CN114200214B - High-frequency inductance loss measurement method - Google Patents
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- CN114200214B CN114200214B CN202111509291.3A CN202111509291A CN114200214B CN 114200214 B CN114200214 B CN 114200214B CN 202111509291 A CN202111509291 A CN 202111509291A CN 114200214 B CN114200214 B CN 114200214B
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- 238000000691 measurement method Methods 0.000 title claims abstract description 13
- 238000005259 measurement Methods 0.000 claims abstract description 43
- 230000010355 oscillation Effects 0.000 claims abstract description 41
- 230000003071 parasitic effect Effects 0.000 claims abstract description 41
- 230000005347 demagnetization Effects 0.000 claims abstract description 40
- 238000000034 method Methods 0.000 claims abstract description 30
- 230000005284 excitation Effects 0.000 claims abstract description 9
- 238000013016 damping Methods 0.000 claims description 17
- 239000003990 capacitor Substances 0.000 claims description 13
- 238000012360 testing method Methods 0.000 claims description 10
- 230000015556 catabolic process Effects 0.000 claims description 6
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 claims description 3
- 230000000087 stabilizing effect Effects 0.000 claims description 3
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- 230000002349 favourable effect Effects 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 8
- 238000004146 energy storage Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
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- 230000004048 modification Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
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- 238000011161 development Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
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- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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Abstract
The invention relates to a high-frequency inductance loss measurement method, which is characterized in that a demagnetization loop is connected in parallel to the parasitic inductance of a direct-current pre-excitation loop of a high-frequency inductance loss measurement circuit by a damped oscillation method, so that energy is discharged through the demagnetization loop, a magnetic piece loop to be measured obtains more ideal oscillation, and the measurement precision is further improved. The method is favorable for improving the accuracy of high-frequency inductance loss measurement, and has high measurement frequency and low realization cost.
Description
Technical Field
The invention belongs to the field of power converters, and particularly relates to a high-frequency inductance loss measurement method.
Background
With the wide application of the third generation wide bandgap semiconductor device, the power converter can work at the switching frequency of megahertz, which is favorable for the continuous development of the power converter in the high-frequency and miniaturized directions, the inductor is one of the key devices, the size is smaller and smaller, and the loss of the inductor can directly influence the performance and heating of the whole power converter. It is therefore necessary to measure the loss of inductance accurately.
The measurement of high-frequency inductance (inductance with magnetic core) loss is a concern in the industry, and the current measurement methods mainly include a calorimeter method, an impedance analyzer measurement method, an alternating current power measurement method, a direct current power measurement method and a damped oscillation method.
The calorimeter has more measurement steps and long measurement time, and is not suitable for the measurement of actual engineering; impedance analyzer measurements are based on small signal excitations and are also difficult to measure for small inductance general fixtures; the alternating current power measuring method samples voltage and current signals, and the phase error of the voltage and the current is larger under the working condition that the frequency is higher; the DC power measurement method adopts a DC/AC inverter, and the normal output of PWM waves generated by the inverter cannot be ensured under high frequency; the damped oscillation method is based on an RLC second-order circuit, has high measurement frequency, and can measure the Q value of the MHz-level high-frequency inductor, but does not consider the influence of parasitic inductance of a direct-current pre-excitation loop on the oscillation process, and can influence the accuracy of damped oscillation measurement. Therefore, the measurement methods have respective defects, and the high-frequency inductance loss cannot be accurately measured.
Disclosure of Invention
The invention aims to provide a high-frequency inductance loss measurement method which is beneficial to improving the accuracy of high-frequency inductance loss measurement, has high measurement frequency and low realization cost.
In order to achieve the above purpose, the invention adopts the following technical scheme: a method for measuring high-frequency inductance loss includes connecting a demagnetizing loop in parallel to parasitic inductance of DC pre-exciting loop of high-frequency inductance loss measuring circuit by damping oscillation method to let energy be discharged by demagnetizing loop so as to make magnetic element loop to be measured obtain more ideal oscillation and further to raise measuring accuracy.
Further, the damped oscillation method high frequency inductance loss measurement circuit with the demagnetization circuit includes: the device comprises a direct current source U 0, a current limiting resistor R 1, a pre-excitation loop parasitic inductance L s, a switch S, a capacitor C, a demagnetization loop and a magnetic piece to be measured, wherein the positive electrode of the direct current source U 0 is connected with the current limiting resistor R 1, the parasitic inductance L s and the switch S and then connected with one end of the magnetic piece to be measured, the negative electrode of the direct current source U 0 is connected with the other end of the magnetic piece to be measured, the demagnetization loop is connected in parallel with the two ends of the current limiting resistor R 1 and the parasitic inductance L s, and the capacitor C is connected in parallel with the two ends of the magnetic piece to be measured; when t=0, the switch S is closed, and when t=t 0, the switch S is opened, and the parasitic inductance L s discharges energy through the demagnetization loop, so that the switch S is ensured to be completely turned off, and the magnetic component loop to be detected can realize more ideal oscillation.
Further, when t=0, the switch S is closed, and the direct current source provides an initial direct current exciting current for the magnetic piece to be detected in a short time, and the parasitic inductance L s is excited; when t=t 0, the switch S is opened, and the magnetic piece to be tested and the capacitor C form an RLC series resonance circuit, namely a measurement loop; the to-be-measured magnetic piece consumes energy to demagnetize through the corresponding loss resistor R of the to-be-measured magnetic piece, and the second-order circuit is in an under-damped damping oscillation state due to the existence of the corresponding loss resistor R of the to-be-measured magnetic piece; after the switch S is disconnected, the parasitic inductance L s affecting the measurement discharges energy through the demagnetization loop, so that the parasitic inductance current does not pass through the path of the switch S, and the switch S is ensured to be completely disconnected; thus, the measuring loop forms an ideal under-damped oscillation, eliminating disturbances to the measuring loop.
Further, the method is based on a second-order RLC under-damped oscillation circuit, a second-order differential equation shown in a formula (6) is satisfied, the voltages u test at two ends of the magnetic piece to be measured are shown in a formula (7), the voltages u test at two ends of the magnetic piece to be measured are sine waves with damping trend, and the voltages at two ends of the magnetic piece to be measured are subjected to damping oscillation discharge near a zero value;
utest＝Ae-δtsin(ωt+β) (7)
Measuring a first positive peak value u m1、um2 and a second positive peak value u m1、um2 of voltage waveforms at two ends of a magnetic part to be measured and corresponding time t 1、t2, obtaining an oscillation damping coefficient delta through formulas (8) and (9), and obtaining a loss resistance R corresponding to the magnetic part to be measured in the damping oscillation process through a formula (10);
R＝2δL (10)。
Further, the demagnetization circuit includes a freewheeling diode D 1 and a resistor R 2, after the switch S is turned off, the freewheeling diode is utilized to conduct with a small forward voltage drop, and the resistor R 2 plays a role in absorbing energy and limiting the excessive current passing through the freewheeling diode, so that the parasitic inductance L s discharges energy through the demagnetization circuit, ensuring that the switch S is completely cut off, and not affecting the damped oscillation process of the measurement circuit of the magnetic component to be measured.
Further, the demagnetization loop comprises a zener diode D 2 and a resistor R 3, by utilizing the reverse characteristic of the zener diode, after the switch S is turned off, the parasitic inductor L s discharges to enable the D 2 to bear reverse voltage, when the reverse voltage is close to the breakdown value of the D 2, the voltages at two ends of the D 2 are stabilized to be close to the breakdown voltage, the voltage stabilizing function of the diode is realized, and the R 3 is used for preventing the current passing through the zener diode from being burnt out due to overlarge; thereby forming a demagnetization loop of the parasitic inductance L s, and improving the accuracy of measurement.
Further, the direct current source is changed into an energy storage capacitor.
Compared with the prior art, the invention has the following beneficial effects: the method can eliminate the influence of parasitic inductance on measurement, improve the accuracy of measuring inductance loss by a damped oscillation method, has the measuring frequency of up to tens of megahertz, is easy to realize, has low hardware cost, and has strong practicability and wide application prospect.
Drawings
FIG. 1 is a schematic diagram of a measurement circuit according to an embodiment of the invention;
FIG. 2 is a schematic waveform diagram of the voltage across the magnetic part to be measured according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a measurement circuit according to a first embodiment of the invention;
FIG. 4 is a waveform diagram of measured voltage of a magnetic part to be measured without a demagnetization circuit according to a first embodiment of the present invention;
FIG. 5 is a waveform diagram of measured voltage of a magnetic part to be measured with a demagnetization circuit according to a first embodiment of the present invention;
FIG. 6 is a schematic diagram of a measurement circuit according to a second embodiment of the invention;
FIG. 7 is a schematic diagram of a measurement circuit according to a third embodiment of the invention;
fig. 8 is a schematic diagram of a measurement circuit according to a fourth embodiment of the present invention.
Detailed Description
The invention will be further described with reference to the accompanying drawings and examples.
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of exemplary embodiments according to the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
The embodiment provides a high-frequency inductance loss measurement method, wherein a demagnetization loop is connected in parallel to the parasitic inductance of a direct-current pre-excitation loop of a high-frequency inductance loss measurement circuit by a damped oscillation method, so that energy is discharged through the demagnetization loop, a magnetic piece loop to be measured obtains more ideal oscillation, and further measurement accuracy is improved.
As shown in fig. 1, the present embodiment provides a damped oscillation method high frequency inductance loss measurement circuit with a demagnetization loop, including: the device comprises a direct current source U 0, a current limiting resistor R 1, a pre-excitation loop parasitic inductance L s, a switch S (an electronic switch or a mechanical switch), a capacitor C, a demagnetization loop and a magnetic piece to be detected. The positive pole of DC source U 0 is connected current-limiting resistance R 1, parasitic inductance L s and switch S, then connects and awaits measuring magnetic part one end, the negative pole of DC source U 0 is connected and is awaits measuring the magnetic part other end, the demagnetization return circuit is parallelly connected at current-limiting resistance R 1 and parasitic inductance L s' S both ends, electric capacity C connects in parallel at the both ends of awaiting measuring magnetic part. In the figure, L, R is a serial equivalent model of the magnetic component to be measured, R is a loss resistance corresponding to the magnetic component to be measured, and u test is the voltage at two ends of the magnetic component to be measured. When t=0, the switch S is closed, and when t=t 0, the switch S is opened, and the parasitic inductance L s discharges energy through the demagnetization loop, so that the switch S is ensured to be completely turned off, and the magnetic component loop to be detected can realize more ideal oscillation. When t=0, the switch S is closed, and the direct current source provides initial direct current exciting current for the magnetic piece to be detected in a short time, and the parasitic inductance L s is excited; when t=t 0, the switch S is turned off, and the magnetic part to be measured and the capacitor C on the right side in fig. 1 form an RLC series resonant circuit, i.e. a measurement loop. The measuring loop selects the capacitance with good high-frequency characteristics, namely parasitic resistance and parasitic inductance, and almost does not count, so that the loss resistance of the RLC measuring loop comes from the magnetic piece to be measured as far as possible. The magnetic part to be measured consumes energy to demagnetize through the resistor R, and because the corresponding loss resistor R exists in the magnetic part to be measured, the second-order circuit is in an under-damped damping oscillation state, so that accurate measurement of the R value is critical. After the switch S is disconnected, parasitic inductance L s influencing the measurement discharges energy through the demagnetization loop, so that parasitic inductance current does not pass through the path of the switch S, the switch S is ensured to be completely disconnected, and thus, the measurement loop forms ideal under-damped oscillation, and the interference on the measurement loop is eliminated.
The invention is based on a second-order RLC under-damped oscillation circuit, and satisfies a second-order differential equation shown in a formula (6), the voltage u test at two ends of a magnetic part to be detected is shown in a formula (7), the voltage u test at two ends of the magnetic part to be detected is a sine wave with a damping trend, the corresponding schematic waveform is shown in figure 2, and the voltage at two ends of the magnetic part to be detected is subjected to damping oscillation discharge near a zero value; the method comprises the steps of observing voltage waveforms at two ends of a magnetic part to be measured, measuring a first positive peak value u m1、um2, a second positive peak value u m1、um2 and corresponding time t 1、t2, obtaining oscillation damping coefficients delta through formulas (8) and (9), and obtaining a loss resistance R corresponding to the magnetic part to be measured in the damping oscillation process through a formula (10).
utest＝Ae-δtsin(ωt+β) (7)
R＝2δL (10)。
As shown in fig. 3, in the first embodiment, the demagnetization circuit includes a freewheeling diode D 1 and a resistor R 2, after the switch S is turned off, the freewheeling diode is used to conduct the voltage drop in the forward direction, and the resistor R 2 acts to absorb energy and limit the excessive current passing through the freewheeling diode, so that the parasitic inductance L s discharges energy through the demagnetization circuit, ensuring that the switch S is completely turned off and not affecting the damped oscillation process of the measurement circuit of the magnetic component to be measured.
In the first embodiment, the known magnetic part to be measured is a patch inductance of 240nH, the patch capacitance is selected to be 200pF, the direct current source is input to be 2V, the current limiting resistance is 5 Ω, the voltage at two ends of the magnetic part to be measured is measured by using the oscilloscope voltage probe with higher bandwidth, as shown in fig. 4, the measured voltage waveform of the magnetic part to be measured without the demagnetization circuit is measured, then according to the scheme of fig. 3, the flywheel diode D 1 and the resistor R 2 are selected for experiment, as shown in fig. 5, the measured voltage waveform of the magnetic part to be measured with the demagnetization circuit is measured, so that the damped oscillation waveform with the demagnetization circuit scheme can be seen to be more ideal, and the measurement is more accurate.
As shown in fig. 6, in the second embodiment, the demagnetization circuit includes a zener diode D 2 and a resistor R 3, and by using the reverse characteristic of the zener diode, after the switch S is turned off, the parasitic inductance L s discharges to make D 2 bear the reverse voltage, and when the reverse voltage approaches to the breakdown value of D 2, the voltages at the two ends of D 2 stabilize to the vicinity of the breakdown voltage, so as to realize the voltage stabilizing function of the diode, and R 3 is used for preventing the current passing through the zener diode from being too large and burning out. Compared with the first embodiment shown in fig. 3, the reverse voltage born by the zener diode D 2 is higher than the forward turn-on voltage of the flywheel diode D 1, so the resistance of R 3 can be selected to be smaller than the resistance of R 2, thereby forming a demagnetization loop of the parasitic inductance L s and improving the measurement accuracy.
In consideration of the fact that the direct current source has larger internal resistance, parasitic inductance of the direct current pre-excitation loop is larger, in order to reduce the parasitic inductance, an energy storage capacitor with small internal resistance is used for replacing a direct current source on the basis of the scheme with the demagnetization loop, the parasitic inductance of the direct current pre-excitation loop is reduced, and measurement accuracy is improved. As shown in fig. 7, the dc source is replaced with the energy storage capacitor C in according to the first embodiment. As shown in fig. 8, the dc source is replaced with the energy storage capacitor C in on the basis of the second embodiment.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the invention in any way, and any person skilled in the art may make modifications or alterations to the disclosed technical content to the equivalent embodiments. However, any simple modification, equivalent variation and variation of the above embodiments according to the technical substance of the present invention still fall within the protection scope of the technical solution of the present invention.
Claims (6)
1. A high-frequency inductance loss measurement method is characterized in that a demagnetization loop is connected in parallel to a parasitic inductance of a direct-current pre-excitation loop of a high-frequency inductance loss measurement circuit by a damped oscillation method, so that energy is discharged through the demagnetization loop, a magnetic piece loop to be measured obtains more ideal oscillation, and measurement accuracy is improved;
the damped oscillation method high-frequency inductance loss measurement circuit with the demagnetization loop comprises the following steps: the device comprises a direct current source U 0, a current limiting resistor R 1, a parasitic inductance L s, a switch S, a capacitor C, a demagnetization circuit and a magnetic piece to be measured, wherein the positive electrode of the direct current source U 0 is connected with the current limiting resistor R 1, the parasitic inductance L s and the switch S and then connected with one end of the magnetic piece to be measured, the negative electrode of the direct current source U 0 is connected with the other end of the magnetic piece to be measured, the demagnetization circuit is connected in parallel with the two ends of the current limiting resistor R 1 and the parasitic inductance L s, and the capacitor C is connected in parallel with the two ends of the magnetic piece to be measured; when t=0, the switch S is closed, and when t=t 0, the switch S is opened, and the parasitic inductance L s discharges energy through the demagnetization loop, so that the switch S is ensured to be completely turned off, and the magnetic component loop to be detected can realize more ideal oscillation.
2. The method of measuring high frequency inductance loss according to claim 1, wherein when t=0, the switch S is closed, the dc source provides the initial dc exciting current to the magnetic member to be measured in a short time, and the parasitic inductance L s is excited; when t=t 0, the switch S is opened, and the magnetic piece to be tested and the capacitor C form an RLC series resonance circuit, namely a measurement loop; the to-be-measured magnetic piece consumes energy through the to-be-measured magnetic piece corresponding loss resistor R to perform demagnetization, and the second-order circuit is in an under-damped damping oscillation state due to the existence of the to-be-measured magnetic piece corresponding loss resistor R; after the switch S is disconnected, the parasitic inductance L s affecting the measurement discharges energy through the demagnetization loop, so that the parasitic inductance current does not pass through the path of the switch S, and the switch S is ensured to be completely disconnected; thus, the measuring loop forms an ideal under-damped oscillation, eliminating disturbances to the measuring loop.
3. The method for measuring the high-frequency inductance loss according to claim 2, wherein the method is based on a second-order RLC under-damped oscillation circuit, a second-order differential equation shown in a formula (6) is satisfied, the voltages u test at two ends of the magnetic part to be measured are shown in a formula (7), the voltages u test at two ends of the magnetic part to be measured are sine waves with damping trend, and the voltages at two ends of the magnetic part to be measured are subjected to damping oscillation discharge near a zero value;
utest＝Ae-δtsin(ωt+β) (7)
Measuring a first positive peak value u m1、um2 and a second positive peak value u m1、um2 of voltage waveforms at two ends of a magnetic part to be measured and corresponding time t 1、t2, obtaining an oscillation damping coefficient delta through formulas (8) and (9), and obtaining a loss resistance R corresponding to the magnetic part to be measured in the damping oscillation process through a formula (10);
R＝2δL (10)。
4. The method according to claim 1, wherein the demagnetization circuit comprises a freewheeling diode D 1 and a resistor R 2, and after the switch S is turned off, the freewheeling diode is used to conduct the voltage drop in forward direction to be small, the resistor R 2 acts to absorb energy and limit the excessive current passing through the freewheeling diode, so that the parasitic inductance L s discharges energy through the demagnetization circuit, and the complete interruption of the switch S is ensured, so that the damping oscillation process of the measurement circuit of the magnetic component to be measured is not affected.
5. The method according to claim 1, wherein the demagnetization loop comprises a zener diode D 2 and a resistor R 3, the reverse characteristic of the zener diode is utilized, after the switch S is turned off, the parasitic inductance L s discharges to make D 2 bear a reverse voltage, when the reverse voltage approaches to the breakdown value of D 2, the voltages at both ends of D 2 stabilize to the vicinity of the breakdown voltage, the voltage stabilizing function of the diode is realized, and R 3 is used for preventing the current passing through the zener diode from being too large to burn out; thereby forming a demagnetization loop of the parasitic inductance L s, and improving the accuracy of measurement.
6. A method of measuring high frequency inductance loss according to claim 4 or 5, wherein the dc source is replaced by a storage capacitor.
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