CN114459544A - Evaluation method for comprehensive stress sand dust test of electronic product - Google Patents
Evaluation method for comprehensive stress sand dust test of electronic product Download PDFInfo
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- CN114459544A CN114459544A CN202210147035.2A CN202210147035A CN114459544A CN 114459544 A CN114459544 A CN 114459544A CN 202210147035 A CN202210147035 A CN 202210147035A CN 114459544 A CN114459544 A CN 114459544A
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Abstract
The invention discloses a comprehensive stress sand dust test evaluation method for an electronic product, and belongs to the field of reliability tests. Firstly, researching and collecting information aiming at the practical application environment of an electronic product to be evaluated, and carrying out classification statistical analysis on related data; then, according to the data analysis result in the step 1, comprehensive stress sand dust test severity selection and test section design are carried out; then, according to the test conditions and the section designed in the step 2, carrying out the specific implementation of the test and the monitoring of key parameters; and finally, performing performance characterization test and risk grade judgment on the test sample. According to the invention, based on the actual application environment characteristics of the product, the temperature stress and dust comprehensive stress conditions are introduced, and the risk grade evaluation is carried out on the product under the temperature and humidity conditions, so that the application environment of the product can be more closely simulated, and the evaluation on the reliability of the electronic product under the comprehensive dust stress conditions is more complete.
Description
Technical Field
The invention relates to the technical field of reliability testing, in particular to a comprehensive stress sand dust test evaluation method for electronic products.
Background
With the continuous development of industrialization level and the continuous deterioration of natural environment, the influence of the dust environment on the service life and reliability of electronic products is further increased. The intrusion of dust can cause the electronic product to have harmful effects such as seizing of moving parts, abrasion of moving parts, changes in contact resistance and insulation properties, reduction in heat transfer properties, increase in noise, contamination of lubricants, and changes in optical properties.
The dust invades into the electronic products due to the mechanisms of deposition of self gravity, entrainment of air heat movement, suction caused by inconsistent air pressure due to temperature change and the like. The sand dust deposited on the surface of the insulator is a poor conductor; however, in combination with other environments such as temperature and humidity, soluble particles are dissolved to form an electrolyte, thereby accelerating corrosion of metal corrosion and change of conductivity.
Therefore, the comprehensive stress sand dust test on the electronic product has very important significance for improving the reliability of the electronic product.
Disclosure of Invention
The invention aims to provide an evaluation method for an electronic product comprehensive stress sand dust test, which is used for evaluating the reliability level of an electronic product under a comprehensive sand dust stress condition.
In order to solve the technical problem, the invention provides an evaluation method for a comprehensive stress sand dust test of an electronic product, which comprises the following steps:
step 1: carrying out investigation and information collection aiming at the practical application environment of the electronic product to be evaluated, and carrying out classification statistical analysis on related data;
step 2: according to the data analysis result in the step 1, carrying out comprehensive stress sand dust test severity selection and test section design;
and step 3: carrying out specific implementation of the test and monitoring of key parameters according to the test conditions and the section designed in the step 2;
and 4, step 4: and (4) performing performance characterization tests and risk grade judgment on the test samples.
Optionally, in step 1, the actual application environment of the electronic product is environment information related to the test, including a high temperature upper limit temperature, a low temperature lower limit temperature, a maximum humidity and an average humidity range per year, an average dust reduction per year, and typical components contained in the dust.
Optionally, in the step 2, the selection of the severity of the comprehensive stress dust test and the design of the test section include the following substeps:
substep 1, selecting a reasonable comprehensive stress dust test severity grade according to the actual application environment investigation and analysis result of the electronic product;
and substep 2, designing a test section by combining the design and application characteristics of the product.
Optionally, in the substep 1, the severity level of the comprehensive stress dust test is determined by a correction matrix formed by the dust stress level and the temperature stress level.
Optionally, in the substep 2, the dust concentration of the dust is selected from dust concentration (6 +/-1) g/m specified by relevant standards in the design of the test section2。
Optionally, in the substep 2, the working state of the sample in the design of the test section should be intermittently operated to increase the suction effect of the dust through the thermal cycle.
Optionally, in step 3, the specific implementation method of the test is implemented by referring to relevant standards.
Optionally, in step 3, the monitoring of the key parameters includes monitoring of functions, electrical performance, noise parameters of the product and dust concentration in the test chamber.
Optionally, in step 4, the performance characterization test of the test sample includes a temperature and humidity accelerated test, and the test time is not less than 24H.
Optionally, in step 4, the risk level determination is divided into four different levels, i.e., a type a, a type B, a type C, and a type D, according to the degree of damage.
The evaluation method for the comprehensive stress sand dust test of the electronic product, provided by the invention, has the following beneficial effects:
(1) the determination of the test profile is based on the actual application environment of the electronic product, which is beneficial to the accuracy of subsequent evaluation;
(2) the combined effect of the existence of the dust and other environmental factors is considered, so that the evaluation result is more accurate and reliable;
(3) the severity level of the comprehensive stress dust test is creatively provided, which is beneficial to determining and evaluating the stress intensity in the implementation process;
(4) corresponding performance test representation and risk grade evaluation are provided for a test sample, and the improvement of product reliability is facilitated;
(5) at present, with the continuous deterioration of the sand dust environment, the influence on the service life and the reliability of the electronic product is further increased, and the evaluation method is suitable for the electronic product, can be popularized to other product fields, and has wide application prospects.
Drawings
FIG. 1 is a schematic flow chart of a comprehensive stress sand dust test evaluation method for electronic products provided by the invention;
FIG. 2 is a schematic sectional view of the dust concentration in the comprehensive stress dust test of the present invention;
FIG. 3 is a schematic cross-sectional view of the working state of a comprehensive stress dust test sample according to the present invention;
FIG. 4 is a schematic temperature stress profile of the comprehensive stress dust test in the present invention.
Detailed Description
The method for evaluating the comprehensive stress dust test of the electronic product provided by the invention is further described in detail by combining the attached drawings and specific embodiments. Advantages and features of the present invention will become apparent from the following description and from the claims. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.
The invention provides a method for evaluating a comprehensive stress sand dust test of an electronic product, which has a flow shown in figure 1 and comprises the following steps:
step S11: carrying out investigation and information collection aiming at the practical application environment of the electronic product to be evaluated, and carrying out classification statistical analysis on related data;
the practical application environment of the electronic product is environment information related to a test, and comprises a high-temperature upper limit temperature, a low-temperature lower limit temperature, maximum humidity, an annual average humidity range, annual average dust reduction amount, typical components contained in sand and dust and the like; preferably, the research on the practical application environment of the electronic product should be comprehensive.
Step S12: according to the data analysis result in the step S11, carrying out comprehensive stress sand dust test severity selection and test section design; the method comprises the following substeps:
substep 1, selecting a reasonable comprehensive stress dust test severity grade according to the actual application environment investigation and analysis result of the electronic product; the severity grade of the comprehensive stress dust test is determined by a correction matrix formed by the stress grade of the dust and the stress grade of the temperature, and can be shown in the following table 1:
TABLE 1 severity rating for comprehensive stress test
Wherein, T1The period definition of 1 day of the test is shown under the corresponding sand stress condition, and the like;
R1representing the period definition of 1 day of the test under the corresponding temperature stress condition, and so on;
S1the period of 1 day of the test is defined under the corresponding comprehensive conditions of temperature stress and sand dust stress, and the like. The stress test severity rating is combined, and the S9 test severity rating is recommended.
Substep 2, designing a test section by combining the design and application characteristics of the product; if the sand dust environmental stress of a specific area cannot be determined, the sand dust stress can adopt standard dust concentration (6 +/-1) g/m2(ii) a The working conditions of the samples in the design of the test section should be run intermittently to increase the suction effect of the dust through the thermal cycling.
FIG. 2 is a schematic view showing a dust concentration profile of the comprehensive stress dust test of the present invention. As shown in fig. 3, the working state of the sample should be run intermittently, and the running time can be determined by the application characteristics of the product itself. As shown in FIG. 4, the high and low temperature limits of the temperature stress can be performed at a high temperature of 60 ℃ and a low temperature of-10 ℃; or determined by the actual application environment of the product and the investigation and analysis results.
Step S13: performing specific implementation of the test and monitoring of key parameters according to the test conditions and the profile designed in the step S12;
the specific implementation method of the test is implemented according to relevant standards, and the monitoring of key parameters comprises the monitoring of the parameters of the product such as functions, electrical performance, noise and the like and the monitoring of the dust concentration in the test box; the monitoring method of the dustfall concentration is to measure by placing a collector at the same horizontal position of a sample.
Step S14: performing performance characterization test and risk grade judgment on the test sample; the performance characterization test of the test sample comprises a temperature and humidity accelerated test which adopts a constant temperature and humidity condition, and the test section can be executed according to the condition of product verification; the risk grade judgment is divided into four different grades of A type, B type, C type and D type according to the hazard degree. To facilitate the determination of the risk level, reference may be made to the following table 2:
TABLE 2 Risk class criteria
The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.
Claims (10)
1. A comprehensive stress sand dust test evaluation method for electronic products is characterized by comprising the following steps:
step 1: carrying out investigation and information collection aiming at the practical application environment of the electronic product to be evaluated, and carrying out classification statistical analysis on related data;
step 2: according to the data analysis result in the step 1, carrying out comprehensive stress sand dust test severity selection and test section design;
and step 3: carrying out specific implementation of the test and monitoring of key parameters according to the test conditions and the section designed in the step 2;
and 4, step 4: and (4) performing performance characterization tests and risk grade judgment on the test samples.
2. The method for evaluating the comprehensive stress dust and sand test of the electronic product as claimed in claim 1, wherein in the step 1, the actual application environment of the electronic product is environment information related to the test, including a high temperature upper limit temperature, a low temperature lower limit temperature, a maximum humidity and an annual average humidity range, an annual average dust reduction amount, and typical components contained in the dust and sand.
3. The method for evaluating the comprehensive stress dust test of the electronic product as claimed in claim 1, wherein in the step 2, the selection of the severity of the comprehensive stress dust test and the design of the test section comprises the following substeps:
substep 1, selecting a reasonable comprehensive stress dust test severity grade according to the actual application environment investigation and analysis result of the electronic product;
and substep 2, designing a test section by combining the design and application characteristics of the product.
4. The method for evaluating the comprehensive stress dust test of the electronic product as claimed in claim 3, wherein in the substep 1, the severity level of the comprehensive stress dust test is determined by a correction matrix formed by the stress level of the dust and the stress level of the temperature.
5. The method of claim 3, wherein in substep 2, the dust concentration of the dust is selected from the dust concentrations specified by the relevant standards (6 ± 1) g/m in the design of the test profile2。
6. The method as claimed in claim 3, wherein in the substep 2, the working condition of the sample in the design of the test section is intermittently operated to increase the suction effect of dust generated by thermal cycling.
7. The method for evaluating the comprehensive stress dust test of the electronic product as claimed in claim 1, wherein in the step 3, the specific implementation method of the test is implemented by referring to relevant standards.
8. The method for evaluating the comprehensive stress sand dust test of the electronic product as claimed in claim 1, wherein in the step 3, the monitoring of the key parameters comprises monitoring of the function, the electrical performance and the noise parameters of the product and the dust concentration in the test chamber.
9. The method for evaluating the comprehensive stress dust and sand test of the electronic product as claimed in claim 1, wherein in the step 4, the performance characterization test of the test sample comprises a temperature and humidity acceleration test, and the test time is not less than 24H.
10. The method for evaluating the comprehensive stress dust and sand test of the electronic product as claimed in claim 1, wherein in the step 4, the risk level judgment is divided into four different levels of A type, B type, C type and D type according to the degree of damage.
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