CN114235368B - Device and method for testing opening and closing of cover - Google Patents
Device and method for testing opening and closing of cover Download PDFInfo
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- CN114235368B CN114235368B CN202111552687.6A CN202111552687A CN114235368B CN 114235368 B CN114235368 B CN 114235368B CN 202111552687 A CN202111552687 A CN 202111552687A CN 114235368 B CN114235368 B CN 114235368B
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- 238000012360 testing method Methods 0.000 title claims abstract description 506
- 238000000034 method Methods 0.000 title claims abstract description 35
- 230000006870 function Effects 0.000 claims description 28
- 238000003825 pressing Methods 0.000 claims description 17
- 230000002159 abnormal effect Effects 0.000 claims description 16
- 238000004590 computer program Methods 0.000 claims description 13
- 238000003384 imaging method Methods 0.000 claims description 11
- 238000010998 test method Methods 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 7
- 230000000007 visual effect Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 9
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- 235000001892 vitamin D2 Nutrition 0.000 description 6
- 238000004458 analytical method Methods 0.000 description 5
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- 239000000203 mixture Substances 0.000 description 3
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- 238000011056 performance test Methods 0.000 description 3
- 238000004445 quantitative analysis Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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Abstract
The application provides a cover opening and closing testing device and method, through setting up program control box, testboard and plectrum device, and set up pressure unit and camera unit on the testboard, and utilize program control box according to test command control pressure unit on individual testboard to at least one device that awaits measuring and apply the test force of uncapping, or control L plectrum in the plectrum device to at least one device that awaits measuring, and the camera unit on L testboard of control shooting at least one device that awaits measuring under uncapping test force or cover opening test force's image, can realize the automated test of waiting to await measuring the device cover opening and closing, avoid using the time cost that the manual test leads to and the condition that the cost of labor is higher, and, use test command to exert uncapping test force and cover opening test force to the device that awaits measuring, compared with the mode of manual test, can also realize accurate control, help improving the degree of opening and closing test's degree of accuracy.
Description
Technical Field
The application relates to the field of testing, in particular to a cover opening and closing testing device and method.
Background
With the gradual increase of the functional demands of users on intelligent wearable devices, watch-type intelligent wearable devices with a cover opening and closing function are becoming more and more popular. In the watch type intelligent wearing equipment, after a user can open the watch cover, some small objects (such as headphones and the like) are stored in the watch type intelligent wearing equipment, and the small objects are taken out for use when needed, so that the dilemma that the user is difficult to store the small objects at present is greatly solved.
At present, before the intelligent wearable device with the cover opening and closing function leaves the factory, performance test is usually required to be carried out on the intelligent wearable device, and the performance test at least comprises test on the cover opening and closing function of the intelligent wearable device. However, the existing performance test of opening and closing the cover is mainly completed manually, specifically, the fixed opening and closing actions are manually executed, and the opening and closing angles of the opening and closing are judged in a mode of observing by human eyes. However, the manual test mode is usually inaccurate, so that the same actions of opening and closing the cover can not be ensured, uncertainty of human eyes in observation exists, and further, larger errors of test results can be caused, and the improvement of the test accuracy is not facilitated.
Accordingly, there is a need for a cover opening/closing testing device for improving the accuracy of cover opening/closing testing.
Disclosure of Invention
The application provides a cover opening and closing testing device and a method, which are used for improving the accuracy of cover opening and closing testing.
In a first aspect, the present application provides a cover opening and closing testing device, comprising: the device comprises a program control box, at least one test bench arranged side by side on the upper surface of the program control box, and a pulling piece device positioned above the at least one test bench; the device comprises at least one test bench, a pressing unit, a camera unit and a display unit, wherein the at least one test bench is used for accommodating at least one device to be tested, each test bench is provided with the pressing unit and the camera unit, and the visual field range of the camera unit comprises a space for accommodating the device to be tested on the test bench; the plectrum device comprises a height adjusting bracket fixed on two sides of the program control box, a transverse adjusting bracket rod erected on the height adjusting bracket and at least one plectrum arranged on the transverse adjusting bracket, the at least one plectrum corresponds to the position of the at least one test bench one by one, and the plectrum device moves the at least one plectrum to the position corresponding to the at least one device to be tested through the height adjusting bracket and the transverse adjusting bracket rod; the program control box is used for receiving the test command, controlling the pressing unit on the test tables to apply the cover opening test force to at least one device to be tested according to the test command, or controlling the L poking sheets in the poking sheet device to apply the cover opening test force to at least one device to be tested, and controlling the camera shooting units on the L test tables to shoot images of the at least one device to be tested under the cover opening test force or the cover opening test force.
Through the mode, the program control box, the test board and the poking piece device are arranged, automatic test of opening and closing the cover of the device to be tested is achieved, the situation that time cost and labor cost are high due to manual test is avoided, and the test command is used for applying the cover opening test force and the cover closing test force to the device to be tested.
One possible implementation manner, the test command is an uncovering test command sent by the control device; the program control box is used for generating a first control signal containing P uncovering test forces according to the uncovering test command and sending the first control signal to a pressing unit in at least one test bench, wherein P is a positive integer; the pressure applying unit in the at least one test bench is used for applying P uncovering test forces to the device to be tested according to the first control signal and sending a shooting instruction to the shooting unit; and the camera unit in the at least one test bench is used for shooting a first image of the uncapping angle of the device to be tested accommodated in the at least one test bench under each uncapping test force and sending the first image to the control equipment.
Through the mode, the test results of a plurality of different uncapping test forces are relied on, whether the uncapping function is normal can be more comprehensively and accurately determined, moreover, the first image of the uncapping angle under each uncapping test force is acquired, the analysis of the next step is further facilitated by the aid of the acquired images, the uncapping angle is prevented from being observed by eyes, and the test accuracy is further improved. Therefore, the quantitative analysis of the uncovering performance of the device to be tested can be realized by the test mode, the test error is reduced, and the uncovering test accuracy is effectively improved.
One possible implementation manner, the test command is a capping test command sent by the control device; the program control box is also used for generating a second control signal containing M cover closing test forces according to the cover closing test command and sending the second control signal to at least one plectrum, wherein M is a positive integer; the at least one poking piece is used for applying M cover closing test forces to the device to be tested according to the second control signal and sending an image shooting instruction to the image shooting unit; and the camera unit in the at least one test bench is used for shooting a second image of the closing angle of the device to be tested accommodated in the at least one test bench under each closing test force and sending the second image to the control equipment.
Through the mode, the test results of a plurality of different closing test forces are relied on, whether the closing function is normal can be more comprehensively and accurately determined, and the second image of the closing angle under each closing test force is collected, so that the analysis of the next step is further facilitated by relying on the collected images, the observation of the closing angle by human eyes is avoided, and the test accuracy is further improved. Therefore, the quantitative analysis of the closing performance of the device to be tested can be realized by the test mode, the test error is reduced, and the closing test accuracy is effectively improved.
In a second aspect, the present application provides a method of testing a cover opening and closing, suitable for use in a control device, the control device being connected to a cover opening and closing testing apparatus according to any one of claims 1 to 4; the method comprises the following steps: sending a test command to the cover opening and closing test device, wherein the test command is used for indicating to apply cover opening test force or cover closing test force to the device to be tested; receiving an image returned by the cover opening and closing testing device, wherein the image is an image containing the cover opening angle of the device to be tested under the cover opening testing force or an image containing the cover closing angle under the cover closing testing force; and judging whether the cover opening angle or the cover closing angle of the device to be tested meets the requirement according to the image, if so, determining that the cover opening and closing functions of the device to be tested are normal, and if not, determining that the cover opening and closing functions of the device to be tested are normal.
One possible implementation manner, the test command is an uncap test command, where the uncap test command is used to instruct to apply P uncap test forces to the device to be tested, and the image is a first image, where the first image is a first image including an uncap angle of the device to be tested under each of the P uncap test forces; judging whether the cover opening angle or the closing angle of the device to be tested meets the requirement according to the image, comprising: according to the first image corresponding to each uncovering test force, determining coordinate values of buckling points in the device to be tested in a preset coordinate system, wherein the buckling points are position points which are marked on the device to be tested in advance and are used for indicating the opening and closing angles of the device to be tested; calculating a first angle of the uncapping angle of the device to be tested according to the coordinate value of the buckling point, and calculating the uncapping angle of the device to be tested under the uncapping test force according to the first angle; when the difference value of the opening angle and the theoretical opening angle corresponding to the opening test force is not larger than a first threshold value, determining that each device to be tested is opened normally under the opening test force, and when the difference value of the opening angle and the theoretical opening angle corresponding to the opening test force is larger than the first threshold value, determining that the device to be tested is opened abnormally under the opening test force; if at least one uncapping test force with abnormal uncapping exists in the P uncapping test forces, determining that the uncapping angle of the device to be tested does not meet the requirement.
One possible implementation manner, the test command is a capping test command, the capping test command is used for indicating that M capping test forces are applied to the device to be tested, the image is a second image, and the second image is a second image containing a capping angle of the device to be tested under each of the M capping test forces; judging whether the cover opening angle or the closing angle of the device to be tested meets the requirement according to the image, comprising: determining coordinate values of buckling points in a preset coordinate system of the device to be tested according to a second image corresponding to each covering test force, wherein the buckling points are position points which are marked on the device to be tested in advance and used for indicating the opening and closing angles of the device to be tested, and calculating a second angle of the covering angles of the device to be tested according to the coordinate values of the buckling points; calculating the closing angle of the device to be tested under the closing test force according to the second angle, determining that each device to be tested is normally closed under the closing test force when the difference value between the closing angle and the theoretical closing angle corresponding to the closing test force is not larger than a second threshold value, and determining that the device to be tested is abnormal under the closing test force when the difference value between the closing angle and the theoretical closing angle corresponding to the closing test force is larger than the second threshold value; if at least one abnormal closing test force exists in the M closing test forces, determining that the closing angle of the device to be tested does not meet the requirement.
A possible implementation manner, the method further includes: according to P first angles of the P cover opening test forces and the P first angles of the P cover opening test forces, a cover opening test curve is established, the slope of tangent lines of P points corresponding to the P cover opening test forces in the cover opening test curve is calculated, the cover opening test force with the slope of 0 is determined to be the maximum cover opening test force, and the maximum cover opening test force indicates the maximum cover opening test force which can be born by the device to be tested in use.
A possible implementation manner, the method further includes: according to M second angles corresponding to the M closing test forces and the M closing test forces, a closing test curve is established, tangential slopes of M points corresponding to the M closing test forces in the closing test curve are calculated, the closing test force with the slope of 0 is determined to be the maximum closing test force, and the maximum closing test force indicates the maximum closing test force which can be born by a product to be tested in use.
In a third aspect, the present application provides a computer readable storage medium storing a computer program which, when executed, performs any of the methods of the first aspect described above.
In a fourth aspect, the present application provides a computing device comprising: a memory for storing program instructions; and a processor for calling program instructions stored in the memory and executing the method according to the obtained program.
In a fifth aspect, the present application provides a computer program product for implementing a method as in any one of the designs of the first aspect above, when the computer program product is run on a processor.
The advantages of the second to fifth aspects may be specifically referred to the advantages achieved by any of the designs of the first aspect, and will not be described in detail herein.
Drawings
Fig. 1 schematically illustrates an open-close cover testing device provided in an embodiment of the present application;
FIG. 2 schematically illustrates a device under test according to an embodiment of the present application;
fig. 3 is a schematic flow chart illustrating a method for testing a cover opening and closing test according to an embodiment of the present application;
fig. 4 schematically illustrates a flowchart of an uncapping test method provided in an embodiment of the present application;
fig. 5 schematically illustrates a flowchart of a capping test method provided in an embodiment of the present application;
FIG. 6 schematically illustrates an open cover test curve provided by an embodiment of the present application;
fig. 7 schematically illustrates a schematic diagram of a capping test according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail below with reference to the accompanying drawings, and it is apparent that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Fig. 1 schematically illustrates a structural diagram of an open-close cover testing device according to an embodiment of the present application, and as shown in fig. 1, the open-close cover testing device includes a program control box 101, a test bench 109 disposed side by side on an upper surface of the program control box 101, and a paddle 105 device disposed above the test bench 109. Wherein at least one device under test 110 may be placed on each test station 109. For example, in fig. 1, a total of 3 test stations 109 are disposed on the upper surface of the program control box 101, and one device under test 110 is placed on each test station 109.
In this embodiment of the present application, the device to be tested may be a device with a cover opening and closing function, and may specifically refer to a wearable device with a cover opening and closing function, such as a wearable watch with a foldable watch cover. For example, fig. 2 schematically illustrates a structure of a wearable watch with an openable and closable cover, as shown in fig. 2, in which a receiving space 1102 is provided in the watch, and a screen 1101 of the watch can be opened upwards so as to receive articles such as a bluetooth headset placed therein by a user.
With continued reference to FIG. 1, each of the components of the test apparatus will be described in detail below:
Each test stand 109 is provided with a pressing unit 107 and an imaging unit 103, and the imaging unit 103 may be installed at a side of the pressing unit 107 opposite to the device under test so that its field of view can contain the entire space on the test stand 109 for accommodating the device under test 110;
the plectrum 105 device includes the altitude mixture control support of fixing in program control case 101 both sides, and the altitude mixture control support is erect a horizontal adjustment cradling piece on the altitude mixture control support, is provided with plectrum 105 on the horizontal adjustment cradling piece, and plectrum 105's position and the position one-to-one of testboard 109. Illustratively, as shown in fig. 1, 3 paddles 105 are disposed on the horizontal support frame rod 104, and the 3 paddles 105 are respectively in one-to-one correspondence with the 3 test stations 109, and the 3 paddles 105 can be moved to positions corresponding to the device under test 110 by adjusting the height adjustment support and the horizontal adjustment support frame rod;
the program control box 101 may receive a test command, which may specifically be sent by a control device as illustrated in fig. 1, for example, a personal computer (Personal Computer, PC) device of a user or a terminal device of a user, and the program control box 101 controls the pressing unit 107 on the test stand 109 to apply the cover opening test force to the device under test 110 or controls the paddle 105 in the paddle 105 device to apply the cover closing test force to the device under test 110 according to the test command and controls the image capturing unit 103 on the test stand 109 to capture an image of the device under test 110 under the cover opening test force or the cover closing test force. The application positions and the application directions of the cover opening test force and the cover closing test force may be predetermined by a person skilled in the art according to the function keys of the device to be tested, for example, in an example, as shown in fig. 2, the cover opening test force corresponds to a force F1, and the cover closing test force corresponds to a force F2.
In one possible implementation, a fixing clamp 106 may be further provided at a position where the test stand 109 contacts the device under test 110, the fixing clamp 106 including a base and a movable member, the base being fixed to the test stand 109, the movable member being movable in a left-right direction as shown in the drawing so as to fix the device under test 110 on the test stand 109. Illustratively, as shown in fig. 1, the movable members of the fixed jigs 106 on the three test stations 109 may be U-shaped, and the size of the openings thereof may be adjusted so as to clamp the openable cover wristwatch shown in fig. 1. In addition, the movable part of the fixing clamp can be in other shapes, such as a ring shape, a snap-fit type, and the like, and is not particularly limited.
The following is a brief description of the process of testing the device under test 110 using the open/close cover test device:
uncapping test procedure
Step one, the control apparatus transmits an uncovering test command to the program control box 101.
Step two, the program control box 101 generates a first control signal containing P cover opening test forces according to the cover opening test command, and sends the first control signal to the pressure applying unit 107 in the test bench 109, where P is a positive integer.
In step three, the pressing unit 107 in the test stand 109 applies P cover opening test forces of different magnitudes to the device under test 110 according to the first control signal, and sends an image capturing instruction to the image capturing unit 103.
In step four, the image capturing unit 103 receives the image capturing instruction, captures a first image of the uncapping angle of the device under test 110 accommodated in the test stand 109 under each uncapping test force according to the image capturing instruction, and sends the first image to the control apparatus.
Step five, the control device determines whether the cover opening function of the device under test 110 is normal according to the first image.
Closing cover test process
Step one, the control device sends a capping test command to the program control box 101.
Step two, the program control box 101 generates a second control signal containing M capping test forces according to the capping test command, and sends the second control signal to the at least one pulling sheet 105, where M is a positive integer.
In step three, the paddle 105 applies M cover closing test forces with different magnitudes to the device under test 110 according to the second control signal, and sends an image capturing instruction to the image capturing unit 103.
In step four, the image capturing unit 103 may receive an image capturing instruction, capture a second image of the capping angle of the device under test 110 accommodated in the test stand 109 under each capping test force according to the image capturing instruction, and send the second image to the control apparatus.
Step five, the control device determines whether the capping function of the device under test 110 is normal according to the second image.
In the above embodiment, the program control box, the test stand and the pulling piece device are provided, the pressing unit and the image capturing unit 103 are provided on the test stand, and the program control box is used to control the pressing unit on the test stand to apply the cover opening test force to the at least one device under test 110 according to the test command, or control the L pulling pieces in the pulling piece device to apply the cover opening test force to the at least one device under test 110, and control the image capturing unit 103 on the L test stand to capture the image of the at least one device under test 110 under the cover opening test force or the cover opening test force. The automatic test of opening and closing the cover of the device to be tested 110 is realized, the situation that the time cost and the labor cost are high due to the manual test is avoided, and the test command is used for applying the cover opening test force and the cover closing test force to the device to be tested 110.
Based on the open-close cover testing device illustrated in fig. 1, the embodiment of the application further provides an open-close cover testing method, which is suitable for a control device, such as the control device illustrated in fig. 1, and the control device is connected with the open-close cover testing device in fig. 1. The specific implementation process of the cover opening and closing test method is described in detail below.
Fig. 3 is a schematic flow chart illustrating a method for testing a cover opening and closing test according to an embodiment of the present application, as shown in fig. 3, the flow includes the following steps:
step 301, the control device sends a test command to the cover opening and closing test device, where the test command is used to instruct the device to be tested 110 to apply a cover opening test force or a cover closing test force;
step 302, the control device receives an image returned by the cover opening and closing testing device, where the image is an image containing the cover opening angle of the device under test 110 under the cover opening test force or an image containing the cover closing angle under the cover closing test force;
step 303, the control device determines whether the cover opening angle or the cover closing angle of the device under test 110 meets the requirement according to the image, if yes, step 304 is executed, and if not, step 305 is executed.
In step 304, the control device determines that the cover opening and closing function of the device under test 110 is normal.
In step 305, the control device determines that the cover opening and closing function of the device under test 110 is abnormal.
By the mode, the control equipment can control the application of the cover opening test force or the cover closing test force to the device to be tested, errors caused by the manual application of the test force are avoided, and the image of the opening and closing angle under each opening and closing test force is collected, so that the analysis of the next step is facilitated by depending on the collected image, the observation of the opening and closing angle by human eyes is avoided, and the test accuracy is further improved.
The following describes the test procedure in detail from the perspective of the open test and the close test, respectively.
Uncapping test procedure
Fig. 4 is a schematic flow chart illustrating an uncapping test method according to an embodiment of the present application, as shown in fig. 4, where the flow includes the following steps:
in step 401, the control device sends an open-cover test command to the open-cover test device, where the open-cover test command indicates that P open-cover test forces are applied to the device under test 110.
Illustratively, the control apparatus first sends an open test command to the program control box 101, and after the program control device receives the open test command, the program control box 101 generates a first control signal containing P open test forces according to the open test command, and controls the pressing unit 107 to apply the open test force to the device under test 110. The first control signal comprises the number P of the uncovering test forces, the magnitude of each uncovering test force and the execution times.
Optionally, the magnitude of the P lid opening test forces may range from 1N to 1000N, and the magnitude of P may range from 100 to 1000. Preferably, p=1000, that is, 1000 different door test forces are applied to the device under test 110 within the range of door test forces. Also, illustratively, the first door test force may be 1N in magnitude, the second door test force may be 2N in magnitude, the third door test force may be 3N … …, the 1000 th door test force may be 1000N in magnitude, and each door test force of a different magnitude may be applied multiple times, for example 10 times each door test force of a different magnitude.
In step 402, the control apparatus receives a first image of an open lid angle of the device under test 110 at each of the P open lid test forces.
Illustratively, the pressing unit 107 applies the decap test force to the device under test 110 according to the number P of the decap test forces, the magnitude of each of the decap test forces, and the number of executions in the first control signal, and after each application of the decap test force, sends an image capturing instruction to the image capturing unit 103, and the image capturing unit 103 may receive the image capturing instruction, capture a first image of the decap angle of the device under test 110 accommodated in the test stand 109 under each of the decap test forces according to the image capturing instruction, and send the first image to the control apparatus. For example, assuming that 1000 different door test forces are applied to the device under test 110, each door test force being applied 10 times, the pressing unit 107 will transmit 10000 image capturing instructions to the image capturing unit 103 in total during the whole door test, and the image capturing unit 103 can capture 10000 first images of the door angle of the device under test 110 under the door test force and transmit the 10000 first images to the control apparatus.
In step 403, the control device determines coordinate values of the snap-fit points in the device under test 110 in a preset coordinate system according to the first image corresponding to each of the cover opening test forces.
The fastening point may be a position point pre-marked on the device under test 110 for indicating the opening and closing angle of the device under test 110, for example, may be a point Q in fig. 2. In order to accurately represent the position change condition of the buckling point, in the embodiment of the application, a coordinate system shown in fig. 2 is also preset on the test bench, the O point is the origin of the coordinate system, and the coordinate value of the Q point in the coordinate system changes along with the magnitude of the uncapping angle.
In step 404, the control device calculates a first angle of the uncapping angle of the device under test 110 according to the coordinate value of the buckling point, and calculates the uncapping angle of the device under test 110 under the uncapping test force according to the first angle.
Still further to the example in step 402, assuming that the control apparatus receives 10000 first images, the control apparatus may calculate a first angle of the uncapping angle in each image according to the Q-point coordinate values in the 10000 images, and calculate the magnitude of the uncapping angle in each image according to the first angle. Since 10 times of the door test force is applied per door test force, the control apparatus can average the magnitudes of the door angles calculated under the 10 times of the door test force of the same magnitude as the magnitudes of the door angles under the door test force.
In step 405, the control device determines whether a difference between the magnitude of the uncapping angle and the magnitude of the theoretical uncapping angle corresponding to the uncapping test force is greater than a first threshold. If yes, go to step 406; if not, step 407 is performed.
Step 406, the control device determines that the cover of each device under test 110 is normal under the cover test force;
in step 407, the control apparatus determines that the device under test 110 is abnormal in uncapping under this uncapping test force.
In one possible implementation, one uncapping test force corresponds to a theoretical uncapping angle, and the theoretical uncapping angle corresponding to each uncapping test force is set according to an industry standard, for example, may be set by a person skilled in the art according to experience, or may also be obtained through experimental verification, and is not limited in particular. For example, in one possible case, the theoretical uncapping angle corresponding to the uncapping test force of 1N is 5 degrees, the theoretical uncapping angle corresponding to the uncapping test force of 2N is 7 degrees, the theoretical uncapping angle corresponding to the uncapping test force of 3N is 10 degrees, and the theoretical uncapping angle corresponding to the uncapping test force of … …, 1000N is 180 degrees.
Alternatively, the first threshold may be 5 degrees to 15 degrees. Preferably, the first threshold may be set to 10 degrees. Thus, assuming that when the door test force is 3N, the average value of the detected door angles is 25 degrees, the difference between the theoretical door angles corresponding to the door test force of 3N and the theoretical door angles of 10 degrees is 15 degrees, and is greater than the first threshold value by 10 degrees, it is determined that the device under test 110 is abnormal in door under the door test force. Otherwise, if the average value of the detected uncapping angles is 15 degrees when the uncapping test force is 3N, the difference value of the theoretical uncapping angle corresponding to the uncapping test force of 3N is 5 degrees and is not greater than the first threshold value of 10 degrees, and at this time, whether the difference value of the uncapping angles under other uncapping test forces and the theoretical uncapping angle corresponding to the uncapping test force is greater than the first threshold value can be judged.
Further, if all the differences in the cover opening angles are not greater than the first threshold, it may be determined that the cover opening angle of the device under test 110 meets the requirement. Otherwise, if the difference between the magnitude of the uncapping angle and the magnitude of the theoretical uncapping angle corresponding to the uncapping test force is greater than the first threshold, it is determined that the uncapping angle of the device under test 110 does not meet the requirement. Therefore, whether the cover opening function is normal or not can be comprehensively and accurately determined, further analysis of the next step is facilitated depending on the acquired image, the observation of the cover opening angle by human eyes is avoided, and the accuracy of the test is further improved.
Closing cover test process
In the cover closing test process, the control equipment sends a test command to the cover opening and closing test device to be a cover closing test command. Moreover, before the cover closing test, the device under test 110 may be initialized, so that the angle of the device under test 110 is opened to a certain size, and the device under test 110 may be opened to 150 degrees for example.
Fig. 5 schematically illustrates a flowchart of a capping test method provided in an embodiment of the present application, as shown in fig. 5, where the flowchart includes the following steps:
in step 501, the control device sends a cover closing test command to the cover opening test device, where the cover closing test command indicates that M cover closing test forces are applied to the device under test 110.
Illustratively, the control device first sends a capping test command to the program control box 101, and after the program control device receives the capping test command, the program control box 101 generates a second control signal containing M capping test forces according to the capping test command, and controls the pressing unit 107 to apply the capping test force to the device under test 110. The second control signal includes the number M of the capping test forces, the magnitude of each capping test force and the execution times. The range of the M cover closing test forces and the number of applications may refer to the P cover closing test forces, and will not be described herein.
In step 502, the control device receives a second image of the capping angle of the device under test 110 under each of the M capping test forces.
Illustratively, the pressing unit 107 applies the capping test force to the device under test 110 according to the number M of capping test forces in the second control signal, the magnitude of each capping test force, and the number of executions. And sends an imaging instruction to the imaging unit 103, and each time the capping test force is applied, sends an imaging instruction to the imaging unit 103, and the imaging unit 103 may receive the imaging instruction, and according to the imaging instruction, take a second image of the capping angle of the device under test 110 accommodated in the test stand 109 under each capping test force, and send the second image to the control device. The manner in which the image capturing unit 103 captures the second image may refer to the manner in which the image capturing unit 103 captures the first image, which is not described herein.
In step 503, the control device determines coordinate values of the snap-fit point Q in the device under test 110 in a preset coordinate system according to the second image corresponding to each snap-fit test force.
In step 504, the control device calculates a second angle of the capping angle of the device under test 110 according to the coordinate value of the buckling point, and calculates the capping angle of the device under test 110 under the capping test force according to the second angle. The method for calculating the cover opening angle of the device under test 110 under the cover opening test force is referred to the method for calculating the cover opening in step 404, and will not be described herein.
In step 505, the control device determines whether a difference between the size of the closing angle and the theoretical closing angle corresponding to the closing test force is greater than a second threshold. If yes, go to step 506; if not, go to step 507.
In step 506, the control device determines that each device under test 110 is properly capped under the capping test force.
In step 507, the control device determines that the device under test 110 is abnormal under this capping test force.
In one possible implementation, one closing test force corresponds to a theoretical closing angle, for example, the theoretical closing angle corresponding to a closing test force of 1N is 125 degrees, the theoretical closing angle corresponding to a closing test force of 2N is 100 degrees, and the theoretical closing angle corresponding to a closing test force of 3N is 80 degrees … … 1000N is 0 degrees.
Alternatively, the second threshold may be 5 degrees to 15 degrees, and preferably, the second threshold is set to 10 degrees. Assuming that when the closing test force is 3N, the average value of the measured closing angles is 110 degrees, the difference of 10 degrees of the theoretical closing angles corresponding to the closing test force of 3N is 15 degrees, and the difference is greater than the second threshold value by 10 degrees, then determining that the device 110 to be tested is abnormal in closing under the closing test force; if the average value of the measured closing angles is 120 degrees and the difference between the theoretical closing angles corresponding to the closing test force of 3N and the theoretical closing angles corresponding to the closing test force of 3N is 5 degrees and is not greater than the second threshold value by 10 degrees, then it is determined whether the difference between the theoretical closing angles corresponding to the closing test force and the closing angles corresponding to the closing test force of other magnitudes is greater than the second threshold value, and in one possible implementation, if the difference is not greater than the second threshold value, then it is determined that the closing angle of the device 110 to be tested meets the requirements. As long as the difference between the size of one closing angle and the theoretical closing angle corresponding to the closing test force is greater than the second threshold, it is determined that the closing angle of the device under test 110 does not meet the requirement, and only when the difference between the sizes of all closing angles and the theoretical closing angle corresponding to the closing test force is not greater than the second threshold, it is determined that the closing angle of the device under test 110 meets the requirement. Therefore, whether the closing function is normal can be comprehensively and accurately determined, further analysis of the next step is facilitated depending on the collected image, the observation of the closing angle by human eyes is avoided, and the accuracy of the test is further improved.
In one possible implementation manner, the cover opening test curve may be further established according to P first angles corresponding to the P cover opening test forces and the P cover opening test forces, and a slope of tangent lines of P points corresponding to the P cover opening test forces in the cover opening test curve may be calculated, where the cover opening test force with the slope of 0 is determined as a maximum cover opening test force, and the maximum cover opening test force indicates a maximum cover opening force that the device 110 to be tested can bear when in use. For example, fig. 6 exemplarily illustrates a schematic diagram of an uncapping test curve provided in an embodiment of the present application, as shown in fig. 6, an x axis corresponds to an uncapping test force, and a y axis corresponds to a first angle. As can be seen from fig. 6, when the door test force reaches 800N, the first angle reaches 150 degrees, and at this time, the door test force is increased again, and the first angle still remains at 150 degrees without further change, so 800N can be determined as the maximum door force that can be borne by the device under test 110. That is, in the product instruction manual corresponding to the device to be tested, the force can be marked, so that the user is reminded not to use the force exceeding 800N to open the cover, and damage is avoided.
In one possible implementation manner, a closing test curve may be established according to M second angles corresponding to the M closing test forces and M closing test forces, and a slope of a tangent line of M points corresponding to the M closing test forces in the closing test curve may be calculated, where the closing test force with the slope of 0 is determined as a maximum closing test force, and the maximum closing test force indicates a maximum closing test force that the device 110 to be tested can bear when in use. Fig. 7 schematically illustrates a schematic view of a capping test curve provided in an embodiment of the present application, where, as shown in fig. 7, an x-axis corresponds to a capping test force, and a y-axis corresponds to a second angle. As can be seen from fig. 7, when the capping test force reaches 800N, the second angle reaches 0 degrees, and at this time, the capping test force is increased again, and the second angle still remains at 0 degrees and does not change any further, so 800N can be determined as the maximum capping test force that the device under test 110 can withstand. That is, in the product usage manual corresponding to the device to be tested, the force can be marked, so that the user is reminded not to use the force exceeding 800N to close the cover, and damage is avoided.
Based on the same technical concept, the embodiment of the invention further provides a computing device, which comprises: a memory for storing program instructions;
and a processor for calling program instructions stored in the memory and executing the method as illustrated in fig. 4, 5 or 6 according to the obtained program.
Based on the same technical idea, an embodiment of the invention also provides a computer-readable storage medium, which when run on a processor, implements the method as illustrated in fig. 4, 5 or 6.
Based on the same technical idea, embodiments of the present invention also provide a computer program product implementing the method as illustrated in fig. 4, 5 and 6 when said computer program product is run on a processor.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various modifications and variations can be made in the present application without departing from the spirit or scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims and the equivalents thereof, the present application is intended to cover such modifications and variations.
Claims (10)
1. A cover opening and closing test device, comprising:
the device comprises a program control box, at least one test bench arranged side by side on the upper surface of the program control box, and a pulling piece device positioned above the at least one test bench;
the device comprises at least one test bench, a pressure applying unit, a camera unit and a control unit, wherein the at least one test bench is used for accommodating at least one device to be tested, each test bench is provided with the pressure applying unit and the camera unit, and the visual field range of the camera unit comprises a space for accommodating the device to be tested on the test bench;
The plectrum device comprises a height adjusting bracket fixed on two sides of the program control box, a transverse adjusting bracket rod erected on the height adjusting bracket and at least one plectrum arranged on the transverse adjusting bracket, the at least one plectrum corresponds to the position of the at least one test bench one by one, and the plectrum device moves the at least one plectrum to the position corresponding to the at least one device to be tested through the height adjusting bracket and the transverse adjusting bracket rod;
the program control box is used for receiving a test command, controlling the pressing units on the L test tables to apply an uncovering test force to the at least one device to be tested according to the test command, or controlling the L poking sheets in the poking sheet device to apply an uncovering test force to the at least one device to be tested, and controlling the camera units on the L test tables to shoot images of the at least one device to be tested under the uncovering test force or the uncovering test force, wherein L is a positive integer;
calculating the uncapping angle of the device to be tested under the uncapping test force according to the image, if the difference value of the uncapping angle and the theoretical uncapping angle corresponding to the uncapping test force is smaller than or equal to a first threshold value, determining that the uncapping function of the device to be tested is normal, and if the difference value of the uncapping angle and the theoretical uncapping angle corresponding to the uncapping test force is larger than the first threshold value, determining that the uncapping function of the device to be tested is abnormal;
Or calculating a closing angle of the device to be tested under the closing test force according to the image, if the difference value of the closing angle and the theoretical closing angle corresponding to the closing test force is smaller than or equal to a second threshold value, determining that the closing function of the device to be tested is normal, and if the difference value of the closing angle and the theoretical closing angle corresponding to the closing test force is larger than the second threshold value, determining that the closing function of the device to be tested is abnormal.
2. The apparatus of claim 1, wherein the test command is an open cover test command sent by a control device;
the program control box is used for generating a first control signal containing P uncovering test forces according to the uncovering test command and sending the first control signal to a pressing unit in the at least one test bench, wherein P is a positive integer;
the pressure applying unit in the at least one test bench is used for applying the P uncovering test forces to the device to be tested according to the first control signal and sending an imaging instruction to the imaging unit;
the image capturing unit in the at least one test bench is used for capturing a first image of the uncapping angle of the device to be tested accommodated in the at least one test bench under each uncapping test force, and sending the first image to the control equipment.
3. The apparatus of claim 1, wherein the test command is a capping test command sent by the control device;
the program control box is further used for generating a second control signal containing M cover closing test forces according to the cover closing test command and sending the second control signal to the at least one plectrum, wherein M is a positive integer;
the at least one shifting piece is used for applying the M cover closing test forces to the device to be tested according to the second control signal and sending an image capturing instruction to the image capturing unit;
and the image pick-up unit in the at least one test bench is used for picking up a second image of the closing angle of the device to be tested accommodated in the at least one test bench under each closing test force and sending the second image to the control equipment.
4. A cover opening and closing test method, characterized by being applied to a control device connected to the cover opening and closing test apparatus according to any one of claims 1 to 3; the method comprises the following steps:
sending a test command to the cover opening and closing test device, wherein the test command is used for indicating to apply cover opening test force or cover closing test force to the device to be tested;
receiving an image returned by the cover opening and closing testing device, wherein the image comprises an image of a cover opening angle of the device to be tested under the cover opening testing force or an image of a cover closing angle under the cover closing testing force;
Calculating the uncapping angle of the device to be tested under the uncapping test force according to the image, and if the difference value of the uncapping angle and the theoretical uncapping angle corresponding to the uncapping test force is smaller than or equal to a first threshold value, determining that the uncapping function of the device to be tested is normal; if the difference value of the uncovering angle and the theoretical uncovering angle corresponding to the uncovering test force is larger than a first threshold value, determining that the uncovering function of the device to be tested is abnormal;
calculating a closing angle of the device to be tested under the closing test force according to the image, and if the difference value of the closing angle and the theoretical closing angle corresponding to the closing test force is smaller than or equal to a second threshold value, determining that the closing function of the device to be tested is normal; and if the difference value of the closing angle and the theoretical closing angle corresponding to the closing test force is larger than a second threshold value, determining that the closing function of the device to be tested is abnormal.
5. The method of claim 4, wherein the test command is an open test command for indicating that P open test forces are applied to the device under test, the image is a first image that includes an open angle of the device under test at each of the P open test forces;
Calculating the uncapping angle of the device to be tested under the uncapping test force according to the image, including:
determining coordinate values of buckling points in the device to be tested in a preset coordinate system according to a first image corresponding to each uncovering test force, wherein the buckling points are position points which are marked on the device to be tested in advance and are used for indicating the opening and closing angles of the device to be tested; calculating a first angle of the uncapping angle of the device to be tested according to the coordinate value of the buckling point, and calculating the uncapping angle of the device to be tested under the uncapping test force according to the first angle; when the difference value of the opening angle and the theoretical opening angle corresponding to the opening test force is not larger than a first threshold value, determining that the opening of each device to be tested is normal under the opening test force, and when the difference value of the opening angle and the theoretical opening angle corresponding to the opening test force is larger than the first threshold value, determining that the device to be tested is abnormal under the opening test force;
and if at least one uncapping test force with abnormal uncapping exists in the P uncapping test forces, determining that the uncapping angle of the device to be tested does not meet the requirement.
6. The method of claim 4, wherein the test command is a capping test command that indicates that M capping test forces are applied to the device under test, the image being a second image that includes a capping angle of the device under test at each of the M capping test forces;
the calculating the capping angle of the device to be tested under the capping test force according to the image comprises the following steps:
determining coordinate values of buckling points in a preset coordinate system in the device to be tested according to a second image corresponding to each covering test force, wherein the buckling points are position points which are marked on the device to be tested in advance and are used for indicating the opening and closing angles of the device to be tested, and calculating a second angle of the covering angles of the device to be tested according to the coordinate values of the buckling points; calculating the closing angle of the device to be tested under the closing test force according to the second angle, determining that each device to be tested is normally closed under the closing test force when the difference value between the closing angle and the theoretical closing angle corresponding to the closing test force is not larger than a second threshold value, and determining that the device to be tested is abnormal under the closing test force when the difference value between the closing angle and the theoretical closing angle corresponding to the closing test force is larger than the second threshold value;
And if at least one cover closing abnormal cover closing test force exists in the M cover closing test forces, determining that the cover closing angle of the device to be tested does not meet the requirement.
7. The method of claim 5, wherein the method further comprises:
according to the P first angles of the P cover opening test forces and the P first angles of the P cover opening test forces, a cover opening test curve is established, the slope of tangent lines of P points corresponding to the P cover opening test forces in the cover opening test curve is calculated, the cover opening test force with the slope of 0 is determined to be the maximum cover opening test force, and the maximum cover opening test force indicates the maximum cover opening test force which can be born by the device to be tested in use.
8. The method of claim 6, wherein the method further comprises:
according to the M second angles of the M cover closing test forces and the M second angles of the M cover closing test forces, a cover closing test curve is established, tangential slopes of M points corresponding to the M cover closing test forces in the cover closing test curve are calculated, the cover closing test force with the slope of 0 is determined to be the maximum cover closing test force, and the maximum cover closing test force indicates the maximum cover closing test force which can be born by the device to be tested in use.
9. A computer readable storage medium, characterized in that the computer readable storage medium stores a computer program which, when executed, performs the method according to any of claims 5 to 8.
10. A computing device, comprising:
a memory for storing program instructions;
a processor for invoking program instructions stored in said memory to perform the method of any of claims 5 to 8 in accordance with the obtained program.
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