CN114061529B - Aspherical surface measuring jig and aspherical surface measuring device - Google Patents
Aspherical surface measuring jig and aspherical surface measuring device Download PDFInfo
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- CN114061529B CN114061529B CN202111338531.8A CN202111338531A CN114061529B CN 114061529 B CN114061529 B CN 114061529B CN 202111338531 A CN202111338531 A CN 202111338531A CN 114061529 B CN114061529 B CN 114061529B
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- 238000004441 surface measurement Methods 0.000 claims abstract description 9
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 238000006073 displacement reaction Methods 0.000 abstract description 3
- 238000005259 measurement Methods 0.000 description 18
- 238000000034 method Methods 0.000 description 10
- 230000008569 process Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 230000007246 mechanism Effects 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 3
- 238000005086 pumping Methods 0.000 description 3
- 238000001179 sorption measurement Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000003139 buffering effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004438 eyesight Effects 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000000741 silica gel Substances 0.000 description 1
- 229910002027 silica gel Inorganic materials 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/22—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes
- G01B21/24—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring angles or tapers; for testing the alignment of axes for testing alignment of axes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/0002—Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C9/00—Measuring inclination, e.g. by clinometers, by levels
- G01C9/02—Details
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
The application relates to an aspherical surface measuring jig and an aspherical surface measuring device. An aspherical surface measurement jig, comprising: the jig main body is provided with an accommodating groove capable of accommodating a workpiece to be measured; and the limiting part is arranged on the jig main body, and one end of the limiting part can extend into the accommodating groove or outwards displace relative to the accommodating groove along the radial displacement of the accommodating groove. When the aspherical measuring jig is used, the workpiece to be measured cannot move relative to the aspherical measuring jig, so that the measuring accuracy of the eccentric amount is higher.
Description
Technical Field
The present disclosure relates to the field of aspheric surface measurement, and in particular, to an aspheric surface measuring tool and an aspheric surface measuring device.
Background
In aspheric surface measurement, a lens to be measured is usually placed in an embedded groove of an existing jig, the jig is rotated, and an eccentric meter is used for measuring the eccentric amount, however, dimensional errors exist in different lenses to be measured, and the lens to be measured placed in the embedded groove is easy to be separated from the side wall of the embedded groove due to the dimensional errors of the lens to be measured, so that displacement occurs in the aspheric surface measurement process to form a larger measurement error.
Disclosure of Invention
Accordingly, it is necessary to provide an aspherical surface measuring jig and an aspherical surface measuring device for solving the problem that a large measuring error occurs in the aspherical surface measuring process due to the dimension error of the lens to be measured.
According to one aspect of the present application, there is provided an aspherical surface measurement jig, including:
the jig main body is provided with an accommodating groove capable of accommodating a workpiece to be measured; and
and one end of the limiting component can move radially along the accommodating groove to extend into the accommodating groove or move outwards relative to the accommodating groove.
In one embodiment, the jig body includes an annular body portion, and at least two radially extending portions extending radially inward along the annular body portion;
at least two of the radially extending portions are circumferentially spaced about the annular body portion.
In one embodiment, the radially extending portion has an abutment surface disposed opposite the outer peripheral surface of the annular body portion.
In one embodiment, the abutment surface is arcuate.
In one embodiment, the radius of the abutment surface is 5-6mm.
In one embodiment, at least one of the radially extending portions has a through hole through which the stopper member radially penetrates along the annular main body portion;
the limiting component is arranged in the through hole;
the through hole is communicated with the accommodating groove.
In one embodiment, the spacing member comprises a micrometer cartridge;
the centerline of the micrometer head of the micrometer cylinder is parallel to the radial direction of the annular body portion.
In one embodiment, the radial extension is capable of being displaced radially of the receiving groove to extend into the receiving groove or to be displaced outwardly relative to the receiving groove.
In one embodiment, the radial extension is displaceable in the circumferential direction of the receiving groove.
In one embodiment, the aspheric surface measuring tool further comprises a mounting member coaxial with the annular main body portion and detachably connected to the annular main body portion.
In one embodiment, the annular main body part is provided with a first mounting hole axially arranged along the annular main body part;
the mounting piece is provided with a second mounting hole;
the annular main body part and the mounting piece are coaxially connected with the second mounting hole by means of the first mounting hole.
According to another aspect of the present application, an aspheric surface measuring device is provided, including the aspheric surface measuring tool.
The aspheric surface measuring jig and the aspheric surface measuring device can enable the workpiece to be measured to be placed in the accommodating groove when the aspheric surface measuring jig is used, one end of the limiting component stretches into the accommodating groove along the radial displacement of the accommodating groove, so that the limiting component is abutted to the workpiece to be measured to limit the workpiece to be measured, the side wall of the accommodating groove is abutted to the side wall of the workpiece to be measured, the workpiece to be measured can be fixed in the accommodating groove, the limiting component can be applicable to the workpiece to be measured with different size errors due to the fact that one end of the limiting component can radially displace along the jig main body, the workpiece to be measured with different size errors can be limited and fixed by using the aspheric surface measuring jig, the eccentric meter can be used for measuring the eccentric value, the workpiece to be measured can rotate together with the aspheric surface measuring jig, and in the process, the workpiece to be measured cannot move relative to the aspheric surface measuring jig, and the measuring accuracy of the eccentric value is higher.
Drawings
Fig. 1 shows a schematic structural diagram (first view) of a jig main body and a workpiece to be measured according to an embodiment of the present application;
FIG. 2 is a schematic diagram showing the structure of an aspherical surface measuring tool and a workpiece to be measured according to an embodiment of the present application;
fig. 3 shows a schematic structural diagram (second view) of a jig main body and a workpiece to be measured according to an embodiment of the present application;
FIG. 4 illustrates a top view of a jig body and a workpiece to be tested in an embodiment of the present application;
FIG. 5 is a schematic view showing the structure of a jig main body and a workpiece to be measured according to another embodiment of the present application;
fig. 6 shows a top view of a jig body and a workpiece to be measured in another embodiment of the present application.
In the figure: 10. an aspherical surface measuring jig; 110. a jig main body; 111. an annular body portion; 1111. a receiving groove; 1112. a notch; 1113. a first mounting hole; 1114. a first annular groove; 1115. a second annular groove; 112. a radial extension; 1121. an abutment surface; 1122. a through hole; 1123. a sub-abutment surface; 113. positioning bolts; 120. a limiting member; 130. a workpiece to be measured; 140. and a mounting member.
Detailed Description
In order to make the above objects, features and advantages of the present application more comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. This application is, however, susceptible of embodiment in many other forms than those described herein and similar modifications can be made by those skilled in the art without departing from the spirit of the application, and therefore the application is not to be limited to the specific embodiments disclosed below.
In the description of the present application, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," etc. indicate orientations or positional relationships based on the orientation or positional relationships shown in the drawings, are merely for convenience in describing the present application and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be configured and operated in a particular orientation, and therefore should not be construed as limiting the present application.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In the description of the present application, the meaning of "plurality" is at least two, such as two, three, etc., unless explicitly defined otherwise.
In this application, unless specifically stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
In this application, unless expressly stated or limited otherwise, a first feature "up" or "down" a second feature may be the first and second features in direct contact, or the first and second features in indirect contact via an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.
It will be understood that when an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like are used herein for illustrative purposes only and are not meant to be the only embodiment.
At present, the aspherical design of the aspherical mirror corrects images, solves the problems of distortion of vision and the like, and simultaneously, makes the lens lighter, thinner and flatter. Moreover, the aspherical mirror still maintains excellent impact resistance, and these advantages of the aspherical mirror make the use of the aspherical mirror wider.
The inventors have noted that a large amount of center misalignment can lead to increased lens manufacturing errors when fixing, adjusting and bonding a large number of lenses, and thus, it is important to obtain a more accurate amount of decentration. In the eccentric measurement process, the lens to be measured is usually placed in the embedded groove of the existing jig, so as to rotate the jig, and the eccentric measurement is performed by using the eccentric meter, however, different lenses to be measured have dimensional errors, the lens to be measured placed in the embedded groove is easy to displace in the eccentric measurement process due to the dimensional errors of the lens to be measured, that is, the lens to be measured placed in the embedded groove cannot be placed in the embedded groove in a matched manner due to the dimensional errors, and a gap exists between the lens to be measured and the jig, so that the lens to be measured can displace relative to the jig in the aspheric measurement process, and further a larger measurement error is formed.
In order to alleviate the problem that different lenses to be measured have dimensional errors and have intervals with the jig, the applicant researches and discovers that a detachable limiting component can be arranged for the lenses to be measured in design, the limiting component can be used for limiting the lenses to be measured with different dimensional errors, the design can be used for limiting and fixing the lenses to be measured with different dimensional errors, and then aspheric surface measurement, such as eccentric measurement, can be carried out on the lenses to be measured with different dimensional errors. In addition, in the aspheric surface measurement process of the lens to be measured, the lens to be measured is limited and fixed, so that the lens to be measured cannot move relative to the limiting component, the measurement error is small, and the measurement is more accurate.
Fig. 1 shows a schematic structural diagram of a jig main body 110 and a workpiece 130 to be measured in an embodiment of the present application, and fig. 2 shows a schematic structural diagram of an aspheric surface measuring jig 10 and a workpiece 130 to be measured in an embodiment of the present application.
Referring to fig. 1 and 2, an aspheric surface measuring tool 10 according to an embodiment of the present application includes a tool body 110 and a limiting member 120.
The jig main body 110 has a receiving slot 1111 for receiving the workpiece 130 to be measured, the limiting member 120 is disposed on the jig main body 110, and one end of the limiting member 120 can be displaced radially along the receiving slot 1111 to extend into the receiving slot 1111 or be displaced outwardly relative to the receiving slot 1111. When the aspheric surface measuring jig 10 is used, the jig main body 110 can be fixed in a to-be-measured area of an eccentric instrument, the to-be-measured workpiece 130 is placed in the accommodating groove 1111, one end of the limiting component 120 is enabled to move radially along the accommodating groove 1111 and extend into the accommodating groove 1111, the limiting component 120 is enabled to be abutted against the to-be-measured workpiece 130 to limit the to-be-measured workpiece 130, the side walls of the to-be-measured workpiece 130 and the accommodating groove 1111 are enabled to be abutted against each other, the to-be-measured workpiece 130 can be fixed in the accommodating groove 1111, and the limiting component 120 can be enabled to be applicable to the to-be-measured workpiece 130 with different dimensional errors due to the fact that one end of the limiting component 120 can move radially along the jig main body 110, the to-be-measured workpiece 130 with different dimensional errors can be limited and fixed by the aspheric surface measuring jig 10, so that the eccentricity measurement can be performed by using the eccentric instrument, and the to-be-measured workpiece 130 can rotate together with the aspheric surface measuring jig 10, and in the process, the to-be-measured workpiece 130 cannot move relative to the aspheric surface measuring jig 10, and the measurement accuracy is higher.
Further, referring to fig. 1 and 2 again, the jig main body 110 includes an annular main body 111, and at least two radially extending portions 112 extending radially inward along the annular main body 111, the at least two radially extending portions 112 being spaced apart around the circumference of the annular main body 111.
It will be appreciated that the annular body portion 111 and the at least two radially extending portions 112 together enclose a receiving groove 1111, the radial direction of the receiving groove 1111 being parallel to the radial direction of the annular body portion 111. At least two radial extensions 112 are also circumferentially spaced around the receiving slot 1111.
When the aspheric surface measuring tool 10 is used, the tool main body 110 can be fixed in the to-be-measured area of the eccentric instrument, and the to-be-measured workpiece 130 is placed in the accommodating groove 1111, then when one end of the limiting component 120 moves radially along the accommodating groove 1111 to extend into the accommodating groove 1111 and is abutted against the to-be-measured workpiece 130, the at least one radial extending portion 112 can also be abutted against the to-be-measured workpiece 130, so that the to-be-measured workpiece 130 can be well fixed in the accommodating groove 1111, and the eccentric amount can be measured by using the eccentric instrument.
Further, referring to fig. 1 again, and referring to fig. 3 in combination, the radially extending portion 112 has an abutment surface 1121 disposed opposite to the outer peripheral surface of the annular main body 111.
That is, the abutment surface 1121 of the at least one radially extending portion 112 can radially abut against the workpiece 130 to be measured along the annular main body portion 111, so that, on one hand, one end of the limiting member 120 can radially displace along the jig main body 110 and extend into the accommodating groove 1111, so that one end of the limiting member 120 radially abuts against the workpiece 130 to be measured along the annular main body portion 111, and on the other hand, the abutment surface 1121 of the at least one radially extending portion 112 can radially abut against the workpiece 130 to be measured along the annular main body portion 111, so that the workpiece 130 to be measured can be better fixed in the accommodating groove 1111.
Optionally, a buffer is disposed on the abutment surface 1121, and the buffer is disposed between the abutment surface 1121 and the workpiece 130 to be measured, so as to protect the workpiece 130 to be measured from being damaged during the fixing process of the aspheric surface measuring tool 10. Of course, the buffer may also be disposed on a side of the limiting member 120 facing the workpiece 130 to be tested, for protecting the workpiece 130 to be tested.
Optionally, the buffer member may be a rubber pad, the buffer member may also be foam, the buffer member may also be a silica gel pad, and the buffer member may also be made of other materials capable of buffering and protecting the workpiece 130 to be tested.
In some embodiments, referring to fig. 1 and 3 again, the contact surface 1121 is arc-shaped, and when the contact surface 1121 of the radially extending portion 112 radially contacts the workpiece 130 to be measured along the annular main portion 111, the contact surface 1121 of the arc-shaped contact surface 1121 contacts the workpiece 130 to be measured with a larger contact area, so that the contact surface 1121 of the radially extending portion 112 radially contacts the workpiece 130 to be measured along the annular main portion 111, and the workpiece 130 to be measured can be fixed in the accommodating groove 1111 better.
Further, the radius of the abutment surface 1121 is 5-6mm, so that the abutment surface 1121 can better cooperate with the outer periphery of the workpiece 130 to be measured, so that the workpiece 130 to be measured can be better fixed by using the aspheric surface measuring jig 10.
In other embodiments, referring to fig. 4, the abutment surface 1121 includes two sub-abutment surfaces 1123 connected at an angle, so that the two sub-abutment surfaces 1123 of the abutment surface 1121 can respectively abut against the outer periphery of the workpiece 130 to be measured, i.e. the two sub-abutment surfaces 1123 can respectively tangent to the outer periphery of the workpiece 130 to be measured, so as to increase the contact area between the radial extension 112 and the workpiece 130 to be measured, and also make the abutment surface 1121 suitable for workpieces to be measured with different sizes, especially for workpieces 130 to be measured with different dimensional errors, so as to better fix the workpiece 130 to be measured by using the aspheric measuring tool 10.
Further, referring to fig. 2 again, at least one radially extending portion 112 has a through hole 1122 for the limiting member 120 to radially penetrate along the annular main body portion 111, the limiting member 120 is mounted in the through hole 1122, and the through hole 1122 and the receiving groove 1111 are mutually communicated, so that the limiting member 120 radially penetrates through the through hole 1122 along the annular main body portion 111, so that one end of the limiting member 120 can radially displace along the jig main body 110 to extend into the receiving groove 1111 or displace outwardly relative to the receiving groove 1111.
In some embodiments, referring again to fig. 2, one of the radial extending portions 112 has a through hole 1122 for the limiting member 120 to pass radially through along the annular main portion 111, and the limiting member 120 is mounted in the through hole 1122.
In other embodiments, two radially extending portions 112 have through holes 1122 for the limiting members 120 to penetrate radially along the annular main body 111, and two limiting members 120 are mounted in the two through holes 1122 in a one-to-one correspondence manner, so that the workpiece 130 to be measured in the receiving groove 1111 can be better fixed by using the two limiting members 120.
In still other embodiments, the plurality of radially extending portions 112 each have a through hole 1122 for the limiting member 120 to radially penetrate along the annular main body 111, and the number of limiting members 120 is also plural, and each limiting member 120 is mounted in the corresponding through hole 1122, so that the workpiece 130 to be measured in the receiving groove 1111 can be better fixed by the plurality of limiting members 120.
Further, the stopper 120 includes a micrometer cylinder, a center line of a micrometer head of which is parallel to a radial direction of the annular main body portion 111.
It will be appreciated that the micrometer head of the micrometer cylinder can be displaced in the radial direction of the annular main body 111 to abut against the workpiece 130 to be measured, i.e. the micrometer head of the micrometer cylinder can be displaced in the radial direction of the accommodation groove 1111 to abut against the workpiece 130 to be measured.
When the aspheric surface measuring tool 10 is used, the tool main body 110 can be fixed in the to-be-measured area of the eccentric instrument, the to-be-measured workpiece 130 is placed in the accommodating groove 1111, and then one end of the micrometer cylinder, which is far away from the micrometer head, is rotated, so that the micrometer head of the micrometer cylinder can displace along the radial direction of the annular main body 111, that is, the micrometer head of the micrometer cylinder can displace along the radial direction of the accommodating groove 1111 to extend into the accommodating groove 1111 or displace outwards relative to the accommodating groove 1111, so that the limiting component 120 is abutted against the to-be-measured workpiece 130, and the to-be-measured workpiece 130 with different dimensional errors can be limited and fixed in the accommodating groove 1111 by the micrometer cylinder.
Further, referring to fig. 1 and 2 again, the annular main body 111 is provided with a notch 1112 located at a side of the through hole 1122 away from the accommodating groove 1111 and communicated with the through hole 1122, the size of one end of the notch 1112 facing the through hole 1122 is smaller than the size of one end of the notch 1112 away from the through hole 1122, the size of one end of the micro-measuring cylinder away from the micro-measuring head is larger, so that the micro-measuring cylinder can conveniently pass through the notch 1112 and be mounted on the through hole 1122, and the micro-measuring head of the micro-measuring cylinder can pass through the notch 1112 and the through hole 1122, so that the micro-measuring head of the micro-measuring cylinder can conveniently displace along the radial direction of the annular main body 111.
Further, referring to fig. 5 and 6, the radial extension 112 can be displaced radially of the receiving groove 1111 to extend into the receiving groove 1111 or be displaced outwardly relative to the receiving groove 1111. The radial extension 112 can be displaced along the radial direction of the accommodating groove 1111 according to the workpieces 130 to be measured with different sizes, so that the contact surface 1121 of at least one radial extension 112 can be contacted with the workpieces 130 to be measured, thereby improving the applicability of the aspheric surface measuring tool 10.
Further, referring to fig. 5 and 6 again, the radially extending portion 112 can be displaced along the circumferential direction of the accommodating groove 1111, so as to facilitate adjusting the position of the radially extending portion 112 along the circumferential direction of the accommodating groove 1111 according to different workpieces 130 to be tested, thereby ensuring that the abutment surface 1121 of at least one radially extending portion 112 can abut against the workpiece 130 to be tested, for example, adjusting the position of the radially extending portion 112 along the circumferential direction of the accommodating groove 1111 according to the outer circumferential surface of the workpiece 130 to be tested, so that the abutment surface 1121 of at least one radially extending portion 112 can be substantially matched with the outer circumferential surface of the workpiece 130 to be tested, and improving the contact area between the abutment surface 1121 of the radially extending portion 112 and the workpiece 130 to be tested, and also improving the installation firmness of the workpiece 130 to be tested.
Optionally, referring to fig. 5, a first annular groove 1114 formed along a circumferential direction of the annular main body 111 is formed on an inner circumferential surface of the annular main body 111, the radially extending portion 112 is movably formed along the circumferential direction of the accommodating groove 1111 in the first annular groove 1114, referring to fig. 6, a second annular groove 1115 formed along a circumferential direction of the annular main body 111 is formed on a top surface of the annular main body 111, each radially extending portion 112 may be fixed on the first annular groove 1114 by means of the positioning bolt 113, specifically, an outer diameter of a bolt head of the positioning bolt 113 is larger than a groove width of the second annular groove 1115, so that a thread section of the positioning bolt 113 may pass through the second annular groove 1115, but a bolt head of the positioning bolt 113 cannot pass through the second annular groove 1115. Each of the radially extending portions 112 is provided with a threaded hole which is matched with the positioning bolt 113, the threaded section of the positioning bolt 113 passes through the second annular groove 1115 along the direction perpendicular to the top surface of the annular main body portion 111 and is connected with the threaded hole of the corresponding radially extending portion 112, and the bolt head of the positioning bolt 113 is abutted against the top surface of the annular main body portion 111 along the direction perpendicular to the top surface of the annular main body portion 111, so that the corresponding radially extending portion 112 is positioned on the first annular groove 1114.
When the position of the radially extending portion 112 along the circumferential direction of the receiving groove 1111 needs to be adjusted, the corresponding positioning bolt 113 may be loosened, the radially extending portion 112 may be displaced to a suitable position along the circumferential direction of the receiving groove 1111, and then the corresponding positioning bolt 113 may be tightened to fix the radially extending portion 112 in a suitable position.
When the radially extending portion 112 is required to be displaced along the radial direction of the receiving groove 1111, the corresponding positioning bolt 113 may be loosened, the radially extending portion 112 may be displaced along the radial direction of the first annular groove 1114 and along the radial direction of the receiving groove 1111, and after being displaced to a proper position, the corresponding positioning bolt 113 may be tightened again to fix the radially extending portion 112 in a proper position.
Further, referring to fig. 1 and 3 again, the aspheric surface measuring tool 10 further includes a mounting member 140 coaxial with the annular main body 111 and detachably connected to the annular main body 111, when the aspheric surface measuring tool 10 is used, the annular main body 111 is first connected to the annular main body 111 along the annular main body 111, then the workpiece 130 to be measured is fixed in the accommodating groove 1111, the top surface of the workpiece 130 to be measured is upward, one side of the mounting member 140 far away from the annular main body 111 is fixed in a measuring area of the eccentric instrument, after the eccentric amount of the top surface of the workpiece 130 to be measured is measured by the eccentric instrument, the annular main body 111 is detached from the mounting member 140 (the workpiece 130 to be measured is still fixed on the annular main body 111), so that the annular main body 111 is turned 180 degrees, and the bottom surface of the workpiece 130 to be measured is upward, thus the measurement of the eccentric amount of the bottom surface of the workpiece 130 to be measured can be performed, and the measurement accuracy of the eccentric amount of the top surface and the bottom surface of the workpiece 130 to be measured can be avoided under the condition that the workpiece 130 to be measured is not detached, and the measurement accuracy of the eccentric amount due to the assembly error is prevented.
Further, referring to fig. 1 and 3 again, the annular main body 111 is provided with a first mounting hole 1113 axially along the annular main body 111, and the mounting member 140 is provided with a second mounting hole, and the annular main body 111 and the mounting member 140 are coaxially connected with each other by means of the first mounting hole 1113, so that the annular main body 111 and the mounting member 140 can be detachably connected.
Specifically, the first mounting hole 1113 and the second mounting hole are threaded holes, and the annular main body 111 and the mounting member 140 can be connected by means of bolts matched with the threaded holes, so that the annular main body 111 can be conveniently detached from the mounting member 140.
The aspheric surface measuring device provided in an embodiment of the present application includes the aspheric surface measuring device 10, when the aspheric surface measuring device 10 is used, the device main body 110 can be fixed in a measuring area of an eccentric instrument, the workpiece 130 to be measured is placed in the accommodating groove 1111, at least two radial extending portions 112 are circumferentially spaced around the accommodating groove 1111, and one end of the micrometer head of the micrometer tube is rotated to make the micrometer head of the micrometer tube displace along the radial direction of the annular main body 111, that is, the micrometer head of the micrometer tube can displace radially along the device main body 110 and extend into the accommodating groove 1111 or displace outwardly relative to the accommodating groove 1111, so that the micrometer head of the micrometer tube is abutted against the workpiece 130 to be measured, and at least one radial extending portion 112 can be abutted against the workpiece 130 to be measured, so that the workpiece 130 to be measured is well fixed in the accommodating groove 1111, and the eccentric instrument can be used for measuring the eccentric amount.
In some embodiments, referring to fig. 1 and 3 again, the number of the radial extending portions 112 is three, the micrometer cylinder radially penetrates one of the radial extending portions 112 along the annular main portion 111, and the micrometer head of the micrometer cylinder can radially displace along the jig main portion 110 to extend into the accommodating groove 1111 or displace outwards relative to the accommodating groove 1111, so that the micrometer head of the micrometer cylinder abuts against the workpiece 130 to be measured, and the other two radial extending portions 112 also abut against the workpiece 130 to be measured, so that the workpiece 130 to be measured is well limited and fixed in the accommodating groove 1111.
Optionally, the radial extension 112 has a vacuum adsorption hole for adsorbing the workpiece 130 to be measured, the vacuum adsorption hole is disposed on the contact surface 1121 of the radial extension 112, and the vacuum adsorption hole is externally connected with a vacuum pumping device, when the workpiece 130 to be measured is fixed by using the aspheric surface measuring fixture 10, when the contact surface 1121 of a certain radial extension 112 contacts the workpiece 130 to be measured, the vacuum pumping device can perform vacuum pumping operation, so that the workpiece 130 to be measured is adsorbed on the contact surface 1121, and the fixing effect of the workpiece 130 to be measured is improved, so that the eccentric value can be measured better by using the eccentric meter.
Further, the aspheric surface measuring device further comprises a rotating mechanism, the rotating mechanism is in transmission connection with the jig main body 110, the rotating mechanism is used for driving the jig main body 110 to rotate around the central line of the jig main body 110, the rotating mechanism can be used for driving the jig main body 110 to rotate around the central line of the jig main body 110, and in the rotating process, the eccentric meter is used for measuring the eccentric amount.
In some embodiments, the aspheric surface measuring tool 10 of the present application is used to fix the workpiece 130 to be measured, and the eccentric amount and the inclination are measured twice by means of an eccentric meter, and one eccentric amount and one inclination data can be obtained for each measurement. Then, the workpiece 130 to be measured is detached from the aspheric surface measuring jig 10, the aspheric surface measuring jig 10 is utilized again to fix the workpiece 130 to be measured, and the eccentric value and the inclination are measured by means of an eccentric instrument for two times; this was repeated 3 times.
Similarly, in the comparative example, the workpiece 130 to be measured is fitted into the fitting groove of the existing jig, and the measurement of the eccentricity and the inclination is performed by means of the eccentric meter twice, and one data of the eccentricity and the inclination can be obtained for each measurement. Then taking out the workpiece 130 to be measured from the existing jig, embedding the workpiece 130 to be measured into the embedded groove of the existing jig again, and measuring the eccentric amount and the inclination by means of an eccentric instrument for two times; this was repeated 3 times.
Table 1 lists data for measuring the eccentricity by means of an eccentric instrument using the aspherical surface measuring jig 10 of the present application and the existing jig of the comparative example.
In table 1, the nth loading refers to fixing the workpiece 130 to be measured by using the aspheric surface measuring tool 10 of the present application, or embedding the workpiece 130 to be measured into the embedding groove of the existing tool. In the nth feeding, the data of the eccentric amount of the two times can be obtained by measuring the eccentric amount twice. The total deviation of the eccentric amount is equal to the difference between the maximum value and the minimum value among all the data of the eccentric amount obtained using the same jig in table 1 above.
As is apparent from table 1, the total deviation of the eccentric amount obtained by the aspherical surface measuring jig 10 of the present application is smaller than the total deviation of the eccentric amount obtained by the conventional jig, and the total deviation of the eccentric amount is reduced from about 18 μm to about 6 μm, and it is apparent that the total deviation of the eccentric amount obtained by the aspherical surface measuring jig 10 of the present application is significantly reduced, and thus, the accuracy of the eccentric amount obtained by the aspherical surface measuring jig 10 of the present application is significantly improved.
Table 2 lists data for measurement of inclination by means of an eccentric using the aspherical surface measuring jig 10 of the present application and the existing jig of the comparative example.
In table 2, the nth feeding means that the aspherical surface measuring jig 10 of the present application is used to fix the workpiece 130 to be measured for the nth time, or the workpiece 130 to be measured is embedded in the embedding groove of the existing jig for the nth time. In the nth feeding, the data of the inclination of the two times can be obtained by measuring the material twice. The total deviation of the inclination is equal to the difference between the maximum value and the minimum value among all the data of the inclination obtained with the same jig in table 2 above.
As can be seen from table 2, the total deviation of the inclination obtained by the aspheric surface measuring jig 10 of the present application is smaller than the total deviation of the inclination obtained by the conventional jig, and the total deviation of the inclination is reduced from 0.0172 ° to 0.0092 °. It is apparent that the total deviation of the inclination obtained by using the aspherical surface measuring jig 10 of the present application is significantly reduced, and then the accuracy of the inclination obtained by using the aspherical surface measuring jig 10 of the present application is significantly improved.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the invention. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.
Claims (12)
1. An aspherical surface measurement jig, comprising:
the jig main body is provided with an accommodating groove capable of accommodating a workpiece to be measured; and
the limiting component is arranged on the jig main body, and one end of the limiting component can move along the radial direction of the accommodating groove to extend into the accommodating groove or move outwards relative to the accommodating groove;
the jig main body comprises an annular main body part and at least two radial extension parts which extend inwards along the radial direction of the annular main body part;
at least two of the radially extending portions are circumferentially spaced around the annular body portion;
at least one of the radial extending parts is provided with a through hole for the limiting part to radially penetrate along the annular main body part;
the limiting component is arranged in the through hole;
the through hole is communicated with the accommodating groove.
2. The tool according to claim 1, wherein the radially extending portion has an abutment surface disposed opposite to an outer peripheral surface of the annular body portion.
3. The tool of claim 2, wherein the abutment surface is arc-shaped.
4. The tool of claim 3, wherein the radius of the contact surface is 5-6mm.
5. The tool according to claim 2, wherein a buffer is disposed on the abutment surface, and the buffer is disposed between the abutment surface and the workpiece to be measured.
6. The tool according to claim 2, wherein the abutment surface comprises two sub abutment surfaces connected at an angle, and the two sub abutment surfaces of the abutment surface can respectively abut against the outer periphery of the workpiece to be measured.
7. The tool of claim 6, wherein the limiting member comprises a micrometer;
the centerline of the micrometer head of the micrometer cylinder is parallel to the radial direction of the annular body portion.
8. The tool of claim 2, wherein the radial extension is capable of being displaced radially of the receiving groove to extend into or displace outwardly relative to the receiving groove.
9. The tool according to claim 2 or 8, wherein the radial extension is displaceable along the circumference of the receiving groove.
10. The tool of claim 2, further comprising a mounting member coaxial with the annular body and removably coupled to the annular body.
11. The aspherical surface measurement jig of claim 10 wherein the annular body portion is provided with a first mounting hole axially disposed along the annular body portion;
the mounting piece is provided with a second mounting hole;
the annular main body part and the mounting piece are coaxially connected with the second mounting hole by means of the first mounting hole.
12. An aspherical surface measuring device, comprising the aspherical surface measuring jig according to any one of claims 1 to 11.
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| CN2021112843889 | 2021-11-01 | ||
| CN202111284388 | 2021-11-01 |
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| CN114061529A (en) | 2022-02-18 |
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Effective date of registration: 20240108 Address after: 518109, Building E4, 101, Foxconn Industrial Park, No. 2 East Ring 2nd Road, Fukang Community, Longhua Street, Longhua District, Shenzhen City, Guangdong Province (formerly Building 1, 1st Floor, G2 District), H3, H1, and H7 factories in K2 District, North Shenchao Optoelectronic Technology Park, Minqing Road, Guangdong Province Patentee after: INTERFACE OPTOELECTRONICS (SHENZHEN) Co.,Ltd. Patentee after: Interface Technology (Chengdu) Co., Ltd. Patentee after: GENERAL INTERFACE SOLUTION Ltd. Address before: No.689 Hezuo Road, West District, high tech Zone, Chengdu City, Sichuan Province Patentee before: Interface Technology (Chengdu) Co., Ltd. Patentee before: INTERFACE OPTOELECTRONICS (SHENZHEN) Co.,Ltd. Patentee before: Yicheng Photoelectric (Wuxi) Co.,Ltd. Patentee before: GENERAL INTERFACE SOLUTION Ltd. |