CN114062998A - Method for monitoring running state of calibrating device, electronic device and storage medium - Google Patents
Method for monitoring running state of calibrating device, electronic device and storage medium Download PDFInfo
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Abstract
The invention discloses a method for monitoring the running state of a calibrating device, an electronic device and a storage medium, wherein the method comprises the following steps: acquiring N error data of a jth epitope of a calibrating device in a certain historical time period to construct a long-period sample space; calculating the normal operation error control limit of the error point according to the error data in the long-period sample space; selecting n error data closest to the current moment from the long-period sample space to construct a short-period sample space; acquiring error data of the jth epitope at the current moment at an error point; and judging whether the jth epitope is normal or not according to the normal operation error control limit, the error data at the current moment and/or the error data in the short-period sample space. The invention aims to provide a method for monitoring the running state of a calibrating device, an electronic device and a storage medium.
Description
Technical Field
The invention relates to the technical field of electric energy metering, in particular to a method for monitoring the running state of a calibrating device, an electronic device and a storage medium.
Background
For the intelligent electric energy meter, before the intelligent electric energy meter is formally put into use, a verification mechanism carries out forced verification on the metering performance according to legal metering and verification regulations such as JJJG 596 electronic type alternating current electric energy meter, JJG 1099-. When the error value measured by the detected electric energy meter at the specified measuring point is within the specified error limit value, the metering performance of the meter is qualified.
With the continuous development of economic society, in order to guarantee timely and efficient satisfaction of the meter requirements of each unit, the electric energy meter calibration technology basically completes the conversion from traditional manual calibration to automatic calibration, but the batch quality risk potential caused by the failure of the calibration device body is also amplified.
In order to ensure that the calibrating device body is always in a good operation state, a checking method during a fixed period is mainly adopted at present, so that the calibrating device is always in a controllable state in a calibrating period.
Although the method can effectively avoid quality accidents caused by failure of the calibrating device body to a certain extent, the method has limited effect in the actual application process of the calibration during a large-scale assembly line, and the main reason is that the calibration frequency is poor in pertinence, and the problem that the calibrating device fails in one calibration period cannot be timely solved.
Disclosure of Invention
The invention aims to provide a method for monitoring the running state of a calibrating device, an electronic device and a storage medium.
The invention is realized by the following technical scheme:
in one aspect of the present application, there is provided a method for monitoring an operating condition of an assay device, comprising the steps of:
s1: acquiring N error data of a jth epitope of a calibrating device in a certain historical time period;
s2: arranging the N error data according to a time sequence to construct a long-period sample space; calculating the normal operation error control limit of the error point according to the error data in the long-period sample space;
s3: selecting n error data closest to the current moment from the long-period sample space to construct a short-period sample space;
s4: obtaining the error data of the jth epitope at the current moment at the error point p
S5: according to the normal operation error control limit and the error data
And/or the error data in the short period sample space judges whether the jth epitope is normal;
s6: when the jth epitope is normal, repeatedly executing S4; and when the jth epitope is abnormal, repeatedly executing S1-S5 until the repetition number reaches a threshold value.
Preferably, the error data is error data of a qualified electric energy meter.
Preferably, the normal operation error control limit is:
wherein, ErrupExpress errorLower limit of differential control, WarningupIndicating an upper error warning limit, RigntupIndicating the upper limit of the error tolerance, RigntdownIndicating the lower limit of allowable error, WarningdownIndicating a lower error warning limit, ErrdownDenotes an upper limit of error control, σ denotes a standard deviation of error data, xiWhich represents the i-th error data,
representing the average of the error data.
Preferably, when said error data
Or when m error data in the short-period sample space are larger than the error control upper limit or smaller than the error control lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is larger than or equal to 0 and is smaller than or equal to n.
Preferably, when said error data
Or when m error data in the short-period sample space are larger than the error allowable upper limit or smaller than the error allowable lower limit, judging that the jth epitope of the verification device is abnormal, wherein m is more than or equal to 0 and less than or equal to n.
Preferably, when said error data
Or when m error data in the short-period sample space are larger than the error warning upper limit or smaller than the error warning lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is more than or equal to 0 and less than or equal to n.
Preferably, before repeatedly performing S4, the method further includes an updating sub-step, where the updating sub-step is used to update the error data in the long period sample space, the error data in the short period sample space and the normal operation error control limit when the jth epitope is normal.
Preferably, the update substep comprises:
using said error data
Replacing error data farthest from the current moment in the long-period sample space, sequencing the updated error data in the long-period sample space according to time sequence, and calculating the normal operation error control limit;
using said error data
And replacing the error data farthest from the current moment in the short-period sample space, and sequencing the updated error data in the short-period sample space according to time sequence.
In another aspect of the present application, an electronic device is provided that includes a processor and a memory;
the memory to store the processor-executable instructions;
the processor is configured to perform a method of monitoring an operational status of an assay device as described above.
In yet another aspect of the present application, there is provided a computer readable storage medium comprising a stored computer program which, when executed, performs a method of monitoring an operational state of a certification apparatus as described above.
Compared with the prior art, the invention has the following advantages and beneficial effects:
1. the running state of the calibrating device body can be monitored in real time, and the possible quality failure risk of the calibrating device body can be found in time;
2. extra hardware equipment is not needed, and the investment is small;
3. the whole process does not need manual intervention, so that the interference of human factors can be effectively eliminated, and the fairness and the justness of the detection result are ensured.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a schematic flow chart of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
Example 1
The embodiment provides a method for monitoring an operation state of a verification device, as shown in fig. 1, including the following steps:
s1: acquiring N error data of a jth epitope of a calibrating device in a certain historical time period; specifically, the method comprises the following steps:
and error data of the electric energy meter in the whole detection link within a period of time are derived from the database, and are classified according to the time sequence by using the calibrating device, the calibrating device epitope and the calibrating error point as basic units, so that a certain epitope can be conveniently detected subsequently. In order to ensure the accuracy of the monitoring effect, the number of data of each verification error point under each epitope is not less than N, and N can be determined according to actual conditions; if the error data in a period of time can not meet the N requirements, the state monitoring work of the epitope can be suspended until the N requirements are met; or increasing the range of the time period to ensure that the error data is not less than N. Further, in order to ensure the accuracy of the detection result, the error data in the implementation are all from the qualified electric energy meter, so that the detection error caused by disqualification of the electric energy meter is avoided.
In addition, the period of time mentioned in this embodiment may be a week, a half month or a month closest to the current time, and may be reasonably selected according to the needs; the full inspection in this embodiment refers to the verification of all the electric energy meters arriving one by one according to the metrological verification rules, and the error data refers to the original verification error data without the reduction processing.
S2: arranging the N error data according to a time sequence to construct a long-period sample space;
selecting N error data from the step S1 and arranging the N error data according to the time sequence to construct a long-period sample space, and calculating the normal operation error control limit of the error point according to the error data in the long-period sample space; the normal operation error control limit in this embodiment includes an error control lower limit, an error warning upper limit, an error warning lower limit, an error allowable upper limit, and an error operation lower limit, and is obtained by the following formula:
wherein, ErrupIndicating the lower limit of error control, WarningupIndicating an upper error warning limit, RigntupIndicating the upper limit of the error tolerance, RigntdownIndicating the lower limit of allowable error, WarningdownIndicating a lower error warning limit, ErrdownDenotes an upper limit of error control, σ denotes a standard deviation of error data, xiWhich represents the i-th error data,
representing the average of the error data.
S3: selecting n error data closest to the current moment from the long-period sample space to construct a short-period sample space; wherein the value of n is set according to actual requirements;
s4: obtaining the error data of the jth epitope at the current moment at the error point p
S5: according to the normal operation error control limit and error data
And/or error data in the short-period sample space judges whether the jth epitope is normal; specifically, the present embodiment is provided with three types of judgment criteria, which are respectively:
criterion 1: when there is error data
Or when m error data in the short-period sample space are larger than the error control upper limit or smaller than the error control lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is more than or equal to 0 and less than or equal to n, and the value of m is selected according to the actual condition;
criterion 2: when there is error data
Or when m error data in the short-period sample space are larger than the error allowable upper limit or smaller than the error allowable lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is more than or equal to 0 and less than or equal to n, and the value of m is selected according to the actual condition;
criterion 3: when there is error data
Or when m error data in the short-period sample space are larger than the error warning upper limit or smaller than the error warning lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is more than or equal to 0 and less than or equal to n, and the value of m is selected according to the actual condition;
in practical application, one criterion can be selected to judge whether a certain epitope of the electric energy meter is normal, or a plurality of criteria can be combined to judge whether a certain epitope of the electric energy meter is normal according to actual conditions; when one reference is selected for judgment, as long as the single criterion is not met, the epitope is judged to be abnormal; when a plurality of criteria are combined for judgment, the judgment may be made as abnormal only when the plurality of criteria are violated, or whether the epitope is normal may be judged by setting a weight.
S6: when the jth epitope is normal, repeatedly executing S4; and when the jth epitope is abnormal, repeatedly executing S1-S5 until the repeated times reach the threshold times, judging that the epitope is abnormal, and indicating that the epitope has problems and needs to be overhauled.
In the detection process of the electric energy meter, if the electric energy meter to be detected is unqualified, the difference between the test data of the verification device and the conventional test data is large, and the fault is easily judged to be caused by the unqualified electric energy meter; and when the calibrating device fails, although the test data of the calibrating device has deviation, the change is not large compared with the conventional test data, so that whether the calibrating device fails or not is not easy to judge.
Example 2
In order to make the detection result more accurate, this embodiment is further improved on the basis of embodiment 1, and before repeatedly performing S4, the method further includes an updating sub-step, where the updating sub-step is configured to update error data in the long-period sample space and the short-period sample space when the jth epitope is normal, so that the calculated normal operation error control limit fits the state of the current epitope more specifically:
when the current epitope is normal, deleting the error data farthest from the current moment in the long-period sample space, and enabling the error data to be normal
Filling the long-period sample space, and sequencing error data in the long-period sample space according to time sequence;
deleting the error data farthest from the current time in the short-period sample space, and converting the error data into the data with the maximum length
And filling the short-period sample space, and sequencing the error data in the short-period sample space according to time sequence.
Because the working performance of the calibrating device changes in the working process, the performance of the current calibrating device cannot be well reflected by historical detection data, and therefore, in the embodiment, when the epitope of the calibrating device is normal, error data farthest from the current moment in the long-period sample space and the short-period sample space are updated in real time, so that the calculated normal operation error control limit and the error data in the short-period sample space can be more attached to the state of the current epitope, and the accuracy of the detection result is further ensured.
Example 3
The embodiment provides an electronic device, comprising a processor and a memory;
a memory for storing processor-executable instructions;
a processor configured to perform a method of monitoring an operational state of an assay device as in example 1 or example 2.
Example 4
The present embodiment provides a computer-readable storage medium comprising a stored computer program, which when executed performs a method for monitoring an operational status of a certification apparatus as in embodiment 1 or embodiment 2.
The following describes the scheme of the present embodiment with specific examples:
(1) abnormal epitope running state of calibrating device
Assuming that the epitope 3 of the verification device No. 2 is at the load point where "power factor is equal to 1.0L, load current Ib" is the nearest 12 pieces of error data as shown in table 1:
error data for epitope 3 of calibration device No. 12
| Serial number | Time of data generation | Error data |
| 1 | 2020.12.12 00：01：09 | 0.03 |
| 2 | 2020.12.12 00：01：08 | 0.04 |
| 3 | 2020.12.12 00：01：07 | 0.15 |
| 4 | 2020.12.12 00：01：06 | 0.17 |
| 5 | 2020.12.12 00：01：05 | 0.12 |
| 6 | 2020.12.12 00：01：04 | 0.05 |
| 7 | 2020.12.12 00：01：03 | 0.18 |
| 8 | 2020.12.12 00：01：02 | 0.10 |
| 9 | 2020.12.12 00：01：01 | 0.02 |
| 10 | 2020.12.12 00：01：00 | 0.19 |
| 11 | 2020.12.11 00：01：00 | 0.17 |
| 12 | 2020.12.10 00：01：00 | 0.16 |
Step one, constructing a long-period sub-sample space by taking N as 10:
step two, constructing a short-period sub-sample space by taking n as 3:
step three, calculating the error control limit in normal operation:
step four, error data P is obtained in real time (2020.12.1200: 02: 09 moment generation)ij p＝0.21；
Step five, judging an operation state conclusion:
in the case where only criterion 1 is considered and m is 0, since P isij p＞ErrupRepeating the above steps, if the repetition times reach the threshold value, or P still existsij p＞ErrupThen the epitope is judged to be abnormal, and the period check work should be immediately scheduled.
(2) Normal state of epitope operation of the assay device
Assuming that the epitope No. 3 of the verification device No. 2 is in the load point where "power factor is equal to 1.0L and load current Ib" are the nearest 12 pieces of error data as shown in table 2:
error data for epitope 3 of calibration device No. 22
| Serial number | Time of data generation | Error data |
| 1 | 2020.12.12 00：01：09 | 0.03 |
| 2 | 2020.12.12 00：01：08 | 0.04 |
| 3 | 2020.12.12 00：01：07 | 0.15 |
| 4 | 2020.12.12 00：01：06 | 0.17 |
| 5 | 2020.12.12 00：01：05 | 0.12 |
| 6 | 2020.12.12 00：01：04 | 0.05 |
| 7 | 2020.12.12 00：01：03 | 0.18 |
| 8 | 2020.12.12 00：01：02 | 0.10 |
| 9 | 2020.12.12 00：01：01 | 0.02 |
| 10 | 2020.12.12 00：01：00 | 0.19 |
| 11 | 2020.12.11 00：01：00 | 0.17 |
| 12 | 2020.12.10 00：01：00 | 0.16 |
Step one, constructing a long-period sub-sample space by taking N as 10:
step two, constructing a short-period sub-sample space by taking n as 3:
step three, calculating the error control limit in normal operation:
step four, error data P is obtained in real time (2020.12.1200: 02: 09 moment generation)ij p＝0.01；
Step five, judging an operation state conclusion:
in the case where only criterion 1 is considered and m is 0, since P isij p＜ErrupAnd judging that the epitope is normal without checking work during the arrangement period.
Step six, dynamically updating the long-period sub-sample space:
step seven, dynamically updating the short-period sub-sample space:
and step eight, repeating the step four to the step seven.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (10)
1. A method for monitoring the running state of a calibrating device is characterized by comprising the following steps:
s1: acquiring N error data of a jth epitope of a calibrating device in a certain historical time period;
s2: arranging the N error data according to a time sequence to construct a long-period sample space; calculating the normal operation error control limit of the error point according to the error data in the long-period sample space;
s3: selecting n error data closest to the current moment from the long-period sample space to construct a short-period sample space;
s4: obtaining the error data of the jth epitope at the current moment at the error point p
S5: according to the normal operation error control limit and the error data
And/or the error data in the short period sample space judges whether the jth epitope is normal;
s6: when the jth epitope is normal, repeatedly executing S4; and when the jth epitope is abnormal, repeatedly executing S1-S5 until the repetition number reaches a threshold value.
2. A method as claimed in claim 1, wherein the error data is error data of a qualified electric energy meter.
3. A method as claimed in claim 1, wherein the normal operation error control limit is:
wherein, ErrupIndicating the lower limit of error control, WarningupIndicating an upper error warning limit, RigntupIndicating the upper limit of the error tolerance, RigntdownIndicating the lower limit of allowable error, WarningdownIndicating a lower error warning limit, ErrdownDenotes an upper limit of error control, σ denotes a standard deviation of error data, xiWhich represents the i-th error data,
representing the average of the error data.
4. A method as claimed in claim 3, wherein said error data is stored in a database
Or when m error data in the short-period sample space are larger than the error control upper limit or smaller than the error control lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is larger than or equal to 0 and is smaller than or equal to n.
5. A method as claimed in claim 3, wherein said error data is stored in a database
Or m error data in the short-period sample space is greater than the upper error tolerance limit or less than the lower error tolerance limit,and judging that the jth epitope of the verification device is abnormal, wherein m is more than or equal to 0 and less than or equal to n.
6. A method as claimed in claim 3, wherein said error data is stored in a database
Or when m error data in the short-period sample space are larger than the error warning upper limit or smaller than the error warning lower limit, judging that the jth epitope of the calibrating device is abnormal, wherein m is more than or equal to 0 and less than or equal to n.
7. A method as claimed in any one of claims 1 to 6, further comprising an updating sub-step before repeatedly performing S4, wherein the updating sub-step is used for updating the error data in the long-period sample space, the error data in the short-period sample space and the normal operation error control limit when the jth epitope is normal.
8. A method as claimed in claim 7, wherein the updating sub-step comprises:
using said error data
Replacing error data farthest from the current moment in the long-period sample space, sequencing the updated error data in the long-period sample space according to time sequence, and calculating the normal operation error control limit;
using said error data
And replacing the error data farthest from the current moment in the short-period sample space, and sequencing the updated error data in the short-period sample space according to time sequence.
9. An electronic device comprising a processor and a memory;
the memory to store the processor-executable instructions;
the processor configured to perform a method of monitoring the operational status of a certification apparatus according to any one of claims 1 to 8.
10. A computer-readable storage medium comprising a stored computer program which, when executed, performs a method of monitoring the operational status of a certification apparatus according to any one of claims 1 to 8.
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