CN114252780A

CN114252780A - Power supply testing device

Info

Publication number: CN114252780A
Application number: CN202011001222.7A
Authority: CN
Inventors: 王翊鹏; 张俊伟; 张军
Original assignee: Hongfujin Precision Electronics Zhengzhou Co Ltd; Hon Hai Precision Industry Co Ltd
Current assignee: Hongfujin Precision Electronics Zhengzhou Co Ltd; Hon Hai Precision Industry Co Ltd
Priority date: 2020-09-22
Filing date: 2020-09-22
Publication date: 2022-03-29
Also published as: TW202212854A

Abstract

The utility model provides a power supply testing device, power supply testing device includes port circuit, the return circuit of bleeding and control circuit, port circuit is used for the electricity to be connected an element that awaits measuring, the return circuit of bleeding with port circuit electricity is connected, the return circuit of bleeding is used for adjusting the energy of the element that awaits measuring is bled to produce test data, control circuit with the return circuit electricity is connected to bleed, control circuit output first control signal is used for control the return circuit of bleeding is to the regulation of the element that awaits measuring energy is bled. The power supply testing device accelerates data analysis of the mobile phone power supply, further improves detection speed, is easy to operate and convenient to use, and can find and correspondingly solve the problem of the mobile phone power supply in time.

Description

Power supply testing device

Technical Field

The application relates to the technical field of testing, in particular to a power supply testing device.

Background

With the continuous development of the technology, a large number of mobile phone batteries are widely applied to mobile phones of different models, specifications and styles. Before the mobile phone battery is wrapped and marked, a plurality of performance index parameters of the mobile phone battery are usually detected, if the discharge performance of the battery is verified, the battery which meets the standard is detected and sent to the next procedure, and if the battery which does not meet the standard is detected, the unqualified reason needs to be found out and the problem needs to be solved. When producing mobile phone batteries on a large scale, the feedback of relevant problems of the batteries needs to be obtained in time and the solving speed of the problems needs to be improved.

Disclosure of Invention

In view of the above, a power testing apparatus is needed to provide timely feedback of problems related to power production and increase the speed of solving the problems of the mobile phone.

In one embodiment of the present application, a power supply testing device is provided, which includes a port circuit, a bleeding loop, and a control circuit;

the port circuit is used for electrically connecting a component to be tested;

the bleeder circuit is electrically connected with the port circuit and is used for regulating the energy discharge of the element to be tested;

the control circuit is electrically connected with the discharge loop, and the control circuit outputs a first control signal to the discharge loop for controlling the regulation of the discharge loop on the energy discharge of the element to be tested.

In one possible implementation manner of the present application, the power supply testing apparatus further includes an acquisition circuit;

the acquisition circuit is electrically connected with the element to be tested through the discharge loop and is used for acquiring test data generated in the energy discharge process of the element to be tested;

the acquisition circuit is electrically connected with the control circuit and is used for outputting the test data to the control circuit.

In one possible implementation manner of the present application, the power supply testing apparatus further includes a power supply module, where the power supply module is configured to provide electric energy for the power supply testing apparatus.

In one possible implementation manner of the present application, the power supply testing apparatus further includes a communication module, the communication module is electrically connected to the collection circuit, the communication module is in communication connection with a host, and the communication module is configured to send the test data to the host, so that the host remotely monitors the energy discharge of the element to be tested.

In one possible implementation manner of the present application, the control circuit includes a control chip, and the control chip outputs the first control signal to the bleeding loop; the control chip outputs a second control signal to the discharge loop according to the test data acquired by the acquisition circuit.

In one possible implementation manner of the present application, the bleeding loop includes a first operational amplifier, a first capacitor, a second capacitor, a first resistor, a second resistor, a third resistor, a fourth resistor, a second operational amplifier, a fifth resistor, a sixth resistor, a seventh resistor, and an eighth resistor;

one end of a forward input end of the first operational amplifier is electrically connected with one end of the third resistor, the other end of the third resistor is electrically connected with the control chip and one end of the fourth resistor, a reverse input end of the first operational amplifier is electrically connected with one end of the first resistor, an output end of the first operational amplifier is electrically connected with one end of the second resistor, and the other end of the second resistor is electrically connected with the element to be tested;

the output end of the second operational amplifier is electrically connected with the other end of the first resistor, one end of the seventh resistor, one end of the first capacitor, one end of the eighth resistor and one end of the second capacitor, the reverse input end of the second operational amplifier is electrically connected with one end of the fifth resistor, the other end of the eighth resistor and the other end of the second capacitor, the forward input end of the second operational amplifier is electrically connected with one end of the sixth resistor, and the other end of the sixth resistor is electrically connected with the element to be tested;

the other end of the seventh resistor is grounded;

the other end of the first capacitor is grounded;

the other end of the fourth resistor is grounded;

the other end of the fifth resistor is grounded.

In one possible implementation manner of the present application, the bleeding circuit further includes a first electronic switch and a ninth resistor;

the first end of the first electronic switch is grounded through a ninth resistor, the first end of the first electronic switch is electrically connected with the positive input end of the second operational amplifier through the sixth resistor, the second end of the first electronic switch is electrically connected with the output end of the first operational amplifier through the second resistor, and the third end of the first electronic switch is electrically connected with the port circuit.

In one possible implementation manner of the present application, the bleeding circuit further includes a second electronic switch and a tenth resistor;

the first end of the second electronic switch is grounded through a tenth resistor, the first end of the second electronic switch is electrically connected with the positive input end of the second operational amplifier through the sixth resistor, the second end of the second electronic switch is electrically connected with the output end of the first operational amplifier through the second resistor, and the third end of the second electronic switch is electrically connected with the port circuit.

In one possible implementation manner of the present application, the power supply testing apparatus further includes an eleventh resistor and a light emitting diode;

one end of the eleventh resistor is electrically connected with the positive terminal of the port circuit;

the other end of the eleventh resistor is grounded through the light emitting diode.

In one possible implementation manner of the present application, the port circuit includes a first interface, a second interface, a third interface, and a fourth interface;

the first interface is electrically connected with the anode of the element to be tested;

the second interface is electrically connected with the control chip;

the third interface is electrically connected with the control chip;

the fourth interface is electrically connected with the negative electrode of the element to be tested.

The application passes through power testing arrangement has accelerated the data analysis to the component that awaits measuring for accelerate the data analysis of cell-phone battery, further improve detection speed, its easy operation and simplicity make the battery load formula of cell-phone detect more generally quick, and guarantee that the relevant problem of power battery when large-scale production can obtain repayment and problem solution speed can obtain very big improvement.

Drawings

Fig. 1 is a functional block diagram of a power supply test apparatus in an embodiment of the present application.

Fig. 2 is a circuit connection diagram of the control circuit shown in fig. 1.

Fig. 3A is a diagram of a partial circuit connection in the bleeder circuit of fig. 1.

Fig. 3B is a circuit diagram of a first electronic switch of the bleed circuit of fig. 1.

Fig. 3C is a circuit diagram of a second electronic switch of the bleed circuit of fig. 1.

Fig. 3D is a partial circuit diagram of the bleed circuit of fig. 1.

Fig. 4 is a circuit connection diagram of the acquisition circuit shown in fig. 1.

Fig. 5 is a circuit connection diagram of the port circuit shown in fig. 1.

Fig. 6 is a schematic diagram showing test results in the power supply testing apparatus shown in fig. 1.

Description of the main elements

The following detailed description will further illustrate the present application in conjunction with the above-described figures.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It will be understood that when an element is referred to as being "electrically connected" to another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "electrically connected" to another element, it can be connected by contact, e.g., by wires, or by contactless connection, e.g., by contactless coupling.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

Some embodiments of the present application will be described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.

Referring to fig. 1, the present application provides a power testing apparatus 100. The power supply testing device 100 is used for testing the discharge performance of the device under test 200.

In the embodiment of the present application, the element to be tested 200 performs energy release, and it can be understood that the element to be tested 200 performs an energy release process, that is, the element to be tested 200 performs a discharge process, that is, the element to be tested 200 outputs a discharge current or a discharge voltage. The power supply testing device 100 detects the output characteristic of the element under test 200 during the energy discharge process.

Specifically, power testing arrangement 100 includes positive terminal and negative pole end, the positive terminal with the negative pole end is used for the electricity to be connected the element 200 that awaits measuring, the element 200 that awaits measuring is used for providing discharge voltage or discharge current, and will discharge voltage or discharge current pass through the positive terminal with the negative pole end is exported, power testing arrangement 100 automatic control the element 200 that awaits measuring carries out the energy and releases, and detects the test data of element 200 that awaits measuring in the energy release in-process, the test data includes the relevant data of voltage and/or electric current along with time variation, will the test data carries out the image show, and the person of facilitating the use is right the test data carries out the analysis. The discharge performance of the device 200 to be tested is tested by detecting the output characteristics of the device 200 to be tested in the whole process from full charge to empty of the battery of the device 200 to be tested.

In the embodiment of the present application, the device under test 200 may be a battery, which may be a power electronic product, such as a mobile phone battery.

In the embodiment of the present application, the power testing apparatus 100 includes a port circuit 10, a bleeding loop 20, an acquisition circuit 30, a control circuit 40, a power module (not shown), and a communication module 50.

In the embodiment of the present application, the control circuit 40 is electrically connected to the port circuit 10, the bleeding circuit 20 and the collecting circuit 30, respectively. One end of the port circuit 10 is used to electrically connect the element to be tested 200, and the other end of the port circuit 10 is used to electrically connect one end of the bleeding circuit 20. One end of the acquisition circuit 30 is electrically connected to the other end of the bleed circuit 20, and the other end of the acquisition circuit 30 is electrically connected to the communication module 50. The power module is used for supplying power to the internal components of the power testing device 100, and the power module is electrically connected to the control circuit 40, the port circuit 10, the collecting circuit 30 and the discharging loop 20.

In this embodiment, the port circuit 10 includes a positive terminal and a negative terminal, the positive terminal of the device 200 to be tested is electrically connected to the positive terminal, the negative terminal of the device 200 to be tested is electrically connected to the negative terminal, and the port circuit 10 is configured to connect the device 200 to be tested to the power testing apparatus 100.

In this embodiment, the control circuit 40 is configured to control the adjustment of the bleeding circuit 20 to the energy of the element to be tested 200, and the control circuit 40 outputs a control signal to the bleeding circuit 20 according to a preset control logic. For example, a user sets a control logic in the control circuit 40 in advance, at an initial time, the control circuit 40 outputs a first control signal to the bleeding circuit 20 to control the bleeding circuit 20 to adjust the energy bleeding of the element to be tested 200 according to the first control signal, meanwhile, the control circuit 40 collects the test data collected by the collecting circuit 30 and analyzes the test data, and when the test data reaches a preset trigger condition, for example, when the discharge current of the element to be tested 200 reaches a preset value, the control circuit 40 outputs a second control signal to the bleeding circuit 20 to control the bleeding circuit 20 to adjust the element to be tested 200. The control logic of the control circuit 40 is not particularly limited in this application.

In the embodiment of the present application, the bleeding circuit 20 is electrically connected between the positive terminal and the negative terminal of the port circuit 10, that is, the bleeding circuit 20 is electrically connected between the positive terminal and the negative terminal of the device under test 200, and the bleeding circuit 20 is used for controlling the discharge of the device under test 200 according to the control signal output by the control circuit 40.

In the embodiment of the present application, the collecting circuit 30 is electrically connected to the bleeding circuit 20, so as to collect the test data during the energy bleeding process of the element 200 to be tested when the element 200 to be tested discharges through the bleeding circuit 20, and output the test data to the control circuit 40.

In this embodiment, the communication module 50 is configured to implement remote communication, and transmit the test data acquired by the acquisition circuit 30 to an external host, so that a user can remotely monitor the test condition of the to-be-tested element 200 through the host in real time.

In the embodiment of the present application, the power testing device 100 further includes a housing (not shown). The housing is substantially rectangular. The housing is used for accommodating and installing the port circuit 10, the bleeding circuit 20, the collecting circuit 30, the control circuit 40, the power module and the communication module 50.

In one possible implementation manner of the present application, a display screen (not shown), a heat sink (not shown), a fan (not shown), and a temperature sensor (not shown) are further disposed on the housing. The display screen can be used for displaying the test data of the element to be tested 200 after energy release, and showing the change of the voltage/or current of the element to be tested 200 in the energy release process along with time. The heat sink is disposed on one side of the device under test 200 to dissipate heat of the device under test 200, so as to accelerate energy release of the device under test 200. The fan may further reduce the temperature of the heat sink. The temperature sensor is arranged on one side of the radiating fin to detect the temperature of the radiating fin, and then the rotating speed of the fan is adjusted according to the feedback of the temperature sensor.

In the embodiment of the present application, the power module includes a first power source V1, a second power source V2, and a third power source V3. In one possible implementation, the first power source V1 may be 3.3V. In one possible implementation, the second power source V2 may be 12V. In one possible implementation, the third power source V3 may be 2.5V.

Referring to fig. 2, fig. 2 is a circuit diagram of a control circuit 40 according to a preferred embodiment of the present application.

In the embodiment of the present application, the control circuit 40 includes a control chip, and the control chip includes a first power terminal VDD1, a first ground terminal GND1, a digital-to-analog conversion pin D/a out, an analog-to-digital conversion pin a/D SPI CS, a FAN terminal FAN, a temperature terminal TEMP, a DISPLAY terminal DISPLAY, a data input terminal SPI1-MOSI, a data output terminal SPI1-MOSO, a clock terminal I2C-SCL, a data terminal I2C-SDA, and a clock control terminal SPI 1-SCK.

In the embodiment of the present application, the clock terminal I2C-SCL is a serial clock pin of the I2C bus, and the data terminal I2C-SDA is a serial data pin of the I2C bus. It will be appreciated that a typical I2C bus has two signal lines, one for the bi-directional data line SDA and the other for the clock line SCL. The clock end I2C-SCL and the data end I2C-SDA of the control chip U3 are electrically connected with the port circuit 10 through an I2C bus, and signal transmission is carried out with the port circuit 10 through the clock end I2C-SCL and the data end I2C-SDA.

In the embodiment of the present application, the digital-to-analog conversion pin D/a out is electrically connected to the bleeding circuit 20, and is used to output a control signal to the bleeding circuit 20, so as to control the bleeding circuit 20, and thus the bleeding circuit 20 regulates the energy bleeding of the device under test 200.

The analog-to-digital conversion pin a/D SPI CS is electrically connected to the acquisition circuit 30 and is configured to output an acquisition signal to the acquisition circuit 30, and the acquisition circuit 30 acquires test data of voltage and/or current changing with time in a discharging process of the element to be tested 200 according to the acquisition signal.

The data input end SPI1-MOSI is electrically connected to the data input end DIN of the acquisition circuit 30, and the data output end SPI1-MOSO is electrically connected to the data output end DOUT of the acquisition circuit 30 to receive data acquired by the acquisition circuit 30.

The clock control end SPI1-SCK is electrically connected with the acquisition circuit 30.

The FAN end FAN is electrically connected with the interface of the FAN and used for outputting a pulse modulation signal to control the rotating speed of the FAN.

The temperature end TEMP is electrically connected with an interface of the temperature sensor and used for receiving temperature information of the radiating fin sensed by the temperature sensor and further feeding back and adjusting the rotating speed of the fan.

The DISPLAY terminal DISPLAY is electrically connected with the interface of the DISPLAY screen.

The first power terminal VDD1 is electrically connected to the first power source V1 for receiving power supplied from the first power source V1.

In one possible implementation, a filter circuit is disposed between the first power supply terminal VDD1 and the first power supply V1, and the filter circuit is used to filter the power supply voltage output by the first power supply V1 for the purpose of suppressing interference. The filter circuit may include a plurality of capacitors, as shown in fig. 2, including a fifth capacitor C5, a sixth capacitor C6, and a seventh capacitor C7, and it is understood that in the embodiment of the present application, the plurality of capacitors have a filtering function.

The first ground GND1 of the control chip U3 is grounded.

Referring to fig. 3A to 3B, in the embodiment of the present application, the bleeder circuit 20 includes a first operational amplifier U1, a second operational amplifier U2, a first electronic switch D1, a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, and a ninth resistor R9.

In the embodiment of the present application, the positive power supply terminal V + of the first operational amplifier U1 is electrically connected to the second power supply V2. The negative power supply terminal V-of the first operational amplifier U1 is grounded. The positive input end of the first operational amplifier U1 is electrically connected with the digital-to-analog conversion pin D/A _ out of the control chip U3 through the third resistor R3. One end of the fourth resistor R4 is electrically connected between the third resistor R3 and the digital-to-analog conversion pin D/a _ out. The other end of the fourth resistor R4 is grounded.

An inverting input terminal of the first operational amplifier U1 is electrically connected to one end of the first resistor R1, the other end of the first resistor R1 is electrically connected to one end of the seventh resistor R7, one end of the first capacitor C1, one end of the second capacitor C2, one end of the eighth resistor R8, and an output terminal of the second operational amplifier U2, and the other end of the seventh resistor R7 is grounded. The other end of the first capacitor C1 is grounded. The output end of the first operational amplifier U1 is electrically connected to the second end of the first electronic switch D1 through the second resistor R2.

An output end of the second operational amplifier U2 is electrically connected to one end of the second capacitor C2, one end of the eighth resistor R8, one end of the seventh resistor R7, and the other end of the first resistor R1, and an inverting input end of the second operational amplifier U2 is electrically connected to the other end of the eighth resistor R8, the other end of the second capacitor C2, and one end of the fifth resistor R5. The other end of the fifth resistor R5 is grounded. The positive input end of the second operational amplifier U2 is electrically connected to the first end of the first electronic switch D1 through the sixth resistor R6.

In the embodiment of the present application, the second operational amplifier U2 is utilized to form a local negative feedback loop, and the negative feedback loop controls the magnitude of the discharge voltage or the discharge current of the device under test 200, so as to further realize the control of the power-down speed, so that the whole discharge loop 20 of the device under test 200 is safer and more reliable.

The first terminal of the first electronic switch D1 is also grounded through the ninth resistor R9, and the first terminal of the first electronic switch D1 is also electrically connected to the acquisition circuit 30. The third terminal of the first electronic switch D1 is electrically connected to the positive terminal of the port circuit 10.

In the embodiment of the present application, referring to fig. 3C, the bleeder circuit 20 further includes a second electronic switch D2 and a tenth resistor R10. The first terminal of the second electronic switch D2 is grounded through the tenth resistor R10. The first end of the second electronic switch D2 is also electrically connected to the positive input terminal of the second operational amplifier U2 through the sixth resistor R6. The second end of the second electronic switch D2 is electrically connected with the output end of the first operational amplifier U1 through the second resistor R2. The third terminal of the second electronic switch D2 is electrically connected to the positive terminal of the port circuit 10.

In the embodiment of the present application, the first electronic switch D1 and the ninth resistor R9 may form a first group of discharge circuits, the second electronic switch D2 and the tenth resistor R10 may form a second group of discharge circuits, and the second group of discharge circuits are arranged to implement redundancy, so that the working pressure of a single discharge circuit can be effectively reduced. The element to be tested can be connected to any group of discharge circuits according to the requirement.

In the embodiment of the present application, referring to fig. 3D, the power testing apparatus 100 further includes an eleventh resistor R11 and a light emitting diode D3. One end of the eleventh resistor R11 is electrically connected to the positive terminal of the port circuit 10. The other end of the eleventh resistor R11 is grounded through the light emitting diode D3. The connection condition of the device under test 200 can be detected by the light emitting diode D3. For example, when the device under test 200 is connected to the port circuit 10, the light emitting diode D3 is turned on to output an optical signal.

In the embodiment of the present application, the first electronic switch D1 and the second electronic switch D2 can be both N-type fets. For example, the second terminals of the first electronic switch D1 and the second electronic switch D2 are gates of fets, the first terminals of the first electronic switch D1 and the second electronic switch D2 are sources of fets, and the third terminals of the first electronic switch D1 and the second electronic switch D2 are drains of fets.

It can be understood that, in the embodiment of the present application, the control circuit 40 can output a control signal to control the conduction of the first electronic switch D1, and the element under test 200 is electrically connected to the loop of the first electronic switch D1, and is grounded through the first electronic switch D1 to discharge energy. The bleeder circuit 20 adjusts the voltage between the source and the drain of the first electronic switch D1 through the negative feedback of the second operational amplifier U2, so as to adjust the current between the source and the drain of the first electronic switch D1, thereby realizing the constant current discharge of the device under test 200.

Referring to fig. 4, in the embodiment of the present application, the acquisition circuit 30 includes an acquisition chip U4. The acquisition chip U4 includes a second power terminal VDD2, a second ground terminal GND2, a sampling terminal CS, a data input terminal DIN, a data output terminal DOUT, a clock terminal SCLK, an analog input first terminal AIN0, and an analog input second terminal AIN 1.

The second power terminal VDD2 of the acquisition chip U4 is electrically connected with the first power supply V1. In one possible implementation manner, the circuit further includes a third capacitor C3, one end of the third capacitor C3 is electrically connected to the second power terminal VDD2 and the first power source V1, and the other end of the third capacitor C3 is grounded.

In one possible implementation manner, the circuit further includes a fourth capacitor C4, one end of the fourth capacitor C4 is electrically connected to the second power terminal VDD2 and the first power source V1, and the other end of the fourth capacitor C4 is grounded. The third capacitor C3 and the fourth capacitor C4 are used for filtering the power voltage outputted by the first power source V1 to achieve the purpose of suppressing interference.

The second ground GND2 of the collection chip U4 is grounded.

The sampling end CS is electrically connected with an analog-to-digital conversion pin A/D SPI CS of the control chip U3. The sampling terminal CS is electrically connected to the first power source V1 through a seventeenth resistor R17.

The data input end DIN is electrically connected with the data input end SPI1-MOSI of the control chip U3, and the data output end DOUT is electrically connected with the data output end SPI1-MISO of the control chip U3. The data input terminal DIN is electrically connected to the first power source V1 through the fifteenth resistor R15, and the data output terminal DOUT is electrically connected to the first power source V1 through the sixteenth resistor R16. The clock terminal SCLK is electrically connected with the clock control terminal SPI1-SCK of the control chip U3, and the clock terminal SCLK is electrically connected with the first power supply V1 through a fourteenth resistor R14.

The analog input first terminal AIN0 is electrically connected to the positive terminal of the port circuit 10 through a twelfth resistor R12. One end of the eighteenth resistor R18 is electrically connected between the twelfth resistor R12 and the first end AIN0 of the analog input, and the other end of the eighteenth resistor R18 is grounded.

The analog input second terminal AIN1 is electrically connected to one end of the thirteenth resistor R13 and one end of the nineteenth resistor R19, and the other end of the thirteenth resistor R13 is electrically connected to the first end of the second electronic switch D2 or the first end of the first electronic switch D1. One end of the nineteenth resistor R19 is electrically connected to one end of the thirteenth resistor R13, and the other end of the nineteenth resistor R19 is grounded.

It is understood that in the embodiment of the present application, the collecting circuit 30 collects the test data and transmits the test data to the host computer through the communication module 50 for remote monitoring. When the user needs to continuously reduce the voltage of the device 200 to be tested or the external environment changes, or the test data of the device 200 to be tested reaches a preset value, the control chip U3 outputs a second control signal or a third control signal to the bleeding circuit 20 according to the test data acquired by the acquisition circuit 30, so as to regulate the stable energy bleeding of the device 200 to be tested through the bleeding circuit 20, for example, when the discharge voltage of the device 200 to be tested is reduced from the preset voltage to half of the preset voltage acquired by the acquisition circuit 30, the control circuit 40 outputs a fourth control signal to the bleeding circuit 20.

It is understood that in the embodiment of the present application, after the device under test 200 is electrically connected to the port circuit 10, the control chip U3 outputs a control signal to the bleeding circuit 20 according to a preset control logic, for example, the bleeding circuit 20 controls the voltage of the device under test 200 to decrease to a predetermined voltage according to the control signal. It can be understood that the process of the voltage flowing through the device under test 200 dropping to the preset voltage is the process of the energy discharge of the device under test 200, in this process, test data can be generated, the acquisition circuit 30 acquires the test data, the acquisition circuit 30 transmits the acquired test data to the control circuit 40, and the control circuit 40 can know the relevant performance condition of the device under test 200 by analyzing the test data. When the energy of the element 200 to be tested is released to a certain preset condition, for example, the discharge voltage of the element 200 to be tested reaches a preset threshold, the acquisition circuit 30 outputs the acquired test data of the element 200 to be tested to the control circuit 40, and the control circuit 40 outputs a second control signal to the release circuit 20 after judging that the discharge voltage of the element 200 to be tested reaches the preset voltage by analyzing the test data acquired by the acquisition circuit 30, so as to control the release circuit 20 to adjust the energy release process of the element 200 to be tested.

In one possible implementation, the initial adjustment of the bleeding circuit 20 is to internally set a small-scale energy bleeding to the element under test 200, and the subsequent adjustment is to externally set a large-scale energy bleeding to the element under test 200.

As shown in fig. 5, in the embodiment of the present application, the port circuit 10 may be a socket, and includes a first interface 11, a second interface 12, a third interface 13, and a fourth interface 14.

The first interface 11 is electrically connected to the positive electrode of the device under test 200, the fourth interface 14 is electrically connected to the negative electrode of the device under test 200, and the device under test 200 is connected to the port circuit 10 through the first interface 11 and the fourth interface 14.

It is understood that the first interface 11 is electrically connected to the analog input first terminal AIN0 of the acquisition circuit 30, one terminal of the eleventh resistor R11, the third terminal of the first electronic switch D1 or the third terminal of the second electronic switch D2. The fourth interface 14 is connected to ground.

Illustratively, the device also comprises a first MOS transistor Q1 and a twentieth resistor R20. The second interface 12 is electrically connected to a first end of a first MOS transistor Q1, and a third end of the first MOS transistor Q1 is electrically connected to one end of a twentieth resistor R20 and the data terminal I2C-SDA of the control chip U3. It can be understood that the third terminal of the first MOS transistor Q1 is electrically connected to the control chip U3 through an I2C serial data bus I2C 2-SDA. The second end of the first MOS transistor Q1 is electrically connected to a third power source V3. The other end of the twentieth resistor R20 is electrically connected to the first power source V1.

Exemplarily, the device further comprises a second MOS transistor Q2 and a twenty-first resistor R21. One end of the third interface 13 is electrically connected to the first end of the second MOS transistor Q2, and the third end of the Q2 of the second MOS transistor is electrically connected to the clock end I2C-SCL of the control chip U3. It can be understood that the third terminal of the second MOS transistor Q2 is electrically connected to the control chip U3 through an I2C serial bus I2C 2-SCL. One end of the twenty-first resistor R21 and the clock end I2C2-SCL of the control chip U3. The second end of the second MOS transistor Q2 is electrically connected to a third power source V3. The other end of the twenty-first resistor R21 is electrically connected with the first power supply V1.

In the embodiment of the present application, the first MOS transistor Q1 and the second MOS transistor Q2 are both N-type MOS transistors. The first end of the first MOS transistor Q1 and the first end of the second MOS transistor Q2 are source electrodes of MOS transistors. The second ends of the first MOS transistor Q1 and the second MOS transistor Q2 are gates of the MOS transistors. The third ends of the first MOS transistor Q1 and the second MOS transistor Q2 are the drains of the MOS transistors. Of course, the first MOS transistor Q1 and the second MOS transistor Q2 may be P-type MOS transistors according to requirements, which is not specifically limited in this application.

In the embodiment of the present application, the rated voltage of the battery may be 2.5V. In the embodiment of the present application, the turn-on voltage of the first MOS transistor Q1 and the second MOS transistor Q2 is less than 2.5V.

In the embodiment of the present application, two ends of the device under test 200 are electrically connected to the first interface 11 and the fourth interface 14 of the port circuit 10, respectively. The control chip U3 outputs a first control signal to the bleeding circuit 20 through the digital-to-analog conversion pin D/a out, the first operational amplifier U1 of the bleeding circuit 20 controls the conduction of the first electronic switch D1 according to the first control signal, and then adjusts and controls the voltage between the drain and the source of the first electronic switch D1 in real time through the first electronic switch D1, and the second operational amplifier U2 feeds back the energy bleeding of the device under test 200, thereby adjusting the control of the first operational amplifier U1 on the first electronic switch D1. A local negative feedback circuit of the second operational amplifier U2 is formed to collect the current signal output by the first electronic switch D1 or the second electronic switch D2 into the second operational amplifier U2 and feed back to the first operational amplifier U1 in real time, so as to form a closed-loop feedback self-adjusting system. The required bleed current can be output via the first electronic switch D1 and the second electronic switch D2.

Under the control of the bleeding loop 20, the device under test 200 performs fast bleeding of energy through the ninth resistor R9 or the tenth resistor R10, and generates test data when the device under test 200 bleeds energy. The collecting circuit 30 collects the test data and transmits the test data to the control circuit 40 and the communication module 50, and the control circuit 40 outputs a second control signal to the bleeding circuit 20 according to the test data. The communication module 50 outputs the test data to the host computer, so as to realize remote test of the device 200 to be tested.

It can be understood that, in the embodiment of the present application, the process of discharging the device under test 200 through the ninth resistor R9 and/or the tenth resistor R10 is a process of discharging energy of the device under test 200.

In the embodiment of the present application, the battery discharge performance of the device under test 200 during a single cycle is tested by the control of the control chip U3, that is, the output characteristic of the device under test 200 during the process from full charging to emptying is controlled by the control signal output by the control chip U3, and the stable discharge of the energy of the device under test 200 in the power supply testing apparatus 100 is ensured.

In the embodiment of the present application, the power testing apparatus 100 further includes a communication module 50. The communication module 50 is communicatively coupled to a host (not shown). By the host, the test data can be remotely displayed and the power supply test device 100 is controlled to stably discharge the energy to the element to be tested 200. In the embodiment of the present application, the power supply testing apparatus 100 can be remotely operated in various ways, for example, compared with the conventional apparatus: the unmanned remote test can be realized, and the more convenient communication forms such as wireless communication, Bluetooth communication and the like can be expanded by reserving a special communication interface according to the use condition.

In the embodiment of the present application, please refer to fig. 6, a memory storing a computer program and a processor capable of calling the computer program are disposed in the host, and the host can construct an intelligent report graph of a test result formed by time, voltage and current by remotely monitoring the collected test data. Fig. 6 shows an intelligent report graph of the test result formed by the voltage, which is more intuitive, faster, and more effective in responding to the test status and trend during operation, and can assist technicians to perform more technical and data analysis remotely. In the embodiment of the present application, the power testing apparatus 100 can provide comprehensive protection against overvoltage, overcurrent, and high temperature, so as to prevent damage to the device and the device under test caused by carelessness or misoperation during use, increase safety in testing experiments, and protect safety of technicians and device materials more comprehensively.

In the embodiment of the present application, the bleeding loop 20 in the power testing apparatus 100 constructs the accurate feedback control circuit 40 to adjust the discharge parameters and control the current, the multi-channel design meets the discharge requirement of small volume and large current, the high-precision detection circuit is used to achieve the precision acquisition requirement, and the special designed fast feedback circuit is used to achieve the fast feedback control, thereby ensuring the high-precision discharge control.

It can be understood that, in the embodiment of the present application, the power supply testing apparatus 100 may be applied to various power supply testing verifications of a smart phone, such as verifying a battery discharge performance, verifying a stability of a power supply, verifying a battery charge-discharge aging test, and the like.

In the embodiment of the application, the power supply testing device 100 accelerates data analysis of the battery and the power supply, further improves the detection speed, is easy to operate and convenient to use, and can quickly find and correspondingly solve the problem of the mobile phone power supply.

Although the present application has been described in detail with reference to the preferred embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the spirit and scope of the present application. Those skilled in the art can make other changes and the like in the design of the present application within the spirit of the present application as long as they do not depart from the technical effects of the present application. Such variations are intended to be included within the scope of this disclosure as claimed.

Claims

1. A power supply testing device is characterized by comprising a port circuit, a discharge loop and a control circuit;

the port circuit is used for electrically connecting a component to be tested;

2. The power supply testing device of claim 1, further comprising an acquisition circuit;

3. The power supply test device of claim 2, wherein: the power supply testing device further comprises a power supply module, and the power supply module is used for providing electric energy for the power supply testing device.

4. The power supply test device of claim 2, wherein: the power supply testing device further comprises a communication module, the communication module is electrically connected with the acquisition circuit and is in communication connection with a host, and the communication module is used for sending the test data to the host so that the host can remotely monitor the energy release of the element to be tested.

5. The power supply test device of claim 2, wherein: the control circuit comprises a control chip, and the control chip outputs the first control signal to the bleeding loop; the control chip outputs a second control signal to the discharge loop according to the test data acquired by the acquisition circuit.

6. The power supply test device of claim 5, wherein: the bleeder circuit comprises a first operational amplifier, a first capacitor, a second capacitor, a first resistor, a second resistor, a third resistor, a fourth resistor, a second operational amplifier, a fifth resistor, a sixth resistor, a seventh resistor and an eighth resistor;

the other end of the seventh resistor is grounded;

the other end of the first capacitor is grounded;

the other end of the fourth resistor is grounded;

the other end of the fifth resistor is grounded.

7. The power supply test device of claim 6, wherein: the bleeder circuit also comprises a first electronic switch and a ninth resistor;

8. The power supply test device of claim 7, wherein: the bleeder circuit further comprises a second electronic switch and a tenth resistor;

9. The power supply test device of claim 8, wherein: the LED further comprises an eleventh resistor and a light emitting diode;

10. The power supply test device of claim 9, wherein: the port circuit comprises a first interface, a second interface, a third interface and a fourth interface;

the second interface is electrically connected with the control chip;

the third interface is electrically connected with the control chip;