CN114038731A - Ion screening method and system of mass spectrometer - Google Patents
Ion screening method and system of mass spectrometer Download PDFInfo
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- CN114038731A CN114038731A CN202111370623.4A CN202111370623A CN114038731A CN 114038731 A CN114038731 A CN 114038731A CN 202111370623 A CN202111370623 A CN 202111370623A CN 114038731 A CN114038731 A CN 114038731A
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- H01J49/025—Detectors specially adapted to particle spectrometers
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- H—ELECTRICITY
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- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
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Abstract
The invention discloses an ion screening method of a mass spectrometer, wherein the mass spectrometer is provided with a deflection conductor; the screening method comprises the following steps: switching on a first voltage signal to the deflection conductor to enable the deflection conductor to generate a deflection electric field for deflecting the flight direction of ions; detecting a laser synchronous pulse signal, and keeping a deflection conductor connected with a first voltage signal unchanged after the laser synchronous pulse signal is output so as to deflect the flight direction of the non-target ions; when the target ions fly out of the accelerating electric field, a second voltage signal is connected to the deflection conductor, and a deflection electric field for deflecting the target ions is not generated, so that the target ions can fly to reach the detector; when the target ions all pass through the deflection conductor, a first voltage signal is switched on the deflection conductor. Promote the life of detector to a certain extent in this application, avoid non-target ion to the interference of target ion detection result. The application also provides an ion screening system of the mass spectrometer, which has the beneficial effects.
Description
Technical Field
The invention relates to the technical field of ion detection, in particular to an ion screening method and system of a mass spectrometer.
Background
As shown in fig. 1, fig. 1 is a schematic structural diagram of a conventional mass spectrometer; the laser pulse source emits exciting laser to the sample, so that the ion source sample generates ions, the ions are accelerated by the accelerating field, enter the field-free drift tube and fly to the ion detector at a constant speed. In practice, not all ions excited and generated in the ion source sample are target ions to be detected, but only target ions with molecular weights within a specific range are targets to be detected by focused detection analysis. However, in the conventional mass spectrometer, all ions generated by the excited ion source sample fly toward the ion detector and are finally received by the ion detector. While there is a limit to the number of ions that the ion detector can receive and detect, as the time of use accumulates, once the number of ions detected by the ion detector reaches an upper limit, the ion detector will not be usable. As can be seen, there are a large number of unwanted non-target ions in the ions received and detected by the ion detector, and the lifetime of the ion detector is somewhat lost. Therefore, if the non-target ions generated by the ion source sample can be prevented from being received by the ion detector, the service life of the ion detector can be greatly prolonged.
Disclosure of Invention
The invention aims to provide an ion screening method and system of a mass spectrometer, which can reduce the number of non-target ions reaching a detector to a certain extent, thereby prolonging the service life of the detector in the mass spectrometer.
In order to solve the technical problem, the invention provides an ion screening method of a mass spectrometer, wherein a deflection conductor is arranged on the side surface of an ion flight path between an accelerating electric field of the mass spectrometer and a detector; the screening method comprises the following steps:
switching on a first voltage signal to the deflection conductor to enable the deflection conductor to generate a deflection electric field, and when the ions fly through the deflection electric field, the flight direction is deflected and does not reach the detector;
detecting a laser synchronous pulse signal, and keeping the deflection conductor connected with the first voltage signal unchanged after the laser synchronous pulse signal is output so as to deflect the flight direction of the non-target ions flying out of the accelerating electric field;
when the target ions fly out of the accelerating electric field, a second voltage signal is connected to the deflecting conductor, and a deflecting electric field for deflecting the target ions is not generated, so that the target ions can fly to reach the detector;
and when the target ions all pass through the deflection conductor, switching on the first voltage signal to the deflection conductor.
In an optional embodiment of the present application, the deflection conductor is at least one set of deflection conductor plates disposed at a side of the ion flight path; each group of the deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded;
switching on a first voltage signal to the deflection conductor, comprising:
accessing a high-voltage electric signal larger than a grounding voltage to the second conductor plate;
or, a negative high-voltage electric signal lower than the grounding voltage is accessed to the second conductor plate;
switching on a second voltage signal to the deflection conductor, comprising:
a voltage signal having the same magnitude as a ground voltage is applied to the second conductive plate.
In an optional embodiment of the present application, the deflection conductor is a focusing electrode in the mass spectrometer or a metal cylindrical housing of the mass spectrometer without a field region;
switching on a first voltage signal to the deflection conductor, comprising:
connecting a high-voltage electric signal with the electric property opposite to that of the ions to the deflection conductor;
switching on a second voltage signal to the deflection conductor, comprising:
and connecting a high-voltage electric signal with the same electric property as the ions to the deflection conductor.
In an optional embodiment of the present application, the method further comprises alternately applying the first voltage signal and the second voltage signal to the deflection conductor a plurality of times; and the duration of each time of the first voltage signal and the second voltage signal is determined according to the molecular weight of the non-target ions needing to be deflected and the target ions not needing to be deflected.
The application also provides an ion screening system of a mass spectrometer, including:
the input end of the controller is connected with a laser pulse source for outputting a laser pulse signal;
the output end of the ion selection circuit is connected with a deflection conductor arranged in the mass spectrometer, and the input end of the ion selection circuit is connected with the controller;
the controller is configured to control the ion selection circuitry to output first and second voltage signals to the deflection conductor to perform steps of a method of ion screening for implementing a mass spectrometer as described in any preceding claim.
In an optional embodiment of the present application, the deflection conductor is at least one set of deflection conductor plates disposed at a side of the ion flight path; each group of the deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded;
the second conductor plate is connected with a signal output end of the ion selection circuit, and the ion selection circuit comprises a high-voltage power supply, a pulse circuit and an RC series circuit;
the pulse circuit comprises a voltage division element and a transistor switch which are connected in series; one end of the pulse circuit is connected with the output end of the high-voltage power supply, and the other end of the pulse circuit is grounded; the node of the voltage division element connected with the transistor switch is a signal output end of the ion selection circuit; the first end of the RC series circuit is connected with the signal output end of the ion selection circuit, and the second end of the RC series circuit is grounded;
the controller is connected with the control end of the transistor switch and used for controlling the on and off of the transistor switch.
In an optional embodiment of the present application, a first terminal of the voltage dividing element is connected to a high voltage power supply, and a second terminal is connected to a first terminal of the transistor switch; a second terminal of the transistor switch is grounded;
when the controller outputs a low level signal, the first end and the second end of the transistor switch are disconnected;
when the controller outputs a high level signal, the first terminal and the second terminal of the transistor switch are conducted.
In an alternative embodiment of the present application, a first terminal of the transistor switch is connected to the high voltage power supply, and a second terminal is connected to a first terminal of the voltage dividing element; the second end of the voltage division element is grounded;
when the controller outputs a low level signal, the first end and the second end of the transistor switch are disconnected;
when the controller outputs a high level signal, the first terminal and the second terminal of the transistor switch are conducted.
In an optional embodiment of the present application, the ion selection circuit further comprises an RC parallel circuit; and the control end of the transistor switch is connected with the controller through the RC parallel circuit.
In an optional embodiment of the present application, the controller and the transistor switch are connected by an isolation circuit.
The invention provides an ion screening method of a mass spectrometer.A deflection conductor is arranged on the side surface of an ion flight path between an accelerating electric field of the mass spectrometer and a detector; the screening method comprises the following steps: switching on a first voltage signal to the deflection conductor to enable the deflection conductor to generate a deflection electric field, and when ions fly through the deflection electric field, the flying direction deflects and does not reach a detector; detecting a laser synchronous pulse signal, and keeping a deflection conductor connected with a first voltage signal unchanged after the laser synchronous pulse signal is output so as to deflect the flight direction of the non-target ions flying out of the accelerating electric field; when the target ions fly out of the accelerating electric field, a second voltage signal is connected to the deflection conductor, and a deflection electric field for deflecting the target ions is not generated, so that the target ions can fly to reach the detector; when the target ions all pass through the deflection conductor, a first voltage signal is switched on the deflection conductor.
According to the principle that ions with different molecular weights sequentially pass through a field-free drift tube of a mass spectrometer to fly to a detector according to different sequences, a first voltage signal is firstly communicated with a deflection conductor in the mass spectrometer before a laser pulse source is started, so that a deflection electric field generated by the deflection conductor can immediately deflect the flight direction of non-target ions after the laser pulse source is started; and the second voltage signal is connected to the deflection conductor when the target ions start to fly, so that the deflection conductor does not generate an electric field for deflecting the ions, and the first voltage signal is connected to the deflection conductor again after the target ions completely fly through, thereby further ensuring that the ions with the molecular weight larger than that of the target ions and the ions with the molecular weight smaller than that of the target ions can be deflected by the electric field generated by the deflection conductor and cannot reach the detector, further prolonging the service life of the detector to a certain extent, and simultaneously, the detector only displays the detection result of the target ions and avoids the interference of the non-target ions on the detection result of the target ions to a certain extent.
The application also provides an ion screening system of the mass spectrometer, which has the beneficial effects.
Drawings
In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a conventional mass spectrometer;
fig. 2 is a schematic flow chart of an ion screening method of a mass spectrometer provided in an embodiment of the present application;
FIG. 3 is a schematic structural diagram of a mass spectrometer provided by an embodiment of the present application;
FIG. 4 is a mass spectrum plot of a detector corresponding to non-screened target and non-target ions;
FIG. 5 is a mass spectrum plot of a detector corresponding to a region of target ion screening;
FIG. 6 is a mass spectrum of a target ion selected from a plurality of intervals and measured by a detector
Fig. 7 is a schematic structural diagram of an ion selection circuit according to an embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of another ion selection circuit according to an embodiment of the present disclosure.
Detailed Description
Referring to fig. 1, in the mass spectrometer, ions of an ion source sample 01 excited by laser output by a laser pulse source 2 include ions with different molecular weights, and the acceleration speeds of the ions with different molecular weights in an acceleration electric field are different, and the acceleration speed of the ions with smaller molecular weights in an acceleration electric field U is larger; conversely, ions with higher molecular weights have smaller speeds after acceleration, and accordingly, ions with lower molecular weights leave the acceleration electric field U first and enter the field-free region and fly to the detector 1, while ions with higher molecular weights leave the acceleration electric field U later and fly to the detector 1 through the field-free region.
When ions are actually detected, only target ions in a specific molecular weight region need to be detected, ions in other molecular weight regions belong to non-target ions, and when the non-target ions reach the detector 1 and are detected by the detector 1, the service life of the detector 1 is influenced, and the definition of the target ion detection result is also influenced.
Therefore, in the application, the target ions and the non-target ions are screened in consideration of the fact that the target ions and the non-target ions have different time passing through a field-free area due to the fact that the target ions and the non-target ions have different mass, when the non-target ions pass through the field-free area, the non-target ions are prevented from flying to the detector, and finally the non-target ions cannot reach the detector 1, only the target ions can reach the detector 1 to be detected, so that the service life of the detector is prolonged, and the display definition of detection results is improved.
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 2 and fig. 3, fig. 2 is a schematic flow chart of an ion screening method of a mass spectrometer provided in an embodiment of the present application, and fig. 3 is a schematic structural diagram of the mass spectrometer provided in the embodiment of the present application. In the ion screening method of the mass spectrometer, in a field-free region between an accelerating electric field of the mass spectrometer and a detector, a deflection conductor is further arranged on the side of an ion flight path. Taking the mass spectrometer shown in fig. 3 as an example, the deflection conductor may be a plate conductor arranged in a field-free region. On this basis, the ion screening method of the mass spectrometer in the application can comprise the following steps:
s11: and switching on a first voltage signal to the deflection conductor so that the deflection conductor generates a deflection electric field, and when the ions fly through the deflection electric field, the flight direction is deflected and does not reach the detector.
For ions flying in the field-free region, the flight direction is along a straight line, i.e. along the direction in which the exit of the accelerating electric field U is directed to the detector 1 in fig. 3. In the field-free region, because no external force acts, the ions can keep the flight with the unchanged speed direction. And after the deflection conductor switches on the first voltage signal, the deflection conductor can produce an electric field around it, obviously, when the ion flies through the space region where this electric field locates, the flight direction receives the electric field influence and must produce the deflection, and then makes this ion can't fly and reach detector 1.
S12: and detecting a laser synchronous pulse signal, and keeping the deflection conductor connected with the first voltage signal unchanged after the laser synchronous pulse signal is output so as to deflect the flight direction of the non-target ions flying out of the accelerating electric field.
The laser synchronization pulse signal is a signal for starting the laser pulse source 2 to emit laser to the ion source sample 01. In general, the first voltage signal is only required to be synchronously applied to the deflection conductor when the laser synchronization pulse signal starts to be output. However, in the present embodiment, it is considered that, after the output of the laser synchronization pulse signal is detected, it is difficult to synchronously control the deflection conductor to switch on the first voltage signal immediately, so that there is a certain delay for the moment when the deflection conductor switches on the first voltage signal, more or less, relative to the laser synchronization pulse signal, and during this delay phase, there may be a time when the non-target ions have been excited and fly to reach the detector, for this reason, in the present embodiment, in order to improve the accuracy of screening the non-target ions, the first voltage signal is switched on to the deflection conductor before the laser pulse signal triggers the laser pulse source 2, and then the non-target ions are necessarily deflected by the deflection conductor and cannot reach the detector 1 as soon as the laser pulse signal subsequently generates the non-target ions.
In addition, in order to satisfy the electric field intensity generated by the deflecting conductor to ensure that a sufficiently large deflecting electric field force can be generated for the non-target ions, the magnitude of the first voltage signal should also satisfy a certain voltage magnitude, and a high-voltage electric signal with a relatively large voltage magnitude should be adopted as much as possible.
S13: when the target ions fly out of the accelerating electric field, a second voltage signal is applied to the deflecting conductor, and a deflecting electric field for deflecting the target ions is not generated, so that the target ions fly to reach the detector.
It should be noted that, specifically, what kind of electric signal the second voltage signal is, and what kind of deflection conductor is, have a large correlation.
In an alternative embodiment of the present application, the deflection conductor may be at least one set of deflection conductor plates disposed at the side of the ion flight path; each group of deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded;
switching on a first voltage signal to a deflection conductor, comprising:
accessing a high-voltage pulse signal larger than the grounding voltage to the second conductor plate;
or, a negative high-voltage pulse signal lower than the grounding voltage is accessed to the second conductor plate;
switching on a second voltage signal to the deflection conductor, comprising:
a voltage signal having the same magnitude as a ground voltage is applied to the second conductive plate.
As shown in fig. 3, when the deflection conductor is a pair of conductor plates, the first conductor plate 31 is grounded, and when the second conductor plate 32 receives a high-voltage pulse signal, a deflection electric field is formed between the first conductor plate 31 and the second conductor plate 32, so that charged non-target ions flying between the first conductor plate 31 and the second conductor plate 32 can be deflected by the deflection electric field.
On the basis of this, when the target ions start to enter the region between the first conductive plate 31 and the second conductive plate 32, it is obvious that an electric field for deflecting the ions can no longer be generated, and the ground voltage signal can be applied to the second conductive plate 32. Then there is no electric field between the first 31 and second 32 conductive plates. When the target ions fly through, they are not deflected and thus reach the detector 1 smoothly.
However, in practical applications, it can be understood that the deflection conductors disposed on both sides of the ion flight path are not necessarily paired conductor plates, and even when only one conductor is disposed, when the voltage applied to the conductor is set to be a high-voltage pulse electrical signal, an electric field can be formed around the conductor, so as to deflect the non-target ions; when the target ions fly, the voltage of the conductor is switched to the ground voltage, so that the electric field around the conductor disappears, and the non-target ions are allowed to pass through.
In another alternative embodiment of the present application, the deflection conductor may be a focusing electrode 4 in the mass spectrometer or a field-free metallic cylindrical housing 5 of the mass spectrometer;
switching on a first voltage signal to a deflection conductor, comprising:
switching on a high-voltage pulse signal opposite to the electric property of the ions to the deflection conductor;
switching on a second voltage signal to the deflection conductor, comprising:
a high voltage pulse signal having the same electrical property as that of the ions is applied to the deflection conductor.
Take the deflecting conductor as the focusing electrode 4 as an example. The focusing electrode 4 is a metal cylinder disposed at the exit of the accelerating electric field U in the mass spectrometer. In a conventional mass spectrometer, the flight direction of ions generated by excitation of the ion source sample 01 after acceleration from the accelerating electric field U cannot be guaranteed to be all directed to the detector 1, but may be at a certain deflection angle, for which reason, a focusing electrode 4 needs to be provided in the mass spectrometer. When the ions generated by the ion source sample 01 excited by the laser are all ions with positive charges, the positive voltage is kept connected to the focusing electrode 4, so that an electric field with electric field lines pointing to the central axis of the metal cylinder is generated in the metal cylinder of the focusing electrode 4; then, if the ions fly in a direction deviating from the central axis of the focusing electrode 4, the ion flight trajectory can be close to the central axis of the focusing electrode 4 under the driving action of the electric field, so that the final flight trajectory of the ions almost coincides with the straight line where the central axis of the focusing electrode 4 is located. Similarly, when the excited ions are negatively charged ions, a negative voltage needs to be applied to the focusing electrode 4, so that the direction of the electric field lines in the cylinder of the focusing electrode 4 is directed from the central axis of the focusing electrode 4 to the inner sidewall of the focusing electrode 4.
It should be noted that, for the same target source sample, the target ions and the non-target ions flying out from the accelerating electric field U after being excited by the laser are both ions with the same charge.
Therefore, in the application, when the target ions and the non-target ions pass through the focusing electrode 4, different voltage signals are respectively switched on the focusing electrode 4, so as to realize the screening of the target ions and the non-target ions.
Taking the example that both the target ions and the non-target ions are positively charged, when the non-target ions pass through the focusing electrode 4, the first voltage signal which is connected to the focusing electrode is a negative voltage electrical signal with a voltage less than 0V, and the focusing electrode 4 generates an adsorption effect on the ions, so that the flight trajectory of the non-target ions deviates toward the central axis of the focusing electrode 4 and deflects toward the side wall of the focusing electrode 4 to fly, and further cannot reach the detector 1.
When the target ions fly through the tube of the focusing electrode 4, the second voltage signal which is connected to the focusing electrode 4 can be a positive voltage electrical signal with a voltage greater than 0V, and at the moment, the action force of the focusing electrode 4 on the ions is a repulsive force, so that the flying track of the target ions is close to the central axis of the focusing electrode 4, and the target ions can reach the detector 1 more smoothly.
Similarly, when the target ions and the non-target ions are both negatively charged, the first voltage signal is a positive voltage electrical signal greater than 0V, and the second voltage signal is a negative voltage electrical signal less than 0V.
When the metal cylindrical shell 5 without a field region of the mass spectrometer is used as a deflection conductor, the working mode and principle of the metal cylindrical shell are the same as those of the focusing electrode 4, the first voltage signal is also the voltage signal opposite to the electrical property of the ions, and the second voltage signal is the voltage signal opposite to the electrical property of the ions, so that repeated description is omitted in the application.
S14: when the target ions all pass through the deflection conductor, a first voltage signal is switched on the deflection conductor.
Generally, non-target ions having a molecular weight larger than that of the target ions are present in the ions generated after the ion source sample 01 is excited, and non-target ions having a molecular weight smaller than that of the target ions are also present. Obviously, the non-target ions with molecular weight larger than that of the target ions have a slower flying speed than that of the target ions, so that after the target ions have flown to the detector 1, there may be some non-target ions with molecular weight larger than that of the target ions flying to the detector 1, in order to prevent the non-target ions from reaching the detector 1 to the maximum extent, after the target ions fly through the field-free region, the first voltage signal is further applied to the deflection conductor to deflect the non-target ions with molecular weight larger than that of the target ions, and finally, only the target ions can smoothly reach the detector 1.
Furthermore, for target ions to be detected, they may be distributed in a plurality of molecular weight ion intervals which are not intermittently connected to each other, for example, for (0, a1], (a1, a2], (a2, a3], (a3, a4], (a4, a 5) a plurality of molecular weight ion intervals in which ions in three molecular weight ion intervals of (a1, a2] and (a3, a 4) are target ions, (0, a1], (a2, a3], (a4, a 5) are non-target ions, in the ion screening process, a first voltage signal and a second voltage signal may be alternately applied to the deflection conductor a plurality of times, wherein each application of the first voltage signal and the second voltage signal continues for a period of time according to the molecular weight determination of the non-target ions to be deflected as required and the target ions which do not need to be deflected are (0, a 1), When non-target ions in three molecular weight ion intervals (a2, a 3), (a4, a 5) fly through the field-free region, a first voltage signal is applied to the deflection conductor, and when target ions in two multi-molecular weight ion intervals (a1, a 2) and (a3, a 4) are present, a second voltage signal is applied to the deflection conductor.
Referring to fig. 4 to 6, fig. 4 is a mass spectrum measured by a detector corresponding to the non-screened target ions and non-target ions; FIG. 5 is a mass spectrum plot of a detector corresponding to a region of target ion screening; fig. 6 is a mass spectrum diagram measured by a detector corresponding to the screening of target ions in a plurality of intervals. It can be known from fig. 4 and fig. 5 that the matrix molecular diagram peaks with small molecular weight in the mass spectrum of fig. 4 contain a large number of matrix peaks with small molecular weight, which not only reduces the service life of the detector, but also reduces the signal-to-noise ratio of the matrix small molecular ions because the peaks belong to noise peaks, thus making the operation of the instrument more complicated. In FIG. 5, a target ion of a predetermined molecular weight range is selected to reach the detector, and non-target ions of the remaining interval range are deflected so as not to reach the detector; fig. 6 shows an ion mass spectrum obtained by selecting two target ions in a preset molecular weight range to reach a detector, so that only target ions in the target molecular weight range reach the detector through selection, useless non-target ions are screened out, the loss of the detector is greatly reduced, the service life of the detector is prolonged, noise signals of the spectrum are reduced, the signal-to-noise ratio is greatly improved, and the ion spectrum in the target molecular weight range is only required to be processed and analyzed subsequently, so that the operation of an instrument is relatively simple and efficient.
In summary, in the application, the deflection conductor is arranged in the field-free region where ions fly in the mass spectrometer, and before the laser pulse source is started, the deflection conductor is connected to generate a deflection electric field, so that the non-target ions which firstly enter the field-free region can be completely deflected and are not received by the detector; and when the target ions enter a field-free region, the voltage signals switched on by the deflection conductors are switched, so that the deflection conductors do not deflect the target ions, and after the target ions reach the detector in a flying manner, the voltage signals switched on by the deflection conductors are switched again, so that the deflection conductors can deflect non-target ions with molecular weights larger than that of the target ions, thereby realizing the deflection of the non-target ions to the maximum extent, reducing the non-target ions of the detector as much as possible, further slowing down the attenuation of the detector to a certain extent, and further prolonging the service life of the detector.
Also disclosed in this application are embodiments of an ion screening system for a mass spectrometer, which may include:
the input end of the controller is connected with a laser pulse source for outputting a laser pulse signal;
the output end of the ion selection circuit is connected with a deflection conductor arranged in the mass spectrometer, and the input end of the ion selection circuit is connected with the controller;
the controller is for controlling the ion selection circuit to output the first voltage signal and the second voltage signal to the deflection conductor to perform steps of a method of ion screening for implementing a mass spectrometer as claimed in any one of the above.
In the ion screening method based on the mass spectrometer, the deflection conductor is used for screening target ions and non-target ions, and the switched-on voltage signal is switched back and forth between two different constant voltage signals, so that the switched-on voltage of the deflection conductor can be regarded as a square wave pulse signal. Therefore, in practical application, the ion selection circuit can adopt a circuit structure capable of outputting a square wave pulse signal. However, based on the requirement of the electric field generated by the deflection conductor for the deflection capability of the non-target ions, generally speaking, the voltage difference between the high level signal and the low level signal of the square wave pulse signal should reach a certain difference value to ensure the complete deflection of the non-target ions, that is, the pulse voltage signal output by the ion selection circuit is required to be a high voltage pulse signal.
It can be understood that, for a square wave pulse signal, when switching between a high level and a low level, theoretically, a rising edge and a falling edge of a voltage signal are switched instantaneously, but in practical applications, a certain buffer time exists in both the rising edge and the falling edge, especially for a high voltage pulse signal with a large voltage difference between the high level and the low level, and during the switching between the high level and the low level, it is difficult for the voltage signal to rapidly rise and rapidly fall. However, for target ions and non-target ions, the time difference between the target ions and the non-target ions after flying through the mass spectrometer is very short, and is basically in the order of several nanoseconds, so that the ion selection circuit is required to realize the rapid rising and rapid falling of high and low level signals when switching two different voltage signals output, so as to more accurately realize the screening between the non-target ions and the target ions.
At least one group of deflecting conductor plates arranged on the side of the ion flight path by using the deflecting conductor; each group of deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded; a second conductive plate and an ion selection circuit are examples. Referring to fig. 7 and 8, fig. 7 is a schematic structural diagram of an ion selection circuit provided in an embodiment of the present application, and fig. 8 is a schematic structural diagram of another ion selection circuit provided in an embodiment of the present application.
In an optional embodiment of the present application, the ion selection circuit may comprise:
a high voltage power supply HV, a pulse circuit, and an RC series circuit; as shown in fig. 7 and 8, the RC series circuit includes a high voltage resistant capacitor C2 and a high voltage resistant resistor R3 connected in series, and the high voltage resistant resistor R3 has a high power and a smaller resistance than the voltage dividing element R2.
The pulse circuit comprises a voltage division element R2 and a transistor switch Q which are connected in series with each other;
one end of the pulse circuit is connected with the output end of the high-voltage power supply HV, and the other end of the pulse circuit is grounded;
the node where the voltage division element R2 and the transistor switch Q are connected is a signal output end OUT of the ion selection circuit;
one end of the RC series circuit is connected with the signal output end OUT of the ion selection circuit, and the other end of the RC series circuit is grounded;
the controller is connected with the control end of the transistor switch Q and used for controlling the on and off of the transistor switch.
Optionally, an RC parallel circuit may be further disposed between the controller and the control terminal of the transistor switch Q; the RC parallel circuit may be a circuit structure formed by connecting a resistance element R1 and a capacitance element C1 in parallel.
In the embodiment, the output of a high-voltage pulse signal is realized mainly through a pulse circuit consisting of a voltage division element R2 and a transistor switch Q, one end of the pulse circuit is connected with the output end of a high-voltage power supply HV, and the other end of the pulse circuit is grounded; meanwhile, the control end of the transistor switch Q is connected with the output end of the controller through an RC parallel circuit, so that the controller can control the transistor switch Q to be switched on and off by outputting corresponding control signals; the turn-off and turn-on of the transistor switch Q determine whether the voltage at the node between the transistor switch Q and the voltage dividing element R2 is the ground voltage or the output voltage of the high voltage power supply HV, thereby switching the output voltage of the pulse circuit back and forth between the high voltage signal and the ground signal.
For the pulse circuit composed of the voltage dividing element R2 and the transistor switch Q, the voltage dividing element R2 may be a voltage dividing resistor or other voltage dividing element with a certain resistance value, and the transistor switch Q may be a transistor, a MOS transistor or other similar semiconductor switch, which is not limited in this application.
As mentioned above, the controller can control the transistor switch Q to be turned off and on, and based on the basic operation characteristics of the transistor switch Q, the control signal for controlling the transistor switch Q can also be a pulse signal switched between high and low levels.
In addition, the operating characteristics of the pulse circuit formed by the voltage dividing element R2 and the transistor switch Q can be approximately regarded as an RC series circuit, based on the charge-discharge process of the transistor switch Q similar to the capacitor, an equivalent RC series circuit is formed between the junction capacitor of the transistor switch Q and the voltage dividing element R2, and the junction capacitor of the transistor switch Q causes a certain delay in the switching process, thereby causing the buffering delay duration of the rising edge and the falling edge of the finally output pulse signal.
In order to reduce the delay time of the rising edge and the falling edge when the ion selection circuit switches to output the high level signal and the low level signal, the ion selection circuit in this embodiment may further connect the RC series circuit in parallel between the signal output terminal OUT and the ground terminal.
Because the RC series circuit composed of the high-voltage-resistant capacitor C2 and the high-voltage-resistant resistor R3 in the RC series circuit carries out charging and discharging and filtering when the high-voltage pulse changes, the high-voltage-resistant capacitor C2 circuit in the RC series circuit can charge the transistor switch Q when the transistor switch Q is turned on, and absorbs the charge of the transistor switch Q when the transistor switch Q is turned off, so that the buffering delay time of the rising edge and the falling edge of the output high-voltage pulse signal can be reduced to a certain extent, the high-voltage level can be switched quickly, the extremely fast falling and rising speed of the output high-voltage pulse signal can be realized, the nanosecond level can be reached, and the accuracy of switching high-level and low-level signals in the high-voltage pulse signal can be ensured. And the R circuit and the C circuit have certain filtering effect together, and remove higher harmonics, so that the high-voltage pulse waveform is more regular.
In addition, the controller is further used for shortening the time length consumed by the control signal of the switch to start the transistor switch Q to be switched on or switched off by utilizing the charge and discharge functions of the capacitor element C1 in the RC parallel circuit through the RC parallel circuit and the control end of the transistor switch Q.
Based on the high-voltage pulse signal output by the ion selection circuit, the time delay of the rising edge and the falling edge can be reduced to a few nanometers in the process of alternately switching the high-voltage signal and the low-voltage signal, so that the time delay of the rising edge and the falling edge is greatly shortened, and when the ion selection circuit is applied to various control systems, the control precision of the control system is improved.
There may be a variety of different circuit connection configurations for the pulse circuit.
Referring to fig. 7, in an alternative embodiment of the present application, the pulse circuit may include:
a first end of the voltage dividing element R2 is connected to the high voltage power source HV, and a second end is connected to a first end of the transistor switch Q; the second end of the transistor switch Q is grounded; the control end of the transistor switch Q is connected with the controller through an RC parallel circuit;
first and second end conductors of a transistor switch Q when the controller outputs a high level signal;
when the controller outputs a low level signal, the first terminal and the second terminal of the transistor switch Q are turned off.
Referring to fig. 7, a first terminal of the transistor switch Q is connected to an output terminal of the high voltage power supply HV through a voltage dividing element R2; and the second terminal of the transistor switch Q is grounded, and the RC series circuit is connected in parallel to both terminals of the transistor switch Q. Taking the transistor switch Q in fig. 7 as an NPN transistor as an example, when the controller outputs a low level signal to the base of the transistor switch Q through the RC parallel circuit, the collector and the emitter of the transistor switch Q are also disconnected from each other, and the collector of the transistor switch Q connected to the voltage dividing element R2 serves as an output terminal of the pulse circuit, and the output terminal of the pulse circuit also outputs a high voltage signal. When the controller outputs a high-level pulse signal to the base of the transistor switch Q, the collector and the emitter of the transistor switch Q are conducted, the collector of the transistor switch Q is connected with the high-voltage power supply HV through the voltage dividing element R2, the collector of the transistor switch Q serves as the output end of the pulse circuit, and a grounded 0V voltage signal is output, so that the voltage output by the ion selection circuit is rapidly switched between the high-voltage signal and the grounded 0V voltage signal.
Referring to fig. 8, in another alternative embodiment of the present application, the pulse circuit may include:
the first end of the transistor switch Q is connected with a high-voltage power supply HV, the second end of the transistor switch Q is connected with the first end of the voltage division element R2, and the control end of the transistor switch Q is connected with the second end of the RC parallel circuit; the second end of the voltage dividing element R2 is grounded;
when the controller outputs a low level signal, the first end and the second end of the transistor switch Q are disconnected;
when the controller outputs a high level signal, the first terminal and the second terminal of the transistor switch Q are turned on.
Referring to fig. 8, taking the example that the transistor switch Q is a PNP type triode, the end of the connection between the transistor switch Q and the voltage dividing element R2 is the emitter of the transistor switch Q, that is, the emitter voltage of the transistor switch Q is the voltage signal output by the pulse circuit. In this case, the RC series circuit is connected in parallel across the voltage dividing element R2. Similar to the principle in fig. 7, when the controller outputs a high-level pulse signal to the base of the transistor switch Q through the RC parallel circuit, the collector and the emitter of the transistor switch Q are disconnected from each other, at this time, the emitter of the transistor switch Q is connected to the ground terminal through the voltage dividing element R2, and the voltage signal output by the pulse circuit is a voltage signal of the ground terminal.
When the controller inputs a high-level signal to the base electrode of the transistor switch Q, the collector electrode and the emitter electrode of the transistor are conducted, and the emitter electrode of the transistor switch Q is directly conducted with the high-voltage power supply HV.
In the embodiments shown in fig. 7 and 8, the pulse circuit mainly outputs the high-voltage pulse signal by taking the high-voltage signal as a high-level signal and taking the ground voltage signal as a low-level signal as an example. However, in the practical application process, for the ion selection circuit, it is not excluded that the high-voltage pulse signal output by the ion selection circuit is a high-level signal with the ground voltage and a negative high-voltage signal (i.e. a voltage signal lower than the ground voltage and having a relatively large voltage) is a low-level signal; in this case, the high-voltage power supply in fig. 7 and 8 may be replaced with a ground voltage source, and the ground in fig. 7 and 8 may be replaced with a negative high-voltage source.
In addition, the high-voltage pulse signal output by the ion selection circuit may be required to have a high-voltage signal as a high-level signal and a negative high-voltage signal as a low-level signal. In this case, the ground terminal in fig. 7 and 8 may be replaced with a negative high voltage source. Obviously, the ion selection circuit corresponding to this embodiment can be applied to the embodiment in which the deflection conductors are the focusing electrode 4 and the metal cylindrical housing 5.
Taking fig. 8 as an example, when the controller outputs a high level signal to the control terminal of the transistor switch Q, the transistor switch Q is closed; when the controller outputs a low level signal to the control terminal of the transistor switch Q, the transistor switch Q is turned off. The high voltage power supply HV is a power supply of several tens of volts to one thousand volts. The voltage divider R2 may be a high withstand voltage and high power resistor, and may reach the first end of the voltage divider R2 through the transistor switch Q. And the node of the voltage dividing element R2 connected with the transistor switch Q is connected with the first end of the high-voltage-resistant capacitor C2, the second end of the high-voltage-resistant capacitor C2 is connected with the first end of the high-voltage-resistant resistor R3, the high-voltage-resistant resistor R3 is equivalent to a filter, a high-voltage-resistant and high-power resistor can be adopted, the resistance value of the high-voltage-resistant and high-power resistor is much smaller than that of the voltage dividing element R2, and the second end of the high-voltage-resistant resistor R3 is grounded. Meanwhile, the second end of the voltage dividing element R2 is also grounded, and the end of the voltage dividing element R2, the transistor switch Q, and the high voltage resistant capacitor C2, which are connected together, is the signal output end of the ion selection circuit.
When the controller outputs a high-level signal to the control end of the transistor switch Q, the transistor switch Q is closed to form a path, a high-voltage power supply HV is directly grounded through the transistor switch Q and the voltage division element R2, and a node where the transistor switch Q, the voltage division element R2 and the high-voltage resistant capacitor C2 are connected together is a signal output end OUT of the ion selection circuit and outputs the high-level signal;
when the controller outputs a low level signal to the control end of the transistor switch Q, the transistor switch Q is disconnected to form an open circuit, and the signal output end of the ion selection circuit is grounded through the voltage division element R2 to output a low level signal. The RC series circuit consisting of the high-voltage-resistant capacitor C1 and the high-voltage-resistant resistor R3 is charged, discharged and filtered when the high-voltage pulse changes, so that the extremely fast descending and ascending speeds of the high-voltage pulse signal output can be realized, the nanosecond level can be reached, and the accuracy of switching high-level and low-level signals in the high-voltage pulse signal is ensured.
As mentioned above, the controller realizes the control of the disconnection and the conduction of the transistor switch by outputting the low-voltage pulse signal, so as to control the output of the high-voltage pulse signal of the ion selection circuit, therefore, the output control of the high-voltage pulse signal is realized by the low-voltage pulse signal output by the controller in the application, in order to ensure the circuit safety, an isolation circuit is further arranged between the controller and the control end of the transistor switch in the application, specifically, an isolation chip can be added between the controller and the RC parallel circuit, so as to avoid the negative interference of the high-voltage pulse signal to the controller.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include elements inherent in the list. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. In addition, parts of the above technical solutions provided in the embodiments of the present application, which are consistent with the implementation principles of corresponding technical solutions in the prior art, are not described in detail so as to avoid redundant description.
The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. An ion screening method of a mass spectrometer is characterized in that a deflection conductor is arranged on the side surface of an ion flight path between an accelerating electric field of the mass spectrometer and a detector; the screening method comprises the following steps:
switching on a first voltage signal to the deflection conductor to enable the deflection conductor to generate a deflection electric field, and when the ions fly through the deflection electric field, the flight direction is deflected and does not reach the detector;
detecting a laser synchronous pulse signal, and keeping the deflection conductor connected with the first voltage signal unchanged after the laser synchronous pulse signal is output so as to deflect the flight direction of the non-target ions flying out of the accelerating electric field;
when the target ions fly out of the accelerating electric field, a second voltage signal is connected to the deflecting conductor, and a deflecting electric field for deflecting the target ions is not generated, so that the target ions can fly to reach the detector;
and when the target ions all pass through the deflection conductor, switching on the first voltage signal to the deflection conductor.
2. The method of ion screening for a mass spectrometer of claim 1, wherein said deflection conductor is at least one set of deflection conductor plates disposed on a side of said ion flight path; each group of the deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded;
switching on a first voltage signal to the deflection conductor, comprising:
accessing a high-voltage electric signal larger than a grounding voltage to the second conductor plate;
or, a negative high-voltage electric signal lower than the grounding voltage is accessed to the second conductor plate;
switching on a second voltage signal to the deflection conductor, comprising:
a voltage signal having the same magnitude as a ground voltage is applied to the second conductive plate.
3. The method of ion screening for a mass spectrometer of claim 1, wherein the deflection conductor is a focusing electrode in the mass spectrometer or a metal cylindrical housing of the mass spectrometer without a field region;
switching on a first voltage signal to the deflection conductor, comprising:
connecting a high-voltage electric signal with the electric property opposite to that of the ions to the deflection conductor;
switching on a second voltage signal to the deflection conductor, comprising:
and connecting a high-voltage electric signal with the same electric property as the ions to the deflection conductor.
4. The method of ion screening for a mass spectrometer of any of claims 1 to 3, further comprising:
alternately applying the first voltage signal and the second voltage signal to the deflection conductor for a plurality of times; and the duration of each time of the first voltage signal and the second voltage signal is determined according to the molecular weight of the non-target ions needing to be deflected and the target ions not needing to be deflected.
5. An ion screening system for a mass spectrometer, comprising:
the input end of the controller is connected with a laser pulse source for outputting a laser pulse signal;
the output end of the ion selection circuit is connected with a deflection conductor arranged in the mass spectrometer, and the input end of the ion selection circuit is connected with the controller;
the controller is configured to control the ion selection circuit to alternately output a first voltage signal and a second voltage signal to the deflection conductor to perform the steps of implementing the ion screening method of the mass spectrometer of any of claims 1 to 4.
6. The ion screening system of a mass spectrometer of claim 5, wherein said deflection conductors are at least one set of deflection conductor plates disposed laterally of said ion flight path; each group of the deflection conductor plates comprises a first conductor plate and a second conductor plate, and the first conductor plate is grounded;
the second conductor plate is connected with a signal output end of the ion selection circuit, and the ion selection circuit comprises a high-voltage power supply, a pulse circuit and an RC series circuit;
the pulse circuit comprises a voltage division element and a transistor switch which are connected in series; one end of the pulse circuit is connected with the output end of the high-voltage power supply, and the other end of the pulse circuit is grounded; the node of the voltage division element connected with the transistor switch is a signal output end of the ion selection circuit; the first end of the RC series circuit is connected with the signal output end of the ion selection circuit, and the second end of the RC series circuit is grounded;
the controller is connected with the control end of the transistor switch and used for controlling the on and off of the transistor switch.
7. The ion screening system of a mass spectrometer of claim 6, wherein a first terminal of said voltage divider element is connected to said high voltage power supply and a second terminal is connected to a first terminal of said transistor switch; a second terminal of the transistor switch is grounded;
when the controller outputs a low level signal, the first end and the second end of the transistor switch are disconnected;
when the controller outputs a high level signal, the first terminal and the second terminal of the transistor switch are conducted.
8. The ion screening system of a mass spectrometer of claim 6, wherein a first terminal of said transistor switch is connected to said high voltage power supply and a second terminal is connected to a first terminal of said voltage divider element; the second end of the voltage division element is grounded;
when the controller outputs a low level signal, the first end and the second end of the transistor switch are disconnected;
when the controller outputs a high level signal, the first terminal and the second terminal of the transistor switch are conducted.
9. The ion screening system of a mass spectrometer of claim 6, wherein the ion selection circuit further comprises an RC parallel circuit; and the control end of the transistor switch is connected with the controller through the RC parallel circuit.
10. The ion screening system of a mass spectrometer of claim 6, wherein said controller and said transistor switch are connected by an isolation circuit.
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| CN202111370623.4A CN114038731B (en) | 2021-11-18 | 2021-11-18 | Ion screening method and system of mass spectrometer |
| PCT/CN2022/131863 WO2023088228A1 (en) | 2021-11-18 | 2022-11-15 | Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit |
| AU2022389627A AU2022389627A1 (en) | 2021-11-18 | 2022-11-15 | Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit |
| EP22894762.8A EP4293703A1 (en) | 2021-11-18 | 2022-11-15 | Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit |
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| CN202111370623.4A CN114038731B (en) | 2021-11-18 | 2021-11-18 | Ion screening method and system of mass spectrometer |
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| WO2023088228A1 (en) * | 2021-11-18 | 2023-05-25 | 安图实验仪器(郑州)有限公司 | Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107331597A (en) * | 2017-06-23 | 2017-11-07 | 江苏天瑞仪器股份有限公司福建分公司 | The ion repulsion method of MALDI-TOF-MS instrument |
| CN109755096A (en) * | 2018-12-31 | 2019-05-14 | 聚光科技(杭州)股份有限公司 | Screening type time of-flight mass spectrometer and detection method |
-
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107331597A (en) * | 2017-06-23 | 2017-11-07 | 江苏天瑞仪器股份有限公司福建分公司 | The ion repulsion method of MALDI-TOF-MS instrument |
| CN109755096A (en) * | 2018-12-31 | 2019-05-14 | 聚光科技(杭州)股份有限公司 | Screening type time of-flight mass spectrometer and detection method |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2023088228A1 (en) * | 2021-11-18 | 2023-05-25 | 安图实验仪器(郑州)有限公司 | Ion screening method and system for mass spectrometer, high-voltage pulse circuit, and selection circuit |
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