CN114200214A - High-frequency inductance loss measuring method - Google Patents
High-frequency inductance loss measuring method Download PDFInfo
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- CN114200214A CN114200214A CN202111509291.3A CN202111509291A CN114200214A CN 114200214 A CN114200214 A CN 114200214A CN 202111509291 A CN202111509291 A CN 202111509291A CN 114200214 A CN114200214 A CN 114200214A
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- 238000000034 method Methods 0.000 title claims abstract description 34
- 230000010355 oscillation Effects 0.000 claims abstract description 38
- 230000005347 demagnetization Effects 0.000 claims abstract description 37
- 230000003071 parasitic effect Effects 0.000 claims abstract description 37
- 238000005259 measurement Methods 0.000 claims abstract description 33
- 238000013016 damping Methods 0.000 claims abstract description 11
- 230000005284 excitation Effects 0.000 claims abstract description 8
- 239000003990 capacitor Substances 0.000 claims description 16
- 238000012360 testing method Methods 0.000 claims description 12
- 230000000087 stabilizing effect Effects 0.000 claims description 11
- 230000001939 inductive effect Effects 0.000 claims description 7
- 230000015556 catabolic process Effects 0.000 claims description 6
- 238000004146 energy storage Methods 0.000 claims description 5
- NAWXUBYGYWOOIX-SFHVURJKSA-N (2s)-2-[[4-[2-(2,4-diaminoquinazolin-6-yl)ethyl]benzoyl]amino]-4-methylidenepentanedioic acid Chemical compound C1=CC2=NC(N)=NC(N)=C2C=C1CCC1=CC=C(C(=O)N[C@@H](CC(=C)C(O)=O)C(O)=O)C=C1 NAWXUBYGYWOOIX-SFHVURJKSA-N 0.000 claims description 3
- 238000013459 approach Methods 0.000 claims description 3
- 239000004576 sand Substances 0.000 claims description 3
- 230000009286 beneficial effect Effects 0.000 abstract description 4
- 238000010586 diagram Methods 0.000 description 8
- 238000000691 measurement method Methods 0.000 description 8
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000007707 calorimetry Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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Abstract
The invention relates to a high-frequency inductance loss measuring method, which is characterized in that a demagnetization loop is connected in parallel with a parasitic inductance of a direct-current pre-excitation loop of a high-frequency inductance loss measuring circuit by a damping oscillation method, so that energy is discharged through the demagnetization loop, a loop of a magnetic piece to be measured obtains more ideal oscillation, and the measuring precision is further improved. The method is beneficial to improving the accuracy of high-frequency inductance loss measurement, and has high measurement frequency and low implementation cost.
Description
Technical Field
The invention belongs to the field of power converters, and particularly relates to a high-frequency inductance loss measuring method.
Background
With the wide application of the third generation wide bandgap semiconductor device, the power converter can work at the megahertz switching frequency, which is beneficial to the continuous development of the power converter towards high frequency and miniaturization. It is therefore necessary to accurately measure the loss of the inductance.
The measurement of high-frequency inductance (inductance with magnetic core) loss is a concern in the industry, and at present, the measurement methods mainly include a calorimetry method, an impedance analyzer measurement method, an alternating current power measurement method, a direct current power measurement method and a damped oscillation method.
The calorimetric method has more measuring steps, long measuring time and is not suitable for measurement of actual engineering; the impedance analyzer measurement method is based on small-signal excitation, and is difficult to measure for a clamp with small volume and common inductance; the alternating current power measurement method samples voltage and current signals, and the phase error of the voltage and the current is larger under the working condition of higher frequency; the direct current power measurement method adopts a DC/AC inverter, and the normal output of PWM waves generated by the inverter cannot be ensured under high frequency; the damping oscillation method is based on an RLC second-order circuit, the measurement frequency is high, although the Q value of a megahertz high-frequency inductor can be measured, the influence of parasitic inductance of a direct-current pre-excitation loop on the oscillation process is not considered, and the accuracy of damping oscillation measurement can be influenced. Therefore, the above measurement methods all have respective disadvantages, and the high-frequency inductance loss cannot be accurately measured.
Disclosure of Invention
The invention aims to provide a high-frequency inductance loss measuring method which is beneficial to improving the accuracy of high-frequency inductance loss measurement, and has high measuring frequency and low implementation cost.
In order to achieve the purpose, the invention adopts the technical scheme that: a high-frequency inductance loss measuring method is characterized in that a demagnetization loop is connected in parallel with a direct-current pre-excitation loop parasitic inductance of a damping oscillation method high-frequency inductance loss measuring circuit, so that energy is discharged through the demagnetization loop, a loop of a magnetic piece to be measured obtains more ideal oscillation, and measuring accuracy is improved.
Further, the damping oscillation method high-frequency inductance loss measuring circuit with the demagnetization loop comprises: DC source U0Current limiting resistor R1Pre-excitation loop parasitic inductance LsSwitch S, capacitor C, demagnetizing loop and magnetic piece to be tested, and direct current source U0Positive electrode of the resistor is connected with a current-limiting resistor R1Parasitic inductance LsAnd a switch S connected with one end of the magnetic member to be tested, the DC source U0The negative pole of the current-limiting resistor is connected with the other end of the magnetic piece to be detected, and the demagnetization loop is connected in parallel with the current-limiting resistor R1And parasitic inductance LsThe capacitor C is connected in parallel at two ends of the magnetic piece to be measured(ii) a When t is 0, the switch S is closed, t is t0Time switch S is off, parasitic inductance LsEnergy is released through the demagnetization circuit, so that the switch S is completely turned off, and the circuit of the magnetic piece to be tested can realize more ideal oscillation.
Further, when t is equal to 0, the switch S is closed, the direct current source provides initial direct current exciting current for the magnetic piece to be tested in a short time, and the parasitic inductance LsExcitation also occurs; when t is equal to t0When the switch S is switched off, the magnetic piece to be measured and the capacitor C form an RLC series resonance circuit, namely a measurement loop; the magnetic piece to be tested is demagnetized by the energy consumed by the loss resistor R corresponding to the magnetic piece to be tested, and the second-order circuit is in an underdamped damped oscillation state due to the existence of the loss resistor R corresponding to the magnetic piece to be tested; parasitic inductance L affecting the measurement after the switch S is turned offsEnergy is discharged through the demagnetization loop, so that parasitic inductive current does not pass through the path of the switch S, and the switch S is completely turned off; thus, the measurement loop forms an ideal under-damped oscillation, eliminating interference with the measurement loop.
Further, the method is based on a second-order RLC underdamped oscillation circuit, meets a second-order differential equation shown as a formula (6), and the voltage u at two ends of the magnetic element to be testedtestAs shown in equation (7), the voltage u across ittestThe voltage at two ends of the magnetic piece to be tested is in damped oscillation discharge near a zero value;
utest＝Ae-δtsin(ωt+β) (7)
measuring the first and second positive peak values u of the voltage waveform at two ends of the magnetic part to be measuredm1、um2And corresponding time t1、t2Obtaining an oscillation attenuation coefficient delta through formulas (8) and (9), and obtaining a loss resistance R corresponding to the magnetic piece to be detected in the process of oscillation attenuation through a formula (10);
R＝2δL (10)。
further, the demagnetization circuit comprises a freewheeling diode D1And a resistance R2After the switch S is turned off, the forward conduction voltage drop of the freewheeling diode is small, and the resistor R is2The parasitic inductance L is enabled to absorb energy and limit the excessive current passing through the freewheeling diodesThe switch S is completely cut off by the energy released by the demagnetization circuit, and the damping oscillation process of the measurement circuit of the magnetic piece to be measured is not influenced.
Further, the demagnetization loop comprises a voltage stabilizing diode D2And a resistance R3By utilizing the reverse characteristic of the voltage stabilizing diode, after the switch S is turned off, the parasitic inductance LsDischarge to D2Subject to a reverse voltage when the reverse voltage approaches D2At breakdown value of D2The voltage at two ends is stabilized to be near the breakdown voltage, the voltage stabilizing function of the diode is realized, R3The voltage stabilizing diode is used for preventing the current passing through the voltage stabilizing diode from being too large and burning out; thereby forming a parasitic inductance LsThe demagnetizing circuit improves the measuring accuracy.
Further, the direct current source is changed into an energy storage capacitor.
Compared with the prior art, the invention has the following beneficial effects: the method can eliminate the influence of parasitic inductance on measurement, improve the accuracy of inductance loss measurement by a damping oscillation method, has the measurement frequency as high as dozens of megahertz, is easy to realize, has low hardware cost, and has strong practicability and wide application prospect.
Drawings
FIG. 1 is a schematic diagram of a measurement circuit of an embodiment of the present invention;
FIG. 2 is a schematic waveform diagram of voltages at two ends of a magnetic member to be measured according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a measurement circuit according to a first embodiment of the present invention;
FIG. 4 is a diagram of a voltage waveform measured in a magnetic device under test without a demagnetization circuit according to an embodiment of the invention;
FIG. 5 is a diagram of a voltage waveform measured in a magnetic device under test with a demagnetization circuit according to an embodiment of the invention;
FIG. 6 is a schematic diagram of a measurement circuit according to a second embodiment of the present invention;
FIG. 7 is a schematic diagram of a measurement circuit according to a third embodiment of the present invention;
fig. 8 is a schematic diagram of a measurement circuit according to a fourth embodiment of the present invention.
Detailed Description
The invention is further explained below with reference to the drawings and the embodiments.
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
The embodiment provides a high-frequency inductance loss measuring method, wherein a demagnetization loop is connected in parallel to a parasitic inductance of a direct-current pre-excitation loop of a high-frequency inductance loss measuring circuit of a damping oscillation method, so that energy is discharged through the demagnetization loop, a loop of a magnetic element to be measured obtains more ideal oscillation, and the measuring precision is further improved.
As shown in fig. 1, the present embodiment provides a ringing high-frequency inductance loss measuring circuit having a demagnetization circuit, including: DC source U0Current limiting resistor R1Pre-excitation loop circuitInductance LsThe device comprises a switch S (an electronic switch or a mechanical switch), a capacitor C, a demagnetization loop and a magnetic piece to be detected. The direct current source U0Positive electrode of the resistor is connected with a current-limiting resistor R1Parasitic inductance LsAnd a switch S connected with one end of the magnetic member to be tested, the DC source U0The negative pole of the current-limiting resistor is connected with the other end of the magnetic piece to be detected, and the demagnetization loop is connected in parallel with the current-limiting resistor R1And parasitic inductance LsThe capacitor C is connected in parallel with two ends of the magnetic piece to be measured. In the figure, L, R is the series equivalent model of the magnetic member to be measured, R is the loss resistance corresponding to the magnetic member to be measured, utestThe voltage at two ends of the magnetic piece to be measured. When t is 0, the switch S is closed, t is t0Time switch S is off, parasitic inductance LsEnergy is released through the demagnetization circuit, so that the switch S is completely turned off, and the circuit of the magnetic piece to be tested can realize more ideal oscillation. When t is 0, the switch S is closed, the direct current source provides initial direct current exciting current for the magnetic piece to be tested in a short time, and the parasitic inductance LsExcitation also occurs; when t is equal to t0When the switch S is turned off, the magnetic member to be measured on the right side in fig. 1 and the capacitor C form an RLC series resonant circuit, i.e., a measurement loop. The measuring loop selects a capacitor with good high-frequency characteristics, namely a parasitic resistor and a parasitic inductor which are almost negligible, so that the loss resistance of the RLC measuring loop comes from the magnetic piece to be measured as far as possible. The magnetic piece to be measured dissipates energy through the resistor R for demagnetization, and due to the fact that the magnetic piece to be measured corresponds to the loss resistor R, the second-order circuit is in an underdamped damped and damped oscillation state, and therefore it is critical to accurately measure the R value. Parasitic inductance L affecting the measurement after the switch S is turned offsThe energy is discharged through the demagnetization loop, so that the parasitic inductance current does not pass through the path of the switch S, the switch S is ensured to be completely turned off, the measurement loop forms ideal under-damped oscillation, and the interference to the measurement loop is eliminated.
The invention is based on a second-order RLC underdamped oscillation circuit, satisfies a second-order differential equation shown as an equation (6), and has the voltage u at two ends of a magnetic piece to be testedtestAs shown in equation (7), the voltage u across ittestThe voltage at two ends of the magnetic piece to be tested decays, oscillates and discharges near a zero value, wherein the sine wave is a sine wave with a decay trend, and a corresponding schematic waveform is shown in fig. 2; by observingMeasuring voltage waveform at two ends of magnetic element and measuring first and second positive peak value um1、um2And corresponding time t1、t2And obtaining the oscillation attenuation coefficient delta through formulas (8) and (9), and obtaining the loss resistance R corresponding to the magnetic piece to be measured in the process of oscillation attenuation through a formula (10).
utest＝Ae-δtsin(ωt+β) (7)
R＝2δL (10)。
As shown in FIG. 3, in the first embodiment, the demagnetization circuit comprises a freewheeling diode D1And a resistance R2After the switch S is turned off, the forward conduction voltage drop of the freewheeling diode is small, and the resistor R is2The parasitic inductance L is enabled to absorb energy and limit the excessive current passing through the freewheeling diodesThe switch S is completely cut off by the energy released by the demagnetization circuit, and the damping oscillation process of the measurement circuit of the magnetic piece to be measured is not influenced.
In the first embodiment, given that the magnetic component to be measured is a chip inductor of 240nH, the chip capacitor is 200pF, the dc source input is 2V, the current-limiting resistor is 5 Ω, the voltage at two ends of the magnetic component to be measured is measured by using the oscilloscope voltage probe with higher bandwidth, as shown in fig. 4, the voltage waveform of the magnetic component to be measured is actually measured without a demagnetization loop, and then according to the scheme shown in fig. 3, the freewheeling diode D is selected1And a resistance R2The experiment is carried out, and as shown in fig. 5, the actually measured voltage waveform of the magnetic piece to be measured with the demagnetization circuit is shown, so that the damped oscillation waveform with the demagnetization circuit scheme is more ideal, and the measurement is more accurate.
As shown in FIG. 6, in the second embodiment, the demagnetization circuit includes a voltage regulator diode D2And a resistance R3By utilizing the reverse characteristic of the voltage stabilizing diode, after the switch S is turned off, the parasitic inductance LsDischarge to D2Subject to a reverse voltage when the reverse voltage approaches D2At breakdown value of D2The voltage at two ends is stabilized to be near the breakdown voltage, the voltage stabilizing function of the diode is realized, R3For preventing the current through the zener diode from being too large and burning out. Comparing with the first embodiment as shown in FIG. 3, the zener diode D2Subjected to a reverse voltage higher than that of the freewheeling diode D1Forward on voltage, so selected R3Resistance value can be less than R2Resistance value to form a parasitic inductance LsThe demagnetizing circuit improves the measuring accuracy.
Considering that the parasitic inductance of the direct-current pre-excitation loop is larger due to larger internal resistance of the direct-current source, in order to reduce the parasitic inductance, an energy storage capacitor with small internal resistance is used for replacing the direct-current source on the basis of the scheme of the demagnetization loop, so that the parasitic inductance of the direct-current pre-excitation loop is reduced, and the measurement accuracy is improved. As shown in fig. 7, based on the first embodiment, the dc source is replaced by the energy storage capacitor Cin. As shown in fig. 8, in the second embodiment, the dc source is replaced by the energy storage capacitor Cin。
The foregoing is directed to preferred embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow. However, any simple modification, equivalent change and modification of the above embodiments according to the technical essence of the present invention are within the protection scope of the technical solution of the present invention.
Claims (7)
1. A high-frequency inductance loss measuring method is characterized in that a demagnetization loop is connected in parallel with a direct-current pre-excitation loop parasitic inductance of a damping oscillation method high-frequency inductance loss measuring circuit, so that energy is discharged through the demagnetization loop, a loop of a magnetic piece to be measured obtains more ideal oscillation, and measuring accuracy is improved.
2. The high-frequency inductive loss measuring method according to claim 1, wherein the ringing high-frequency inductive loss measuring circuit having a demagnetization circuit includes: DC source U0Current limiting resistor R1Pre-excitation loop parasitic inductance LsSwitch S, capacitor C, demagnetizing loop and magnetic piece to be tested, and direct current source U0Positive electrode of the resistor is connected with a current-limiting resistor R1Parasitic inductance LsAnd a switch S connected with one end of the magnetic member to be tested, the DC source U0The negative pole of the current-limiting resistor is connected with the other end of the magnetic piece to be detected, and the demagnetization loop is connected in parallel with the current-limiting resistor R1And parasitic inductance LsThe capacitor C is connected in parallel with two ends of the magnetic piece to be detected; when t is 0, the switch S is closed, t is t0Time switch S is off, parasitic inductance LsEnergy is released through the demagnetization circuit, so that the switch S is completely turned off, and the circuit of the magnetic piece to be tested can realize more ideal oscillation.
3. The high-frequency inductance loss measuring method according to claim 2, wherein when t is 0, the switch S is closed, the dc source provides an initial dc exciting current for the magnetic member to be measured in a short time, and the parasitic inductance L issExcitation also occurs; when t is equal to t0When the switch S is switched off, the magnetic piece to be measured and the capacitor C form an RLC series resonance circuit, namely a measurement loop; the magnetic piece to be tested is demagnetized by the energy consumed by the loss resistor R corresponding to the magnetic piece to be tested, and the second-order circuit is in an underdamped damped oscillation state due to the existence of the loss resistor R corresponding to the magnetic piece to be tested; parasitic inductance L affecting the measurement after the switch S is turned offsEnergy is discharged through the demagnetization loop, so that parasitic inductive current does not pass through the path of the switch S, and the switch S is completely turned off; thus, the measurement loop forms an ideal under-damped oscillation, eliminating interference with the measurement loop.
4. A high-frequency inductive loss measuring method according to claim 3,the method is based on a second-order RLC underdamped oscillation circuit, meets a second-order differential equation shown as an equation (6), and the voltage u at two ends of a magnetic piece to be testedtestAs shown in equation (7), the voltage u across ittestThe voltage at two ends of the magnetic piece to be tested is in damped oscillation discharge near a zero value;
utest＝Ae-δtsin(ωt+β) (7)
measuring the first and second positive peak values u of the voltage waveform at two ends of the magnetic part to be measuredm1、um2And corresponding time t1、t2Obtaining an oscillation attenuation coefficient delta through formulas (8) and (9), and obtaining a loss resistance R corresponding to the magnetic piece to be detected in the process of oscillation attenuation through a formula (10);
R＝2δL (10)。
5. a high frequency inductive loss measuring method as claimed in claim 2, characterized in that said demagnetization circuit comprises a freewheeling diode D1And a resistance R2After the switch S is turned off, the forward conduction voltage drop of the freewheeling diode is small, and the resistor R is2The parasitic inductance L is enabled to absorb energy and limit the excessive current passing through the freewheeling diodesThe switch S is completely cut off by the energy released by the demagnetization circuit, and the damping oscillation process of the measurement circuit of the magnetic piece to be measured is not influenced.
6. A high-frequency inductor according to claim 2Method for loss measurement, characterized in that the demagnetization circuit comprises a zener diode D2And a resistance R3By utilizing the reverse characteristic of the voltage stabilizing diode, after the switch S is turned off, the parasitic inductance LsDischarge to D2Subject to a reverse voltage when the reverse voltage approaches D2At breakdown value of D2The voltage at two ends is stabilized to be near the breakdown voltage, the voltage stabilizing function of the diode is realized, R3The voltage stabilizing diode is used for preventing the current passing through the voltage stabilizing diode from being too large and burning out; thereby forming a parasitic inductance LsThe demagnetizing circuit improves the measuring accuracy.
7. A high frequency inductive loss measuring method as claimed in claim 5 or 6, characterized in that the DC source is replaced by an energy storage capacitor.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117192443A (en) * | 2023-11-03 | 2023-12-08 | 常州同惠电子股份有限公司 | Test method and test system for turn-to-turn tester |
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| CN117192443B (en) * | 2023-11-03 | 2024-02-09 | 常州同惠电子股份有限公司 | Test method and test system for turn-to-turn tester |
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