CN114370844A - Statistical method for uniformity of surface characteristic value of plate - Google Patents
Statistical method for uniformity of surface characteristic value of plate Download PDFInfo
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- CN114370844A CN114370844A CN202111563789.8A CN202111563789A CN114370844A CN 114370844 A CN114370844 A CN 114370844A CN 202111563789 A CN202111563789 A CN 202111563789A CN 114370844 A CN114370844 A CN 114370844A
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- 238000007619 statistical method Methods 0.000 title claims abstract description 10
- 239000000463 material Substances 0.000 claims abstract description 13
- 239000011159 matrix material Substances 0.000 claims abstract description 12
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000005096 rolling process Methods 0.000 claims abstract description 9
- 230000000149 penetrating effect Effects 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 abstract description 5
- 238000000053 physical method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012876 topography Methods 0.000 description 1
- 238000011077 uniformity evaluation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
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- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention discloses a statistical method for uniformity of surface characteristic values of plates, which is used for measuring the full size of a plate to be measured according to 400 points/m2Drawing lines for marking a dot matrix, forming a 5 cm-5 cm square lattice matrix when marking the dot matrix, taking a closed annular band at the edge of the plate material as a layer, taking a measuring grid every 5cm, inwards stepping the layer by layer, and then inwards stepping the layer by layer until the center; selecting two straight lines which form an angle of 45 degrees with the rolling direction, and penetrating through the edge, the center and the edge, wherein the passing measurement lattice is the lattice to be measured; and measuring two adjacent edges in the selected grid to be measured, marking characteristic values in the transverse and longitudinal directions of the rolling direction of the plate and recording the characteristic values. The method can comprehensively and accurately represent the distribution condition of the surface characteristic values (roughness, Pc value and the like) of the plate while considering the cost and the efficiency.
Description
Technical Field
The invention relates to a statistical method for uniformity of a surface characteristic value of a plate.
Background
At present, the influence of the surface micro-topography is increasingly highlighted among the factors influencing the stamping forming performance of the sheet material. The control of the surface appearance of the plate is not good (generally embodied as the roughness and the Pc value are not ideal and the distribution is not uniform), the performance is often appeared in the stamping process, and due to the complex action factors with various performances of the plate and the states of a stamping die, a press and the like under the comprehensive working conditions, the prejudgment and the improvement are difficult, so that the analysis of a large number of reasons is very troublesome, and the improvement direction is not clear.
In the practical application process, the size of the finished plate is large, the efficiency of calculating the uniformity by measuring the characteristic value of each area is extremely low, and the existing measuring equipment widely applied in the industry is divided into a macroscopic physical measurement mode and a microscopic laser measurement mode, wherein the macroscopic physical measurement mode is a linear measurement value about 50mm, the microscopic laser measurement mode is a micron-sized area measurement mode, and the efficiency of the omnibearing detection expanded to the width direction is extremely low.
In patent CN111412868, a laser measuring component and an optical measuring system are used to measure surface characteristic values such as roughness by a method of continuously shifting and measuring local areas, but because the measuring points are very limited, the whole surface characteristic value cannot be obtained, and a method and a standard for judging uniformity are also provided.
Disclosure of Invention
The invention aims to provide a statistical method for uniformity of a surface characteristic value of a plate, which aims to solve the problems that the measurement of the surface characteristic value of the plate under the prior art can only be carried out locally and microscopically, and the characteristic value measurement in the full-size range of the plate can not be carried out efficiently.
In order to solve the technical problems, the invention adopts the following technical scheme:
a statistical method for uniformity of surface characteristic values of a plate comprises the following steps:
measuring the full size of the plate to be measured according to 400 points/m2Drawing lines for marking a dot matrix, forming a 5 cm-5 cm square lattice matrix when marking the dot matrix, taking a closed annular band at the edge of the plate material as a layer, taking a measuring grid every 5cm, inwards stepping the layer by layer, and then inwards stepping the layer by layer until the center; selecting two straight lines which form an angle of 45 degrees with the rolling direction, and penetrating through the edge, the center and the edge, wherein the passing measurement lattice is the lattice to be measured;
setting the measuring length to be 5cm by using a short-range physical roughness measuring instrument, measuring two adjacent edges in the selected to-be-measured grid, marking and recording characteristic values in the transverse and longitudinal directions of the rolling direction of the plate;
according to the operation, at least 4 grids to be measured are arranged on each layer except the central area, the grids represent the distribution rule of the plate material in all directions, the average value X of each layer is obtained, the numerical value of each area of the layer is subtracted from the average value, the maximum absolute value is delta X, the average value of each delta X is delta XP, and the uniformity standard is judged according to the deviation value range.
Further, the characteristic values comprise roughness and a Pc value.
Further, Δ X ═ 10 and Δ XP ═ 10 are class a, 10< Δ X/Δ XP <30 is class B, and Δ X/Δ XP > -30 is class C.
Compared with the prior art, the invention has the beneficial technical effects that:
the invention can realize the measurement and uniformity analysis with low cost and high efficiency, and can comprehensively and accurately evaluate the uniformity of the surface characteristic value of the plate while giving consideration to the cost and the efficiency.
Drawings
The invention is further illustrated in the following description with reference to the drawings.
FIG. 1 is a schematic diagram of a dot matrix mark.
Detailed Description
As shown in FIG. 1, a statistical method for uniformity of surface characteristic values of sheet materials measures the full size of a sheet material to be measured according to 400 points/m2Drawing lines for marking a dot matrix, forming a 5 cm-5 cm square lattice matrix when marking the dot matrix, taking a closed annular band at the edge of the plate material as a layer, taking a measuring grid every 5cm, inwards stepping the layer by layer, and then inwards stepping the layer by layer until the center; selecting two straight lines which form an angle of 45 degrees with the rolling direction, and penetrating through the edge, the center and the edge, wherein the passing measurement lattice is the lattice to be measured;
setting the measuring length to be 5cm by using a short-range physical roughness measuring instrument, measuring two adjacent edges in the selected to-be-measured grid, marking and recording characteristic values in the transverse and longitudinal directions of the rolling direction of the plate;
according to the operation, at least 4 grids to be measured are arranged on each layer except the central area, the grids represent the distribution rule of the plate material in all directions, the average value X of each layer is obtained, the numerical value of each area of the layer is subtracted from the average value, the maximum absolute value is delta X, the average value of each delta X is delta XP, and the uniformity standard is judged according to the deviation value range.
The characteristic values comprise roughness and Pc values. Δ X < ═ 10 and Δ XP < ═ 10 for class a, 10< Δ X/Δ XP <30 for class B, and Δ X/Δ XP > -30 for class C.
Examples
Sheet Pc value distribution uniformity evaluation
1. And (3) forming transverse and vertical line grids on the plate at intervals of every 5cm, wherein the passing area is shown as a shadow, the rolling direction of the plate is shown as an arrow in figure 1, and the Pc values of two sides of the plate are respectively measured. As shown in the table below.
2. The rating is calculated as follows:
the above-described embodiments are merely illustrative of the preferred embodiments of the present invention, and do not limit the scope of the present invention, and various modifications and improvements of the technical solutions of the present invention can be made by those skilled in the art without departing from the spirit of the present invention, and the technical solutions of the present invention are within the scope of the present invention defined by the claims.
Claims (3)
1. A statistical method for uniformity of surface characteristic values of a plate is characterized by comprising the following steps:
measuring the full size of the plate to be measured according to 400 points/m2The density of the material is drawn to mark a dot matrix, a 5 cm-5 cm square lattice array is formed when the dot matrix is marked, closed annular bands at the edge of the plate material are taken as one layer, each 5cm is a measuring grid, one layer of closed annular bands is gradually arranged inwards, each 5cm is a measuring grid, and the layers are arranged one by oneThen, the step is carried out inwards until the center is reached; selecting two straight lines which form an angle of 45 degrees with the rolling direction, and penetrating through the edge, the center and the edge, wherein the passing measurement lattice is the lattice to be measured;
setting the measuring length to be 5cm by using a short-range physical roughness measuring instrument, measuring two adjacent edges in the selected to-be-measured grid, marking and recording characteristic values in the transverse and longitudinal directions of the rolling direction of the plate;
according to the operation, at least 4 grids to be measured are arranged on each layer except the central area, the grids represent the distribution rule of the plate material in all directions, the average value X of each layer is obtained, the numerical value of each area of the layer is subtracted from the average value, the maximum absolute value is delta X, the average value of each delta X is delta XP, and the uniformity standard is judged according to the deviation value range.
2. The statistical method for the uniformity of the surface characteristic values of the sheet material as claimed in claim 1, wherein the characteristic values include roughness and Pc value.
3. The statistical method for the uniformity of the surface characteristic values of the plate material as claimed in claim 1, wherein Δ X < ═ 10 and Δ XP < ═ 10 are class a, 10< Δ X/Δ XP <30 is class B, and Δ X/Δ XP > -30 is class C.
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| CN202111563789.8A CN114370844B (en) | 2021-12-20 | 2021-12-20 | Statistical method for uniformity of characteristic values of surface of plate |
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| CN202111563789.8A CN114370844B (en) | 2021-12-20 | 2021-12-20 | Statistical method for uniformity of characteristic values of surface of plate |
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| CN114370844A true CN114370844A (en) | 2022-04-19 |
| CN114370844B CN114370844B (en) | 2024-03-22 |
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