CN110542871B - Magnetic characteristic measurement system and method for magnetic material - Google Patents
Magnetic characteristic measurement system and method for magnetic material Download PDFInfo
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- CN110542871B CN110542871B CN201910957114.8A CN201910957114A CN110542871B CN 110542871 B CN110542871 B CN 110542871B CN 201910957114 A CN201910957114 A CN 201910957114A CN 110542871 B CN110542871 B CN 110542871B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/123—Measuring loss due to hysteresis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/12—Measuring magnetic properties of articles or specimens of solids or fluids
- G01R33/14—Measuring or plotting hysteresis curves
Abstract
The invention provides a system and a method for measuring magnetic characteristics of a magnetic material. The measuring system comprises a digital signal generator, a full-bridge inverter circuit, a filter circuit, a magnetic material single-chip tester and a data acquisition device, wherein four absorption capacitors of the filter circuit are respectively connected with four switching tubes of the full-bridge inverter circuit in parallel, so that the coupling with the full-bridge inverter circuit is realized, overshoot and oscillation generated in the switching process of the switching tubes are filtered out, the interference of peripheral circuits is effectively inhibited, and the measuring accuracy of the magnetic field intensity in the magnetic characteristic measuring process of the magnetic material is improved.
Description
Technical Field
The invention relates to the technical field of electromagnetic measurement, in particular to a system and a method for measuring magnetic characteristics of a magnetic material.
Background
Monolithic tester (SST) is an effective method for measuring the magnetic properties of magnetic materials, and is usually used in conjunction with a linear power supply such as a power amplifier to probe the magnetic properties of magnetic materials under different excitation forms. This is different from the practical working condition of using magnetic material as key element of high-frequency transformer for high-voltage DC transmission. The power electronic full-bridge inverter circuit widely applied to high-voltage direct-current transmission is actually a switching power supply, and due to the existence of parasitic inductance in a power loop of the circuit, the power electronic full-bridge inverter circuit can cause unavoidable overshoot and oscillation during switching action. On the other hand, any filter circuit cannot achieve the completely ideal effect, and in the case of the H-coil method, slight disturbances generated during the switching of the waveform may be amplified and delayed in the conversion of the electric-magnetic-electric signal, so that a more accurate method for determining the magnetic field strength is sought. The magnetic circuit method is a method for solving the magnetic field intensity developed based on the ampere loop law, and the key point is the determination of the magnetic circuit length, the IEC standard has the magnetic circuit length of an Ebostan square ring, but the standard of novel magnetic materials such as nanocrystalline and the like is not established, and the relationship between the effective magnetic circuit length and the sample piece length in a closed magnetic circuit cannot be visually determined, so that the accurate solution of the magnetic field intensity obtained by the magnetic circuit method is influenced.
Disclosure of Invention
The invention aims to provide a magnetic characteristic measuring system and method of a magnetic material, which are used for improving the magnetic field intensity accuracy of the magnetic material in the magnetic characteristic measuring process.
In order to achieve the purpose, the invention provides the following scheme:
a magnetic property measurement system of a magnetic material, the measurement system comprising:
the device comprises a digital signal generator, a full-bridge inverter circuit, a filter circuit, a magnetic material single-chip tester and a data acquisition device;
the digital signal generator is connected with the control end of the full-bridge inverter circuit;
the input end of the full-bridge inverter circuit is connected with a direct-current power supply, and the output end of the full-bridge inverter circuit is connected with an exciting coil of the magnetic material monolithic tester;
the input end of the data acquisition device is respectively connected with an exciting coil and an H coil of the magnetic material single-chip tester;
the filter circuit comprises four absorption capacitors which are respectively connected in parallel to the four switching tubes of the full-bridge inverter circuit.
Optionally, the magnetic material single-sheet tester includes: the device comprises a first iron yoke, a second iron yoke, a sample wafer bracket, an exciting coil and an H coil;
the sample wafer support is provided with a rectangular hollow structure, two ends of the sample wafer support are fixed on the inner side of the window of the first iron yoke through nylon screws, and the lower surface of the rectangular hollow structure and the section of the first iron yoke are on the same plane;
the second iron yoke is buckled on the first iron yoke;
the excitation coil is wound outside the sample wafer support; the tested sample wafer and the H coil are both placed in the rectangular hollow structure, and the H coil is located in the center of the upper portion of the tested sample wafer.
Optionally, the magnetic material single-sheet tester further comprises an induction coil;
the induction coil is wound outside the sample wafer support, and the excitation coil is wound outside the induction coil;
the induction coil is connected with the data acquisition device.
Optionally, the data acquisition device is an oscilloscope.
Optionally, the data acquisition device includes a data acquisition card and a computer.
A magnetic property measurement method of a magnetic material, the measurement method being based on the measurement system, the measurement method comprising the steps of:
controlling a full-bridge inverter circuit to provide sine wave excitation with different amplitudes and frequencies to an excitation coil of the magnetic material monolithic tester by using a digital signal generator of the measuring system;
respectively measuring the excitation current of an excitation coil and the induced voltage of an H coil under the excitation of sine waves with different amplitudes and frequencies;
determining the effective magnetic path length of the magnetic material single-chip tester by adopting a straight line fitting mode according to the excitation current of the excitation coil and the induction voltage of the H coil under the excitation of sine waves with different amplitudes and frequencies;
controlling a full-bridge inverter circuit to provide rectangular wave or PWM wave excitation for an excitation coil of the magnetic material monolithic tester by using a digital signal generator of the measuring system;
measuring the excitation current of an excitation coil under the excitation of rectangular waves or PWM waves;
and calculating the magnetic field intensity of the magnetic material single-chip tester based on an ampere loop law according to the effective magnetic path length of the magnetic material single-chip tester and the excitation current of the excitation coil under the excitation of the rectangular wave or the PWM wave.
Optionally, the method for determining the effective magnetic path length of the magnetic material monolithic tester by using a straight line fitting mode according to the excitation current of the excitation coil and the induced voltage of the H coil under the excitation of sine waves with different amplitudes and frequencies specifically includes:
according to the induced voltage u of the H coil under the excitation of sine waveH(t) using the formula
Calculating in the sample under testMagnetic field intensity Hs(t) wherein KHIs the coefficient of the H coil, mu0Magnetic permeability in vacuum;
according to formula N1i(t)＝Hs(t)·(lδ+ls)+ΔH(t)lδ＝Hs(t)·l+ΔH(t)lδCarrying out linear fitting on the magnetic field intensity and the excitation current in the sample wafer to be tested, which are obtained by calculating the induced voltage under the excitation of sine waves with different amplitudes and frequencies, and calculating the effective magnetic path length l of the magnetic material single-chip tester according to the slope of the linear obtained by fitting; wherein N is1I (t) the excitation current of the excitation coil, lδIs the air gap magnetic path length lsΔ H (t) ═ H for the magnetic path length of the sample piece to be measuredδ(t)-Hs(t)，Hδ(t) is the magnetic field strength in the air gap, Hs(t) is the magnetic field strength in the sample under test.
Optionally, the calculating, according to the effective magnetic path length of the magnetic material monolithic tester and the excitation current of the excitation coil under the excitation of the rectangular wave or the PWM wave, the magnetic field strength of the magnetic material monolithic tester under the excitation of the rectangular wave or the PWM wave based on the ampere loop law specifically includes:
using the effective magnetic path length l and the excitation current i (t) of the excitation coil under the excitation of the rectangular wave or PWM wave, and using the formula N1i (t) h (t) l, calculating the magnetic field strength h (t) of the magnetic material monolithic tester excited by the rectangular wave or the PWM wave; wherein N is1Showing the excitation coil.
Optionally, the calculating the magnetic field strength of the monolithic magnetic material tester based on the ampere loop law according to the effective magnetic path length of the monolithic magnetic material tester and the excitation current of the excitation coil excited by the rectangular wave or the PWM wave further includes:
measuring an induced voltage of an induction coil of the measurement system;
calculating the magnetic flux density of the magnetic material single-chip tester by using the induced voltage of the induction coil;
and drawing a BH magnetic hysteresis loop reflecting the magnetic characteristics of the single piece to be tested according to the magnetic field intensity and the magnetic flux density of the magnetic material single piece tester.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
the invention provides a system and a method for measuring magnetic characteristics of a magnetic material. The measuring system comprises a digital signal generator, a full-bridge inverter circuit, a filter circuit, a magnetic material single-chip tester and a data acquisition device, wherein four absorption capacitors of the filter circuit are respectively connected with four switching tubes of the full-bridge inverter circuit in parallel, so that the coupling with the full-bridge inverter circuit is realized, overshoot and oscillation generated in the switching process of the switching tubes are filtered out, the interference of peripheral circuits is effectively inhibited, and the measuring accuracy of the magnetic field intensity in the magnetic characteristic measuring process of the magnetic material is improved.
In addition, the measurement system of the invention provides an excitation power supply through the full-bridge inverter circuit, and the magnetization characteristic of the magnetic material is reflected closer to the practical application working condition. Because the exciting coil is directly wound on the sample wafer bracket instead of the magnetic circuit iron yoke, the influence of an air gap is small, and the required exciting power is low. The full-bridge inverter circuit comprises four switching tubes, the switching tubes can adopt high-frequency power electronic devices such as Si IGBT or SiC MOSFET, and the measurement bandwidth is determined by the frequency limit of the power electronic devices.
The invention provides a magnetic characteristic measuring method of a magnetic material, which correctly reflects the effective magnetic path length of the loss of a corresponding uniform magnetization area (under sine wave excitation) in a measuring system, provides a basis for magnetic field intensity calculation under arbitrary waveform excitation, and improves the measuring accuracy of the magnetic field intensity in the magnetic characteristic measuring process of the magnetic material.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
Fig. 1 is a structural view of a magnetic property measurement system of a magnetic material according to the present invention;
FIG. 2 is a block diagram of a magnetic material single-piece tester provided in the present invention;
FIG. 3 is a fitted line graph of magnetic field strength and excitation current in a sample wafer under test provided by the present invention;
fig. 4 is a flowchart of a method for measuring magnetic properties of a magnetic material according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The invention aims to provide a magnetic characteristic measuring system and a magnetic characteristic measuring method of a magnetic material, so as to improve the measuring accuracy of the magnetic field intensity in the magnetic characteristic measuring process of the magnetic material.
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
As shown in fig. 1, the present invention provides a magnetic property measurement system for magnetic materials, which can be applied to the measurement of the magnetic properties of novel magnetic materials such as nanocrystals under any alternating field, and the measurement system comprises a digital signal generator 1(DSP), a full-bridge inverter circuit 2, a filter circuit 3, a magnetic material monolithic tester 4 and a data acquisition device 5; the digital signal generator 1 is connected with the control end of the full-bridge inverter circuit 2; the input end of the full-bridge inverter circuit 2 is connected with a direct current power supply, and the output end of the full-bridge inverter circuit 2 is connected with an exciting coil of the magnetic material monolithic tester 4; the input end of the data acquisition device 5 is respectively connected with an excitation coil and an H coil of the magnetic material single-chip tester 4; the filter circuit 3 comprises four absorption capacitors which are respectively connected in parallel to the four switching tubes of the full-bridge inverter circuit 2. Wherein, the data acquisition device 5 may be an oscilloscope. The data acquisition device can also be a device comprising a data acquisition card and a computer, and a visual interface is built on the computer.
The full-bridge inverter circuit comprises four switching tubes, the switching tubes adopt high-frequency power electronic devices such as Si IGBT or SiCMOS field effect transistor, and the measurement bandwidth is determined by the frequency limit of the power electronic devices.
As shown in fig. 2, the magnetic material single-sheet tester 4 includes: a first iron yoke 7, a second iron yoke 6, a coupon holder 8, an exciting coil 9, and an H-coil 11;
the sample wafer support 8 is provided with a rectangular hollow structure, two ends of the sample wafer support 8 are respectively fixed on the inner sides of the left window and the right window of the first iron yoke 7 through nylon screws, and the lower surface of the rectangular hollow structure and the section of the first iron yoke are on the same plane; the second iron yoke 6 is buckled on the first iron yoke 7; the exciting coil 9 is wound outside the sample holder 8; the sample piece to be measured 12 and the H coil are both arranged in the rectangular hollow structure, and the H coil is positioned at the upper part of the sample piece to be measured. As a preferred embodiment, the magnetic material single-piece tester 4 further comprises an induction coil 10; the induction coil 10 is wound outside the sample holder 8, and the excitation coil 9 is wound outside the induction coil 10; the induction coil 10 is connected with the data acquisition device 5.
Specifically, the induction coil 10 of the magnetic material single-sheet tester 4 is wound on the outer layer of the sample wafer support for 8 times, the excitation coil 9 is wound on the induction coil 10 (namely, the outermost layer of the sample wafer support), the sample wafer support 8 is fixed on the inner side of the window of the first iron yoke 7 through nylon screws, so that the lower surface of the inner side of the sample wafer support 8 is kept horizontal with the section 14 of the first iron yoke, the sample wafer 12 to be tested is inserted into the sample wafer support 8, the H coil 11 is placed at the central position of the surface of the sample wafer to be tested, and further, the second iron yoke 6 is lightly placed on the first iron yoke 7, and the sections 13 and 14 of the two are ensured to be superposed.
Because the exciting coil 9 is wound on the sample wafer support 8, the sample wafer 12 to be measured is magnetized only by generating enough magnetic field intensity on the sample wafer 12 to be measured and simultaneously having a closed magnetic circuit, so that the exciting power required by the system of the invention is less than that of a measuring system in which the exciting coil is wound on the first iron yoke 7 and the second iron yoke 6.
The invention also provides a magnetic characteristic measuring method of the magnetic material, and the measuring method is based on the measuring system provided by the invention.
In the magnetic circuit of the magnetic material single-sheet tester 4, ampere-loop law (1) is satisfied:
N1i(t)＝H(t)l (1)
wherein N is1-the number of turns of the exciting coil; i (t) -the excitation coil current; h (t) -the magnetic field strength of the magnetic material single-sheet tester; l-the equivalent magnetic path length of the single-sheet tester of magnetic material.
Since the thickness of the nanocrystalline material is typically 20 μm to 25 μm and the width is 40mm, the cross-sectional area of the magnetic flux passing through the sample piece to be measured is much smaller than the cross-sectional area of the yoke. In the entire closed magnetic circuit, the conservation of magnetic flux is satisfied, and the magnetic field intensity in the first and second iron yokes 7 and 6 can be ignored. Then, the formula (2) is satisfied for the measurement system of the present invention:
l＝lδ+ls(2)
wherein lδAir gap magnetic path length ls-the magnetic path length of the sample piece to be measured.
Substituting the formula (2) into the formula (1),
N1i(t)＝Hδ(t)lδ+Hs(t)ls(3)
wherein Hδ(t) -magnetic field strength in the air gap, Hs(t) — the magnetic field strength in the sample sheet under test.
Phi (t) -the magnetic flux in the magnetic circuit, being equal everywhere in the entire closed magnetic circuit, mu0Permeability in vacuum, μrThe relative permeability of the sample material under test.
For nanocrystalline materials, murUp to 2X 104Therefore, the magnetic field strength in the air gap is much higher than that in the sample piece to be measured, but the second term in equation (4) cannot be easily ignored because the air gap magnetic path length is narrow. Equation (5) is introduced for processing,
Hδ(t)＝Hs(t)+ΔH(t) (5)
substituting (5) into (3),
N1i(t)＝Hs(t)·(lδ+ls)+ΔH(t)lδ(6)
according to the measurement result under the sinusoidal excitation, as shown in fig. 3, the relationship between the excitation current reflected by equation (6) and the magnetic field strength of the surface of the sample to be measured is a linear function, i.e. the second term at the right end of equation (6) is approximately a constant of approximately 0 due to the extremely small length of the air gap magnetic circuit. As shown in FIG. 3, a straight line (abscissa is magnetic field intensity H in a sample under test) is fitted according to the function of equation (6)s(t) the ordinate is the current value of the exciting coil) to obtain the effective magnetic path length of the magnetic material single-sheet tester 4. The length of the magnetic circuit is not changed along with the frequency and is only related to the applied magnetic induction, so that the magnetic circuit can be applied to rectangular waves with adjustable duty ratios and PWM excitation to obtain the magnetic field intensity.
Therefore, as shown in fig. 4, the specific steps of the measurement method provided by the present invention include:
according to the induced voltage u of the H coil under the excitation of sine waveH(t) using the formula
Calculating the magnetic field strength H in the sample to be measureds(t) wherein KHIs the coefficient of the H coil, mu0Magnetic permeability in vacuum;
according to formula N1i(t)＝Hs(t)·(lδ+ls)+ΔH(t)lδ＝Hs(t)·l+ΔH(t)lδCarrying out linear fitting on the magnetic field intensity and the excitation current in the sample wafer to be tested, which are obtained by calculating the induced voltage under the excitation of sine waves with different amplitudes and frequencies, and calculating the effective magnetic path length l of the magnetic material single-chip tester according to the slope of the linear obtained by fitting; wherein N is1I (t) the excitation current of the excitation coil, lδIs the air gap magnetic path length lsΔ H (t) ═ H for the magnetic path length of the sample piece to be measuredδ(t)-Hs(t)，Hδ(t) is the magnetic field strength in the air gap, Hs(t) is the magnetic field strength in the sample under test.
And step 404, controlling a full-bridge inverter circuit to provide rectangular wave or PWM wave excitation to an excitation coil of the magnetic material single-chip tester by using a digital signal generator of the measuring system.
excitation of the exciting coil under excitation of the rectangular wave or PWM wave using the effective magnetic path length lExcitation current i (t) using the formula N1i (t) h (t) l, calculating the magnetic field strength h (t) of the magnetic material monolithic tester excited by the rectangular wave or the PWM wave; wherein N is1Indicating the number of exciting coil turns.
measuring an induced voltage of an induction coil of the measurement system; calculating the magnetic flux density of the magnetic material single-chip tester by using the induced current; and calculating the magnetic flux of the magnetic material single-sheet tester according to the magnetic field intensity and the magnetic flux density of the magnetic material single-sheet tester. The working principle and the working process of measurement by using the measurement system and the method provided by the invention are as follows: the program is programmed in the digital signal generator 1, the digital signal generator 1 outputs pulse signals to control the on-off of the switch tubes in the full-bridge inverter circuit 2 so as to output required waveforms, and the filter circuit 3 is composed of capacitors connected in parallel to the four switch tubes of the full-bridge inverter circuit, so that a path is provided for high-frequency signals generated in the switching process, and the output waveforms of the full-bridge inverter circuit 2 are ideal. The voltage of an induction coil 10 and the current of an H coil 11 on the SST are acquired by a probe of a data acquisition device, the magnetic induction and the magnetic field intensity of a nanocrystalline sample to be detected 12 can be respectively calculated according to a Faraday electromagnetic induction law and an ampere loop law, and a related hysteresis loop is drawn for loss calculation.
Compared with the prior art, the invention has the beneficial effects that: the magnetic material is combined with a full-bridge inverter circuit, so that the magnetization characteristic of the magnetic material is reflected closer to the actual application working condition; the filter circuit is coupled with the power electronic full-bridge inverter circuit, so that the interference of a peripheral circuit is reduced, and the oscillation and overshoot in an excitation waveform are effectively inhibited; because the exciting coil is directly wound on the sample wafer bracket instead of the magnetic circuit iron yoke, the influence of an air gap is small, and the required exciting power is low.
The invention provides a new method for determining the effective magnetic path length, which correctly reflects the effective magnetic path length corresponding to the loss of a uniform magnetization area in a measurement system and provides a basis for loss calculation.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The principle and the implementation manner of the present invention are explained by applying specific examples, the above description of the embodiments is only used to help understanding the method of the present invention and the core idea thereof, the described embodiments are only a part of the embodiments of the present invention, not all embodiments, and all other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention without creative efforts belong to the protection scope of the present invention.
Claims (7)
1. A method for measuring a magnetic property of a magnetic material, the method being based on a system for measuring a magnetic property of a magnetic material, the system comprising:
the device comprises a digital signal generator, a full-bridge inverter circuit, a filter circuit, a magnetic material single-chip tester and a data acquisition device;
the digital signal generator is connected with the control end of the full-bridge inverter circuit;
the input end of the full-bridge inverter circuit is connected with a direct-current power supply, and the output end of the full-bridge inverter circuit is connected with an exciting coil of the magnetic material monolithic tester;
the input end of the data acquisition device is respectively connected with an exciting coil and an H coil of the magnetic material single-chip tester;
the filter circuit comprises four absorption capacitors which are respectively connected in parallel with four switching tubes of the full-bridge inverter circuit;
the measuring method comprises the following steps:
controlling a full-bridge inverter circuit to provide sine wave excitation with different amplitudes and frequencies to an excitation coil of the magnetic material monolithic tester by using a digital signal generator of the measuring system;
respectively measuring the excitation current of an excitation coil and the induced voltage of an H coil under the excitation of sine waves with different amplitudes and frequencies;
determining the effective magnetic path length of the magnetic material single-chip tester by adopting a straight line fitting mode according to the excitation current of the excitation coil and the induction voltage of the H coil under the excitation of sine waves with different amplitudes and frequencies; the method specifically comprises the following steps: according to the induced voltage u of the H coil under the excitation of sine waveH(t) using the formula
Calculating the magnetic field strength H in the sample to be measureds(t) wherein KHIs the coefficient of the H coil, mu0Magnetic permeability in vacuum; according to formula N1i(t)＝Hs(t)·(lδ+ls)+ΔH(t)lδ＝Hs(t)·l+ΔH(t)lδCarrying out linear fitting on the magnetic field intensity and the excitation current in the sample wafer to be tested, which are obtained by calculating the induced voltage under the excitation of sine waves with different amplitudes and frequencies, and calculating the effective magnetic path length l of the magnetic material single-chip tester according to the slope of the linear obtained by fitting; wherein N is1I (t) the excitation current of the excitation coil, lδIs the air gap magnetic path length lsΔ H (t) ═ H for the magnetic path length of the sample piece to be measuredδ(t)-Hs(t)，Hδ(t) is the magnetic field strength in the air gap, Hs(t) is the magnetic field strength in the sample under test;
controlling a full-bridge inverter circuit to provide rectangular wave or PWM wave excitation for an excitation coil of the magnetic material monolithic tester by using a digital signal generator of the measuring system;
measuring the excitation current of an excitation coil under the excitation of rectangular waves or PWM waves;
and calculating the magnetic field intensity of the magnetic material single-chip tester based on an ampere loop law according to the effective magnetic path length of the magnetic material single-chip tester and the excitation current of the excitation coil under the excitation of the rectangular wave or the PWM wave.
2. The method of measuring the magnetic characteristics of a magnetic material according to claim 1, wherein the magnetic material single-sheet tester comprises: the device comprises a first iron yoke, a second iron yoke, a sample wafer bracket, an exciting coil and an H coil;
the sample wafer support is provided with a rectangular hollow structure, two ends of the sample wafer support are fixed on the inner side of the window of the first iron yoke through nylon screws, and the lower surface of the rectangular hollow structure and the section of the first iron yoke are on the same plane;
the second iron yoke is buckled on the first iron yoke;
the excitation coil is wound outside the sample wafer support; the tested sample wafer and the H coil are both placed in the rectangular hollow structure, and the H coil is located in the center of the upper portion of the tested sample wafer.
3. The method of measuring the magnetic characteristics of a magnetic material according to claim 2, wherein the magnetic material single-sheet tester further comprises an induction coil;
the induction coil is wound outside the sample wafer support, and the excitation coil is wound outside the induction coil;
the induction coil is connected with the data acquisition device.
4. The method of measuring the magnetic properties of a magnetic material according to claim 1, wherein the data acquisition device is an oscilloscope.
5. The method of claim 1, wherein the data acquisition device comprises a data acquisition card and a computer.
6. The method for measuring the magnetic properties of the magnetic material according to claim 1, wherein the calculating of the magnetic field strength of the magnetic material single-wafer tester excited by the rectangular wave or the PWM wave based on the ampere loop law according to the effective magnetic path length of the magnetic material single-wafer tester and the excitation current of the excitation coil excited by the rectangular wave or the PWM wave specifically comprises:
using the effective magnetic path length l and the excitation current i (t) of the excitation coil under the excitation of the rectangular wave or PWM wave, and using the formula N1i (t) h (t) l, calculating the magnetic field strength h (t) of the magnetic material monolithic tester excited by the rectangular wave or the PWM wave; wherein N is1Showing the excitation coil.
7. The method of measuring the magnetic characteristics of a magnetic material according to claim 1, wherein the method further comprises calculating the magnetic field strength of the magnetic material single wafer tester based on ampere loop law from the effective magnetic path length of the magnetic material single wafer tester and the excitation current of the excitation coil under excitation of the rectangular wave or PWM wave, and thereafter:
measuring the induced voltage of an induction coil of the magnetic material single-chip tester;
calculating the magnetic flux density of the magnetic material single-chip tester by using the induced voltage of the induction coil;
and drawing a BH magnetic hysteresis loop reflecting the magnetic characteristics of the single piece to be tested according to the magnetic field intensity and the magnetic flux density of the magnetic material single piece tester.
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| CN203606476U (en) * | 2013-12-05 | 2014-05-21 | 武汉钢铁(集团)公司 | System for measuring magnetic characteristics of silicon steel sheet under excitation of PWM power supply |
| CN104569875B (en) * | 2015-01-06 | 2018-01-05 | 北京航空航天大学 | Silicon steel sheet two-dimensional magnetic property measuring system and its measuring method under a kind of controllable stress condition |
| CN104616863B (en) * | 2015-02-04 | 2016-07-20 | 浙江工业大学 | A kind of orthogonal iron core type controlled reactor containing wedge-shaped slot and under D.C. magnetic biasing the computational methods of the equivalence length of magnetic path |
| CN108459193B (en) * | 2018-04-04 | 2020-09-11 | 北京智芯微电子科技有限公司 | Alternating current measuring device |
| CN108919150B (en) * | 2018-07-20 | 2023-05-02 | 河北工业大学 | Vertical three-phase flexible broadband rotating magnetic characteristic measurement system and measurement method |
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2019
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