CN114421888A - Damp-heat aging test method for photovoltaic module - Google Patents
Damp-heat aging test method for photovoltaic module Download PDFInfo
- Publication number
- CN114421888A CN114421888A CN202210073515.9A CN202210073515A CN114421888A CN 114421888 A CN114421888 A CN 114421888A CN 202210073515 A CN202210073515 A CN 202210073515A CN 114421888 A CN114421888 A CN 114421888A
- Authority
- CN
- China
- Prior art keywords
- test
- sample
- testing
- bare cell
- photovoltaic module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000032683 aging Effects 0.000 title claims abstract description 97
- 238000010998 test method Methods 0.000 title claims abstract description 9
- 238000012360 testing method Methods 0.000 claims abstract description 179
- 238000003466 welding Methods 0.000 claims abstract description 70
- 238000000034 method Methods 0.000 claims abstract description 41
- 238000013101 initial test Methods 0.000 claims abstract description 36
- 238000001514 detection method Methods 0.000 claims abstract description 17
- 239000000523 sample Substances 0.000 claims description 87
- 229910000679 solder Inorganic materials 0.000 claims description 30
- 230000004907 flux Effects 0.000 claims description 6
- 238000003825 pressing Methods 0.000 claims description 4
- 230000008569 process Effects 0.000 abstract description 16
- 238000005260 corrosion Methods 0.000 abstract description 6
- 230000007797 corrosion Effects 0.000 abstract description 6
- 238000002474 experimental method Methods 0.000 abstract description 4
- 239000000463 material Substances 0.000 description 14
- 230000000052 comparative effect Effects 0.000 description 6
- 238000004806 packaging method and process Methods 0.000 description 6
- 239000002002 slurry Substances 0.000 description 6
- 238000005476 soldering Methods 0.000 description 6
- 239000008358 core component Substances 0.000 description 5
- 238000012795 verification Methods 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 239000005022 packaging material Substances 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 238000005457 optimization Methods 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000000306 component Substances 0.000 description 2
- 238000005538 encapsulation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 229920001577 copolymer Polymers 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Photovoltaic Devices (AREA)
Abstract
The invention discloses a damp and hot aging test method of a photovoltaic module, which comprises the following steps of preparing a sample, and comprises the following steps: providing a bare cell, and welding a welding strip on the front surface of the bare cell to obtain a sample; a step of sample testing comprising: carrying out initial test on the sample to obtain an initial test result, wherein the initial test comprises a power test, a PL test and an EL test; placing the initially tested sample into a damp and hot aging box for testing, and setting the testing conditions of the damp and hot aging box as follows: the testing temperature is 85 plus or minus 1 ℃, the relative humidity is 85 plus or minus 1 percent, and the testing time is 24 hours; a step of analyzing the result of the sample, comprising: and carrying out post-detection on the sample to obtain a post-detection result, wherein the post-detection comprises power test, PL test and EL test, and calculating an attenuation value according to the initial test result and the post-detection result. The method is closer to the state of a bare cell in an actual photovoltaic module product, improves the corrosion speed of a sample, accelerates the experiment process and saves a large amount of test resources.
Description
Technical Field
The invention relates to the technical field of photovoltaics, in particular to a damp-heat aging test method for a photovoltaic module.
Background
At present, when a photovoltaic manufacturing enterprise updates a new material or improves and upgrades a product, a series of reliability tests are required to be performed in order to verify the process reliability of the material or the new product, so as to ensure that the service life of a photovoltaic module reaches more than 25 years. The damp-heat test (DH) is used as an important aging test, the test conditions are that the temperature is 85 ℃ and the humidity is 85%, and systematic evaluation and analysis are carried out on all components of the photovoltaic module product and the moisture and heat aging resistance of the package through the damp-heat test, so that the damp-heat aging resistance is improved, and the overall performance of the product is improved.
At present, the conventional photovoltaic module products are used in the damp and hot tests, the material consumption is large, and the test cost is high; and the test time is long (1000h-2000h), the whole verification period is as long as 4-5 months, the verification efficiency is extremely low, which is extremely unfavorable for updating new materials or new processes, often because the damp-heat test prolongs the whole introduction period and the removal speed of improper schemes is too slow.
Therefore, it is desirable to provide a method capable of improving the efficiency of the damp heat aging test of the photovoltaic module.
Disclosure of Invention
In view of this, the invention provides a method for testing the damp-heat aging of a photovoltaic module, which can quickly and effectively test the reliability of the photovoltaic module and improve the efficiency and timeliness of the damp-heat aging test of the photovoltaic module.
Based on the above, the invention provides a damp-heat aging test method for a photovoltaic module, which comprises the following steps:
a step of preparing a sample comprising: providing a bare cell, wherein the bare cell comprises a front surface and a back surface which are oppositely arranged; welding a welding strip on the front side of the bare cell to obtain a sample;
a step of sample testing comprising: carrying out initial test on the sample to obtain an initial test result, wherein the initial test comprises a power test, a PL test and an EL test; placing the sample after the initial test into a damp and hot aging box for testing, and setting the testing conditions of the damp and hot aging box as follows: the testing temperature is 85 plus or minus 1 ℃, the relative humidity is 85 plus or minus 1 percent, and the testing time is 24 hours;
a step of analyzing the result of the sample, comprising: and carrying out post-detection on the sample to obtain a post-detection result, wherein the post-detection comprises a power test, a PL test and an EL test, and calculating an attenuation value according to the initial test result and the post-detection result.
Optionally, the attenuation value is equal to (initial test result-post test result)/initial test result.
Optionally, the steps of the sample testing are repeated 4-8 times.
Optionally, the front surface of the bare cell comprises main grid lines, and the solder strips correspond to the main grid lines one to one and are electrically connected with the main grid lines.
Optionally, the number of the solder strips is greater than or equal to 5 and less than or equal to 20.
Optionally, the length of the solder strip is not greater than the side length of the bare cell.
Optionally, the step of preparing the sample further includes welding a welding strip on the back surface of the bare cell.
Optionally, the number of the welding strips for welding the back surface of the bare cell sheet is not less than 3.
Optionally, the solder strip is soaked in the flux and then welded with the bare cell.
Optionally, the sample after the initial test is placed in a humid and hot aging box for testing, and the distance between the sample and the inner wall of the humid and hot aging box is not less than 10 cm.
In another aspect, the present invention further provides a method for detecting a photovoltaic module, which is used for determining an initial test result and a post test result of the sample, and includes: and contacting and conducting a test probe with the welding strip, wherein the pressing direction of the test probe is consistent with the direction of the main grid line on the sample.
Compared with the prior art, the damp-heat aging test method for the photovoltaic module provided by the invention at least realizes the following beneficial effects:
according to the invention, the welding strip is welded on the surface of the bare cell to form the sample to be tested, and the sample to be tested is subjected to a damp-heat aging test so as to directly evaluate the water vapor resistance of the cell of the core component of the photovoltaic module, so that the aging resistance data feedback can be rapidly and rapidly carried out, data support can be provided for the process optimization adjustment and the material type selection such as silver paste and the like of the bare cell end, and the step of carrying out the long-time DH evaluation on the photovoltaic module is omitted.
The mode of welding the welding strip by using the bare cell is more truly close to the state of the cell in an actual product, and because no packaging material is used for packaging, the corrosion speed of a sample is improved, the experimental process is accelerated, a testing mechanism for more effectively optimizing the cell process and the aging resistance is realized, and a large amount of testing resources are saved. The invention carries out the test by directly using the welding strip welding mode of the bare cell, saves a large amount of electric appliance connection and auxiliary material encapsulation, and matches with the existing cell test resource, so that the test is more accurate, and in order to explore the process improvement of the cell, the influence of other auxiliary materials is eliminated, and the humidity-resistant and heat-resistant aging factors related to the cell are more directly evaluated.
Of course, it is not necessary for any product in which the present invention is practiced to achieve all of the above-described technical effects simultaneously.
Other features of the present invention and advantages thereof will become apparent from the following detailed description of exemplary embodiments thereof, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description, serve to explain the principles of the invention.
FIG. 1 is a flow chart of a method for testing the damp-heat aging of a photovoltaic module according to the present invention;
fig. 2 is a schematic structural view of a photovoltaic module in the related art;
fig. 3 is a schematic plan view of a bare cell according to the present invention;
FIG. 4 is a cross-sectional view of a sample provided by the present invention.
Detailed Description
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
With reference to fig. 1, fig. 1 is a flowchart of a method for testing thermal and humidity aging of a photovoltaic module provided by the present invention, where the method for testing thermal and humidity aging of a photovoltaic module of this embodiment includes the following steps:
s1, a step of preparing a sample, comprising: providing a bare cell, wherein the bare cell comprises a front surface and a back surface which are oppositely arranged; welding a welding strip on the front side of the bare cell to obtain a sample;
s2, a step of sample testing, comprising: carrying out initial test on the sample to obtain an initial test result, wherein the initial test comprises a power test, a PL test and an EL test; placing the initially tested sample into a damp and hot aging box for testing, and setting the testing conditions of the damp and hot aging box as follows: the testing temperature is 85 plus or minus 1 ℃, the relative humidity is 85 plus or minus 1 percent, and the testing time is 24 hours;
s3, a step of analyzing the sample result, which comprises: and carrying out post-detection on the sample to obtain a post-detection result, wherein the post-detection comprises power test, PL test and EL test, and calculating an attenuation value according to the initial test result and the post-detection result.
Optionally, in the related art, the testing conditions of the damp-heat aging are 85 ℃ and 85% of relative humidity, and the testing conditions in the present invention are also 85 ℃ and 85% of relative humidity, but a slight error is allowed in the present invention, that is, the testing conditions are: the test temperature is 85 plus or minus 1 ℃ and the relative humidity is 85 plus or minus 1 percent.
The bare cell in the present invention refers to a cell that is not packaged and is not welded with a solder ribbon.
In order to reduce the time of the damp-heat aging test in the related art, a method of performing the damp-heat aging test on the bare cell is adopted to characterize the damp-heat aging resistance of the photovoltaic module. Referring to fig. 2, fig. 2 is a schematic view of a structure of a photovoltaic module in the related art. The photovoltaic module 000 in fig. 2 includes a plurality of bare cell sheets 03 arranged in an array, the bare cell sheets 03 are located between a first packaging layer 02 and a second packaging layer 04, and the front surface of the photovoltaic module 000 is glass 01 and the back surface thereof is a back plate 05. The photovoltaic module further comprises a solder strip (not shown in the figure), one end of the solder strip is connected with the main grid line on the front surface of one bare cell, and the other end of the solder strip is connected with the main grid line on the back surface of the adjacent bare cell. Referring to table 1, table 1 is a comparison of the results of the thermal and humidity aging tests performed on the bare cell and the photovoltaic module.
Table 1: comparison result of humid heat aging test on bare cell and photovoltaic module
In table 1, the thermal-humidity aging test was performed on the bare cells of comparative sample 1, comparative sample 2, and comparative sample 3, and the photovoltaic modules corresponding to comparative sample 1, comparative sample 2, and comparative sample 3, respectively. By comparison, as can be seen from table 1, the attenuation of the bare cell in the damp-heat aging test is smaller than that of the packaged photovoltaic module, and the method for testing only the bare cell cannot well reflect the damp-heat water vapor corrosion condition of the photovoltaic module product, so that the damp-heat aging resistance of the photovoltaic module is represented inaccurately by performing the damp-heat aging test on only the bare cell.
According to the invention, a sample is obtained by welding the welding strip on the bare cell, and the sample is subjected to a damp-heat aging test, so that the damp-heat aging resistance of the core component of the photovoltaic module is reflected. Specifically, welding a welding strip on the front surface of the bare cell to obtain a sample to be detected; the method comprises the steps of carrying out initial test on a sample to be tested, wherein the test items of the initial test comprise a power test, a PL test and an EL test, optionally, the power test, the PL test and the EL test are carried out by adopting methods in the related technology, the method is not specifically limited, the sample after the initial test is placed into a damp-heat aging box for carrying out damp-heat aging test, the test temperature is set to be 85 +/-1 ℃, the relative humidity is 85 +/-1%, and the test time is 24h, carrying out post-test on the sample after the damp-heat aging test, wherein the post-test comprises the power test, the PL test and the EL test, and calculating an attenuation value according to the initial test result and the post-test result.
According to the invention, the sample to be tested is formed by welding the welding strip on the surface of the bare cell, the sample to be tested is subjected to the damp-heat aging test to directly evaluate the damp-heat aging resistance of the cell of the core component of the photovoltaic module, the aging resistance data feedback is rapidly and quickly carried out, data support can be provided for the optimization adjustment of the process of the cell end and the model selection of materials such as silver paste, and the step of carrying out the DH test on the photovoltaic module for a long time is omitted.
The mode of welding the welding strip by using the bare cell is more truly close to the state of the cell in an actual product, and because no packaging material is used for packaging, the corrosion speed of a sample is improved, the experimental process is accelerated, a testing mechanism for more effectively optimizing the cell process and the aging resistance is realized, and a large amount of testing resources are saved.
The invention directly uses the welding strip of the bare cell for testing, saves a large amount of electric appliance connection, and is matched with the existing cell testing resources, so that the testing is more accurate, and the influence of other auxiliary materials is eliminated for researching the process improvement of the cell, and the humidity and heat aging resistant factors related to the cell are more directly evaluated.
In this embodiment, in order to verify the reliability of the damp-heat aging test method of the present invention, a verification experiment is performed:
verification experiment 1: a plurality of P-type bare cells in the same batch are taken and divided into a first part and a second part which are equal in number, the first part is a sample of the application, the second part is a photovoltaic module, a welding strip is welded on the front surface of the first part of the P-type bare cell, and the testing is carried out according to the damp-heat aging testing method, so that the attenuation rate of DH1000 is 3.09%. Referring to table 2, table 2 is the results of the P-type photovoltaic module subjected to the damp-heat aging test.
Table 2: result of damp-heat aging test of P-type photovoltaic module
As shown in table 2, the second P-type bare cell was equally divided into three parts of the same number, one part of the P-type bare cell was packaged with EVA (polyethylene-polyvinyl acetate copolymer) on one side, the decay rate of DH1000 after the thermal and humidity aging test was 2.42%, one part of the P-type bare cell was packaged with EVA on both sides, the decay rates of DH1000 after the thermal and humidity aging test were 2.57% (front side) and 2.96% (back side), one part of the P-type bare cell was packaged with POE (ethylene-octene copolymer) on both sides, and the decay rates of DH1000 after the thermal and humidity aging test were 1.68% (front side) and 1.98% (back side).
Verification experiment 2: taking a plurality of N-type bare cells in the same batch, and dividing the N-type bare cells into two parts with the same number, wherein the first part is a sample of the application, and the second part is a photovoltaic module; dividing the first part into three parts with equal quantity, wherein one part of the N-type bare cell is welded with a welding strip, the slurry adopts the first part, and the decay rate of DH200 is 3.6%, the decay rate of DH400 is 5.94% and the decay rate of DH1000 is 8.25% after the damp-heat aging test is carried out; one part of the welding solder strip for welding the N-type bare cell, the slurry adopts the second type, and the decay rate of DH200, DH400 and DH1000 after the damp-heat aging test is 1.44%, 2.03% and 3.51% respectively; one part of the welding solder strip for welding the N-type bare cell adopts the third slurry, and the decay rate of DH200, the decay rate of DH400 and the decay rate of DH1000 after the damp-heat aging test are respectively 0.98%, 1.34% and 1.72%. Referring to table 3, table 3 is the results of the damp heat aging test performed on the N-type photovoltaic module.
Table 3: result of damp-heat aging test of N-type photovoltaic module
As shown in table 3, the second part was divided into three equal parts, wherein one part of the N-type bare cell was packaged on both sides with POE, the first one was used as the slurry, and the decay rates of DH1000 after the damp-heat aging test were 3.16% (front) and 1.00% (back); one part of the N-type bare cell is packaged on both sides by POE, the slurry adopts the second type, and the attenuation rate of DH1000 after the damp-heat aging test is 4.82% (front side) and 2.46% (back side); the other N-type bare cell is packaged by POE on both sides, the slurry adopts the third type, and the attenuation rate of DH1000 after the damp-heat aging test is 6.24% (front side) and 3.60% (back side).
From the above data, it can be seen that the DH test result of the solder ribbon soldered on the bare cell and the DH test result of the photovoltaic module in the present application can be well corresponded, and thus it is also confirmed that it is reliable to reflect the resistance to wet heat aging of the photovoltaic module by the resistance to wet heat aging of the solder ribbon soldered on the bare cell in the present application.
In some alternative embodiments, the attenuation value is equal to (initial test result-post test result)/initial test result.
It is understood that if the initial test result is a1 and the post test result is a2, the attenuation value k is (a1-a2)/a1, and when the attenuation value reaches a preset threshold, it indicates that the attenuation of the photovoltaic device is large, and the photovoltaic device has failed, for example, the preset threshold is 10%, and if the attenuation value is greater than or equal to 10%, the photovoltaic device fails, although the attenuation portion may be observed and the failure mode may be analyzed.
In some alternative embodiments, the steps of the sample testing are repeated 4-8 times.
It can be understood that the time for performing a sample test is 24 hours, and the attenuation value of 24 hours is usually small, and the failure mode of the photovoltaic module cannot be obviously tested, so that the sample test needs to be repeated for many times, for example, the step of the sample test is repeated for 4 times, namely DH96, and the step of the sample test is repeated for 8 times, namely DH192, so that the attenuation value of the failure of the photovoltaic module can be basically reached when the repetition time is between 4 and 8 times, the resistance to heat and humidity aging of the bare cell of the core component of the photovoltaic module can be directly evaluated through shorter test time, the feedback of the aging resistance data can be rapidly performed, and the step of evaluating the DH of the photovoltaic module for a long time is omitted.
Optionally, according to the test result, the target is subjected to failure criterion (namely a preset threshold) formulated according to a large number of experimental results, whether the sample fails or not is judged, the battery process can be optimized according to an aging failure mode, and the quality of the used material is compared to select the type of the material.
In some alternative embodiments, referring to fig. 3, fig. 3 is a schematic plan view of a bare cell provided by the present invention, and fig. 4 is a cross-sectional view of a sample provided by the present invention. The front surface 101 of the battery piece 10 comprises main grid lines 1, and the welding strips 11 correspond to the main grid lines 1 one by one and are electrically connected with the main grid lines 1.
Only the case where there is a space between the adjacent bare cell pieces is shown in fig. 4, but of course, the case where the end portions of the adjacent bare cell pieces overlap, that is, the case of stitch welding, is also possible.
Optionally, the main gate lines 1 extend in the row direction X and the column direction Y, the front side 101 of the bare cell 10 further has the sub gate lines 2 extending in the row direction X and the column direction Y, and the main gate lines 1 and the sub gate lines 2 intersect.
Alternatively, the diameter of the solder strip may be between 0.15-0.4mm, which is closer to the diameter of the solder strip in the actual product of the photovoltaic module.
In the invention, a sample is obtained by welding the welding strip 11 on the front side 101 of the bare cell 10, of course, the welding strip 11 is connected with the main grid lines 1 on the front side 101 of the bare cell 10 in a one-to-one correspondence manner, and optionally, as shown in fig. 4, the welding strip 11 can also be connected with the main grid lines on the back side 102 of the adjacent bare cell 10. The method provided by the invention tests the sample to reflect the wet-heat aging resistance of the photovoltaic module, and omits a step of carrying out DH evaluation on the photovoltaic module for a long time. The mode of welding the welding strip by using the bare cell is more truly close to the state of the bare cell in an actual product, and the corrosion speed of a sample is improved, the experimental process is accelerated, a more effective test mechanism for optimizing the battery process and the aging resistance is exerted and a large amount of test resources are saved because no packaging material is used for packaging.
In some alternative embodiments, the number of solder strips is greater than or equal to 5 and less than or equal to 20.
It can be understood that, in the related art, the size of the bare cell is larger and larger, the corresponding current is also higher and higher, and the internal loss is also more and more, in order to reduce the loss caused by the current, a mode of increasing the number of the main grid lines is usually adopted, the internal loss can be effectively reduced by increasing the number of the main grid lines, the number of the solder strips in this embodiment corresponds to the number of the main grid lines, the number of the main grid lines is greater than or equal to 5 and less than or equal to 20, so that the number of the solder strips is also greater than or equal to 5 and less than or equal to 20, and the internal loss of the bare cell can be reduced.
In some alternative embodiments, the length of the solder ribbon is no greater than the side length of the bare cell sheet.
It can be understood that the length of the solder ribbon in the product of the photovoltaic module is not greater than the side length of the bare cell, so the length of the solder ribbon in the sample of the embodiment is not greater than the side length of the bare cell, thereby being able to more closely approach the state of the photovoltaic module in the actual product.
In some optional embodiments, the step of preparing the sample further includes welding a welding tape on the back surface of the bare cell.
In the step S1, a welding tape may be welded to the back surface of the bare cell at the same time when the sample is prepared. It is understood that the front side of the bare cell is the primary influencing surface for moisture and the back side of the bare cell is the non-primary influencing surface for moisture. In this embodiment, the purpose of welding the welding strip on the back of the bare cell is to ensure the flatness of the bare cell, and prevent the influence on the accuracy of the test caused by the warping of the bare cell due to the welding of the welding strip only on the front of the bare cell.
The inventor also tests a sample with the welding strips welded on the front surface and the back surface of the bare cell, takes the P type as an example, the attenuation rate of DH1000 after the damp-heat aging test is 1.21%, the DH test result and the DH test result of the photovoltaic module can also better correspond, and the fact that the damp-heat aging resistance of the photovoltaic module is reflected by the damp-heat aging resistance of the welding strips welded on the front surface and the back surface of the bare cell in the application is reliable.
In some alternative embodiments, the number of the welding bands welded on the back surface of the battery piece is not less than 3.
It can be understood that, in order to ensure the flatness of the bare cell, the welding bands are only welded on the front surface of the bare cell to prevent warping and affecting the accuracy of the test, the number of the welding bands welded on the back surface of the bare cell is at least 3, and of course, the 3 welding bands can be arranged on the edges of the two sides of the bare cell and in the middle of the bare cell, so that the flatness of the bare cell can be well ensured. Optionally, the larger the number of the welding bands on the back surface of the bare cell is, the smoother the bare cell is, and certainly, the number of the welding bands on the back surface of the bare cell cannot be too large, otherwise, the cost is increased.
In some alternative embodiments, the solder strip is soldered to the bare cell after being soaked in the flux.
Optionally, the solder strip may be welded to the bare cell by spraying flux, which is not limited herein. The welding strip may be a welding strip welded to the front surface of the bare cell or a welding strip welded to the back surface of the bare cell.
In the production process of the photovoltaic module, the soldering strip is required to be welded with the bare cell by using the soldering flux, and after the soldering strip is soaked in the soldering flux in the embodiment, the soldering strip is welded with the bare cell by welding or manually welding the soldering strip on the main grid line, so that the state of the photovoltaic module in an actual product can be more approximate.
In some optional embodiments, the sample after the initial test is placed in a humid and hot aging box for testing, and the distance between the sample and the inner wall of the humid and hot aging box is not less than 10 cm.
It can be understood that the temperature at the inner wall of the humid and hot aging box has an error with the temperature inside the humid and hot aging box, and the temperature of the humid and hot aging box close to the inner wall is usually higher than the temperature of the middle part of the humid and hot aging box, so that a certain distance is formed between the sample and the inner wall of the humid and hot aging box, and thus, the temperature environment between different samples is ensured to be consistent.
In the embodiment, the distance between the sample and the inner wall of the humid and hot aging box is not less than 10 cm, so that the humid and hot environment among the samples can be consistent, and the test result is more accurate.
In another aspect, the present embodiment further provides a method for testing a photovoltaic module, which is used for determining an initial test result and a post test result of any one of the above samples, and includes: and (3) contacting and conducting the test probe with the welding strip, wherein the pressing direction of the test probe is consistent with the direction of the main grid line on the sample.
It can be understood that the sample of the present invention is to weld a solder ribbon on a bare cell, and the bare cell has a main grid line 1 (refer to fig. 3), the main grid line 1 extends along the column direction Y, and the main grid line 1 includes a plurality of parallel-connected positive main grid lines and a plurality of parallel-connected negative main grid lines. Of course, the manner in which the initial test results and the post test results are tested is the same. In this embodiment, the tester is electrically connected to the sample by pressing the probes, one test probe of the tester is electrically contacted to the solder strip corresponding to the positive main gate line on the bare cell, and the other test probe of the tester is electrically contacted to the solder strip corresponding to the negative main gate line on the bare cell, so that the tester is electrically connected to the photovoltaic module, and the sample is subjected to power-up test by the tester, where the power-up test includes the above-mentioned power test, PL test, and EL test.
By the detection method, the corresponding initial test result and the post test result are recorded, and the attenuation value is calculated.
According to the embodiment, the damp-heat aging test method for the photovoltaic module provided by the invention at least has the following beneficial effects:
according to the invention, the welding strip is welded on the surface of the bare cell to form the sample to be tested, and the sample to be tested is subjected to a damp-heat aging test so as to directly evaluate the water vapor resistance of the cell of the core component of the photovoltaic module, so that the aging resistance data feedback can be rapidly and rapidly carried out, data support can be provided for the process optimization adjustment and the material type selection such as silver paste and the like of the bare cell end, and the step of carrying out the long-time DH evaluation on the photovoltaic module is omitted.
The mode of welding the welding strip by using the bare cell is more truly close to the state of the cell in an actual product, and because no packaging material is used for packaging, the corrosion speed of a sample is improved, the experimental process is accelerated, a testing mechanism for more effectively optimizing the cell process and the aging resistance is realized, and a large amount of testing resources are saved. The invention carries out the test by directly using the welding strip welding mode of the bare cell, saves a large amount of electric appliance connection and auxiliary material encapsulation, and matches with the existing cell test resource, so that the test is more accurate, and in order to explore the process improvement of the cell, the influence of other auxiliary materials is eliminated, and the humidity-resistant and heat-resistant aging factors related to the cell are more directly evaluated.
Although some specific embodiments of the present invention have been described in detail by way of examples, it should be understood by those skilled in the art that the above examples are for illustrative purposes only and are not intended to limit the scope of the present invention. It will be appreciated by those skilled in the art that modifications may be made to the above embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (10)
1. A damp and hot aging test method for a photovoltaic module is characterized by comprising the following steps:
a step of preparing a sample comprising: providing a bare cell, wherein the bare cell comprises a front surface and a back surface which are oppositely arranged; welding a welding strip on the front side of the bare cell to obtain a sample;
a step of sample testing comprising: carrying out initial test on the sample to obtain an initial test result, wherein the initial test comprises a power test, a PL test and an EL test; placing the sample after the initial test into a damp and hot aging box for testing, and setting the testing conditions of the damp and hot aging box as follows: the testing temperature is 85 plus or minus 1 ℃, the relative humidity is 85 plus or minus 1 percent, and the testing time is 24 hours;
a step of analyzing the result of the sample, comprising: and carrying out post-detection on the sample to obtain a post-detection result, wherein the post-detection comprises a power test, a PL test and an EL test, and calculating an attenuation value according to the initial test result and the post-detection result.
2. The method for damp-heat aging testing of a photovoltaic module according to claim 1, wherein the attenuation value is equal to (initial test result-post test result)/initial test result.
3. The method according to claim 1, wherein the front surface of the bare cell comprises main grid lines, and the solder strips correspond to the main grid lines one to one and are electrically connected with the main grid lines.
4. The method for testing the humid heat aging of a photovoltaic module according to claim 3, wherein the number of the solder ribbons is 5 or more and 20 or less.
5. The method for testing the humid heat aging of a photovoltaic module according to claim 4, wherein the length of the solder ribbon is not greater than the side length of the bare cell.
6. The method for testing the humid heat aging of a photovoltaic module according to claim 1, wherein the step of preparing the sample further comprises welding a solder ribbon on the back surface of the bare cell sheet.
7. The method for testing the humid heat aging of a photovoltaic module according to claim 6, wherein the number of the bare cell back side welding ribbons is not less than 3.
8. The method for testing the humid heat aging of a photovoltaic module according to claim 6, wherein the solder ribbon is soldered to the bare cell after being soaked in a flux.
9. The method for testing the humid heat aging of the photovoltaic module as claimed in claim 1, wherein the sample after the initial test is placed in a humid heat aging box for testing, and the distance between the sample and the inner wall of the humid heat aging box is not less than 10 cm.
10. A method for testing a photovoltaic module, for determining initial and post test results of a sample according to any one of claims 1 to 9, comprising: and contacting and conducting a test probe with the welding strip, wherein the pressing direction of the test probe is consistent with the direction of the main grid line on the sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210073515.9A CN114421888A (en) | 2022-01-21 | 2022-01-21 | Damp-heat aging test method for photovoltaic module |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210073515.9A CN114421888A (en) | 2022-01-21 | 2022-01-21 | Damp-heat aging test method for photovoltaic module |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114421888A true CN114421888A (en) | 2022-04-29 |
Family
ID=81275170
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210073515.9A Pending CN114421888A (en) | 2022-01-21 | 2022-01-21 | Damp-heat aging test method for photovoltaic module |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114421888A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113776938A (en) * | 2021-09-10 | 2021-12-10 | 东方日升新能源股份有限公司 | Method and device for testing connection performance of battery piece and welding strip |
-
2022
- 2022-01-21 CN CN202210073515.9A patent/CN114421888A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113776938A (en) * | 2021-09-10 | 2021-12-10 | 东方日升新能源股份有限公司 | Method and device for testing connection performance of battery piece and welding strip |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN108680486B (en) | Long-term weather resistance testing method for photovoltaic module | |
| JP2009105401A (en) | Process tester and testing methodology for thin-film photovoltaic device | |
| CN102707225A (en) | Integrated circuit testing optimizing method and testing device thereof | |
| CN114421888A (en) | Damp-heat aging test method for photovoltaic module | |
| CN109037091B (en) | Sliced battery reference piece and calibration method thereof | |
| Du et al. | Modeling, imaging and resistance analysis for crystalline silicon photovoltaic modules failure on thermal cycle test | |
| Wohlgemuth et al. | The effect of cell thickness on module reliability | |
| CN109239606B (en) | Lithium ion battery pre-formation negative pressure failure detection method | |
| Meena et al. | Investigation and Differentiation of Degradation Modes Affecting Series Resistance in Photovoltaic Cells and Modules | |
| CN115021678A (en) | Test method for evaluating long-term attenuation of solar cell | |
| CN112103215B (en) | Method for monitoring attenuation of slice or series welding performance of battery piece | |
| Li et al. | IEC and IEEE design qualifications: an analysis of test results acquired over nine years | |
| Pingel et al. | Investigation of damp heat degradation mechanisms and correlation to an accelerated test procedure (HAST) | |
| CN112367050A (en) | Electrical performance testing method suitable for large-size solar cell | |
| CN113937026A (en) | Method for testing damp and hot reliability of passivated contact battery | |
| Meng et al. | Process induced deflection and stress on encapsulated solar cells | |
| CN112271144B (en) | Method for testing humidity and heat resistance reliability of solar cell | |
| CN109520917A (en) | The corrosion resistance test method of cell piece slurry | |
| CN209822651U (en) | Novel label | |
| CN117375528A (en) | Component testing method | |
| KR102323403B1 (en) | Durability test device of solar cell unit | |
| CN117554275A (en) | Method for testing corrosion resistance of battery piece | |
| CN210429741U (en) | Heterojunction battery welding temperature detection device | |
| Zahid et al. | Analysis of Accelerated Damp Heat Test for Degradation Analysis and Recovery Method of Photovoltaic Module | |
| CN219997234U (en) | Thermoelectric element power generation performance test system and sample platform |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |