CN114384081B - Textile cloth defect detection device and detection method thereof - Google Patents
Textile cloth defect detection device and detection method thereof Download PDFInfo
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- CN114384081B CN114384081B CN202111582003.7A CN202111582003A CN114384081B CN 114384081 B CN114384081 B CN 114384081B CN 202111582003 A CN202111582003 A CN 202111582003A CN 114384081 B CN114384081 B CN 114384081B
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- textile cloth
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N21/8903—Optical details; Scanning details using a multiple detector array
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N2021/8909—Scan signal processing specially adapted for inspection of running sheets
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The invention discloses a textile cloth defect detection device and a detection method thereof, wherein the device comprises a drive control system, the drive control system is connected with a semiconductor laser array, a fast and slow axis collimating mirror and a beam splitter are sequentially arranged on an emergent light path of the semiconductor laser array, the beam splitter is respectively connected with a transmission imaging system and a photoelectric detection system, and the transmission imaging system is also connected with an off-axis beam control system. The method has the advantages that the semiconductor laser irradiates the surface of the textile cloth, reflected light on the surface of the textile cloth is fed back to the variation of the intensity of the self-mixing interference signal in the cavity of the semiconductor laser, the defect of the textile cloth is judged, the application of a complex algorithm is not needed, the real-time quick response detection can be realized, and the defects of low detection response speed and recognition errors caused by mass data processing are avoided. The textile cloth defect detection device is simple in structure and can improve detection precision and efficiency.
Description
Technical Field
The invention belongs to the technical field of textile material detection methods, relates to a textile cloth defect detection device, and further relates to a detection method of the detection device.
Background
In the cloth manufacturing process, the probability of occurrence of defects is increased along with the increase of processing layers, and the defects of various types including loose warp and weft, pollution, warp and wool, unclear openings, broken holes and the like are faced. There are two commonly employed defect detection methods: human visual defect detection and machine vision detection. In the manual visual detection, a long training process is required from study defects to operation detection and from liveness to proficiency; even a skilled worker is easy to cause physiological and psychological fatigue, so that the detection efficiency is extremely low. Machine vision is currently commonly used to replace manual vision defect detection. In machine vision detection, a deep learning technology is generally introduced, intelligent processing of visible light images is realized by continuously training and optimizing a large number of defect pictures and applying advanced algorithms such as a deep neural network, and cloth defects are rapidly identified by combining a filtering algorithm, so that higher detection accuracy is achieved in the error-prone detection process. However, machine vision is mainly based on advanced algorithms of deep learning to realize defect identification, and the image processing process of massive data inevitably generates data processing time delay, and error rate of defect identification can also be generated in the data processing process, especially for the first occurrence of defects with novel characteristics.
Disclosure of Invention
The invention aims to provide a textile cloth defect detection device, which solves the problem of error of defect identification in the prior art.
The technical scheme adopted by the invention is that the textile cloth defect detection device comprises a drive control system, wherein the drive control system is connected with a semiconductor laser array, a fast and slow axis collimating mirror and a beam splitter are sequentially arranged on an emergent light path of the semiconductor laser array, the beam splitter is respectively connected with a transmission imaging system and a photoelectric detection system, and the transmission imaging system is also connected with an off-axis beam control system.
The invention is also characterized in that:
the photoelectric detection system comprises a photoelectric detector, the photoelectric detector is connected with a computer through a data acquisition device, and the photoelectric detector is connected with a beam splitter.
The device also comprises a motion control system for controlling the start and stop of the textile fabric manufacture, and the motion control system is connected with a computer.
Another object of the invention is to provide a method for detecting defects in textile cloth.
The invention adopts another technical scheme that the textile cloth defect detection method adopts the textile cloth defect detection device and comprises the following steps:
step 1, a light beam emitted by a semiconductor laser array is collimated and emitted through a fast and slow axis collimating mirror;
step 2, the light beam emitted by the fast and slow axis collimating mirror is divided into two parts of light beams through a beam splitter, one light beam is incident to a transmission imaging system, and the other light beam is incident to a photoelectric detector;
step 3, forming compact linear array light spots on the detected textile cloth by the light beams entering the transmission imaging system, and simultaneously controlling off-axis light beams in the imaging light beams by the off-axis light beam control system to eliminate aberration formed by the off-axis light beams;
step 4, detecting a compact linear array facula part beam on the textile cloth, feeding back to a semiconductor laser array along a transmission imaging system, a beam splitter and a fast and slow axis collimating mirror, and forming a self-mixing interference signal;
and 5, after the self-mixing interference signals pass through the fast and slow axis collimating mirror and the beam splitter, one beam is incident to the transmission imaging system, the other beam is incident to the photoelectric detector for detection, the data acquisition device acquires the self-mixing interference signals of the photoelectric detector and sends the self-mixing interference signals to the computer, and the computer judges the intensity variation of the self-mixing interference signals to realize detection of the defects of the woven cloth.
And 6, when detecting that the textile cloth has defects, controlling the motion control system to stop weaving by the computer.
The beneficial effects of the invention are as follows:
according to the method for detecting the defects of the textile cloth, the semiconductor laser is used for irradiating the surface of the textile cloth, reflected light on the surface of the textile cloth is fed back to the variation of the intensity of the self-mixing interference signal in the cavity of the semiconductor laser, the defects of the textile cloth are judged, the application of a complex algorithm is not needed, the detection can be responded quickly in real time, and the defects of low detection response speed and recognition errors caused by mass data processing are avoided. The textile cloth defect detection device is simple in structure and can improve detection precision and efficiency.
Drawings
FIG. 1 is a schematic diagram of a textile cloth defect detection device according to the present invention;
FIG. 2 is a graph of the detection result of the method for detecting defects of woven cloth according to the present invention.
In the figure: 1. the system comprises a drive control system, a semiconductor laser array, a fast and slow axis collimating mirror, a beam splitter, a transmission imaging system, an off-axis beam control system, a photoelectric detector, a motion control system, a computer and a data acquisition device.
Detailed Description
The invention will be described in detail below with reference to the drawings and the detailed description.
The textile fabric defect detection device comprises a drive control system 1, wherein the drive control system 1 is connected with a semiconductor laser array 2, and the drive control system 1 is used for providing a drive power supply for the semiconductor laser array 2 and controlling the working temperature of the semiconductor laser. The fast and slow axis collimating mirror 3 and the beam splitter 4 are sequentially arranged on the emergent light path of the semiconductor laser array 2, the beam splitter 4 is respectively connected with the transmission imaging system 5 and the photoelectric detection system, the transmission imaging system 5 is also connected with the off-axis beam control system 6, and the off-axis beam control system 6 controls off-axis beams in imaging beams of the transmission imaging system 5 to eliminate aberration formed by the off-axis beams. The photoelectric detection system comprises a photoelectric detector 7, the photoelectric detector 7 is connected with a computer 9 through a data acquisition unit 10, and the photoelectric detector 7 is connected with the beam splitter 4. The device also comprises a motion control system 8 for controlling the start and stop of the manufacture of the textile cloth, wherein the motion control system 8 is connected with a computer 9, and when detecting that the textile cloth has defects, the device controls the stop of the spinning.
The textile cloth defect detection method specifically comprises the following steps:
step 1, a driving control system 1 provides a driving power supply for a semiconductor laser array 2 and controls the working temperature of semiconductor lasers, and light beams emitted by the semiconductor laser array 2 are collimated and emitted through a fast and slow axis collimating mirror 3;
step 2, the light beam emitted by the fast and slow axis collimating mirror 3 is divided into two parts of light beams through the beam splitter 4, one light beam is incident to the transmission imaging system 5, and the other light beam is incident to the photoelectric detector 7;
step 3, forming compact linear array light spots on the detected textile cloth by the light beams entering the transmission imaging system 5, and simultaneously controlling off-axis light beams in the imaging light beams by the off-axis light beam control system 6 to eliminate aberration formed by the off-axis light beams;
step 4, detecting a compact linear array light spot part beam on the textile cloth, forming a Doppler effect by reflecting the light of the textile cloth along a transmission imaging system 5, a beam splitter 4 and a fast and slow axis collimating mirror 3, and feeding back the Doppler effect to the semiconductor laser array 2 to form a self-mixing interference signal; when defects appear in the textile cloth, the reflectivity of the laser is influenced by the surface of the textile cloth, so that the intensity of the self-mixing interference signal is influenced. The self-mixing interference signal of cloth defect detection is shown in fig. 2, wherein straight lines represent signals without defects; when irradiated onto a cloth defect, a striped self-mixing interference signal appears.
Step 5, after the self-mixing interference signals pass through the fast and slow axis collimating mirror 3 and the beam splitter 4, one beam is incident to the transmission imaging system 5, the other beam is incident to the photoelectric detector 7 for detection, the data collector 10 collects the self-mixing interference signals of the photoelectric detector 7 and sends the self-mixing interference signals to the computer 9, and the computer 9 judges the intensity variation of the self-mixing interference signals to realize detection of textile cloth defects;
and 6, when detecting that the textile cloth has defects, the computer 9 controls the motion control system 8 to stop weaving.
According to the method for detecting the defects of the textile cloth, disclosed by the invention, the semiconductor laser is used for irradiating the surface of the textile cloth, reflected light on the surface of the textile cloth is fed back to the variation of the intensity of the self-mixing interference signal in the cavity of the semiconductor laser, so that the defects of the textile cloth are judged, the application of a complex algorithm is not needed, the detection can be responded quickly in real time, and the defect of slow detection response speed caused by mass data processing is avoided. The textile cloth defect detection device is simple in structure and can improve detection efficiency.
Claims (2)
1. The textile cloth defect detection method is characterized by comprising a textile cloth defect detection device, wherein the textile cloth defect detection device comprises a drive control system (1), the drive control system (1) is connected with a semiconductor laser array (2), a fast and slow axis collimating mirror (3) and a beam splitter (4) are sequentially arranged on an emergent light path of the semiconductor laser array (2), the beam splitter (4) is respectively connected with a transmission imaging system (5) and a photoelectric detection system, and the transmission imaging system (5) is also connected with an off-axis beam control system (6); the photoelectric detection system comprises a photoelectric detector (7), wherein the photoelectric detector (7) is connected with a computer (9) through a data acquisition device (10), and the photoelectric detector (7) is connected with a beam splitter (4); the device also comprises a motion control system (8) for controlling the start and stop of the textile fabric manufacture, wherein the motion control system (8) is connected with a computer (9), and comprises the following steps:
step 1, light beams emitted by the semiconductor laser array (2) are collimated and emitted through a fast and slow axis collimating mirror (3);
step 2, the light beam emitted by the fast and slow axis collimating mirror (3) is divided into two parts of light beams by a beam splitter (4), one light beam is incident to a transmission imaging system (5), and the other light beam is incident to a photoelectric detector (7);
step 3, forming compact linear array light spots on the detected textile cloth by the light beams entering the transmission imaging system (5), and simultaneously controlling off-axis light beams in the imaging light beams by an off-axis light beam control system (6) to eliminate aberration formed by the off-axis light beams;
step 4, detecting compact linear array light spot part light beams on the textile cloth, feeding back the light beams to the semiconductor laser array (2) along the transmission imaging system (5), the beam splitter (4) and the fast and slow axis collimating mirror (3), and forming self-mixing interference signals;
step 5, after the self-mixing interference signals pass through the fast and slow axis collimating mirror (3) and the beam splitter (4), one beam is incident to the transmission imaging system (5), the other beam is incident to the photoelectric detector (7) for detection, the data acquisition device (10) acquires the self-mixing interference signals of the photoelectric detector (7) and sends the self-mixing interference signals to the computer (9), and the computer (9) judges the intensity variation of the self-mixing interference signals to realize detection of textile cloth defects.
2. The method for detecting defects of textile cloth according to claim 1, further comprising a step 6 of controlling the motion control system (8) to stop weaving when detecting defects of the textile cloth by the computer (9).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111582003.7A CN114384081B (en) | 2021-12-22 | 2021-12-22 | Textile cloth defect detection device and detection method thereof |
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| CN202111582003.7A CN114384081B (en) | 2021-12-22 | 2021-12-22 | Textile cloth defect detection device and detection method thereof |
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| CN114384081B true CN114384081B (en) | 2023-07-28 |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111351790A (en) * | 2020-04-24 | 2020-06-30 | 上海御微半导体技术有限公司 | Defect detection device |
| WO2021227134A1 (en) * | 2020-05-11 | 2021-11-18 | 中国科学院上海光学精密机械研究所 | Absorptive defect single-beam photothermal measurement device and measurement method |
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| US5523839A (en) * | 1994-02-28 | 1996-06-04 | Minnesota Mining & Manufacturing | Differential optical interferometric profilomenty for real time manufacturing control |
| US6809808B2 (en) * | 2002-03-22 | 2004-10-26 | Applied Materials, Inc. | Wafer defect detection system with traveling lens multi-beam scanner |
| EP1718954A4 (en) * | 2004-01-22 | 2010-08-11 | Wintriss Engineering Corp | Illumination system for material inspection |
| CN202330297U (en) * | 2011-11-28 | 2012-07-11 | 陕西长岭纺织机电科技有限公司 | Device for automatically detecting texture defects |
| CN106501266B (en) * | 2016-10-18 | 2018-05-29 | 淮阴师范学院 | Optical thin film defect inspection method based on differential interference |
| US10830709B2 (en) * | 2018-09-28 | 2020-11-10 | Onto Innovation Inc. | Interferometer with pixelated phase shift mask |
| CN111256583B (en) * | 2020-02-03 | 2021-09-21 | 暨南大学 | Differential self-mixing interference measurement system and method |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111351790A (en) * | 2020-04-24 | 2020-06-30 | 上海御微半导体技术有限公司 | Defect detection device |
| WO2021227134A1 (en) * | 2020-05-11 | 2021-11-18 | 中国科学院上海光学精密机械研究所 | Absorptive defect single-beam photothermal measurement device and measurement method |
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