CN114442480A - Control parameter adjusting method and system of automatic test equipment and automatic test equipment - Google Patents
Control parameter adjusting method and system of automatic test equipment and automatic test equipment Download PDFInfo
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Abstract
The invention provides a method and a system for adjusting control parameters of automatic test equipment and the automatic test equipment, wherein the method comprises the following steps: establishing a controller model of the automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment; acquiring a voltage set value and a maximum peak voltage of the tested equipment, and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic testing equipment and an integral gain parameter; adjusting the integral gain parameter of the controller model within the integral gain parameter adjusting range; and comparing the stable time of the controller model, updating the voltage rising time, determining the corresponding voltage rising time when the stable time is minimum, and further determining the gain coefficient of the integral controller. The problem that the tested equipment is damaged due to overshoot is avoided, the risk and complexity of gain of the automatic tuning test equipment controller are reduced, time consumption is short, efficiency is high, and the method is more suitable for actual production environments.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a control parameter adjusting method and system of automatic test equipment and the automatic test equipment.
Background
Proportional-integral-derivative controllers (PID controllers) are control loop mechanisms that utilize feedback and are widely used in industrial control systems and various other applications where continuous modulation control is required. The PID controller performs corrections based on proportional, integral and derivative terms by continuously calculating an error value as the difference between the desired Set Point (SP) and the measured Process Variable (PV). Each PID controller term has a corresponding coefficient. The setting of the coefficients determines how quickly the PID controller can bring the measured process variable to the desired set point. Typically, control systems utilize proportional gains to quickly reach a desired set point and integral gains to account for steady state errors.
Typical control system tuners allow a user to set a proportional gain to quickly approach a desired setting, and an integral gain to account for steady state errors. Due to the numerous gain value selections, a very large search space is provided for the user.
However, the minute power supply rise time characteristics may not be clearly visible on the physical monitor controlling the system tuner. The device under test may be damaged by overshoot if the gain factor of the automatic test equipment is improperly set.
Disclosure of Invention
In view of this, embodiments of the present invention provide a method and a system for adjusting control parameters of an automatic test equipment, and an automatic test equipment, so as to solve the problem in the prior art that a device under test may be damaged due to overshoot caused by improper setting of a gain coefficient.
According to a first aspect, an embodiment of the present invention provides a method for adjusting control parameters of an automatic test device, the method being applied to a load board having a device under test, a capacitor of the load board being coupled to the capacitor of the device under test, the method including:
establishing a controller model of automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment;
acquiring a voltage set value and a maximum peak voltage of the tested equipment, and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic test equipment and an integral gain parameter;
adjusting the integral gain parameter of the controller model within the integral gain parameter adjustment range;
comparing the stable time of the controller model, updating the voltage rise time, and determining the corresponding voltage rise time when the stable time is minimum;
and determining a gain coefficient of the integral controller according to the corresponding voltage rising time when the stabilization time is minimum.
Optionally, the correspondence between the voltage of the automatic test equipment and the integral gain parameter is determined as follows:
performing time modeling on the automatic test equipment based on the first capacitance information and the second capacitance information to obtain gain and delay characteristic information of the automatic test equipment;
and determining the corresponding relation between the voltage of the automatic test equipment and an integral gain parameter based on the gain and delay characteristic information.
Optionally, before the obtaining the voltage set value and the maximum peak voltage of the device under test, the method further includes:
determining an initial integral gain parameter and an initial proportional gain parameter of the controller model based on a digital source meter voltage range of the automatic test equipment;
and calculating the initial voltage rise time and the initial stability time of the controller model based on the initial integral gain parameter.
Optionally, the proportional gain parameter of the controller model is the initial proportional gain parameter.
Optionally, the comparing the stability time of the controller model, updating the voltage rise time, and determining the voltage rise time corresponding to the minimum stability time includes:
acquiring first stabilization time corresponding to the current integral gain parameter in the adjustment range of the integral gain parameter;
updating the initial voltage rise time based on the relationship between the first stabilization time and the initial stabilization time, and returning to the step of obtaining the first stabilization time corresponding to the current integral gain parameter in the adjustment range of the integral gain parameter;
and determining the updated initial voltage rising time as the voltage rising time corresponding to the minimum stabilization time.
Optionally, the updating the initial voltage rise time based on the relationship between the first stabilization time and the initial stabilization time includes:
judging whether the first stabilization time is less than initial stabilization time;
and when the first stabilization time is less than the initial stabilization time, updating the initial voltage rise time to a first voltage rise time corresponding to the current integral gain parameter.
Optionally, the method further comprises:
and determining the gain coefficient of an integral controller in the FPGA of the automatic test equipment based on the gain coefficient of the integral controller.
According to a second aspect, an embodiment of the present invention provides a control parameter adjustment system for an automatic test equipment, the system is applied to a load board having a device under test, a capacitor of the load board is coupled to the capacitor of the device under test, and the system includes:
the first processing module is used for establishing a controller model of the automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment;
the second processing module is used for acquiring a voltage set value and a maximum peak voltage of the tested equipment and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic testing equipment and an integral gain parameter;
the third processing module is used for adjusting the integral gain parameter of the controller model within the adjustment range of the integral gain parameter;
the fourth processing module is used for comparing the stabilization time of the controller model, updating the voltage rise time and determining the corresponding voltage rise time when the stabilization time is minimum;
and the fifth processing module is used for determining the gain coefficient of the integral controller according to the corresponding voltage rise time when the stabilization time is minimum.
According to a third aspect, embodiments of the present invention provide a non-transitory computer readable storage medium storing computer instructions which, when executed by a processor, implement the method of the first aspect of the present invention and any one of its alternatives.
According to a fourth aspect, an embodiment of the present invention provides an automatic test apparatus, including: a memory and a processor, the memory and the processor being communicatively coupled to each other, the memory having stored therein computer instructions, the processor being configured to execute the computer instructions to perform the method of the first aspect of the present invention and any one of the alternatives thereof.
The technical scheme of the invention has the following advantages:
the embodiment of the invention provides a control parameter adjusting method and system of automatic test equipment and the automatic test equipment, which are applied to a load board with tested equipment, wherein a capacitor of the load board is coupled with a capacitor of the tested equipment, and a controller model of the automatic test equipment is established based on first capacitance information of the load board and second capacitance information of the tested equipment; acquiring a voltage set value and a maximum peak voltage of the tested equipment, and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic testing equipment and an integral gain parameter; adjusting the integral gain parameter of the controller model within the integral gain parameter adjusting range; comparing the stable time of the controller model, updating the voltage rise time, and determining the corresponding voltage rise time when the stable time is minimum; and determining the gain coefficient of the integral controller according to the corresponding voltage rising time when the stabilization time is minimum. Embodiments of the present invention provide an adjustable recommended integral gain factor based on load plate capacitance and device under test capacitance and allow only guided or automatic adjustment along a single axis (i.e., integral gain factor) within the integral gain parameter adjustment range (i.e., guard band). The problem that the tested equipment is possibly damaged due to overshoot caused by improper setting of the gain coefficient is avoided, the risk and complexity of tuning the gain of the automatic testing equipment controller are obviously reduced, time consumption is short, efficiency is high, and the method is more suitable for actual production environments.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flowchart illustrating a method for adjusting control parameters of automatic test equipment according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a tuning gain controller architecture of an automatic test equipment according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a load board with a device under test according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of a control parameter adjustment system of automatic test equipment according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of an automatic test equipment in an embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
A proportional-integral-derivative controller (PID controller) is a control loop mechanism that utilizes feedback and is widely used in industrial control systems and various other applications requiring continuous modulation control. The PID controller continuously calculates an error value as the difference between the desired Set Point (SP) and the measured Process Variable (PV) and applies corrections based on proportional, integral and derivative terms. Each PID controller term has a corresponding coefficient. The setting of the coefficients determines how quickly the PID controller can bring the measured process variable to the desired set point. Determining the coefficients of the PID is very time consuming due to the wide range of possibilities. Conventional methods attempt to provide general guidance on how to set the coefficients, but risk causing overshoot that may damage the device under test. The prior art attempts to overcome this problem by cloud computing based on storage models and historical data, changing the traditional PID algorithm or obtaining coefficients by frequency analysis. All of these prior art methods are expensive to implement (i.e., cloud computing based on various models and a sufficient amount of historical data), still require a large amount of user input (i.e., change the traditional PID algorithm), or may be applicable to general situations but are too complex for a particular industry field such as Automatic Test Equipment (ATE) of semiconductors, i.e., frequency analysis. Therefore, how to efficiently and accurately determine a proper gain coefficient and avoid that the device to be tested is damaged due to overshoot caused by improper setting of the gain coefficient becomes an urgent problem to be solved.
Based on the foregoing problems, an embodiment of the present invention provides a method for adjusting control parameters of automatic test equipment, where the method is applied to a load board with a device under test, and a capacitor of the load board is coupled to a capacitor of the device under test, and as shown in fig. 1, the method for adjusting control parameters of automatic test equipment specifically includes the following steps:
step S101: and establishing a controller model of the automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment.
In particular, the relationship between the capacitance of the load board and the capacitance of the device under test is prior art. The purpose of building a controller model is to simulate the behavior of the hardware of the automatic test equipment when interacting with the device under test.
Step S102: and acquiring a voltage set value and the maximum peak voltage of the tested equipment, and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic testing equipment and the integral gain parameter.
The corresponding relation between the voltage of the automatic test equipment and the integral gain parameter is determined by the product characteristics of the automatic test equipment. The maximum peak voltage is a maximum voltage value allowed to be output by the device under test, the voltage setting value is a voltage value expected to be output by the device under test, and is usually a voltage value at which the device under test normally operates, and when the voltage value of the device under test exceeds the maximum peak voltage, the device under test may be damaged. Therefore, the adjustment range of the integral gain parameter is determined by the maximum peak voltage, a protective band is set for the integral gain parameter, and the problem that the tested equipment is damaged due to overshoot can be avoided.
In practice, the maximum peak voltage is usually set according to a predetermined ratio of the voltage set value, such as: the maximum peak voltage is 110% of the voltage set value, and further, in order to ensure that the automatic test equipment can work near the voltage value of normal operation to ensure the working performance of the automatic test equipment, a minimum operating voltage may be set, and the minimum operating voltage is also generally set according to a predetermined proportion of the voltage set value, such as: the lowest operation voltage is 90% of the voltage set value, and the integration gain parameter adjusting range is determined through the lowest operation voltage and the maximum peak voltage, the integration gain parameter adjusting interval is shortened, the automatic testing equipment can be guaranteed to work nearby the voltage value of normal work all the time, and the working performance of the automatic testing equipment is further improved.
Step S103: and adjusting the integral gain parameter of the controller model within the integral gain parameter adjusting range.
Specifically, the integral gain parameter is adjusted in the guard band of the integral gain parameter, so that the optimal integral gain parameter can be found, and the problem that the tested equipment is damaged due to overshoot can be solved.
Step S104: and comparing the stable time of the controller model, updating the voltage rising time, and determining the corresponding voltage rising time when the stable time is minimum.
Specifically, the shorter the stabilization time of the controller model is, the better the performance of the controller model is, and at this time, the integral gain parameter corresponding to the controller model is the optimal integral gain parameter.
Step S105: and determining the gain coefficient of the integral controller according to the corresponding voltage rising time when the stabilization time is minimum.
Specifically, the process of calculating the corresponding integral gain parameter based on the voltage rise time is the prior art, and is not described herein again.
By performing the above steps, the method for adjusting control parameters of automatic test equipment according to the embodiments of the present invention provides an adjustable recommended integral gain factor based on the capacitance of the load board and the capacitance of the device under test, and only allows for guiding or automatic adjustment along a single axis (i.e., integral gain factor) within the adjustment range (i.e., guard band) of the integral gain parameter. The problem that the tested equipment is possibly damaged due to overshoot caused by improper setting of the gain coefficient is avoided, the risk and complexity of tuning the gain of the automatic testing equipment controller are obviously reduced, time consumption is short, efficiency is high, and the method is more suitable for actual production environments.
Specifically, in an embodiment, before the step S102 is executed, the method for adjusting control parameters of automatic test equipment further includes the following steps:
step S106: an initial integral gain parameter and an initial proportional gain parameter of the controller model are determined based on a digital source meter voltage range of the automatic test equipment.
Specifically, the proportional gain is selected according to the voltage range of the digital source meter, and then an initial integral gain is determined within the range of the voltage set value and the maximum peak voltage after the proportional gain is fixed. In the embodiment of the present invention, in order to further shorten the adjustment time and improve the efficiency, in step S103, the proportional gain parameter of the controller model is the initial proportional gain parameter while the integral gain parameter of the controller model is adjusted.
Step S107: and calculating to obtain the initial voltage rise time and the initial stability time of the controller model based on the initial integral gain parameter.
Specifically, the initial voltage rise time calculation process is the prior art, and depends on a time model of a specific automatic test equipment product, and the time model is described in detail in step S102 below, and is not described herein again.
Specifically, in an embodiment, the correspondence between the voltage of the automatic test equipment and the integral gain parameter in step S102 is determined as follows:
step S201: and performing time modeling on the automatic test equipment based on the first capacitance information and the second capacitance information to obtain the gain and delay characteristic information of the automatic test equipment.
Specifically, by giving a set of specific electrical stimuli, i.e. giving the automatic test equipment a certain instantaneous variation of current, voltage or frequency characteristics, the behavior of the hardware of the automatic test equipment is simulated by a time model, and then gain and delay characteristic information thereof is obtained. For adjusting the simulated behavior applied to the automatic test equipment. The time modeling is a synonym of a circuit model of automatic test equipment, and a specific implementation process is not described herein again.
Step S202: and determining the corresponding relation between the voltage of the automatic test equipment and the integral gain parameter based on the gain and delay characteristic information.
Specifically, based on a time model of the automatic test equipment product, a "rough" proportional and integral gain combination is obtained. The solution would then adjust the "approximate" gain according to the particular situation. For example, some devices under test may be able to accept higher voltage output tolerances or slower ramp up times, etc., and may be flexibly adjusted depending on the device under test.
Specifically, in an embodiment, the step S104 specifically includes the following steps:
step S401: and acquiring first stabilization time corresponding to the current integral gain parameter within the integral gain parameter adjusting range.
Specifically, the current integral gain parameter may be obtained at a certain sampling interval within an integral gain parameter adjustment range, that is, within a minimum-maximum safety band of the integral gain, and then applied to a controller model, where the time required for monitoring the voltage of the device under test to be stabilized to a voltage setting value is the first stabilization time.
Step S402: the initial voltage rise time is updated based on the relationship between the first stabilization time and the initial stabilization time, and the process returns to step S401.
Specifically, the step S402 determines whether the first stable time is less than the initial stable time; and when the first stabilization time is less than the initial stabilization time, updating the initial voltage rise time to be the first voltage rise time corresponding to the current integral gain parameter. Otherwise, the initial voltage rise time is not updated. Thereby ensuring that the initial voltage rise time of the final update is minimal.
Step S403: and determining the updated initial voltage rising time as the voltage rising time corresponding to the minimum stabilization time.
Specifically, the integral gain coefficient can be determined according to the voltage rise time corresponding to the minimum stabilization time obtained in the integral gain parameter adjusting range, and the optimal performance of the integral gain coefficient is ensured.
Specifically, in an embodiment, the foregoing further includes:
step S108: and determining the gain coefficient of the integral controller in the FPGA of the automatic test equipment based on the gain coefficient of the integral controller.
Therefore, the controller model of the automatic test equipment is established, the automatic test equipment is simulated to work, the gain coefficient of the integral controller is determined, the gain coefficient of the integral controller in the FPGA of the automatic test equipment can be obtained, the automatic test equipment does not need to be directly subjected to gain coefficient adjustment, and the problem that the tested equipment is possibly damaged due to overshoot due to improper setting of the gain coefficient is avoided.
The following describes a method for adjusting control parameters of automatic test equipment according to an embodiment of the present invention in detail with reference to a specific application example.
Exemplarily, a tuning gain controller architecture of the automatic test equipment established by the method for adjusting the control parameters of the automatic test equipment provided by the embodiment of the present invention is shown in fig. 2, and a main process of the tuning gain controller for adjusting the control parameters is as follows:
step 1: performing time modeling based on the load board capacitance and the tested equipment capacitance to obtain the gain and delay characteristic information of the automatic testing equipment;
and 2, step: determining the relationship between the voltage range of a digital source meter of automatic test equipment and the gain of a proportional controller and an integral controller;
and step 3: determining the relationship between the current range and the resistance of a digital source meter of automatic test equipment;
and 4, step 4: calculating initial rising voltage time;
step 5, establishing a controller model of the automatic test equipment according to the load board capacitance and the tested equipment capacitance, and determining an initial gain parameter of the controller model based on the voltage range of the digital source meter to obtain initial voltage rise time;
step 6; acquiring a voltage set value and a maximum peak voltage of the tested equipment, and determining a gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the peak voltage and the gain parameter; and adjusting the gain parameter within the gain parameter adjusting range.
Step 7, comparing the stable time of the controller model, and updating the voltage rise time; determining the corresponding voltage rise time when the stabilization time is minimum;
and 8, determining a gain coefficient of the integral controller according to the corresponding voltage rise time when the stabilization time is minimum.
And step 9: and updating the gain coefficient of the integral controller in the FPGA of the automatic test equipment according to the determined gain coefficient of the integral controller.
The above-described solution of the invention allows only guided or automatic adjustment along a single axis (i.e. the integral gain factor) within a predetermined min-max band (i.e. the guard band). This significantly reduces the risk and complexity of tuning the gain of the automatic test equipment controller, making our method more suitable for production environments than laboratory environments, thereby avoiding the problem of unstable response of the device under test due to the potential for overshoot damage due to improper gain factor setting, or due to slow rise time of the digital source meter driven power supply. In addition, in practical applications, the solution provided by the embodiment of the present invention may also be utilized to fix the integral gain coefficient and then adjust the proportional gain within the preset voltage range, and the specific implementation process is similar to the implementation process of fixing the proportional gain coefficient and adjusting the integral gain within the preset voltage range, and is not described herein again.
By performing the above steps, the method for adjusting control parameters of automatic test equipment according to the embodiments of the present invention provides an adjustable recommended integral gain factor based on the capacitance of the load board and the capacitance of the device under test, and only allows for guiding or automatic adjustment along a single axis (i.e., integral gain factor) within the adjustment range (i.e., guard band) of the integral gain parameter. The problem that the tested equipment is possibly damaged due to overshoot caused by improper setting of the gain coefficient is avoided, the risk and complexity of tuning the gain of the automatic testing equipment controller are obviously reduced, time consumption is short, efficiency is high, and the method is more suitable for actual production environments.
An embodiment of the present invention further provides a control parameter adjustment system for an automatic test device, where the system is applied to a load board with a device under test, as shown in fig. 3, a load board capacitor 110 is coupled to a device under test capacitor 120, and the load board is connected to a source meter unit in fig. 2, as shown in fig. 4, the control parameter adjustment system for an automatic test device specifically includes:
the first processing module 101 is configured to establish a controller model of the automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the device under test. For details, refer to the related description of step S101 in the above method embodiment, and no further description is provided here.
The second processing module 102 is configured to obtain a voltage setting value and a maximum peak voltage of the device under test, and determine an adjustment range of an integral gain parameter corresponding to the maximum peak voltage according to a correspondence between the voltage of the automatic test device and the integral gain parameter. For details, refer to the related description of step S102 in the above method embodiment, and no further description is provided here.
And the third processing module 103 is configured to adjust the integral gain parameter of the controller model within the adjustment range of the integral gain parameter. For details, refer to the related description of step S103 in the above method embodiment, and no further description is provided here.
And a fourth processing module 104, configured to compare the stabilization time of the controller model, update the voltage rise time, and determine a corresponding voltage rise time when the stabilization time is minimum. For details, refer to the related description of step S104 in the above method embodiment, and no further description is provided here.
And a fifth processing module 105, configured to determine a gain coefficient of the integral controller according to a voltage rise time corresponding to the time when the settling time is minimum. For details, refer to the related description of step S105 in the above method embodiment, and no further description is provided here.
Through the cooperative cooperation of the above components, the control parameter adjustment system of the automatic test equipment provided by the embodiment of the invention provides an adjustable recommended integral gain coefficient based on the capacitance of the load board and the capacitance of the tested equipment, and only allows guiding or automatic adjustment along a single axis (i.e. integral gain coefficient) within the adjustment range (i.e. the guard band) of the integral gain parameter. The problem that the tested equipment is possibly damaged due to overshoot caused by improper setting of the gain coefficient is avoided, the risk and complexity of tuning the gain of the automatic testing equipment controller are obviously reduced, time consumption is short, efficiency is high, and the method is more suitable for actual production environments.
Further functional descriptions of the modules are the same as those of the corresponding method embodiments, and are not repeated herein.
An embodiment of the present invention further provides an automatic test device, as shown in fig. 5, the automatic test device includes: a processor 901 and a memory 902, wherein the processor 901 and the memory 902 may be connected by a bus or other means, and fig. 5 illustrates an example of a connection by a bus.
The memory 902, which is a non-transitory computer readable storage medium, may be used to store non-transitory software programs, non-transitory computer executable programs, and modules, such as program instructions/modules corresponding to the methods in the embodiments of the present invention. The processor 901 executes various functional applications and data processing of the processor, i.e., implements the above-described method, by executing non-transitory software programs, instructions, and modules stored in the memory 902.
The memory 902 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function; the storage data area may store data created by the processor 901, and the like. Further, the memory 902 may include high speed random access memory, and may also include non-transitory memory, such as at least one magnetic disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, the memory 902 may optionally include memory located remotely from the processor 901, which may be connected to the processor 901 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
One or more modules are stored in the memory 902, which when executed by the processor 901 performs the methods described above.
The specific details of the automatic test equipment may be understood by referring to the corresponding related descriptions and effects in the above method embodiments, and are not described herein again.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, and the implemented program can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic Disk, an optical Disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a Flash Memory (Flash Memory), a Hard Disk (Hard Disk Drive, abbreviated as HDD) or a Solid State Drive (SSD), etc.; the storage medium may also comprise a combination of memories of the kind described above.
The above embodiments are only for illustrating the technical solutions of the present invention and not for limiting the same, and although the present invention is described in detail with reference to the above embodiments, those of ordinary skill in the art should understand that: modifications and equivalents may be made to the embodiments of the invention without departing from the spirit and scope of the invention, which is to be covered by the claims.
Claims (10)
1. A method for adjusting control parameters of an automatic test equipment, the method being applied to a load board having a device under test, a capacitor of the load board being coupled to a capacitor of the device under test, the method comprising:
establishing a controller model of automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment;
acquiring a voltage set value and a maximum peak voltage of the tested equipment, and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic test equipment and an integral gain parameter;
adjusting the integral gain parameter of the controller model within the integral gain parameter adjustment range;
comparing the stable time of the controller model, updating the voltage rise time, and determining the corresponding voltage rise time when the stable time is minimum;
and determining the gain coefficient of the integral controller according to the corresponding voltage rising time when the stabilization time is minimum.
2. The method of claim 1, wherein the voltage to integral gain parameter correspondence of the automatic test equipment is determined by:
performing time modeling on the automatic test equipment based on the first capacitance information and the second capacitance information to obtain gain and delay characteristic information of the automatic test equipment;
and determining the corresponding relation between the voltage of the automatic test equipment and the integral gain parameter based on the gain and delay characteristic information.
3. The method of claim 1, wherein prior to said obtaining the voltage set point and the maximum peak voltage of the device under test, the method further comprises:
determining an initial integral gain parameter and an initial proportional gain parameter of the controller model based on a digital source meter voltage range of the automatic test equipment;
and calculating the initial voltage rise time and the initial stability time of the controller model based on the initial integral gain parameter.
4. The method of claim 3, wherein the proportional gain parameter of the controller model is the initial proportional gain parameter.
5. The method of claim 3, wherein comparing the settling time of the controller model, updating the voltage rise time, and determining the voltage rise time corresponding to the minimum settling time comprises:
acquiring first stabilization time corresponding to the current integral gain parameter in the adjustment range of the integral gain parameter;
updating the initial voltage rise time based on the relationship between the first stabilization time and the initial stabilization time, and returning to the step of obtaining the first stabilization time corresponding to the current integral gain parameter in the adjustment range of the integral gain parameter;
and determining the updated initial voltage rising time as the voltage rising time corresponding to the minimum stabilization time.
6. The method of claim 5, wherein updating the initial voltage rise time based on the relationship between the first settling time and the initial settling time comprises:
judging whether the first stabilization time is less than initial stabilization time;
and when the first stabilization time is less than the initial stabilization time, updating the initial voltage rise time to a first voltage rise time corresponding to the current integral gain parameter.
7. The method of claim 1, further comprising:
and determining the gain coefficient of an integral controller in the FPGA of the automatic test equipment based on the gain coefficient of the integral controller.
8. A control parameter adjustment system for an automatic test equipment, the system being applied to a load board having a device under test, a capacitor of the load board being coupled to a capacitor of the device under test, the system comprising:
the first processing module is used for establishing a controller model of the automatic test equipment based on the first capacitance information of the load board and the second capacitance information of the tested equipment;
the second processing module is used for acquiring a voltage set value and a maximum peak voltage of the tested equipment and determining an integral gain parameter adjusting range corresponding to the maximum peak voltage according to the corresponding relation between the voltage of the automatic testing equipment and an integral gain parameter;
the third processing module is used for adjusting the integral gain parameter of the controller model within the integral gain parameter adjusting range;
the fourth processing module is used for comparing the stable time of the controller model, updating the voltage rise time and determining the corresponding voltage rise time when the stable time is minimum;
and the fifth processing module is used for determining a gain coefficient of the integral controller according to the corresponding voltage rise time when the stabilization time is minimum.
9. A non-transitory computer-readable storage medium storing computer instructions that, when executed by a processor, implement the method of any one of claims 1-7.
10. An automatic test apparatus, comprising:
and a memory and a processor, the memory and the processor being communicatively coupled to each other, the memory having stored therein computer instructions, the processor performing the method of any of claims 1-7 by executing the computer instructions.
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