CN110008503A - A kind of platen method measuring flatness - Google Patents
A kind of platen method measuring flatness Download PDFInfo
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- CN110008503A CN110008503A CN201910090236.1A CN201910090236A CN110008503A CN 110008503 A CN110008503 A CN 110008503A CN 201910090236 A CN201910090236 A CN 201910090236A CN 110008503 A CN110008503 A CN 110008503A
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- 238000005259 measurement Methods 0.000 claims abstract description 58
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/30—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring roughness or irregularity of surfaces
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/10—Geometric CAD
- G06F30/18—Network design, e.g. design based on topological or interconnect aspects of utility systems, piping, heating ventilation air conditioning [HVAC] or cabling
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
Abstract
The invention discloses a kind of platen method measuring flatness, layout measurement method includes the following steps: rectangle platen face is carried out grid with preprepared level meter；It reads the grid to layout the data of measurement, data matrix is constituted using doubly subscripted variable；Datum plane is established, the actual difference between the data matrix each point and the datum plane is calculated by preconfigured objective function.The invention has the benefit that not limited by measuring condition, it can be according to the different measurement requests of measured piece, change the input of the parameters such as measurement segment length, measurement segment number, level meter indicating value essence, it is used in production scene simple to operate, it is easy to grasp, achievees the purpose that improve the working efficiency of measurement of planeness technical process and the quality of data processed result.
Description
Technical field
The present invention relates to the computer data processing technology fields of platen facial plane degree, it particularly relates to one
Kind platen method measuring flatness.
Background technique
Numerical control mill, boring machine and surface grinding machine are important equipments used in current equipment manufacture machining.These
The work top of lathe is the reference for installation of workpiece at work, is geometry after work top assembles during Machine Manufacture
The benchmark of precision checking, and geometric accuracy is to guarantee the basis of lathe operating accuracy.Therefore the precision measure of work top is whole
The crucial precision project that a quality inspection technique requires, according to " detection of GB/T11337-2004 straightness error " national Specification,
Rectangular table face level meter, grid, which is layouted when mensuration measurement flatness is assembly, uses measurement method and tool all very simple
Single, measurement accuracy is very high, is also convenient for according to modified result, but data processing complex.Right work top flatness needs several
Secondary measurement, amendment can be only achieved the required precision of factory.Therefore the data processing work amount of measurement is big, complicated, cumbersome, is easy to
Wrong phenomenon is badly in need of changing.Therefore this problem of this invention very good solution, greatly improves the work of this technical process
Make the quality of efficiency and data processed result.
For the problems in the relevant technologies, currently no effective solution has been proposed.
Summary of the invention
For the problems in the relevant technologies, the present invention proposes a kind of platen method measuring flatness, existing to overcome
There is above-mentioned technical problem present in the relevant technologies.
For this purpose, the specific technical solution that the present invention uses is as follows:
A kind of platen method measuring flatness, method includes the following steps:
Rectangle platen face is carried out grid with preprepared level meter to layout measurement；
It reads the grid to layout the data of measurement, data matrix is constituted using doubly subscripted variable；
Datum plane is established, the data matrix each point and the datum plane are calculated by preconfigured objective function
Between actual difference.
Further, rectangle platen face grid is carried out with preprepared level meter to layout the step of measuring
Include:
Longitudinal measurement is carried out to rectangle platen face using preprepared level meter, obtains the longitudinal measurement of n column
Data L1；
Cross measure is carried out to rectangle platen face using preprepared level meter, obtains m row cross measure
Data L2；
Wherein, n and m is the natural number more than or equal to 2.
Further, the step of reading the grid to layout the data of measurement, data matrix constituted using doubly subscripted variable
Include:
By longitudinal measurement data L1A is constituted using doubly subscripted variable1n、a2n、ain…amn；
By the cross measure data L2A is constituted using doubly subscripted variablem1、am2、amj…amn；
By longitudinal measurement data L1First row and the cross measure data L2The measuring section zero-bit of the first row and tested
Face horizontal reference zero-bit is overlapped, and constitutes the data matrix.
Further, the data matrix are as follows:
Further, the step of establishing datum plane include:
Three farthest point a of the data matrix distance are chosen in tested plane11、am1And a1nEstablish the datum plane；
Wherein, a11With am1And a1nNumerical value distinguish equal zero setting.
Further, it is calculated between the data matrix each point and the datum plane by preconfigured objective function
The step of actual difference includes:
It derives and constructs the objective function；
According to constructed objective function input variable；
The objective function calculates output variable according to the variable inputted, obtain the data matrix each point with it is described
Actual difference between datum plane.
Further, deriving the step of constructing the objective function includes:
Calculate the numerical value of each measuring point P ' in the data matrix first row；
Calculate the numerical value of the data matrix each measuring point P " of each row of transversal sectional in addition to first row；
Calculating each measuring point of each transverse direction adds first row to correspond to measuring point P﹟Numerical value；
Calculate vertical slope P1；
Calculate lateral slope P2；
The objective function P (i, j) is calculated using calculation formula；
Wherein, the calculation formula is P (i, j)=P﹟-P1-P2=P ' (i, 1)+P " (i, j)-(i-1) × P1-(j-1)×
P2。
Further, the formula for calculating the numerical value of each measuring point P ' in the data matrix first row are as follows:
The formula for calculating data matrix numerical value of each measuring point P " of each row of transversal sectional in addition to first row are as follows:
Each each measuring point of transverse direction of calculating adds first row to correspond to measuring point P﹟Numerical value formula are as follows:
The calculating vertical slope P1Formula are as follows:
The lateral slope P of the calculating2Formula are as follows:
Wherein, the objective function Equation are as follows:
Further, the input variable:
M is cross measure number of segment, i.e. line number；
N is longitudinal measurement number of segment, i.e. columns；
Q is level meter indicating accuracy, and unit is millimeter；
L1Length is measured to be longitudinal, unit is millimeter；
L2For cross measure length, unit is millimeter；
aijFor the reading for being tested the i-th row, jth column measuring point in plane；
I is m to measurement ordinal number, also, i=1,2 ... m；
J is n to measurement ordinal number, also, j=1,2 ... n.
Further, the output variable:
P (i, j) is the difference of the i-th row, jth column measuring point and datum plane in tested plane, the aij point of position and input
It is corresponding；
Wherein, SmaxFor the maximum difference in measuring point with datum plane, unit is micron；
SminFor the minimal difference in measuring point with datum plane, unit is micron；
S is that flatness surveys reading value, and unit is micron.
The invention has the benefit that by the way that rectangle platen face is carried out grid with preprepared level meter
It layouts measurement；It reads the grid to layout the data of measurement, data matrix is constituted using doubly subscripted variable；Datum plane is established,
The actual difference between the data matrix each point and the datum plane is calculated by preconfigured objective function；To not by
The limitation of measuring condition can change measurement segment length, measurement segment number, level meter and show according to the different measurement requests of measured piece
It is worth the input of the parameters such as essence, in production scene using simple to operate, is easy to grasp, reaches and improve measurement of planeness technique mistake
The purpose of the quality of the working efficiency and data processed result of journey.
Detailed description of the invention
It in order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, below will be to institute in embodiment
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without creative efforts, can also obtain according to these attached drawings
Obtain other attached drawings.
Fig. 1 is a kind of flow chart of platen method measuring flatness according to an embodiment of the present invention；
Fig. 2 be a kind of grid of platen method measuring flatness according to an embodiment of the present invention layout measurement signal
Figure；
Fig. 3 is a kind of objective function building measurement of platen method measuring flatness according to an embodiment of the present invention
Flow chart.
Specific embodiment
To further illustrate that each embodiment, the present invention are provided with attached drawing, these attached drawings are that the invention discloses one of content
Point, mainly to illustrate embodiment, and the associated description of specification can be cooperated to explain the operation principles of embodiment, cooperation ginseng
Examine these contents, those of ordinary skill in the art will be understood that other possible embodiments and advantages of the present invention, in figure
Component be not necessarily to scale, and similar component symbol is conventionally used to indicate similar component.
According to an embodiment of the invention, providing a kind of platen method measuring flatness.
Now in conjunction with the drawings and specific embodiments, the present invention is further described, as shown in Figure 1-3, implement according to the present invention
The platen method measuring flatness of example, method includes the following steps:
Rectangle platen face is carried out grid with preprepared level meter and layouted measurement by step S101；
Step S102 reads the grid and layouts the data of measurement, constitutes data matrix using doubly subscripted variable；
Step S103, establishes datum plane, calculates the data matrix each point and institute by preconfigured objective function
State the actual difference between datum plane.
With the aid of the technical scheme, thus the limitation of not tested amount condition, can according to the different measurement requests of measured piece,
The input for changing the parameters such as measurement segment length, measurement segment number, level meter indicating value essence uses side easy to operate in production scene
Just, it is easy to grasp, achievees the purpose that improve the working efficiency of measurement of planeness technical process and the quality of data processed result.
In one embodiment, rectangle platen face grid is carried out with preprepared level meter to layout measurement
The step of include:
Longitudinal measurement is carried out to rectangle platen face using preprepared level meter, obtains the longitudinal measurement of n column
Data L1；
Cross measure is carried out to rectangle platen face using preprepared level meter, obtains m row cross measure
Data L2；
Wherein, n and m is the natural number more than or equal to 2.
In one embodiment, it reads the grid to layout the data of measurement, data matrix is constituted using doubly subscripted variable
The step of include:
By longitudinal measurement data L1A is constituted using doubly subscripted variable1n、a2n、ain…amn；
By the cross measure data L2A is constituted using doubly subscripted variablem1、am2、amj…amn；
By longitudinal measurement data L1First row and the cross measure data L2The measuring section zero-bit of the first row and tested
Face horizontal reference zero-bit is overlapped, and constitutes the data matrix.
In one embodiment, the data matrix are as follows:
In one embodiment, the step of establishing datum plane include:
Three farthest point a of the data matrix distance are chosen in tested plane11、am1And a1nEstablish the datum plane；
Wherein, a11With am1And a1nNumerical value distinguish equal zero setting.
In one embodiment, the data matrix each point is calculated by preconfigured objective function and the benchmark is flat
The step of actual difference between face includes:
It derives and constructs the objective function；
According to constructed objective function input variable；
The objective function calculates output variable according to the variable inputted, obtain the data matrix each point with it is described
Actual difference between datum plane.
In one embodiment, deriving the step of constructing the objective function includes:
Calculate the numerical value of each measuring point P ' in the data matrix first row；
Calculate the numerical value of the data matrix each measuring point P " of each row of transversal sectional in addition to first row；
Calculating each measuring point of each transverse direction adds first row to correspond to measuring point P﹟Numerical value；
Calculate vertical slope P1；
Calculate lateral slope P2；
The objective function P (i, j) is calculated using calculation formula；
Wherein, the calculation formula is P (i, j)=P﹟-P1-P2=P ' (i, 1)+P " (i, j)-(i-1) × P1-(j-1)×
P2。
In one embodiment, the formula for calculating the numerical value of each measuring point P ' in the data matrix first row are as follows:
The formula for calculating data matrix numerical value of each measuring point P " of each row of transversal sectional in addition to first row are as follows:
Each each measuring point of transverse direction of calculating adds first row to correspond to measuring point P﹟Numerical value formula are as follows:
The calculating vertical slope P1Formula are as follows:
The lateral slope P of the calculating2Formula are as follows:
Wherein, the objective function Equation are as follows:
In one embodiment, the input variable:
M is cross measure number of segment, i.e. line number；
N is longitudinal measurement number of segment, i.e. columns；
Q is level meter indicating accuracy, and unit is millimeter；
L1Length is measured to be longitudinal, unit is millimeter；
L2For cross measure length, unit is millimeter；
aijFor the reading for being tested the i-th row, jth column measuring point in plane；
I is m to measurement ordinal number, also, i=1,2 ... m；
J is n to measurement ordinal number, also, j=1,2 ... n.
In one embodiment, the output variable:
P (i, j) is the difference of the i-th row, jth column measuring point and datum plane in tested plane, the aij point of position and input
It is corresponding；
Wherein, SmaxFor the maximum difference in measuring point with datum plane, unit is micron；
SminFor the minimal difference in measuring point with datum plane, unit is micron；
S is that flatness surveys reading value, and unit is micron.
In addition, in specific application, being worked out in the building and solution of objective function using BASIC language, using double
The calling repeatedly of each data of Do statement solid line is required with reaching superposition as defined in standard and overturning；Successively by DATA statement
Input each variable M, N, Q, L1、L2It joins end to end and sequentially inputs one by one, computer is pressed by Row Column with input measurement data
Objective function prints out flatness numerical value after carrying out operation.
Wherein, the input regulation of variable Q are as follows:
To level meter indicating accuracy, for example, 0.02/1000mm when inputting computer, is inputted by Q=0.02mm；With this
Analogize, then Q value inputs 0.001/1000mm by 0.001；Input variable value unit is micron.
Benchmark origin: P (1,1) input is zero；This point is origin and level meter the rising in tested surface on desirable level face
Point coincides.
In conclusion by means of above-mentioned technical proposal of the invention, by by rectangle platen face with preparing in advance
Good level meter carries out grid and layouts measurement；It reads the grid to layout the data of measurement, data is constituted using doubly subscripted variable
Matrix；Datum plane is established, is calculated between the data matrix each point and the datum plane by preconfigured objective function
Actual difference；To not tested amount condition limitation, can according to the different measurement requests of measured piece, change measurement segment length,
The input for measuring segment number, the parameters such as level meter indicating value essence is easy to grasp, reach in production scene using simple to operate
Improve the purpose of the working efficiency of measurement of planeness technical process and the quality of data processed result.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Within mind and principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (10)
1. a kind of platen method measuring flatness, which is characterized in that method includes the following steps:
Rectangle platen face is carried out grid with preprepared level meter to layout measurement；
It reads the grid to layout the data of measurement, data matrix is constituted using doubly subscripted variable；
Datum plane is established, is calculated between the data matrix each point and the datum plane by preconfigured objective function
Actual difference.
2. platen method measuring flatness according to claim 1, which is characterized in that by rectangle platen
Face carries out grid the step of measuring of layouting with preprepared level meter
Longitudinal measurement is carried out to rectangle platen face using preprepared level meter, n is obtained and arranges longitudinal measurement data
L1；
Cross measure is carried out to rectangle platen face using preprepared level meter, obtains m row cross measure data
L2；
Wherein, n and m is the natural number more than or equal to 2.
3. platen method measuring flatness according to claim 2, which is characterized in that read the grid and layout
The data of measurement, using doubly subscripted variable constitute data matrix the step of include:
By longitudinal measurement data L1A is constituted using doubly subscripted variable1n、a2n、ain…amn；
By the cross measure data L2A is constituted using doubly subscripted variablem1、am2、amj…amn；
By longitudinal measurement data L1First row and the cross measure data L2The measuring section zero-bit and tested surface water of the first row
Flat benchmark zero-bit is overlapped, and constitutes the data matrix.
4. platen method measuring flatness according to claim 3, which is characterized in that the data matrix are as follows:
5. platen method measuring flatness according to claim 4, which is characterized in that establish the step of datum plane
Suddenly include:
Three farthest point a of the data matrix distance are chosen in tested plane11、am1And a1nEstablish the datum plane；
Wherein, a11With am1And a1nNumerical value distinguish equal zero setting.
6. platen method measuring flatness according to claim 5, which is characterized in that pass through preconfigured mesh
Scalar functions calculate the step of actual difference between the data matrix each point and the datum plane and include:
It derives and constructs the objective function；
According to constructed objective function input variable；
The objective function calculates output variable according to the variable inputted, obtains the data matrix each point and the benchmark
The actual difference of interplanar.
7. platen method measuring flatness according to claim 6, which is characterized in that derive and construct the target
The step of function includes:
Calculate the numerical value of each measuring point P ' in the data matrix first row；
Calculate the numerical value of the data matrix each measuring point P " of each row of transversal sectional in addition to first row；
Calculating each measuring point of each transverse direction adds first row to correspond to measuring point P﹟Numerical value；
Calculate vertical slope P1；
Calculate lateral slope P2；
The objective function P (i, j) is calculated using calculation formula；
Wherein, the calculation formula is P (i, j)=P﹟-P1-P2=P ' (i, 1)+P " (i, j)-(i-1) × P1-(j-1)×P2。
8. platen method measuring flatness according to claim 7, which is characterized in that described to calculate the data
The formula of the numerical value of each measuring point P ' in matrix first row are as follows:
The formula for calculating data matrix numerical value of each measuring point P " of each row of transversal sectional in addition to first row are as follows:
Each each measuring point of transverse direction of calculating adds first row to correspond to measuring point P﹟Numerical value formula are as follows:
The calculating vertical slope P1Formula are as follows:
The lateral slope P of the calculating2Formula are as follows:
Wherein, the objective function Equation are as follows:
9. platen method measuring flatness according to claim 8, which is characterized in that the input variable:
M is cross measure number of segment, i.e. line number；
N is longitudinal measurement number of segment, i.e. columns；
Q is level meter indicating accuracy, and unit is millimeter；
L1Length is measured to be longitudinal, unit is millimeter；
L2For cross measure length, unit is millimeter；
aijFor the reading for being tested the i-th row, jth column measuring point in plane；
I is m to measurement ordinal number, also, i=1,2 ... m；
J is n to measurement ordinal number, also, j=1,2 ... n.
10. platen method measuring flatness according to claim 9, which is characterized in that the output variable:
P (i, j) is the difference of the i-th row, jth column measuring point and datum plane in tested plane, the aij point pair of position and input
It answers；
Wherein, SmaxFor the maximum difference in measuring point with datum plane, unit is micron；
SminFor the minimal difference in measuring point with datum plane, unit is micron；
S is that flatness surveys reading value, and unit is micron.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111811442A (en) * | 2020-07-14 | 2020-10-23 | 上海船舶工艺研究所(中国船舶工业集团公司第十一研究所) | Method for rapidly measuring and calculating planeness of large-area deck of ship |
| CN114370844A (en) * | 2021-12-20 | 2022-04-19 | 包头钢铁（集团）有限责任公司 | Statistical method for uniformity of surface characteristic value of plate |
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