CN114083456A - Non-nailing high-power microwave radio frequency device test fixture - Google Patents

Non-nailing high-power microwave radio frequency device test fixture Download PDF

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Publication number
CN114083456A
CN114083456A CN202111274721.8A CN202111274721A CN114083456A CN 114083456 A CN114083456 A CN 114083456A CN 202111274721 A CN202111274721 A CN 202111274721A CN 114083456 A CN114083456 A CN 114083456A
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CN
China
Prior art keywords
pressing plate
sleeve
power microwave
nailing
test fixture
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Pending
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CN202111274721.8A
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Chinese (zh)
Inventor
赵鑫燚
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CETC 13 Research Institute
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CETC 13 Research Institute
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Application filed by CETC 13 Research Institute filed Critical CETC 13 Research Institute
Priority to CN202111274721.8A priority Critical patent/CN114083456A/en
Publication of CN114083456A publication Critical patent/CN114083456A/en
Pending legal-status Critical Current

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25BTOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
    • B25B11/00Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders

Abstract

The invention provides a non-nailing high-power microwave radio frequency device test fixture, which belongs to the technical field of product debugging and testing of semiconductor high-power devices and comprises a base, a plurality of positioning columns, a pressing block assembly and a sleeve assembly, wherein the upper end of the base is suitable for accommodating a product test box, the plurality of positioning columns are uniformly distributed at the upper end of the base and positioned outside an accommodating area, the pressing block assembly is arranged on the plurality of positioning columns and comprises a lower pressing plate and an upper pressing plate, the distance between the lower pressing plate and the upper pressing plate is adjustable, the upper pressing plate can be locked with the positioning columns, a product contact suitable for contacting the product test box is arranged at the bottom end of the lower pressing plate, the sleeve assembly is arranged between the upper pressing plate and the lower pressing plate and comprises a lower sleeve and an upper sleeve which are in threaded connection, and the lower sleeve is used for driving the contact to tightly press the product test box after rotating. The non-nailing high-power microwave radio frequency device test fixture provided by the invention has the technical effects that the product contact can be fastened to the test box by screwing the sleeve component without fastening by using screws, the operation speed is high, the efficiency is high, and the product test efficiency is improved.

Description

Non-nailing high-power microwave radio frequency device test fixture
Technical Field
The invention belongs to the technical field of debugging and testing of semiconductor high-power device products, and particularly relates to a non-nailing high-power microwave radio frequency device test fixture.
Background
At present, in the field of manufacturing microwave radio frequency devices in China, particularly for manufacturing microwave devices such as high-power GaAs and GaN, when products need to be debugged and tested, most of the microwave radio frequency devices adopt a test mode of fastening the products to a test box by using screws so that contacts on the products contact the test box, and the test mode has good grounding effect and is stable in the test process, but the test efficiency of the test mode is extremely low, the heat dissipation performance is general, and the screws are easy to scratch the products in the operation.
Disclosure of Invention
The invention aims to provide a non-nailing high-power microwave radio frequency device test fixture, and aims to solve the technical problem that the test operation efficiency is low when a product is fastened to a test box by using a screw.
In order to achieve the purpose, the invention adopts the technical scheme that: the provided nail-free high-power microwave radio frequency device test fixture comprises a base, a plurality of positioning columns, a pressing block assembly and a sleeve assembly; the upper end of the base is provided with an accommodating area suitable for accommodating the product testing box; the positioning columns are uniformly distributed at the upper end of the base and are positioned outside the accommodating area; the pressing block assembly is arranged on the positioning columns and comprises a lower pressing plate and an upper pressing plate, the distance between the lower pressing plate and the upper pressing plate is adjustable, through holes which are communicated with each other and communicated with the accommodating area are formed in the middle parts of the lower pressing plate and the upper pressing plate, a plurality of locking holes suitable for being locked with the positioning columns are formed in the edge part of the upper pressing plate, a plurality of inserting holes which are aligned with the locking holes one by one are formed in the edge part of the lower pressing plate, the inserting holes and the locking holes are all sleeved on the positioning columns, and product contacts suitable for being in contact with a product testing box are arranged at the bottom ends of the lower pressing plate; the sleeve assembly comprises a lower sleeve and an upper sleeve, the lower sleeve is connected with the upper end of the lower pressing plate, the upper end of the upper sleeve is connected with the lower end of the upper pressing plate, the lower sleeve is in threaded connection with the upper sleeve, and the lower sleeve is used for driving the contact to compress the product testing box after rotating.
In a possible implementation manner, the non-nailing high-power microwave radio-frequency device test fixture further comprises a handle which is arranged above the upper pressure plate and one end of which is connected with the upper end of the lower sleeve, and the handle is screwed to drive the lower sleeve to rotate and push the lower pressure plate to move.
In a possible implementation manner, a fan used for dissipating heat during testing is detachably connected to the bottom end face of the base.
In a possible implementation manner, the outer wall of the lower sleeve is provided with external threads, the inner wall of the upper sleeve is provided with internal threads, and the upper sleeve is sleeved on the lower sleeve and is in threaded connection with the lower sleeve.
In a possible implementation manner, the lower pressing plate is provided with a circular groove which is suitable for accommodating the lower end of the lower sleeve, and the lower sleeve rotates in the groove and is used for pushing the lower pressing plate to move.
In a possible implementation manner, a bearing piece is arranged in the groove, the lower end of the lower sleeve abuts against the upper end of the bearing piece, and the upper sleeve, the lower sleeve and the bearing piece are coaxially arranged.
In a possible implementation mode, the lockhole is rectangular arc, the lockhole is inside to have and to be suitable for the messenger the reference column pass wear the hole, still have be used for with the locking portion of reference column upper end joint locking, wear the hole with locking portion intercommunication, wear the hole cover and revolve the twisting on the reference column the top board can make locking portion with the reference column joint is locked, with locking the top board.
In a possible implementation manner, one end of the handle connected with the upper end of the lower sleeve is in a circular ring shape, the other end of the handle is used for holding a hand, and the circular ring shape is matched with the circular shape of the lower sleeve.
In a possible implementation manner, the through holes in the lower pressing plate are square, the through holes in the upper pressing plate are circular, and the shapes of the upper pressing plate and the lower pressing plate are both made of PPS materials.
In one possible implementation, the bottom end of the base has a plurality of legs with adjustable height.
The nailing-free high-power microwave radio frequency device test fixture provided by the invention has the beneficial effects that: compared with the prior art, the non-nailing high-power microwave radio frequency device test fixture comprises a base, a plurality of positioning columns, a pressing block assembly and a sleeve assembly, wherein the upper end of the base is provided with an accommodating area suitable for accommodating a product test box, the plurality of positioning columns are uniformly distributed at the upper end of the base and positioned outside the accommodating area, the pressing block assembly is arranged on the plurality of positioning columns and comprises a lower pressing plate and an upper pressing plate, the interval between the lower pressing plate and the upper pressing plate is adjustable, the upper pressing plate can be locked with the positioning columns, the bottom end of the lower pressing plate is provided with a product contact suitable for contacting the product test box, the sleeve assembly is arranged between the upper pressing plate and the lower pressing plate and comprises a lower sleeve and an upper sleeve which are in threaded connection, the lower sleeve is used for driving the contact to press the product test box tightly after rotating, the technical problem that the product is fastened to the test box by using screws is solved, the test operation efficiency is low, the non-fastening screws are not used, the product contact can be fastened to the test box by screwing the sleeve assembly, the operation speed is high, the efficiency is high, and the technical effect of improving the product testing efficiency is achieved.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a non-nailing high-power microwave RF device testing fixture provided in an embodiment of the present invention;
fig. 2 is a schematic structural diagram of the non-nailing high-power microwave rf device test fixture according to the embodiment of the present invention in a state where the test box is not mounted after the positioning column and the pressing block assembly are separated;
FIG. 3 is a schematic structural diagram of the non-nailing high-power microwave RF device testing fixture according to the embodiment of the present invention in a state where the testing box is installed after the positioning column and the pressing block assembly are separated;
FIG. 4 is a half-sectional view of a nailless high power microwave RF device test fixture in an exploded state according to an embodiment of the present invention;
FIG. 5 is a half-sectional view of a non-nailing high-power microwave RF device testing fixture provided by an embodiment of the present invention;
FIG. 6 is a top view of a non-nailing high-power microwave RF device testing fixture provided by an embodiment of the present invention;
FIG. 7 is a bottom view of a non-nailing high-power microwave RF device testing fixture provided by an embodiment of the present invention;
FIG. 8 is a left side view of a non-nailing high-power microwave RF device testing fixture provided by an embodiment of the present invention;
FIG. 9 is a right side view of a non-nailing high power microwave RF device testing fixture provided by an embodiment of the present invention;
FIG. 10 is a front view of a non-nailing high-power microwave RF device testing fixture provided by an embodiment of the present invention;
fig. 11 is a rear view of a non-nailing high-power microwave rf device testing fixture provided by an embodiment of the present invention.
Description of reference numerals:
1. a base; 11. an accommodating area; 2. a positioning column; 3. a briquetting assembly; 31. a lower pressing plate; 32. an upper pressure plate; 33. through holes; 34. a lock hole; 341. a penetration hole; 342. a locking portion; 35. a jack; 36. a groove; 37. a bearing member; 4. a sleeve assembly; 41. a lower sleeve; 42. an upper sleeve; 43. a raised structure; 5. a test cartridge; 6. a contact; 7. a boss; 8. a handle; 9. a fan; 10. and (3) a support leg.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Referring to fig. 1 to fig. 11, a non-nailing high-power microwave rf device testing fixture provided by the present invention will now be described. The non-nailing high-power microwave radio frequency device test fixture comprises a base 1, a plurality of positioning columns 2, a pressing block assembly 3 and a sleeve assembly 4; the upper end of the base 1 is provided with an accommodating area 11 suitable for accommodating the product testing box 5; the positioning columns 2 are uniformly distributed at the upper end of the base 1 and are positioned outside the accommodating area 11; the pressing block assembly 3 is arranged on the positioning columns 2 and comprises a lower pressing plate 31 and an upper pressing plate 32, the distance between the lower pressing plate 31 and the upper pressing plate 32 is adjustable, through holes 33 which are mutually communicated are formed in the middle parts of the lower pressing plate 31 and the upper pressing plate 32 and are communicated with the accommodating area 11, a plurality of locking holes 34 suitable for being locked with the positioning columns 2 are formed in the edge parts of the upper pressing plate 32, a plurality of inserting holes 35 which are aligned with the locking holes 34 one by one are formed in the edge parts of the lower pressing plate 31, the inserting holes 35 and the locking holes 34 are sleeved on the positioning columns 2, and product contacts 6 suitable for being in contact with the product testing boxes 5 are arranged at the bottom ends of the lower pressing plate 31; the sleeve assembly 4 comprises a lower sleeve 41 and an upper sleeve 42, the lower end of the lower sleeve 41 is connected with the upper end of the lower pressing plate 31, the upper end of the upper sleeve 42 is connected with the lower end of the upper pressing plate 32, the lower sleeve 41 is in threaded connection with the upper sleeve 42, and the lower sleeve 41 is used for driving the contact 6 to compress the product testing box 5 after rotating.
Compared with the prior art, the non-nailing high-power microwave radio frequency device test fixture comprises a base 1, a plurality of positioning columns 2, a pressing block component 3 and a sleeve component 4, wherein the upper end of the base 1 is provided with an accommodating area 11 suitable for accommodating a product test box 5, the plurality of positioning columns 2 are uniformly distributed at the upper end of the base 1 and are positioned outside the accommodating area 11, the pressing block component 3 is arranged on the plurality of positioning columns 2 and comprises a lower pressing plate 31 and an upper pressing plate 32, the distance between the lower pressing plate 31 and the upper pressing plate 32 is adjustable, the upper pressing plate 32 can be locked with the positioning columns 2, the bottom end of the lower pressing plate 31 is provided with a product contact 6 suitable for contacting the product test box 5, the sleeve component 4 is arranged between the upper pressing plate 32 and the lower pressing plate 31 and comprises a lower sleeve 41 and an upper sleeve 42 which are in threaded connection, the lower sleeve 41 is used for driving the contact 6 to tightly press the product test box 5 after rotating, the technical problem of fastening a product to the test box 5 by using a screw and having low test operation efficiency is solved, the technical effects that the product contact 6 can be fastened to the test box 5 by screwing the sleeve component 4 without fastening the screw are achieved, the operation speed is high, the efficiency is high, and the product test efficiency is improved.
In general, a product needs to be fastened by four screws, the torque parameter of the product is measured according to the pressure applied to the product, an M2 type screw is used, under a good test state, the torque of a single screw is 2.5kgf/cm, the result is 0.245N.m through a formula, and the result is about 50Kg through torque conversion, so that the resultant force F of the four screws is about 200 Kg.
In order to output large torque by using a small tool, a principle of torque amplification is required, such as a principle similar to a jack, and after repeated tests, in order to realize short-stroke and large-torque output, a sleeve assembly 4 with an outer diameter of 60cm and a thread pitch of 3mm is finally determined to be used as a core output component, namely a driving component for driving a contact 6 to contact a test box 5.
Through setting up reference column 2, can make accurate placing of briquetting subassembly 3 on reference column 2, contactless test box 5 prevents that product contact 6 from touching base 1 etc. has realized the spacing effect to briquetting subassembly 3, prevents to cause the device damage. Briquetting subassembly 3 is high temperature resistant, corrosion-resistant, wear resistant PPS material, can be in 200 ℃ environment long-term stable work, and life is in 3-4 years, is equipped with the gusset of stainless steel material simultaneously and does the structural reinforcement, long service life, and the reliability is high.
Two groups of boss 7 which are in a pi shape are arranged on the base 1 in parallel, the two groups of bosses 7 are arranged at intervals, the areas which are separated from each other are accommodating areas 11, two positioning columns 2 are arranged on each group of bosses 7, four positioning columns 2 are arranged totally, the height of the boss 7 is larger than that of the test box 5, the pressing block assembly 3 is used for providing downward driving force for the product contact 6, the product contact 6 is driven to move towards the test box 5, the active contact between the two is finally realized, and the use of later-stage tests is facilitated. Interval is adjusted through sleeve subassembly 4 between top board 32 and the lower pressure plate 31 exactly, thereby realized compressing tightly to product contact 6, because reference column 2 is four, then the quantity of jack 35 and lockhole 34 also respectively is four, all with reference column 2 set up the position and align, reference column 2 is exactly the body of rod or cylinder or the bolt that the top has the hood, reference column 2 can reciprocate in jack 35, the internal diameter of jack 35 and lockhole 34 is greater than reference column 2's external diameter, consequently, reference column 2 can not appear pressing block subassembly 3 locking card dead phenomenon. The lock hole 34 is clamped with the top cap at the upper end of the positioning column 2, and the upper pressing plate 32 can be fixed through the top cap.
Specifically, the structure of the lock hole 34 is similar to the structure of a rear hanging hole of a clock hung on a wall body seen in daily life, and the lock hole 34 is 8-shaped or gourd-shaped, the positioning column 2 is inserted from a part with a larger inner diameter, the positioning column 2 moves to a part with a smaller inner diameter through the sliding of the lock hole 34, and the lock hole 34 is fixed with the positioning column 2 through the clamping of a top cap.
The angle of rotation of the lower sleeve 41 is determined by the spacing between the product contacts 6 and the test cartridge 5, regardless of the spacing, by screwing the sleeve 41 off to bring the product contacts 6 into contact with both the test cartridge 5.
The test box 5 is a self-contained test box 5 of a product, and the product contacts 6 are two contacts 6 on the product, so that the purpose of butt joint with the contacts 6 on the test box 5 is convenient for later test use. The mode of using four screws to lock among the prior art has been overcome, is convenient for realize not having the nailing and compress tightly fixedly.
In some embodiments, referring to fig. 1 to 11, the non-nailing high-power microwave rf device testing fixture further includes a handle 8 disposed above the upper pressing plate 32 and having one end connected to the upper end of the lower sleeve 41, wherein the screwing handle 8 is used for driving the lower sleeve 41 to rotate and pushing the lower pressing plate 31 to move. The handle 8 and the upper sleeve 42 are mutually matched and connected or connected in a detachable connection mode, the handle 8 is installed when the handle is used, and the handle 8 can be conveniently taken down when not used.
In this embodiment, the setting of handle 8 has utilized lever principle, through the outer end of hand gripping handle 8, can drive sleeve 42 circumference rotation after the rotation, and the operation is labour saving and time saving, then can drive product contact 6 and compress tightly to test box 5, compares in through four screws, fixes contact 6 on test box 5, and handle 8 easy operation is convenient.
In some embodiments, referring to fig. 1 to 11, a fan 9 for dissipating heat during testing is detachably connected to the bottom end surface of the base 1. Fan 9 can be connected with external power source, and fan 9 rotates after the circular telegram to can dispel the heat to the product in the test procedure, prevent that the high temperature in the test from influencing the test.
By arranging the fan 9, the technical problems that the temperature is high and the heat can not be dissipated in the process of testing the microwave radio frequency device are solved.
Specifically, the upper end of fan 9 is equipped with a plurality of sucking discs, and the sucking disc can attract on base 1, and then can dismantle the mode accessible sucking disc of connection and realize to fix fan 9 on base 1. When the fan 9 is not needed, the fan can be conveniently taken down.
The base 1 is made of brass materials, and stability is guaranteed.
In some embodiments, referring to fig. 1 to 11, the outer wall of the lower sleeve 41 is provided with external threads, the inner wall of the upper sleeve 42 is provided with internal threads, and the upper sleeve 42 is sleeved on the lower sleeve 41 and is connected with the lower sleeve 41 in a threaded manner. The upper sleeve 42 is provided with a protrusion 43 on its outer circumference, the protrusion 43 is used to fixedly connect with the upper pressing plate 32, and the handle 8 is connected with the upper end of the lower sleeve 41 by a plurality of connectors (e.g. screws). The lower sleeve 41 is the inner sleeve and the upper sleeve 42 is the outer sleeve.
Threaded connection can realize the effect similar to the jack, makes product contact 6 firmly compress tightly on test box 5, makes things convenient for the later stage test to use. In the embodiment, the handle 8 is screwed once, so that the compressing effect of four screws can be realized, the operation speed is high, the efficiency is improved, and the time and the labor are saved.
In some embodiments, referring to fig. 1 to 11, the lower pressing plate 31 has a circular groove 36 adapted to receive the lower end of the lower sleeve 41, and the lower sleeve 41 rotates in the groove 36 and is used to push the lower pressing plate 31 to move. Because the lower pressing plate 31 can move up and down relative to the upper pressing plate 32, in order to ensure that the lower sleeve 41 can stably push the lower pressing plate 31 to move, the lower pressing plate 31 is provided with the groove 36, the lower end of the lower sleeve 41 can be completely clamped in the groove 36, and when the lower sleeve 41 rotates, the lower end rotates in the groove 36, so that the lower pressing plate 31 can be pushed to move downwards.
In order to reduce the wear of the lower sleeve 41 on the lower press plate 31, in some embodiments, referring to fig. 3 to 5, a bearing member 37 is disposed in the groove 36, the lower end of the lower sleeve 41 abuts against the upper end of the bearing member 37, and the upper sleeve 42, the lower sleeve 41 and the bearing member 37 are coaxially arranged. The bearing piece 37 adopts an axially-loaded bearing, can bear a certain axial force, the lower sleeve 41 acts on the axial force of the bearing, the bearing can be driven to rotate, the lower end of the bearing can be fixed in the groove 36, and therefore the technical effect of reducing the abrasion of the lower sleeve 41 to the groove 36 is achieved through the bearing.
In some embodiments, referring to fig. 1 to 11, the locking hole 34 is in a long arc shape, the locking hole 34 has an insertion hole 341 through which the positioning column 2 can pass and a locking portion 342 for being clamped and locked with the upper end of the positioning column 2, the insertion hole 341 is communicated with the locking portion 342, the insertion hole 341 is sleeved on the positioning column 2, and the upper pressing plate 32 is screwed to lock the locking portion 342 and the positioning column 2 in a clamping manner, so as to lock the upper pressing plate 32. The locking portion 342 is 8-shaped or gourd-shaped.
The locking hole 34 in this embodiment is a quick-mounting structure, and after the through hole 341 and the insertion hole 35 are both sleeved on the positioning column 2, the upper pressing plate 32 is independently screwed, so that the upper pressing plate 32 rotates around the center, the locking portion 342 is actively locked with the positioning column 2 in a clamping manner, and at this time, the upper pressing plate 32 is fixed, and the lower pressing plate 31 can move upward (by screwing the sleeve assembly 4).
In some embodiments, referring to fig. 1 to 11, one end of the handle 8 connected to the upper end of the lower sleeve 41 is circular, and the other end is used for hand holding, and the circular shape is matched with the circular shape of the lower sleeve 41. The circular end of the handle 8 is detachably connected to the upper end of the lower sleeve 41 by a plurality of connecting members (e.g., screws), and when the handle 8 is screwed, the lower sleeve 41 is screwed and rotated with respect to the upper sleeve 42.
In some embodiments, referring to fig. 1 to 11, the through holes 33 of the lower pressing plate 31 are square, the through holes 33 of the upper pressing plate 32 are circular, and the shapes of the upper pressing plate 32 and the lower pressing plate 31 are made of PPS material. The test box 5 can be seen from the middle position of the test box when the upper end of the test box is overlooked, namely, the middle parts of the handle 8, the briquetting assembly 3 and the sleeve assembly 4 are all cavities.
In some embodiments, referring to fig. 1 to 11, the bottom end of the base 1 has a plurality of height-adjustable legs 10. The height of the supporting foot 10 can be adjusted, and the adjustable supporting foot in the prior art can be adopted, thereby ensuring the use stability of the base 1. The height of the base 1 can also be adjusted by means of a plurality of feet 10.
Compared with the fixing mode in the prior art, the fixing mode of the product contact 6 and the test box 5 improves the test operation efficiency by about 450 percent and the overall efficiency by 4.6 times.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims (10)

1. The no nailing high-power microwave radio frequency device test fixture is characterized by comprising:
the upper end of the base is provided with an accommodating area suitable for accommodating the product test box;
the positioning columns are uniformly distributed at the upper end of the base and are positioned outside the accommodating area;
the pressing block assembly is arranged on the positioning columns and comprises a lower pressing plate and an upper pressing plate, the distance between the lower pressing plate and the upper pressing plate is adjustable, through holes which are communicated with each other and communicated with the accommodating area are formed in the middle parts of the lower pressing plate and the upper pressing plate, a plurality of locking holes suitable for being locked with the positioning columns are formed in the edge part of the upper pressing plate, a plurality of jacks which are aligned with the locking holes one by one are formed in the edge part of the lower pressing plate, the jacks and the locking holes are all sleeved on the positioning columns, and product contacts suitable for being in contact with product testing boxes are arranged at the bottom ends of the lower pressing plate; and
the sleeve assembly comprises a lower sleeve and an upper sleeve, the lower sleeve is connected with the upper end of the lower pressing plate, the upper end of the upper sleeve is connected with the lower end of the upper pressing plate, the lower sleeve is in threaded connection with the upper sleeve, and the lower sleeve is used for driving the contact to compress the product testing box after rotating.
2. The nailing-free high-power microwave radio frequency device test fixture as claimed in claim 1, further comprising a handle arranged above the upper pressure plate and having one end connected with the upper end of the lower sleeve, wherein the handle is screwed to drive the lower sleeve to rotate and push the lower pressure plate to move.
3. The nailless high-power microwave RF device test fixture of claim 1, wherein a fan for dissipating heat during testing is detachably connected to the bottom end surface of the base.
4. The nailing-free high-power microwave radio frequency device test fixture as claimed in claim 1, wherein the outer wall of the lower sleeve is provided with external threads, the inner wall of the upper sleeve is provided with internal threads, and the upper sleeve is sleeved on the lower sleeve and is in threaded connection with the lower sleeve.
5. The nailless high power microwave rf device test fixture of claim 1, wherein the lower platen has a circular groove adapted to receive a lower end of the lower sleeve, the lower sleeve rotating within the groove and adapted to push the lower platen to move.
6. The nailing-free high-power microwave radio frequency device test fixture according to claim 5, wherein a bearing member is arranged in the groove, the lower end of the lower sleeve abuts against the upper end of the bearing member, and the upper sleeve, the lower sleeve and the bearing member are coaxially arranged.
7. The non-nailing high-power microwave radio frequency device test fixture as claimed in claim 1, wherein the locking hole is in the shape of an elongated arc, the locking hole is internally provided with a through hole for the positioning column to pass through, and a locking portion for being clamped and locked with the upper end of the positioning column, the through hole is communicated with the locking portion, the through hole is sleeved on the positioning column, and the upper pressing plate is screwed to clamp and lock the locking portion and the positioning column so as to lock the upper pressing plate.
8. The nailing-free high-power microwave radio frequency device test fixture as claimed in claim 2, wherein one end of the handle connected with the upper end of the lower sleeve is in a ring shape, the other end of the handle is used for hand holding, and the ring shape is matched with the circle of the lower sleeve.
9. The nailing-free high-power microwave radio frequency device test fixture according to claim 1, wherein the through holes on the lower pressure plate are square, the through holes on the upper pressure plate are circular, and the shapes of the upper pressure plate and the lower pressure plate are made of PPS material.
10. The nailless high power microwave rf device test fixture of claim 1, wherein the base includes a plurality of legs at a bottom end thereof, the legs being adjustable in height.
CN202111274721.8A 2021-10-29 2021-10-29 Non-nailing high-power microwave radio frequency device test fixture Pending CN114083456A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202111274721.8A CN114083456A (en) 2021-10-29 2021-10-29 Non-nailing high-power microwave radio frequency device test fixture

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Application Number Priority Date Filing Date Title
CN202111274721.8A CN114083456A (en) 2021-10-29 2021-10-29 Non-nailing high-power microwave radio frequency device test fixture

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Publication Number Publication Date
CN114083456A true CN114083456A (en) 2022-02-25

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020153877A1 (en) * 2000-05-03 2002-10-24 Harris Daniel L. Indexing rotatable chuck for a probe station
CN201532942U (en) * 2009-08-11 2010-07-21 中芯国际集成电路制造(上海)有限公司 Manually-driven test adapter
CN208520897U (en) * 2018-06-20 2019-02-19 深圳市鑫世佳电子科技有限公司 A kind of flexible circuitry board test device improving positioning accuracy
CN209878237U (en) * 2019-11-26 2019-12-31 武汉中极氢能产业创新中心有限公司 Testing device for membrane electrode sealing performance
CN210863973U (en) * 2019-09-20 2020-06-26 广东超川电子科技有限公司 Stator performance detection equipment
CN212341370U (en) * 2020-03-12 2021-01-12 深圳市均特利科技有限公司 Mechanical positioning type PCB product test seat

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020153877A1 (en) * 2000-05-03 2002-10-24 Harris Daniel L. Indexing rotatable chuck for a probe station
CN201532942U (en) * 2009-08-11 2010-07-21 中芯国际集成电路制造(上海)有限公司 Manually-driven test adapter
CN208520897U (en) * 2018-06-20 2019-02-19 深圳市鑫世佳电子科技有限公司 A kind of flexible circuitry board test device improving positioning accuracy
CN210863973U (en) * 2019-09-20 2020-06-26 广东超川电子科技有限公司 Stator performance detection equipment
CN209878237U (en) * 2019-11-26 2019-12-31 武汉中极氢能产业创新中心有限公司 Testing device for membrane electrode sealing performance
CN212341370U (en) * 2020-03-12 2021-01-12 深圳市均特利科技有限公司 Mechanical positioning type PCB product test seat

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