CN114356679B - Method and device for setting bad block, storage medium and electronic equipment - Google Patents
Method and device for setting bad block, storage medium and electronic equipment Download PDFInfo
- Publication number
- CN114356679B CN114356679B CN202210266830.3A CN202210266830A CN114356679B CN 114356679 B CN114356679 B CN 114356679B CN 202210266830 A CN202210266830 A CN 202210266830A CN 114356679 B CN114356679 B CN 114356679B
- Authority
- CN
- China
- Prior art keywords
- bad block
- block
- bad
- error type
- marking
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Abstract
The invention provides a method, a device, a storage medium and electronic equipment for realizing bad block setting, wherein the method comprises the following steps: setting bad block configuration parameters in host simulation equipment, wherein the bad block configuration parameters comprise bad block error types and bad block triggering conditions, and the bad block triggering conditions are that the operation times of operation types corresponding to the bad block error types reach a preset time threshold; when the host simulation equipment operates the storage particle simulation equipment, counting the operation times of different operation types; when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type, marking the physical block currently operated in the storage particle simulation equipment as a corresponding bad block of the bad block error type. The method realizes the bad block setting by setting the bad block triggering mechanism according to the operation times corresponding to the read, write and erase operation types, ensures that the bad block is triggered as required, and ensures that the bad block processing logic of the firmware is verified.
Description
Technical Field
The invention relates to the technical field of storage device testing, in particular to a method and a device for realizing bad block setting, a storage medium and electronic equipment.
Background
Bad block testing is an important testing link in SSD system testing. When nand is actually used, it is difficult to make a bad block appear on the corresponding logical process as expected by the test, resulting in difficulty in verifying the bad block processing flow of FW. The traditional bad block error making processing is to directly insert erase, program and read error into a block or a page in nand, and the defect of the error making mode is that whether the error of a corresponding physical block is triggered or not is uncertain in the running process, so that the bad block cannot be triggered.
The existing bad block test is to set a bad block at a physical position in a nonvolatile memory, if the physical position is not operated in the test process, the bad block cannot be triggered, so that the set bad block is invalid, the bad block processing logic of firmware cannot be verified, and the processing flow of the bad block cannot be triggered.
Disclosure of Invention
In view of the above, the present invention has been made to provide a method, apparatus, storage medium, and electronic device for implementing bad block setting that overcome or at least partially solve the above problems.
In one aspect of the present invention, a method for implementing bad block setting is provided, where the method includes:
setting bad block configuration parameters in host simulation equipment, wherein the bad block configuration parameters comprise bad block error types and bad block triggering conditions, and the bad block triggering conditions are that the operation times of operation types corresponding to the bad block error types reach a preset time threshold;
when the host simulation equipment operates the storage particle simulation equipment, counting the operation times of different operation types;
and when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type, marking the physical block currently operated in the storage particle simulation equipment as a corresponding bad block of the bad block error type.
Further, the method further comprises:
and sending the error type of the bad block of the current physical block to the firmware to be tested so that the firmware to be tested triggers the preset bad block processing logic operation according to the error type of the bad block.
Further, the error types of the bad blocks comprise bad blocks in read operation, bad blocks in write operation and bad blocks in erase operation;
the marking of the physical block currently operating in the storage grain simulation equipment as the corresponding bad block of the bad block error type comprises the following steps:
if the error type of the bad block of the currently triggered bad block is a read operation bad block, marking 4Kbyte in the current physical page in the current physical block in the current operation as a read bad block;
if the error type of the bad block triggered currently is a bad block in write operation, marking a current physical page in the physical block in current operation as a bad block in write operation;
and if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, marking the currently operated physical block as a bad block.
Further, the configuration parameters of the bad blocks further include the number of the bad blocks set in the test, and the number is 1 or more.
Further, the host simulation device and the storage particle simulation device realize simulation operation in a double-process mode.
In a second aspect of the present invention, an apparatus for implementing bad block setting is provided, where the apparatus includes:
the device comprises a setting module, a judging module and a judging module, wherein the setting module is used for setting bad block configuration parameters in host simulation equipment, the bad block configuration parameters comprise a bad block error type and a bad block triggering condition, and the bad block triggering condition is that the operation times of an operation type corresponding to the bad block error type reach a preset time threshold;
the counting module is used for counting the operation times of different operation types when the host simulation equipment operates the storage particle simulation equipment;
and the marking module is used for marking the physical block currently operated in the storage particle simulation equipment as the corresponding bad block with the bad block error type when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type.
Further, the apparatus further comprises:
and the sending module is used for sending the bad block error type of the current physical block to the firmware to be tested so that the firmware to be tested triggers the preset bad block processing logic operation according to the bad block error type.
Further, the bad block error types comprise a read operation bad block, a write operation bad block and an erase operation bad block;
the marking module is specifically used for marking the bad block according to the following mode, and if the error type of the bad block of the currently triggered bad block is a read operation bad block, marking 4Kbyte in the current physical page in the currently operated physical block as a read bad block; if the error type of the bad block triggered currently is a bad block in write operation, marking a current physical page in the physical block in current operation as a bad block in write operation; and if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, marking the currently operated physical block as a bad block.
In another aspect of the present invention, a computer-readable storage medium is provided, on which a computer program is stored, which computer program, when being executed by a processor, carries out the steps of the method of carrying out bad block setting as described above.
In yet another aspect of the present invention, an electronic device is further provided, which includes a memory, a processor, and a computer program stored on the memory and executable on the processor, and the processor executes the computer program to implement the steps of the method for setting the bad block as described above.
The method, the device, the storage medium and the electronic equipment for realizing bad block setting provided by the embodiment of the invention realize the bad block setting by setting the bad block triggering mechanism according to the operation times corresponding to the read, write and erase operation types, can easily and conveniently set the bad block, so that the bad block set each time can be triggered, the efficiency of verifying firmware FW bad block processing logic is improved, and the testing efficiency is improved.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 is a flowchart of a method for implementing bad block setting according to an embodiment of the present invention;
fig. 2 is a schematic diagram of an implementation of an SSD simulator according to an embodiment of the invention;
fig. 3 is a block diagram of an apparatus for implementing bad block setting according to an embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
FIG. 1 schematically illustrates a flow diagram of a method of implementing bad block setup according to one embodiment of the invention. Referring to fig. 1, the method for implementing bad block setting according to the embodiment of the present invention specifically includes the following steps:
and S11, setting bad block configuration parameters in the host simulation equipment, wherein the bad block configuration parameters comprise a bad block error type and a bad block triggering condition. The bad block error types comprise a read operation bad block, a write operation bad block and an erase operation bad block, and the bad block triggering condition is that the operation times of the operation types corresponding to the bad block error types reach a preset time threshold.
Specifically, a bad block means that some flash areas in nand flash cannot be erased, and such a unit area is a bad block. Since the read and write operations in nand flash are in page units, the erase is in block units, and the erase operation must be performed before the write operation, a minimum operable unit is a block, and any irreparable bit error occurs in the entire block, and the block is considered to be a bad block.
In this embodiment, a bad block configuration parameter may be set in the host analog device according to a preset bad block test requirement, so as to trigger a bad block according to the number of times of reading and writing to realize the bad block setting.
S12, when the host simulation equipment operates the storage particle simulation equipment, counting the operation times of different operation types;
and S13, when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type, marking the physical block currently operated in the storage particle simulation equipment as the corresponding bad block of the bad block error type.
The invention can randomly insert the bad blocks with different error types such as reading, writing, erasing and the like by setting the bad block configuration parameters in the host simulation equipment of the SSD simulator, thereby efficiently verifying the bad block processing logic of the Firmware (FW). The SSD simulator realizes the simulation of a hardware environment by using software resources to replace the real environments such as an FPGA, a chip and the like so as to realize the verification and the test of FW software logic. Fig. 2 is a schematic diagram of an implementation of an SSD simulator according to an embodiment of the invention. As shown in fig. 2, the SSD emulator is mainly composed of two parts, a host emulation device at the host end and a storage particle emulation device at the device end, where the host emulation device and the storage particle emulation device implement emulation operation in a dual-process manner, and socket communication is used for inter-process communication. One process serves as a host side and the other process serves as a device side. The host side is a main process, and the device side is a sub process. The host end sends commands such as reading and writing to the equipment end, the equipment end sends responses back to the host end, and therefore one-time communication is completed, and data transmission between the two processes is achieved through a memory sharing mode.
The main functions of the host simulation equipment are as follows: realizing command management, pattern attribute generation of read-write data, space distribution, data comparison, bad block setting and simulation of Nand space creation;
the main functions of the storage particle simulation device are: analyzing the command sent by the host simulation equipment, storing the command of the host simulation equipment, sending the command to firmware FW, and returning to the host simulation equipment after the command is finished;
the simulation implementation of the Nand flash is as follows: the processing of read and write erase commands supports SLC, TLC modes, returning commands or data to FW or host emulation devices, modes supporting compressed data and uncompressed data.
The method for realizing bad block setting provided by the embodiment of the invention realizes bad block setting by adopting a mode of setting a bad block triggering mechanism according to the operation times corresponding to the read, write and erase operation types, can easily and conveniently set bad blocks, ensures that the bad blocks set each time can be triggered, improves the efficiency of verifying firmware FW bad block processing logic and improves the testing efficiency.
In the embodiment of the invention, after the physical block currently operated in the storage particle simulation equipment is marked as the corresponding bad block with the bad block error type, the bad block error type of the current physical block is sent to the firmware to be tested, so that the firmware to be tested triggers the preset bad block processing logic operation according to the bad block error type, the verification of the firmware FW bad block processing logic is realized, and the efficiency of verifying the FW bad block processing logic is improved.
The bad block error types in the embodiment of the invention comprise a read operation bad block, a write operation bad block and an erase operation bad block.
The method specifically includes the following implementation methods that if the error type of the currently triggered bad block is a read operation bad block, the read operation bad block sets the minimum unit to be 4Kbyte, and therefore when the read error is triggered, the 4Kbyte in the current physical page in the currently operated physical block is marked as a read bad block; if the error type of the bad block of the currently triggered bad block is a write operation bad block, setting the minimum unit of the write operation bad block as a page, and marking the current physical page in the currently operated physical block as a write bad block when the write error is triggered; if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, the minimum unit set by the erasing operation bad block is one block, and therefore the physical block currently operated is marked as the bad block when the erasing error is triggered.
The bad block configuration parameters also include the number of the bad blocks set in the test, and the number is 1 or more.
In a specific embodiment, the bad block configuration parameters may be set in the host analog device according to predetermined times, so as to implement insertion of bad blocks of the read/write/erase error type in the nand, and when each pair of nand is read/write/erase/operated, the number of operations is reduced once until the number is reduced to 0, and the current physical location is set as a bad block. For example, if it is desired to set a bad block of the erase error type in the slc area, then the slc area generates an erase error at the 2 nd erase setting. When 2 times of erasing operations are sent to the slc, a bad block of the position of a physical block which is currently operated is triggered, the current physical block in the slc area is marked as a bad block, and then the bad block state of the physical block is returned to the firmware FW to trigger the bad block processing logic of the FW.
The following description will be made by taking an operation when a nand error type (nand error type) is set as an erase error type (erase), and the write error type (program) and the read error type (read) are implemented in the same manner, but different types of errors are generated, and different units of marked bad blocks are generated, and the logic processing is the same.
Distributing a shared memory of a bad block trigger error injection for storing different types of errors and trigger conditions of corresponding error types, and specifically adopting a shared variable time _ err [ error _ type ] [ ei _ slot _ num ] record;
wherein, error type is error type such as nand _ erase, nand _ read, nand _ program, etc.;
ei _ slot _ num is the number of error types set each time, and the number that can be set for erase error is the value of ei _ slot _ num, i.e. multiple error can be set in one test. For example, the currently set type is nand _ erase _ error, and nand error type is set as: erase, which triggers error type when operating for nand the nth time (times), i.e. sets time _ err [ nand _ erase _ error ] [ ei _ slot _ num ] = N;
every time when performing erase operation on nand, subtracting 1 from the value of time _ err [ nand _ erase _ err ] [ ei _ slot _ num ];
judging whether the current time _ err [ nand _ erase _ err ] [ ei _ slot _ num ] is 0 or not, and if so, setting the state of the block of the current erase to be a bad block. And returning the current state to the firmware FW, namely triggering the bad block processing flow of the FW
For simplicity of explanation, the method embodiments are described as a series of acts or combinations, but those skilled in the art will appreciate that the embodiments are not limited by the order of acts described, as some steps may occur in other orders or concurrently with other steps in accordance with the embodiments of the invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
Fig. 3 schematically shows a structural diagram of an apparatus for implementing bad block setting according to an embodiment of the present invention. Referring to fig. 3, the apparatus for implementing bad block setting in the embodiment of the present invention specifically includes a setting module 201, a statistics module 202, and a marking module 203, where:
a setting module 201, configured to set a bad block configuration parameter in a host analog device, where the bad block configuration parameter includes a bad block error type and a bad block triggering condition, and the bad block triggering condition is that the operation frequency of an operation type corresponding to the bad block error type reaches a preset frequency threshold;
a counting module 202, configured to count the operation times of different operation types when the host simulation device operates the storage particle simulation device;
the marking module 203 is configured to mark a physical block currently operated in the storage grain simulation device as a corresponding bad block of a bad block error type when the operation frequency of any operation type satisfies a bad block triggering condition of a bad block error type corresponding to the operation type.
In the embodiment of the present invention, the apparatus further includes a sending module, not shown in the drawing, where the sending module is configured to send the bad block error type of the current physical block to the firmware to be tested, so that the firmware to be tested triggers a preset bad block processing logic operation according to the bad block error type.
In the embodiment of the invention, the error types of the bad block comprise a bad block in read operation, a bad block in write operation and a bad block in erase operation.
Further, the marking module 203 is specifically configured to mark a bad block in the following manner, and if the error type of the bad block of the currently triggered bad block is a read operation bad block, mark a 4Kbyte in a current physical page in the currently operated physical block as a read bad block; if the error type of the bad block triggered currently is a bad block in write operation, marking a current physical page in the physical block in current operation as a bad block in write operation; and if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, marking the currently operated physical block as a bad block.
For the device embodiment, since it is basically similar to the method embodiment, the description is simple, and for the relevant points, refer to the partial description of the method embodiment.
Furthermore, an embodiment of the present invention also provides a computer-readable storage medium, on which a computer program is stored, which when executed by a processor implements the steps of the method as described above.
In this embodiment, the module/unit integrated by the method for implementing bad block setting may be stored in a computer readable storage medium if it is implemented in the form of a software functional unit and sold or used as an independent product. Based on such understanding, all or part of the flow of the method according to the embodiments of the present invention may also be implemented by a computer program, which may be stored in a computer-readable storage medium, and when the computer program is executed by a processor, the steps of the method embodiments described above may be implemented. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, usb disk, removable hard disk, magnetic disk, optical disk, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signals, telecommunications signals, software distribution medium, and the like. It should be noted that the computer readable medium may contain content that is subject to appropriate increase or decrease as required by legislation and patent practice in jurisdictions, for example, in some jurisdictions, computer readable media does not include electrical carrier signals and telecommunications signals as is required by legislation and patent practice.
In addition, an embodiment of the present invention further provides an electronic device, where the electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the steps of the method for implementing the bad block setting as described above when executing the program. Such as steps S11-S13 shown in FIG. 1. Alternatively, the processor, when executing the computer program, implements the functions of each module/unit in the above-mentioned device embodiment for implementing bad block setting, such as the setting module 201, the counting module 202, and the marking module 203 shown in fig. 3.
In a specific embodiment, the electronic device is an SSD emulator that includes a host emulation device and a storage granule emulation device.
The method, the device, the storage medium and the electronic equipment for realizing bad block setting provided by the embodiment of the invention realize the bad block setting by setting the bad block triggering mechanism according to the operation times corresponding to the read, write and erase operation types, can easily and conveniently set the bad block, so that the bad block set each time can be triggered, the efficiency of verifying firmware FW bad block processing logic is improved, and the testing efficiency is improved.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Furthermore, those skilled in the art will appreciate that while some embodiments herein include some features included in other embodiments, rather than other features, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, any of the claimed embodiments may be used in any combination.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (8)
1. A method for implementing bad block provisioning, the method comprising:
setting bad block configuration parameters in host simulation equipment, wherein the bad block configuration parameters comprise bad block error types and bad block triggering conditions, and the bad block triggering conditions are that the operation times of operation types corresponding to the bad block error types reach a preset time threshold;
when the host simulation equipment operates the storage particle simulation equipment, counting the operation times of different operation types;
when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type, marking the physical block currently operated in the storage particle simulation equipment as a corresponding bad block of the bad block error type;
and sending the error type of the bad block of the current physical block to the firmware to be tested so that the firmware to be tested triggers the preset bad block processing logic operation according to the error type of the bad block.
2. The method of claim 1, wherein the bad block error types include a read bad block, a write bad block, and an erase bad block;
the marking of the physical block currently operating in the storage grain simulation equipment as the corresponding bad block of the bad block error type comprises the following steps:
if the error type of the bad block of the currently triggered bad block is a read operation bad block, marking 4Kbyte in the current physical page in the current physical block in the current operation as a read bad block;
if the error type of the bad block triggered currently is a bad block in write operation, marking a current physical page in the physical block in current operation as a bad block in write operation;
and if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, marking the currently operated physical block as a bad block.
3. The method according to any one of claims 1-2, wherein the bad block configuration parameters further include the number of the set bad blocks in the current test, and the number is 1 or more.
4. The method of any one of claims 1-2, wherein the host emulation device and the storage granule emulation device implement emulation operations in a two-process manner.
5. An apparatus for implementing bad block provisioning, the apparatus comprising:
the device comprises a setting module, a judging module and a judging module, wherein the setting module is used for setting bad block configuration parameters in host simulation equipment, the bad block configuration parameters comprise a bad block error type and a bad block triggering condition, and the bad block triggering condition is that the operation times of an operation type corresponding to the bad block error type reach a preset time threshold;
the counting module is used for counting the operation times of different operation types when the host simulation equipment operates the storage particle simulation equipment;
the marking module is used for marking the physical block currently operated in the storage particle simulation equipment as the corresponding bad block with the bad block error type when the operation times of any operation type meet the bad block triggering condition of the bad block error type corresponding to the operation type;
and the sending module is used for sending the bad block error type of the current physical block to the firmware to be tested so that the firmware to be tested triggers the preset bad block processing logic operation according to the bad block error type.
6. The apparatus of claim 5, wherein the bad block error types include a read bad block, a write bad block, and an erase bad block;
the marking module is specifically used for marking the bad block according to the following mode, and if the error type of the bad block of the currently triggered bad block is a read operation bad block, marking 4Kbyte in the current physical page in the currently operated physical block as a read bad block; if the error type of the bad block triggered currently is a bad block in write operation, marking a current physical page in the physical block in current operation as a bad block in write operation; and if the error type of the bad block of the currently triggered bad block is an erasing operation bad block, marking the currently operated physical block as a bad block.
7. A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the method according to any one of claims 1 to 4.
8. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the method according to any of claims 1-4 when executing the computer program.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210266830.3A CN114356679B (en) | 2022-03-18 | 2022-03-18 | Method and device for setting bad block, storage medium and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210266830.3A CN114356679B (en) | 2022-03-18 | 2022-03-18 | Method and device for setting bad block, storage medium and electronic equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114356679A CN114356679A (en) | 2022-04-15 |
| CN114356679B true CN114356679B (en) | 2022-06-07 |
Family
ID=81094488
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210266830.3A Active CN114356679B (en) | 2022-03-18 | 2022-03-18 | Method and device for setting bad block, storage medium and electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114356679B (en) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2565790A1 (en) * | 2011-08-31 | 2013-03-06 | Samsung Electronics Polska Spolka z organiczona odpowiedzialnoscia | Method and system for injecting simulated errors |
| US9047988B2 (en) * | 2012-11-20 | 2015-06-02 | International Business Machines Corporation | Flash interface error injector |
| CN106909484B (en) * | 2017-03-06 | 2019-12-17 | 苏州浪潮智能科技有限公司 | System and method for simulating bad disk test in storage environment |
| CN111045858B (en) * | 2018-10-15 | 2023-12-29 | 深信服科技股份有限公司 | Bad track processing method and system |
| CN110489285B (en) * | 2019-07-12 | 2022-07-15 | 苏州浪潮智能科技有限公司 | Abnormal branch testing method and system for solid state disk |
| US11397635B2 (en) * | 2019-12-09 | 2022-07-26 | Sandisk Technologies Llc | Block quality classification at testing for non-volatile memory, and multiple bad block flags for product diversity |
-
2022
- 2022-03-18 CN CN202210266830.3A patent/CN114356679B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN114356679A (en) | 2022-04-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109684150B (en) | Performance test system, test method and simulation platform of storage particle controller | |
| CN102750221B (en) | Performance test method for Linux file system | |
| CN109165025A (en) | The offline method for burn-recording of chip, device, system, computer storage medium and equipment | |
| CN110956997B (en) | Method, device and equipment for testing BER (bit error rate) of solid state disk | |
| CN113778822B (en) | Error correction capability test method and device, readable storage medium and electronic equipment | |
| CN110610740A (en) | Test unit, method and system, controller and storage device | |
| US10642747B1 (en) | Virtual flash system | |
| CN101377748A (en) | Method for checking reading and writing functions of memory device | |
| CN115440294A (en) | Multi-command hybrid test method for NAND Flash controller | |
| CN110427326A (en) | Solid state hard disk password test method and apparatus based on Driver Master | |
| CN105573676A (en) | Method for verifying data consistency in storage system | |
| CN115547400A (en) | Nonvolatile memory chip test system and nonvolatile memory chip test method | |
| US10949130B2 (en) | Virtual solid state storage system with solid state storage error emulation | |
| CN114356679B (en) | Method and device for setting bad block, storage medium and electronic equipment | |
| CN114115724A (en) | Solid state disk safe erasing method and device | |
| CN113032246A (en) | SSD (solid State disk) firmware operation method and device, readable storage medium and electronic equipment | |
| CN111897685A (en) | Method and device for checking data in power failure, storage medium and electronic equipment | |
| CN114415974B (en) | Method and device for operating logic space by SSD, storage medium and SSD device | |
| CN108089987B (en) | Function verification method and device | |
| CN112802530B (en) | NAND test method and device, readable storage medium and electronic equipment | |
| CN110427528A (en) | SSD identifier test method, device, computer equipment and storage medium | |
| CN114388053B (en) | SSD data testing method and device, storage medium and testing equipment | |
| CN112463608B (en) | Test method and system based on distributed storage | |
| CN112306954A (en) | File system testing method and device | |
| US10585615B1 (en) | Virtual flash system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |