CN114034254A - Method for measuring thickness of thin material - Google Patents
Method for measuring thickness of thin material Download PDFInfo
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- CN114034254A CN114034254A CN202111392591.8A CN202111392591A CN114034254A CN 114034254 A CN114034254 A CN 114034254A CN 202111392591 A CN202111392591 A CN 202111392591A CN 114034254 A CN114034254 A CN 114034254A
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- 239000000463 material Substances 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 35
- 230000002093 peripheral effect Effects 0.000 claims abstract description 22
- 238000012935 Averaging Methods 0.000 claims description 2
- 238000005192 partition Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 14
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 230000007547 defect Effects 0.000 abstract description 2
- 238000012545 processing Methods 0.000 description 5
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
The invention relates to the technical field of sheet production, in particular to a method for measuring the thickness of a sheet. A method of measuring the thickness of a sheet material comprising: the method comprises the steps that grid division is carried out on the peripheral surfaces of a reference piece and a sheet to be measured, a first distance between each first grid of the reference piece and a ranging structure is measured, and a first position and a first distance of each first grid are stored; the thin material to be measured bypasses the circumferential surface of the rotating reference piece, a second distance between any second grid of the thin material to be measured and the ranging structure is measured, and a second position and a second distance of the second grid are stored; acquiring a first position and a first distance corresponding to a second position, wherein the difference between the second distance and the first distance is the thickness of the thin material to be measured; the first grids on the peripheral surface of the reference piece correspond to the second grids of the sheet to be detected one by one. The invention overcomes the defect of low measurement precision caused by the tolerance of the reference part in the manufacturing process, and provides the method for measuring the thickness of the thin material.
Description
Technical Field
The invention relates to the technical field of sheet production, in particular to a method for measuring the thickness of a sheet.
Background
In order to meet the market demand, manufacturers produce a large number of products with the length far greater than the thickness, but the thickness of the products is very small, and the precision requirement is difficult to achieve by using a conventional measuring method, so that the thickness measurement of thin materials becomes a difficult problem in enterprise production.
At present, in the thickness measurement field, an upper laser thickness gauge and a lower laser thickness gauge are arranged at the same position of a thin material, and the thickness of the thin material to be measured is obtained through comparison and conversion with a calibration block or a calibration membrane. The measurement method needs the thin material to be suspended, and tension changes exist, so that the thin material fluctuates up and down, and the measurement precision is influenced. In addition, a method for measuring the thickness of a product by using a laser range finder at a position right above the radial highest point of a roller is also provided, in the method, the original size of the roller is used as a reference, and the roller has the factors of cutter abrasion, vibration of processing equipment, equipment processing control precision and the like in the processing process, so that the reference roller may have large cylindricity and circular runout, and the distance from each point to the laser range finder is the same after the thin material to be measured is wound on the roller, so that the thickness of the thin material cannot be accurately measured, the measurement precision cannot be improved to be higher than the processing precision, and the micron-sized thin material cannot be measured, and the final measurement of the thickness of the thin material has large deviation.
Disclosure of Invention
Therefore, the technical problem to be solved by the invention is that the measurement precision of the sheet material in the prior art is not high, thereby providing a method for measuring the thickness of the sheet material.
In order to solve the above problems, the present invention provides a method for measuring a thickness of a sheet, comprising:
the method comprises the steps that grid division is carried out on the peripheral surfaces of a reference piece and a sheet to be measured, a first distance between each first grid of the reference piece and a ranging structure is measured, and a first position and a first distance of each first grid are stored;
the thin material to be measured bypasses the circumferential surface of the rotating reference piece, a second distance between any second grid of the thin material to be measured and the ranging structure is measured, and a second position and a second distance of the second grid are stored;
acquiring a first position and a first distance corresponding to a second position, wherein the difference between the second distance and the first distance is the thickness of the thin material to be measured;
the first grids on the peripheral surface of the reference piece correspond to the second grids of the sheet to be detected one by one.
Optionally, the specific step of meshing the circumferential surface of the reference member is as follows:
equally spaced divisions are made in the axial and circumferential directions of the reference member in accordance with predetermined values.
Optionally, the first position and the first distance after the reference member is moved by a first predetermined value in the axial direction and a second predetermined value in the circumferential direction are measured and stored while the reference member is rotated.
Optionally, the predetermined value is 1 mm.
Optionally, the reference member runs at the same linear speed as the sheet to be measured.
Alternatively, the reference member is rotated at different speeds, a third position and a third distance per predetermined time of rotation of the reference member are measured and stored, and the circumferential surface of the reference member is gridded according to the first position.
Optionally, a plurality of second distances between a plurality of second grids of the sheet to be measured and the ranging structure are measured and second positions of the plurality of grids are determined.
Optionally, according to the second position, averaging differences between the plurality of second distances and the first distance to obtain the thickness of the to-be-measured sheet.
Optionally, the distance measuring structure starts self-checking every predetermined time, and the integrity of the first position and the first distance of the reference member is determined again.
Optionally, when the first position and the first distance of the reference member are incomplete, the first distance between each first grid on the circumferential surface of the reference member and the ranging structure is measured again, and the storage is updated.
The technical scheme of the invention has the following advantages:
1. the invention provides a method for measuring the thickness of a thin material, which divides the peripheral surfaces of a reference piece and the thin material to be measured into grids, measures a first distance between each first grid of the reference piece and a distance measuring structure, and stores a first position and a first distance of the first grid. And the thin material to be measured bypasses the circumferential surface of the rotating reference surface, the second distance between any second grid of the thin material to be measured and the ranging structure is measured, and the second position and the second distance of the second grid are stored. And acquiring a first position and a first distance corresponding to the second position, wherein the difference between the second distance and the first distance is the thickness of the thin material to be measured. The first grids on the peripheral surface of the reference piece correspond to the second grids of the sheet material to be detected one by one. Because the reference piece has tolerance during processing, the first distances between any point on the peripheral surface of the reference piece and the distance measuring structures are not completely the same, the first distances between all points and the distance measuring structures and the corresponding first positions are collected as far as possible before the thin material is wound on the peripheral surface of the reference piece, therefore, after the thin material to be measured is placed on the reference surface, only the second distance between any point of the thin material and the distance measuring structures needs to be measured, the corresponding first position is found according to the second position, the first position of the point is further obtained, the thickness of the thin material to be measured is calculated by calculating the difference between the second distance and the first distance, the defect that the measurement precision is not high due to the tolerance of the reference piece in manufacturing is overcome, the high-precision measurement of the thin material is realized, and the method is simple.
2. According to the method for measuring the thickness of the thin material, when the reference piece rotates, the first position and the first distance when the reference piece moves 1mm respectively along the axial direction and the circumferential direction are measured and stored, so that the position equidistance of measuring points among grids is ensured, the data acquisition amount is reduced to the greatest extent on the basis of ensuring the measurement accuracy, and the working efficiency is improved.
3. According to the method for measuring the thickness of the thin material, when the reference piece rotates, the first position and the first distance of the reference piece moving by the first preset value along the axial direction and the second preset value along the circumferential direction are measured and stored, so that the circumferential surface of the reference piece can be divided more accurately, and the measuring accuracy is further improved.
4. According to the method for measuring the thickness of the thin material, the reference piece and the thin material to be measured run at the same linear speed so as to keep the axial rotation of the reference piece consistent with the advancing speed of the thin material to be measured.
5. According to the method for measuring the thickness of the thin material, the reference member rotates at different speeds, the third position and the third distance of the reference member in each rotation preset time are measured and stored, and the peripheral surface of the reference member is subjected to meshing according to the first position. On the basis of meshing the circumferential surface of the reference member at the first position, the positions and distances of more points on the roller are stored, and the reference member rotates at different speeds to adapt to different speeds of the sheet to be measured.
6. The method for measuring the thickness of the thin material provided by the invention measures a plurality of second distances and corresponding second positions between a plurality of grids of the thin material to be measured and the ranging structure, averages the difference values between the plurality of second distances and the first distances to obtain the thickness of the thin material to be measured, obtains the average thickness of the thin material to be measured and a reasonable thickness fluctuation interval to reduce the measurement error, and solves the problem of thickness abnormity in production in time.
7. According to the method for measuring the thickness of the thin material, the first distance between each grid on the peripheral surface of the reference member and the distance measuring structure is measured again at preset time intervals, the first distance is updated and stored, the change condition of the surface of the reference member is mastered in time in the production process, and the first distance and the first position are stored again, so that the method is beneficial to measuring the thickness of the thin material with high precision.
8. According to the method for measuring the thickness of the thin material, the distance measuring structure starts self-checking every other preset time, the integrity of the first position and the first distance of the reference piece is judged again, and when the first position and the integrity of the first distance of the reference piece are not complete, the first distance between each first grid on the peripheral surface of the measurement reference piece and the distance measuring structure is measured again and updated and stored. The range finding structure starts the integrity of the first position and the first distance of self-checking in order to judge the benchmark piece, avoids causing the measured incompleteness of the sheet thickness of awaiting measuring because of the integrity disappearance, can also regularly update the first position and the first distance of benchmark piece simultaneously, in time masters the global particular case of benchmark piece.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic structural diagram of a device for measuring the thickness of a thin material according to an embodiment of the present invention;
description of reference numerals: 1-a processor; 2-a mounting rack; 3-a ranging structure; 4-a reference member.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it should be understood that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplicity of description, but do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In addition, the technical features involved in the different embodiments of the present invention described below may be combined with each other as long as they do not conflict with each other.
One embodiment of the apparatus for measuring the thickness of a sheet material as shown in fig. 1 comprises a reference member 4 having a peripheral surface for surrounding the sheet material to be measured, a distance measuring structure 3 spaced from the reference member by a predetermined distance, and a processor 1 in signal connection with the distance measuring structure.
The benchmark piece 4 is the roller, winds along the axial of roller and establishes the sheet material that awaits measuring, and the roller is connected with drive structure, and is concrete, and drive structure is the motor, provides the power of uniform velocity rotation for the roller.
One side of roller is equipped with mounting bracket 2, and mounting bracket 2 has range finding structure 3 towards one side sliding connection of roller, and range finding structure 3 can slide along the axial of roller on mounting bracket 2. In particular, the distance measuring structure 3 is a non-contact distance measuring member, such as a laser distance meter. The laser range finder can be connected with step motor, and every time the roller rotates certain angle, the laser range finder moves the distance of a unit along the axial of roller, and after the roller rotated a week, the mesh partition was accomplished according to the distance that sets for to roller global to the first distance and the corresponding first position of every mesh to laser range finder are saved simultaneously, coordinate value promptly.
The processor 1 is mounted at one end of the central shaft of the roll. In particular, the processor 1 is a position sensor, for example a photoelectric sensor. The photoelectric sensor is in signal connection with the laser range finder and is used for receiving and storing a first distance and a first position sent by the laser range finder before the roller winds the sheet to be measured; and after the roller winds the sheet to be measured, the roller is used for receiving and storing the second distance and the second position sent by the laser range finder, searching the first position and the first distance corresponding to the second position, and calculating the difference value of the first position and the first position to obtain the thickness of the sheet to be measured.
Before the measurement of the thickness of the sheet is started, the peripheral surface of the roll is first meshed in the axial direction and the circumferential direction at a predetermined value of 1 mm.
Then, fix the laser range finder above the roller, the laser range finder moves along the axial of roller on mounting bracket 2, simultaneously, after the roller rotated 1mm at predetermined speed under the motor drive, the laser range finder measured the first distance of a summit of roller periphery face grid to the laser range finder to send this first distance and the coordinate value of this mesh summit to the photoelectric sensor, the photoelectric sensor records this first distance and first position. And circulating until the roller rotates for one circle, recording and storing the first distance and the first position of the vertex of each grid on the peripheral surface of the roller by the photoelectric sensor, and establishing a data table of the first distance and the first position of the peripheral surface of the roller. After the roller is rotated at a certain speed, the roller is further required to be rotated at different speeds to measure and store a third position and a third distance per predetermined time of rotation, and the circumferential surface of the roller is gridded according to the first position to store positions and distances of more points on the roller.
The method comprises the steps of winding a thin material on the peripheral surface of a roller, rotating the roller at a preset speed, setting continuous measurement by a laser range finder according to a grid to obtain a plurality of second distances of the thin material to be measured, recording corresponding second positions by a photoelectric sensor, finding corresponding first positions and first distances in a data table according to the second positions, calculating difference values of the plurality of second distances and the first distances, and calculating the thickness of the thin material to be measured.
And at fixed intervals, measuring the first distance between each grid on the peripheral surface of the roller and the laser range finder again to judge the integrity of the first position and the first distance, and recalibrating and updating the storage when the integrity is found to be lost.
As an alternative embodiment, the predetermined value for the meshing may also be 0.5mm, which is set according to the actual conditions in production.
Alternatively, the number of the distance measuring structures can be two or more, and the distance measuring structures are arranged on the mounting frame at equal intervals and used for simultaneously measuring the distance between two or more grids on the same axial surface of the reference member and the distance between the two or more grids.
As an alternative embodiment, the distance measuring structure may also be a microwave distance meter for measuring the first and second distances.
As an alternative embodiment, the processor may also be any of an encoder, a proximity sensor or a light sensor.
It should be understood that the above examples are only for clarity of illustration and are not intended to limit the embodiments. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. And obvious variations or modifications of the invention may be made without departing from the spirit or scope of the invention.
Claims (10)
1. A method for measuring the thickness of a thin material is characterized by comprising the following steps:
the peripheral surfaces of the reference piece (4) and the thin material to be measured are subjected to grid division, a first distance between each first grid of the reference piece (4) and the ranging structure (3) is measured, and a first position and a first distance of each first grid are stored;
the thin material to be measured bypasses the circumferential surface of the rotating reference piece (4), the second distance between any second grid of the thin material to be measured and the distance measuring structure (3) is measured, and the second position and the second distance of the second grid are stored;
acquiring a first position and a first distance corresponding to a second position, wherein the difference between the second distance and the first distance is the thickness of the thin material to be measured;
the first grids on the peripheral surface of the reference piece (4) correspond to the second grids of the sheet material to be measured one by one.
2. The method for measuring the thickness of a thin material according to claim 1, wherein the specific step of meshing the peripheral surface of the reference member (4) is:
the partition is performed at equal intervals along the axial direction and the circumferential direction of the reference member (4) according to a predetermined value.
3. A method of measuring the thickness of a sheet as claimed in claim 2, characterized in that, while the reference member (4) is rotating, the first position and the first distance after the reference member (4) has been moved by a first predetermined value in the axial direction and a second predetermined value in the circumferential direction are measured and stored.
4. A method for measuring the thickness of a sheet as claimed in claim 3, wherein said predetermined value is 1 mm.
5. A method for measuring the thickness of a sheet as claimed in claim 4, wherein the reference member (4) runs at the same linear speed as the sheet to be measured.
6. A method of measuring a thickness of a sheet as claimed in claim 1, wherein the reference member (4) is rotated at different speeds, a third position and a third distance per predetermined time of rotation of the reference member (4) are measured and stored, and the peripheral surface of the reference member (4) is gridded based on the first position.
7. Method for measuring the thickness of a sheet according to claim 6, characterized in that a plurality of second distances between a plurality of second grids of the sheet to be measured and the distance measuring structure (3) are measured and the second positions of the plurality of grids are determined.
8. A method as claimed in claim 7, characterized in that the thickness of the sheet to be measured is obtained by averaging the differences between the plurality of second distances and the first distance according to the second position.
9. A method for measuring the thickness of a sheet as claimed in claim 6, wherein the distance measuring structure starts a self-test at predetermined intervals to reassert the integrity of the first position and the first distance of the reference element (4).
10. Method for measuring the thickness of a sheet according to claim 9, characterized in that, when the first position and the first distance of the reference element (4) are incomplete, the first distance between each first grid of the peripheral surface of the reference element (4) and the distance measuring structure (3) is re-measured and stored updated.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111392591.8A CN114034254A (en) | 2021-11-22 | 2021-11-22 | Method for measuring thickness of thin material |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111392591.8A CN114034254A (en) | 2021-11-22 | 2021-11-22 | Method for measuring thickness of thin material |
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| CN114034254A true CN114034254A (en) | 2022-02-11 |
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| CN202111392591.8A Pending CN114034254A (en) | 2021-11-22 | 2021-11-22 | Method for measuring thickness of thin material |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116026261A (en) * | 2023-03-30 | 2023-04-28 | 钛玛科（北京）工业科技有限公司 | Method and device for measuring thickness of sheet membrane by utilizing pressure difference change |
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|---|---|---|---|---|
| US5075622A (en) * | 1989-10-09 | 1991-12-24 | Sumitomo Heavy Industries, Ltd. | Sheet thickness measuring apparatus with magnetic and optical sensors |
| JPH1082632A (en) * | 1996-09-06 | 1998-03-31 | Yamabun Denki:Kk | Measuring apparatus for thickness of sheet |
| WO2012073401A1 (en) * | 2010-11-29 | 2012-06-07 | 野方 鉄郎 | Roll displacement measurement method and roll displacement measurement device using same, and film thickness measurement method and film thickness measurement device using same |
| CN105651192A (en) * | 2016-04-12 | 2016-06-08 | 广州市尤特新材料有限公司 | Detection method and system of surface thickness and planeness of rotary target |
| CN105865351A (en) * | 2016-05-10 | 2016-08-17 | 童孝波 | Nondestructive detecting method for thickness of scales on inner surface of drum |
| CN106871773A (en) * | 2017-02-14 | 2017-06-20 | 肇庆市嘉仪仪器有限公司 | A kind of online noncontact thickness-measuring equipment and its measuring method |
| CN110044312A (en) * | 2019-05-16 | 2019-07-23 | 江苏塔菲尔新能源科技股份有限公司 | A kind of measuring device and its measurement method of thickness |
-
2021
- 2021-11-22 CN CN202111392591.8A patent/CN114034254A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5075622A (en) * | 1989-10-09 | 1991-12-24 | Sumitomo Heavy Industries, Ltd. | Sheet thickness measuring apparatus with magnetic and optical sensors |
| JPH1082632A (en) * | 1996-09-06 | 1998-03-31 | Yamabun Denki:Kk | Measuring apparatus for thickness of sheet |
| WO2012073401A1 (en) * | 2010-11-29 | 2012-06-07 | 野方 鉄郎 | Roll displacement measurement method and roll displacement measurement device using same, and film thickness measurement method and film thickness measurement device using same |
| CN105651192A (en) * | 2016-04-12 | 2016-06-08 | 广州市尤特新材料有限公司 | Detection method and system of surface thickness and planeness of rotary target |
| CN105865351A (en) * | 2016-05-10 | 2016-08-17 | 童孝波 | Nondestructive detecting method for thickness of scales on inner surface of drum |
| CN106871773A (en) * | 2017-02-14 | 2017-06-20 | 肇庆市嘉仪仪器有限公司 | A kind of online noncontact thickness-measuring equipment and its measuring method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116026261A (en) * | 2023-03-30 | 2023-04-28 | 钛玛科（北京）工业科技有限公司 | Method and device for measuring thickness of sheet membrane by utilizing pressure difference change |
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