CN201615942U - Silicon steel sheet magnetic surveying device - Google Patents
Silicon steel sheet magnetic surveying device Download PDFInfo
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- CN201615942U CN201615942U CN2009202122760U CN200920212276U CN201615942U CN 201615942 U CN201615942 U CN 201615942U CN 2009202122760 U CN2009202122760 U CN 2009202122760U CN 200920212276 U CN200920212276 U CN 200920212276U CN 201615942 U CN201615942 U CN 201615942U
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- magnetic survey
- tautness meter
- steel sheet
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Abstract
The utility model discloses a silicon steel sheet magnetic surveying device, which comprises a magnetic surveying part, a base, a tensometer and a tension part, wherein a silicon steel sheet sample is arranged inside the magnetic surveying part; a limiting column and a support are respectively disposed on the base; one end of the sample is fixed onto the limiting column; the other end of the sample is connected with the tensometer; and the other end of the tensometer is connected with the tension part which is arranged on the support. The silicon steel sheet magnetic surveying device tensions the sample through rotation of a hand wheel, displays and records tension force through the tensometer, and provides accurate and continuous tension force for magnetic surveying of the sample, accordingly detects magnetic property of the silicon steel sheet under stress.
Description
Technical field
The utility model relates to the Magnetic Measurement technology of siliconized plate, more particularly, relates to a kind of siliconized plate magnetic survey device.
Background technology
Silicon steel is one of important Metallic Functional Materials, and iron loss and magnetic strength are the important magnetic characteristic indexs of two of silicon steel.At present, in the magnetic characteristic testing process of siliconized plate, sample all carries out not being with under the stress situation.Yet in actual use, siliconized plate carries out work having again often under the stress situation.Therefore, the magnetic characteristic of siliconized plate detection index can't accurately reflect magnetic characteristic situation of change in actual use.Number of patent application is that 200820190216.9 Chinese patent discloses a kind of coating tension measuring device that is used for siliconized plate Magnetic Measurement instrument, this measurement mechanism mainly is aimed at the coating of detection siliconized plate and the tension force situation of bottom, but have following two shortcomings: 1, since by the sample stress point only at a side end, this can make sample owing to deflection takes place discontinuity, degree of orientation variation when causing magnetic survey influences measurement result; 2, owing to adopt the instrument of counterweight as stress application, tension force range interval in the time of not only can being limited in practice, thereby can't detect the magnetic property of sample under the extreme case, and can't accomplish pulling force is distributed more subtly because of counterweight, thereby the tension force that causes being applied in the magnetic survey process is not continuous data, and be discrete data, reduced measurement effect.
The utility model content
At the above-mentioned shortcoming that exists in the prior art, the purpose of this utility model provides a kind of siliconized plate magnetic survey device, and this magnetic survey device can provide accurate and continuous stress when detecting the magnetic characteristic of siliconized plate.
For achieving the above object, the utility model adopts following technical scheme:
In comprising, establishes in this siliconized plate magnetic survey device the magnetic survey parts of sample, also comprise base, tautness meter and stress part, be respectively equipped with spacing column and support on the base, described sample one end is fixed on the spacing column, the other end links to each other with tautness meter, the tautness meter other end links to each other with stress part, and stress part is located on the support.
Described stress part comprises handwheel, wire rope and screens device, and handwheel is located on the support, and wire rope one end winding is on handwheel, and the other end links to each other with tautness meter, and the screens device is located on the handwheel.
Described spacing column is a pair of, and described sample one end is provided with two through holes, and is sheathed on the spacing column, and the sample other end is provided with a through hole, and links to each other with the hook of tautness meter.
Described pulling force is counted electronic digital display type tautness meter.
In technique scheme, in comprising, establishes in siliconized plate magnetic survey device of the present utility model magnetic survey parts, base, tautness meter and the stress part of siliconized plate sample, be respectively equipped with spacing column and support on the base, sample one end is fixed on the spacing column, the other end links to each other with tautness meter, the tautness meter other end links to each other with stress part, and stress part is located on the support.This magnetic survey device rotates tensile sample by handwheel, shows and the record pulling force by tautness meter, for the magnetic survey of sample provides accurate and continuous pulling force, is subjected to detect under the stress situation siliconized plate magnetic characteristic thereby be implemented in.
Description of drawings
Fig. 1 is the structural representation of siliconized plate magnetic survey device of the present utility model;
Fig. 2 is the A portion vertical view among Fig. 1;
Fig. 3 is the side view of the spacing column among Fig. 1.
Embodiment
Further specify the technical solution of the utility model below in conjunction with drawings and Examples.
See also Fig. 1～shown in Figure 3, in comprising, establishes in siliconized plate magnetic survey device 10 of the present utility model the magnetic survey parts 11 of sample, these magnetic survey parts 11 are basic identical with prior art, equally also comprise upper and lower two symmetrically arranged U type yokes 111, coil, magnetic survey device (not shown) etc., wherein be embedded with nonmagnetic framework 112 on the opposing end surface of U type yoke 111 respectively; 1 on siliconized plate sample is located between the nonmagnetic framework 112, and two ends pass nonmagnetic framework 112 respectively.Different is with prior art, this magnetic survey device 10 also comprises base 12, tautness meter 13 and stress part 14, be respectively equipped with spacing column 15 and support 16 on the base 12, spacing column 15 is a pair of, and the end that sample 1 passes is provided with two through holes, and is sheathed on the spacing column 15 by through hole, sample 1 other end is provided with a through hole, and link to each other with the hook of tautness meter 13, tautness meter 13 other ends link to each other with stress part 14, and stress part 14 is located on the support 16.Stress part 14 comprises handwheel 141, wire rope 142 and screens device 143, handwheel 141 is located on the support 16, wire rope 142 1 end windings are on handwheel 141, the other end links to each other with tautness meter 13, screens device 143 is located on the handwheel 141, play the effect of snap close, thereby the back handwheel 141 of guaranteeing to let go turns round no longer, keeps default pulling force constant.In order to write down and read pulling force numerical value more accurately, optional it can show any big or small pulling force in 0～20kgf scope with electron number phenotype tautness meter, and degree of accuracy reaches 0.01, can satisfy the demand of band stress magnetic survey.
The principle of work of this magnetic survey device 10 is as follows:
The magnetic characteristic data of this sample 1, for example magnetic strength (B8) and iron loss (P17/50) are measured and write down to tested siliconized plate sample 1 by after shown in Figure 1 the installing, earlier when not applying pulling force, by magnetic survey parts 11; Subsequently, rotate handwheel 141, increase pulling force gradually, and can carry out step-less adjustment and control the pulling force size to sample 1 by the mode of turning clockwise; Then, lock screens device 143 again, the fixing pulling force that has been provided with remains unchanged, and measures and note the magnetic characteristic data under this pulling force situation this moment; Be rotated further handwheel 141 again and increase pulling force, measure and the magnetic characteristic data of record sample 1 under different pulling force, last statistics can obtain the relation of pulling force and magnetic property.In whole testing process, because sample 1 two ends are fixed, principle according to " crossing 2 definite straight lines ", even can guarantee that sample 1 is in discontinuity, therefore deflection can not take place, thereby avoid sample 1 degree of orientation variation in the magnetic survey process, effectively guaranteed the accuracy of magnetic characteristic energy measured value.
Those of ordinary skill in the art will be appreciated that, above embodiment is used for illustrating the utility model, and be not to be used as qualification of the present utility model, as long as in connotation scope of the present utility model, all will drop in claims scope of the present utility model variation, the modification of the above embodiment.
Claims (4)
1. siliconized plate magnetic survey device is established the magnetic survey parts of siliconized plate sample in comprising, it is characterized in that:
This magnetic survey device also comprises base, tautness meter and stress part, be respectively equipped with spacing column and support on the base, described sample one end is fixed on the spacing column, and the other end links to each other with tautness meter, the tautness meter other end links to each other with stress part, and stress part is located on the support.
2. siliconized plate magnetic survey device as claimed in claim 1 is characterized in that:
Described stress part comprises handwheel, wire rope and screens device, and handwheel is located on the support, and wire rope one end winding is on handwheel, and the other end links to each other with tautness meter, and the screens device is located on the handwheel.
3. siliconized plate magnetic survey device as claimed in claim 1 is characterized in that:
Described spacing column is a pair of, and described sample one end is provided with two through holes, and is sheathed on the spacing column, and the sample other end is provided with a through hole, and links to each other with the hook of tautness meter.
4. siliconized plate magnetic survey device as claimed in claim 1 is characterized in that:
Described pulling force is counted electronic digital display type tautness meter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202122760U CN201615942U (en) | 2009-11-12 | 2009-11-12 | Silicon steel sheet magnetic surveying device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009202122760U CN201615942U (en) | 2009-11-12 | 2009-11-12 | Silicon steel sheet magnetic surveying device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201615942U true CN201615942U (en) | 2010-10-27 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009202122760U Expired - Fee Related CN201615942U (en) | 2009-11-12 | 2009-11-12 | Silicon steel sheet magnetic surveying device |
Country Status (1)
| Country | Link |
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| CN (1) | CN201615942U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102749596A (en) * | 2011-04-22 | 2012-10-24 | 中国科学院电子学研究所 | Magnetic steel performance consistency screening device for space travelling wave tube |
| CN108802638A (en) * | 2017-04-26 | 2018-11-13 | 河北工业大学 | Nanocrystalline high frequency property detection device and measurement method under a kind of consideration stress |
| CN110542871A (en) * | 2019-10-10 | 2019-12-06 | 华北电力大学 | magnetic characteristic measurement system and method for magnetic material |
| CN110687486A (en) * | 2019-10-11 | 2020-01-14 | 安徽万磁电子有限公司 | Magnetic strength detection device and detection method for detecting magnetism of magnetic shoe |
-
2009
- 2009-11-12 CN CN2009202122760U patent/CN201615942U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102749596A (en) * | 2011-04-22 | 2012-10-24 | 中国科学院电子学研究所 | Magnetic steel performance consistency screening device for space travelling wave tube |
| CN102749596B (en) * | 2011-04-22 | 2014-06-11 | 中国科学院电子学研究所 | Magnetic steel performance consistency screening device for space travelling wave tube |
| CN108802638A (en) * | 2017-04-26 | 2018-11-13 | 河北工业大学 | Nanocrystalline high frequency property detection device and measurement method under a kind of consideration stress |
| CN108802638B (en) * | 2017-04-26 | 2021-04-13 | 河北工业大学 | Nanocrystalline high-frequency magnetic characteristic detection device and measuring method under stress |
| CN110542871A (en) * | 2019-10-10 | 2019-12-06 | 华北电力大学 | magnetic characteristic measurement system and method for magnetic material |
| CN110687486A (en) * | 2019-10-11 | 2020-01-14 | 安徽万磁电子有限公司 | Magnetic strength detection device and detection method for detecting magnetism of magnetic shoe |
| CN110687486B (en) * | 2019-10-11 | 2021-06-08 | 安徽万磁电子有限公司 | Magnetic strength detection device and detection method for detecting magnetism of magnetic shoe |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101027 Termination date: 20161112 |
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| CF01 | Termination of patent right due to non-payment of annual fee |