CN114296124A - Scintillator afterglow test system, method and device and electronic equipment - Google Patents
Scintillator afterglow test system, method and device and electronic equipment Download PDFInfo
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Abstract
The application relates to a scintillator afterglow test system, a method, a device and electronic equipment, wherein the system comprises: the device comprises a rack, a detection device and a control device, wherein the rack is rotatably arranged, and a detection channel is formed in the middle of the rack; the X-ray detector and the scintillator detector are fixed on the rack and symmetrically arranged along the rotating shaft of the rack, and the scintillator detector is used for detecting an X-ray signal emitted by the X-ray source; the X-ray shielding block is arranged in the detection channel; the frame can drive when rotatory the X ray source with the scintillator detector centers on X ray shielding block relative rotation makes X ray shielding block irradiates X ray the region to be measured of scintillator detector carries out periodic truncation control. Through the application, the testing cost is reduced, and the afterglow testing precision is improved.
Description
Technical Field
The application relates to the technical field of scintillator detectors, in particular to a scintillator afterglow test system, method and device and electronic equipment.
Background
The scintillator detector still has residual luminescence, which is called afterglow of the scintillator, within a period of time after the X-ray irradiation is stopped. The afterglow of the scintillator is the important performance of the scintillator, the existence of the afterglow can cause the trailing of a detector signal of the scintillator, influence the image quality, reduce the spatial resolution of the image, cause the image to be blurred and degraded and the like, and the measurement of the afterglow of the scintillator has important significance.
In practical application, the afterglow characteristic of the scintillator is often characterized by afterglow intensities at several typical times, which are simply classified as short time afterglow (t)1Time of day) and long afterglow (t)2Time of day). The difficulty of testing the short-time afterglow is that X-rays are required to be far below t1Time ofInternal complete truncation (t)Cutting block＜＜t1) The long-time afterglow test requires the afterglow test device to have extremely high sensitivity and measuring range and to be more than t2Occlusion time (t)Shade>t2). The existing afterglow test device methods comprise two types: one type realizes X-ray cutoff through a switch of an X-ray device, but the X-ray device needs 10 ms-order time from the beginning to the complete closing, and the method cannot measure 10 ms-order afterglow; the other type realizes the on-off of the afterglow detector irradiated by the rays by arranging a movable or rotary shielding block between the ray generator and the afterglow detector, however, the method needs to build a more complex system to drive the reciprocating or periodic motion of the shielding block, and the testing cost is increased. The CT system is provided with a high-speed rotating rack, an X-ray bulb tube and a large-range and high-sensitivity detector system, and meets various requirements of scintillator afterglow tests.
Disclosure of Invention
The embodiment of the application provides a scintillator afterglow testing system, method and device and electronic equipment, so as to at least solve the problems of low afterglow testing precision and high cost in the related art.
In a first aspect, an embodiment of the present application provides a scintillator afterglow testing system, including:
the device comprises a rack, a detection device and a control device, wherein the rack is rotatably arranged, and a detection channel is formed in the middle of the rack;
the X-ray detector and the scintillator detector are fixed on the rack and symmetrically arranged along the rotating shaft of the rack, and the scintillator detector is used for detecting an X-ray signal emitted by the X-ray source;
the X-ray shielding block is arranged in the detection channel; the frame can drive when rotatory the X ray source with the scintillator detector centers on X ray shielding block relative rotation makes X ray shielding block irradiates X ray the region to be measured of scintillator detector carries out periodic truncation control.
In some of these embodiments, the X-ray shielding block is fixed to the detection channel off-center with respect to the rotational axis of the gantry;
the width of the X-ray shielding block is larger than that of the scintillator detector along the axial direction of the machine frame.
In some embodiments, the apparatus further comprises an electronic device electrically connected to the gantry, the X-ray source, and the scintillator detector, for determining a corresponding afterglow intensity based on an X-ray signal detected by the scintillator detector in a truncated state.
In some of these embodiments, further comprising a scatter correction device, the scatter correction device comprising at least one of:
an anti-scatter grid disposed in front of the scintillator detector along a radiation direction of the X-rays;
x-ray shielding material disposed at each direction of the scintillator detector.
In a second aspect, the present application provides a scintillator afterglow testing method, which is applied to the scintillator afterglow testing system as described in the first aspect, and the method includes:
acquiring the truncation time of the X-ray shielding block for truncating the X-ray to irradiate the region to be detected of the scintillator detector when the rack rotates; the truncation time is the duration from complete non-shielding to complete shielding of the unit pixel point of the region to be detected;
determining adjustment information of the scintillator afterglow test system based on the truncation time; the adjustment information comprises position information of the X-ray shielding block and rotation parameters of the rack;
and adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system.
In some of these embodiments, the determining adjustment information for the scintillator afterglow test system based on the cutoff time comprises:
determining a corresponding truncation time calculation mode according to the position arrangement among the X-ray source, the scintillator detector and the X-ray shielding block;
and determining the position information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the truncation time calculation mode.
In some embodiments, the adjusting information further includes size information of an X-ray shielding block, and before adjusting the scintillator afterglow testing system based on the adjusting information and determining a real-time X-ray signal detected by a region to be tested of a scintillator detector when the gantry rotates based on the adjusted scintillator afterglow testing system, the method further includes:
acquiring the shielding time of the X-ray shielding block for shielding the X-ray from irradiating the region to be detected of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
and determining the position information and the size information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the shielding time.
In a third aspect, an embodiment of the present application provides a scintillator afterglow testing method, which is applied to the scintillator afterglow testing system according to the first aspect, where the method includes:
acquiring the shielding time of the X-ray shielding block for shielding the X-ray from irradiating the region to be detected of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system.
In some embodiments, after the adjusting the scintillator afterglow testing system based on the adjustment information and determining the real-time X-ray signal detected by the region to be tested of the scintillator detector during the rotation of the gantry based on the adjusted scintillator afterglow testing system, the method further includes:
and determining the real-time afterglow intensity corresponding to the region to be detected according to the real-time X-ray signals detected by the region to be detected of the scintillator detector.
In some of these embodiments, the method further comprises:
determining scattering correction data under different gantry rotation angles according to the scattering intensities of the X-ray shielding block and the scintillator detector at multiple groups of relative positions under the static state of the gantry;
and correcting the afterglow intensity of the gantry at different rotation angles according to the scattering correction data.
In a fourth aspect, an embodiment of the present application provides a scintillator afterglow testing apparatus, including:
the device comprises a truncation time acquisition unit, a detection unit and a control unit, wherein the truncation time acquisition unit is used for acquiring the truncation time of the X-ray shielding block for truncating the X-ray to irradiate the region to be detected of the scintillator detector when the rack rotates; the truncation time is the duration from complete non-shielding to complete shielding of the unit pixel point of the region to be detected;
a first adjustment information determination unit configured to determine adjustment information of the X-ray shielding block according to the truncation speed; the adjustment information includes position information;
and the first X-ray signal determining unit is used for determining real-time X-ray signals detected by the region to be detected of the scintillator detector when the rack rotates on the basis of the adjusted X-ray shielding block.
In a fifth aspect, an embodiment of the present application provides a scintillator afterglow testing apparatus, including:
the shielding time acquisition unit is used for acquiring shielding time of the X-ray shielding block shielding the X-ray from irradiating the to-be-detected region of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
the second adjustment information determining unit is used for determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and the second X-ray signal determining unit is used for adjusting the scintillator afterglow testing system based on the adjustment information and determining real-time X-ray signals detected by the region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow testing system.
In a sixth aspect, the present application provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to implement the scintillator afterglow testing method according to the second aspect or the third aspect.
Compared with the prior art, the scintillator afterglow test system, the scintillator afterglow test method, the scintillator afterglow test device and the electronic equipment are rotatably arranged through the rack, and the middle of the rack forms a detection channel; the X-ray source and the scintillator detector are fixed on the rack and symmetrically arranged along the rotating shaft of the rack, and the scintillator detector is used for detecting an X-ray signal emitted by the X-ray source; x ray shielding piece set up in the test passage, realized combining the X ray shielding piece of peripheral hardware on the basis of current X ray imaging equipment subassembly, driven when utilizing the frame rotation X ray source with the scintillator detector centers on X ray shielding piece rotates relatively, makes X ray shielding piece irradiates X ray the region to be tested of scintillator detector carries out periodic truncation control, accomplishes the test of scintillator afterglow to need not to build reciprocal or periodic motion that complicated test system drove the shielding piece, reduced test cost. The size of the X-ray shielding block, the position in the detection channel and the frame rotation parameters are changed to carry out truncation control, the truncation and/or shielding duration of X-ray irradiation of the detector pixel can be adjusted, the testing of the afterglow from sub-millisecond to second level is realized, and the afterglow testing precision is improved to meet different practical application requirements.
The details of one or more embodiments of the application are set forth in the accompanying drawings and the description below to provide a more thorough understanding of the application.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic diagram of a scintillator afterglow testing system according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of a scintillator afterglow testing method according to one embodiment of the present application;
FIG. 3 is a schematic flow chart illustrating the determination of adjustment information of an X-ray shielding block according to an embodiment of the present application;
4(a) -4(b) are schematic diagrams of different positional arrangements between the X-ray source, the scintillator detector and the X-ray shielding block (corresponding to different rotation states of the gantry) in one embodiment of the present application;
FIG. 5 is a schematic flow chart of a scintillator afterglow testing method in another embodiment of the present application;
FIG. 6 is a schematic flow chart of a scintillator afterglow testing method in another embodiment of the present application;
FIG. 7 is a block diagram of a scintillator afterglow testing apparatus according to an embodiment of the present application;
fig. 8 is a schematic structural diagram of an electronic device in one embodiment of the present application.
Description of the drawings: 11. a frame; 12. an X-ray source; 13. a scintillator detector, 14, an X-ray shielding block; 401. a truncation time acquisition unit; 402. a first adjustment information determination unit; 403. a first X-ray signal determination unit; 50. a bus; 51. a processor; 52. a memory; 53. a communication interface.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described and illustrated below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments provided in the present application without any inventive step are within the scope of protection of the present application.
It is obvious that the drawings in the following description are only examples or embodiments of the present application, and that it is also possible for a person skilled in the art to apply the present application to other similar contexts on the basis of these drawings without inventive effort. Moreover, it should be appreciated that in the development of any such actual implementation, as in any engineering or design project, numerous implementation-specific decisions must be made to achieve the developers' specific goals, such as compliance with system-related and business-related constraints, which may vary from one implementation to another.
Reference in the specification to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the specification. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of ordinary skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments without conflict.
Unless defined otherwise, technical or scientific terms referred to herein shall have the ordinary meaning as understood by those of ordinary skill in the art to which this application belongs. Reference to "a," "an," "the," and similar words throughout this application are not to be construed as limiting in number, and may refer to the singular or the plural. The present application is directed to the use of the terms "including," "comprising," "having," and any variations thereof, which are intended to cover non-exclusive inclusions; for example, a process, method, system, article, or apparatus that comprises a list of steps or modules (elements) is not limited to the listed steps or elements, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus. Reference to "connected," "coupled," and the like in this application is not intended to be limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The term "plurality" as referred to herein means two or more. "and/or" describes an association relationship of associated objects, meaning that three relationships may exist, for example, "A and/or B" may mean: a exists alone, A and B exist simultaneously, and B exists alone. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. Reference herein to the terms "first," "second," "third," and the like, are merely to distinguish similar objects and do not denote a particular ordering for the objects.
A scintillation detector is a common ionizing radiation detection device, and mainly comprises a scintillator and a photoelectric conversion device such as a photodiode and a photomultiplier tube. The afterglow of the scintillator is an important property of the scintillator detector, and has an important influence on the imaging quality. Afterglow of a scintillator detector is a phenomenon of luminescence decay due to defects or impurities inside the scintillator. There are many factors that affect scintillator afterglow: the scintillator afterglow is influenced by the manufacturing process of the scintillator, the time and dose of radiation absorption of the scintillator, the ambient temperature, etc., and the time constant thereof can be from several milliseconds to several tens hours.
The scintillator afterglow test system provided by the present application can be applied to a radiation scanning inspection system such as an X-ray imaging device, for example, a Computed Tomography (CT) scanner, a Digital Radiography (DR) scanner (e.g., a mobile digital radiography camera), a Digital Subtraction Angiography (DSA) scanner, a Dynamic Space Reconstruction (DSR) scanner, an X-ray microscope scanner, a multi-modality scanner, etc., and the present embodiment is not limited thereto.
As shown in fig. 1, the present embodiment provides a scintillator afterglow testing system, comprising: a gantry 11, an X-ray source 12, a scintillator detector 13 and an X-ray shielding block 14. Wherein,
the frame 11 may be used to support various components of the scintillator afterglow testing system. The housing 11 may be rotatably provided, and in particular, the housing 11 may include a fixed housing and a rotating housing connected to the fixed housing to rotate about a rotation axis, and a detection passage may be formed therebetween.
The X-ray source 12 and the scintillator detector 13 are fixed to the gantry 11 and symmetrically arranged along the rotational axis of the gantry 11. The X-ray source 12 may emit radioactive rays into the detection channel, and may be an X-ray tube, such as an X-ray tube with a rotating anode, or an X-ray tube with a carbon nanotube emitter.
The scintillator detector 13 is used for detecting the X-ray signal emitted by the X-ray source 12. Specifically, the X-ray source 12 and the scintillator detector 13 form a sector-shaped detection surface, and X-rays generated by the X-ray source 12 pass through the object to be detected, which is disposed between the X-rays and the scintillator detector 13 in the detection channel, to generate transmission projections on the scintillator detector 13 and are at least partially detected by the scintillator detector 13. In some embodiments, the scintillator detector 13 may be a single-pixel detector, a linear array scintillator detector, or a planar array scintillator detector, which is not limited herein.
An X-ray shielding block 14 is arranged in the detection channel between the X-ray source 12 and the scintillator detector 13. The X-ray shielding block 14 may be made of lead, tungsten, etc., and its size, thickness, shape and arrangement position may be adaptively configured according to the material, measurement sensitivity, etc., and the present application is not limited thereto.
When the frame 11 rotates, the frame 11 can drive the X-ray source 12 and the scintillator detector 13 to rotate around the X-ray shielding block 14, so that the X-ray shielding block 14 irradiates the region to be detected of the scintillator detector 13 with X-rays to perform periodic truncation control. The scintillator detector 13 emits scintillation light after absorbing radiation energy of the X-ray within the cutoff time, and the photoelectric conversion device converts a scintillation light signal into an electrical signal, so that a corresponding X-ray signal can be obtained. The region to be detected may be a central pixel point of the scintillator detector 13, or may be other pixel points; which may be a pixel point or a one-dimensional or two-dimensional pixel array on the scintillator detector 13.
In summary, the scintillator afterglow test system provided by the embodiment of the present application is rotatably disposed through a rack, and a detection channel is formed in the middle of the rack; the X-ray source and the scintillator detector are fixed on the rack and symmetrically arranged along the rotating shaft of the rack, and the scintillator detector is used for detecting an X-ray signal emitted by the X-ray source; x ray shielding piece set up in the test passage, realized combining the X ray shielding piece of peripheral hardware on the basis of current X ray imaging equipment subassembly, driven when utilizing the frame rotation X ray source with the scintillator detector centers on X ray shielding piece rotates relatively, makes X ray shielding piece irradiates X ray the region to be tested of scintillator detector carries out periodic truncation control, accomplishes the test of scintillator afterglow to need not to build reciprocal or periodic motion that complicated test system drove the shielding piece, reduced test cost. The size of the X-ray shielding block, the position in the detection channel and the frame rotation parameters are changed to carry out truncation control, the truncation and/or shielding duration of X-ray irradiation of the detector pixel can be adjusted, the testing of the afterglow from sub-millisecond to second level is realized, and the afterglow testing precision is improved to meet different practical application requirements.
The embodiments of the present application are described and illustrated below by means of preferred embodiments.
On the basis of the above embodiments, in some of the embodiments, the X-ray shielding block 14 may be disposed at the axial center of the rotation shaft of the gantry 11, or may be disposed eccentrically. When the X-ray shielding block 14 is disposed on the axis of the rotating shaft of the frame 11, the X-ray shielding block 14 periodically appears between the X-ray tube and the scintillator detector 13, and the region to be detected may be any pixel point or pixel array on the scintillator detector 13. In a preferred embodiment, the X-ray shielding block 14 is fixed eccentrically to the detection channel with respect to the rotational axis of the gantry 11. When the X-ray shielding block 14 is disposed on the axis of the rotating shaft of the frame 11, since the pixel points of the scintillator detector 13 are distributed in a fan shape, most of the pixel points are not collinear with the X-ray source 12 and the axis of the rotating shaft, except for the middle pixel point, other pixel points near two sides of the scintillator detector 13 still periodically have the state conversion of being shielded/irradiated. Correspondingly, the region to be measured may be a pixel point or a pixel array located at an edge position on the scintillator detector 13 at this time, as long as the state conversion of the periodic shielding/irradiation can be realized.
In some embodiments, the scintillator afterglow testing system further comprises a scanning bed disposed in the detection channel, and the X-ray shielding block 14 is detachably disposed on the scanning bed and can be moved with the scanning bed to perform position adjustment.
In the present embodiment, in order to ensure a good shielding effect, the thickness of the X-ray shielding block 14 is preferably 4 to 5mm along the radiation direction of the X-ray. The width of the X-ray shielding block 14 at least needs to block the scintillator detector 13 along the axial direction of the gantry 11, i.e. the width of the X-ray shielding block 14 is larger than the width of the scintillator detector 13. The length of the X-ray shielding block 14 along the tangential direction of the rotation direction of the gantry 11 can be adaptively configured according to the truncation time and/or the shielding time, and the rotation speed of the gantry 11, the arrangement position of the X-ray shielding block 14 in the detection channel, and the like are specifically considered.
On the basis of the foregoing embodiments, in some of the embodiments, the scintillator afterglow testing system further includes an electronic device, which is electrically connected to the gantry 11, the X-ray source 12 and the scintillator detector 13, and configured to determine a corresponding afterglow intensity based on an X-ray signal detected by the scintillator detector 13 in a truncated state.
In this embodiment, the electronic device performs processing calculation based on the X-ray signal detected by the scintillator detector 13 in the cutoff state, and obtains the afterglow intensity. In some embodiments, the afterglow intensity can be characterized by the ratio of the X-ray signal intensities of the region under test before and after the X-ray irradiation scintillator detector 13 is turned off. The periodic on-off control of the X-ray can be realized by utilizing the rotation of the frame 11, the afterglow intensity can be obtained by utilizing the data processing of a plurality of test results, and the accuracy of the afterglow test is improved.
On the basis of the above-described embodiments, in some of them the X-rays emitted by the X-ray source 12 are attenuated to a different extent in the radiation direction while also being partly scattered with respect to the primary radiation direction, the scattered X-ray beam influencing the measurement result on reaching the scintillator detector 13 on the basis of its superposition with the X-ray beam arriving in the primary radiation direction. In order to eliminate the effect of scattered beams, the scintillator afterglow testing system further comprises a scatter correction device comprising at least one of: an anti-scatter grid placed in front of the scintillator detector 13 in the radiation direction of the X-rays; x-ray shielding material arranged in each direction of the scintillator detector 13.
In a specific embodiment, the scatter correction means is an anti-scatter grid placed in front of the scintillator detector 13 in the radiation direction of the X-rays. Wherein, the anti-scattering grating has a one-dimensional or two-dimensional grating-shaped structure. In the X-ray radiation direction, the anti-scatter-grid is disposed in front of the scintillator detector 13 and aligned with a region to be measured on the scintillator detector 13. The X-ray beam emitted by the X-ray source 12 is emitted in all directions and the scintillator detector 13 receives radiation from the X-ray source directly through the anti-scatter-grid and blocks scattered beams from other radiation directions.
In another specific embodiment, the scatter correction means comprise X-ray shielding material arranged in each direction of said scintillator detector 13 to reduce the influence of scattered beams on the measurement results. Wherein the X-ray shielding material may be lead, tungsten or other material having a high atomic number and absorbing a substantial amount of the X-ray beam. In some embodiments, after disposing the X-ray shielding material in each direction of the scintillator detector 13, the afterglow measurement result of the scintillator afterglow test system can be scatter corrected according to the scattering intensity measured under different measurement conditions.
In other embodiments, in order to improve the accuracy of the measurement result, the anti-scatter grid and the X-ray shielding material may be disposed at the same time, which is not limited herein.
The embodiment also provides a scintillator afterglow testing method which is applied to the scintillator afterglow testing system as described in the above embodiments. FIG. 2 is a flowchart of a scintillator afterglow testing method according to an embodiment of the present application, as shown in FIG. 2, the flowchart comprises the following steps:
step S201, obtaining the truncation time of the X-ray shielding block for truncating the X-ray to irradiate the region to be measured of the scintillator detector when the rack rotates.
In this embodiment, the truncation time is a duration from completely not being blocked to completely being blocked of the unit pixel point of the region to be detected. In the afterglow measuring process, in order to meet different measuring requirements, the truncation time of the X-ray shielding block for truncating the X-ray irradiation on the region to be measured of the scintillator detector needs to be controlled. Typically, the truncation time is less than 1 ms.
Step S202, determining the adjustment information of the scintillator afterglow test system based on the truncation time; the adjustment information includes position information of the X-ray shielding block and rotation parameters of the gantry.
In this embodiment, the truncation time may be determined by adjusting the rotational speed of the gantry 11, the radius of rotation, and the position parameters of the X-ray shielding block 14. In some embodiments, after the truncation time is determined, when a plurality of parameters such as the position of the X-ray shielding block and the gantry rotation speed cannot be uniquely determined according to the counting method, reasonable interval optimization can be performed on the values of the rotation parameters such as the position of the X-ray shielding block and the gantry rotation speed, for example, by changing different gantry rotation parameters, position information of different X-ray shielding blocks can be obtained; by changing the position information of the X-ray shielding block, various rotation parameters of the rack can be obtained.
And S203, adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system.
In this embodiment, after the adjustment information of the scintillator afterglow test system is determined according to the required cutoff time, the scintillator afterglow test system can meet the actual measurement requirement of the cutoff time by adjusting the position information of the X-ray shielding block in the scintillator afterglow test system and the rotation parameter of the gantry. And at the moment, determining the X-ray signal detected by the scintillator afterglow testing system as a real-time X-ray signal detected by the corresponding region to be detected under the truncation time.
In summary, the scintillator afterglow test method provided in the embodiment of the present application obtains the cutoff time for the X-ray shielding block to cut off the X-ray irradiation on the region to be tested of the scintillator detector when the frame rotates; determining adjustment information of the scintillator afterglow test system based on the truncation time; the adjustment information comprises position information of the X-ray shielding block and rotation parameters of the rack; and adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system. The scintillator afterglow test device has the advantages that the scintillator afterglow test is realized by combining the peripheral X-ray shielding blocks on the basis of the existing X-ray imaging equipment assembly, so that a complex test system is not required to be built to drive the reciprocating or periodic motion of the shielding blocks, the positions of the X-ray shielding blocks in the scintillator afterglow test system are adjusted according to the requirements of the truncation time, different requirements of the truncation time test can be met, and the test cost is reduced.
On the basis of the foregoing embodiments, in some of the embodiments, before the adjusting information further includes size information of an X-ray shielding block, and the adjusting the scintillator afterglow testing system based on the adjusting information and determining a real-time X-ray signal detected by a region to be tested of a scintillator detector when the gantry rotates based on the adjusted scintillator afterglow testing system, the method further includes:
step S203A, acquiring a shielding time when the X-ray shielding block shields the region to be measured of the scintillator detector from the X-ray when the gantry rotates.
In this embodiment, the shielding time is a duration from complete shielding to re-irradiation of the unit pixel points in the region to be detected. In the afterglow measurement process, in order to meet different measurement requirements, in addition to the need of controlling the cutoff time of the X-ray shielding block for cutting off the X-ray to irradiate the region to be measured of the scintillator detector, the shielding time of the X-ray shielding block for shielding the X-ray to irradiate the region to be measured of the scintillator detector is often controlled.
Step S203B, determining the position information and the size information of the X-ray shielding block and the rotation parameter of the gantry according to the truncation time and the occlusion time.
Specifically, referring to fig. 4(a) -4(b), the occlusion time can be determined by adjusting the rotation speed and the rotation radius of the gantry 11 and the position parameters of the X-ray shielding block 14. In some embodiments, after the occlusion time is determined, when a plurality of parameters such as the position, the size information, the gantry rotation speed, and the like of the X-ray shielding block cannot be uniquely determined according to the counting method, reasonable interval optimization can be performed on the position of the X-ray shielding block, the size of the X-ray shielding block, and each rotation parameter of the gantry. According to the shielding time, the rack rotation parameter and the position information of the X-ray shielding block, the size information of the X-ray shielding block can be obtained through calculation. It should be noted that the size information of the X-ray shielding block may be the length of the X-ray shielding block along the circumferential direction of the gantry (i.e., the length of the X-ray shielding block FE shown in fig. 4 (a)).
In this embodiment, after the position information of the X-ray shielding block and the rotation parameter of the gantry are determined according to the truncation time, the size information of the X-ray shielding block in the scintillator afterglow test system can be determined by the calculation formula, so that the scintillator afterglow test system can further meet the actual measurement requirement of the shielding time. At the moment, the X-ray signals detected by the scintillator afterglow testing system are determined to be real-time X-ray signals detected by the corresponding region to be tested under the test requirements of the truncation time and the shielding time.
On the basis of the above embodiments, in some of them, as shown in fig. 3, the determining the adjustment information of the scintillator afterglow testing system based on the truncation time includes:
step S2021, determining a corresponding truncation time calculation mode according to the position arrangement among the X-ray source, the scintillator detector and the X-ray shielding block.
In this embodiment, when the gantry rotates 180 degrees, the position relationship among the X-ray source, the scintillator detector and the X-ray shielding block changes, and the corresponding calculation manner of the cutoff time changes accordingly. Specifically, as shown in fig. 4(a), in some embodiments, the distance between the X-ray shielding block 14 and the scintillator detector 13 is smaller than the distance between the X-ray shielding block 14 and the X-ray source 12. As shown in fig. 4(b), in other embodiments, the distance between the X-ray shielding block 14 and the scintillator detector 13 is larger than the distance between the X-ray shielding block 14 and the X-ray source 12. Wherein, FE represents the X-ray shielding block 14 disposed in the detection channel, the circular ring is the frame 11, O is the axis of the rotation shaft of the frame 11, OS/OD is the rotation radius, the X-ray source 12 and the scintillator detector 13 are symmetrically disposed on the circular ring, and S/S ' and D/D ' represent the positions of the regions to be detected of the X-ray source 12 and the scintillator detector 13 at times t and t ', respectively. The gantry 11 rotates from time t to t ', D' P being the length of the scintillator detector 13 that is shielded by the X-ray shielding block 14.
The corresponding way of calculating the truncation time in fig. 4(a) is as follows:
the cutoff time calculation corresponding to fig. 4(b) is as follows:
wherein lpixelThe length of the region or pixel unit to be measured along the rotation direction, ω is the rotation angular velocity of the rack 11, r is the rotation radius OS or OD of the rack 11, and n is the ratio DE/SE of the lengths.
Exemplarily, taking fig. 4(a) as an example, the derivation process of the truncation time calculation manner is described:
frame rotation linear speed ω r ═ D 'D/(t' -t) (1)
The cutting speed v ═ D 'P/(t' -t) (2)
Apply a small angle geometric approximation: DP/DE ≈ S 'S/SE ═ D' D/SE
Available DP ≈ (DE/SE) ≈ D 'D ═ n ≈ D' D (3)
And D 'P ═ D' D-DP (4)
Substituting (1), (3) and (4) into (2)
The available v ≈ ω r (1-n).
The formula (I) can be obtained according to the relation between the speed and the time and the distance.
Note that the small angle approximation is strictly true only when E coincides with O (i.e., n is 1), and the error gradually increases when n is too large or too small (i.e., the position of the X-ray shielding block is too close to the X-ray source or the scintillator detector).
In other embodiments, when the X-ray shielding block is disposed at the axis of the rotating shaft of the gantry, two cases are included, in the first case, the E end of the X-ray shielding block is located at the rotating center O, and the F end is disposed eccentrically, in which case n ═ DE/SE ≠ 1, the afterglow measurement can be performed by using the F end as the truncation end according to formula (i) or (ii). In the second case, the X-ray shielding block passes through the center of rotation, where n is DE/SE ≠ 1 at both ends of the X-ray shielding block, the cut-off time calculation mode can be determined according to formula (i) or (ii), and the afterglow measurement can be performed with either end as the cut-off end.
Step S2022, determining the position information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the truncation time calculation mode.
In some embodiments, the truncation time t isCutting blockAnd different gantry rotation parameters (including the rotation speed omega and the rotation radius r of the gantry 11) are substituted into the truncation time calculation mode to obtain n, so that the length ratio DE/SE of the X-ray shield 14 when the X-ray shield is arranged in the scintillator afterglow test system is determined, and the position information of the X-ray shield block in the detection channel can be determined according to the length ratio DE/SE. In other embodiments, by substituting different position information (i.e., length ratio n-DE/SE) when the X-ray shield 14 is disposed in the scintillator afterglow test system into the above-mentioned cut-off time calculation manner, different optimized intervals of gantry rotation parameters (including the rotation speed ω and the rotation radius r of the gantry 11) can be determined.
As shown in fig. 5, this embodiment further provides a scintillator afterglow testing method, which is applied to the scintillator afterglow testing system according to the above embodiment. As shown in fig. 5, the process includes the following steps:
step S301, acquiring shielding time of an X-ray shielding block for shielding X-rays from irradiating a region to be detected of a scintillator detector when a rack rotates; the shielding time is the duration from the complete shielding to the re-irradiation of the unit pixel points in the region to be detected.
Step S302, determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and S303, adjusting the scintillator afterglow testing system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow testing system.
In this embodiment, the step S301 is the same as the step S203A in the above embodiment, and details of this application are not repeated herein.
In the present embodiment, the blocking time may be determined by adjusting the rotation speed of the gantry 11, the rotation radius, and the position parameters of the X-ray shielding block 14. In some embodiments, after the occlusion time is determined, when a plurality of rotation parameters such as the position, size information, and gantry rotation speed of the X-ray shielding block cannot be uniquely determined according to the counting method, reasonable interval optimization can be performed on the position of the X-ray shielding block, the size of the shielding block, and each rotation parameter of the gantry. For example, by changing different gantry rotation parameters (such as rotation speed and rotation radius) and size information of the X-ray shielding blocks, position information of different X-ray shielding blocks can be obtained; by changing the position information of the X-ray shielding block and the size information of the X-ray shielding block, different rotation parameters of the rack and the like can be obtained. Illustratively, the calculation is as follows:
wherein, tShadeFor the time of occlusion,/ShadeN is the position information of the X-ray shielding block (i.e., the length ratio DE/SE when the X-ray shield 14 is disposed in the scintillator afterglow test system), θ (l)ShadeN, r) is the rotation angle of the frame in the shielding time, which is the length l of the shielding blockShadePosition n and gantry rotation radius (the gantry rotation radius can be considered as determined when tested with a CT machine), ω is the gantry rotation speed, r is the gantry rotation radius.
In this embodiment, after the adjustment information of the scintillator afterglow test system is determined according to the required shielding time, the scintillator afterglow test system can meet the actual shielding time measurement requirement by adjusting the position information and the size information of the X-ray shielding block in the scintillator afterglow test system and the rotation parameter of the rack. And at the moment, determining the X-ray signal detected by the scintillator afterglow testing system as a real-time X-ray signal detected by the corresponding region to be detected under the shielding time.
On the basis of the foregoing embodiments, in some embodiments, after determining real-time X-ray signals detected by a region to be measured of a scintillator detector during rotation of a gantry based on an adjusted X-ray shielding block, the method further includes: and determining the real-time afterglow intensity corresponding to the region to be detected according to the real-time X-ray signals detected by the region to be detected of the scintillator detector.
In this embodiment, the real-time afterglow intensity can be obtained by performing processing calculation based on the real-time X-ray signal detected by the scintillator detector 13 in the cutoff state. In some embodiments, the afterglow intensity can be characterized by the ratio of the X-ray signal intensities of the region under test before and after the X-ray irradiation scintillator detector 13 is turned off. The periodic on-off control of the X-ray can be performed by using the rotation of the frame 11 to obtain the change curve of the afterglow intensity along with the time after the X-ray is turned off, and the afterglow intensity can be obtained by performing data processing on a plurality of test results to improve the accuracy of the afterglow test.
As shown in fig. 6, on the basis of the above embodiments, in some of the embodiments, the method further includes:
step S204, according to the scattering intensity of the X-ray shielding block and the scintillator detector at a plurality of groups of relative positions under the static state of the frame, scattering correction data under different frame rotation angles are determined.
And S205, correcting the afterglow intensity of the gantry at different rotation angles according to the scattering correction data.
In the scintillator afterglow test process, the gantry 11 rotates continuously, the positions of the X-ray source 12 and the scintillator detector 13 change continuously, and after a region to be measured of the scintillator detector 13 is shielded, a measured X-ray signal is not only residual luminescence of the scintillator detector 13, but also a part of the X-ray signal is scattered from X-rays, and further scattering correction is needed.
In this embodiment, in a static state of the gantry 11, the X-ray irradiation state of the scintillator detector 13 does not change, and at this time, when the region to be measured is blocked, all signals measured are from scattering, and afterglow is negligible. Since scatter is position dependent, the position of the scintillator detector 13 relative to the X-ray shielding block 14 when the gantry 11 is stationary can be changed to obtain scatter intensities of the X-ray shielding block 14 and the scintillator detector 13 at sets of relative positions.
Further, the relative positions of the X-ray shielding block 14 and the scintillator detector 13 cannot be exhausted, and the scattering intensities of the X-ray shielding block 14 and the scintillator detector 13 at all other relative positions can be obtained by using a data fitting manner such as a polynomial difference value, so as to obtain scattering correction data, so as to correct the afterglow intensities of the gantry 11 at different rotation angles according to the scattering correction data. The scattering correction is carried out through the steps and the afterglow test result, so that the stability and the reliability of the afterglow test are improved.
It should be noted that the steps illustrated in the above-described flow diagrams or in the flow diagrams of the figures may be performed in a computer system, such as a set of computer-executable instructions, and that, although a logical order is illustrated in the flow diagrams, in some cases, the steps illustrated or described may be performed in an order different than here.
The present embodiment further provides a scintillator afterglow testing apparatus, which is used for implementing the above embodiments and preferred embodiments, and the description of which has been given above is omitted. As used hereinafter, the terms "module," "unit," "subunit," and the like may implement a combination of software and/or hardware for a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated.
Fig. 7 is a block diagram of a structure of a scintillator afterglow testing apparatus according to an embodiment of the present application, as shown in fig. 7, the apparatus comprising: a truncation time acquisition unit 401, a first adjustment information determination unit 402, and a first X-ray signal determination unit 403.
A truncation time acquiring unit 401, configured to acquire a truncation time when the X-ray shielding block truncates the X-ray irradiation of the to-be-detected region of the scintillator detector when the gantry rotates; the truncation time is the duration from complete non-shielding to complete shielding of the unit pixel point of the region to be detected;
a first adjustment information determining unit 402 configured to determine adjustment information of the X-ray shielding block according to the truncation speed; the adjustment information includes position information;
a first X-ray signal determining unit 403, configured to determine, based on the adjusted X-ray shielding block, a real-time X-ray signal detected by the region to be measured of the scintillator detector when the gantry rotates.
In some of these embodiments, the scintillator afterglow testing apparatus further comprises: the device comprises a shielding time acquisition unit and a first adjustment information acquisition module.
The shielding time acquisition unit is used for acquiring shielding time of the X-ray shielding block shielding the X-ray from irradiating the to-be-detected region of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
and the first adjustment information acquisition module is used for determining the position information and the size information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the shielding time.
In some embodiments, the first adjustment information determining unit 402 includes: a truncation time calculation mode determining module and a second adjustment information determining module.
The cutoff time calculation mode determining module is used for determining a corresponding cutoff time calculation mode according to the position arrangement among the X-ray source, the scintillator detector and the X-ray shielding block;
and the second adjustment information determining module is used for determining the position information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the truncation time calculation mode.
In some of these embodiments, the scintillator afterglow testing apparatus further comprises: and an afterglow intensity determination unit.
And the afterglow intensity determining unit is used for determining the real-time afterglow intensity corresponding to the region to be detected according to the real-time X-ray signals detected by the region to be detected of the scintillator detector.
In some of these embodiments, the scintillator afterglow testing apparatus further comprises: a scatter correction data determining unit and a scatter correcting unit.
The scattering correction data determining unit is used for determining scattering correction data under different gantry rotation angles according to the scattering intensities of the X-ray shielding block and the scintillator detector at multiple groups of relative positions under the static state of the gantry;
and the scattering correction unit is used for correcting the afterglow intensity of the gantry at different rotation angles according to the scattering correction data.
The embodiment of the present application further provides a scintillator afterglow test device, including: an occlusion time acquisition unit, a second adjustment information determination unit, and a second X-ray signal determination unit.
The shielding time acquisition unit is used for acquiring shielding time of the X-ray shielding block shielding the X-ray from irradiating the to-be-detected region of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
the second adjustment information determining unit is used for determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and the second X-ray signal determining unit is used for adjusting the scintillator afterglow testing system based on the adjustment information and determining real-time X-ray signals detected by the region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow testing system.
The above modules may be functional modules or program modules, and may be implemented by software or hardware. For a module implemented by hardware, the modules may be located in the same processor; or the modules can be respectively positioned in different processors in any combination.
In addition, the scintillator afterglow testing method of the embodiment of the present application described in conjunction with fig. 2 can be implemented by electronic equipment. Fig. 8 is a schematic diagram of a hardware structure of an electronic device according to an embodiment of the present application.
The electronic device may comprise a processor 51 and a memory 52 in which computer program instructions are stored.
Specifically, the processor 51 may include a Central Processing Unit (CPU), or A Specific Integrated Circuit (ASIC), or may be configured to implement one or more Integrated circuits of the embodiments of the present Application.
The memory 52 may be used to store or cache various data files that need to be processed and/or used for communication, as well as possible computer program instructions executed by the processor 51.
The processor 51 may read and execute the computer program instructions stored in the memory 52 to implement any one of the above-described embodiments of the scintillator afterglow testing method.
In some of these embodiments, the electronic device may also include a communication interface 53 and a bus 50. As shown in fig. 8, the processor 51, the memory 52, and the communication interface 53 are connected via the bus 50 to complete mutual communication.
The communication interface 53 is used for implementing communication between modules, apparatuses, units and/or devices in the embodiments of the present application. The communication interface 53 may also enable communication with other components such as: the data communication is carried out among external equipment, image/data acquisition equipment, a database, external storage, an image/data processing workstation and the like.
The electronic device may execute the scintillator afterglow test method in the embodiment of the present application based on the obtained program instruction, thereby implementing the scintillator afterglow test method described with reference to fig. 2.
In addition, in combination with the scintillator afterglow testing method in the above embodiments, the embodiments of the present application may provide a computer readable storage medium to implement. The computer readable storage medium having stored thereon computer program instructions; the computer program instructions, when executed by a processor, implement any of the scintillator afterglow testing methods of the above embodiments.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (13)
1. A scintillator afterglow testing system, comprising:
the device comprises a rack, a detection device and a control device, wherein the rack is rotatably arranged, and a detection channel is formed in the middle of the rack;
the X-ray detector and the scintillator detector are fixed on the rack and symmetrically arranged along the rotating shaft of the rack, and the scintillator detector is used for detecting an X-ray signal emitted by the X-ray source;
the X-ray shielding block is arranged in the detection channel; the frame can drive when rotatory the X ray source with the scintillator detector centers on X ray shielding block relative rotation makes X ray shielding block irradiates X ray the region to be measured of scintillator detector carries out periodic truncation control.
2. Scintillator afterglow testing system according to claim 1,
the X-ray shielding block is eccentrically fixed to the detection channel relative to the rotating shaft of the rack;
the width of the X-ray shielding block is larger than that of the scintillator detector along the axial direction of the machine frame.
3. The scintillator afterglow testing system of claim 1 further comprising electronics electrically connected to the gantry, the X-ray source, and the scintillator detector for determining a corresponding afterglow intensity based on an X-ray signal detected by the scintillator detector in a truncated state.
4. The scintillator afterglow testing system of claim 1, further comprising a scatter correction device comprising at least one of:
an anti-scatter grid disposed in front of the scintillator detector along a radiation direction of the X-rays;
x-ray shielding material disposed at each direction of the scintillator detector.
5. A scintillator afterglow testing method applied to the scintillator afterglow testing system according to any one of claims 1 to 4, wherein the method comprises the following steps:
acquiring the truncation time of the X-ray shielding block for truncating the X-ray to irradiate the region to be detected of the scintillator detector when the rack rotates; the truncation time is the duration from complete non-shielding to complete shielding of the unit pixel point of the region to be detected;
determining adjustment information of the scintillator afterglow test system based on the truncation time; the adjustment information comprises position information of the X-ray shielding block and rotation parameters of the rack;
and adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system.
6. The scintillator afterglow test method of claim 5, wherein the determining the adjustment information of the scintillator afterglow test system based on the truncation time comprises:
determining a corresponding truncation time calculation mode according to the position arrangement among the X-ray source, the scintillator detector and the X-ray shielding block;
and determining the position information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the truncation time calculation mode.
7. The scintillator afterglow testing method according to claim 5, wherein the adjustment information further includes information on the size of an X-ray shielding block, and before adjusting the scintillator afterglow testing system based on the adjustment information and determining a real-time X-ray signal detected by a region to be tested of a scintillator detector when the gantry rotates based on the adjusted scintillator afterglow testing system, the method further comprises:
acquiring the shielding time of the X-ray shielding block for shielding the X-ray from irradiating the region to be detected of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
and determining the position information and the size information of the X-ray shielding block and the rotation parameter of the rack according to the truncation time and the shielding time.
8. A scintillator afterglow testing method applied to the scintillator afterglow testing system according to any one of claims 1 to 4, wherein the method comprises the following steps:
acquiring the shielding time of the X-ray shielding block for shielding the X-ray from irradiating the region to be detected of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and adjusting the scintillator afterglow test system based on the adjustment information, and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow test system.
9. The scintillator afterglow testing method of any of claims 5-8, wherein after adjusting the scintillator afterglow testing system based on the adjustment information and determining a real-time X-ray signal detected by a region under test of a scintillator detector while the gantry is rotating based on the adjusted scintillator afterglow testing system, the method further comprises:
and determining the real-time afterglow intensity corresponding to the region to be detected according to the real-time X-ray signals detected by the region to be detected of the scintillator detector.
10. The scintillator afterglow test method of any of claims 5 to 8, further comprising:
determining scattering correction data under different gantry rotation angles according to the scattering intensities of the X-ray shielding block and the scintillator detector at multiple groups of relative positions under the static state of the gantry;
and correcting the afterglow intensity of the gantry at different rotation angles according to the scattering correction data.
11. A scintillator afterglow testing device, comprising:
the device comprises a truncation time acquisition unit, a detection unit and a control unit, wherein the truncation time acquisition unit is used for acquiring the truncation time of the X-ray shielding block for truncating the X-ray to irradiate the region to be detected of the scintillator detector when the rack rotates; the truncation time is the duration from complete non-shielding to complete shielding of the unit pixel point of the region to be detected;
a first adjustment information determination unit for determining adjustment information of the scintillator afterglow test system based on the truncation time; the adjustment information comprises position information of the X-ray shielding block and rotation parameters of the rack;
and the first X-ray signal determining unit is used for adjusting the scintillator afterglow testing system based on the adjustment information and determining real-time X-ray signals detected by a region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow testing system.
12. A scintillator afterglow testing device, comprising:
the shielding time acquisition unit is used for acquiring shielding time of the X-ray shielding block shielding the X-ray from irradiating the to-be-detected region of the scintillator detector when the rack rotates; the shielding time is the duration from the complete shielding of the unit pixel point of the region to be detected to the re-irradiation;
the second adjustment information determining unit is used for determining the adjustment information of the scintillator afterglow test system according to the shielding time; the adjustment information comprises size information and position information of the X-ray shielding block and rotation parameters of the rack;
and the second X-ray signal determining unit is used for adjusting the scintillator afterglow testing system based on the adjustment information and determining real-time X-ray signals detected by the region to be detected of the scintillator detector when the rack rotates based on the adjusted scintillator afterglow testing system.
13. An electronic device comprising a memory and a processor, characterized in that the memory has stored therein a computer program, the processor being arranged to run the computer program to perform the scintillator afterglow testing method of any of the claims 5-10.
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| CN117870846A (en) * | 2023-02-22 | 2024-04-12 | 张引 | Correlation type blade arrival detection device and detection method for blade tip timing system |
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