CN114325208A - Modularized testing device and testing equipment applied by same - Google Patents

Modularized testing device and testing equipment applied by same Download PDF

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Publication number
CN114325208A
CN114325208A CN202011061617.6A CN202011061617A CN114325208A CN 114325208 A CN114325208 A CN 114325208A CN 202011061617 A CN202011061617 A CN 202011061617A CN 114325208 A CN114325208 A CN 114325208A
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China
Prior art keywords
testing
unit
carrier
assembled
modular
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CN202011061617.6A
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Chinese (zh)
Inventor
李子玮
李思宏
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Hongjin Precision Co ltd
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Hongjin Precision Co ltd
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Application filed by Hongjin Precision Co ltd filed Critical Hongjin Precision Co ltd
Priority to CN202011061617.6A priority Critical patent/CN114325208A/en
Publication of CN114325208A publication Critical patent/CN114325208A/en
Pending legal-status Critical Current

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Abstract

The invention provides a modularized testing device, which comprises a bearing unit, a testing unit and a crimping unit, wherein a carrier of the bearing unit bears the testing unit which can slide, a bearing plate of the testing unit is provided with a plurality of testers, the testers are used for bearing and testing a plurality of electronic elements, the crimping unit is assembled on the carrier of the bearing unit through a detachable frame, the frame is assembled with a plurality of crimpers, and the plurality of crimpers are aligned to the plurality of testers, so that the modularized testing device is beneficial to repair and replacement, a batch of a plurality of electronic elements can be conveniently taken and placed when the testing unit slides out of the carrier, and the crimping unit is used for crimping the plurality of electronic elements to execute testing operation when the testing unit slides in the carrier, thereby improving the use efficiency.

Description

Modularized testing device and testing equipment applied by same
Technical Field
The invention relates to a modularized testing device which is modularized, is beneficial to repair and replacement and improves the operation convenience.
Background
At present, after the electronic device is manufactured, the testing equipment must perform testing operation on the electronic device to eliminate the defective products. Referring to fig. 1, in the present test equipment, a feeding device 12 and a receiving device 13 are disposed at a front section of a machine 11, and a plurality of test devices 14A, 14B, 14C, 14D, 14E, and 14F are horizontally arranged at a rear section of the machine 11, where, taking the test device 14A as an example, two electrically connected test seats 141A and a circuit board 142A are fixedly disposed on the machine 11 for performing test operations on electronic components, the test device 14A further includes a rack 143A disposed on the machine 11, the rack 143A is assembled with a crimping device 144A, and the crimping device 144A corresponds to the test seat 141A for pressing down the electronic components in the test seat 141A to perform test operations; the testing apparatus uses the conveyor 15 to extend into the testing device 14A, and take out a tested electronic component from the testing seat 141A, and move an electronic component to be tested into the testing seat 141A to perform the testing operation, and so on, the conveyor 15 sequentially performs the operations of taking out the tested electronic component and placing the tested electronic component on the plurality of testing devices 14B, 14C, 14D, 14E, 14F; however, the conveyor 15 must move in and out of the plurality of testing devices 14A, 14B, 14C, 14D, 14E, 14F repeatedly, so as to move in and out of a single electronic device, which not only increases the operation timing and consumes time, but also reduces the testing throughput. In addition, when replacing different types of test sockets, circuit boards and crimpers, the test sockets, circuit boards and crimpers must be removed from each of the test apparatuses 14A, 14B, 14C, 14D, 14E and 14F one by one, which makes the replacement operation complicated and time consuming. Furthermore, in order to move the feeder 15 between the pressing device 144A and the test seat 141A, the height of the frame 143A and the pressing device 144A must be increased, which not only increases the volume of the testing device 14A, but also extends the pressing stroke of the pressing device 144A to increase the working time.
Disclosure of Invention
The invention aims to: the utility model provides a modularization testing arrangement and applied test equipment thereof solves the above-mentioned technical problem that exists among the prior art.
In order to achieve the purpose, the invention adopts the technical scheme that:
a modular testing apparatus, comprising:
a bearing unit: a carrier is arranged;
a test unit: comprises a carrier plate and a plurality of testers, wherein the carrier plate can move into/out of the carrier of the bearing unit, and the testers are assembled on the carrier plate and used for bearing and testing the plurality of electronic elements;
a pressure welding unit: comprises a frame and a plurality of crimpers, wherein the frame is assembled on the carrier of the bearing unit, and the plurality of crimpers are assembled on the frame for crimping the plurality of electronic elements of the plurality of testers.
The modular test device further comprises a driving unit, wherein the driving unit is provided with at least one driver to drive the test unit to move.
In the modularized testing device, at least one sliding rail set is arranged between the bearing plate of the testing unit and the carrier of the bearing unit.
In the modular testing device, the supporting plate of the testing unit is provided with a plurality of supporting parts, and the plurality of supporting parts are used for bearing and supporting the plurality of testers.
In the modularized testing device, at least one quick release device is arranged between the carrier and the frame of the compression joint unit.
The modular testing apparatus is characterized in that the crimper of the crimping unit comprises:
a first movable member;
a second movable member: is arranged opposite to the first movable piece along the operation axis;
an operating part: the first movable piece is assembled for being connected with the electronic element in a pressing mode;
a drive source: for driving the first movable member and the second movable member to move reversely;
an actuating device: the second movable piece is assembled to drive the second movable piece to move reversely along the operation axis;
a limiting part: the limiting part is arranged on the actuating tool and can limit the reverse displacement of the operating part along the operating axis when the limiting part is limited in bearing.
The modular testing device is characterized in that the crimping device further comprises an adjusting structure for finely adjusting the operation piece, the adjusting structure comprises a first adjusting piece and a second adjusting piece, the first adjusting piece is assembled on the frame and provided with a first floating connection portion, the second adjusting piece is used for driving the actuating tool to move, and a second floating connection portion is arranged and matched with the first floating connection portion.
The modularized testing device is characterized in that the crimping device further comprises at least one blocking part, and the blocking part can be arranged on the tester, the bearing plate or the frame to block the limiting part.
The modular testing device is characterized in that the crimping device further comprises a resetting structure, the resetting structure is provided with a cover plate on the first adjusting piece, and a first elastic piece is arranged between the cover plate and the actuating piece or the second moving piece.
A test apparatus using a modular test device, comprising:
a machine platform;
a feeding device: at least one feeding and bearing device arranged on the machine platform and used for accommodating the electronic element to be operated;
the material receiving device comprises: at least one material receiving and placing device arranged on the machine platform and used for accommodating the operated electronic elements;
a frame body: is arranged on the machine table and is provided with a plurality of layers of erection spaces;
a plurality of said modular test apparatus: the plurality of layers of the erection spaces are assembled on the frame body;
a conveying device: at least one first conveyor arranged on the machine table for conveying the electronic elements;
the central control device: for controlling and integrating the operation of each device.
The present invention provides a modular testing device, which comprises a bearing unit, a testing unit and a crimping unit, wherein a carrier of the bearing unit bears the testing unit which can slide, a bearing plate of the testing unit is provided with a plurality of testers, the testers are used for bearing and testing a plurality of electronic elements, the crimping unit is assembled on the carrier of the bearing unit by a detachable frame, the frame is assembled with a plurality of crimpers, and the plurality of crimpers are oppositely positioned on the plurality of testers, so that the modular testing device is favorable for repairing and replacing, and is convenient for taking and placing a batch of a plurality of electronic elements when the testing unit slides out of the carrier, and the crimping unit is used for crimping the plurality of electronic elements to execute testing operation when the carrier is slid in, and further, the use efficiency is improved.
The second advantage of the present invention is to provide a modular testing apparatus, wherein the carrier plate of the testing unit is assembled with a plurality of testers, and when the carrier plate is moved out of the supporting unit, the conveyor can pick and place a plurality of electronic components in a batch, so as to reduce the actuation sequence of picking and placing materials and further improve the production efficiency.
The present invention provides a modular testing device, wherein the crimping unit uses the quick release device to assemble the frame on the carrier of the bearing unit, when the number or the type of the applied crimping devices is changed, the quick release device is used to rapidly disassemble the frame, so as to facilitate the detachment of a plurality of crimping devices in a batch, reduce the replacement time, and further improve the production efficiency.
The present invention provides a modular testing device, wherein the plurality of crimping devices of the crimping unit are respectively locked on the frame, and the crimping devices can be independently replaced during repair without replacing the whole set of crimping units, thereby effectively saving the cost.
The invention has the fifth advantage of providing the modularized testing device, the slidable testing unit and the quick-detachable crimping unit are assembled on the bearing unit, the whole miniaturization is realized, the testing operation can be conveniently executed in a place with limited space, the labor is saved, and the use efficiency and the convenience are further improved.
The present invention provides a modular testing device, wherein a driving source is arranged between a first moving part and a second moving part of a crimping device of a crimping unit to drive the first moving part and the second moving part to move reversely along an operation axis, an operation part is assembled at the bottom of the first moving part and used for crimping an electronic element, an actuating tool driven by the second moving part to move is arranged on the crimping device, the actuating tool is assembled with at least one limiting part, and the actuating tool and the second moving part can be positioned after the limiting part is limited by bearing, so as to prevent the first moving part and the operation part from retracting and moving along the operation axis, so that the operation part can be indeed crimped on the electronic element to execute preset operation, and further improve the operation quality.
The present invention provides a modular testing device, wherein the first adjustment member and the second adjustment member of the crimping unit are provided with a first floating connection portion and a second floating connection portion which are mutually matched, the second adjustment member is connected with the actuating tool or the second moving member by the connecting member, the actuating tool or the second moving member is used for driving the second adjustment member to make a floating displacement (such as an X direction, a Y direction or a horizontal angle theta) so as to release the clamping, the first moving member can drive the operating member to make the floating displacement, and the position of the operating member is further finely adjusted, so that the operating member precisely crimps the electronic element, and further the use efficiency is improved.
The invention has the eighth advantage of providing the test equipment applying the modular test device, which comprises a feeding device, a receiving device, a multi-layer frame body, the modular test device, a conveying device and a central control device, wherein the feeding device is connected with the receiving device; the feeding device is arranged on the machine table and is provided with at least one feeding bearing device for accommodating the electronic element to be operated; the receiving device is arranged on the machine table and is provided with at least one receiving and bearing device for accommodating the operated electronic element; the multi-layer frame is arranged on the machine table and is provided with a plurality of layers, and each layer is provided with at least one mounting space; the plurality of modularized testing devices are arranged in the plurality of layers of erection spaces of the multi-layer frame body, and each modularized testing device is used for testing a batch of electronic elements; the conveying device is arranged on the machine table and is provided with at least one first conveyor for conveying the electronic elements; the central control device is used for controlling and integrating the actions of all the devices so as to execute automatic operation and achieve the practical benefit of improving the operation efficiency.
Drawings
FIG. 1 is a schematic diagram of a prior art testing apparatus.
FIG. 2 is a front view of the modular test apparatus of the present invention.
FIG. 3 is a side view of a modular test apparatus of the present invention.
FIG. 4 is a schematic diagram of the crimper and tester of the present invention.
Figure 5 is a side view of the crimper of the present invention.
FIG. 6 is a schematic diagram (one) of the use of the modular test apparatus of the present invention.
FIG. 7 is a schematic diagram of the use of the modular test apparatus of the present invention (II).
FIG. 8 is a schematic representation (III) of the use of the modular test apparatus of the present invention.
FIG. 9 is a schematic diagram (IV) of the use of the modular test apparatus of the present invention.
Fig. 10 is a configuration diagram of the modular test apparatus of the present invention applied to a test device.
Description of reference numerals: [ Prior Art ] A machine table 11; a supply device 12; a material receiving device 13; test devices 14A, 14B, 14C, 14D, 14E, 14F; a tester 141A; a circuit board 142A; a frame 143A; a crimper 144A; a conveyor 15; the present invention a test apparatus 20; a carrier 21; a bottom plate 211; side plates 212; a test zone 213; a carrier plate 22; a support member 221; a housing hole 222; a circuit board 231; a test socket 232; a probe 2321; a bearing surface 2322; a first positioning member 2323; a catch member 2324; a slide rail set 24; a motor 251; a pulley set 252; a frame 26; a fastener 261; a first movable member 271; a first surface 2711; an accommodating space 2712; the mounting face 2713; an nesting block 2714; a guide hole 2715; air chamber 2716; airway 2717; an extension 2718; a relief portion 2719; a second movable member 272; a second surface 2721; a connecting face 2722; a crimping piece 273; a press-down portion 2731; a stop surface 2732; a second positioning member 2733; an actuator 274; a first member 2741; a second member 2742; a third member 2743; a stopper 275; a first adjuster 276; the first floating portion 2761; a receiving groove 2762; a bottom plate 2763; a first through hole 2764; a second adjuster 277; the second floating portion 2771; a second through hole 2772; a connector 278; a first elastic member 279; a cover plate 280; the second elastic member 281; posts 282; a catch block 283; an operating axis L; a work table 30; a machine table 40; a refueling zone 41; a feeding device 50; a supply receiver 51; a material receiving device 60; a material receiving and holding device 61; a frame body 70; the mounting space 71; a conveying device 80; a first conveyor 81; a second conveyor 82; a third conveyor 83; a fourth conveyor 84.
Detailed Description
To further understand the present invention, a preferred embodiment is shown in the drawings, and the following detailed description is given:
referring to fig. 2 to 5, the modular testing apparatus 20 of the present invention includes a supporting unit, a testing unit, a pressing unit, and a driving unit for automatically driving the testing unit to move into/out of the supporting unit according to the operation requirement.
The bearing unit is provided with at least one carrier 21, the carrier 21 can be a panel, a frame or a box body, the type of the carrier can be a flat plate type or ㄩ type, the carrier 21 only needs to bear the test unit, the compression unit and the driving unit, and the invention is not limited by the embodiment; in the present embodiment, the carrier 21 includes a bottom plate 211 and two side plates 212, the two side plates 212 are fixed on the bottom plate 21 in the Z direction, and a testing area 213 is formed between the bottom plate 211 and the two side plates 212.
The test unit comprises a bearing plate 22 and a plurality of testers, the bearing plate 22 can be moved in/out of the carrier 21 of the bearing unit, the plurality of testers are assembled on the bearing plate 22 for testing the electronic element, when the test unit is repaired and replaced, the bearing plate 22 can be taken out, and a plurality of testers in a batch can be replaced at one time, so that the operation convenience is improved; furthermore, a slide rail set is disposed between the support plate 22 and the carrier 21, the support plate 22 can be manually or automatically moved, for example, a handle is disposed on the support plate 22, and the handle can be manually moved to pull the support plate 22; for example, the carrier plate 22 is coupled to a driver that drives the carrier plate 22 to displace automatically.
In the embodiment, the carrier plate 22 is located in the testing area 213 of the carrier 21 and is provided with a plurality of supporting members 221, the supporting members 221 may be integrally formed with the carrier plate 22 or may be separate elements, in the embodiment, the carrier plate 22 is provided with a plurality of accommodating holes 222, and each accommodating hole 222 is assembled with one supporting member 221 which is a block. The plurality of supporting members 221 of the carrier plate 22 are used for assembling a plurality of testers, each tester comprises an electrically connected circuit board 231 and a testing seat 232 with a probe 2321, the testing seat 232 is used for bearing and testing electronic elements, the bolts are locked on the supporting members 221 of the carrier plate 22, and the supporting members 221 are used for assisting in supporting the testing seat 232 to prevent deformation under pressure. The top surface of the test seat 232 is used as a bearing surface 2322, and a first positioning member 2323 is provided as a positioning hole. A plurality of slide rail sets 24 arranged in the X direction are arranged between the carrier plate 22 and the carrier 21, each slide rail set 24 is provided with a slide rail on the bottom surface of the carrier plate 22, and a plurality of slide seats capable of sliding the slide rail are arranged on the bottom plate 211 of the carrier 21, and the carrier plate 22 is stably displaced on the carrier 21 by the slide rail sets 24.
The driving unit is configured with at least one driver between the carrier plate 22 and the carrier 21, the driver may be a pressure cylinder or include a motor and at least one transmission set, but is not limited to the embodiment; in the present embodiment, the driver includes a motor 251 and a transmission set as a pulley set 252, the motor 251 is mounted on the side plate 212 of the carrier 21 and drives the pulley set 252 by a rotation shaft, and the pulley set 252 connects the driving carrier plate 22 and the plurality of testers to automatically move into/out of the testing area 213 of the carrier 21.
The compression unit is provided with at least one frame 26 and a plurality of compression devices, the frame 26 is assembled on the carrier 21 of the bearing unit, and the plurality of compression devices are assembled on the frame 26 for compressing and connecting the electronic elements of the tester; further, the frame 26 can be fixed or movably assembled to the carrier 21, for example, the frame 26 is assembled to the carrier 21 by a bolt or a quick release for disassembling the whole set of press-connection units; in this embodiment, a quick release device, which is a buckle 261, is disposed between the frame 26 and the carrier 21, the frame 26 is assembled to the carrier 21 by the buckle 261, and when the crimping unit is repaired and replaced, the buckle 261 can be opened, so as to quickly and quickly remove the frame 26 and a plurality of crimpers in a batch, thereby improving the operation convenience.
The crimping device comprises a first movable member 271, a second movable member 272, a driving source, a crimping member 273, an actuating member 274 and a limiting member 275, and further comprises an adjusting structure and a resetting structure according to operation requirements.
The first movable member 271 can be a cylinder body or a panel, and is displaced along the operation axis L, and an accommodating space 2712 is concavely provided on the first surface 2711 along the operation axis L, and one surface opposite to the first surface 2711 is used as an assembly surface 2713, in this embodiment, the first movable member 271 is a cylinder body, and an engaging block 2714 is provided on the side surface, and a guide hole 2715 is provided on the engaging block 2714.
The second movable element 272 and the first movable element 271 are disposed relatively along the operation axis L, the second movable element 272 can move reversely along the operation axis L, further, the second movable element 272 can be a panel, a piston or a diaphragm, in this embodiment, the second movable element 272 is a piston and can be movably mounted in the accommodating space 2712 of the first movable element 271, a gas chamber 2716 is formed between a second surface 2721 of the second movable element 272 and an inner bottom surface of the accommodating space 2712, and in addition, one surface of the second movable element 272, which is opposite to the second surface 2721, serves as a connecting surface 2722.
The driving source is used for driving the first movable element 271 and the second movable element 272 to move in opposite directions, and further, the driving source may be an air bag, a piezoelectric element, or an air chamber and an air duct, as long as the driving source can drive the first movable element 271 and the second movable element 272 to move in opposite directions, which is not limited to this embodiment. For example, the driving source is an air bag, and the driving source can be directly assembled and connected to the first surface 2711 of the first movable element 271 and the second surface 2721 of the second movable element 272, so that when the air bag is inflated and expanded, the first movable element 271 and the second movable element 272 are driven to move in opposite directions, and the accommodating space 2712 and the air chamber 2716 of the first movable element 271 can be omitted. For example, the driving source includes an air chamber disposed between an inner bottom surface of the accommodating space 2712 of the first movable member 271 and the second surface 2721 of the second movable member 272, and an air passage disposed in the first movable member 271 or the second movable member 272, where the air passage inputs air into the air chamber to drive the first movable member 271 and the second movable member 272 to move in opposite directions. In this embodiment, the driving source includes an air chamber 2716 and an air channel 2717, the air chamber 2716 is located between the inner bottom surface of the accommodating space 2712 of the first movable member 271 and the second surface 2721 of the second movable member 272, the air channel 2717 is located on the first movable member 271, one end of the air chamber 2716 is connected to the other end of the first movable member 271, and the other end of the air chamber 2716 is connected to an air supply device (not shown) and an air pressure detector, so as to input air into the air chamber 2716.
The compression joint part 273 is assembled on the first moving part 271 for compressing the electronic element, furthermore, the compression joint part 273 is assembled with at least one temperature controller which can be a heating element or a refrigerating chip so as to enable the electronic element to be positioned in a test environment simulating the temperature of an application place in the future; in this embodiment, the pressing member 273 is mounted on the mounting surface 2713 of the first movable member 271, and at least one pressing portion 2731 is provided to perform a pressing operation on the electronic device. The pressure-contact member 273 has a stopper surface 2732 and a second positioning member 2733 on the periphery of the pressing portion 2731, the stopper surface 2732 is higher than the pressing portion 2731, and the second positioning member 2733 serving as a positioning pin is protruded at a position corresponding to the first positioning member 2323.
Furthermore, the pressing device can mount another circuit board (not shown) and another plurality of probes (not shown) electrically connected to the pressing portion 2731 of the pressing member 273 according to the operation requirement, so as to test the electronic component with double-sided contacts.
Actuating means 274 is mounted on second movable element 272 for driving second movable element 272 in a reverse displacement along working axis L; furthermore, the actuator 274 includes at least a first member 2741 mounted on the second movable member 272 in a locking or straddling manner, so that the second movable member 272 can drive the first member 2741 to move synchronously; in the embodiment, the actuator 274 includes a first member 2741, a second member 2742, and a third member 2743, and further, the first member 2741, the second member 2742, and the third member 2743 may be integrally formed or separate members; in this embodiment, the first member 2741, the second member 2742, and the third member 2743 of the actuator 274 are independent members, the first member 2741 is a panel and is horizontally disposed and locked on the connection surface 2722 of the second movable member 272, the second member 2742 is a guide rod disposed in the Z-axis direction, one end of the guide rod is assembled to the first member 2741, the other end of the guide rod penetrates through the guide hole 2715 of the first movable member 271 so that the first movable member 271 can stably move in the Z-direction along the second member 2742, and the third member 2743 is a frame disposed in the X-direction and is assembled to the other end of the second member 2742, so that the second movable member 272 can drive the first member 2741, the second member 2742, and the third member 2743 to synchronously move in the opposite directions.
The limiting member 275 is disposed on the actuating member 274 to position the second movable member 272 when the limiting member 275 is stopped, so as to prevent the first movable member 271 and the pressing member 273 from moving back and forth; furthermore, the position-limiting member 275 and the actuator 274 may be integrally formed or may be separate components, and the position-limiting member 275 may be disposed on the actuator 274 in the Y-direction or the Z-direction; for example, the position-limiting member 275 can be a panel and extends in the Y direction from the third member 2743 of the actuator 274; for example, the position-limiting element 275 can be an L-shaped element and can be disposed on the first member 2741 or the third member 2743 of the actuating element 274 in the Z-direction, and when the position-limiting element 275 is disposed on the first member 2741, the third member 2743 can be omitted from the actuating element 274.
The adjusting structure includes a first adjusting member 276, a second adjusting member 277, a connecting member 278, a first elastic member 279, and a cover 280. The first adjustment member 276 is provided with a first floating portion 2761, the second adjustment member 277 is provided with a second floating portion 2771, the second floating portion 2771 and the first floating portion 2761 are mutually matched, further, the first floating portion 2761 and the first adjustment member 276 can be integrally formed or respectively independent elements, for example, the first adjustment member 276 can be integrally formed with a first floating portion 2761 which is an arc bump; for example, first adjuster 276 may be fitted with a panel having first float 2761 as a bead; similarly, the second floating portion 2771 and the second adjustment member 277 may be integrally formed or separate elements; in addition, the second floating portion 2771 and the first floating portion 2761 may be in an arc shape or a V shape that are engaged with each other, so long as the shape of the second adjusting member 277 is not floating, the first adjusting member 276 and the second adjusting member 277 are engaged with each other. The connecting member 278 connects the second adjusting member 277 and the actuating member 274 or the second moving member 272, and the actuating member 274 or the second moving member 272 drives the second adjusting member 277 to perform a floating displacement (such as an X direction, a Y direction, or a horizontal angle Θ) to release the latch, so that the first moving member 271 can drive the crimping member 273 to perform the floating displacement, and further the swinging position or the swinging angle of the crimping member 273 is finely adjusted, so that the crimping member 273 is precisely crimped onto the electronic component.
In the embodiment, the first adjusting member 276 is a panel and is locked and assembled to the frame 26, so that the whole crimping device can be conveniently taken out when the first adjusting member 276 is disassembled; the first adjusting member 276 and the first member 2741 of the actuator 274 have a proper distance therebetween, the first adjusting member 276 is provided with a receiving groove 2762 at a position corresponding to the second movable member 272, a bottom plate 2763 of the receiving groove 2762 is provided with a first through hole 2764 for passing the second adjusting member 277, and the first adjusting member 276 is provided with a plurality of first floating portions 2761 which are arc-shaped protrusions on the bottom plate 2763. The second adjusting member 277 is a panel and is located in the receiving groove 2762 of the first adjusting member 276, and has a suitable moving distance with the receiving groove 2762, the second adjusting member 277 is provided with a second floating portion 2771 in an arc groove at a position corresponding to the first floating portion 2761 of the first adjusting member 276, and in an inactive state, the second adjusting member 277 makes the second floating portion 2771 fit and clamped to the first floating portion 2761 of the first adjusting member 276 by its own weight or the weight of the first member 2741 or the second movable member 272. The connecting member 278 is a bolt and is locked to the second adjusting member 277 and the first member 2741, so that the first member 2741 drives the second floating portion 2771 of the second adjusting member 277 to separate from the first floating portion 2761 or to float along the first floating portion 2761 to release the locking, so that the second movable member 272 drives the first movable member 271 and the pressing member 273 to float (e.g., in the X-Y direction or at the horizontal angle Θ), thereby finely adjusting the swinging position or the swinging angle of the pressing member 273.
The reset structure is provided with a first elastic element 279 between the first adjusting element 276 and the actuating element 274 or the second movable element 272 to drive the actuating element 274 to reset; in this embodiment, the second adjusting member 277 has a second through hole 2772 for passing through the first elastic member 279, one end of the first elastic member 279 abuts against the first member 2741 of the actuating member 274, and the other end abuts against a cover plate 280 locked to the first adjusting member 276, so as to drive the actuating member 274 to reset.
The reset structure further comprises at least one second elastic element 281 disposed between the actuator 274 and the first movable element 271 for driving the first movable element 271 to reset; in this embodiment, an extending portion 2718 is disposed between two opposite nesting pieces 2714 of the first moving member 271 in the return structure, the extending portion 2718 is disposed with a recessed yielding portion 2719, the return structure is disposed with a pillar 282 at a position corresponding to the yielding portion 2719 of the third member 2743 of the actuator 274, the pillar 282 is sleeved with a second elastic member 281 and a blocking block 283, one surface of the blocking block 283 abuts against the extending portion 2718 of the first moving member 271 to support the first moving member 271, and the other surface of the blocking block 283 abuts against the second elastic member 281.
In the test sequence, after the limit piece 275 of the crimping mechanism is limited by the bearing, the second movable piece 272 and the first movable piece 271 can be limited, and the design of the stop limit piece 275 can be designed according to the operation requirement, and at least one stop part is arranged on the test base 232, the support plate 22 or the frame 26 and at a position corresponding to the limit piece 275; for example, when the position-limiting member 275 is disposed in the Y direction, a stopping member, which is a blocking piece, may be disposed at a position of the testing seat 232 or the supporting plate 22 corresponding to the position-limiting member 275; for example, when the position-limiting member 275 is disposed in the Z direction, a stopping member as a stopping groove may be disposed at a position of the frame 26 corresponding to the position-limiting member 275. In this embodiment, the testing base 232 is provided with a blocking component 2324 extending in the Y direction and being a blocking piece at a position opposite to the limiting component 275, the blocking component 2324 and the testing base 232 may be integrally formed or may be separate elements, and the actuator 274 may have a suitable distance between the limiting component 275 and the blocking component 2324 in an unactuated state.
Referring to fig. 4, 6 and 7, the modular testing apparatus 20 of the present invention is light and easy to carry, and can be conveniently placed on a carrier (such as a laboratory table or a small work table), and the carrier 21 of the modular testing apparatus 20 can also be positioned on the carrier by a positioning element (such as a bolt or a positioning pin); in the present embodiment, the modular testing apparatus 20 is locked to the table of the small work table 30. During testing, the driving unit drives the carrier plate 22 of the testing unit to move out of the testing area 213 of the carrier 21 in the X direction by the motor 251 through the pulley set 252, and since the limiting member 275 of the crimper is not attached to the blocking member 2324 of the testing seat 232, the carrier plate 22 can carry a plurality of testing seats 232 of a batch to move out of the testing area 213 synchronously and is located outside the carrier 21, so that a conveyor (not shown) can move a plurality of electronic components to be tested of a batch into the testing seats 232; then, the motor 251 drives the carrier plate 22 via the pulley set 252 to carry a batch of test sockets 232 with electronic devices to be tested into the test area 213.
Referring to fig. 8 and 9, since the test seat 232 is opposite to the compression joint device and the stopper 2324 is located above the limit piece 275 of the compression joint device, during compression, the air channel 2717 of the compression joint device inputs air into the air chamber 2716 of the first movable piece 271, the air in the air chamber 2716 pushes the first movable piece 271 and the second movable piece 272 to move reversely along the operation axis L, the first movable piece 271 drives the compression joint device 273 to move downward in the Z direction synchronously, and if the second positioning part 2733 of the compression joint device 273 and the first positioning part 2323 of the test seat 232 have a slight difference, the second positioning part 2733 of the compression joint device 273 abuts against the stopper surface 2322 of the test seat 232; because the gas in the air chamber 2716 cannot push the crimping piece 273 to continuously move downwards, in the state that the gas is continuously input into the air chamber 2716, the gas can push the second movable piece 272 to reversely move upwards along the operation axis L in the Z direction, the second movable piece 272 pushes the actuator 274 and the second adjusting piece 277 to float upwards in the Z direction, and the second movable piece 272 drives the first movable piece 271 and the crimping piece 273 to move in the Y direction by using the second floating part 2771 of the second adjusting piece 277 to float and move in the Y direction along the first floating part 2761 of the first adjusting piece 276, so as to finely adjust the position of the crimping piece 273, and the second positioning part 2733 of the crimping piece 273 aligns to the first positioning part 2323 of the test seat 232.
However, when the actuator 274 moves upward in the Z direction, the third member 2743 drives the limiting member 275 to move synchronously, so that the limiting member 275 abuts against the stopper 2324 of the test seat 232 to limit the actuator 274, since the actuator 274 is connected to the second movable member 272 and also synchronously limits the second movable member 272, when the air chamber 2716 maintains a predetermined pressure, the gas in the air chamber 2716 pushes the first movable member 271 to drive the pressing member 273 to move downward in the Z direction along the working axis L, so that the second positioning member 2733 of the pressing member 273 is inserted into the first positioning member 2323 of the test seat 232, and the first movable member 271 receives the downward pushing force of the gas in the air chamber 2716, thereby effectively preventing the first movable member 271 and the pressing member 273 from moving reversely along the working axis L, not only enabling the pressing portion 2731 of the pressing member 273 to smoothly press the electronic component, but also enabling the pressing member 273 to press the electronic component reliably with the predetermined pressing force, thereby improving the testing quality.
Referring to fig. 2 to 5 and 10, the modular testing apparatus 20 of the present invention is applied to a testing device, which includes a machine 40, a feeding device 50, a receiving device 60, a multi-layer frame 70, the modular testing apparatus 20 of the present invention, a conveying device 80 and a central control device (not shown); the feeding device 50 is disposed on the machine 40 and has at least one feeding holder 51 for accommodating the electronic component to be operated; the material receiving device 60 is disposed on the machine 40 and has at least one receiving device 61 for receiving the operated electronic components; the multi-layer frame 70 is disposed on the machine table 40 and has a plurality of layers, each layer having at least one mounting space 71; in the present embodiment, the plurality of modular testing devices 20 are disposed in the plurality of layers of mounting spaces 71 of the multi-layer frame 70, and each modular testing device 20 is used for testing a batch of electronic components, in which the mounting spaces 71 of each layer of the frame 70 are used for assembling the carriers 21 of the modular testing devices 20, so that the carriers 21 can be rapidly assembled on the frame 70 to carry the whole set of testing units, crimping units and driving units, thereby facilitating repair and replacement; the conveying device 80 is disposed on the machine 40 and has at least one first conveyor for conveying the electronic components; furthermore, the first conveyor may be a material mover or a disk carrier, the conveying device 80 is additionally provided with at least one second conveyor according to the operation requirement, the second conveyor may be a carrying platform, the second conveyor may be configured on the machine platform 40, or may be shifted to the front of each layer of the rack space 71 of the rack 70 in the Z direction synchronously with a third conveyor, and the second conveyor may be configured on the machine platform 40 and may be fixed at a fixed point, or may be shifted in at least one direction on the machine platform 40; furthermore, the second conveyor can be provided with a plurality of bearing grooves for accommodating the electronic elements to be tested and the tested electronic elements, and the first conveyor is a material moving device for moving and carrying the electronic elements; the second conveyor can carry a feeding carrier 51 and a receiving carrier 61 for rapidly supplying the feeding carrier 51 with the electronic components to be tested on the whole tray, and the receiving carrier 61 is used for receiving the tested electronic components on the whole tray, while the first conveyor is a tray moving device for moving the feeding carrier 51. In the present embodiment, the conveying device 80 includes a first conveyor 81, a second conveyor 82, a third conveyor 83 and a fourth conveyor 84, the first conveyor 81 is a tray moving device to move the feeding carrier 51 of the feeding device 50 with a tray of electronic components to be tested to the second conveyor 82, the second conveyor 82 is provided with an empty receiving carrier 61, the carrier 22 of the testing unit is driven by the driving unit of the modular testing device 20 to move the plurality of testing seats 232 from the testing area 213 to the material changing area 41, the second conveyor 82 and the third conveyor 83 synchronously move in the Z direction to one side of the carrier 22, the plurality of suction nozzles of the third conveyor 83 can perform distance-changing positions to take out a plurality of tested electronic components from the plurality of testing seats 232 at a time and to the receiving carrier 61 of the second conveyor 82 for storage, the third conveyor 83 takes out a plurality of electronic components to be tested from the feeding carrier 51 of the second conveyor 82, and is moved to the plurality of test seats 232 of the carrier plate 22, the driving unit of the testing apparatus 20 drives the carrier plate 22 to carry a plurality of test seats 232 with electronic devices to be tested, and moves from the material changing area 41 to the test area 213 to execute the test operation; the fourth conveyor 84 is a tray moving device for moving the material receiving container 61 of the second conveyor 82 to the material receiving device 60 for receiving according to the test result; the central control device is used for controlling and integrating the actions of all the devices so as to execute automatic operation and achieve the practical benefit of improving the operation efficiency.

Claims (10)

1. A modular testing apparatus, comprising:
a bearing unit: a carrier is arranged;
a test unit: comprises a carrier plate and a plurality of testers, wherein the carrier plate can move into/out of the carrier of the bearing unit, and the testers are assembled on the carrier plate and used for bearing and testing the plurality of electronic elements;
a pressure welding unit: comprises a frame and a plurality of crimpers, wherein the frame is assembled on the carrier of the bearing unit, and the plurality of crimpers are assembled on the frame for crimping the plurality of electronic elements of the plurality of testers.
2. The modular testing device of claim 1, further comprising a driving unit having at least one driver for driving the testing unit to move.
3. The modular testing device as recited in claim 1, wherein at least one set of slide rails is disposed between the carrier plate of the testing unit and the carrier of the supporting unit.
4. The modular testing apparatus of claim 1, wherein the carrier plate of the testing unit is provided with a plurality of supporting members for supporting the plurality of testers.
5. The modular testing apparatus of claim 1, wherein the press-fit unit is provided with at least one quick release between the carrier and the frame.
6. The modular testing device of any of claims 1-5, wherein the crimper of the crimping unit comprises:
a first movable member;
a second movable member: is arranged opposite to the first movable piece along the operation axis;
an operating part: the first movable piece is assembled for being connected with the electronic element in a pressing mode;
a drive source: for driving the first movable member and the second movable member to move reversely;
an actuating device: the second movable piece is assembled to drive the second movable piece to move reversely along the operation axis;
a limiting part: the limiting part is arranged on the actuating tool and can limit the reverse displacement of the operating part along the operating axis when the limiting part is limited in bearing.
7. The modular testing apparatus of claim 6, wherein the crimper further comprises an adjustment structure for fine-tuning the working member, the adjustment structure comprising a first adjustment member and a second adjustment member, the first adjustment member being assembled with the frame and having a first floating portion, the second adjustment member being configured to drive the actuator to move, and having a second floating portion, the second floating portion being engaged with the first floating portion.
8. The modular testing apparatus of claim 6, wherein the crimper further comprises at least one detent member, the detent member can be disposed on the tester, the carrier plate or the frame for detent the position limiting member.
9. The modular testing apparatus of claim 6, wherein the crimper further comprises a restoring structure, the restoring structure is provided with a cover plate on the first adjusting member, and a first elastic member is disposed between the cover plate and the actuating member or the second movable member.
10. A test apparatus using a modular test device, comprising:
a machine platform;
a feeding device: at least one feeding and bearing device arranged on the machine platform and used for accommodating the electronic element to be operated;
the material receiving device comprises: at least one material receiving and placing device arranged on the machine platform and used for accommodating the operated electronic elements;
a frame body: is arranged on the machine table and is provided with a plurality of layers of erection spaces;
a plurality of modular test apparatus as recited in claim 1: the plurality of layers of the erection spaces are assembled on the frame body;
a conveying device: at least one first conveyor arranged on the machine table for conveying the electronic elements;
the central control device: for controlling and integrating the operation of each device.
CN202011061617.6A 2020-09-30 2020-09-30 Modularized testing device and testing equipment applied by same Pending CN114325208A (en)

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CN202011061617.6A CN114325208A (en) 2020-09-30 2020-09-30 Modularized testing device and testing equipment applied by same

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Application Number Priority Date Filing Date Title
CN202011061617.6A CN114325208A (en) 2020-09-30 2020-09-30 Modularized testing device and testing equipment applied by same

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Publication Number Publication Date
CN114325208A true CN114325208A (en) 2022-04-12

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Country Link
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1916641A (en) * 2005-08-17 2007-02-21 京元电子股份有限公司 Test system for electric components
TW200941002A (en) * 2008-03-28 2009-10-01 King Yuan Electronics Co Ltd A socket, test device and test method for testing electronic element packages with leads
TW201331591A (en) * 2012-01-19 2013-08-01 Prov Technology Corp Crimping device for electronic component inspection apparatus
WO2013129873A1 (en) * 2012-02-29 2013-09-06 (주)제이티 Apparatus for testing elements
TW201339588A (en) * 2012-03-23 2013-10-01 Hon Tech Inc Floating device and application testing equipment thereof
US20180024188A1 (en) * 2016-07-25 2018-01-25 Astronics Test Systems Inc. High volume system level testing of devices with pop structures
CN110879304A (en) * 2018-09-06 2020-03-13 致茂电子股份有限公司 Sliding electronic component testing device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1916641A (en) * 2005-08-17 2007-02-21 京元电子股份有限公司 Test system for electric components
TW200941002A (en) * 2008-03-28 2009-10-01 King Yuan Electronics Co Ltd A socket, test device and test method for testing electronic element packages with leads
TW201331591A (en) * 2012-01-19 2013-08-01 Prov Technology Corp Crimping device for electronic component inspection apparatus
WO2013129873A1 (en) * 2012-02-29 2013-09-06 (주)제이티 Apparatus for testing elements
TW201339588A (en) * 2012-03-23 2013-10-01 Hon Tech Inc Floating device and application testing equipment thereof
US20180024188A1 (en) * 2016-07-25 2018-01-25 Astronics Test Systems Inc. High volume system level testing of devices with pop structures
CN110879304A (en) * 2018-09-06 2020-03-13 致茂电子股份有限公司 Sliding electronic component testing device

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