CN114325043B - System and method for improving small current test precision - Google Patents

System and method for improving small current test precision Download PDF

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Publication number
CN114325043B
CN114325043B CN202111542752.7A CN202111542752A CN114325043B CN 114325043 B CN114325043 B CN 114325043B CN 202111542752 A CN202111542752 A CN 202111542752A CN 114325043 B CN114325043 B CN 114325043B
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current
module
input end
voltage
acquisition
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CN114325043A (en
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秦胜
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China Express Jiangsu Technology Co Ltd
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China Express Jiangsu Technology Co Ltd
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Abstract

The invention discloses a system and a test method for improving small current test precision, wherein an input end of a current sensor in the system is connected with an anode of a power supply line of a tested unit, and an output end of the current sensor is connected with an input end of an acquisition module; the input end of the voltage sensor is connected with the positive pole and the negative pole of the power supply line of the unit to be tested, and the output end of the voltage sensor is connected with the input end of the acquisition module; the output end of the acquisition module is connected with the input end of the constant current source module, the output end of the constant current source module is connected with the input end of the shunt module, and the output end of the shunt module is connected with the input end of the current sensor; the input end of the acquisition module, the input end of the constant current source module and the input end of the shunt module are all connected with an upper computer. According to the invention, the current sensor does not need to be replaced, the precision of the current sensor is improved by adding the constant current source, so that the test precision of small current is improved, and the time cost and the equipment cost are effectively saved.

Description

System and method for improving small current test precision
Technical Field
The invention relates to the technical field of electric power measurement, in particular to a system and a test method for improving small current test precision.
Background
The current sensor is a detecting device, which can sense the information of the detected current and convert the information sensed by detection into an electric signal meeting certain standard or other information output in a required form according to certain rules so as to meet the requirements of information transmission, processing, storage, display, recording, control and the like. The current sensor is widely applied in power systems, such as frequency converters, DCDC converters, motor controllers, switching power supplies, uninterruptible power supplies, process control, battery management systems, and applications in various fields of traditional industry, automation and the like. The method is applied to different fields, the requirements of the whole machine and the system on the current sensor are different, for example, products are required to have high precision, some products are required to have quick response time, and other products are required to have strong anti-interference capability. Therefore, different current sensors have great differences in measurement range, accuracy, response time, anti-interference capability, and the like.
The existing current sensor is difficult to consider the test precision of small current on the premise of ensuring a large measurement range, so that when the current sensor is used for testing a plurality of tested devices, the sensors with different precision are often required to be replaced according to different states of different tested devices for testing, the test efficiency is low, and the time cost and the equipment cost are increased.
Disclosure of Invention
The technical problem to be solved by the embodiment of the invention is to provide a system and a test method for improving the small current test precision without replacing a current sensor, and the precision of the current sensor is improved by additionally adding a constant current source, so that the small current test precision is improved, and the time cost and the equipment cost are effectively saved.
In order to achieve the above purpose, the embodiment of the invention provides a system for improving small current testing precision, which comprises a current sensor, a voltage sensor, an acquisition module, a constant current source module, a shunt module and an upper computer;
the input end of the current sensor is connected with the positive electrode of the power supply line of the unit to be tested, and the output end of the current sensor is connected with the input end of the acquisition module; the input end of the voltage sensor is connected with the positive pole and the negative pole of the power supply line of the unit to be tested, and the output end of the voltage sensor is connected with the input end of the acquisition module;
the output end of the acquisition module is connected with the input end of the constant current source module, the output end of the constant current source module is connected with the input end of the shunt module, and the output end of the shunt module is connected with the input end of the current sensor; the acquisition module comprises a plurality of acquisition channels, the constant current source module is used for providing external current for the acquisition channels, and the shunt module is used for shunting the external current according to the parameter information of the acquisition channels so that the acquisition channels can distribute the required external current;
the input end of the acquisition module, the input end of the constant current source module and the input end of the shunt module are all connected with the upper computer, the upper computer is used for controlling the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested, and the upper computer is also used for calculating the actual current value of the unit to be tested according to the feedback result of the acquisition channel and the additional current value allocated to the acquisition channel.
As an improvement of the scheme, the acquisition channel comprises a current acquisition channel and a voltage acquisition channel, wherein the input end of the current acquisition channel is connected with the output end of the current sensor, and the input end of the voltage acquisition channel is connected with the output end of the voltage sensor.
As an improvement of the above scheme, the collection module configures corresponding current parameter information for the current collection channel according to the current value after receiving the current value collected by the current sensor, and configures corresponding voltage parameter information for the voltage collection channel according to the voltage value after receiving the voltage value collected by the voltage sensor.
As an improvement of the scheme, the system further comprises a communication module, wherein the input end of the communication module is connected with the communication interface of the unit to be tested, and the output end of the communication module is connected with the upper computer; the communication module is used for receiving the communication signal of the unit to be tested and sending the communication signal to the upper computer, and the upper computer controls the shunt module to adjust the external current value distributed to the acquisition channel according to the communication signal.
The embodiment of the invention also provides a test method for improving the small current test precision, which is applied to the system for improving the small current test precision, and comprises the following steps:
connecting the positive pole of the power supply line of the unit to be tested with the input end of the current sensor, and connecting the positive pole and the negative pole of the power supply line of the unit to be tested with the input end of the voltage sensor;
the upper computer calls the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested;
after receiving the current value acquired by the current sensor, the acquisition module configures corresponding current parameter information for a current acquisition channel in the acquisition module according to the current value, and after receiving the voltage value acquired by the voltage sensor, the acquisition module configures corresponding voltage parameter information for a voltage acquisition channel in the acquisition module according to the voltage value;
the current distribution module distributes the external current provided by the constant current source module according to the current parameter information so that the current acquisition channel can distribute the required external current;
and the upper computer calculates the actual current value of the unit to be measured according to the feedback result of the current acquisition channel and the additional current value allocated to the current acquisition channel.
Further, the upper computer is further configured to control the shunt module to adjust an external current value allocated to the acquisition channel according to the communication signal received by the communication module and the communication signal of the unit under test.
Compared with the prior art, the system and the method for improving the small current testing precision provided by the embodiment of the invention have the beneficial effects that: receiving a current value acquired by a current sensor and a voltage value acquired by a voltage sensor through an acquisition module, configuring corresponding current parameter information for a current acquisition channel in the acquisition module according to the current value, and configuring corresponding voltage parameter information for the voltage acquisition channel in the acquisition module according to the voltage value; the current collecting channel is used for collecting the current of the constant current source module, and the current collecting channel is used for collecting the current of the constant current source module; and the upper computer calculates the actual current value of the tested unit according to the feedback result of the current acquisition channel and the additional current value allocated to the current acquisition channel. According to the embodiment of the invention, the current sensor does not need to be replaced, the precision of the current sensor is improved by additionally adding the constant current source, so that the test precision of small current is improved, and the time cost and the equipment cost are effectively saved.
Drawings
FIG. 1 is a schematic diagram of a preferred embodiment of a system for improving low current test accuracy provided by the present invention;
FIG. 2 is a schematic diagram of another preferred embodiment of a system for improving the accuracy of low current testing provided by the present invention;
fig. 3 is a flow chart of a preferred embodiment of a test method for improving the accuracy of low-current testing according to the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1, fig. 1 is a schematic structural diagram of a system for improving the accuracy of low current testing according to a preferred embodiment of the present invention. The system for improving the small current testing precision comprises a current sensor, a voltage sensor, an acquisition module, a constant current source module, a shunt module and an upper computer;
the input end of the current sensor is connected with the positive electrode of the power supply line of the unit to be tested, and the output end of the current sensor is connected with the input end of the acquisition module; the input end of the voltage sensor is connected with the positive pole and the negative pole of the power supply line of the unit to be tested, and the output end of the voltage sensor is connected with the input end of the acquisition module;
the output end of the acquisition module is connected with the input end of the constant current source module, the output end of the constant current source module is connected with the input end of the shunt module, and the output end of the shunt module is connected with the input end of the current sensor; the acquisition module comprises a plurality of acquisition channels, the constant current source module is used for providing external current for the acquisition channels, and the shunt module is used for shunting the external current according to the parameter information of the acquisition channels so that the acquisition channels can distribute the required external current;
the input end of the acquisition module, the input end of the constant current source module and the input end of the shunt module are all connected with the upper computer, the upper computer is used for controlling the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested, and the upper computer is also used for calculating the actual current value of the unit to be tested according to the feedback result of the acquisition channel and the additional current value allocated to the acquisition channel.
Specifically, the system for improving the small current testing precision provided by the embodiment comprises a current sensor, a voltage sensor, an acquisition module, a constant current source module, a shunt module and an upper computer. The input end of the current sensor is connected with the positive electrode of the power supply line of the unit to be tested and is used for collecting the current value of the unit to be tested; the output end of the current sensor is connected with the input end of the acquisition module and is used for sending the acquired current value to the acquisition module. The input end of the voltage sensor is connected with the positive pole and the negative pole of the power supply line of the unit to be tested and is used for collecting the voltage value of the unit to be tested; the output end of the voltage sensor is connected with the input end of the acquisition module and is used for sending the acquired voltage value to the acquisition module. The embodiment collects the voltage and the current simultaneously, is favorable for enabling the electrical characteristic curve of the tested unit to be clearer, and improves the contrast. The output end of the acquisition module is connected with the input end of the constant current source module, the output end of the constant current source module is connected with the input end of the shunt module, and the output end of the shunt module is connected with the input end of the current sensor. The acquisition module comprises a plurality of acquisition channels, each acquisition channel is configured with corresponding parameter information according to a received current value or voltage value, the constant current source module is used for providing external current for the acquisition channel, and the shunt module is used for shunting the external current according to the parameter information of the acquisition channel so that the acquisition channel can distribute the required external current. The input end of the acquisition module, the input end of the constant current source module and the input end of the shunt module are all connected with an upper computer, the upper computer is used for controlling the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested, and the upper computer is also used for subtracting the additional current value allocated to the acquisition channel from the feedback result of the acquisition channel to obtain the actual current value of the unit to be tested.
When the current sensor with different testing precision is tested on different tested units, the precision of the current sensor is improved by additionally adding the constant current source, so that the testing precision of small current is improved, and the time cost and the equipment cost are effectively saved.
In another preferred embodiment, the collection channel comprises a current collection channel and a voltage collection channel, wherein the input end of the current collection channel is connected with the output end of the current sensor, and the input end of the voltage collection channel is connected with the output end of the voltage sensor.
In another preferred embodiment, after the collection module receives the current value collected by the current sensor, corresponding current parameter information is configured for the current collection channel according to the current value, and after the collection module receives the voltage value collected by the voltage sensor, corresponding voltage parameter information is configured for the voltage collection channel according to the voltage value.
Specifically, the collection channel comprises a current collection channel and a voltage collection channel, the input end of the current collection channel is connected with the output end of the current sensor, and the input end of the voltage collection channel is connected with the output end of the voltage sensor. After the acquisition module receives the current value acquired by the current sensor, corresponding current parameter information is configured for the current acquisition channel according to the current value, and after the acquisition module receives the voltage value acquired by the voltage sensor, corresponding voltage parameter information is configured for the voltage acquisition channel according to the voltage value.
In a further preferred embodiment, the system further comprises a communication module, wherein the input end of the communication module is connected with the communication interface of the unit under test, and the output end of the communication module is connected with the upper computer; the communication module is used for receiving the communication signal of the unit to be tested and sending the communication signal to the upper computer, and the upper computer controls the shunt module to adjust the external current value distributed to the acquisition channel according to the communication signal.
Specifically, referring to fig. 2, fig. 2 is a schematic structural diagram of another preferred embodiment of a system for improving the accuracy of low current testing according to the present invention. The system also comprises a communication module, wherein the input end of the communication module is connected with a communication interface of the unit to be tested, and the output end of the communication module is connected with the upper computer. The communication module is used for receiving the communication signal of the unit to be tested and sending the communication signal to the upper computer, and the upper computer controls the shunt module to adjust the external current value distributed to the acquisition channel according to the communication signal.
Correspondingly, the invention also provides a test method for improving the small current test precision, which is applied to the system for improving the small current test precision.
Referring to fig. 3, fig. 3 is a flow chart of a preferred embodiment of a testing method for improving the accuracy of small current testing according to the present invention. The test method for improving the small current test precision comprises the following steps:
s1, connecting a positive electrode of a power supply line of the unit to be tested with an input end of the current sensor, and connecting a positive electrode and a negative electrode of the power supply line of the unit to be tested with an input end of the voltage sensor;
s2, the upper computer calls the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested;
s3, after the acquisition module receives the current value acquired by the current sensor, configuring corresponding current parameter information for a current acquisition channel in the acquisition module according to the current value, and after the acquisition module receives the voltage value acquired by the voltage sensor, configuring corresponding voltage parameter information for a voltage acquisition channel in the acquisition module according to the voltage value;
s4, the shunt module shunts the external current provided by the constant current source module according to the current parameter information so that the current acquisition channel can distribute the required external current;
and S5, the upper computer calculates an actual current value of the unit to be tested according to a feedback result of the current acquisition channel and an additional current value allocated to the current acquisition channel.
Specifically, when the system for improving the small current testing precision provided by any one of the embodiments is used for testing a unit to be tested, the positive electrode of the power supply line of the unit to be tested is connected with the input end of the current sensor, and the positive electrode and the negative electrode of the power supply line of the unit to be tested are connected with the input end of the voltage sensor. The upper computer calls the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested. After the acquisition module receives the current value acquired by the current sensor, corresponding current parameter information is configured for the current acquisition channel in the acquisition module according to the current value, and after the acquisition module receives the voltage value acquired by the voltage sensor, corresponding voltage parameter information is configured for the voltage acquisition channel in the acquisition module according to the voltage value. The current collecting channel is used for collecting the external current supplied by the constant current source module, and the current collecting channel is used for collecting the external current supplied by the constant current source module. The upper computer subtracts the additional current value allocated to the current collection channel from the feedback result of the current collection channel to obtain the actual current value of the tested unit.
It should be noted that, when the upper computer calls the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested, if the current range of the unit to be tested is not large under different working states, the current working range of the unit to be tested can be known according to product parameters and experience, and then the current sensor with proper precision can be directly matched, at this time, the constant current source module and the shunt module do not need to be called, and only the acquisition module needs to be called. If the current of the measured unit is known, the upper computer controls the shunt module to shunt the external current provided by the constant current source module according to the current parameter information of each current acquisition channel, so that the current acquisition channels can distribute the required external current.
Preferably, the upper computer is further configured to control the shunt module to adjust an external current value allocated to the acquisition channel according to the communication signal received by the communication module according to the communication signal of the unit under test.
Specifically, if the current of the tested unit is unknown, the upper computer calls the communication module, and controls the shunt module to adjust the external current value distributed to the current acquisition channel according to the communication signal, so as to realize automatic adjustment of the test precision of the current sensor according to the tested unit, further improve the test precision of small current, and effectively save time cost and equipment cost.
The embodiment of the invention provides a system and a test method for improving small current test precision, wherein a current value acquired by a current sensor and a voltage value acquired by a voltage sensor are received through an acquisition module, corresponding current parameter information is configured for a current acquisition channel in the acquisition module according to the current value, and corresponding voltage parameter information is configured for a voltage acquisition channel in the acquisition module according to the voltage value; the current collecting channel is used for collecting the current of the constant current source module, and the current collecting channel is used for collecting the current of the constant current source module; and the upper computer calculates the actual current value of the tested unit according to the feedback result of the current acquisition channel and the additional current value allocated to the current acquisition channel. According to the embodiment of the invention, the current sensor does not need to be replaced, the precision of the current sensor is improved by additionally adding the constant current source, so that the test precision of small current is improved, and the time cost and the equipment cost are effectively saved.
It should be noted that the system embodiments described above are merely illustrative, and that the units described as separate units may or may not be physically separate, and that units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. In addition, in the system embodiment of the present invention, the connection relationship between the modules represents that there is a communication connection between them, and may be specifically implemented as one or more communication buses or signal lines. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
While the foregoing is directed to the preferred embodiments of the present invention, it will be appreciated by those skilled in the art that changes and modifications may be made without departing from the principles of the invention, such changes and modifications are also intended to be within the scope of the invention.

Claims (6)

1. The system for improving the small current testing precision is characterized by comprising a current sensor, a voltage sensor, an acquisition module, a constant current source module, a shunt module and an upper computer;
the input end of the current sensor is connected with the positive electrode of the power supply line of the unit to be tested, and the output end of the current sensor is connected with the input end of the acquisition module; the input end of the voltage sensor is connected with the positive pole and the negative pole of the power supply line of the unit to be tested, and the output end of the voltage sensor is connected with the input end of the acquisition module;
the output end of the acquisition module is connected with the input end of the constant current source module, the output end of the constant current source module is connected with the input end of the shunt module, and the output end of the shunt module is connected with the input end of the current sensor;
the input end of the acquisition module, the input end of the constant current source module and the input end of the shunt module are all connected with the upper computer.
2. The system for improving small current testing accuracy according to claim 1, wherein the collection module comprises a current collection channel and a voltage collection channel, wherein an input end of the current collection channel is connected with an output end of the current sensor, and an input end of the voltage collection channel is connected with an output end of the voltage sensor.
3. The system for improving small current testing precision according to claim 2, wherein the collection module configures corresponding current parameter information for the current collection channel according to the current value after receiving the current value collected by the current sensor, and configures corresponding voltage parameter information for the voltage collection channel according to the voltage value after receiving the voltage value collected by the voltage sensor.
4. A system for improving small current testing accuracy according to any one of claims 1-3, further comprising a communication module, wherein the input end of the communication module is connected with the communication interface of the tested unit, and the output end of the communication module is connected with the upper computer; the communication module is used for receiving the communication signal of the unit to be tested and sending the communication signal to the upper computer, and the upper computer controls the shunt module to adjust the external current value distributed to the acquisition module according to the communication signal.
5. A test method for improving the small current test precision, which is applied to the system for improving the small current test precision according to any one of claims 1 to 4, and is characterized by comprising the following steps:
connecting the positive pole of the power supply line of the unit to be tested with the input end of the current sensor, and connecting the positive pole and the negative pole of the power supply line of the unit to be tested with the input end of the voltage sensor;
the upper computer calls the acquisition module, the constant current source module and the shunt module according to the state information of the unit to be tested;
after receiving the current value acquired by the current sensor, the acquisition module configures corresponding current parameter information for a current acquisition channel in the acquisition module according to the current value, and after receiving the voltage value acquired by the voltage sensor, the acquisition module configures corresponding voltage parameter information for a voltage acquisition channel in the acquisition module according to the voltage value;
the current distribution module distributes the external current provided by the constant current source module according to the current parameter information so that the current acquisition channel can distribute the required external current;
and the upper computer calculates the actual current value of the unit to be measured according to the feedback result of the current acquisition channel and the additional current value allocated to the current acquisition channel.
6. The method for improving small current testing accuracy according to claim 5, wherein the upper computer is further configured to control the shunt module to adjust the value of the applied current distributed to the collection module according to the communication signal of the unit under test received by the communication module.
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