CN114062906B - Power board testing arrangement - Google Patents

Power board testing arrangement Download PDF

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Publication number
CN114062906B
CN114062906B CN202210046379.4A CN202210046379A CN114062906B CN 114062906 B CN114062906 B CN 114062906B CN 202210046379 A CN202210046379 A CN 202210046379A CN 114062906 B CN114062906 B CN 114062906B
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Prior art keywords
interface
mcu
resistor
power board
circuit
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CN202210046379.4A
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CN114062906A (en
Inventor
蔡烈波
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Suzhou Inspur Intelligent Technology Co Ltd
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Suzhou Inspur Intelligent Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834—Automated test systems [ATE]; using microprocessors or computers

Abstract

The application discloses a Power board testing device, which relates to the field of board card testing, wherein an MCU control circuit sends a first electric signal to a Power board to be tested so as to detect the Power board to be tested; MCU control circuit sends the second signal of telecommunication in order to control the alarm and instruct the testing result to alarm circuit, detection circuit is connected with MCU control circuit and the Power board that awaits measuring, whether short circuit between the interface of the Power board that detects and await measuring, and whether three emitting diode normally works, send the signal of telecommunication through MCU control circuit and realize detecting the Power board that awaits measuring and show the test result, the Power board test of having avoided going on PC frock, need carry out the start action, wait for the computer to get into the OS page, show the slower problem of test result.

Description

Power board testing arrangement
Technical Field
The application relates to an integrated circuit board test field especially relates to a Power board testing arrangement.
Background
The Power board is an element for controlling the switch of the computer on the computer mainboard, and in the production process, the Power board needs to be detected, so that three Light Emitting Diodes (LEDs) on the Power board are ensured to be normally on and off, and two switches are normally effective; the connector that can not the short circuit between the interface of Power board, and be connected to the Power board on the welded winding displacement can normally switch on, guarantee that the Power board function is normal, current, generally through setting up a PC frock, be connected to corresponding Personal Computer (PC) mainboard to corresponding Power board on, the start tests.
Because the Power board test is carried out on the PC tool, the PC tool needs to be started, and waits for the computer to enter an Operating System (OS) page to obtain the Power board test, communication is carried out through communication signals in the process, and the test result is displayed.
Therefore, how to improve the testing efficiency of the Power board is a technical problem to be solved urgently by the person in the art.
Disclosure of Invention
The utility model aims at providing a Power board testing arrangement.
In order to solve the above technical problem, the present application provides a Power board testing device, including:
the device comprises an MCU control circuit, an alarm circuit and a detection circuit, wherein the MCU control circuit comprises an MCU;
the MCU control circuit is connected with the Power board to be detected and is used for sending a first electric signal to the Power board to be detected so as to detect the Power board to be detected;
the MCU control circuit is connected with the alarm circuit and is used for sending a second electric signal to the alarm circuit so as to control the alarm to indicate a detection result;
the detection circuit with MCU control circuit with the Power board that awaits measuring is connected, detection circuit includes: the circuit comprises a first triode, a second triode, a first resistor, a second resistor, a first relay and a second relay;
the base electrode of the first triode is connected with the sixth interface of the MCU, the collector electrode of the first triode is connected with one end of the first resistor, the other end of the first resistor is connected with a Power supply, the emitter electrode of the first triode is connected with the fifth interface of the first relay, the first interface of the first relay is connected with the Power supply, the second interface of the first relay is grounded, the fourth interface of the first relay is connected with the second interface of the Power board to be tested, and the sixth interface of the first relay is connected with the eleventh interface of the MCU;
the base of the second triode is connected with the seventh interface of the MCU, the collector of the second triode is connected with one end of the second resistor, the other end of the second resistor is connected with a Power supply, the emitter of the second triode is connected with the fifth interface of the second relay, the first interface of the second relay is connected with the Power supply, the second interface of the second relay is grounded, the fourth interface of the second relay is connected with the seventh interface of the Power board to be tested, and the sixth interface of the second relay is connected with the fifteenth interface of the MCU.
Preferably, in the Power board testing apparatus, the alarm circuit includes: the first indication circuit, the second indication circuit and the third triode are connected with the first resistor and the fourth resistor respectively;
the first end of the third resistor is connected with a fifth interface of the MCU, the second end of the third resistor is connected with the base electrode of the third triode, the collector electrode of the third triode is connected with the first end of the fourth resistor, and the second end of the fourth resistor is connected with the first indicating circuit and the second indicating circuit;
the first indicating circuit is used for indicating that the detection result of the Power plate to be detected is qualified, and the second indicating circuit is used for indicating that the detection result of the Power plate to be detected is unqualified.
Preferably, in the Power board test apparatus, the first indication circuit includes: a fifth resistor, a first light emitting diode;
the second end of the fourth resistor is connected with the first end of the fifth resistor, the second end of the fifth resistor is connected with the anode of the first light-emitting diode, and the cathode of the first light-emitting diode is connected with the third interface of the MCU.
Preferably, in the Power board testing apparatus, the second indicating circuit includes: a sixth resistor, a second light emitting diode;
the second end of the fourth resistor is connected with the first end of the sixth resistor, the second end of the sixth resistor is connected with the anode of the second light emitting diode, and the cathode of the second light emitting diode is connected with the fourth interface of the MCU.
Preferably, in the Power board testing apparatus, the alarm circuit further includes: a buzzer;
and the emitter of the third triode is connected with the first end of the buzzer, and the second end of the buzzer is grounded.
Preferably, the Power board testing apparatus further includes: the second connector, the second connector with MCU control circuit with the Power board that awaits measuring is connected, the second connector with the MCU one-to-one is connected, the second connector with the Power board one-to-one that awaits measuring is connected.
Preferably, the Power board testing apparatus further includes: a control circuit, the control circuit comprising: a first switch, a second switch;
one end of the first switch is connected with the first interface of the MCU, and the other end of the first switch is grounded; the MCU is used for receiving a low level signal by the first interface of the MCU and assigning a high level to the sixth interface and the seventh interface of the MCU when the first switch is closed;
one end of the second switch is connected with the second interface of the MCU, and the other end of the second switch is grounded; and the MCU is used for receiving a low level signal by the second interface of the MCU and assigning a low level to the sixth interface and the seventh interface of the MCU when the second switch is closed.
The Power board testing device comprises a Micro Controller Unit (MCU) control circuit and an alarm circuit, wherein the alarm circuit comprises an alarm, and the MCU control circuit is connected with a Power board to be tested and used for sending a first electric signal to the Power board to be tested so as to detect the Power board to be tested; the MCU control circuit is connected with the alarm circuit and used for sending a second electric signal to the alarm circuit to control the alarm to indicate a detection result, the detection circuit is connected with the MCU control circuit and the Power board to be detected, whether short circuit exists between interfaces of the Power board to be detected or not is detected, and whether three light-emitting diodes work normally or not is detected. Through the device that this application provided, send the signal of telecommunication through MCU control circuit and realize detecting the Power board that awaits measuring and show the test result, avoided carrying out the test of Power board on the PC frock, need carry out the start action, wait for the computer to get into the OS page, show the slower problem of test result.
Drawings
In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.
Fig. 1 is a schematic diagram of a Power board testing apparatus according to an embodiment of the present disclosure;
fig. 2 is a schematic diagram of an MCU control circuit provided in an embodiment of the present application;
fig. 3 is a schematic circuit diagram of a Power board to be tested according to an embodiment of the present disclosure;
fig. 4 is a schematic diagram of a first connector of a Power board to be tested according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram of a detection circuit according to an embodiment of the present disclosure;
FIG. 6 is a schematic diagram of an alarm circuit provided in an embodiment of the present application;
fig. 7 is a schematic diagram of a second connector provided in an embodiment of the present application;
fig. 8 is a schematic diagram of a control circuit according to an embodiment of the present disclosure.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without any creative effort belong to the protection scope of the present application.
The core of this application provides the efficiency of software testing's of the improvement Power board testing arrangement.
In order that those skilled in the art will better understand the disclosure, the following detailed description will be given with reference to the accompanying drawings.
Fig. 1 is a schematic view of a Power board testing device provided in an embodiment of the present application, and as shown in fig. 1, the embodiment of the present application provides a Power board testing device, including:
the device comprises an MCU control circuit 11, an alarm circuit 12 and a detection circuit 14, wherein the MCU control circuit 11 comprises an MCU;
the MCU control circuit 11 is connected with the Power board 13 to be detected and is used for sending a first electric signal to the Power board 13 to be detected so as to detect the Power board 13 to be detected;
the alarm circuit 12 comprises an alarm, and the MCU control circuit 11 is connected with the alarm circuit 12 and used for sending a second electric signal to the alarm circuit 12 to control the alarm to indicate a detection result;
the detection circuit 14 is connected with the MCU control circuit 11 and the Power board 13 to be detected, the detection circuit 14 comprises a first triode Q1, a second triode Q2, a first resistor R1, a second resistor R2, a first Relay0, a second Relay1,
the base electrode of a first triode Q1 is connected with a sixth interface P1.5 of the MCU, the collector electrode of the first triode Q1 is connected with one end of a first resistor R1, the other end of the first resistor R1 is connected with a Power supply, the emitter electrode of the first triode Q1 is connected with a fifth interface of a first Relay0, the first interface of the first Relay0 is connected with the Power supply, the second interface of the first Relay0 is grounded, the fourth interface of the first Relay0 is connected with a second interface P2 of the Power board 13 to be tested, and the sixth interface of the first Relay0 is connected with an eleventh interface P3.1 of the MCU;
the base of a second triode Q2 is connected with a seventh interface P1.6 of the MCU, the collector of a second triode Q2 is connected with one end of a second resistor R2, the other end of the second resistor R2 is connected with a Power supply, the emitter of the second triode Q2 is connected with a fifth interface of a second Relay Relay1, the first interface of the second Relay Relay1 is connected with the Power supply, the second interface of the second Relay Relay1 is grounded, the fourth interface of the second Relay Relay1 is connected with the seventh interface P7 of the Power board 13 to be tested, and the sixth interface of the second Relay Relay1 is connected with a fifteenth interface P3.5 of the MCU.
Fig. 2 is a schematic diagram of an MCU control circuit provided in this embodiment of the present application, where the MCU is of a type C8051, and as shown in fig. 2, a ninth interface of the MCU is connected to a negative electrode of a capacitor C1 and one end of a resistor R7, the other end of the resistor R7 is grounded, a negative electrode of a capacitor C1 is connected to one end of a key SW, a positive electrode of the capacitor is connected to the other end of the key, and a positive electrode of the capacitor is connected to a power supply to form a reset circuit, an eighteenth interface of the MCU is connected to one end of a crystal oscillator Y1 and a first end of a capacitor C2, a nineteenth interface of the MCU is connected to the other end of the crystal oscillator Y1 and a first end of a capacitor C3, and a second end of a capacitor C2 is grounded to form an oscillation circuit; and a fortieth interface of the MCU is connected with a power supply, and a thirty-first interface of the MCU is connected with the power supply through a resistor R8 to supply power to the MCU.
Fig. 3 is a schematic circuit diagram of a Power board to be tested provided in the embodiment of the present application, fig. 4 is a schematic diagram of a first connector of the Power board to be tested provided in the embodiment of the present application, and as shown in fig. 3, JP3001 is a first connector of the Power board 13 to be tested, a sixth port P6 of the Power board 13 to be tested is grounded, a second port P2 of the first connector JP3001 is connected with a ninth resistor R9, the other end of the ninth resistor R9 is connected with the anode of a third light emitting diode D3, the cathode of the third light emitting diode D3 is connected with an eighth port P8 of the first connector JP3001, a seventh port P7 of the first connector JP3001 is connected with a tenth resistor R10, the other end of the tenth resistor R10 is connected with the anode of a fourth light emitting diode D4 and the anode of a fifth light emitting diode D5, the cathode of the fourth light emitting diode D4 is connected with a third port P59638 of the first connector JP3001, the cathode of the fifth light emitting diode D3959648 is connected with a first connector JP3001 and a third port P3 is connected with a first switch P395961, the other end of the third switch S3 is grounded, the fifth interface P5 of the first connector JP3001 is connected with the fourth switch S4, the other end of the fourth switch S4 is grounded, the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 can be normally turned on or off or not in the application, the third switch S3 and the fourth switch S4 are effective or not, and whether a short circuit exists between the interfaces P1-P8 or not is ensured, so that the Power board 13 to be tested can normally function.
Through the device provided by this embodiment, the MCU control circuit 11 is connected to the Power board 13 to be tested, and the detection of the Power board 13 to be tested is realized by sending a first electrical signal to the Power board 13 to be tested, where it should be noted that the first electrical signal is not only an electrical signal, but also includes electrical signals for detecting three leds, electrical signals for detecting two switches, and electrical signals for detecting whether a short circuit exists between the interfaces P1-P8, and the MCU control circuit 11 sends an electrical signal for detection to the Power board 13 to be tested, and detects whether three leds normally emit light, whether two switches are turned on, and whether a short circuit exists between the interfaces P1-P8; when the MCU control circuit 11 detects a detection result, a second electric signal for representing the detection result can be sent to the alarm circuit 12 by the way, and the alarm circuit 12 indicates a corresponding result through the second electric signal, so that a worker can obtain the detection result of the Power board 13 to be detected.
In this embodiment, what type of alarm device included in the alarm circuit 12 is not limited, such as an indicator light and a buzzer, and the type of detection result indicated by the alarm circuit 12 is also not limited in this embodiment, for example, there is no short circuit between interfaces, the first indicator light is not on, the short circuit between interfaces, the first indicator light is on, the three light emitting diodes are normally on and off, the second indicator light is not on, the three light emitting diodes are not normally on and off, the second indicator light is on, the two switches are turned on, the buzzer is not alarming, the two switches are not turned on, and the buzzer alarms; the MCU controls the alarm circuit to indicate the detection result by sending an electrical signal, and the embodiment does not specifically limit how the alarm circuit 12 indicates the detection result, and is designed according to actual needs.
MCU accessible assigns the signal of telecommunication of different levels to the interface of Power board 13 that awaits measuring for the return circuit that emitting diode belongs to switches on, whether normally works with the judgement three emitting diode, and the accessible assigns high-low level to adjacent interface, judges whether there is the short circuit between the interface.
The MCU can assign high levels to the first interface P1 and the fifth interface P5 of the Power board 13 to be tested respectively, the other end of the third switch S3 and the other end of the fourth switch S4 are grounded, the switches are closed, if the MCU assigns the level of the port to be pulled low, the switch test is passed, otherwise, the switch test is not passed.
Fig. 5 is a schematic diagram of a detection circuit 14 according to an embodiment of the present application, and as shown in fig. 5, when a first Relay0 and a second Relay1 are in a normally closed state, a first interface, a third interface, and a fourth interface are conducted, and when they are in a normally open state, a third interface, a fourth interface, and a sixth interface are conducted.
When the sixth interface P1.5 and the seventh interface P1.6 of the MCU respectively assign high levels to the base of the first triode Q1 and the base of the second triode Q2, the first Relay0 and the second Relay1 work, the third interface, the fourth interface and the sixth interface are conducted, the fourth interface of the first Relay0 is connected with the second interface P2 of the Power board 13 to be tested, the sixth interface of the first Relay0 is connected with the eleventh interface P3.1 of the MCU, therefore, the second interface P2 and the eleventh interface P3.1 of the Power board 13 to be tested are connected, the fourth interface of the second Relay 5 is connected with the seventh interface P7 of the Power board 13 to be tested, the sixth interface of the second Relay1 is connected with the fifteenth interface P3.5 of the MCU, therefore, the seventh interface P7 and the seventh interface P7 of the Power board 13 to be tested are connected with the fifteenth interface P3.5 of the MCU, and the sixteenth interface P13 to eighth interface P13 to the eighth interface P13 and the eighth interface P1 of the MCU to be tested are connected with the fifth interface P13 and the eighth interface P3.25 of the MCU to be tested, The ninth interfaces are connected in a one-to-one correspondence manner; assigning values to the interfaces of the Power board 13 to be tested through the MCU, assigning values to adjacent interfaces as a high level and a low level, and when the MCU detects that the corresponding level is a normal assignment level, passing a short circuit test between the interfaces; when the detected level does not accord with the assigned level, the high level corresponding to the assignment is pulled down by the adjacent low level due to the existence of the short circuit, which indicates that the short circuit exists between the interfaces of the Power board 13 to be tested, and the test fails.
When the MCU sixth interface P1.5 and the MCU seventh interface P1.6 respectively assign low levels to the base electrodes of the first triode Q1 and the second triode Q2, the first Relay Relay0 and the second Relay Relay1 do not work, the first interface, the third interface and the fourth interface are conducted, the first interfaces of the first Relay Relay0 and the second Relay Relay1 are connected with a Power supply, and therefore the second interface P2 and the seventh interface P7 of the Powerplate 13 to be tested are connected with the Power supply; and assigning low levels to the eighth interface P8, the third interface P3 and the fourth interface P4 of the Power board 13 to be tested through the MCU, wherein at this time, circuits where the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 of the Power board 13 to be tested are located form a loop, if the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 are normally lit, the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 pass the function test, and if any one of the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 is not lit, the test does not pass.
The Power board testing device comprises an MCU (microprogrammed control Unit) control circuit 11, an alarm circuit 12 and a detection circuit 14, wherein the alarm circuit 12 comprises an alarm, and the MCU control circuit 11 is connected with a Power board 13 to be tested and used for sending a first electric signal to the Power board 13 to be tested so as to detect the Power board 13 to be tested; MCU control circuit 11 is connected with alarm circuit 12 for send the second signal of telecommunication in order to control the alarm to indicate the testing result to alarm circuit 12, detection circuitry 14 is connected with MCU control circuit 11 and Power board 13 that awaits measuring, detects whether short circuit between the interface of Power board 13 that awaits measuring, and whether three emitting diode normally work. Through the device that this application provided, send the signal of telecommunication through MCU control circuit 11 and realize detecting the Power board 13 that awaits measuring and show the test result, avoided carrying out the Power board test on the PC frock, need carry out the start action, wait for the computer to get into the OS page, show the slower problem of test result.
According to the above embodiment, this embodiment provides a preferable solution of the alarm circuit 12, and the alarm circuit includes a third resistor R3, a fourth resistor R4, a first indicating circuit, a second indicating circuit, and a third transistor Q3;
the first end of a third resistor R3 is connected with a fifth interface P1.4 of the MCU, the second end of a third resistor R3 is connected with the base electrode of a third triode, the collector electrode of the third triode is connected with the first end of a fourth resistor R4, and the second end of a fourth resistor R4 is connected with a first indicating circuit and a second indicating circuit;
the first indicating circuit is used for indicating that the detection result of the Power plate 13 to be detected is qualified, and the second indicating circuit is used for indicating that the detection result of the Power plate 13 to be detected is unqualified.
It should be noted that the present embodiment does not limit the specific types of the first indication circuit and the second indication circuit, for example, the first indication circuit is a green indication lamp, and the second indication circuit is a red indication lamp, and the first indication circuit and the second indication circuit are designed according to actual needs.
The first indicating circuit is used for indicating that the detection result of the Power plate 13 to be detected is qualified, and the second indicating circuit is used for indicating that the detection result of the Power plate 13 to be detected is unqualified; when the detection is qualified, the MCU assigns a value to the base electrode of the third triode through the fifth interface P1.4 to enable the first indicating circuit to be conducted to indicate that the detection result of the Power board 13 to be detected is qualified, and when the detection is unqualified, the MCU assigns a value to the base electrode of the third triode through the fifth interface P1.4 to enable the first indicating circuit to be conducted to indicate that the detection result of the Power board 13 to be detected is unqualified.
Through the alarm circuit provided by the embodiment, the conditions of qualified detection and unqualified detection are separately indicated, and the detection result is visually obtained.
Fig. 7 is a schematic diagram of an alarm circuit according to an embodiment of the present application, and as shown in fig. 7, according to the above embodiment, the present application provides a preferred solution, where the first indication circuit includes: a fifth resistor R5, a first light emitting diode D1,
the second end of the fourth resistor R4 is connected with the first end of the fifth resistor R5, the second end of the fifth resistor R5 is connected with the anode of the first light-emitting diode D1, and the cathode of the first light-emitting diode D1 is connected with the third interface P1.2 of the MCU.
When the detection is qualified, the MCU assigns a value to the base electrode of the third triode through the fifth interface P1.4, and assigns a value to the negative electrode of the first light-emitting diode D1 through the third interface P1.2, so that the first light-emitting diode D1 is conducted, and the current detection is qualified.
According to the above embodiments, this embodiment provides a preferable solution, and the second indicating circuit includes: a sixth resistor R6, a second LED D2;
the second end of the fourth resistor R4 is connected with the first end of the sixth resistor R6, the second end of the sixth resistor R6 is connected with the anode of the second light-emitting diode D2, and the cathode of the second light-emitting diode D2 is connected with the fourth port P1.3 of the MCU.
When the detection is unqualified, the MCU assigns a value to the base electrode of the third triode through the fifth interface P1.4, and assigns a value to the negative electrode of the second light-emitting diode D2 through the fourth interface P1.3, so that the second light-emitting diode D2 is conducted, and the current detection is indicated to be qualified.
According to the above embodiment, in order to more directly indicate the detection result when the detection is failed and to alert the worker, the alarm circuit further includes: the buzzer B1 is provided with a buzzer,
an emitter of the third triode Q3 is connected with the first end of the buzzer B1, and the second end of the buzzer B1 is grounded.
When the detection is unqualified, the MCU assigns a value to the base electrode of the third triode through the fifth interface P1.4, so that the buzzer B1 is conducted, and the buzzer B1 gives an alarm to the staff.
According to the above embodiment, the first connector JP3001 of the Power board 13 to be tested needs to be connected with the MCU of the MCU control circuit 11, so that the MCU is used for detecting the interface assignment of the Power board 13 to be tested, and since the MCU is directly connected with the Power board 13 to be tested, the Power board 13 to be tested may be short-circuited, this embodiment provides an optimized solution, and the Power board testing apparatus further includes: fig. 7 is a schematic diagram of a second connector provided in this embodiment of the present application, and as shown in fig. 7, the second connector JP3001-1 is connected to the MCU and the Power board 13 to be tested, the second connector JP3001-1 is connected to the MCU in a one-to-one correspondence, and the second connector JP3001-1 is connected to the Power board 13 to be tested in a one-to-one correspondence.
The MCU is connected with the Power board 13 to be tested through the second connector JP3001-1, the second connector JP3001-1 is only used as a connecting device for connecting the MCU with the Power board 13 to be tested, no electric signal is processed, and the problem of short circuit possibly caused by direct connection of the MCU with the Power board 13 to be tested is avoided.
According to the above embodiment, in order to enable the operator to control the type of test to be performed, this embodiment provides a preferable solution, and the Power board testing apparatus further includes: fig. 8 is a schematic diagram of a control circuit according to an embodiment of the present application, and as shown in fig. 8, the control circuit includes: a first switch S1, a second switch S2,
one end of the first switch S1 is connected with the first interface P1.0 of the MCU, and the other end of the first switch S1 is grounded; the MCU is used for receiving a low level signal by the first MCU interface P1.0 and assigning a high level to the sixth MCU interface P1.5 and the seventh MCU interface P1.6 when the first switch S1 is closed;
one end of the second switch S2 is connected with the second interface P1.1 of the MCU, and the other end of the second switch S2 is grounded; the MCU is configured to, when the second switch S2 is closed, receive the low level signal at the second interface P1.1 of the MCU, assign a low level to the sixth interface 1.5 of the MCU and the seventh interface 1.6 of the MCU.
When the first switch S1 is closed, the MCU first interface P1.0 receives a low level signal, assigns a high level to the MCU sixth interface P1.5 and the MCU seventh interface P1.6, that is, assigns a high level to the base of the first transistor Q1 and the base of the second transistor Q2, and detects whether there is a short circuit between the interfaces of the Power board 13 to be tested. When the second switch S2 is closed, the MCU second interface P1.1 receives the low level signal, assigns a low level to the MCU sixth interface 1.5 and the MCU seventh interface 1.6, that is, assigns a low level to the base of the first transistor Q1 and the base of the second transistor Q2, and detects whether the three leds of the Power board 13 to be tested are working normally.
In order to make the present solution better understood by those skilled in the art, the present embodiment provides a specific preferred solution, a Power board testing apparatus, including: the device comprises an MCU control circuit 11, an alarm circuit 12, a detection circuit 14, a second connector JP3001-1 and a control circuit;
the MCU control circuit 11 is shown in FIG. 2, the Power board 13 circuit to be tested is shown in FIGS. 3 and 4, the detection circuit 14 is shown in FIG. 5, the alarm circuit 12 is shown in FIG. 6, the second connector JP3001-1 is shown in FIG. 7, and the control circuit is shown in FIG. 8;
one end of a first switch S1 of the control circuit is connected with a first interface P1.0 of the MCU, the other end of the first switch S1 is grounded, one end of a second switch S2 is connected with a second interface P1.1 of the MCU, and the other end of the second switch S2 is grounded; the alarm circuit 12 comprises a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a first light-emitting diode D1, a second light-emitting diode D2, a third triode Q3 and a buzzer B1; the first end of a third resistor R3 is connected with a fifth interface P1.4 of the MCU, the second end of a third resistor R3 is connected with the base electrode of the third triode, the collector electrode of the third triode is connected with the first end of a fourth resistor R4, the second end of the fourth resistor R4 is connected with the first end of a fifth resistor R5, the second end of a fifth resistor R5 is connected with the anode of a first light-emitting diode D1, the cathode of the first light-emitting diode D1 is connected with the third interface P1.2 of the MCU, the second end of the fourth resistor R4 is connected with the first end of a sixth resistor R6, the second end of the sixth resistor R6 is connected with the anode of a second light-emitting diode D2, the cathode of the second light-emitting diode D2 is connected with the fourth interface P1.3 of the MCU, the emitter of a third triode Q3 is connected with the first end of a buzzer B1, and the second end of the buzzer B1 is grounded; the base of a first triode Q1 of the detection circuit 14 is connected with a sixth MCU interface P1.5, a fourth Relay Relay0 interface is connected with a second interface P2 of the Power board 13 to be detected, a sixth Relay Relay0 interface is connected with an eleventh MCU interface P3.1, the base of a second triode Q2 is connected with a seventh MCU interface P1.6, a fourth Relay Relay1 interface is connected with a seventh MCU interface P7 of the Power board 13 to be detected, and a sixth Relay Relay1 interface is connected with a fifteenth MCU interface P3.5; the interfaces P3.0-P3.6 of the MCU control circuit 11 are correspondingly connected with the interfaces P1-P8 (P6 grounding) of the second connector JP3001-1 one by one, and the interfaces P1-P8 (P6 grounding) of the second connector JP3001-1 are correspondingly connected with the interfaces P1-P8 (P6 grounding) of the first connector JP3001 of the Power board 13 to be tested one by one.
Specifically, when the switch S1 is closed and the switch S2 is opened, the MCU first interface P1.0 receives a low level signal, assigns a high level to the MCU sixth interface P1.5 and the MCU seventh interface P1.6, the first Relay0 and the second Relay1 operate, the third interface, the fourth interface and the sixth interface are connected, the fourth interface of the first Relay0 is connected to the second interface P2 of the Power board 13 to be tested, the sixth interface of the first Relay0 is connected to the eleventh interface P3.1 of the MCU, so the second interface P2 of the Power board 13 to be tested is connected to the eleventh interface P3.1 of the MCU, the fourth interface of the second Relay1 is connected to the seventh interface P7 of the Power board 13 to be tested, the sixth interface of the second Relay1 is connected to the fifteenth interface P3.5 of the MCU, so the seventh interface P7 of the Power board to be tested is connected to the fifteenth interface P52 of the MCU, and the eighth interface P52 of the fifth interface P3.3 to be tested, The ninth interfaces are connected in a one-to-one correspondence manner; the MCU is used for assigning values to the interfaces of the Power board 13 to be tested, the adjacent interfaces are assigned to be high level and low level, when the MCU detects that the corresponding levels are normal assigned levels, the short-circuit test between the interfaces passes, the MCU controls the first light-emitting diode D1 to be conducted to indicate that the short-circuit test passes, and when the detected levels do not accord with the assigned levels, the MCU controls the second light-emitting diode D2 and the buzzer B1 to be conducted to indicate that the short-circuit test does not pass.
Specifically, when the switch S2 is closed and the switch S1 is opened, the MCU second interface P1.1 receives a low level signal, assigns a low level to the MCU sixth interface 1.5 and the MCU seventh interface 1.6, the first Relay0 and the second Relay1 do not operate, the first interface, the third interface and the fourth interface are connected, and the first interfaces of the first Relay0 and the second Relay1 are connected to the Power supply, so the second interface P2 and the seventh interface P7 of the Power board 13 to be tested are connected to the Power supply; and assigning low levels to the eighth interface P8, the third interface P3 and the fourth interface P4 of the Power board 13 to be tested through the MCU, wherein at this time, circuits where the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 of the Power board 13 to be tested are located form a loop, if the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 are normally lit, the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 pass the function test, and if any one of the third light emitting diode D3, the fourth light emitting diode D4 and the fifth light emitting diode D5 is not lit, the test does not pass.
Specifically, when the switches S1 and S2 are turned off, the MCU assigns a high level to the interfaces P3.0 and P3.4, and assigns a high level to the first interface P1 and the fifth interface P5 of the first connector JP3001 of the Power board 13 to be tested through the second connector JP3001-1, and when the third switches S3 and S4 are turned off, due to the physical connection relationship, the high levels corresponding to the first interface P1 and the fifth interface P5 are forced to be pulled low because of the ground, and the MCU detects that the levels of the interfaces P3.0 and P3.4 are pulled low, and controls the second light emitting diode D2 and the buzzer B1 to be turned on, so as to indicate that the switch test does not pass.
Through the device that this application provided, send the signal of telecommunication through MCU control circuit 11 and realize detecting the Power board 13 that awaits measuring and show the test result, avoided carrying out the Power board test on the PC frock, need carry out the start action, wait for the computer to get into the OS page, show the slower problem of test result.
The Power board testing device provided by the application is described in detail above. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description. It should be noted that, for those skilled in the art, it is possible to make several improvements and modifications to the present application without departing from the principle of the present application, and such improvements and modifications also fall within the scope of the claims of the present application.
It is further noted that, in the present specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

Claims (7)

1. A Power board testing device, characterized by, includes:
the device comprises an MCU control circuit, an alarm circuit and a detection circuit, wherein the MCU control circuit comprises an MCU;
the MCU control circuit is connected with the Power board to be detected and is used for sending a first electric signal to the Power board to be detected so as to detect the Power board to be detected;
the MCU control circuit is connected with the alarm circuit and is used for sending a second electric signal to the alarm circuit so as to control the alarm to indicate a detection result;
the detection circuit with MCU control circuit with the Power board that awaits measuring is connected, detection circuit includes: the circuit comprises a first triode, a second triode, a first resistor, a second resistor, a first relay and a second relay; wherein, the Power board that awaits measuring includes: the third light emitting diode, the fourth light emitting diode, the fifth light emitting diode, the ninth resistor, the tenth resistor, the third switch, the fourth switch and the first connector;
the cathode of the third led is connected to the eighth interface of the first connector, the anode of the third led is connected to the first terminal of the ninth resistor, the second terminal of the ninth resistor is connected to the second interface of the first connector, the seventh interface of the first connector is connected to the second terminal of the tenth resistor, the first terminal of the tenth resistor is connected to the anode of the fourth led and the anode of the fifth led, the cathode of the fourth led is connected to the third interface of the first connector, the cathode of the fifth led is connected to the fourth interface of the first connector, the first interface of the first connector is connected to the third switch, the other end of the third switch is grounded, the fifth interface of the first connector is connected to the fourth switch, and the other end of the fourth switch is grounded;
the base electrode of the first triode is connected with the sixth interface of the MCU, the collector electrode of the first triode is connected with one end of the first resistor, the other end of the first resistor is connected with a power supply, the emitter electrode of the first triode is connected with the fifth interface of the first relay, the first interface of the first relay is connected with the power supply, the second interface of the first relay is grounded, the fourth interface of the first relay is connected with the second interface of the first connector, and the sixth interface of the first relay is connected with the eleventh interface of the MCU;
the base electrode of the second triode is connected with the seventh interface of the MCU, the collector electrode of the second triode is connected with one end of the second resistor, the other end of the second resistor is connected with a power supply, the emitter electrode of the second triode is connected with the fifth interface of the second relay, the first interface of the second relay is connected with the power supply, the second interface of the second relay is grounded, the fourth interface of the second relay is connected with the seventh interface of the first connector, and the sixth interface of the second relay is connected with the fifteenth interface of the MCU.
2. The Power board testing device of claim 1, wherein the alarm circuit comprises: the first indication circuit comprises a first resistor, a second resistor, a third resistor, a fourth resistor, a first indication circuit, a second indication circuit and a third triode;
the first end of the third resistor is connected with a fifth interface of the MCU, the second end of the third resistor is connected with the base electrode of the third triode, the collector electrode of the third triode is connected with the first end of the fourth resistor, and the second end of the fourth resistor is connected with the first indicating circuit and the second indicating circuit;
the first indicating circuit is used for indicating that the detection result of the Power plate to be detected is qualified, and the second indicating circuit is used for indicating that the detection result of the Power plate to be detected is unqualified.
3. The Power board testing device of claim 2, wherein the first indicator circuit comprises: a fifth resistor, a first light emitting diode;
the second end of the fourth resistor is connected with the first end of the fifth resistor, the second end of the fifth resistor is connected with the anode of the first light-emitting diode, and the cathode of the first light-emitting diode is connected with the third interface of the MCU.
4. The Power board testing device of claim 2, wherein the second indicator circuit comprises: a sixth resistor and a second light emitting diode;
the second end of the fourth resistor is connected with the first end of the sixth resistor, the second end of the sixth resistor is connected with the anode of the second light emitting diode, and the cathode of the second light emitting diode is connected with the fourth interface of the MCU.
5. The Power board testing device of claim 2, wherein the alarm circuit further comprises: a buzzer;
and the emitter of the third triode is connected with the first end of the buzzer, and the second end of the buzzer is grounded.
6. The Power board testing device of claim 2, further comprising: a second connector; the second connector with MCU control circuit with the Power board that awaits measuring is connected, the second connector with the MCU one-to-one is connected, the second connector with the Power board one-to-one that awaits measuring is connected.
7. The Power board testing device of claim 1, further comprising: a control circuit, the control circuit comprising: a first switch and a second switch;
one end of the first switch is connected with the first interface of the MCU, and the other end of the first switch is grounded; the MCU is used for receiving a low level signal by the first interface of the MCU and assigning a high level to the sixth interface and the seventh interface of the MCU when the first switch is closed;
one end of the second switch is connected with the second interface of the MCU, and the other end of the second switch is grounded; and the MCU is used for receiving a low level signal by the second interface of the MCU and assigning a low level to the sixth interface and the seventh interface of the MCU when the second switch is closed.
CN202210046379.4A 2022-01-17 2022-01-17 Power board testing arrangement Active CN114062906B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5844363A (en) * 1981-09-10 1983-03-15 Toshiba Corp Unit tester for power board
CN103487683A (en) * 2013-09-13 2014-01-01 深圳市九洲电器有限公司 Product testing circuit and product testing device
CN205080242U (en) * 2015-07-28 2016-03-09 芜湖美的厨卫电器制造有限公司 Power strip function test system
CN113918396A (en) * 2021-09-30 2022-01-11 浪潮(山东)计算机科技有限公司 System, method, device and medium for testing touch panel

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201113697A (en) * 2009-10-12 2011-04-16 Quanta Comp Inc Test device

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5844363A (en) * 1981-09-10 1983-03-15 Toshiba Corp Unit tester for power board
CN103487683A (en) * 2013-09-13 2014-01-01 深圳市九洲电器有限公司 Product testing circuit and product testing device
CN205080242U (en) * 2015-07-28 2016-03-09 芜湖美的厨卫电器制造有限公司 Power strip function test system
CN113918396A (en) * 2021-09-30 2022-01-11 浪潮(山东)计算机科技有限公司 System, method, device and medium for testing touch panel

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