CN114063328A - Liquid crystal panel display abnormity analysis method and analysis system - Google Patents

Liquid crystal panel display abnormity analysis method and analysis system Download PDF

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Publication number
CN114063328A
CN114063328A CN202111361034.XA CN202111361034A CN114063328A CN 114063328 A CN114063328 A CN 114063328A CN 202111361034 A CN202111361034 A CN 202111361034A CN 114063328 A CN114063328 A CN 114063328A
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display
panel
bad
abnormal
compensation
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CN202111361034.XA
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Chinese (zh)
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杨锁
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LG Display Optoelectronics Technology China Co Ltd
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LG Display Optoelectronics Technology China Co Ltd
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]

Abstract

The invention discloses a method and a system for analyzing display abnormity of a liquid crystal panel, wherein the method comprises the following steps: acquiring a bad panel, wherein the bad panel is a panel with a preset bad display phenomenon; adjusting compensation parameters of an organic light emitting unit of the poor panel, and determining a display abnormal position based on a display picture under at least one group of compensation parameters; carrying out fault detection on the driving module of the bad panel according to the abnormal display position, and determining a bad cause according to a fault detection result; acquiring a first optical image of the poor panel under a first magnification, and acquiring a characteristic defect based on the first optical image; and (4) according to the characteristic defects and the engineering history, carrying out abnormity analysis on the process and the equipment, and determining the cause of the failure. By integrating specific display failure phenomena and types, a corresponding abnormal analysis method is executed, the cause of the display failure is accurately searched, the probability of failure in display failure analysis is reduced, and the yield is improved.

Description

Liquid crystal panel display abnormity analysis method and analysis system
Technical Field
The invention relates to the technical field of display, in particular to a method and a system for analyzing display abnormity of a liquid crystal display panel.
Background
The liquid crystal panel is an important component of the liquid crystal display, and the quality of the liquid crystal panel is directly related to the overall performance of the liquid crystal display.
In the manufacturing process of the liquid crystal panel, a plurality of forming processes, such as an array process, a color film process, a box forming process and a module assembling process, are included, and display defects such as poor dot, poor line or uneven display brightness of the liquid crystal panel may occur due to non-uniformity of any one process or design. Fig. 1 is a schematic diagram illustrating a conventional display defect. As shown in fig. 1, in the display screen of the liquid crystal panel 00, full-screen or half-screen spacing horizontal stripes appear, and such liquid crystal panels are generally discarded directly, which results in waste of materials.
In order to reduce the influence of the poor display problem on the liquid crystal display, the prepared liquid crystal panel needs to be detected, and the problem of poor display caused by the poor display needs to be searched and solved. In the prior art, the display failure analysis is usually performed by identifying and marking a failure position after a tester clicks a screen, and then performing failure confirmation through a high-magnification microscope. The prior art has the following defects: manual operation lacks an effective analysis technique for the cause of failure, resulting in long time for analyzing the cause of failure of a single panel, low efficiency, low accuracy of the manually marked position, affecting the analysis result of the cause of failure, and failure in analyzing the defects in all process steps due to the fact that a high-magnification optical microscope cannot analyze the defects, for example, the defects of circuits in a module are difficult to identify through manual observation, resulting in failure of analyzing the failure or inaccurate analysis result.
Disclosure of Invention
The invention aims to: the method and the system for analyzing the display abnormality of the liquid crystal panel integrate specific display defect phenomena and types, execute a strategic abnormality analysis method, can accurately search the cause of the display defect, and reduce the probability of failure in analysis of the display defect.
In order to achieve the purpose, the invention adopts the following technical scheme:
the method for analyzing the display abnormality of the liquid crystal panel comprises the following steps:
obtaining a bad panel, wherein the bad panel is a panel with a preset bad display phenomenon;
adjusting compensation parameters of the organic light-emitting unit of the poor panel, and determining a display abnormal position based on a display picture corresponding to at least one group of compensation parameters;
carrying out fault detection on the driving module of the bad panel according to the display abnormal position, and determining a bad cause according to a fault detection result;
acquiring a first optical image of the poor panel under a first magnification, and acquiring a first characteristic defect based on the first optical image;
and according to the first characteristic defect and the engineering history, carrying out abnormity analysis on the process and the equipment, and determining a bad cause, wherein the engineering history is a record of the preparation process of the bad panel.
As a preferable aspect of the abnormality analysis method, the detecting a failure of the driving module of the defective panel according to the display abnormal position includes: acquiring a target main control chip corresponding to the display abnormal position; replacing the target main control chip; acquiring a first display picture of the bad panel after the target main control chip is replaced; performing preset display bad phenomenon detection on the first display picture, and judging whether a bad cause is abnormal of the main control chip according to a detection result; and detecting the output voltage of the target main control chip with abnormality, and determining the abnormality type of the target main control chip according to the detection result of the output voltage.
As a preferable aspect of the abnormality analysis method, the failure detection of the drive module of the defective panel further includes: acquiring an abnormal display area corresponding to the first display picture; determining a corresponding module abnormal part according to the abnormal display area; measuring impedance of the abnormal module, and determining an abnormal TAB area according to the impedance measurement result; repairing the abnormal TAB area; acquiring a second display picture of the poor panel after the repair of the TAB area; and detecting a preset display bad phenomenon on the second display picture, and judging whether a bad cause is TAB area abnormity according to a phenomenon detection result.
As a preferable scheme of the anomaly analysis method, performing compensation parameter adjustment on the organic light emitting unit of the defective panel, and determining a display anomaly position based on a display screen corresponding to at least one group of compensation parameters includes: applying a gray compensation voltage to at least one color channel of the organic light-emitting unit to obtain a compensation display picture; adjusting the voltage value of the gray compensation voltage to gradually change the gray value of the compensation display picture from a first preset gray value to a second preset gray value; and carrying out coordinate detection on the compensation display pictures under different gray values, and determining abnormal display positions according to coordinate detection results.
As a preferable embodiment of the anomaly analysis method, the method for adjusting compensation parameters of an organic light emitting unit of the defective panel further includes: removing the internal compensation parameters of the organic light-emitting unit to obtain a non-compensation display picture, wherein the gray value of the non-compensation display picture is gradually changed from a first preset gray value to a second preset gray value; and carrying out coordinate detection on the non-compensation display pictures under different gray values, and determining abnormal display positions according to coordinate detection results.
As a preferable embodiment of the anomaly analysis method, the method for adjusting compensation parameters of an organic light emitting unit of the defective panel further includes: applying an active compensation voltage to the organic light emitting unit, the active compensation voltage being determined according to a difference between the gray compensation voltage and a driving voltage threshold of the organic light emitting unit; and carrying out coordinate detection on the display picture after the active compensation, and determining the abnormal display position according to the coordinate detection result.
As a preferable mode of the abnormality analysis method, after acquiring the display abnormality position, the method further includes: acquiring a second optical image of the bad panel under a second magnification, and reconfirming the display abnormal position based on the second optical image; wherein the second magnification is less than the first magnification.
As a preferable embodiment of the anomaly analysis method, after the first characteristic defect is acquired, the method further includes: removing the packaging cover plate of the bad panel, and obtaining at least one circuit substrate positioned below the packaging cover plate; acquiring a third optical image of the circuit substrate, and acquiring a second characteristic defect based on the third optical image; and performing defect analysis on the second characteristic defect, and determining a bad cause according to a defect analysis result.
As a preferable scheme of the abnormality analysis method, the preset display failure phenomenon is a line failure at equal intervals.
Provided is a liquid crystal panel display abnormality analysis system including:
the reliability detection module is used for acquiring a bad panel, and the bad panel is a panel with a preset bad display phenomenon;
the compensation module is used for adjusting compensation parameters of the organic light-emitting unit of the poor panel and determining the abnormal display position based on the display picture corresponding to at least one group of compensation parameters;
the module abnormity analysis module is used for carrying out fault detection on the driving module of the bad panel according to the display abnormal position and determining a bad cause according to a fault detection result;
the optical detection module is used for acquiring a first optical image of the poor panel under a first magnification and acquiring a first characteristic defect based on the first optical image;
and the process anomaly analysis module is used for carrying out anomaly analysis on the process and the equipment according to the first characteristic defects and the engineering history, and determining the cause of the failure, wherein the engineering history is the record of the preparation process of the panel with the failure.
The invention has the beneficial effects that: by adjusting compensation parameters of the organic light emitting units of the display panel, integrating specific display failure phenomena and types, and executing a strategic failure analysis method for different display failure positions and characteristic defects, the cause of the display failure can be accurately searched, the probability of failure of the display failure analysis is reduced, the display failure analysis efficiency is improved, the problem of the display failure of the panel is fundamentally solved, the yield is improved, and the waste is avoided.
Drawings
The invention is explained in more detail below with reference to the figures and examples.
Fig. 1 is a schematic diagram illustrating a conventional display defect.
Fig. 2 is a flowchart of a method for analyzing abnormality of a liquid crystal panel according to a first embodiment of the present invention.
Fig. 3 is a flowchart of an abnormality analysis method for a liquid crystal panel according to a second embodiment of the present invention.
Fig. 4 is a flowchart of an abnormality analysis method for an lcd panel according to a third embodiment of the present invention.
Fig. 5 is a flowchart of an abnormality analysis method for an lcd panel according to a fourth embodiment of the present invention.
Fig. 6 is a flowchart of an abnormality analysis method for an lcd panel according to a fifth embodiment of the present invention.
Fig. 7 is a flowchart of an abnormality analysis method for an lcd panel according to a sixth embodiment of the present invention.
Fig. 8 is a flowchart of an abnormality analysis method for an lcd panel according to a seventh embodiment of the present invention.
Fig. 9 is a flowchart of an abnormality analysis method for a liquid crystal panel according to an eighth embodiment of the present invention.
Fig. 10 is a schematic structural diagram of an lcd panel display abnormality analysis system according to a ninth embodiment of the present invention.
Detailed Description
Advantages and features of the present invention and methods of accomplishing the same will become apparent with reference to the following detailed description of the embodiments taken in conjunction with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but may be implemented in various forms, which are provided only to complete the disclosure of the present invention and make those skilled in the art sufficiently understand the scope of the present invention, and the present invention is limited only by the scope of the claims. Like reference numerals denote like constituent elements throughout the specification.
Hereinafter, the present invention is described in detail with reference to the accompanying drawings.
Fig. 2 is a flowchart of a method for analyzing a display abnormality of a liquid crystal panel according to a first embodiment of the present invention, wherein the method is used for analyzing a cause of a horizontal line defect of the liquid crystal panel.
As shown in fig. 2, the display abnormality analysis method specifically includes the steps of:
step S1: and acquiring a bad panel, wherein the bad panel is a panel with a preset bad display phenomenon.
Alternatively, the predetermined display defect may be an equally spaced line defect, wherein the equally spaced line defect may be an equally spaced horizontal line defect.
In this embodiment, a dot screen test can be performed on the prepared liquid crystal panel (i.e., a display signal is provided to the liquid crystal cell), and the liquid crystal panel which generates the preset display failure phenomenon is screened out through observation and is used as a failure panel for subsequent abnormal analysis. In the process of the point screen test, the liquid crystal panel can be driven to display a white picture, so that the phenomenon of poor display can be conveniently identified.
Further, the prepared liquid crystal panel may be subjected to a dot screen test in a reliability test environment, where the environment temperature is greater than or equal to a preset temperature threshold (e.g., the preset temperature threshold may be 60 ℃), and the environment humidity is greater than or equal to a preset humidity threshold (e.g., the preset humidity threshold may be 50%).
Step S2: and adjusting compensation parameters of the organic light-emitting unit of the bad panel, and determining the abnormal display position based on the display picture corresponding to at least one group of compensation parameters.
The compensation parameter is a compensation voltage or a compensation current applied to a driving circuit of the organic light emitting unit, and the display gray scale value of the organic light emitting unit can be changed by adjusting the value of the compensation parameter.
In this embodiment, the organic light emitting units include a red organic light emitting unit, a green organic light emitting unit, and a blue organic light emitting unit, and in the compensation parameter adjusting process, the display image of the defective panel can be maintained in a single color, which can be any one of red, green, blue, or gray. The abnormal position can be positioned and displayed by acquiring the coordinates of any point on the horizontal line in the display picture or the coordinates of any point on the scanning line.
Step S3: and carrying out fault detection on the drive module of the bad panel according to the display abnormal position, and determining a bad cause according to a fault detection result.
In this embodiment, the driving module includes main control chips C-PCBs, source driver chips S-PCBs, and TAB (Tape Automated Bonding) regions, where each main control chip C-PCB correspondingly drives a plurality of source driver chips S-PCBs, and the source driver chips S-PCBs are attached to the circuit substrate through the TAB regions. When the drive module is subjected to fault testing, fault testing and fault type analysis can be sequentially carried out on the main control chip C-PCB, the source drive chip S-PCB and the TAB area, and the cause of poor display is determined according to the fault testing and fault type analysis results.
Step S4: a first optical image of the defective panel at a first magnification is acquired, and a first characteristic defect is acquired based on the first optical image.
Wherein the first characteristic defect may be a defect for directly determining the characteristic type by an optical microscope, typically the first characteristic defect may include at least one of: foreign matter, bubbles, or repair marks.
Illustratively, the first magnification may be 20 times.
In this embodiment, the optical microscope with the first magnification may be used to sample the defective panel after the compensation parameter adjustment to obtain a first optical image, and the first optical image may be observed or detected to obtain the first characteristic defect and the location of the first characteristic defect.
Step S5: and according to the first characteristic defect and the engineering history, carrying out abnormity analysis on the process and the equipment, and determining a bad cause.
Wherein the engineering history is a record of the preparation process of the poor panel. Typically, the record of the manufacturing process includes, but is not limited to: and the preparation process and the preparation equipment used by the panel analyze the project history by combining the type and the position of the first characteristic defect and judge whether the process or the equipment is abnormal.
Specifically, after the liquid crystal panel is prepared, the liquid crystal panel is subjected to a reliability test, and a preset display defect, such as a defect panel with equal-interval horizontal lines, generated in the test process is screened out. After the bad panel is obtained, applying compensation parameters to the organic light emitting units of the bad panel, obtaining display pictures with different gray values by adjusting the numerical value of the compensation parameters, carrying out preset display bad phenomenon check on the display pictures under each gray value, and if the horizontal line bad phenomenon exists, positioning the abnormal display position in the panel by detecting the coordinate of any point on the horizontal line in the display pictures or the coordinate of the scanning line corresponding to the horizontal line bad phenomenon.
After obtaining the display abnormal position, firstly analyzing whether the cause of the bad panel is abnormal of the driving module: and sequentially carrying out fault test on the main control chip C-PCB, the source electrode driving chip S-PCB and the TAB area of the driving module, and determining the cause of the poor display according to the fault test result. If the driving module is not abnormal, namely the cause of the display failure is not the driving module, observing whether the failure panel has a first characteristic defect such as a foreign matter, a bubble or a repair trace by using an optical microscope with a first magnification, and if the defect position and the preparation process and the preparation equipment corresponding to the defect position can be determined according to the first characteristic defect, analyzing the difference of the corresponding preparation process and the preparation equipment, and determining the number of the failure panel according to the analysis, or determining whether the manufacture process of the failure panel has a process with improper operation, thereby determining the cause of the display failure of the panel. By integrating specific bad display phenomena and types and executing a strategic abnormal analysis method for different abnormal display positions and characteristic defects, the cause of the bad display can be accurately searched, the probability of the failure of the bad display analysis is reduced, the bad display analysis efficiency is improved, the problem of the bad display of the panel is fundamentally solved, the yield is improved, and the waste is avoided.
In one embodiment, when analyzing the abnormality of the process and the equipment based on the engineering history, the method further comprises: the method increases the sampling data of the liquid crystal panels for the abnormal preparation process and equipment, namely, the quantity of the sampled liquid crystal panels is increased on the basis of the original sampling quantity in the liquid crystal panels produced by the abnormal preparation process and equipment, and the abnormal analysis is carried out on the liquid crystal panels with the enlarged sampling quantity one by adopting the method recorded by the invention. By enlarging the sampling data of abnormal processes and equipment, failure analysis caused by abnormal operation is avoided, and accurate finding of a failure cause is facilitated.
Fig. 3 is a flowchart of an analysis method for abnormality display of a liquid crystal panel according to a second embodiment of the present invention, and in this embodiment, a specific implementation of fault detection on a driving module is shown, but not limited to the above steps.
As shown in fig. 3, the display abnormality analysis method specifically includes the steps of:
step S1: and obtaining a poor panel.
Step S2: and adjusting compensation parameters of the organic light-emitting unit of the bad panel, and determining the abnormal display position based on the display picture corresponding to at least one group of compensation parameters.
Step S301: and acquiring a target main control chip corresponding to the abnormal position.
Step S302: and replacing the target main control chip.
Step S303: and acquiring a first display picture of the defective panel after the target main control chip is replaced, and detecting the preset display defect of the first display picture.
In this embodiment, the method described in step S2 may be adopted to obtain the first display screen of the defective panel after the target main control chip is replaced, and perform the display defect detection on the first display screen with different gray values.
In other embodiments, the detection of the display defect may be performed based on the white display frame of the defective panel after the target main control chip is replaced, which is not limited herein.
Step S304: and judging whether the bad cause is the abnormality of the main control chip according to the detection result.
If the target main control chip is replaced and the first display picture does not have the preset poor display phenomenon, judging that the cause of the poor display is abnormal, and executing the step S305; if the target main control chip is replaced and the first display image still has the default display defect, it is determined that the cause of the display defect is not abnormal, and step S4 is executed.
Step S305: and detecting the output voltage of the target main control chip with the abnormality, and determining the abnormal type of the target main control chip according to the detection result of the output voltage.
Step S4: a first optical image of the defective panel at a first magnification is acquired, and a first characteristic defect is acquired based on the first optical image.
Step S5: and according to the first characteristic defect, based on the project history, carrying out abnormity analysis on the process and the equipment, and determining a bad cause.
Specifically, the above steps S301 to S305 show an abnormality analysis method for the main control chip. After the abnormal display position is obtained, the main control chip corresponding to the abnormal display position is determined as a target main control chip, the target main control chip is replaced, a pixel driving signal is applied to a panel after the target main control chip is replaced, and whether a preset display bad phenomenon exists in a display picture after the target main control chip is replaced or not is judged. And if the preset display bad phenomenon still exists in the first display picture after the target main control chip is replaced, judging that the cause of the display bad phenomenon is not the abnormity of the main control chip, and executing a subsequent abnormity analysis step. If the target main control chip is replaced and the preset display defect does not exist in the first display picture, judging that the cause of the display defect is the abnormality of the main control chip, further detecting the output voltage of the replaced target main control chip, determining the abnormality type of the target main control chip according to the output voltage abnormality point, for example, the abnormality of the main control chip body or the connection abnormality of the main control chip, if the main control chip body is abnormal, handing over the abnormal main control chip to a chip supplier for confirming the fault type, being beneficial to fundamentally solving the problem of the panel display defect caused by the abnormality of the main control chip and improving the yield.
Fig. 4 is a flowchart of an abnormality analysis method for an lcd panel according to a third embodiment of the present invention.
As shown in fig. 4, after determining that the cause of the display failure is not the abnormality of the main control chip, the display abnormality analysis method further includes the steps of:
step S401: and acquiring an abnormal display area corresponding to the first display picture.
In this embodiment, the source driver chips in the display area are divided into two pieces, that is, the left source driver chip and the right source driver chip, and when performing fault detection on the driver module, a half-screen driving mode may be adopted, and the step S2 is adopted to perform compensation parameter adjustment on the left display area and the right display area respectively, so as to obtain a display picture in a parameter adjustment process, and the display area where a preset display failure phenomenon is generated is an abnormal display area.
Step S402: and determining the corresponding module abnormal part according to the abnormal display area.
In this embodiment, the abnormal module portion is a source driving circuit component corresponding to the abnormal display region, and the abnormal module portion includes but is not limited to: a level shifter and a TAB area.
Step S403: the module abnormal part is subjected to impedance measurement, and an abnormal TAB area is determined according to the impedance measurement result.
In this embodiment, the determining the abnormal TAB region based on the abnormal portion impedance measurement result includes: firstly, measuring the impedance of an abnormal part of the module, and determining an abnormal module according to the impedance measurement result of the abnormal part; then, the impedance measurement is carried out on a level shift part (level shift) of the abnormal component, and an abnormal interval is determined according to the impedance measurement result of the level shift part; finally, impedance measurement is performed on the TAB area of the abnormal section, and the abnormal TAB area is determined according to the TAB area impedance measurement result.
Step S404: the abnormal TAB area is repaired.
Step S405: a second display screen of the defective panel after the repair of the TAB region is acquired.
In this embodiment, the method described in step S2 may be adopted to acquire the second display screen of the defective panel after the TAB area repair, and perform the display defect detection on the second display screen at different gray values.
In other embodiments, the detection of the display defect may be performed based on the white display screen of the defective panel after the TAB area repair, which is not limited.
Step S406: and detecting a preset display bad phenomenon on the second display picture, and judging whether the bad cause is the TAB area abnormity according to a phenomenon detection result.
If the preset poor display phenomenon does not exist in the second display picture after the TAB area is repaired, judging that the cause of the poor display is the abnormal TAB area, and further analyzing the abnormal cause of the TAB area; if the TAB area is repaired and the second display screen still has the default display defect, it is determined that the cause of the display defect is not the TAB area abnormality, and the following step S4 is performed.
Furthermore, after the abnormal cause of the TAB area is analyzed, if the TAB area caused by the TAB preparation process is judged to be abnormal, the corresponding TAB preparation process is improved, the problem of poor panel display caused by the TAB abnormality is solved fundamentally, and the yield is improved.
As shown in fig. 4, before the abnormal display area corresponding to the first display screen is acquired, the method further includes:
step S400: and judging whether the packaging cover plate is damaged or not in the chip replacing process.
Specifically, in the process of replacing the main control chip, the integrated module needs to be unsealed, and if the package cover plate is damaged in the chip replacement process, the step S4 is directly executed; if the package cover is not damaged during the chip replacement process, the step S401 is executed.
Fig. 5 is a flowchart of a method for analyzing a display abnormality of a liquid crystal panel according to a fourth embodiment of the present invention, and in this embodiment, a specific implementation of obtaining a display abnormality position is exemplarily shown.
As shown in fig. 5, the display abnormality analysis method specifically includes the steps of:
step S1: and acquiring a bad panel generating a preset bad display phenomenon.
Step S201: and applying a gray compensation voltage to at least one color channel of the organic light-emitting unit to obtain a compensation display picture.
The color channels comprise red organic light-emitting units, green organic light-emitting units and blue organic light-emitting units, the gray compensation voltage is applied to the pixel driving circuits corresponding to different color channels, and the gray adjustment of light-emitting display is realized through the adjustment of the gray compensation voltage.
Step S202: and adjusting the voltage value of the gray compensation voltage to gradually change the gray value of the compensation display picture from the first preset gray value to the second preset gray value.
Preferably, the first preset gray value can be set to 4, and the second preset gray value can be set to 256; or, the first preset gray value is 256, the second preset gray value is 4, and the gray compensation voltage is adjusted so that the gray value of the compensation display picture gradually changes from 4 to 256, or gradually changes from 256 to 4, so as to obtain the compensation display pictures at different gray values.
Step S203: and detecting coordinates of horizontal lines in the compensation display picture under different gray values, and determining the abnormal display position according to the coordinate detection result.
Step S3: and carrying out fault detection on the drive module of the bad panel according to the display abnormal position, and determining a bad cause according to a fault detection result.
Step S4: a first optical image of the defective panel at a first magnification is acquired, and a first characteristic defect is acquired based on the first optical image.
Step S5: and according to the first characteristic defect, based on the project history, carrying out abnormity analysis on the process and the equipment, and determining a bad cause.
Specifically, after the defective panel is obtained, gray scale compensation voltages which are sequentially changed are applied to the pixel driving circuit of the defective panel so that the compensation display screen of the defective panel shows different display colors (for example, red, green, blue or gray) and display gray scales (for example, 4 to 256). After obtaining the display abnormal position, step S3 to step S5 are executed to analyze the cause of the abnormality of the display abnormal position, which is the same as the above embodiment and is not repeated herein.
Fig. 6 is a flowchart of an analysis method for display anomalies of a liquid crystal panel according to a fifth embodiment of the present invention, and based on fig. 5, this embodiment provides a specific implementation manner of obtaining display image anomalies after removing internal compensation parameters.
As shown in fig. 6, the adjusting of the compensation parameter for the organic light emitting unit of the defective panel further includes:
step S204: and removing the internal compensation parameters of the organic light-emitting unit to obtain a non-compensation display picture, wherein the gray value of the non-compensation display picture is gradually changed from the first preset gray value to the second preset gray value.
The internal compensation parameters may be compensation voltages and compensation currents that are stored in the flash memory unit when the panel is shipped from a factory and are used for eliminating the display non-uniformity phenomenon, and typically, the internal compensation parameters include an α compensation parameter (i.e., a current compensation parameter) and a pi compensation parameter (i.e., a voltage compensation parameter).
Step S205: and detecting coordinates of horizontal lines in the non-compensation display picture under different gray values, and determining the abnormal display position according to the coordinate detection result.
Specifically, after the compensation display picture is detected to have the preset display defect, the internal compensation parameters of the organic light emitting unit are removed, so that the defective panel works in a non-compensation state, the value of the internal compensation parameters is gradually reduced until the value is 0, and the non-compensation display picture under different gray values is obtained. If the horizontal line defect phenomenon occurs in the non-compensation display picture, the coordinate detection can be carried out on any point in the horizontal line, or the coordinate detection is carried out on the scanning line corresponding to the horizontal line defect, and the display abnormal position is determined according to the coordinate detection result.
Fig. 7 is a flowchart of an analysis method for display anomalies of a liquid crystal panel according to a sixth embodiment of the present invention, and based on fig. 6, this embodiment provides a specific implementation manner for obtaining anomalies of a display screen after applying active compensation.
As shown in fig. 7, the compensation parameter adjustment for the organic light emitting unit of the defective panel further includes the following steps:
step S206: an active compensation voltage is applied to the organic light emitting unit.
Step S207: and detecting the coordinates of the horizontal line in the display picture after the active compensation, and determining the abnormal display position according to the coordinate detection result.
The active compensation voltage is used for compensating the organic light emitting unit so that the state of the organic light emitting unit reaches a standard factory state, and the active compensation voltage can be determined by the controller according to the difference between the gray compensation voltage and the driving voltage threshold of the organic light emitting unit.
Specifically, after the detection of the defects of the compensated display frame and the uncompensated display frame is completed, an active compensation voltage is applied to the organic light emitting unit to repair temporary residual images appearing in the display frame, and further, the display frame after the active compensation is subjected to detection of the defects of the equal-interval horizontal lines, for example, the display frame after the active compensation is subjected to gray compensation parameter adjustment again, the display frames under different gray values are subjected to detection of the defects of the equal-interval horizontal lines, and if the defects of the horizontal lines exist, the abnormal display position in the panel is positioned by detecting the coordinates of any point on the horizontal lines in the display frame or the coordinates of the scanning lines corresponding to the defects of the horizontal lines. By repairing the temporary residual image, display failure caused by driving voltage deviation is avoided, and the detection efficiency of the failure cause is improved.
Fig. 8 is a flowchart of an abnormality analysis method for an lcd panel according to a seventh embodiment of the present invention.
As shown in fig. 8, after acquiring the display abnormality position, the display abnormality analysis method further includes:
step S6: acquiring a second optical image of the bad panel under a second magnification, and reconfirming the display abnormal position based on the second optical image; wherein the second magnification is smaller than the first magnification.
Illustratively, the second magnification may be 5 times.
Specifically, after the display abnormal position is obtained in step S2, the defective panel may be placed under an optical microscope of 5 magnifications to inspect the RGB brightness of the organic light emitting unit in the microscopic state, and if there is a horizontal line defect at equal intervals in the microscopic state, the display abnormal position may be determined by detecting coordinates of the horizontal line defect position. By combining the microscopic display picture inspection, the missing inspection of the bad display phenomenon is avoided. And the phenomenon observation can be realized by adopting low multiplying power, and the performance requirement of the abnormal analysis equipment can be reduced.
Fig. 9 is a flowchart of an abnormality analysis method for a liquid crystal panel according to an eighth embodiment of the present invention.
As shown in fig. 9, after the first characteristic defect is acquired, the display abnormality analysis method further includes the steps of:
step S7: it is determined whether the location of the first feature defect can be determined.
If the location of the first feature defect can be determined, the above step S5 is performed; if the location of the first feature defect cannot be determined, step S8 is performed.
Step S8: and removing the packaging cover plate of the bad panel, and obtaining at least one circuit substrate positioned below the packaging cover plate.
In one embodiment, the circuit substrate under the package cover plate comprises a TFT substrate and an aluminum-plastic liner plate.
Step S9: and acquiring a third optical image of the circuit substrate, and acquiring a second characteristic defect based on the third optical image.
In this embodiment, the third optical image may be an optical image at a third magnification, where the third magnification may be greater than or equal to the first magnification, which is beneficial to avoiding missing detection of the feature defect.
In this embodiment, the second characteristic defect includes but is not limited to: metal wiring abnormality, circuit element abnormality and substrate foreign matter. The abnormal metal routing can be the abnormal length or width of the metal routing of the TFT substrate; the circuit element abnormality may be a TFT element abnormality.
Step S10: and analyzing the second characteristic defect, and determining a bad cause according to the defect analysis result.
In one embodiment, the defect analysis of the second characteristic defect includes: and if the second characteristic defect is the metal wiring abnormity or the circuit element abnormity, carrying out abnormity analysis on the electrical parameters of the metal wiring and the circuit element on the circuit substrate, and determining the cause of the display failure according to an abnormity analysis result. Wherein the electrical parameters include, but are not limited to: resistance values and voltage values.
In an embodiment, the defect analyzing the second characteristic defect further includes: if the second characteristic defect is a foreign body, analyzing the section or the component of the substrate foreign body by adopting a preset failure analysis tool, determining the type of the foreign body and the preparation process for generating the foreign body, and determining the cause of the display failure.
Illustratively, the predetermined failure analysis tool includes any one or more of SEM (Scanning Electron Microscope), FIB (Focused Ion Beam), TEM (Transmission Electron Microscope), or EDS (Energy Dispersive Spectrometer).
Specifically, after the second characteristic defect is obtained, different analysis methods are executed according to the specific type of the second characteristic defect, and the root cause of the characteristic defect is searched, so that the problem of poor display of the panel is solved fundamentally, the yield is improved, and waste is avoided.
Based on any one of the above embodiments, the present invention further provides an analysis system for display anomalies of a liquid crystal panel, where the analysis system is configured to execute the analysis method for display anomalies provided in any one of the above embodiments, and has functional modules and beneficial effects corresponding to the execution method.
Fig. 10 is a schematic structural diagram of an lcd panel display abnormality analysis system according to a ninth embodiment of the present invention.
As shown in fig. 10, the display abnormality analysis system 100 includes: a reliability detection module 101, a compensation module 102, a module abnormality analysis module 103, an optical detection module 104, and a process abnormality analysis module 105.
The reliability detection module 101 is configured to obtain a bad panel, where the bad panel is a panel with a predetermined bad display phenomenon.
And the compensation module 102 is configured to perform compensation parameter adjustment on the organic light emitting unit of the defective panel, and determine a display abnormal position based on a display picture corresponding to at least one group of compensation parameters.
And the module abnormality analysis module 103 is used for carrying out fault detection on the drive module of the defective panel according to the display abnormal position and determining a defective cause according to a fault detection result.
The optical detection module 104 is configured to acquire a first optical image of the defective panel at a first magnification, and acquire a first characteristic defect based on the first optical image.
And the process anomaly analysis module 105 is used for carrying out anomaly analysis on the process and the equipment according to the first characteristic defects and the engineering history, and determining the cause of the failure, wherein the engineering history is the record of the preparation process of the panel with the failure.
In one embodiment, the detecting the failure of the driving module of the defective panel according to the abnormal display position includes: acquiring a target main control chip corresponding to the display abnormal position; replacing the target main control chip; acquiring a first display picture of a poor panel after the target main control chip is replaced; performing preset display bad phenomenon detection on the first display picture, and judging whether a bad cause is abnormal of the main control chip according to a detection result; and detecting the output voltage of the target main control chip with the abnormality, and determining the abnormal type of the target main control chip according to the detection result of the output voltage.
In one embodiment, the method for detecting the failure of the driving module of the defective panel further comprises: acquiring an abnormal display area in a first display picture; determining a corresponding module abnormal part according to the abnormal display area; measuring impedance of the abnormal part of the module, and determining an abnormal TAB area according to the impedance measurement result of the abnormal part; repairing the abnormal TAB area; acquiring a second display picture of the poor panel after the repair of the TAB area; and detecting a preset display bad phenomenon on the second display picture, and judging whether the bad cause is the TAB area abnormity according to a phenomenon detection result.
In one embodiment, the adjusting compensation parameters of the organic light emitting unit of the defective panel and determining the display abnormal position based on the display image corresponding to at least one group of compensation parameters includes: applying a gray compensation voltage to at least one color channel of the organic light-emitting unit to obtain a compensation display picture; adjusting the voltage value of the gray compensation voltage to gradually change the gray value of the compensation display picture from a first preset gray value to a second preset gray value; and carrying out coordinate detection on the compensation display pictures under different gray values, and determining the abnormal display position according to the coordinate detection result.
In one embodiment, the adjusting the compensation parameter of the organic light emitting unit of the defective panel further includes: removing the internal compensation parameters of the organic light-emitting unit to obtain a non-compensation display picture, wherein the gray value of the non-compensation display picture is gradually changed from a first preset gray value to a second preset gray value; and carrying out coordinate detection on the non-compensated display pictures under different gray values, and determining the abnormal display position according to the coordinate detection result.
In one embodiment, the adjusting the compensation parameter of the organic light emitting unit of the defective panel further includes: applying an active compensation voltage to the organic light emitting unit, the active compensation voltage being determined according to a difference between the gray compensation voltage and a driving voltage threshold of the organic light emitting unit; and carrying out coordinate detection on the display picture after the active compensation, and determining the abnormal display position according to the coordinate detection result.
Further, the display abnormality analysis system 100 further includes: a low-magnification optical microscope for acquiring a second optical image of the defective panel at a second magnification and reconfirming the display abnormality position based on the second optical image; wherein the second magnification is smaller than the first magnification.
Further, the display abnormality analysis system 100 further includes: the device comprises unsealing equipment, a second optical microscope and failure analysis equipment, wherein the unsealing equipment is used for removing a packaging cover plate of a poor panel and acquiring at least one circuit substrate positioned below the packaging cover plate; the second optical microscope is used for acquiring a third optical image of the circuit substrate and acquiring a second characteristic defect based on the third optical image; and the failure analysis equipment is used for carrying out defect analysis on the second characteristic defect and determining a bad cause according to the defect analysis result.
In one embodiment, the second feature defect includes, but is not limited to: metal wiring abnormality, circuit element abnormality and substrate foreign matter.
As a preferable example of the abnormality analysis method, the display defect is preset to be an equidistant line defect.
In summary, the present invention adjusts the compensation parameters of the organic light emitting units of the display panel, integrates the specific display defect phenomena and types, and implements the strategic abnormality analysis method for different display abnormality positions and characteristic defects, so as to accurately find the cause of the display defect, reduce the probability of the failure of the display defect analysis, improve the efficiency of the display defect analysis, fundamentally solve the problem of the display defect of the panel, improve the yield, and avoid waste.
Although the embodiments of the present invention have been described above with reference to the accompanying drawings, the present invention is not limited to the above embodiments, but may be manufactured in various forms, and those skilled in the art will appreciate that the present invention may be embodied in other specific forms without changing the technical spirit or essential features of the invention. It is therefore to be understood that the above described embodiments are illustrative and not restrictive in all respects.

Claims (10)

1. A method for analyzing display abnormality of a liquid crystal panel is characterized by comprising the following steps:
obtaining a bad panel, wherein the bad panel is a panel with a preset bad display phenomenon;
adjusting compensation parameters of the organic light-emitting unit of the poor panel, and determining a display abnormal position based on a display picture corresponding to at least one group of compensation parameters;
carrying out fault detection on the driving module of the bad panel according to the display abnormal position, and determining a bad cause according to a fault detection result;
acquiring a first optical image of the poor panel under a first magnification, and acquiring a first characteristic defect based on the first optical image;
and according to the first characteristic defect and the engineering history, carrying out abnormity analysis on the process and the equipment, and determining a bad cause, wherein the engineering history is a record of the preparation process of the bad panel.
2. The method for analyzing display abnormality according to claim 1, wherein detecting a failure of a driving module of the defective panel based on the display abnormality position includes:
acquiring a target main control chip corresponding to the display abnormal position;
replacing the target main control chip;
acquiring a first display picture of the defective panel after the target main control chip is replaced, and carrying out preset display defective phenomenon detection on the first display picture;
judging whether the bad cause is the abnormality of the main control chip according to the detection result;
and detecting the output voltage of the target main control chip with abnormality, and determining the abnormality type of the target main control chip according to the detection result of the output voltage.
3. The method for analyzing display abnormality according to claim 2, wherein the failure detection of the driving module of the defective panel further comprises:
acquiring an abnormal display area corresponding to the first display picture;
determining a corresponding module abnormal part according to the abnormal display area;
measuring impedance of the abnormal module, and determining an abnormal TAB area according to the impedance measurement result;
repairing the abnormal TAB area;
acquiring a second display picture of the poor panel after the TAB area is repaired, and carrying out preset display poor phenomenon detection on the second display picture;
and judging whether the bad cause is TAB area abnormity according to the phenomenon detection result.
4. The method for analyzing display anomalies according to claim 1, wherein the adjusting compensation parameters for the organic light emitting units of the defective panel and the determining the display anomaly location based on the display frames corresponding to at least one set of compensation parameters comprises:
applying a gray compensation voltage to at least one color channel of the organic light-emitting unit to obtain a compensation display picture;
adjusting the voltage value of the gray compensation voltage to gradually change the gray value of the compensation display picture from a first preset gray value to a second preset gray value;
and carrying out coordinate detection on the compensation display pictures under different gray values, and determining abnormal display positions according to coordinate detection results.
5. The method of analyzing display abnormality according to claim 4, wherein compensation parameter adjustment is performed on the organic light emitting unit of the defective panel, further comprising:
removing the internal compensation parameters of the organic light-emitting unit to obtain a non-compensation display picture, wherein the gray value of the non-compensation display picture is gradually changed from a first preset gray value to a second preset gray value;
and carrying out coordinate detection on the non-compensation display pictures under different gray values, and determining abnormal display positions according to coordinate detection results.
6. The method of analyzing display abnormality according to claim 4, wherein compensation parameter adjustment is performed on the organic light emitting unit of the defective panel, further comprising:
applying an active compensation voltage to the organic light emitting unit, the active compensation voltage being determined according to a difference between the gray compensation voltage and a driving voltage threshold of the organic light emitting unit;
and carrying out coordinate detection on the display picture after the active compensation, and determining the abnormal display position according to the coordinate detection result.
7. The display abnormality analysis method according to any one of claims 1 to 6, further comprising, after acquiring the display abnormality position:
acquiring a second optical image of the bad panel under a second magnification, and reconfirming the display abnormal position based on the second optical image;
wherein the second magnification is less than the first magnification.
8. The display anomaly analysis method according to any one of claims 1-6, further comprising, after acquiring the first feature defect:
removing the packaging cover plate of the bad panel, and obtaining at least one circuit substrate positioned below the packaging cover plate;
acquiring a third optical image of the circuit substrate, and acquiring a second characteristic defect based on the third optical image;
and performing defect analysis on the second characteristic defect, and determining a bad cause according to a defect analysis result.
9. The display abnormality analysis method according to any one of claims 1 to 6, characterized in that the preset display abnormality is an equally spaced line abnormality.
10. A liquid crystal panel display abnormality analysis system, comprising:
the reliability detection module is used for acquiring a bad panel, and the bad panel is a panel with a preset bad display phenomenon;
the compensation module is used for adjusting compensation parameters of the organic light-emitting unit of the poor panel and determining the abnormal display position based on the display picture corresponding to at least one group of compensation parameters;
the module abnormity analysis module is used for carrying out fault detection on the driving module of the bad panel according to the display abnormal position and determining a bad cause according to a fault detection result;
the optical detection module is used for acquiring a first optical image of the poor panel under a first magnification and acquiring a first characteristic defect based on the first optical image;
and the process anomaly analysis module is used for carrying out anomaly analysis on the process and the equipment according to the first characteristic defects and the engineering history, and determining the cause of the failure, wherein the engineering history is the record of the preparation process of the panel with the failure.
CN202111361034.XA 2021-11-17 2021-11-17 Liquid crystal panel display abnormity analysis method and analysis system Pending CN114063328A (en)

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CN105051506A (en) * 2013-04-08 2015-11-11 宜客斯股份有限公司 Brightness measurement method, brightness measurement device, and image quality adjustment technology using same
CN106847154A (en) * 2017-02-15 2017-06-13 京东方科技集团股份有限公司 Method, device and display device for compensating the bad display panel of display
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