CN114353709A - Surface precision adjusting method of multi-array-surface antenna - Google Patents
Surface precision adjusting method of multi-array-surface antenna Download PDFInfo
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Abstract
The invention relates to the field of machinery, in particular to a method for adjusting the surface precision of multiple array surfaces of an antenna. The invention takes a double-warp-weft instrument measuring system as an auxiliary tool, creatively provides relative coordinates of other sub-array surface measuring points by taking a planeness fitting surface of a main array surface measuring point as a reference through the analysis after the measurement and the plane fitting of the large array surface measuring point, so that the other sub-array surface measuring points can be quantitatively analyzed to obtain the theoretical offset of other array surfaces relative to the main array surface, and the adjustment quantity of the sub-array surfaces can be obtained.
Description
Technical Field
The invention relates to the field of machinery, in particular to a surface precision adjusting method of a multi-array-surface antenna.
Background
The multi-array-surface antenna (generally used for a large base station, a large phased array radar or other equipment needing multi-array-surface assembly) is assembled by an adjusting mechanism to form a large array surface, so that each sub-array surface is ensured to form the large array surface required by design, and the higher the accuracy of the array surface is, the better the accuracy is, the sub-array surfaces are required to be adjusted, and the surface accuracy of the large array surface formed by the sub-array surfaces meets the design requirement of a system.
The existing method for adjusting the surface precision of the large array surface antenna comprises the steps of unfolding the array surface, measuring by a flatness measuring system, fitting the flatness of measured data by the measuring system, determining the overall variation trend of the large array surface according to the fitting result, theoretically calculating the adjustment amount of each subarray corresponding to an adjusting mechanism, measuring the surface precision again after adjustment, and repeating the steps until the surface precision meets the requirement.
However, the above-described plane accuracy adjustment method has several problems for a large-sized wavefront antenna: firstly, the array surface is large (the caliber is tens of meters), the number of measuring points is large (hundreds or thousands), the single surface measuring precision time is long, and the repeated measuring times are large, so that the adjusting period is extremely long; secondly, the overall variation trend of the large array surface is easy to know, but the adjusting structural members among the sub array surfaces are connected with each other, one sub array surface has certain influence on the other connected sub array surface after being adjusted by the corresponding adjusting mechanism, and the influence cannot be quantized, so that the adjustment quantity of the adjusting mechanism in the next step cannot be quantitatively described, only qualitative analysis is performed, and the range of the adjustment quantity is determined, namely, the measurement fitting result cannot directly guide the adjustment of the array surface; thirdly, the large array surface changes along with the adjustment of each sub-array surface, the fitted planes measured each time are different, so that the reference of each adjustment of the adjusting mechanism is changed, the adjustment needs to be repeated for many times, even the adjustment is carried out by experience, and the adjustment difficulty of the large array surface is large.
Disclosure of Invention
Aiming at the defects of the existing surface precision adjusting method, the invention provides a method for adjusting the surface precision of a multi-array-surface antenna. The invention uses a double-warp-weft instrument measuring system (containing plane fitting and coordinate system conversion functions) as an auxiliary tool, and creatively proposes that relative coordinates of measuring points of other subarrays are seen by taking a planeness fitting surface of a measuring point of a main array surface (one of the main array surface and the rest of the sub array surface) as a reference through measurement of measuring points of a large array surface and analysis after plane fitting, so that the other subarray surface measuring points can be quantitatively analyzed to obtain theoretical offset of the other array surfaces relative to the main array surface, and the adjustment quantity of each subarray surface is obtained.
The technical scheme of the invention is as follows: a method for adjusting the surface precision of a multi-array-surface antenna is characterized in that: the method comprises the following steps:
step 1, after target points on an antenna array surface are read by a double-warp weft instrument, fitting the mean square error of the whole surface precision of the antenna array surface, starting to perform subsequent work from step 5 when the result is less than or equal to the final combined surface precision, and continuing from step 2 when the result is greater than the final combined surface precision;
step 3, checking coordinate Z values measured by a plurality of points on the two main beams of the sub array surface in a B coordinate system, checking the change trend of the Z values of the points of the two main beams from top to bottom, measuring the distance alpha 2 before adjustment, then measuring the ideal distance alpha 1 after adjustment, calculating alpha (alpha 1-alpha 2), and calculating the ideal length adjustment value lambda alpha;
step 4, adjusting the lengths of the main adjusting mechanism and the auxiliary adjusting mechanism simultaneously according to the ideal length adjusting value lambda alpha; after adjustment, measuring points on two main beams on the front surface 2 of the sub-body again, performing plane fitting on the two columns, wherein the result of the mean square error of the flatness is less than or equal to the initial adjustment precision, and starting from the step 6; otherwise, the step 5 is started;
7, performing array plane fitting on the main array plane, taking a fitting plane coordinate system as a current coordinate system, checking the Z values of point measurement coordinates on four rows of the subarray plane, determining the adjustment amount of the adjustment mechanism, adjusting the lengths of the main adjustment mechanism and the auxiliary adjustment mechanism according to the ideal length adjustment value, measuring the points on the four rows again after adjustment, fitting the plane, and repeating the step until the result of the surface precision mean square error is less than or equal to the final combined surface precision;
The method for adjusting the surface precision of the multi-array-surface antenna is characterized in that: the n points in step 2 comprise the origin coordinates and the unit vector of the main array surface.
The method for adjusting the surface precision of the multi-array-surface antenna is characterized in that: the process of establishing the origin coordinates and the unit vectors of the main array surface in the step 2 is as follows: the two theodolites firstly translate on the basis of the O coordinate system to obtain an A coordinate system, the A coordinate system obtains another B coordinate system after rotating, and the B coordinate system is used as a current coordinate system.
The method for adjusting the surface precision of the multi-array-surface antenna is characterized in that: further comprising the steps of: 9, after the antenna array surface is adjusted, setting synchronous zero positions of a screw rod in the main adjusting mechanism and the auxiliary adjusting mechanism of the antenna by telecommunication;
and step 10, mounting an antenna limiting pull rod for mechanical limiting.
The method for adjusting the surface precision of the multi-array-surface antenna is characterized in that: further comprising the steps of: the initial adjustment precision is 60% of the final combined surface precision.
The invention has the beneficial effects that: firstly, the method can obviously shorten the adjustment time of the antenna array surface and improve the adjustment efficiency of the array surface; secondly, after the measurement is carried out by the method, the adjustment quantity of different array surfaces relative to the main array surface can be described quantitatively; thirdly, the method can obviously reduce the operation difficulty of adjusting the large-scale antenna array surface, shorten the product development period and have higher economic benefit.
Drawings
Fig. 1 is a diagram of the antenna array configuration (right side view).
Fig. 2 is a diagram of the antenna array configuration (front view).
FIG. 3 is a schematic diagram of the location of the measurement points.
Fig. 4 is a partial enlarged view of the target.
Fig. 5 shows an antenna wavefront measurement schematic (without error).
Fig. 6 is a simplified schematic diagram of antenna structure coefficient calculation.
Fig. 7 shows a schematic diagram of the transformation of the measurement coordinate system.
Description of the drawings: the main wavefront 1, the sub-array 2, the main adjusting mechanism 3, the auxiliary adjusting mechanism 4, the main adjusting most direct point 5, the main adjusting sub-array most direct point 51, the main adjusting main wavefront most direct point 52, the auxiliary adjusting most direct point 6, the auxiliary adjusting sub-wavefront most direct point 61, the auxiliary adjusting main wavefront most direct point 62, the double-warp-weft instrument 7 and the wavefront 8.
Detailed Description
The invention is further described below with reference to the accompanying drawings.
The main array surface 1 and the sub array surface 2 are combined together to form an array surface 8.
As shown in fig. 1 and 2, the present invention takes 1 main array plane and 1 sub array plane as an example, the antenna array plane structure includes a main array plane 1, a sub array plane 2, a main adjusting mechanism 3, and a sub adjusting mechanism 4, when the array planes are assembled, the extending positions of the main adjusting mechanism 3 and the sub adjusting mechanism 4 are required to be adjusted, so that the precision of the combined plane formed by combining the main array plane 1 and the sub array plane 2 reaches the design requirement, and then the control system records the positions of the main adjusting mechanism 3 and the sub adjusting mechanism 4 or returns to zero at this time, so as to ensure that the working requirement of the precision of the combined plane can be met by each array plane expansion. In this embodiment, the final combined surface precision is less than or equal to 0.5 mm.
Definition of the combined surface precision: the deviation amount of the plane surface formed by combining two or more planes from the ideal plane.
Before the array is adjusted, the array needs to be prepared, the position of a measuring point (particularly the point which is most directly influenced by an adjusting mechanism) is determined, and the array surface is erected for preparation measurement. In this embodiment, as shown in fig. 3, measurement points are attached to the main array surface 1 and the sub-array surface 2, the measurement point form is shown in a partial enlarged view of fig. 3 (the measurement point is a target of a combination of a circle, a cross and the like, so as to facilitate the measurement by the theodolite and improve the measurement accuracy), and points corresponding to two rows of main beams are determined (that is, the most direct point affected by the main adjusting mechanism 3 and the auxiliary adjusting mechanism 4 is a row corresponding to 5, and the most direct point of the main adjusting mechanism is a row corresponding to 6). As shown in fig. 4, the antenna wavefront measurement is schematically illustrated, and the combined surface accuracy of the wavefront 8 is measured by using a dual-theodolite 7 measurement system.
The method for adjusting the surface precision of the antenna with multiple array surfaces comprises the following steps of: and creatively using a plane fitted with the measuring points on the main array surface as a reference surface, checking the offset distance of the measuring points on the auxiliary array surface, and calculating the adjustment amount of the next adjusting mechanism through a proportional coefficient lambda of the offset amount and the adjustment amount. In this embodiment: the simplified structure of the antenna array is shown in fig. 5, ACE is an ideal sub array, BCD is a main array, AB is the length of the adjusting mechanism, and a is adjusted’CE’To adjust the process sub-array.
By adjusting the change in length of the mechanism to a value beta (AB-A)’B) The value α (α 1- α 2) for causing the vertical length change of the E point on the sub-array surface is calculated as a scaling factor according to the size of the structure, that is, the scaling factor
At the time of testing, the following work may be prepared first. 1. Preparing according to the figure 4, heightening the test pier of the double theodolite 7 to reach a measuring point state, and enabling the antenna array surface 8 to reach a specified position; 2. the measurement point targets are applied to the antenna array according to fig. 3.
The invention uses a double-warp-weft instrument 7 to test an antenna array surface 8, requires that the surface precision root mean square value is not more than 0.5mm, and comprises the following specific adjustment steps:
step 1, after target points on an antenna array surface 8 are read by a double theodolite 7, fitting the whole surface precision mean square error of the antenna array surface, wherein the result is less than or equal to 0.5, the design requirement is met, an adjusting mechanism does not need to be adjusted, the follow-up work is started from step 5, the result is more than 0.5, and the follow-up work is continued from step 2;
and 2, independently performing plane fitting on the measurement point of the main array surface 1, reading the parameters of n points on the O coordinate system on the main array surface 1, wherein n is more than or equal to 3, n is required to be capable of determining a plane, n points cannot be on a straight line, n points preferably comprise the origin point coordinate and the unit vector of the main array surface 1, the more n points are taken, the higher the precision level of the fitting plane is, generally 50-200 points are. The process of establishing the origin (randomly selected) coordinates and unit vectors of the main array surface 1 is as follows: the two theodolites firstly translate on the basis of the O coordinate system to obtain an A coordinate system, the A coordinate system obtains another B coordinate system after rotating, and the B coordinate system is taken as a current coordinate system as shown in figure 6; and establishing the positions of other points relative to the origin of the B coordinate system.
Step 3, checking coordinate Z values measured by 22 points (11 points of each main beam) on two main beams (3 rd and 6 th rows) of the sub array surface 2 in a B coordinate system, checking the change trend of the Z values of the points of the two main beams from top to bottom, firstly measuring the distance alpha 2 before adjustment, then measuring the ideal distance (generally 0) of the adjusted alpha 1, calculating alpha, and calculating the ideal length adjustment value lambda alpha, wherein a positive value represents that the main beam is excessively tilted and needs to be tilted back and forth; negative values indicate that the vehicle has not turned up to the right position and continues to turn up;
step 4, adjusting the lengths of the main adjusting mechanism 3 and the auxiliary adjusting mechanism 4 simultaneously according to the ideal length adjusting value beta; after adjustment, measuring points on two main beams on the front surface 2 of the sub-body again, performing plane fitting on the two columns, wherein the mean square error result of the flatness is less than or equal to 0.3, and starting from the step 6; otherwise, the step 5 is started; in the step, only two rows of points are taken, the values are less, so the precision requirement is higher, the integral requirement can be met after a plurality of points are fitted, the step is equivalent to preliminary adjustment, the measurement and adjustment times can be reduced, and the preliminary adjustment precision can be 50% -70% of the final combined surface precision. If 60%, the primary adjustment precision is less than or equal to 0.3;
7, performing plane fitting on the four rows (1 st, 3 rd, 6 th and 8 th rows) of the main array surface 1, taking a fitting plane coordinate system as a current coordinate system (the specific method is shown in the step 2), checking point measurement coordinate Z values on the four rows (1 st, 3 rd, 6 th and 8 th rows) of the sub array surface 2, determining the adjustment amount of an adjusting mechanism (the specific method is shown in the step 3), adjusting the lengths of the main adjusting mechanism 3 and the auxiliary adjusting mechanism 4 simultaneously according to ideal length adjustment values, and re-measuring the repeated steps of the four rows (the 1 st, 3 rd, 6 th and 8 th rows) after adjustment until the mean square deviation result of the surface accuracy is less than or equal to 0.5; the step is a precise adjustment process, repeated iteration and test adjustment are needed, the result is closer to the ideal parameter, and the surface precision requirement is gradually met.
9, after the antenna array surface is adjusted, setting synchronous zero positions of a screw rod in the main adjusting mechanism and the auxiliary adjusting mechanism of the antenna by telecommunication;
step 10, mounting an antenna limiting pull rod for mechanical limiting;
and 11, finishing the adjustment of the antenna array surface.
The invention generally has the initial adjustment times of 2 to 4 times and the fine adjustment times of 2 to 3 times, can greatly reduce the measurement times, reduce the measurement time and improve the test efficiency, can be finished within one week in the prior art, has the original debugging time of about twenty days, greatly improves the test efficiency, shortens the construction period and can be used for reference in products of the same type.
When there are 3 or more than 3 array surfaces, firstly, adjusting 1 main array surface and 1 sub array surface according to the above method, and when the precision between the main array surface and the sub array surface meets the requirement, using the main array surface and the sub array surface which have met the requirement as a new main array surface to adjust other sub array surfaces, wherein the steps are as follows.
Claims (5)
1. A method for adjusting the surface precision of a multi-array-surface antenna is characterized in that: the method comprises the following steps:
step 1, after target points on an antenna array surface are read by a double-warp weft instrument, fitting the mean square error of the whole surface precision of the antenna array surface, starting to perform subsequent work from step 5 when the result is less than or equal to the final combined surface precision, and continuing from step 2 when the result is greater than the final combined surface precision;
step 2, carrying out plane fitting on the measurement points of the main array surface independently, reading parameters of n points on the main array surface on an O coordinate system, wherein n is more than or equal to 3 and n is required to be capable of determining a plane,
step 3, checking coordinate Z values measured by a plurality of points on the two main beams of the sub array surface in a B coordinate system, checking the change trend of the Z values of the points of the two main beams from top to bottom, measuring the distance alpha 2 before adjustment, then measuring the ideal distance alpha 1 after adjustment, calculating alpha (alpha 1-alpha 2), and calculating the ideal length adjustment value lambda alpha;
step 4, adjusting the lengths of the main adjusting mechanism and the auxiliary adjusting mechanism simultaneously according to the ideal length adjusting value lambda alpha; after adjustment, measuring points on two main beams on the front surface 2 of the sub-body again, performing plane fitting on the two columns, wherein the result of the mean square error of the flatness is less than or equal to the initial adjustment precision, and starting from the step 6; otherwise, the step 5 is started;
step 5, performing array plane fitting on the two main beams of the main array plane, wherein the original point of the main array plane is on the main beam, and continuing to perform the step 2;
step 6, measuring points on two rows of the main array surface and the sub array surface, performing plane fitting with four rows of points of the two main beams measured before, and starting from step 8 if the surface precision mean square error result is less than or equal to the final combined surface precision; otherwise, the step 7 is started;
7, performing array plane fitting on the main array plane, taking a fitting plane coordinate system as a current coordinate system, checking the Z values of point measurement coordinates on four rows of the subarray plane, determining the adjustment amount of the adjustment mechanism, adjusting the lengths of the main adjustment mechanism and the auxiliary adjustment mechanism according to the ideal length adjustment value, measuring the points on the four rows again after adjustment, fitting the plane, and repeating the step until the result of the surface precision mean square error is less than or equal to the final combined surface precision;
step 8, measuring the remaining points of the antenna array surface again, performing plane fitting with the previously measured four rows of points, and continuing to perform the step 1 if the result of the mean square error of the precision surface precision is greater than the precision of the final combination surface; and if the precision surface precision mean square error result is less than or equal to the final combined surface precision, finishing surface precision adjustment.
2. The method for adjusting the surface accuracy of a multi-wavefront antenna according to claim 1, wherein: the n points in step 2 comprise the origin coordinates and the unit vector of the main array surface.
3. The method for adjusting the surface accuracy of a multi-wavefront antenna according to claim 1, wherein: the process of establishing the origin coordinates and the unit vectors of the main array surface in the step 2 is as follows: the two theodolites firstly translate on the basis of the O coordinate system to obtain an A coordinate system, the A coordinate system obtains another B coordinate system after rotating, and the B coordinate system is used as a current coordinate system.
4. The method for adjusting the surface accuracy of a multi-wavefront antenna according to any one of claims 1 to 3, wherein: further comprising the steps of: 9, after the antenna array surface is adjusted, setting synchronous zero positions of a screw rod in the main adjusting mechanism and the auxiliary adjusting mechanism of the antenna by telecommunication;
and step 10, mounting an antenna limiting pull rod for mechanical limiting.
5. The method for adjusting the surface accuracy of a multi-wavefront antenna according to any one of claims 1 to 3, wherein: further comprising the steps of: the initial adjustment precision is 60% of the final combined surface precision.
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