CN114325517A - B-H magnetization curve testing method and device - Google Patents
B-H magnetization curve testing method and device Download PDFInfo
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Abstract
The invention discloses a method and a device for testing a B-H magnetization curve, which relate to the field of magnetic material testing and are used for testing the B-H magnetization curve of an amorphous alloy soft magnetic material, and the method comprises the following steps: manufacturing a single-winding device based on a material to be detected, and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator; processing the square wave pulse signals sequentially passing through the single-winding device and the detection resistor connected with the single-winding device in series by a signal processor to obtain triangular wave signals; acquiring waveform curves at two ends of the detection resistor through a first channel of an oscilloscope, and acquiring a waveform curve of a triangular wave signal through a second channel of the oscilloscope; and synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope to obtain the B-H magnetization curve of the single-winding device. The invention can solve the technical problem of high test cost caused by complex structure of the double winding in the prior art.
Description
Technical Field
The invention relates to the field of magnetic material testing, in particular to a B-H magnetization curve testing method and device.
Background
Magnetic materials are now widely used in our lives, and are closely related to aspects of informatization, automation, mechatronics, national defense and national economy. Magnetic materials are materials that react in some way to magnetic fields and are functional materials with a wide range of applications. Magnetic materials can be classified into soft magnetic materials and hard magnetic materials according to the ease with which demagnetization occurs after magnetization. Substances which are easy to remove magnetism after magnetization are called soft magnetic materials, and substances which are not easy to remove magnetism are called hard magnetic materials. The magnetic element is widely applied to electronic equipment such as transformers, current transformers, small motors, inductors and the like, and is made of amorphous alloy soft magnetic materials, the magnetic element comprises an amorphous alloy soft magnetic material magnetic core and a coil, and the quality of the magnetic element is closely related to the performance of the amorphous alloy soft magnetic material. At present, the performance of the amorphous alloy soft magnetic material is mainly reflected on a B-H magnetization curve of the amorphous alloy soft magnetic material, and the B-H magnetization curve of the amorphous alloy soft magnetic material is the relationship between magnetic induction intensity B and magnetic field intensity H of the amorphous alloy soft magnetic material in the magnetization process. The B-H magnetization curve of the amorphous alloy soft magnetic material can measure important parameters of the magnetic core, such as remanence Br, saturation magnetic induction Bm, coercive force Hc and the like, and can also evaluate the trend that the relative permeability mu r changes along with the magnetic field intensity H.
The main test method of the B-H magnetization curve of the amorphous alloy soft magnetic material adopts a double-winding structure, the double-winding structure adopts two identical (or concentric) windings to form an electrode to test the B-H magnetization curve, because the two identical windings are complicated in coil winding and difficult to establish, and meanwhile, the circuit structure for testing the double-winding structure is complicated, and the required test device is large in size and expensive.
Therefore, the existing amorphous alloy soft magnetic material testing method generally has the technical problem of high testing cost caused by complex double-winding structure.
Disclosure of Invention
Aiming at the defects of the prior art, the invention aims to provide a method and a device for testing a B-H magnetization curve, and aims to solve the technical problem of high testing cost caused by complex structure of a duplex winding in the prior art.
One aspect of the present invention is to provide a B-H magnetization curve testing method and apparatus, for testing B-H magnetization curve of amorphous alloy soft magnetic material, the method comprising:
manufacturing a single-winding device based on the tested material, and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
processing the square wave pulse signals sequentially passing through the single winding device and the detection resistor connected with the single winding device in series through a signal processor to obtain triangular wave signals;
acquiring the waveform curves at two ends of the detection resistor through a first channel of an oscilloscope, and acquiring the waveform curve of the triangular wave signal through a second channel of the oscilloscope;
and synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope to obtain the B-H magnetization curve of the single-winding device.
Compared with the prior art, the invention has the beneficial effects that: according to the B-H magnetization curve testing method provided by the invention, a single-winding structure is adopted, a double-winding structure is not required to be manufactured, the manufacturing is simple, and the establishment difficulty is low. Specifically, a tested material is made into a single-winding device, a square wave pulse signal single-winding device with adjustable amplitude is input through a square wave pulse signal generator, the single-winding device is connected with a detection resistor in series, and a waveform curve at two ends of the detection resistor is obtained through a first channel of an oscilloscope so as to obtain a curve change rule of the magnetic field intensity H; and simultaneously, performing signal processing on the square wave pulse signal passing through the detection resistor through a signal processor, converting the square wave pulse signal into a triangular wave signal, acquiring a waveform curve of the triangular wave signal through a second channel of the oscilloscope to acquire a curve change rule of the magnetic induction intensity B, and synthesizing the waveform curves acquired by the first channel and the second channel to acquire a B-H magnetization curve of the single-winding device. The method is simple and effective, meanwhile, the winding of the single winding structure is simple, the establishment difficulty is small, the device to be tested is small in size and has high cost performance, the defects that the circuit structure is complex, the testing device is large in size and low in cost performance caused by the fact that a double winding structure is manufactured are avoided, and therefore the technical problem that the testing cost is high due to the fact that the double winding structure is complex in the prior art is solved.
According to an aspect of the foregoing technical solution, the step of obtaining the waveform curves of the two ends of the detection resistor through a first channel of an oscilloscope, and obtaining the waveform curve of the triangular wave signal through a second channel of the oscilloscope specifically includes:
acquiring current I flowing through the single-winding device through the detection resistor, wherein the current I is U/R;
according to ampere's law in electromagnetism, the magnetic field strength H of the single-winding device,
h, N I/L, N U/L R, wherein L is the equivalent length of the single-winding device, and N is the number of turns of the winding coil of the single-winding device;
and acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
According to an aspect of the foregoing technical solution, the method further includes:
according to Faraday's law of magnetic induction
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
is the magnetic flux of the single winding device;
calculating the magnetic induction B of the single-winding device according to the magnetic flux relation,
wherein the content of the first and second substances,s is the effective sectional area of the single winding device;
obtaining the signal processor integrated voltage V through the integration processing of the signal processor,
wherein C is a capacitance of the signal processor, and R is a resistance value of the signal processor;
calculating to obtain the magnetic induction intensity B of the single winding device which is approximately equal to RCV/NS based on the signal processor integral capacitor;
and acquiring the change rule of the magnetic induction intensity B of the single-winding device through a second channel of the oscilloscope.
According to an aspect of the above technology, before the step of inputting an amplitude-adjustable square-wave pulse signal to the single-winding device by a square-wave pulse signal generator, the method further comprises:
conducting electricity to a power supply manager through a first module power supply so as to control the on-off of the square wave pulse signal generator through the power supply manager;
conducting electricity to the square wave pulse signal generator through a first module power supply so as to transmit the square wave pulse signal through the square wave pulse signal generator;
and conducting electricity to an adjustable power supply through the second module power supply, wherein the adjustable power supply controls the amplitude of the square wave pulse signal.
According to one aspect of the technology, the signal processor converts the square wave pulse signal into a triangular wave signal through active integration processing, and the signal processor supplies electric quantity to the signal processor through a second module power supply and a power supply controller to work normally.
According to one aspect of the above technique, the sensing resistor is a high precision RTP non-inductive thick film power resistor.
According to an aspect of the above technique, the first module power supply and the second module power supply are respectively obtained by adding filtering processing to alternating current.
Another aspect of the present invention is to provide a B-H magnetization curve testing apparatus, including:
the signal input module is used for manufacturing a single-winding device based on the material to be detected and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
the signal processing module is used for processing the square wave pulse signals sequentially passing through the single winding device and the detection resistor connected with the single winding device in series through a signal processor to obtain triangular wave signals;
the signal acquisition module is used for acquiring the waveform curves at two ends of the detection resistor through a first channel of an oscilloscope and acquiring the waveform curve of the triangular wave signal through a second channel of the oscilloscope;
and the curve synthesis module is used for synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope so as to obtain the B-H magnetization curve of the single winding device.
According to another aspect of the above technique, the apparatus further comprises:
the current acquisition module is used for acquiring current I flowing through the single-winding device through the detection resistor, wherein the I is U/R;
a magnetic field strength calculation module for calculating the magnetic field strength H of the single-winding device according to the ampere's law in electromagnetism,
h, N I/L, N U/L R, wherein L is the equivalent length of the single-winding device, and N is the number of turns of the winding coil of the single-winding device;
and the magnetic field intensity acquisition module is used for acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
According to another aspect of the above technique, the apparatus further comprises:
an induced electromotive force calculation module for calculating the relationship between the Faraday's magnetic induction law and the electromagnetic field
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
is the magnetic flux of the single winding device;
a magnetic induction conversion module for calculating the magnetic induction B of the single winding device according to the magnetic flux relationship,
wherein S is the effective sectional area of the single-winding device;
an integration processing module for obtaining the signal processor integration voltage V through the integration processing of the signal processor,
wherein C is a capacitance of the signal processor, and R is a resistance value of the signal processor;
a magnetic induction intensity calculating module for calculating the magnetic induction intensity of the single winding device based on the signal processor integral capacitance
And the magnetic induction intensity acquisition module is used for acquiring the change rule of the magnetic induction intensity B of the single-winding device through a second channel of the oscilloscope.
Drawings
The above and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a flow chart of a B-H magnetization curve testing method according to a first embodiment of the present invention;
FIG. 2 is a block diagram of a B-H magnetization curve testing apparatus according to a second embodiment of the present invention;
FIG. 3 is a schematic circuit diagram of a B-H magnetization curve testing apparatus according to a second embodiment of the present invention;
the figure elements are illustrated in symbols:
the system comprises a signal input module 100, a signal processing module 200, a signal acquisition module 300 and a curve synthesis module 400.
Detailed Description
In order to make the objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. Several embodiments of the invention are presented in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "secured to" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. As used herein, the terms "vertical," "horizontal," "left," "right," "up," "down," and the like are used for descriptive purposes only and not for purposes of indicating or implying that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and therefore should not be construed as limiting the invention.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1, a B-H magnetization curve testing method according to a first embodiment of the present invention is shown, the method including steps S10-S13:
step S10, manufacturing a single-winding device based on the tested material, and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
in the embodiment, the measured material is an amorphous alloy soft magnetic material, the amorphous alloy is a long-range disordered structure of the solid alloy obtained by carrying out super-quenching solidification and crystallizing atoms out of order during alloy solidification, molecules forming the amorphous alloy are not in a spatially regular periodicity, and crystal grains and crystal boundaries of crystalline alloy do not exist. Soft magnetic materials mean that the maximum magnetization can be achieved with a minimum external magnetic field. The amorphous alloy soft magnetic material is easy to magnetize and demagnetize, and is widely applied to electrical equipment and electronic equipment.
Specifically, the amorphous alloy soft magnetic material is made into a single-winding device, the single-winding device is formed by only placing one element winding coil in one groove, the number of winding coils is small, the process is simple, the double-winding device is formed by placing two element winding coils in one groove, the number of winding coils is large, the manufacturing process is complex, the building difficulty is high, the single-winding device is simpler to manufacture than the double-winding device, the building difficulty is low, and breakdown faults of adjacent winding coils cannot occur.
The first module power supply provides 12V voltage to conduct to the power supply manager, so that voltage supply required by normal work of the power supply manager is guaranteed, and the power supply manager can normally control the square wave pulse signal generator to be turned on and turned off. Meanwhile, the first module power supply provides 12V voltage to conduct to the square wave pulse signal generator, and the 12V voltage required by normal work of the square wave pulse signal generator is ensured, so that the square wave pulse signal generator emits square wave pulse signals. The square wave pulse signal generator is a push-pull converter, and the push-pull converter is an output circuit formed by connecting two transistors with different polarities. In one period, two transistors with different polarities are respectively turned on for half a period, and finally, a complete periodic signal is synthesized at the connection position (generally an emitter or a source) of the two transistors. The push-pull circuit can achieve high power, high efficiency, small distortion and balanced overall performance, is a form commonly used in a power amplifier circuit and ensures stable transmission of square wave pulse signals.
Meanwhile, 24V voltage is provided to an adjustable power supply through a second module power supply, the adjustable power supply can realize 5-20V adjustable voltage output, based on a voltage stabilizing tube voltage stabilizing circuit, the load current is increased by utilizing the current amplification effect of a transistor, deep voltage negative feedback is introduced into a circuit to stabilize the output voltage, the output voltage is adjustable by changing network parameters, and the amplitude-adjustable square wave pulse signal output of the square wave pulse signal generator is controlled. Therefore, the square wave pulse signal generator can realize stable square wave pulse signal output with adjustable amplitude through the power manager and the adjustable power supply, and the square wave pulse signal is output to the single-winding device so as to test the B-H magnetization curve of the single-winding device and detect the performance of the material to be detected.
Step S11, processing the square wave pulse signals sequentially passing through the single winding device and the detection resistor connected in series with the single winding device by a signal processor to obtain triangular wave signals;
the detection resistor is a high-precision RTP non-inductive thick film power resistor, and parasitic oscillation is prevented in the high-frequency alternating current circuit by utilizing the characteristic of excellent frequency response, so that current output waveform on the resistor is effectively prevented from being distorted. The adjustable power supply converts the 24V voltage provided by the second module power supply into +5V and-5V voltage to realize the +5V and-5V power supply so as to provide the +5V and-5V energy required by the signal processor for normal work. The signal processor is an active integration processor, the active integration processor is a circuit processor with output signals proportional to time integral values of input signals, and the active integration processor integrates and converts pulse wave signals into new pulse wave signals based on the charge-discharge principle of a capacitor.
Specifically, the square wave pulse signal generator transmits a square wave pulse signal to the single-winding device, and the single-winding device is connected with the detection resistor in series to realize conversion of the square wave pulse signal. The signal processor processes the square wave pulse signals passing through the single-winding device and the detection resistor, and converts the square pulse waves into triangular waves based on the principle of capacitor charge and discharge.
Step S12, acquiring the waveform curves at two ends of the detection resistor through a first channel of an oscilloscope, and acquiring the waveform curve of the triangular wave signal through a second channel of the oscilloscope;
the oscilloscope is an electronic measuring instrument with wide application. It can convert the invisible electric signal into visible image, and is convenient for people to research the change process of various electric phenomena. The oscilloscope generates a fine spot of light by impinging a narrow beam of electrons, consisting of high-speed electrons, on a screen coated with a phosphor. The oscilloscope can observe the waveform curve of various signal amplitudes changing along with time, and can also be used for testing various electric quantities, such as voltage, current, frequency, phase difference, amplitude modulation and the like. In this embodiment, the waveform curves of the magnetic field strength H and the magnetic induction B of the single-winding device are observed by an oscilloscope.
Specifically, according to the ampere law in electromagnetism, the magnetic field strength H, H ═ N × I/L of the single-winding device is obtained, in order to detect the magnetic field strength H of the single-winding device, the current I flowing through the single-winding device needs to be detected, the single-winding device is connected in series with a detection resistor, in this embodiment, the detection resistor is a high-precision RTP non-inductive thick-film power resistor with a resistance value of 5.1 Ω, and the current I flowing through the single-winding device is detected by detecting the voltage at two ends of the detection resistor, wherein I ═ U/R;
according to ampere's law in electromagnetism and the substitution and conversion of I ═ U/R, the magnetic field strength H of the single-winding device,
obtaining the relation that the magnetic field intensity H of a single-winding device is in direct proportion to the voltage U of the single-winding device, wherein L is the equivalent length of the single-winding device, and N is the number of turns of a winding coil of the single-winding device;
and converting the magnetic field intensity H of the single-winding device into a corresponding proportional voltage relation, and acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
Besides, in order to obtain the change rule of the magnetic induction intensity B of the single-winding device, the relationship of Faraday's law of magnetic induction is used
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
a magnetic flux of a single winding device;
calculating the magnetic induction intensity B of the single-winding device according to the magnetic flux relation and the Faraday magnetic induction law relation,
wherein S is the effective sectional area of the single-winding device;
the integration voltage V of the signal processor is obtained through the integration processing of the signal processor,
wherein C is the capacitance of the signal processor, R is the resistance value of the signal processor;
based on the integral capacitor of the signal processor, calculating to obtain that the magnetic induction intensity B of the single-winding device is approximately equal to RCV/NS, and obtaining that the magnetic induction intensity B of the single-winding device is in direct proportion to the voltage thereof;
and converting the magnetic induction B of the single-winding device into a corresponding proportional voltage relation, and acquiring the change rule of the magnetic induction B of the single-winding device through a second channel of the oscilloscope.
And step S13, synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope to obtain the B-H magnetization curve of the single winding device.
And synthesizing the waveform curve of the magnetic field intensity H change rule of the single-winding device obtained by the oscilloscope in the first channel and the waveform curve of the magnetic induction intensity B change rule of the single-winding device obtained in the second channel to obtain the B-H magnetization curve of the single-winding device. The method for testing the B-H magnetization curve of the magnetic material through a simple and effective testing method has high cost performance, avoids the defects of complex circuit structure, large size and low cost performance caused by the fact that a double-winding structure is manufactured, and solves the technical problem of high testing cost caused by the complex double-winding structure in the prior art.
Compared with the prior art, the B-H magnetization curve testing method provided by the embodiment has the beneficial effects that: according to the B-H magnetization curve testing method provided by the invention, a single-winding structure is adopted, a double-winding structure is not required to be manufactured, the manufacturing is simple, and the establishment difficulty is low. Specifically, a tested material is made into a single-winding device, a square wave pulse signal single-winding device with adjustable amplitude is input through a square wave pulse signal generator, the single-winding device is connected with a detection resistor in series, and a waveform curve at two ends of the detection resistor is obtained through a first channel of an oscilloscope so as to obtain a curve change rule of the magnetic field intensity H; and simultaneously, performing signal processing on the square wave pulse signal passing through the detection resistor through a signal processor, converting the square wave pulse signal into a triangular wave signal, acquiring a waveform curve of the triangular wave signal through a second channel of the oscilloscope to acquire a curve change rule of the magnetic induction intensity B, and synthesizing the waveform curves acquired by the first channel and the second channel to acquire a B-H magnetization curve of the single-winding device. The method is simple and effective, meanwhile, the winding of the single winding structure is simple, the establishment difficulty is small, the device to be tested is small in size and has high cost performance, the defects that the circuit structure is complex, the testing device is large in size and low in cost performance caused by the fact that a double winding structure is manufactured are avoided, and therefore the technical problem that the testing cost is high due to the fact that the double winding structure is complex in the prior art is solved.
Referring to fig. 2-3, a B-H magnetization curve testing apparatus according to a second embodiment of the present invention is shown. The device includes:
the signal input module 100 is used for manufacturing a single-winding device based on the material to be detected, and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
the 220V alternating current respectively provides different voltages for the first module power supply and the second module power supply through the bridge rectification filter of the EMI filter so as to meet different voltage requirements required by different circuits and processors. The single-winding device is made of the amorphous alloy soft magnetic material so as to test the B-H magnetization curve of the amorphous alloy soft magnetic material, the single-winding device has few winding coils, the process is simple, the device is easy to manufacture, the building difficulty is low, the square wave pulse signal generator transmits a square wave pulse signal with adjustable amplitude to the single-winding device, 24V voltage is provided to an adjustable power supply through the second module power supply, the adjustable power supply can realize 5-20V adjustable voltage output, the output voltage is adjustable through changing network parameters, and the square wave pulse signal output of the square wave pulse signal generator with adjustable amplitude is controlled.
The signal processing module 200 is configured to perform signal processing on the square wave pulse signals sequentially passing through the single-winding device and the detection resistor connected in series with the single-winding device through a signal processor to obtain triangular wave signals;
the single-winding device is connected with the detection resistor in series to detect the current and voltage value of the detection resistor so as to detect the B-H magnetization curve of the single-winding device, and the signal processor integrates and converts the pulse wave signal into a new pulse wave signal based on the charge-discharge principle of the capacitor. Namely, the square wave pulse signal passing through the single-winding device and the detection resistor is subjected to integral conversion processing to form a triangular wave signal.
The signal acquisition module 300 is configured to acquire waveform curves at two ends of the detection resistor through a first channel of an oscilloscope, and acquire a waveform curve of the triangular wave signal through a second channel of the oscilloscope;
wherein the oscilloscope is a processor for converting electrical signals into images. In this embodiment, the waveform curves of the magnetic field strength H and the magnetic induction B of the single-winding device are detected by an oscilloscope.
According to ampere's law in electromagnetism, magnetic field strength H, H of a single-winding device is obtained, in order to detect the magnetic field strength H of the single-winding device, current I flowing through the single-winding device needs to be detected, the single-winding device is connected with a detection resistor in series, and the current I flowing through the single-winding device is detected by detecting voltage at two ends of the detection resistor, wherein I is U/R;
according to ampere's law in electromagnetism and the substitution and conversion of I ═ U/R, the magnetic field strength H of the single-winding device,
obtaining the relation that the magnetic field intensity H of a single-winding device is in direct proportion to the voltage U of the single-winding device, wherein L is the equivalent length of the single-winding device, and N is the number of turns of a winding coil of the single-winding device;
and converting the magnetic field intensity H of the single-winding device into a corresponding proportional voltage relation, and acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
Besides, in order to obtain the change rule of the magnetic induction intensity B of the single-winding device, the relationship of Faraday's law of magnetic induction is used
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
a magnetic flux of a single winding device; calculating the magnetic induction intensity B of the single-winding device according to the magnetic flux relation and the Faraday magnetic induction law relation,
wherein S is the effective sectional area of the single-winding device;
the integration voltage V of the signal processor is obtained through the integration processing of the signal processor,
wherein C is the capacitance of the signal processor, R is the resistance value of the signal processor;
based on the integral capacitor of the signal processor, calculating to obtain that the magnetic induction intensity B of the single-winding device is approximately equal to RCV/NS, and obtaining that the magnetic induction intensity B of the single-winding device is in direct proportion to the voltage thereof;
and converting the magnetic induction B of the single-winding device into a corresponding proportional voltage relation, and acquiring the change rule of the magnetic induction B of the single-winding device through a second channel of the oscilloscope.
And a curve synthesizing module 400, configured to synthesize waveform curves respectively obtained by the first channel and the second channel of the oscilloscope, so as to obtain a B-H magnetization curve of the single winding device.
And synthesizing a waveform curve of the magnetic field intensity H change rule of the single-winding device obtained by the oscilloscope in a first channel and a waveform curve of the magnetic induction intensity B change rule of the single-winding device obtained by the oscilloscope in a second channel to obtain a B-H magnetization curve of the single-winding device.
In summary, the B-H magnetization curve testing device in the above embodiments of the present invention can test the B-H magnetization curve of the magnetic material through a simple circuit structure, and the method is simple and effective, and meanwhile, the winding of the single winding structure is simple, the building difficulty is small, the device to be tested has a small volume and a very high cost performance, and the disadvantages of complicated circuit structure, large volume of the testing device and low cost performance caused by manufacturing the double winding structure are avoided, thereby solving the technical problem of high testing cost caused by the complicated double winding structure in the prior art.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for those skilled in the art, various changes and modifications can be made without departing from the spirit of the invention, and these changes and modifications are all within the scope of the invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A B-H magnetization curve test method is used for testing the B-H magnetization curve of amorphous alloy soft magnetic materials, and is characterized by comprising the following steps:
manufacturing a single-winding device based on the tested material, and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
processing the square wave pulse signals sequentially passing through the single winding device and the detection resistor connected with the single winding device in series through a signal processor to obtain triangular wave signals;
acquiring the waveform curves at two ends of the detection resistor through a first channel of an oscilloscope, and acquiring the waveform curve of the triangular wave signal through a second channel of the oscilloscope;
and synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope to obtain the B-H magnetization curve of the single-winding device.
2. The B-H magnetization curve testing method according to claim 1, wherein the step of obtaining the waveform curves of both ends of the detection resistor through a first channel of an oscilloscope, and obtaining the waveform curve of the triangular wave signal through a second channel of the oscilloscope specifically comprises:
acquiring current I flowing through the single-winding device through the detection resistor, wherein the current I is U/R;
according to ampere's law in electromagnetism, the magnetic field strength H of the single-winding device,
h, N I/L, N U/L R, wherein L is the equivalent length of the single-winding device, and N is the number of turns of the winding coil of the single-winding device;
and acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
3. The B-H magnetization curve test method according to claim 2, characterized in that the method further comprises:
according to Faraday's law of magnetic induction
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
is the magnetic flux of the single winding device;
calculating the magnetic induction B of the single-winding device according to the magnetic flux relation,
wherein S is the effective sectional area of the single-winding device;
obtaining the signal processor integrated voltage V through the integration processing of the signal processor,
wherein C is a capacitance of the signal processor, and R is a resistance value of the signal processor;
calculating to obtain the magnetic induction intensity B of the single winding device which is approximately equal to RCV/NS based on the signal processor integral capacitor;
and acquiring the change rule of the magnetic induction intensity B of the single-winding device through a second channel of the oscilloscope.
4. The method of claim 1, wherein prior to the step of inputting a square-wave pulse signal with adjustable amplitude to the single-winding device via a square-wave pulse signal generator, the method further comprises:
conducting electricity to a power supply manager through a first module power supply so as to control the on-off of the square wave pulse signal generator through the power supply manager;
conducting electricity to the square wave pulse signal generator through a first module power supply so as to transmit the square wave pulse signal through the square wave pulse signal generator;
and conducting electricity to an adjustable power supply through the second module power supply, wherein the adjustable power supply controls the amplitude of the square wave pulse signal.
5. The method for testing the B-H magnetization curve according to claim 1, wherein the signal processor converts the square wave pulse signal into a triangular wave signal through active integration processing, and the signal processor supplies power to the signal processor through a power controller through a second module power supply to normally work.
6. The B-H magnetization curve test method according to claim 1, wherein the detection resistor is a high precision RTP non-inductive thick film power resistor.
7. The method of claim 4, wherein the first module power supply and the second module power supply are separately obtained by an alternating current adding filtering process.
8. A B-H magnetization curve testing apparatus, the apparatus comprising:
the signal input module is used for manufacturing a single-winding device based on the material to be detected and inputting a square wave pulse signal with adjustable amplitude to the single-winding device through a square wave pulse signal generator;
the signal processing module is used for processing the square wave pulse signals sequentially passing through the single winding device and the detection resistor connected with the single winding device in series through a signal processor to obtain triangular wave signals;
the signal acquisition module is used for acquiring the waveform curves at two ends of the detection resistor through a first channel of an oscilloscope and acquiring the waveform curve of the triangular wave signal through a second channel of the oscilloscope;
and the curve synthesis module is used for synthesizing the waveform curves respectively obtained by the first channel and the second channel of the oscilloscope so as to obtain the B-H magnetization curve of the single winding device.
9. The B-H magnetization curve testing device according to claim 7, characterized in that the device further comprises:
the current acquisition module is used for acquiring current I flowing through the single-winding device through the detection resistor, wherein the I is U/R;
a magnetic field strength calculation module for calculating the magnetic field strength H of the single-winding device according to the ampere's law in electromagnetism,
h, N I/L, N U/L R, wherein L is the equivalent length of the single-winding device, and N is the number of turns of the winding coil of the single-winding device;
and the magnetic field intensity acquisition module is used for acquiring the change rule of the magnetic field intensity H of the single-winding device through a first channel of the oscilloscope.
10. The B-H magnetization curve testing device according to claim 7, characterized in that the device further comprises:
an induced electromotive force calculation module for calculating the relationship between the Faraday's magnetic induction law and the electromagnetic field
Integrating the induced electromotive force-epsilon of the single-winding device to obtain
Wherein N is the number of turns of the winding coil of the single-winding device,
is the magnetic flux of the single winding device;
a magnetic induction conversion module for calculating the magnetic induction B of the single winding device according to the magnetic flux relationship,
wherein S is the effective sectional area of the single-winding device;
an integration processing module for obtaining the signal processor integration voltage V through the integration processing of the signal processor,
wherein C is a capacitance of the signal processor, and R is a resistance value of the signal processor;
a magnetic induction intensity calculating module for calculating the magnetic induction intensity of the single winding device based on the signal processor integral capacitance
And the magnetic induction intensity acquisition module is used for acquiring the change rule of the magnetic induction intensity B of the single-winding device through a second channel of the oscilloscope.
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