CN114462614A - Quantum noise intensity determination method and device, electronic device and medium - Google Patents

Quantum noise intensity determination method and device, electronic device and medium Download PDF

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CN114462614A
CN114462614A CN202210134526.3A CN202210134526A CN114462614A CN 114462614 A CN114462614 A CN 114462614A CN 202210134526 A CN202210134526 A CN 202210134526A CN 114462614 A CN114462614 A CN 114462614A
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王琨
唐双红
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Beijing Baidu Netcom Science and Technology Co Ltd
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Abstract

The present disclosure provides a quantum noise intensity determination method, apparatus, electronic device, computer-readable storage medium, and computer program product, and relates to the field of quantum computers, in particular to the field of quantum noise slow release technology. The implementation scheme is as follows: obtaining the maximum mixed state, and repeatedly operating the quantum measurement equipment to measure the maximum mixed state for the first numerical time; obtaining a maximum superposition state, and repeatedly operating the quantum measurement equipment to measure the second numerical times of the maximum superposition state; respectively counting the measurement results of the maximum mixed state and the maximum superposition state to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixed state and a second probability value of each occurrence of the corresponding measurement result of the maximum superposition state; and determining a quantum noise strength of the quantum measurement device based on a difference between the respective first probability value and the corresponding second probability value of the at least one measurement.

Description

Quantum noise intensity determination method and device, electronic device and medium
Technical Field
The present disclosure relates to the field of quantum computers, and in particular, to the field of quantum noise slow release technologies, and in particular, to a method and an apparatus for determining quantum noise intensity of a quantum measurement device, an electronic device, a computer-readable storage medium, and a computer program product.
Background
Quantum computer technology has developed rapidly in recent years, but noise problems in quantum computers are inevitable in the foreseeable future: the heat dissipation in the qubit or the random fluctuations generated in the underlying quantum physical process will cause the state of the qubit to flip or randomize, and the measurement device will read the calculation results with deviations, which may cause the calculation process to fail.
Specifically, due to the limitations of various factors such as instruments, methods, conditions, etc., quantum measurement equipment cannot work precisely, so that measurement noise is generated, and deviation occurs in an actual measurement value. Therefore, it is generally desirable to reduce the effects of measurement noise in order to obtain an unbiased estimate of the measurement.
Disclosure of Invention
The present disclosure provides a quantum noise intensity determination method, apparatus, electronic device, computer-readable storage medium, and computer program product for a quantum measurement device.
According to an aspect of the present disclosure, there is provided a quantum noise intensity determination method of a quantum measurement device, including: acquiring the maximum mixed state of n quantum bits, wherein n is the quantum bit number of the quantum measurement equipment; repeatedly operating the quantum measurement device to measure the maximum mixing state for a first number of times to obtain a measurement result; acquiring the maximum superposition state of n quantum bits; repeatedly operating the quantum measuring equipment to measure the maximum superposition state for a second numerical time to obtain a measuring result; counting the measurement results of the maximum mixing state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixing state and a second probability value of each occurrence of at least one measurement result corresponding to the maximum superposition state; and determining a quantum noise strength of the quantum measurement device based on a difference between the respective first probability value and the corresponding second probability value of the at least one measurement.
According to another aspect of the present disclosure, there is provided a method for error slow release of a quantum measurement device, including: determining a quantum noise intensity of the quantum measurement device; and determining a corresponding method of a chromatography method of the quantum measurement device and a calibration method of the quantum measurement device to carry out error slow release on the quantum measurement device based on the determined quantum noise intensity. The quantum noise intensity of the quantum measurement device is determined based on the method described above.
According to another aspect of the present disclosure, there is provided a quantum noise intensity determination apparatus of a quantum measurement device, including: the first acquisition unit is configured to acquire the maximum mixed state of n quantum bits, wherein n is the quantum bit number of the quantum measurement device; a first measurement unit configured to repeatedly operate the quantum measurement device to perform a first number of measurements on the maximum mixture state to obtain a measurement result; the second acquisition unit is configured to acquire the maximum superposition state of the n qubits; a second measurement unit configured to repeatedly operate the quantum measurement device to perform a second numerical number of measurements on the maximum superposition state to obtain a measurement result; a statistical unit configured to perform statistics on the measurement results of the maximum mixture state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixture state and a second probability value of each occurrence of at least one measurement result corresponding to the maximum superposition state; and a first determination unit configured to determine a quantum noise strength of the quantum measurement device based on a difference between a respective first probability value and a corresponding second probability value of the at least one measurement.
According to another aspect of the present disclosure, there is provided a quantum measurement device error slow-release apparatus including: a second determination unit configured to determine a quantum noise intensity of the quantum measurement device; and a third determination unit configured to determine, based on the determined quantum noise intensity, respective ones of a quantum measurement device chromatography method and a quantum measurement device calibration method to perform error mitigation on the quantum measurement device. The quantum noise intensity of the quantum measurement device is determined based on the method described above.
According to another aspect of the present disclosure, there is provided an electronic device including: at least one processor; and a memory communicatively coupled to the at least one processor; the memory stores instructions executable by the at least one processor to cause the at least one processor to perform the method of the present disclosure.
According to another aspect of the present disclosure, there is provided a non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method described in the present disclosure.
According to another aspect of the disclosure, a computer program product is provided, comprising a computer program which, when executed by a processor, implements the method described in the disclosure.
According to one or more embodiments of the present disclosure, the quantum noise intensity of the quantum measurement device can be efficiently determined, and then it can be determined whether more resources need to be consumed to depict all information of the quantum measurement device based on the determined quantum noise intensity, so as to improve the accuracy of the calculation result.
It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present disclosure, nor do they limit the scope of the present disclosure. Other features of the present disclosure will become apparent from the following description.
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The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the embodiments and, together with the description, serve to explain the exemplary implementations of the embodiments. The illustrated embodiments are for purposes of illustration only and do not limit the scope of the claims. Throughout the drawings, identical reference numbers designate similar, but not necessarily identical, elements.
FIG. 1 illustrates a schematic diagram of an exemplary system in which various methods described herein may be implemented, according to an embodiment of the present disclosure;
FIG. 2 shows a flow chart for error mitigation by a quantum measurement device calibration method;
FIG. 3 shows a flow diagram of a quantum noise strength determination method of a quantum measurement device according to an embodiment of the disclosure;
FIG. 4 shows a quantum circuit schematic for obtaining maximum mixture states according to an embodiment of the present disclosure;
FIG. 5 shows a quantum circuit schematic for obtaining a maximum superposition state according to an embodiment of the present disclosure;
FIG. 6 shows a flow diagram of a quantum measurement device error mitigation method according to an embodiment of the disclosure;
fig. 7 shows a block diagram of a structure of a quantum noise strength determination apparatus of a quantum measurement device according to an embodiment of the present disclosure;
FIG. 8 shows a block diagram of a quantum measurement device error mitigation apparatus according to an embodiment of the present disclosure; and
FIG. 9 illustrates a block diagram of an exemplary electronic device that can be used to implement embodiments of the present disclosure.
Detailed Description
Exemplary embodiments of the present disclosure are described below with reference to the accompanying drawings, in which various details of the embodiments of the disclosure are included to assist understanding, and which are to be considered as merely exemplary. Accordingly, it will be recognized by those of ordinary skill in the art that various changes and modifications may be made to the embodiments described herein without departing from the scope of the present disclosure. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.
In the present disclosure, unless otherwise specified, the use of the terms "first", "second", etc. to describe various elements is not intended to limit the positional relationship, the timing relationship, or the importance relationship of the elements, and such terms are used only to distinguish one element from another. In some examples, a first element and a second element may refer to the same instance of the element, and in some cases, based on the context, they may also refer to different instances.
The terminology used in the description of the various described examples in this disclosure is for the purpose of describing particular examples only and is not intended to be limiting. Unless the context clearly indicates otherwise, if the number of elements is not specifically limited, the elements may be one or more. Furthermore, the term "and/or" as used in this disclosure is intended to encompass any and all possible combinations of the listed items.
Embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings.
To date, the various types of computers in use are based on classical physics as the theoretical basis for information processing, called traditional computers or classical computers. Classical information systems store data or programs using the most physically realizable binary data bits, each represented by a 0 or 1, called a bit or bit, as the smallest unit of information. The classic computer itself has inevitable weaknesses: one is the most fundamental limitation of computing process energy consumption. The minimum energy required by the logic element or the storage unit is more than several times of kT so as to avoid the misoperation of thermal expansion and dropping; information entropy and heating energy consumption; thirdly, when the wiring density of the computer chip is high, the uncertainty of the electronic position is small and the uncertainty of the momentum is large according to the heisenberg uncertainty relation. The electrons are no longer bound and there are quantum interference effects that can even destroy the performance of the chip.
Quantum computers (quantum computers) are physical devices that perform high-speed mathematical and logical operations, store and process quantum information in compliance with quantum mechanical properties and laws. When a device processes and calculates quantum information and runs quantum algorithms, the device is a quantum computer. Quantum computers follow a unique quantum dynamics law, particularly quantum interference, to implement a new model of information processing. For parallel processing of computational problems, quantum computers have an absolute advantage in speed over classical computers. The transformation of each superposed component by the quantum computer is equivalent to a classical calculation, all the classical calculations are completed at the same time and are superposed according to a certain probability amplitude to give an output result of the quantum computer, and the calculation is called quantum parallel calculation. Quantum parallel processing greatly improves the efficiency of quantum computers, making it possible to accomplish tasks that classic computers cannot accomplish, such as factorization of a large natural number. Quantum coherence is essentially exploited in all quantum ultrafast algorithms. Therefore, quantum parallel computation of a classical state is replaced by a quantum state, so that the computation speed and the information processing function which are incomparable with a classical computer can be achieved, and meanwhile, a large amount of computation resources are saved.
With the rapid development of quantum computer technology, the application range of quantum computers is wider and wider due to the strong computing power and the faster operation speed. For example, chemical simulation refers to a process of mapping the hamiltonian of a real chemical system to physically operable hamiltonian, and then modulating parameters and evolution times to find eigenstates that reflect the real chemical system. When simulating an N-electron chemistry system on a classical computer, 2 is involvedNThe calculation amount of the Weischrodinger equation is exponentially increased along with the increase of the system electron number. Classical computers have therefore had very limited effect on chemical simulation problems. To break through this bottleneck, the powerful computing power of quantum computers must be relied upon. A Quantum intrinsic solver (VQE) algorithm is an efficient Quantum algorithm for performing chemical simulation on Quantum hardware, and is one of the most promising applications in the near term of Quantum computers, and opens up many new chemical research fields. However, at present, the measurement noise rate of the quantum computer obviously limits the capability of VQE, so the quantum measurement noise problem must be dealt with well in advance.
One core computational process of the quantum eigensolver algorithm VQE is to estimate an expected value Tr [ Op ], where ρ is the quantum state of the n qubits (n-qubit quantum state) generated by the quantum computer, and the n qubit observables O are the hamiltonian quantities of the real chemical system mapped to physically operable hamiltonian quantities. The process is the most general form of extracting classical information by quantum computation, has wide application, and can be considered as a core step for reading the classical information from quantum information. In general, it can be assumed that O is a diagonal matrix based on one calculation, and thus the expected value Tr [ O ρ ] can be theoretically calculated by formula (1):
Figure BDA0003503923860000051
where O (i) denotes the ith row and ith column element of O (assuming the matrix element index is numbered starting from 0). The quantum computing process can be as followsFIG. 1 shows a process in which a quantum computer 101 generates n qubit quantum states ρ and measures the quantum states ρ via a quantum measurement device 102 to obtain measurement results, is performed M times, and the number M of times of outputting a result i is countediEstimate ρ (i) ≈ MiPer, Tr [ O ρ ] can be estimated by classical computer 103]. Illustratively, the quantum measurement device 102 may implement the measurement of the n qubit quantum states ρ by n (positive integer) single qubit measurement devices 1021 to obtain a measurement result. The law of large numbers ensures that the estimation process is correct when M is sufficiently large.
It will be appreciated that the combination of quantum computer 101 and quantum measurement device 102 is a quantum computer or quantum device in the general sense.
However, in physical implementation, due to the limitations of various factors such as instruments, methods, conditions, and the like, quantum measurement equipment cannot work precisely, thereby generating measurement noise, so that the value M actually estimatediThere is a deviation between/M and ρ (i) resulting in the calculation of Tr [ O ρ ] using equation (1)]An error occurs.
The source of the noise may be either classical noise or quantum noise. Specifically, for:
Figure BDA0003503923860000061
Figure BDA0003503923860000062
under the ideal condition that the quantum measurement device does not contain noise, the corresponding measurement POVM (Positive Operator-Valued measurement) is expressed as follows:
Figure BDA0003503923860000063
Figure BDA0003503923860000064
where the index i indicates no noise (ideal). Under the condition that quantum measurement equipment contains quantum noise, the corresponding measurement POVM (Positive Operator-Valued Measure) is expressed as follows:
Figure BDA0003503923860000065
Figure BDA0003503923860000066
wherein,
Figure BDA0003503923860000067
being a semi-positive definite matrix, superscript q denotes quantum noise (quantum). Under the condition that the quantum measurement equipment only contains classical noise, the corresponding measurement POVM (Positive Operator-Valued measurement) is expressed as follows:
Figure BDA0003503923860000068
Figure BDA0003503923860000069
where the superscript c denotes classical noise (classical). The x is formed by {0,1}nAnd represents the output result of the quantum measurement device.
That is, there may be errors in measuring the output quantum states by the measurement basis described above to determine the corresponding output results. Finally, the number M of times leading to a statistical output iiMay be inaccurate.
If Quantum noise exists in the Quantum measuring equipment, a Quantum measuring equipment chromatography method (Quantum Measurement mobility) must be carried out on the Quantum measuring equipment to obtain all information of the noise and carry out error slow release work; on the other hand, if only classical noise exists in the Quantum Measurement device, all information of the noise can be acquired and error slow release work can be performed only by performing a Quantum Measurement device Calibration method (Quantum Measurement Calibration) on the Quantum Measurement device. Chromatography methods can extract more information, but consume more resources, than calibration methods.
Taking a single quantum bit as an example, assuming that a large number of |0> states and |1> states are prepared, respectively, and measurement results are obtained after measurement by a quantum measurement device, it is found that the probability of obtaining a measurement result of x ═ 0 is 0.9 and 0.2, respectively, and the probability of obtaining a measurement result of x ═ 1 is 0.1 and 0.8, respectively. The corresponding observation operator can be written:
Figure BDA0003503923860000071
Figure BDA0003503923860000072
due to the fact that
Figure BDA0003503923860000073
Can determine gamma12The numerical relationship between them. Here γ is12Is the source of quantum noise and is a quantity that can usually only be characterized by chromatographic methods.
The chromatography method and calibration method of quantum measurement equipment are common techniques for error slow release of quantum measurement equipment.
The quantum measuring equipment chromatography method prepares different input states, measures by using the quantum measuring equipment, and constructs a measurement operator pi according to statistical dataq. The measurement operator obtained by the chromatography method can completely characterize the quantum noise property of the quantum measurement device. However, although the chromatography method can completely map quantum noise, the quantum state and the measurement basis need to be stretched into the whole quantum space, so the chromatography is very expensive, and the required resource is O (4)n) (n is a quantum measurement)The number of device quantum bits).
The quantum measurement equipment calibration method constructs a classical matrix pi through calibration data generated by operating a calibration circuitcThe matrix delineates classical noise information of the noisy quantum measurement device, and when a specific quantum calculation task needs to be executed subsequently, the obtained calibration matrix pi can be utilizedcAnd processing the noisy output data generated by the quantum circuit corresponding to the task so as to slowly release the error of the output data.
For example, in the process of performing error mitigation on the measurement device by using the calibration method, generally, the measurement device may be calibrated first and then the output result of the measurement device may be corrected, and the workflow may be as shown in fig. 2. In this basic flow of measurement noise processing, an experimenter first prepares a number of calibration circuits (step 210), and then runs the calibration circuits in an actual measurement device (step 220) to detect basic information of the measurement device. In particular, a corresponding calibration circuit may be constructed by the quantum computer 101 in a system as shown in fig. 1 to obtain a corresponding standard base quantum state. The standard basis quantum states are measured by measurement device 102 a plurality of times to generate calibration data (step 230). Using the generated calibration data, a calibration matrix a can be constructed (step 240) that characterizes classical noise information of the noisy measurement device. Subsequently, when a specific quantum computing task needs to be executed, a quantum circuit corresponding to the computing task may be first constructed (step S10), and the quantum circuit corresponding to the task is operated in an actual device (step S20), and noisy output data { M } of the quantum circuit is obtainedi}i(step S30). Subsequently, these noisy data may be post-processed using the obtained calibration matrix a (step S40):
Figure BDA0003503923860000081
wherein A is-1Representing the inverse of the calibration matrix a. Approximating { ρ (i) }by the probability distribution p after calibrationiFurther, an expected value Tr [ O ρ ] is calculated](step S50), the classic noise can be effectively eliminatedThereby improving the accuracy of calculating the expected value.
Although the quantum measurement device calibration method requires relatively low computational resources, only classical noise can be characterized. The classical noise can only reflect part of sources of noise of the measuring equipment, for example, noise such as statistical error which can be slowly released through a statistical method in subsequent data processing, however, if the quantum noise of the quantum measuring equipment is significant and the main source of the noise is the quantum noise, the obtained noisy measuring data cannot accurately slowly release the error no matter through any high-level statistical means.
Therefore, how to efficiently and quickly estimate the quantum noise intensity in a quantum measurement device would be necessary. And dynamically deciding whether to process the noise of the quantum measurement equipment by using a quantum measurement equipment chromatography method or a quantum measurement equipment calibration method based on the estimated quantum noise intensity, thereby saving resources consumed by quantum measurement noise processing.
The embodiment according to the present disclosure provides a quantum noise intensity determination method for a quantum measurement device. As shown in fig. 3, the method 300 includes: acquiring the maximum mixed state of n quantum bits, wherein n is the quantum bit number of the quantum measurement equipment (step 310); repeatedly operating the quantum measurement device to measure the maximum mixing state for a first number of times to obtain a measurement result (step 320); acquiring the maximum superposition state of the n quantum bits (step 330); repeatedly operating the quantum measurement device to perform a second numerical measurement on the maximum superposition state to obtain a measurement result (step 340); counting the measurement results of the maximum mixture state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixture state and a second probability value of each occurrence of the at least one measurement result corresponding to the maximum superposition state (step 350); and determining a quantum noise strength of the quantum measurement device based on a difference between the respective first probability value and the corresponding second probability value of the at least one measurement (step 360).
According to the embodiment of the disclosure, the quantum noise intensity of the quantum measurement device can be efficiently determined, and then whether more resources need to be consumed to depict all information of the quantum measurement device can be judged based on the determined quantum noise intensity, so that the accuracy of the calculation result is improved.
The measurement result obtained by measuring the corresponding quantum state by the quantum measurement equipment is a binary string, namely the measurement result is x, x belongs to {0,1}n. Different forms of x are different measurements. The number of occurrences of the preset one or more measurements may be counted to obtain a probability distribution of the one or more measurements.
It will be appreciated that by the method described in this disclosure, all measurements (x e {0,1} can be determinedn) Probability distribution of (2).
Illustratively, in one embodiment according to the present disclosure, estimating a quantum noise strength of an n-qubit quantum measurement device may comprise the steps of:
the first step is as follows: preparing a maximum mixed state:
Figure BDA0003503923860000091
i is 2nAn identity matrix of dimensions.
The second step is that: n in repeatedly operated noisy quantum measuring equipment1Counting the number N of times of outputting binary character string xx|πWhere x ∈ {0,1}n,∑xNx|π=N1
The third step: preparation of maximum stack State
Figure BDA0003503923860000092
Wherein (|0 … 0> + … + |1 … 1 >) includes x ∈ {0,1}nAll forms of (a).
The fourth step: n total of repeatedly operated noisy measuring equipment2Counting the number N of times of outputting binary character string xx|ΦWhere x ∈ {0,1}n,∑xNx|Φ=N2
The fifth step: normalizing the acquired data set by dividing the normalized data set by the running times N of the corresponding measuring equipment1Or N2Obtaining an output resultThe probability distribution of (a) is as follows:
Px|π=Nx|π/Nshots
Px|Φ=Nx|Φ/Nshots
as described above, it is possible to obtain:
Figure BDA0003503923860000101
Figure BDA0003503923860000102
wherein,
Figure BDA0003503923860000103
to represent
Figure BDA0003503923860000104
The y-th row of (c) and the z-th column of elements,
Figure BDA0003503923860000105
the same is true.
Compare P abovex|πAnd Px|ΦThe expression of (2) is easy to see, and the difference value of the two describes the intensity of quantum noise to a certain extent.
According to some embodiments, determining the quantum noise strength of the quantum measurement device may comprise: determining an average value of the absolute difference values corresponding to the at least one measurement result based on the absolute difference values between the respective first probability value and the corresponding second probability value of the at least one measurement result; and determining a quantum noise strength of the quantum measurement device based on the average.
Specifically, in the above embodiment, the probability distributions corresponding to the two input states are subtracted, and the absolute value is calculated and multiplied by 2nObtaining:
Figure BDA0003503923860000106
this value characterizes the quantum noise strength of the output result as a binary string x. An experimenter can judge whether the quantum noise effect is obvious or not by setting the fault tolerance epsilon. For example, if g is assigned to the measurement xxIf yes, the quantum noise of the quantum measurement equipment can be considered to be remarkable; otherwise, the quantum noise of the quantum measuring device is considered to be insignificant. Or, if gx>, quantum noise is considered significant; if g isxAnd < <epsilon, namely the quantum noise is considered to be not significant.
Additionally or alternatively, g if a proportion (e.g. 50%) of the measurements correspond tox> ∈ g or gxIf yes, the quantum noise of the quantum measurement equipment can be considered to be obvious; otherwise, the quantum noise of the quantum measuring device is considered to be insignificant.
Additionally or alternatively, the average quantum noise effect, i.e. g, of all measurements may also be calculatedxAverage value of (a):
Figure BDA0003503923860000107
and comparing the average quantum noise intensity with the fault tolerance epsilon so as to judge the average quantum noise intensity of the quantum measurement equipment.
The method disclosed by the disclosure can be applied to all quantum measurement devices to characterize the quantum noise intensity of the quantum measurement devices, and can be used for acquiring the quantum noise intensity of the measurement devices even if the quantum noise intensity is not significant
Figure BDA0003503923860000111
Of the sum of the non-diagonal elements, i.e. gxTo determine the quantum noise strength of the quantum measurement device.
According to some embodiments, the maximum mixture state is obtained by a preset first quantum circuit. The first quantum circuit includes n qubits in a ground state, n H gates, n auxiliary qubits, and n controlled not gates. The n H gates respectively act on the n quantum bits in the ground state, controlled NOT gates respectively act between the n quantum bits in the ground state and the corresponding auxiliary quantum bits after the H gates are acted, and the n quantum bits in the ground state and the n auxiliary quantum bits are in one-to-one correspondence.
In particular, the preparation of the maximum mixture can be by means of a "purification" process. Taking the preparation of the maximum mixed state corresponding to 4 qubits as an example, 4 qubits in the ground state are obtained, and 4 additional qubits are introduced. The 8 qubits are paired two by two, the 1 st qubit with the 5 th qubit to prepare the entangled state, the 2 nd qubit with the 6 th qubit … and so on. Finally, only half of the paired qubits are observed, i.e. only the first 4 qubits or only the last 4 qubits, resulting in an observation corresponding to the maximum mixture. Wherein the entangled state can be prepared by applying an H gate to one qubit in a qubit pair and then acting with the other qubit on a CNot gate (controlled not gate), as shown in the quantum circuit diagram of fig. 4.
It is understood that this is only an exemplary method for preparing the maximum mixture state, and that other alternative methods for preparing the maximum mixture state are also included, and are not limited to the |0> state as an input, and are not described herein again.
According to some embodiments, the maximum superposition state is obtained by a preset second quantum circuit. The second quantum circuit includes n qubits in a ground state, and n H-gates. The n H-gates act on the n qubits in the ground state, respectively.
Specifically, taking the preparation of the maximum superposition state corresponding to 4 qubits as an example, the preparation of the maximum superposition state may be obtained by adding an H-gate to 4 qubits in the ground state, as shown in the quantum circuit diagram in fig. 5.
It is understood that this is only an exemplary method for preparing the maximum stacking state, and that other optional methods for preparing the maximum stacking state are also included, and are not limited to the |0> state as an input, and will not be described herein.
In one exemplary application of the method according to embodiments of the present disclosure, the quantum noise intensity determination method according to embodiments of the present disclosure is tested by the available quantum computers 1 and 2. Illustratively, experiments were conducted with 4 qubits selected and the maximum mixture state and the maximum superposition state were prepared according to the related examples described above. After the normalization processing is performed on the data returned by the quantum measurement device, the data results shown in table 1 are obtained.
Figure BDA0003503923860000121
It can be seen that for the quantum computer 1, the quantum noise effect of most measurement results is obvious, and the average quantum noise intensity
Figure BDA0003503923860000122
The fault tolerance factor epsilon is far larger than the fault tolerance factor epsilon which is set in common experiments and is 0.1. This means that the quantum computer 1 is more suitable for using the quantum measurement device chromatography method because the quantum effect is significant in the noise of the quantum measurement device, and thus the quantum computer 1 is more suitable for using the quantum measurement device chromatography method. For the quantum computer 2, the quantum noise of most measurement results is not obvious, and the average quantum noise intensity
Figure BDA0003503923860000123
Far less than the fault tolerance e which is set on the common experiment as 0.1. This means that the quantum computer 2 does not have significant quantum effects in the noise of the quantum measuring device, and is more suitable for the calibration method using the quantum measuring device.
Therefore, as shown in fig. 6, according to an embodiment of the present disclosure, there is also provided a method 600 for error slow release of a quantum measurement device, including: determining a quantum noise intensity of the quantum measurement device (step 610); and determining a corresponding one of a quantum measurement device chromatography method and a quantum measurement device calibration method to perform error mitigation on the quantum measurement device based on the determined quantum noise strength (step 620). The quantum noise intensity of the quantum measurement device may be determined based on the method described in any of the above embodiments.
Illustratively, the quantum noise intensity of the quantum measurement device determined by the method described in the above embodiment is significant (corresponding to g)xOr
Figure BDA0003503923860000131
When the fault tolerance is larger than or far larger than the preset fault tolerance belonging to the E), carrying out error slow release on the quantum measurement equipment by a chromatography method of the quantum measurement equipment; otherwise, carrying out error slow release on the quantum measuring equipment by a quantum measuring equipment calibration method.
According to an embodiment of the present disclosure, as shown in fig. 7, there is also provided a quantum noise intensity determination apparatus 700 of a quantum measurement device, including: a first obtaining unit 710 configured to obtain a maximum mixture of n qubits, where n is a quantum bit number of the quantum measurement device; a first measurement unit 720 configured to repeatedly operate the quantum measurement device to perform a first number of measurements on the maximum mixture state to obtain a measurement result; a second obtaining unit 730 configured to obtain a maximum superposition state of the n qubits; a second measurement unit 740 configured to repeatedly operate the quantum measurement device to perform a second number of measurements on the maximum superposition state to obtain a measurement result; a statistical unit 750 configured to perform statistics on the measurement results of the maximum mixture state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixture state and a second probability value of each occurrence of at least one measurement result corresponding to the maximum superposition state; and a first determination unit 760 configured to determine a quantum noise strength of the quantum measurement device based on a difference between a respective first probability value and a corresponding second probability value of the at least one measurement.
Here, the operations of the units 710 to 760 of the quantum noise strength determination apparatus 700 of the quantum measurement device are similar to the operations of the steps 310 to 360 described above, and are not described herein again.
According to an embodiment of the present disclosure, as shown in fig. 8, there is also provided a quantum measurement apparatus error slow-release device 800, including: a second determination unit 810 configured to determine a quantum noise strength of the quantum measurement device; and a third determination unit 820 configured to determine respective ones of a quantum measurement device chromatography method and a quantum measurement device calibration method to perform error mitigation on the quantum measurement device based on the determined quantum noise intensity. The quantum noise intensity of the quantum measurement device may be determined based on the method described in any of the above embodiments.
According to an embodiment of the present disclosure, there is also provided an electronic device, a readable storage medium, and a computer program product.
Referring to fig. 9, a block diagram of a structure of an electronic device 900, which may be a server or a client of the present disclosure, which is an example of a hardware device that may be applied to aspects of the present disclosure, will now be described. Electronic device is intended to represent various forms of digital electronic computer devices, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be examples only, and are not meant to limit implementations of the disclosure described and/or claimed herein.
As shown in fig. 9, the electronic apparatus 900 includes a computing unit 901, which can perform various appropriate actions and processes in accordance with a computer program stored in a Read Only Memory (ROM)902 or a computer program loaded from a storage unit 908 into a Random Access Memory (RAM) 903. In the RAM903, various programs and data required for the operation of the electronic device 900 can also be stored. The calculation unit 901, ROM 902, and RAM903 are connected to each other via a bus 904. An input/output (I/O) interface 905 is also connected to bus 904.
A number of components in the electronic device 900 are connected to the I/O interface 905, including: an input unit 906, an output unit 907, a storage unit 908, and a communication unit 909. The input unit 906 may be any type of device capable of inputting information to the electronic device 900, and the input unit 906 may receive input numeric or character information and generate key signal inputs related to user settings and/or function controls of the electronic device, and may include, but is not limited to, a mouse, a keyboard, a touch screen, a track pad, a track ball, a joystick, a microphone, and/or a remote control. Output unit 907 may be any type of device capable of presenting information and may include, but is not limited to, a display, speakers, a video/audio output terminal, a vibrator, and/or a printer. Storage unit 908 may include, but is not limited to, a magnetic disk, an optical disk. The communication unit 909 allows the electronic device 900 to exchange information/data with other devices via a computer network, such as the internet, and/or various telecommunications networks, and may include, but is not limited to, modems, network cards, infrared communication devices, wireless communication transceivers and/or chipsets, such as bluetooth (TM) devices, 802.11 devices, WiFi devices, WiMax devices, cellular communication devices, and/or the like.
The computing unit 901 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of the computing unit 901 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various dedicated Artificial Intelligence (AI) computing chips, various computing units running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, and so forth. The computing unit 901 performs the various methods and processes described above, such as the methods 200 or 600. For example, in some embodiments, the method 200 or 600 may be implemented as a computer software program tangibly embodied in a machine-readable medium, such as the storage unit 908. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 900 via the ROM 902 and/or the communication unit 909. When the computer program is loaded into RAM903 and executed by computing unit 901, one or more steps of method 200 or 600 described above may be performed. Alternatively, in other embodiments, the computing unit 901 may be configured to perform the method 200 or 600 by any other suitable means (e.g., by means of firmware).
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, Field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), system on a chip (SOCs), Complex Programmable Logic Devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.
Program code for implementing the methods of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the program codes, when executed by the processor or controller, cause the functions/operations specified in the flowchart and/or block diagram to be performed. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the computer. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic, speech, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), Wide Area Networks (WANs), and the Internet.
The computer system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server may be a cloud server, a server of a distributed system, or a server with a combined blockchain.
It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present disclosure may be performed in parallel, sequentially or in different orders, and are not limited herein as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved.
Although embodiments or examples of the present disclosure have been described with reference to the accompanying drawings, it is to be understood that the above-described methods, systems and apparatus are merely exemplary embodiments or examples and that the scope of the present invention is not limited by these embodiments or examples, but only by the claims as issued and their equivalents. Various elements in the embodiments or examples may be omitted or may be replaced with equivalents thereof. Further, the steps may be performed in an order different from that described in the present disclosure. Further, various elements in the embodiments or examples may be combined in various ways. It is important that as technology evolves, many of the elements described herein may be replaced by equivalent elements that appear after the present disclosure.

Claims (13)

1. A quantum noise intensity determination method of a quantum measurement device includes:
acquiring the maximum mixed state of n quantum bits, wherein n is the quantum bit number of the quantum measurement equipment;
repeatedly operating the quantum measurement device to measure the maximum mixing state for a first number of times to obtain a measurement result;
acquiring the maximum superposition state of n quantum bits;
repeatedly operating the quantum measuring equipment to measure the maximum superposition state for a second numerical time to obtain a measuring result;
counting the measurement results of the maximum mixing state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixing state and a second probability value of each occurrence of at least one measurement result corresponding to the maximum superposition state; and
determining a quantum noise strength of the quantum measurement device based on a difference between the respective first probability value and the corresponding second probability value of the at least one measurement.
2. The method of claim 1, wherein determining a quantum noise strength of the quantum measurement device comprises:
determining an average of the absolute difference values corresponding to the at least one measurement based on the absolute difference values between the respective first probability value and the corresponding second probability value of the at least one measurement; and
determining a quantum noise intensity of the quantum measurement device based on the average.
3. The method of claim 1, wherein the maximum mixture state is obtained by a preset first quantum circuit, wherein,
the first quantum circuit includes n qubits in a ground state, n H-gates, n auxiliary qubits, and n controlled not-gates, and wherein,
the n H gates respectively act on the n quantum bits in the ground state, controlled NOT gates respectively act between the n quantum bits in the ground state and the corresponding auxiliary quantum bits after the H gates are acted, and the n quantum bits in the ground state and the n auxiliary quantum bits are in one-to-one correspondence.
4. The method of claim 1 or 3, wherein the maximum superposition state is obtained by a preset second quantum circuit, wherein,
the second quantum circuit includes n qubits in a ground state, and n H-gates, and wherein,
the n H-gates act on the n qubits in the ground state, respectively.
5. An error slow-release method of a quantum measurement device comprises the following steps:
determining a quantum noise intensity of the quantum measurement device; and
determining a respective one of a quantum measurement device chromatography method and a quantum measurement device calibration method to perform error mitigation on the quantum measurement device based on the determined quantum noise intensity,
wherein the quantum noise strength of the quantum measurement device is determined based on the method of any one of claims 1-4.
6. A quantum noise intensity determination apparatus of a quantum measurement device, comprising:
the first acquisition unit is configured to acquire the maximum mixed state of n quantum bits, wherein n is the quantum bit number of the quantum measurement device;
a first measurement unit configured to repeatedly operate the quantum measurement device to perform a first number of measurements on the maximum mixture state to obtain a measurement result;
the second acquisition unit is configured to acquire the maximum superposition state of the n qubits;
a second measurement unit configured to repeatedly operate the quantum measurement device to perform a second number of measurements on the maximum superposition state to obtain a measurement result;
a statistical unit configured to perform statistics on the measurement results of the maximum mixture state and the maximum superposition state respectively to obtain a first probability value of each occurrence of at least one measurement result of the maximum mixture state and a second probability value of each occurrence of at least one measurement result corresponding to the maximum superposition state; and
a first determination unit configured to determine a quantum noise strength of the quantum measurement device based on a difference between a respective first probability value and a corresponding second probability value of the at least one measurement.
7. The apparatus of claim 6, wherein the determining unit comprises:
means for determining an average of the absolute difference values corresponding to the at least one measurement based on the absolute difference values between the respective first probability value and the corresponding second probability value for the at least one measurement; and
means for determining a quantum noise strength of the quantum measurement device based on the average.
8. The apparatus of claim 6, wherein the maximum mixture state is obtained by a preset first quantum circuit, wherein,
the first quantum circuit includes n qubits in a ground state, n H-gates, n auxiliary qubits, and n controlled not-gates, and wherein,
the n H gates respectively act on the n quantum bits in the ground state, controlled NOT gates respectively act between the n quantum bits in the ground state and the corresponding auxiliary quantum bits after the H gates are acted, and the n quantum bits in the ground state and the n auxiliary quantum bits are in one-to-one correspondence.
9. The apparatus of claim 6 or 8, wherein the maximum superposition state is obtained by a preset second quantum circuit, wherein,
the second quantum circuit includes n qubits in a ground state, and n H-gates, and wherein,
the n H-gates act on the n qubits in the ground state, respectively.
10. An error slow-release device of a quantum measurement device, comprising:
a second determination unit configured to determine a quantum noise intensity of the quantum measurement device; and
a third determination unit configured to determine, based on the determined quantum noise intensity, respective ones of a quantum measurement device chromatography method and a quantum measurement device calibration method to erroneously slow down the quantum measurement device,
wherein the quantum noise strength of the quantum measurement device is determined based on the method of any one of claims 1-4.
11. An electronic device, comprising:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein
The memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-5.
12. A non-transitory computer readable storage medium having stored thereon computer instructions for causing the computer to perform the method of any one of claims 1-5.
13. A computer program product comprising a computer program, wherein the computer program realizes the method of any one of claims 1-5 when executed by a processor.
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