CN114235368A - Device and method for testing opening and closing cover - Google Patents
Device and method for testing opening and closing cover Download PDFInfo
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- CN114235368A CN114235368A CN202111552687.6A CN202111552687A CN114235368A CN 114235368 A CN114235368 A CN 114235368A CN 202111552687 A CN202111552687 A CN 202111552687A CN 114235368 A CN114235368 A CN 114235368A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M13/00—Testing of machine parts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Abstract
The application provides a device and a method for testing the opening and closing of a cover, which can realize the automatic testing of the opening and closing of the cover of a device to be tested by arranging a program control box, a test board and a shifting plate device, arranging a pressing unit and a camera unit on the test board, controlling the pressing unit on the test board to apply an opening and closing test force to at least one device to be tested by utilizing the program control box according to a test command, or controlling L shifting plates in the shifting plate device to apply a cover closing test force to at least one device to be tested, and controlling the camera units on the L test boards to shoot images of at least one device to be tested under the opening and closing test force, thereby avoiding the conditions of higher time cost and labor cost caused by manual testing, and applying the opening and closing test force to the device to be tested by utilizing the test command, compared with the manual testing mode, and the accuracy control can be realized, and the accuracy of the opening and closing degree test is improved.
Description
Technical Field
The application relates to the field of testing, in particular to a device and a method for testing an opening and closing cover.
Background
Along with the gradual increase of the functional demand of users to intelligent wearing equipment, watch type intelligent wearing equipment with open and close lid function becomes more and more popular. In this kind of watch class intelligence wearing equipment, the user can open its table lid back, leaves some little article (such as earphone etc.) inside, waits to take out the use inside again when needing, and this kind has greatly solved the dilemma that the user is difficult to deposit small-size object at present stage.
At present, before the intelligent wearable device with the cover opening and closing function leaves a factory, performance tests are generally required to be performed on the intelligent wearable device, and the performance tests at least comprise tests on the opening and closing function of the meter cover. However, the existing performance test of opening and closing the cover is mainly completed manually, specifically, fixed actions of opening and closing the cover are performed manually, and the size of the angle of opening and closing the cover is judged by means of observation of human eyes. However, the manual testing method is usually inaccurate, it cannot be guaranteed that the actions of opening and closing the cover are the same every time, and uncertainty of human eye observation exists, which may cause a large error in the testing result, and is not favorable for improving the testing accuracy.
Therefore, there is a need for an open/close cover testing device to improve the accuracy of the open/close cover testing.
Disclosure of Invention
The application provides a device and a method for testing an opening and closing cover, which are used for improving the accuracy of the opening and closing cover test.
In a first aspect, the present application provides an opening and closing cover testing apparatus, comprising: the test device comprises a program control box, at least one test bench arranged on the upper surface of the program control box side by side, and a plectrum device positioned above the at least one test bench; the device comprises at least one test board, a pressure applying unit, a camera shooting unit and a control unit, wherein the at least one test board is used for accommodating at least one device to be tested, each test board is provided with the pressure applying unit and the camera shooting unit, and the visual field range of the camera shooting unit comprises a space for accommodating the device to be tested on the test board; the plectrum device comprises height adjusting supports fixed on two sides of the program control box, a transverse adjusting support rod erected on the height adjusting supports and at least one plectrum arranged on the transverse adjusting supports, the at least one plectrum corresponds to the position of the at least one test board one by one, and the plectrum device moves the at least one plectrum to the position corresponding to the at least one device to be tested through the height adjusting supports and the transverse adjusting support rod; and the program control box is used for receiving the test command, controlling the pressure applying units on the test benches to apply the uncovering test force to at least one device to be tested according to the test command, or controlling the L poking sheets in the poking sheet device to apply the cover closing test force to at least one device to be tested, and controlling the camera units on the L test benches to shoot images of at least one device to be tested under the uncovering test force or the cover closing test force.
In this way, set up program control case, testboard and plectrum device, realized the automatic test of the device to be tested opening and shutting lid, avoided using the manual test and the time cost and the higher condition of cost of labor that lead to, and, use test command to exert the test power of uncapping and close the lid test power to the device to be tested, compare in the mode of manual test, can also realize accurate control, help improving the degree of accuracy of the test of the degree of opening and shutting.
In one possible implementation manner, the test command is an uncovering test command sent by the control equipment; the program control box is used for generating first control signals containing P uncapping test forces according to the uncapping test command and sending the first control signals to the pressure applying units in at least one test bench, wherein P is a positive integer; the pressure applying unit in the at least one test bench is used for applying P cover opening test forces to the device to be tested according to the first control signal and sending a camera shooting instruction to the camera shooting unit; and the camera unit in the at least one test bench is used for shooting a first image of the uncapping angle of the device to be tested accommodated in the at least one test bench under each uncapping test force, and sending the first image to the control equipment.
Through the mode, depending on the test result of a plurality of different uncapping test forces, can more comprehensively accurately confirm whether the function of uncapping is normal, moreover, through gathering the first image of every uncapping test force under the angle of uncapping, still help relying on the image of gathering to carry out further analysis, avoid the human eye to observe the angle of uncapping, further improve the accuracy of test. Therefore, the test mode can realize quantitative analysis of the uncovering performance of the device to be tested, reduce test errors and effectively improve the uncovering test accuracy.
In one possible implementation manner, the test command is a cover closing test command sent by the control device; the program control box is also used for generating a second control signal containing M cover closing test forces according to the cover closing test command and sending the second control signal to at least one shifting piece, wherein M is a positive integer; the at least one shifting piece is used for applying M cover closing test forces to the device to be tested according to the second control signal and sending a camera shooting instruction to the camera shooting unit; and the camera shooting unit in the at least one test bench is used for shooting a second image of the cover closing angle of the device to be tested accommodated in the at least one test bench under each cover closing test force, and sending the second image to the control equipment.
Through the mode, whether the cover closing function is normal can be determined more comprehensively and accurately depending on the test results of the cover closing test force of a plurality of differences, and in addition, through acquiring the second image of the cover closing angle under each cover closing test force, the method is also helpful for carrying out the later analysis depending on the acquired image, the cover closing angle is prevented from being observed by human eyes, and the test accuracy is further improved. Therefore, the test mode can realize quantitative analysis of the cover closing performance of the device to be tested, reduce test errors and effectively improve the cover closing test accuracy.
In a second aspect, the present application provides a method for testing an opening and closing cover, which is applied to a control device, wherein the control device is connected to the opening and closing cover testing apparatus of any one of claims 1 to 4; the method comprises the following steps: sending a test command to the cover opening and closing test device, wherein the test command is used for indicating that an opening test force or a closing test force is applied to the device to be tested; receiving an image returned by the cover opening and closing testing device, wherein the image comprises an image of the cover opening angle of the device to be tested under the cover opening testing force or an image of the cover closing angle of the device to be tested under the cover closing testing force; and judging whether the cover opening angle or the cover closing angle of the device to be tested meets the requirements or not according to the image, if so, determining that the cover opening and closing function of the device to be tested is normal, and if not, determining that the cover opening and closing function of the device to be tested is normal.
One possible implementation manner is that the test command is an uncovering test command, the uncovering test command is used for indicating that P uncovering test forces are applied to the device to be tested, the image is a first image, and the first image is a first image containing an uncovering angle of the device to be tested under each uncovering test force in the P uncovering test forces; according to the image, judge whether the device under test's angle of uncapping or angle of closing satisfies the requirement, include: determining a coordinate value of a buckling point in the device to be tested in a preset coordinate system according to the first image corresponding to each uncovering test force, wherein the buckling point is a position point which is marked on the device to be tested in advance and used for indicating the opening and closing angle of the device to be tested; calculating a first angle of the cover opening angle of the device to be tested according to the coordinate value of the buckling point, and calculating the size of the cover opening angle of the device to be tested under the cover opening testing force according to the first angle; when the difference value between the opening angle and the theoretical opening angle corresponding to the opening testing force is larger than the first threshold value, determining that the opening of each device to be tested is normal under the opening testing force; and if at least one abnormal uncovering test force exists in the P uncovering test forces, determining that the uncovering angle of the device to be tested does not meet the requirement.
One possible implementation manner is that the test command is a cover closing test command, the cover closing test command is used for indicating that M cover closing test forces are applied to the device to be tested, the image is a second image, and the second image is a second image containing a cover closing angle of the device to be tested under each cover closing test force in the M cover closing test forces; according to the image, judge whether the device under test's angle of uncapping or angle of closing satisfies the requirement, include: determining a coordinate value of a buckling point in the device to be tested in a preset coordinate system according to a second image corresponding to each cover closing test force, wherein the buckling point is a position point which is marked on the device to be tested in advance and used for indicating the opening and closing angle of the device to be tested, and calculating a second angle of the cover closing angle of the device to be tested according to the coordinate value of the buckling point; calculating the size of the cover closing angle of the device to be tested under the cover closing test force according to the second angle, determining that the cover closing of each device to be tested is normal under the cover closing test force when the difference value between the size of the cover closing angle and the theoretical cover closing size corresponding to the cover closing test force is not larger than a second threshold value, and determining that the cover closing of the device to be tested is abnormal under the cover closing test force when the difference value between the size of the cover closing angle and the theoretical cover closing size corresponding to the cover closing test force is larger than the second threshold value; and if at least one abnormal cover closing test force exists in the M cover closing test forces, determining that the cover closing angle of the device to be tested does not meet the requirement.
In one possible implementation, the method further includes: according to P first angles corresponding to P uncapping test forces and P uncapping test forces, an uncapping test curve is established, the slope of a tangent line of P points corresponding to the P uncapping test forces in the uncapping test curve is calculated, the uncapping test force when the slope is 0 is determined as the maximum uncapping test force, and the maximum uncapping test force indicates the maximum uncapping test force which can be borne by the device to be tested when the device to be tested is used.
In one possible implementation, the method further includes: and establishing a cover closing test curve according to the M second angles corresponding to the M cover closing test forces and the M cover closing test forces, calculating the tangent slopes of M points corresponding to the M cover closing test forces in the cover closing test curve, determining the cover closing test force with the slope of 0 as the maximum cover closing test force, and indicating the maximum cover closing test force capable of bearing the product to be tested when the product to be tested is used by the maximum cover closing test force.
In a third aspect, the present application provides a computer-readable storage medium storing a computer program which, when executed, performs the method of any one of the above first aspects.
In a fourth aspect, the present application provides a computing device comprising: a memory for storing program instructions; and the processor is used for calling the program instructions stored in the memory and executing the method in any one of the designs of the first aspect according to the obtained program.
In a fifth aspect, the present application provides a computer program product for implementing the method as designed in any one of the first aspects above when the computer program product is run on a processor.
The advantageous effects of the second aspect to the fifth aspect can be found in any design of the first aspect, and are not described in detail herein.
Drawings
Fig. 1 schematically illustrates a schematic diagram of an open-close cover testing device provided by an embodiment of the present application;
fig. 2 schematically illustrates a device under test according to an embodiment of the present application;
fig. 3 schematically illustrates a flow chart of a method for testing an opening/closing cover according to an embodiment of the present application;
fig. 4 is a schematic flow chart illustrating a decap testing method according to an embodiment of the present disclosure;
fig. 5 schematically illustrates a flow chart of a cover closing test method provided by an embodiment of the present application;
fig. 6 is a schematic diagram illustrating an uncap test curve provided by an embodiment of the present application;
fig. 7 exemplarily shows a schematic diagram of a lid closing test curve provided by an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 schematically illustrates a structural diagram of an opening and closing lid testing apparatus provided in an embodiment of the present application, and as shown in fig. 1, the opening and closing lid testing apparatus includes a program control box 101, a testing table 109 arranged side by side on an upper surface of the program control box 101, and a paddle 105 device arranged above the testing table 109. At least one dut 110 can be placed on each test station 109. For example, the upper surface of the program control box 101 in fig. 1 is provided with 3 test stations 109, and one device under test 110 is placed on each test station 109.
In this application embodiment, the device under test can be the device that has the lid function that opens and shuts, specifically can refer to the wearable equipment that has the lid function that opens and shuts, like the wearable wrist-watch that the table lid can open and shut. For example, fig. 2 exemplarily shows a structural schematic view of a wearable watch with a openable and closable watch cover according to an embodiment of the present application, as shown in fig. 2, a receiving space 1102 is formed inside the watch, and a screen 1101 of the watch can be opened upward so as to receive an article such as a bluetooth headset inside which a user places.
With continued reference to FIG. 1, each of the components of the test apparatus will now be described in detail:
each test bench 109 is provided with a pressure applying unit 107 and a camera unit 103, and the camera unit 103 can be arranged on one side of the pressure applying unit 107 relative to the device under test, so that the visual field range of the camera unit can include the whole space for accommodating the device under test 110 on the test bench 109;
the shifting piece 105 device comprises height adjusting supports fixed on two sides of the program control box 101, a transverse adjusting support rod is erected on each height adjusting support, shifting pieces 105 are arranged on the transverse adjusting support rods, and the positions of the shifting pieces 105 correspond to the positions of the test tables 109 one by one. Exemplarily, as shown in fig. 1, 3 shifting pieces 105 are arranged on the transverse support rod 104, and the 3 shifting pieces 105 correspond to the 3 test stations 109 one by one, and the 3 shifting pieces 105 can be moved to the position corresponding to the device under test 110 by adjusting the height adjusting support and the transverse adjusting support rod;
the program control box 101 may receive a test command, which may be specifically sent by a control device as illustrated in fig. 1, where the control device may be, for example, a Personal Computer (PC) device of a user or a terminal device of the user, and the program control box 101 controls the pressure applying unit 107 on the test bench 109 to apply the opening test force to the device under test 110 or controls the dial 105 in the dial 105 device to apply the closing test force to the device under test 110 according to the test command, and controls the camera unit 103 on the test bench 109 to capture an image of the device under test 110 under the opening test force or the closing test force. The application positions and the application directions of the open-lid testing force and the close-lid testing force can be predetermined by those skilled in the art according to the function keys of the device under test, for example, as shown in fig. 2, the open-lid testing force corresponds to a force F1, and the close-lid testing force corresponds to a force F2.
In one possible implementation, a fixing clamp 106 may be further disposed at a position where the testing platform 109 contacts the device under test 110, and the fixing clamp 106 includes a base fixed on the testing platform 109 and a movable member movable in the left-right direction as shown in the figure so as to fix the device under test 110 on the testing platform 109. For example, as shown in fig. 1, the movable members of the fixing clamps 106 on the three test stations 109 may be U-shaped, and the size of the opening thereof may be adjusted to clamp the openable-lid wristwatch shown in fig. 1. In addition, the movable part of the fixing clamp can also be in other shapes, such as a circular ring type, a buckling type and the like, and is not limited specifically.
The process of testing the dut 110 using the lid opening and closing test apparatus will be briefly described as follows:
decap test procedure
Step one, the control device sends an uncovering test command to the program control box 101.
And step two, the program control box 101 generates a first control signal containing P uncapping test forces according to the uncapping test command, and sends the first control signal to the pressure applying unit 107 in the test bench 109, wherein P is a positive integer.
And step three, the pressing unit 107 in the test bench 109 applies P cover opening test forces with different sizes to the device under test 110 according to the first control signal, and sends a camera shooting instruction to the camera shooting unit 103.
Step four, the camera unit 103 receives the camera instruction, shoots a first image of the uncapping angle of the device under test 110 accommodated in the test bench 109 under each uncapping test force according to the camera instruction, and sends the first image to the control device.
And step five, the control equipment determines whether the uncovering function of the device under test 110 is normal or not according to the first image.
Closure test procedure
Step one, the control device sends a cover closing test command to the program control box 101.
And step two, the program control box 101 generates a second control signal containing M cover closing test forces according to the cover closing test command, and sends the second control signal to at least one shifting piece 105, wherein M is a positive integer.
Step three, the pick-up 105 applies M cover closing test forces with different sizes to the device under test 110 according to the second control signal, and sends a camera shooting instruction to the camera shooting unit 103.
Step four, the camera unit 103 may receive the camera instruction, shoot a second image of the cover closing angle of the device under test 110 accommodated in the test bench 109 under each cover closing test force according to the camera instruction, and send the second image to the control device.
And step five, the control equipment determines whether the cover closing function of the device to be tested 110 is normal or not according to the second image.
In the above embodiment, the program control box, the test board and the pick-up unit are provided, the pressure applying unit and the camera unit 103 are provided on the test board, and the program control box is used to control the pressure applying units on the test boards to apply the opening cover test force to at least one device under test 110 according to the test command, or control the L pick-up units in the pick-up unit to apply the closing cover test force to at least one device under test 110, and control the camera units 103 on the L test boards to shoot the image of at least one device under test 110 under the opening cover test force or the closing cover test force. This scheme has realized the automatic test of opening and shutting the lid to device under test 110, avoids using the manual test and the higher condition of time cost and cost of labor that leads to, and, uses test command to exert the test force of uncapping and close the lid test force to device under test 110, compares in the mode of manual test, can also realize accurate control, helps improving the degree of accuracy of the test of the degree of opening and shutting.
Based on the above opening and closing cover testing device illustrated in fig. 1, an embodiment of the present application further provides an opening and closing cover testing method, where the method is applied to a control device, such as the control device illustrated in fig. 1, and the control device is connected to the opening and closing cover testing device illustrated in fig. 1. The following describes in detail a specific implementation of the method for testing the opening and closing lid.
Fig. 3 exemplarily shows a schematic flow chart of a method for testing an opening/closing cover according to an embodiment of the present application, and as shown in fig. 3, the flow chart includes the following steps:
in step 303, the control device determines whether the opening angle or the closing angle of the device under test 110 meets the requirement according to the image, if so, step 304 is executed, and if not, step 305 is executed.
In step 304, the control device determines that the cover opening and closing function of the device under test 110 is normal.
In step 305, the control device determines that the opening and closing cover of the device under test 110 is abnormal in function.
In this way, the control equipment can control to exert the test power of uncapping or exert the test power of closing the lid to the device under test, avoids the artifical error of exerting the test power and bringing, and, gathers the image of the angle of opening and closing the lid under every test power of opening and closing, still helps relying on the image of gathering to carry out further analysis, avoids the people's eye to observe the angle of opening and closing the lid, further improves the accuracy of test.
The test procedure is described in detail below from the perspective of the open-lid test and the close-lid test, respectively.
Decap test procedure
Fig. 4 is a schematic flow chart illustrating a decap testing method according to an embodiment of the present application, where as shown in fig. 4, the flow chart includes the following steps:
in step 401, the control device sends an uncapping test command to the open-close lid test apparatus, where the uncapping test command indicates that P uncapping test forces are applied to the device under test 110.
Illustratively, the control device first sends a decap test command to the program control box 101, and after the control device receives the decap test command, the program control box 101 generates a first control signal containing P decap test forces according to the decap test command, and controls the pressure applying unit 107 to apply the decap test force to the device under test 110. The first control signal contains the number P of the uncapping test forces, the size of each uncapping test force and the execution times.
Optionally, the range of the P uncapping test forces may be 1N to 1000N, and the size of P may be 100 to 1000. Preferably, P is 1000, that is, 1000 decap test forces of different magnitudes are applied to the device under test 110 within the magnitude range of the decap test force. And, for example, the first uncapping test force may be 1N, the second uncapping test force may be 2N, the third uncapping test force may be 3N … …, the 1000 th uncapping test force may be 1000N, and each uncapping test force of different size may be applied for a plurality of times, for example, each uncapping test force of different size is applied for 10 times.
At step 402, the control apparatus receives a first image of the open lid angle of the device under test 110 at each of the P open lid test forces.
For example, the pressing unit 107 applies the decapping test force to the device under test 110 according to the number P of the decapping test forces in the first control signal, the magnitude of each decapping test force, and the execution times, and sends a camera instruction to the camera unit 103 after each application of the decapping test force, and the camera unit 103 may receive the camera instruction, take a first image of the decapping angle of the device under test 110 accommodated in the test bench 109 under each decapping test force according to the camera instruction, and send the first image to the control device. For example, if 1000 uncapping test forces with different magnitudes are applied to the device under test 110, and each uncapping test force is applied 10 times, then in the whole uncapping test process, the pressing unit 107 sends 10000 times of image pickup instructions to the image pickup unit 103 in total, and the image pickup unit 103 can take 10000 first images of the uncapping angle of the device under test 110 under the uncapping test force and send the 10000 first images to the control device.
In step 403, the control device determines coordinate values of the snap points in the device under test 110 in a preset coordinate system according to the first image corresponding to each uncovering test force.
The snap point may be a position point, which is pre-marked on the device under test 110 and is used for indicating the opening and closing angle of the device under test 110, for example, the point Q in fig. 2. In addition, in order to accurately represent the position change condition of the fastening point, a coordinate system shown in fig. 2 is further arranged on the test bench in advance, the point O is an origin of the coordinate system, and the coordinate value of the point Q in the coordinate system changes along with the size of the uncapping angle.
In step 404, the control device calculates a first opening angle of the device under test 110 according to the coordinate value of the fastening point, and calculates a size of the opening angle of the device under test 110 under the opening test force according to the first angle.
Still taking the example in step 402 for explanation, assuming that the control device receives 10000 first images, the control device may calculate a first angle of the decapping angle in each image according to the Q-point coordinate values in the 10000 first images, and calculate the size of the decapping angle in each image according to the first angle. Since each decap test force is applied 10 times, the control device may average the sizes of the computed decap angles under the decap test forces of the same size for the 10 times, and take the average as the size of the decap angle under the decap test force.
In step 405, the control device determines whether the difference between the size of the uncapping angle and the theoretical uncapping angle corresponding to the uncapping test force is greater than a first threshold. If yes, go to step 406; if not, go to step 407.
in step 407, the control apparatus determines that the device under test 110 is abnormal in opening under the opening test force.
One possible implementation manner is that one uncapping test force corresponds to one theoretical uncapping angle, and the theoretical uncapping angle corresponding to each uncapping test force is set according to an industry standard, for example, the theoretical uncapping angle can be set by a person skilled in the art according to experience, or can be obtained through experimental verification, and is not particularly limited. For example, in one possible case, the theoretical opening angle corresponding to the opening test force of 1N is 5 degrees, the theoretical opening angle corresponding to the opening test force of 2N is 7 degrees, the theoretical opening angle corresponding to the opening test force of 3N is 10 degrees, and the theoretical opening angle corresponding to the opening test forces of … … and 1000N is 180 degrees.
Alternatively, the first threshold may be 5 to 15 degrees. Preferably, the first threshold may be set to 10 degrees. Thus, if the average value of the measured uncapping angles is 25 degrees when the uncapping test force is 3N, and the difference value of the theoretical uncapping angle size 10 degrees corresponding to the uncapping test force of 3N is 15 degrees and is greater than the first threshold value 10 degrees, it is determined that the device under test 110 is abnormal in uncapping test force. On the contrary, if when the test of uncapping was 3N, the uncapping angle average that records was 15 degrees, and the difference of the theoretical uncapping angle size 10 degrees that corresponds with 3N's test of uncapping power was 5 degrees, was not more than first threshold value 10 degrees, can go to judge at this moment whether the difference of the theoretical uncapping angle size that the size of uncapping angle under the test of uncapping power and the test of uncapping power correspond was greater than first threshold value.
Further, if all the uncapping angle differences are not greater than the first threshold, it may be determined that the uncapping angle of the device under test 110 meets the requirement. On the contrary, as long as the difference between the magnitude of one uncapping angle and the magnitude of the theoretical uncapping angle corresponding to the uncapping test force is greater than the first threshold value, it is determined that the uncapping angle of the device under test 110 does not meet the requirement. So, can confirm more comprehensively accurately whether the function of uncapping is normal, moreover, still help relying on the image of gathering to carry out further analysis, avoid the human eye to observe the angle of uncapping, further improve the accuracy of test.
Closure test procedure
And in the cover closing test process, the control equipment sends a test command to the cover opening and closing test device to be a cover closing test command. Before the cover closing test is performed, the device under test 110 may be initialized, so that the angle of the device under test 110 is opened to a certain size, and the device under test 110 may be opened to 150 degrees, for example.
Fig. 5 exemplarily shows a schematic flow chart of a cover closing test method provided by an embodiment of the present application, and as shown in fig. 5, the flow chart includes the following steps:
For example, the control device first sends a cover closing test command to the program control box 101, and after the control device receives the cover closing test command, the program control box 101 generates a second control signal containing M cover closing test forces according to the cover closing test command, and controls the pressing unit 107 to apply the cover closing test force to the device under test 110. The second control signal includes the number M of the cover closing test forces, the magnitude of each cover closing test force, and the execution times. For the range of the M lid opening test forces and the number of times of applying, reference may be made to the P lid opening test forces, which are not described herein again.
Illustratively, the pressing unit 107 applies the capping test force to the device under test 110 according to the number M of capping test forces, the magnitude of each capping test force, and the number of executions in the second control signal. And sends a camera instruction to the camera unit 103, and sends a camera instruction to the camera unit 103 every time a cover closing test force is applied, and the camera unit 103 can receive the camera instruction, shoot a second image of the cover closing angle of the device under test 110 accommodated in the test bench 109 under each cover closing test force according to the camera instruction, and send the second image to the control device. The mode of the image capturing unit 103 capturing the second image may refer to the mode of the image capturing unit 103 capturing the first image, which is not described herein again.
In step 503, the control device determines a coordinate value of the snap point Q in the device under test 110 in a preset coordinate system according to the second image corresponding to each cover closing test force.
And 505, judging whether the difference value between the cover closing angle and the theoretical cover closing angle corresponding to the cover closing test force is larger than a second threshold value by the control equipment. If yes, go to step 506; if not, go to step 507.
In step 506, the control device determines that each dut 110 is normally closed under the closing test force.
In step 507, the control device determines that the device under test 110 is abnormal in closing under the closing test force.
In one possible implementation manner, one closing test force may correspond to one theoretical closing angle, for example, the theoretical closing angle corresponding to the 1N closing test force is 125 degrees, the theoretical closing angle corresponding to the 2N closing test force is 100 degrees, and the theoretical closing angle corresponding to the 3N closing test force is 80 degrees … … 1000N is 0 degree.
Alternatively, the second threshold may be 5 degrees to 15 degrees, and preferably, the second threshold is set to 10 degrees. Assuming that when the cover closing test force is 3N, the measured average value of the cover closing angles is 110 degrees, the difference value of 10 degrees of the theoretical cover closing angle corresponding to the cover closing test force of 3N is 15 degrees and is greater than the second threshold value by 10 degrees, and then determining that the cover closing of the device to be tested 110 is abnormal under the cover closing test force; if the measured average value of the cover closing angle is 120 degrees when the cover closing test force is 3N, the difference value of the theoretical cover closing angle corresponding to the cover closing test force of 3N is 5 degrees and is not greater than the second threshold value 10 degrees, it is determined whether the difference value between the cover closing angle under the cover closing test force of other sizes and the theoretical cover closing angle corresponding to the cover closing test force is greater than the second threshold value, and in a possible implementation manner, if the cover closing test force is not greater than the second threshold value, it is determined that the cover closing angle of the device under test 110 meets the requirement. And determining that the cover closing angle of the device to be tested 110 does not meet the requirement as long as the difference value between the size of one cover closing angle and the theoretical cover closing angle corresponding to the cover closing test force is greater than a second threshold value, and determining that the cover closing angle of the device to be tested 110 meets the requirement only when the difference values between the sizes of all cover closing angles and the theoretical cover closing angles corresponding to the cover closing test force are not greater than the second threshold value. Therefore, whether the cover closing function is normal can be determined more comprehensively and accurately, the method is helpful for the analysis of the next step depending on the collected image, the cover closing angle is prevented from being observed by human eyes, and the test accuracy is further improved.
A possible implementation manner can also establish a cover opening test curve according to P first angles corresponding to P cover opening test forces, the slope of a tangent line of P points corresponding to the P cover opening test forces in the cover opening test curve is calculated, the cover opening test force when the slope is 0 is determined to be the maximum cover opening test force, and the maximum cover opening test force indicates the maximum cover opening force borne by the device to be tested 110 when the device to be tested is used. For example, fig. 6 exemplarily illustrates a decap test curve diagram provided by an embodiment of the present application, where as shown in fig. 6, an x-axis corresponds to an decap test force, and a y-axis corresponds to a first angle. As can be seen from fig. 6, when the decap test force reaches 800N, the first angle reaches 150 degrees, and at this time, the decap test force is increased, and the first angle is still maintained at 150 degrees and does not change any more, so that 800N can be determined as the maximum decap force that can be borne by the device under test 110. That is to say, in the product instruction manual that the device under test corresponds, can mark the size of this power, remind the user not to use the power that exceeds 800N to uncap to avoid damaging.
One possible implementation manner may also be to establish a lid closing test curve according to the M second angles corresponding to the M lid closing test forces and the M lid closing test forces, calculate a slope of a tangent line at M points corresponding to the M lid closing test forces in the lid closing test curve, determine the lid closing test force when the slope is 0 as the maximum lid closing test force, and the maximum lid closing test force indicates the maximum lid closing test force that can be borne by the device under test 110 when in use. Fig. 7 exemplarily shows a schematic diagram of a lid closing test curve provided by the embodiment of the present application, and as shown in fig. 7, the x-axis corresponds to a lid closing test force, and the y-axis corresponds to a second angle. As can be seen from fig. 7, when the cover closing test force reaches 800N, the second angle reaches 0 degree, and at this time, the cover closing test force is increased, and the second angle is still maintained at 0 degree and does not change any more, so that 800N can be determined as the maximum cover closing test force that can be borne by the device under test 110. That is to say, in the product instruction manual that the device under test corresponds, can mark the size of this power, remind the user not to use the power that exceeds 800N to close the lid, avoid damaging.
Based on the same technical concept, an embodiment of the present invention further provides a computing device, including: a memory for storing program instructions;
and the processor is used for calling the program instructions stored in the memory and executing the method illustrated in the figure 4, the figure 5 or the figure 6 according to the obtained program.
Based on the same technical concept, embodiments of the present invention also provide a computer-readable storage medium, which when running on a processor implements the method illustrated in fig. 4, 5 or 6.
Based on the same technical concept, the embodiment of the present invention also provides a computer program product, which when running on a processor implements the methods illustrated in fig. 4, 5 and 6.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. An opening and closing cover testing device is characterized by comprising:
the test device comprises a program control box, at least one test bench and a plectrum device, wherein the at least one test bench is arranged on the upper surface of the program control box side by side;
the device comprises at least one test board, a pressing unit, a camera unit and a control unit, wherein the at least one test board is used for accommodating at least one device to be tested, each test board is provided with the pressing unit and the camera unit, and the visual field range of the camera unit comprises a space for accommodating the device to be tested on the test board;
the plectrum device comprises height adjusting supports fixed on two sides of the program control box, a transverse adjusting support rod erected on the height adjusting supports and at least one plectrum arranged on the transverse adjusting supports, the at least one plectrum corresponds to the position of the at least one test board one by one, and the plectrum device moves the at least one plectrum to the position corresponding to the at least one device to be tested through the height adjusting supports and the transverse adjusting support rod;
the program control box is used for receiving a test command, controlling the pressure applying units on the L test platforms to apply an uncovering test force to the at least one device to be tested according to the test command, or controlling the L shifting pieces in the shifting piece device to apply a cover closing test force to the at least one device to be tested, and controlling the camera units on the L test platforms to shoot images of the at least one device to be tested under the uncovering test force or the cover closing test force, wherein L is a positive integer.
2. The apparatus of claim 1, wherein the test command is an uncap test command sent by the control device;
the program control box is used for generating first control signals containing P uncapping test forces according to the uncapping test command and sending the first control signals to the pressure applying units in the at least one test bench, wherein P is a positive integer;
the pressure applying unit in the at least one test bench is used for applying the P cover opening test forces to the device to be tested according to the first control signal and sending a camera shooting instruction to the camera shooting unit;
and the camera unit in the at least one test bench is used for shooting a first image of the opening angle of the device to be tested accommodated in the at least one test bench under each opening test force, and sending the first image to the control equipment.
3. The apparatus of claim 1, wherein the test command is a close-cover test command sent by the control device;
the program control box is also used for generating a second control signal containing M cover closing test forces according to the cover closing test command and sending the second control signal to the at least one shifting piece, wherein M is a positive integer;
the at least one shifting piece is used for applying the M cover closing test forces to the device to be tested according to the second control signal and sending a camera shooting instruction to the camera shooting unit;
and the camera shooting unit in the at least one test bench is used for shooting a second image of the cover closing angle of the device to be tested accommodated in the at least one test bench under each cover closing test force, and sending the second image to the control equipment.
4. A method for testing a cover opening and closing, which is characterized by being applied to a control device, wherein the control device is connected with the cover opening and closing testing device of any one of claims 1 to 3; the method comprises the following steps:
sending a test command to the cover opening and closing test device, wherein the test command is used for indicating that an opening test force or a closing test force is applied to the device to be tested;
receiving an image returned by the cover opening and closing test device, wherein the image comprises an image of the cover opening angle of the device to be tested under the cover opening test force or an image of the cover closing angle of the device to be tested under the cover closing test force;
and judging whether the cover opening angle or the cover closing angle of the device to be tested meets the requirement or not according to the image, if so, determining that the cover opening and closing function of the device to be tested is normal, and if not, determining that the cover opening and closing function of the device to be tested is normal.
5. The method of claim 4, wherein the test command is a decap test command, the decap test command being indicative of applying P decap test forces to the device under test, the image being a first image comprising an decap angle of the device under test at each of the P decap test forces;
the judging whether the opening angle or the closing angle of the device to be tested meets the requirements or not according to the image comprises the following steps:
determining a coordinate value of a buckling point in the device to be tested in a preset coordinate system according to the first image corresponding to each uncovering test force, wherein the buckling point is a position point which is marked on the device to be tested in advance and used for indicating the opening and closing angle of the device to be tested; calculating a first angle of the cover opening angle of the device to be tested according to the coordinate value of the buckling point, and calculating the size of the cover opening angle of the device to be tested under the cover opening testing force according to the first angle; when the difference value between the cover opening angle and the theoretical cover opening angle corresponding to the cover opening testing force is not larger than a first threshold value, determining that each device to be tested is normally opened under the cover opening testing force, and when the difference value between the cover opening angle and the theoretical cover opening size corresponding to the cover opening testing force is larger than the first threshold value, determining that the device to be tested is abnormal in opening under the cover opening testing force;
and if at least one abnormal uncovering test force exists in the P uncovering test forces, determining that the uncovering angle of the device to be tested does not meet the requirement.
6. The method of claim 4, wherein the test command is a close-cover test command, the close-cover test command is used to instruct the device under test to apply M close-cover test forces, the image is a second image, and the second image is a second image including a close-cover angle of the device under test at each of the M close-cover test forces;
the judging whether the opening angle or the closing angle of the device to be tested meets the requirements or not according to the image comprises the following steps:
determining a coordinate value of a buckling point in a preset coordinate system in the device to be tested according to a second image corresponding to each cover closing test force, wherein the buckling point is a position point which is marked on the device to be tested in advance and used for indicating the opening and closing angle of the device to be tested, and calculating a second angle of the cover closing angle of the device to be tested according to the coordinate value of the buckling point; calculating the size of the cover closing angle of the device to be tested under the cover closing test force according to the second angle, determining that the cover closing of each device to be tested is normal under the cover closing test force when the difference value between the size of the cover closing angle and the theoretical cover closing size corresponding to the cover closing test force is not larger than a second threshold value, and determining that the cover closing of the device to be tested is abnormal under the cover closing test force when the difference value between the size of the cover closing angle and the theoretical cover closing size corresponding to the cover closing test force is larger than the second threshold value;
and if at least one abnormal cover closing test force exists in the M cover closing test forces, determining that the cover closing angle of the device to be tested does not meet the requirement.
7. The method of claim 5, wherein the method further comprises:
establishing a cover opening test curve according to the P cover opening test forces and the P first angles corresponding to the P cover opening test forces, calculating the slope of a tangent line of P points corresponding to the P cover opening test forces in the cover opening test curve, determining the cover opening test force when the slope is 0 as the maximum cover opening test force, and indicating the maximum cover opening test force which can be borne by the device to be tested when the device to be tested is used.
8. The method of claim 6, wherein the method further comprises:
and establishing a cover closing test curve according to the M second angles corresponding to the M cover closing test forces, calculating the tangent slopes of M points corresponding to the M cover closing test forces in the cover closing test curve, determining the cover closing test force when the slope is 0 as the maximum cover closing test force, and indicating the maximum cover closing test force which can be borne by the product to be tested when the product to be tested is used by the maximum cover closing test force.
9. A computer-readable storage medium, characterized in that it stores a computer program which, when executed, performs the method according to any one of claims 5 to 8.
10. A computing device, comprising:
a memory for storing program instructions;
a processor for calling program instructions stored in said memory to execute the method of any of claims 5 to 8 in accordance with the obtained program.
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