CN114253781A

CN114253781A - Test method, device, equipment and storage medium

Info

Publication number: CN114253781A
Application number: CN202111507505.3A
Authority: CN
Inventors: 李信德; 郑倩冰; 袁三燕; 赵宏阳; 吴彤; 韦昌政; 刘勇鹏
Original assignee: Phytium Technology Co Ltd
Current assignee: Phytium Technology Co Ltd
Priority date: 2021-12-10
Filing date: 2021-12-10
Publication date: 2022-03-29
Anticipated expiration: 2041-12-10
Also published as: CN114253781B

Abstract

The invention provides a test method, a test device, test equipment and a storage medium, and relates to the technical field of tests. The test method comprises the following steps: the method comprises the steps that a first device sends a test instruction to a target second device, and the target second device is connected with a target device to be tested; the test instruction is used for controlling the target second equipment to modify parameters of the target pin so as to transmit a test signal to the target equipment to be tested through the target pin for testing; and the first equipment receives a test result fed back by the target equipment to be tested through the connected pin through the target second equipment. The first device sends a test instruction to the target second device, the target second device transmits a test signal to the target device to be tested through the target pin, the target device to be tested can be tested, the target device to be tested can also feed back a test result to the target second device through the pin, and the first device can obtain the test result from the second device. The manual participation is not needed, the testing efficiency is improved, and the human resources are saved.

Description

Test method, device, equipment and storage medium

Technical Field

The invention relates to the technical field of testing, in particular to a testing method, a testing device, testing equipment and a storage medium.

Background

With the development of scientific technology, various electronic devices are increasing, and the devices are generally tested before being used formally. The testing of the device may include checking the performance, reliability, compatibility, stability, and the like of the device, for example.

In the related art, each computer device is generally connected to a device to be tested, and the device to be tested is tested by manually operating the computer device by a tester. In this implementation, since the testing process needs to depend on the manual operation of the testing personnel, the technical problem of low testing efficiency is easily caused.

Disclosure of Invention

The present invention aims to provide a testing method, a testing device, a testing apparatus and a storage medium, so as to solve the technical problem that the related art needs to depend on manual operation of a tester, which is likely to cause low testing efficiency.

In order to achieve the above purpose, the embodiment of the present invention adopts the following technical solutions:

in a first aspect, an embodiment of the present invention provides a test method, which is applied to a first device in a test system, where the test system further includes: the first device is connected with each second device in a communication mode, and each second device comprises at least one group of pins used for connecting devices to be tested; the method comprises the following steps:

the first device sends a test instruction to a target second device, wherein the target second device is one of the at least one second device, and the target second device is connected with a target device to be tested; the test instruction is used for controlling the target second equipment to modify parameters of a target pin so as to transmit a test signal to target equipment to be tested through the target pin for testing;

and the first equipment receives a test result fed back by the target equipment to be tested through the connected pin through the target second equipment.

In the embodiment of the application, the first device sends the test instruction to the target second device, and the target second device can modify the parameters of the target pin based on the test instruction and transmit the test signal to the target device to be tested through the target pin, so that the target device to be tested can be tested to obtain the test result. In the implementation mode, manual participation is not needed, and the testing efficiency is improved.

Optionally, the first device and the second device are located in the same local area network.

In the embodiment of the application, the first device and the second device are located in the same local area network, which means that the first device can be tested with a device to be tested connected to a second device different from the second device in the same local area network, so that the testing mode is more flexible.

Optionally, the sending, by the first device, the test instruction to the target second device includes:

the first device sends a test file to the target second device so that the target second device transmits the test file to the target device to be tested, and the test file is used for the target device to be tested to call a loading program to burn the test file and test according to the test file; wherein, the test file comprises: at least one of the test instructions.

In the embodiment of the application, the first device sends the test file to the target second device so that the target second device transmits the test file to the target device to be tested, and because the test file comprises at least one test instruction, multiple times of test instruction interaction between the first device and the target second device is not needed, and multiple times of test signal interaction between the target second device and the target device to be tested is also not needed, on one hand, the test process can be simpler, more convenient and more flexible; on the other hand, the testing efficiency is improved.

Optionally, before the first device sends the test instruction to the target second device, the method further includes:

the first device sends a write command to the target second device, so that the target second device writes a functional command into a system instruction in an operation script according to the write command, wherein the functional command comprises any one of the following: starting up, shutting down and restarting; and controlling the target to-be-tested equipment to execute the function command once through the target pin every time the target second equipment runs the operation script once.

In the embodiment of the application, the first device sends a write command to the target second device, so that the target second device writes the functional command into the system instruction in the operation script according to the write command. The target second equipment can control the equipment to be tested to execute the test by running the system instruction, and the test efficiency is improved.

Optionally, the test instruction is used to control the target second device to modify a parameter of a target pin, and includes:

the test instruction is used for controlling the target second equipment to modify the value of the description file corresponding to the target pin into an output level and modify the value of the attribute file corresponding to the target pin so as to control the type of the output level; wherein the description file and the attribute file are in the same number directory of the target pin.

In the embodiment of the application, the test instruction is used for controlling the target second device to modify the value of the description file and the value of the attribute file corresponding to the target pin, so that the second device can be controlled to output the test signal to complete the test in a parameter modification mode without manual participation, and the test efficiency is improved.

Optionally, the receiving, by the first device, a test result fed back by the target device to be tested through the connected pin by the target second device includes:

the first device receives a test result sent by the target second device, wherein the test result is obtained by the target second device looking up a log file of the target device to be tested; alternatively, the first and second electrodes may be,

and the first device reads a log file stored by the target second device, wherein the log file stored by the target second device comprises a test result fed back by the target device to be tested through the connected pin.

In the embodiment of the application, the first device may receive the test result sent by the target second device, and may also read the log file stored by the target second device, so that the manner in which the first device obtains the test result is more flexible.

and the first equipment receives the test result sent by the target second equipment, and the test result is obtained from the log file of the target equipment to be tested by the target second equipment through a preset test tool control serial port command.

In the embodiment of the application, the target second device controls the serial port command to obtain the log file from the target device to be tested through the preset testing tool, so that the target second device can conveniently obtain the log file, and the testing efficiency is further improved.

In a second aspect, an embodiment of the present invention provides a testing method, which is applied to second devices in a testing system, in the testing system, a communication connection is established between a first device and each second device, where each second device includes at least one group of pins for connecting to a device to be tested; the method comprises the following steps:

the second equipment receives a test instruction sent by the first equipment;

the second equipment modifies parameters of a target pin according to the test instruction so as to transmit a test signal to target equipment to be tested through the target pin;

and the second equipment receives a test result fed back by the target equipment to be tested according to the test signal and forwards the test result to the first equipment.

Optionally, the test instruction is carried in a test file;

the second device modifies parameters of a target pin according to the test instruction so as to transmit a test signal to the target device to be tested through the target pin, and the method comprises the following steps:

and the second equipment modifies the parameters of a target pin according to the test instruction so as to send the test file to the target equipment to be tested through the target pin, so that the target equipment to be tested calls a loading program to burn the test file, and tests according to the test file.

Optionally, the method further includes:

the second equipment receives a writing instruction sent by the first equipment, and writes a function command into a system instruction in an operation script according to the writing instruction, wherein the function command comprises any one of the following: starting up, shutting down and restarting;

and the second equipment runs the operation script according to the test instruction, wherein the target equipment to be tested is controlled to execute the function command once through the target pin when the operation script is run once.

Optionally, the modifying, by the second device, the parameter of the target pin according to the test instruction includes:

the second equipment modifies the value of the description file corresponding to the target pin into an output level and modifies the value of the attribute file corresponding to the target pin so as to control the type of the output level; wherein the description file and the attribute file are in the same number directory of the target pin.

Optionally, the receiving, by the second device, a test result fed back by the target device to be tested according to the test signal, and forwarding the test result to the first device by the second device includes:

the second device reads the log file of the target device to be tested, obtains the test result and forwards the test result to the first device; alternatively, the first and second electrodes may be,

and the second equipment receives the test result sent by the target equipment to be tested and writes the test result into a log file, so that the first equipment obtains the test result when reading the log file of the second equipment.

the second equipment responds to the checking operation of a user based on a preset testing tool, and controls a serial port command to obtain a log file of the target equipment to be tested;

and the second equipment acquires the test result according to the log file and forwards the test result to the first equipment.

In a third aspect, an embodiment of the present invention provides a test apparatus, which is applied to a first device in a test system, where the test system further includes: the first device is connected with each second device in a communication mode, and each second device comprises at least one group of pins used for connecting devices to be tested; the device comprises:

the device comprises a sending module, a receiving module and a sending module, wherein the sending module is used for sending a test instruction to a target second device, the target second device is one of the at least one second device, and the target second device is connected with a target device to be tested; the test instruction is used for controlling the target second equipment to modify parameters of a target pin so as to transmit a test signal to target equipment to be tested through the target pin for testing;

and the receiving module is used for receiving the test result fed back by the target device to be tested through the connected pin through the target second device.

Optionally, the sending module is further configured to send a test file to the target second device, so that the target second device transmits the test file to the target device to be tested, where the test file is used for the target device to be tested to call a loading program to burn the test file, and to perform a test according to the test file; wherein, the test file comprises: at least one of the test instructions.

Optionally, the apparatus further comprises:

a first sending module, configured to send a write command to the target second device, so that the target second device writes a function command into a system instruction in an operation script according to the write command, where the function command includes any one of: starting up, shutting down and restarting; and controlling the target to-be-tested equipment to execute the function command once through the target pin every time the target second equipment runs the operation script once.

Optionally, the test instruction is used to control the target second device to modify a parameter of a target pin, and includes: the test instruction is used for controlling the target second equipment to modify the value of the description file corresponding to the target pin into an output level and modify the value of the attribute file corresponding to the target pin so as to control the type of the output level; wherein the description file and the attribute file are in the same number directory of the target pin.

Optionally, the receiving module is further configured to receive a test result sent by the target second device, where the test result is obtained by the target second device viewing a log file of the target device to be tested; or reading a log file stored by the target second device, wherein the log file stored by the target second device comprises a test result fed back by the target device to be tested through a connected pin.

Optionally, the receiving module is further configured to receive the test result sent by the target second device, where the test result is obtained from a log file of the target device to be tested by the target second device through a preset test tool control serial port command.

In a fourth aspect, an embodiment of the present invention provides a testing apparatus, which is applied to second devices in a testing system, in the testing system, a communication connection is established between a first device and each second device, where each second device includes at least one group of pins for connecting to a device to be tested; the device comprises:

the first receiving module is used for receiving a test instruction sent by the first equipment;

the modification module is used for modifying parameters of a target pin according to the test instruction so as to transmit a test signal to target equipment to be tested through the target pin;

and the second receiving module is used for receiving a test result fed back by the target device to be tested according to the test signal and forwarding the test result to the first device.

Optionally, the test instruction is carried in a test file;

the modification module is further configured to modify a parameter of a target pin according to the test instruction, so as to send the test file to the target device to be tested through the target pin, so that the target device to be tested calls a loading program to burn the test file, and perform a test according to the test file.

Optionally, the apparatus further comprises:

a third receiving module, configured to receive a write instruction sent by the first device, and write a function command into a system instruction in an operation script according to the write instruction, where the function command includes any one of the following: starting up, shutting down and restarting;

the modification module is further configured to run the operation script according to the test instruction, where the operation script controls the target device to be tested to execute the function command once through the target pin every time the operation script is run once.

Optionally, the modifying module is further configured to modify a value of the description file corresponding to the target pin to be an output level, and modify a value of the attribute file corresponding to the target pin to control a type of the output level; wherein the description file and the attribute file are in the same number directory of the target pin.

Optionally, the second receiving module is further configured to read a log file of the target device to be tested, obtain the test result, and forward the test result to the first device; or receiving a test result sent by the target device to be tested, and writing the test result into a log file, so that the first device obtains the test result when reading the log file of the second device.

Optionally, the second receiving module is further configured to control a serial port command to obtain a log file of the target device to be tested in response to a user's checking operation based on a preset testing tool; and the second equipment acquires the test result according to the log file and forwards the test result to the first equipment.

In a fifth aspect, an embodiment of the present invention provides a test apparatus, including: a memory storing a computer program executable by the processor, and a processor implementing the testing method of any one of the first aspect when the computer program is executed by the processor.

In a sixth aspect, an embodiment of the present invention provides a computer-readable storage medium, where a computer program is stored, and when the computer program is read and executed, the computer program implements the testing method according to any one of the above first aspects.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of a first device according to an embodiment of the present invention;

fig. 3 is a schematic structural diagram of a device to be tested according to an embodiment of the present invention;

FIG. 4 is a flowchart illustrating a testing method according to an embodiment of the present invention;

FIG. 5 is a flowchart illustrating a testing method according to an embodiment of the present invention;

fig. 6 is a schematic flow chart of a testing method according to an embodiment of the present invention;

FIG. 7 is a flowchart illustrating a testing method according to an embodiment of the present invention;

fig. 8 is an interaction flow diagram of a testing method according to an embodiment of the present invention;

FIG. 9 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;

FIG. 10 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention;

fig. 11 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.

Thus, the following detailed description of the embodiments of the present application, presented in the accompanying drawings, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

Furthermore, the terms "first," "second," and the like in the description and in the claims, as well as in the drawings, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It should be noted that the features of the embodiments of the present application may be combined with each other without conflict.

In the related art, each computer device is generally connected to a device to be tested, and the device to be tested is tested by manually operating the computer device by a tester. However, in this implementation, since the testing process requires a manual operation depending on a tester, the testing efficiency is liable to be low.

In view of the above technical problems in the related art, an embodiment of the present application provides a testing method, which communicatively connects a first device and at least one second device, where the second device has a pin for connecting a device to be tested; the first device sends a test instruction to the target second device, the target second device modifies parameters of a target pin, and transmits a test signal to the target device to be tested through the target pin, so that the target device to be tested can be tested, the target device to be tested can also feed back a test result to the target second device through the pin, and the first device can obtain the test result from the second device. The whole testing process is automatically completed based on the first equipment, the target second equipment and the target to-be-tested equipment, so that human participation can be reduced, the testing efficiency is improved, and human resources are saved.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present invention, and as shown in fig. 1, the test system may include: at least one first device 101, at least one second device 102, at least one device under test 103.

The first device 101 may establish a communication connection with each second device 102, where the communication connection may be a wired communication connection or a wireless communication connection. In this embodiment, the first device 101 may be a computing device for issuing a test instruction, may be controlled by a user operation, and may also run a pre-configured related test program. The second device 102 may be a microprocessor device, a micro-computing device, etc. with processing capabilities, and is not limited thereto.

Optionally, each first device 101 and each second device 102 may be connected in the same local area network by a router in a wired or wireless manner, so as to ensure communication connection.

In addition, each second device 102 may include at least one group of pins for connecting to the devices under test 103, and the second device 102 may connect to a corresponding one of the devices under test 103 through one group of pins. When the second device 102 has multiple groups of pins for connecting the devices to be tested 103, multiple devices to be tested 103 may be connected, which is not limited herein and may be specifically designed according to an application scenario.

In some embodiments, the first device 101 may send a test instruction to a target second device 102 of the at least one second device 102; the target second device 102 may receive the test instruction, modify a parameter of the target pin according to the test instruction, and transmit a test signal to the target device to be tested 103 through the target pin to test the target device to be tested 103; the target device to be tested may also feed back a test result to the target second device 102 through the pin, and the first device 101 may obtain the test result from the second device 102.

It should be noted that the target second device 102 is also a second device connected to the target device to be tested 103.

Optionally, fig. 2 is a schematic structural diagram of the first device 101 according to an embodiment of the present invention, and as shown in fig. 2, the first device 101 may include a hardware part and a software part.

The hardware part can comprise a processor and a memory, wherein the processor is a control center of the computer equipment and is used for executing relevant programs so as to realize the test method provided by the embodiment of the application; the memory may store an operating system and other application software, and programming code for implementing the testing methods provided by embodiments of the present invention may be stored in the memory and executed by the processor. The memory may be integrated with or internal to the processor or may be one or more storage units separate from the processor.

The software section includes an operating System, a Basic Input/Output System (BIOS), and application software. An operating system is system software that manages computer hardware and software resources, as well as the kernel and keystone of a computer device. The operating system needs to handle basic transactions such as managing and configuring memory, prioritizing system resources, controlling input and output devices, operating the network, and managing the file system. To facilitate user operation, most operating systems provide an operator interface for a user to interact with the system.

It should be noted that the BIOS functions to run hardware initialization at the power-on boot stage, provide runtime services for the operating system and programs, and also have functions of displaying the processor temperature and adjusting the temperature protection policy. Application software, also known as application programs, is one of the main categories of computer software, and refers to software written for a specific application purpose of a user. For example, the application software may be a program for the purpose of power control, temperature management, and the like.

Optionally, the device under test 103 may be a development board, and fig. 3 is a schematic structural diagram of the device under test 103 according to an embodiment of the present invention, as shown in fig. 3, the device under test 103 may also include: a hardware portion and a software portion. The hardware part comprises: a processor and a memory, the software portion comprising: an operating system, a serial port and a plurality of pins. The description of the processor, the memory, and the operating system may refer to the description of the first device, which is not repeated here.

The serial port is an input/output interface for information interaction between the device to be tested 103 and other devices, and generally includes three pins, such as Tx, Rx, and GND, but not limited thereto. A plurality of pins in the device to be tested 103 may be used to implement the power on/off function of the device to be tested 103; of course, a dupont line may also be led out from the on/off button of the device to be tested and connected to the pin of the second device 102, and the on/off function of the device to be tested 103 is realized through the test signal given by the second device 102, which is not specifically limited in this embodiment of the application.

In some embodiments, the Serial port of the device under test 103 may be connected to a USB (Universal Serial Bus) interface of the second device 102 through a dupont line; the pins of the second device 102 may be connected to the pins of the device under test 103 via dupont lines. The pin of the second device 102 and the pin of the device under test 103 may be GPIO (General-purpose input/output) pins.

Optionally, in an embodiment that the pin of the second device 102 is connected to the pin of the device under test 103 through a dupont line, the test instruction sent by the first device 101 to the second device 102 may be transmitted to the pin of the device under test 103 through the dupont line, so that the device under test completes the test. Accordingly, the test result may be transmitted to the second device 102 through the serial port of the device under test 103, the dupont line, and the USB interface of the second device 102.

The following explains the test method provided in the embodiment of the present application, with the first device 101 as an execution subject.

Fig. 4 is a schematic flowchart of a testing method according to an embodiment of the present invention, and as shown in fig. 4, the method may include:

s401, the first device sends a test instruction to the target second device.

The target second equipment is one of the at least one second equipment, and the target second equipment is connected with target equipment to be tested; the test instruction is used for controlling the target second device to modify the parameters of the target pin so as to transmit the test signal to the target device to be tested through the target pin for testing.

In some embodiments, when a target device to be tested needs to be tested, the first device may determine a target second device connected to the target device to be tested, and the first device may send a test instruction to the target second device.

Correspondingly, the target second device can receive the test instruction, modify the parameters of the target pin according to the test instruction and transmit a test signal to the target device to be tested through the target pin; for the target device to be tested, the target device to be tested can receive the test signal and perform testing according to the test signal.

S402, the first device receives a test result fed back by the target device to be tested through the connected pin through the target second device.

In some embodiments, the target device under test may send the test result to the target second device through the connected pin; the target second device may receive the test result through the connected pin and then send the test result to the first device so that the first device may receive the test result.

Optionally, the target device to be tested may be connected to the target second device through a serial port, where the serial port may generally be composed of a plurality of pins.

Optionally, in this embodiment of the application, the first device may be equipped with a display, a mouse, a keyboard, and other devices, so as to edit or determine the test instruction, and facilitate the user to view the test result, and the like.

In summary, the embodiment of the present application provides a testing method, which is applied to a first device in a testing system, in which the first device sends a testing instruction to a target second device, and the target second device may modify a parameter of a target pin based on the testing instruction and transmit a testing signal to a target device to be tested through the target pin, so that the target device to be tested may be tested to obtain a testing result. In the implementation mode, manual participation is not needed, and the testing efficiency is improved.

The first device and the second device can be connected in a wired mode through a router or in the same network in a wireless mode, and communication between the first device and the second device is guaranteed.

In some embodiments, a static IP address of the second device may be set, and the first device connects the second device according to the set static IP address of the second device, so that the first device and the second device are located in the same local area network. In this application, one first device may be connected to a plurality of second devices, and one first device may also be connected to one second device, which is not limited herein.

In summary, the first device and the second device are located in the same local area network, which means that the first device can be tested with a device to be tested connected to a second device that is different and located in the same local area network, so that the testing manner is more flexible.

Moreover, the first device is in wireless communication connection with the second device, so that the first device can remotely control the second device, and the device to be tested can be remotely tested.

Optionally, the process of sending the test instruction to the target second device by the first device in S401 may include:

the first device sends the test file to the target second device, so that the target second device transmits the test file to the target device to be tested.

The test file can be used for calling a loading program to burn the test file by the target device to be tested and testing according to the test file; wherein, the test file comprises: at least one test instruction.

In some embodiments, a first device may send a test file to a target second device; after receiving the test file, the target second equipment sends the test file to the target equipment to be tested; the target device to be tested can receive the test file, the test file is placed in the loading program, the target device to be tested calls a flash (flash memory) burning test file of the loading program, and then the target device to be tested can test according to the test file.

Optionally, the device to be tested may also start the loader in advance, and call the loader and burn the program after the target device to be tested receives the test file.

In addition, when the target test equipment performs the test according to the test file, the target test equipment can be restarted and enters an operating system to complete the test of the required function. The Loader in the above process may be uboot (Universal Boot Loader, which is used to Boot the kernel).

In summary, the first device sends the test file to the target second device, so that the target second device transmits the test file to the target device to be tested, and because the test file includes at least one test instruction, there is no need to interact the test instruction between the first device and the target second device for many times, and there is no need to interact the test signal between the target second device and the target device to be tested for many times, on one hand, the test process is simpler and more flexible; on the other hand, the testing efficiency is improved.

Optionally, before the process of sending the test instruction to the target second device by the first device in S101, the method may further include:

and the first device sends a write command to the target second device so that the target second device writes the functional command into the system instruction in the operating script according to the write command.

Wherein the function command comprises any one of the following: starting up, shutting down and restarting; and controlling the target to-be-tested equipment to execute a function command through the target pin every time the target second equipment runs the operation script once.

In some embodiments, the first device may send a write command to the target second device, and the target second device may receive the write command and write the function command in the form of an operation script into a system instruction of the target second device according to the write command, and the target second device may control the target device to be tested to execute the function command once through the target pin for testing each time the target second device runs the operation script.

In summary, the first device sends a write command to the target second device, so that the target second device writes the functional command into the system instruction in the operation script according to the write command. The target second device can directly test the target device to be tested, wherein the target second device can control the device to be tested to execute the test by running the system instruction, and the test efficiency is improved.

Optionally, the step of using the test instruction to control the target second device to modify the parameter of the target pin may include: the test instruction is used for controlling the target second device to modify the value of the description file corresponding to the target pin into an output level and modify the value of the attribute file corresponding to the target pin so as to control the type of the output level.

Wherein, the description file and the attribute file are under the same number directory of the target pin.

In some embodiments, the target second device may receive the test instruction, modify a value of a number directory under description file (direction file) of the target pin to an output level (out) according to the test instruction, and modify a value of a number directory under attribute file (value file) of the target pin to control a type of the output level to be a low level or a high level.

Note that the low level may be represented by 0, and the high level may be represented by 1. According to the embodiment of the application, the state of the device to be tested is controlled through the change of the output level, namely the device to be tested is controlled to be switched among power-on, power-off and restarting through the change of the high and low levels, and optionally, the duration time of the high and low levels can be different according to the switching strategies of different states.

For example, when the output level changes from high level to low level and then to high level, the device to be tested may be controlled to change from power-on to power-off, or from power-off to power-on or restarted. For example, the output level to the device to be tested is high, then low for 0.2s and then back to high, and the device to be tested can be controlled to change from power-on to power-off, or from power-off to power-on. The output level to the device to be tested is high, then the output level is low for 2s and then the output level is changed back to the high level, so that the device to be tested can be controlled to restart. Of course, the specific strategy may be adjusted according to the strategy of the device to be tested, and the examples are not limited to the above.

In summary, the test instruction is used to control the target second device to modify the value of the description file and the value of the attribute file corresponding to the target pin, so that the second device can be controlled to output the test signal to complete the test by modifying the parameter, manual participation is not required, and the test efficiency is improved.

Optionally, the process of receiving, by the first device through the target second device in S102, the test result fed back by the target device to be tested through the connected pin may include:

the method comprises the steps that a first device receives a test result sent by a target second device, wherein the test result is obtained by the target second device checking a log file of a target device to be tested; alternatively, the first and second electrodes may be,

the first device reads a log file stored by the target second device, wherein the log file stored by the target second device comprises a test result fed back by the target device to be tested through the connected pin.

That is, the test result may be stored in a log file of the target device to be tested, and the first device obtains the log file of the target device to be tested through the second device. Or the second device may obtain the test result and store the test result in a log file of the second device, and the first device reads the log file of the second device when the test result needs to be checked.

In the embodiment of the application, the target second device may check the log file of the target device to be tested to obtain the test result, and feed back the test result to the first device, and the first device may receive the test result; or the target device to be tested may feed back the test result through the connected pin, the target second device may store the test result, and the first device may read the log file stored by the target second device.

In summary, the first device may receive the test result sent by the target second device, and may also read the log file stored by the target second device, so that the manner in which the first device obtains the test result is more flexible.

and the first equipment receives the test result sent by the target second equipment.

And the test result is obtained from the log file of the target device to be tested by the target second device through a preset test tool control serial port command.

In some embodiments, the target second device obtains a test result from a log file of the target device to be tested through a preset test tool control serial port command; and sending the test result to the first device; the first device may receive the test result.

Alternatively, the predetermined testing tool may be a ser2net tool. The preset testing tool can be provided with a visual window, and a user can input an instruction or edit the instruction through the visual window so as to control a serial port command to be acquired from a log file of a target device to be tested. Correspondingly, the read log file can be displayed in real time through the visual window, so that the user can conveniently see the information of the whole testing process.

In summary, the target second device controls the serial port command to obtain the log file from the target device to be tested through the preset testing tool, so that the target second device can conveniently obtain the log file, and the testing efficiency is further improved.

The following explains the test method provided in the embodiment of the present application, with the second device as an execution subject.

Fig. 5 is a schematic flowchart of a testing method according to an embodiment of the present invention, and as shown in fig. 5, the method may include:

s501, the second equipment receives a test instruction sent by the first equipment.

When a target device to be tested needs to be tested, the first device can determine a second device connected with the target device to be tested, and the first device can send a test instruction to the second device; the second device may receive the test instruction.

S502, the second device modifies the parameters of the target pin according to the test instruction so as to transmit the test signal to the target device to be tested through the target pin.

It should be noted that the second device may be connected to the target device to be tested through the target pin, and the second device may modify a parameter of the target pin according to the test instruction, and may transmit the test signal to the target device to be tested through the target pin.

S503, the second device receives the test result fed back by the target device to be tested according to the test signal, and forwards the test result to the first device.

In some embodiments, the target device to be tested may send the test result to the second device through the connected pin; the second device may receive the test result through the connected pin and then send the test result to the first device, which may receive the test result.

Optionally, the target device to be tested may be connected to the second device through a serial port, where the serial port may generally be composed of a plurality of pins.

To sum up, the embodiment of the present application provides a testing method, applied to a second device in a testing system, the method including: the second equipment receives a test instruction sent by the first equipment; the second equipment modifies the parameters of the target pin according to the test instruction so as to transmit a test signal to the target equipment to be tested through the target pin; and the second equipment receives the test result fed back by the target equipment to be tested according to the test signal and forwards the test result to the first equipment. The first device sends a test instruction to the second device, the second device transmits a test signal to the target device to be tested through the target pin, the target device to be tested can be tested, the target device to be tested can also feed back a test result to the second device through the pin, and the first device can obtain the test result from the second device. The whole testing process is automatically completed based on the first equipment, the second equipment and the target to-be-tested equipment, manual participation is not needed, testing efficiency is improved, and human resources are saved.

In this embodiment of the present application, a static IP address of the second device may be set, and the first device connects to the second device according to the set static IP address of the second device, so that the first device and the second device are located in the same local area network.

In summary, the first device and the second device are located in the same lan, which facilitates the mutual communication between the first devices and the second devices, so that the first devices can be tested on the devices to be tested connected to the different second devices, and the testing mode is more flexible. Moreover, the first device is in wireless communication connection with the second device, so that the first device can remotely control the second device, and the device to be tested can be remotely tested.

Optionally, the test instruction is carried in the test file;

the process of modifying, by the second device in S502, the parameter of the target pin according to the test instruction to transmit the test signal to the target device to be tested through the target pin may include:

and the second equipment modifies the parameters of the target pin according to the test instruction so as to send a test file to the target equipment to be tested through the target pin, so that the target equipment to be tested calls the loading program to burn the test file, and tests according to the test file.

In some embodiments, a first device may send a test file to a second device; the second device can receive the test file and send the test file to the target device to be tested; the target device to be tested can receive the test file, place the test file in a Loader, call the Loader (uboot, Universal Boot Loader, which is used to Boot the kernel) to burn the test file in its flash memory, and then the target device to be tested can test according to the test file, and when testing, can restart and enter the operating system to complete the test of the required function.

In summary, the first device sends the test file to the second device, so that the second device transmits the test file to the target device to be tested, and multiple interactions and transmission of test instructions between the first device and the second device are not required, and multiple interactions and transmission of test signals between the second device and the target device to be tested are also not required, so that the test process is simpler, more convenient and more flexible. In addition, the first device transmits the test file to the target device to be tested through the second device for testing, batch-based test instructions can be further realized for testing, and the test efficiency is improved.

Optionally, fig. 6 is a schematic flow chart of a testing method provided in the embodiment of the present invention, and as shown in fig. 6, the method may further include:

s601, the second device receives a writing instruction sent by the first device, and writes the function command into a system instruction in the form of an operation script according to the writing instruction.

Wherein the function command comprises any one of the following: starting up, shutting down and restarting.

In the above S502, the modifying, by the second device, the parameter of the target pin according to the test instruction to transmit the test signal to the target device to be tested through the target pin includes:

and S602, the second device runs the operation script according to the test instruction, wherein the target device to be tested is controlled to execute a function command through the target pin every time the operation script is run.

In some embodiments, the first device may send a write command to the second device, the second device may receive the write command, and write the function command in the form of an operation script into a system instruction of the second device according to the write command, and the second device controls the target device to be tested to execute the function command once through the target pin for testing each time the second device runs the operation script.

In summary, the second device writes the function command into the system instruction in the operation script according to the write command. The direct test of the second equipment to the target equipment to be tested can be realized, each first equipment can be remotely connected with the second equipment, the second equipment can complete the test as long as the operation script in the system instruction is operated, and the test efficiency is improved.

Optionally, the process of modifying the parameter of the target pin by the second device according to the test instruction in S502 may include: the second equipment modifies the value of the description file corresponding to the target pin as an output level and modifies the value of the attribute file corresponding to the target pin so as to control the type of the output level; wherein, the description file and the attribute file are under the same number directory of the target pin.

In some embodiments, the second device may receive the test instruction, modify a value of a description file (direction file) under a number directory of the target pin to be an output level (out) according to the test instruction, and modify a value of a property file (value file) under the number directory of the target pin to control a type of the output level to be a low level (0 for controlling the device to be tested to be powered on and powered off) or a high level (1 for controlling the device to be tested to be powered off and powered off).

In summary, the second device modifies the value of the description file and the value of the attribute file corresponding to the target pin, so that the second device can be controlled to output the test signal to complete the test by modifying the parameter, manual participation is not required, and the test efficiency is improved.

Optionally, the receiving, by the second device, the test result fed back by the target device to be tested according to the test signal, and forwarding the test result to the first device, includes:

the second equipment reads the log file of the target equipment to be tested, obtains the test result and forwards the test result to the first equipment; alternatively, the first and second electrodes may be,

the second device receives the test result sent by the target device to be tested and writes the test result into the log file, so that the first device obtains the test result when reading the log file of the second device.

In the embodiment of the application, the second device can check the log file of the target device to be tested to obtain the test result and feed back the test result to the first device, and the first device can receive the test result; or the target device to be tested may feed back the test result through the connected pin, the second device may receive and store the test result, and the first device may read the log file stored in the second device.

In summary, the second device may read the log file of the target device to be tested to obtain the test result, and may also receive the test result sent by the target device to be tested, and write the test result into the log file, so that the manner in which the second device obtains the test result is more flexible.

Optionally, fig. 7 is a flowchart of a testing method according to an embodiment of the present invention, and as shown in fig. 7, a process of the second device receiving a test result fed back by the target device to be tested according to the test signal and forwarding the test result to the first device in S503 may include:

s701, the second device responds to the checking operation of the user based on a preset testing tool and controls the serial port command to obtain the log file of the target device to be tested.

S702, the second equipment obtains the test result according to the log file and forwards the test result to the first equipment.

In some embodiments, when a user needs to check a log file, a check operation may be input based on a preset test tool, the second device may respond to the check operation, control the serial port command to obtain the log file of a target device to be tested, obtain a test result from the log file, and send the test result to the first device; the first device may receive the test result.

Alternatively, the predetermined testing tool may be a ser2net tool.

In summary, the second device responds to the checking operation of the user based on the preset testing tool, and controls the serial port command to acquire the log file of the target device to be tested, so that the second device can acquire the log file conveniently.

According to the testing method provided by the embodiment of the application, the second equipment can remotely and automatically test the equipment to be tested based on the testing instruction, the whole testing time is completely free from manual operation, and the consumption of manpower and material resources is greatly reduced. The test of the equipment to be tested can be carried out in the unmanned time period, the waiting time is reduced, the first equipment can also obtain the output of the test result, and the existing errors can be conveniently searched. The test of different first devices on the same device to be tested can be met without plugging and unplugging the device to be tested; when a plurality of types of devices to be tested are tested simultaneously, the devices to be tested can be replaced to be tested only by replacing the remote ip of the second device, and the devices to be tested do not need to be plugged and replaced to be tested in the related technology for testing, so that the testing efficiency is improved, and the testing convenience is improved.

Fig. 8 is a schematic interaction flow diagram of a testing method according to an embodiment of the present invention, as shown in fig. 8, the interaction node related to the testing method includes: the first device, the second device, and the device to be tested, based on the implementation manner of the foregoing embodiment, exemplarily introduce an interaction flow between devices, where the second device in this embodiment is the target second device and the device to be tested is the target device to be tested, and an optional implementation manner of the embodiment may refer to the foregoing embodiment, which is not described herein again. Wherein, the method comprises the following steps:

s801, the first device sends a test instruction to the second device.

S802, the second device modifies the pin parameters connected with the device to be tested according to the test instruction.

And S803, the second device sends a test signal to the device to be tested according to the modified pin parameter.

And S804, the device to be tested completes the test according to the test signal and obtains a test result.

And S805, the device to be tested sends the test result to the second device.

And S806, the second equipment sends the test result to the first equipment.

It should be noted that the interaction flow is only an example for reference, and is not limited thereto.

The following describes a test apparatus, a test device, a storage medium, and the like for executing the test method provided in the present application, and specific implementation processes and technical effects thereof are referred to in the related contents of the test method, and are not described in detail below.

Fig. 9 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention, as shown in fig. 9, the testing apparatus is applied to a first device in a testing system, and the testing system further includes: the first device is connected with each second device in a communication mode, and each second device comprises at least one group of pins used for connecting devices to be tested; the device comprises:

a sending module 801, configured to send a test instruction to a target second device, where the target second device is one of the at least one second device, and the target second device is connected to a target device to be tested; the test instruction is used for controlling the target second equipment to modify parameters of a target pin so as to transmit a test signal to target equipment to be tested through the target pin for testing;

a receiving module 802, configured to receive, by the target second device, a test result fed back by the target device to be tested through the connected pin.

Optionally, the sending module 801 is further configured to send a test file to the target second device, so that the target second device transmits the test file to the target device to be tested, where the test file is used for the target device to be tested to call a loader to burn the test file, and to perform a test according to the test file; wherein, the test file comprises: at least one of the test instructions.

Optionally, the apparatus further comprises:

Optionally, the receiving module 802 is further configured to receive a test result sent by the target second device, where the test result is obtained by the target second device viewing a log file of the target device to be tested; or reading a log file stored by the target second device, wherein the log file stored by the target second device comprises a test result fed back by the target device to be tested through a connected pin.

Optionally, the receiving module 802 is further configured to receive the test result sent by the target second device, where the test result is obtained from the log file of the target device to be tested by the target second device through a preset test tool control serial port command.

Fig. 10 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention, as shown in fig. 10, the testing apparatus is applied to second devices in a testing system, in the testing system, a first device establishes a communication connection with each second device, and each second device includes at least one group of pins for connecting to a device to be tested; the device comprises:

a first receiving module 901, configured to receive a test instruction sent by the first device;

a modifying module 902, configured to modify a parameter of a target pin according to the test instruction, so as to transmit a test signal to a target device to be tested through the target pin;

a second receiving module 903, configured to receive a test result fed back by the target device to be tested according to the test signal, and forward the test result to the first device.

Optionally, the test instruction is carried in a test file;

the modifying module 902 is further configured to modify a parameter of a target pin according to the test instruction, so as to send the test file to the target device to be tested through the target pin, so that the target device to be tested calls a loader to burn the test file, and perform a test according to the test file.

Optionally, the apparatus further comprises:

the modifying module 902 is further configured to run the operation script according to the test instruction, where the target device to be tested is controlled to execute the function command once through the target pin if the operation script is run once.

Optionally, the modifying module 902 is further configured to modify the value of the description file corresponding to the target pin to be an output level, and modify the value of the attribute file corresponding to the target pin to control the type of the output level; wherein the description file and the attribute file are in the same number directory of the target pin.

Optionally, the second receiving module 903 is further configured to read a log file of the target device to be tested, obtain the test result, and forward the test result to the first device; or receiving a test result sent by the target device to be tested, and writing the test result into a log file, so that the first device obtains the test result when reading the log file of the second device.

Optionally, the second receiving module 903 is further configured to control a serial port command to obtain a log file of the target device to be tested, in response to a user's checking operation based on a preset testing tool; and the second equipment acquires the test result according to the log file and forwards the test result to the first equipment.

The above-mentioned apparatus is used for executing the method provided by the foregoing embodiment, and the implementation principle and technical effect are similar, which are not described herein again.

These above modules may be one or more integrated circuits configured to implement the above methods, such as: one or more Application Specific Integrated Circuits (ASICs), or one or more microprocessors (DSPs), or one or more Field Programmable Gate Arrays (FPGAs), among others. For another example, when one of the above modules is implemented in the form of a Processing element scheduler code, the Processing element may be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. For another example, these modules may be integrated together and implemented in the form of a system-on-a-chip (SOC).

Fig. 11 is a schematic structural diagram of a testing apparatus according to an embodiment of the present invention, and as shown in fig. 11, the testing apparatus may include: a processor 1001 and a memory 1002.

The memory 1002 is used for storing programs, and the processor 1001 calls the programs stored in the memory 1002 to execute the above-mentioned method embodiments. The specific implementation and technical effects are similar, and are not described herein again.

Optionally, the invention also provides a program product, for example a computer-readable storage medium, comprising a program which, when being executed by a processor, is adapted to carry out the above-mentioned method embodiments.

In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.

The integrated unit implemented in the form of a software functional unit may be stored in a computer readable storage medium. The software functional unit is stored in a storage medium and includes several instructions to enable a computer device (which may be a personal computer, a server, or a network device) or a processor (processor) to execute some steps of the methods according to the embodiments of the present invention. And the aforementioned storage medium includes: a U disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes will occur to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A testing method applied to a first device in a testing system, the testing system further comprising: the first device is connected with each second device in a communication mode, and each second device comprises at least one group of pins used for connecting devices to be tested; the method comprises the following steps:

2. The method of claim 1, wherein the first device and the second device are located on a same local area network.

3. The method of claim 1 or 2, wherein sending the test instruction to the target second device by the first device comprises:

4. The method of claim 1 or 2, wherein before the first device sends the test instruction to the target second device, the method further comprises:

5. The method of claim 1 or 2, wherein the test instruction is used to control the target second device to modify a parameter of a target pin, and comprises:

6. The method of claim 1 or 2, wherein the first device receives, through the target second device, a test result fed back by the target device under test through the connected pin, and comprises:

7. The method of claim 1 or 2, wherein the first device receives, through the target second device, a test result fed back by the target device under test through the connected pin, and comprises:

8. The testing method is applied to second equipment in a testing system, wherein the first equipment and each second equipment establish communication connection in the testing system, and each second equipment comprises at least one group of pins for connecting the equipment to be tested; the method comprises the following steps:

the second equipment receives a test instruction sent by the first equipment;

9. The method of claim 8, wherein the first device and the second device are located on a same local area network.

10. The method according to claim 8 or 9, wherein the test instructions are carried in a test file;

11. The method according to claim 8 or 9, characterized in that the method further comprises:

12. The method of claim 8 or 9, wherein the second device modifies parameters of a target pin according to the test instructions, including:

13. The method of claim 8, wherein the second device receives a test result fed back by the target device to be tested according to the test signal and forwards the test result to the first device, and the method comprises:

14. The method of claim 8, wherein the second device receives a test result fed back by the target device to be tested according to the test signal and forwards the test result to the first device, and the method comprises:

15. A test apparatus, applied to a first device in a test system, the test system further comprising: the first device is connected with each second device in a communication mode, and each second device comprises at least one group of pins used for connecting devices to be tested; the device comprises:

16. The test device is applied to second equipment in a test system, wherein the first equipment and each second equipment establish communication connection in the test system, and each second equipment comprises at least one group of pins for connecting the equipment to be tested; the device comprises:

17. A test apparatus, comprising: a memory storing a computer program executable by the processor, and a processor implementing the testing method of any one of claims 1 to 14 when the computer program is executed by the processor.

18. A computer-readable storage medium, having stored thereon a computer program which, when read and executed, implements a test method as claimed in any one of claims 1 to 14.