CN114003491A - Test equipment parameter modification method and device, electronic equipment and storage medium - Google Patents
Test equipment parameter modification method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The invention provides a method and a device for modifying parameters of test equipment, electronic equipment and a storage medium, which are used for pre-starting upper computer software of the test equipment for multiple times and acquiring characteristic data corresponding to the parameters of the test equipment after each pre-starting from a memory; comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes; after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in a memory by using a character string matching algorithm, and determining an initial address of the target data in the memory; determining a memory address where the test equipment parameter is located according to the starting address and the data type of the test equipment parameter; and calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data. The scheme of the invention solves the problems of high parameter modification difficulty, low efficiency and poor stability caused by the limitation of equipment and equipment manufacturers.
Description
Technical Field
The invention relates to the technical field of test equipment control, in particular to a method and a device for modifying parameters of test equipment, electronic equipment and a storage medium.
Background
With the development of automatic control technology, the control of test equipment is also developed towards automation and intellectualization, such as a tensile machine, a carbon black dispersion meter and the like. The test equipment control is usually realized by modifying the parameters of the test equipment through software, and the test equipment operates according to the modified parameters of the test equipment to complete corresponding tests.
At present, the following methods are used to modify the parameters of the testing equipment through software:
1. the method is realized by installing necessary protocol gateway hardware and providing information such as PLC addresses and the like by an equipment manufacturer, and can achieve the aim of modifying the parameters of the test equipment through software.
2. The standard interface of the equipment provided by the manufacturer is used for modifying the parameters of the test equipment, and the standard interface of the equipment can be provided only after a part of foreign equipment manufacturers need to charge high cost, so that the purpose of modifying the parameters of the test equipment through software cannot be realized by the part of equipment.
3. The software program is used for simulating manual operation to modify the parameters of the test equipment, and the mode is slow and unstable, so that the parameter modification is easy to fail.
Therefore, how to design a stable and efficient method for modifying the parameters of the test equipment, which is not limited by equipment manufacturers, is an urgent problem to be solved.
Disclosure of Invention
The invention provides a method and a device for modifying parameters of test equipment, electronic equipment and a storage medium, which directly modify the test parameters of the equipment in a memory by accurately searching the memory address of the parameter of the test equipment, realize the automatic modification of the test parameters of the equipment and solve the problems of high difficulty in modifying the parameters, low efficiency and poor stability caused by the limitation of equipment and equipment manufacturers in the prior art.
In a first aspect, the present invention provides a method for modifying parameters of a test apparatus, including:
pre-starting the upper computer software of the test equipment for multiple times, and acquiring characteristic data corresponding to the test equipment parameters after each pre-starting from a memory space;
comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes;
after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in a memory by using a character string matching algorithm, and determining an initial address of the target data in the memory;
determining a memory address where the test equipment parameter is located according to the starting address and the data type of the test equipment parameter;
and calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data.
In an optional embodiment, the pre-starting the upper computer software of the test equipment for multiple times, and acquiring the characteristic data corresponding to the test equipment parameter after each pre-starting from the memory space includes:
starting upper computer software of the test equipment, and loading the started upper computer software by using a debugging tool to obtain a memory base address of the test equipment parameter;
determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length;
acquiring characteristic data corresponding to the test equipment parameters stored in a memory space according to the memory address of the characteristic data corresponding to the test equipment parameters;
and obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
In an optional embodiment, the comparing the plurality of sets of feature data according to a preset comparison rule to obtain a parameter feature code includes:
sequentially comparing the numerical values of the same position of the multiple groups of characteristic data, and if the numerical values of the ith position of the multiple groups of characteristic data are the same, setting the numerical values as the numerical values of the ith position in the parameter characteristic code;
otherwise, setting the value of the ith position in the parameter feature code as a preset symbol;
and obtaining parameter feature codes until the comparison of all the positions of the plurality of groups of feature data is completed.
In an alternative embodiment, the debugging tool comprises at least one of a Cheat Engine, X32dbg, and OllyDBG decompilation tool.
In an alternative embodiment, the string matching algorithm is a KMP algorithm.
In a second aspect, the present invention provides a device for modifying parameters of a testing apparatus, including:
the acquisition module is used for pre-starting the upper computer software of the test equipment for multiple times and acquiring characteristic data corresponding to the test equipment parameters after each pre-starting from the memory space;
the comparison module is used for comparing a plurality of groups of the characteristic data according to a preset comparison rule to obtain a parameter characteristic code;
the matching module is used for searching target data matched with the parameter feature codes in the memory by using a character string matching algorithm after upper computer software of the test equipment is formally started, and determining the initial address of the target data in the memory;
the determining module is used for determining the memory address of the test equipment parameter according to the starting address and the data type of the test equipment parameter;
and the modification module is used for calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data.
In an optional embodiment, the obtaining module is specifically configured to start upper computer software of the test equipment, and load the started upper computer software by using a debugging tool to obtain a memory base address of a parameter of the test equipment; determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length; acquiring characteristic data corresponding to the test equipment parameters stored in a memory space according to the memory address of the characteristic data corresponding to the test equipment parameters; and obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
In an optional embodiment, the comparison module is specifically configured to compare multiple sets of values at the same position of the feature data in sequence, and if the values at the ith position of the multiple sets of feature data are the same, set the value as the value at the ith position in the parameter feature code; otherwise, setting the value of the ith position in the parameter feature code as a preset symbol; and obtaining parameter feature codes until the comparison of all the positions of the plurality of groups of feature data is completed.
In an alternative embodiment, the debugging tool comprises at least one of a Cheat Engine, X32dbg, and OllyDBG decompilation tool.
In an alternative embodiment, the string matching algorithm is a KMP algorithm.
In a third aspect, the present invention provides an electronic device comprising: at least one processor and memory;
the memory stores computer-executable instructions;
the at least one processor executing the computer-executable instructions stored by the memory causes the at least one processor to perform the test device parameter modification method of any of the first aspects.
In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium, in which computer-executable instructions are stored, and when a processor executes the computer-executable instructions, the method for modifying parameters of a test device according to any one of the first aspect is implemented.
According to the method and the device for modifying the parameters of the test equipment, the electronic equipment and the storage medium, provided by the invention, the upper computer software of the test equipment is pre-started for multiple times, and the characteristic data corresponding to the parameters of the test equipment after each pre-start is obtained from the memory space; comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes; after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in a memory by using a character string matching algorithm, and determining an initial address of the target data in the memory; determining a memory address where the test equipment parameter is located according to the starting address and the data type of the test equipment parameter; and calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data. Compared with the prior art, the scheme provided by the invention firstly obtains the characteristic data of a plurality of groups of test equipment parameters in the memory, then determines the characteristic code corresponding to the test equipment parameters according to the characteristic data, accurately positions the memory address of the test equipment parameters according to the characteristic code, and finally directly modifies the equipment test parameters in the memory, thereby realizing the automatic modification of the equipment test parameters and solving the problems of large parameter modification difficulty, low efficiency and poor stability caused by the limitations of equipment and equipment manufacturers in the prior art.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic flow chart of a method for modifying parameters of a test device according to a first embodiment of the present disclosure;
FIG. 2 is a schematic flow chart illustrating another method for modifying parameters of a test device according to an embodiment of the present disclosure;
FIG. 3 is a schematic flow chart illustrating a method for modifying parameters of a testing apparatus according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a test apparatus parameter modification device provided in the second embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure.
Detailed Description
The present disclosure is described in further detail below with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the disclosure and are not limiting of the disclosure. It should be further noted that, for the convenience of description, only some of the structures relevant to the present disclosure are shown in the drawings, not all of them.
Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although a flowchart may describe the steps as a sequential process, many of the steps can be performed in parallel, concurrently or simultaneously. In addition, the order of the steps may be rearranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figure. The processes may correspond to methods, functions, procedures, subroutines, and the like.
In the following embodiments, optional features and examples are provided in each embodiment, and various features described in the embodiments may be combined to form a plurality of alternatives, and each numbered embodiment should not be regarded as only one technical solution.
Example one
Fig. 1 is a schematic flow diagram of a test device parameter modification method according to an embodiment of the present disclosure, where an execution subject of the embodiment is a test device parameter modification apparatus, the apparatus may be implemented in a software and/or hardware manner, and may be integrated in a server or a terminal, as shown in fig. 1, a test device parameter modification method according to an embodiment of the present disclosure includes:
and S1, pre-starting the upper computer software of the test equipment for multiple times, and acquiring characteristic data corresponding to the test equipment parameters after each pre-starting from the memory space.
The upper computer software is software loaded on the upper computer and used for controlling the test equipment to run, and the characteristic data is data of a specific format and content generated when the test equipment parameters are stored in the memory.
In this embodiment, because the upper computer software is started each time, a section of memory space is applied in the memory for storing the test device parameters to ensure normal operation of the program, and addresses of the applied memory space are different each time, which results in that the addresses stored in the memory by the test device parameters each time are different, but the data of a section of specific format and content is generated at the initial part when the test device parameters are stored in the memory each time, the data of the section of specific format and content can be used as the feature data corresponding to the test device parameters, the memory address of the feature data corresponding to the test device parameters can be determined by using the debugging tool, and the feature data corresponding to the test device parameters stored in the memory space can be obtained according to the memory address.
And S2, comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes.
In this embodiment, because some differences exist between the obtained multiple sets of feature data, a uniform feature code capable of representing the parameters of the test equipment needs to be determined, so as to search the position of the parameters of the test equipment in the memory later, and the same value is retained compared with the value at the same position of the multiple sets of feature data, and different values are replaced with specific symbols, so as to generate a feature code including a value and a symbol.
S3, after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in the memory by using a character string matching algorithm, and determining the initial address of the target data in the memory.
In this embodiment, the target data matched with the parameter feature code may be searched from the memory by using a string matching algorithm, and after the target data is found, the start address of the target data is obtained, that is, the start address of the test device parameter in the memory.
And S4, determining the memory address of the test equipment parameter according to the starting address and the data type of the test equipment parameter.
The memory address where the test equipment parameter is located includes a start address and an occupied memory size.
In this embodiment, the size of the memory occupied by the test equipment parameter may be determined according to the data type of the test equipment parameter, and the position of the test equipment parameter in the memory may be accurately determined according to the start address of the test equipment parameter and the size of the memory occupied, so as to modify the data stored in the determined position.
And S5, calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data.
According to the technical scheme provided by the embodiment of the disclosure, the upper computer software of the test equipment is pre-started for multiple times, and the characteristic data corresponding to the test equipment parameters after each pre-start is obtained from the memory space; comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes; after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in a memory by using a character string matching algorithm, and determining an initial address of the target data in the memory; determining a memory address where the test equipment parameter is located according to the starting address and the data type of the test equipment parameter; and calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data. By adopting the technical scheme provided by the disclosure, the characteristic data of a plurality of groups of test equipment parameters in the memory is obtained, the characteristic code corresponding to the test equipment parameters is determined according to the characteristic data, the memory address where the test equipment parameters are located is accurately positioned according to the characteristic code, and the test parameters of the equipment are directly modified in the memory according to the memory address where the test equipment parameters are located, so that the automatic modification of the test parameters of the equipment is realized, and the problems of high difficulty, low efficiency and poor stability in parameter modification caused by the limitations of equipment and equipment manufacturers in the prior art are solved.
On the basis of the embodiment shown in fig. 1, fig. 2 is a schematic flow chart of another test equipment parameter modification method provided in the first embodiment of the present disclosure, and the method provided in the embodiment of the present disclosure is further described with respect to the step S1 in the foregoing embodiment, where the test equipment parameter modification method includes:
s101, starting upper computer software of the test equipment, and loading the started upper computer software by using a debugging tool to obtain a memory base address of the test equipment parameter.
In this embodiment, the debugging tool may include at least one of decompiling tools such as a heat Engine, an X32dbg, and an olydbg, and may also be other debugging tools capable of acquiring a base memory address of the test device parameter, which is not limited in this embodiment.
And S102, determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length.
The preset data length is set according to the storage condition of the actual test equipment parameters in the memory.
In this embodiment, the memory address of the feature data corresponding to the test device parameter may be obtained according to the memory base address of the test device parameter and the preset data length.
S103, acquiring the characteristic data corresponding to the test equipment parameters stored in the memory space according to the memory address of the characteristic data corresponding to the test equipment parameters.
In this embodiment, the characteristic data stored in the memory space corresponding to the memory address is obtained according to the memory address of the characteristic data corresponding to the test equipment parameter.
And S104, obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
In this embodiment, the upper computer software is repeatedly restarted, and a plurality of sets of feature data are obtained according to the method described in S101 to S103.
For example, the upper computer software is run in a windows system, the upper computer software is started for the first time, a decompilation tool is used to load and acquire a memory base address of a test device parameter as 00342000, assuming that a data type corresponding to the test device parameter occupies 4 bytes in a memory, data larger than 4 bytes needs to be fetched from a memory address by taking 00342000 as a starting point, and data of 24 bytes is preset to be fetched, a memory address of feature data corresponding to the test device parameter is 00342000 to 00342017, data stored in a memory space pointed by 00342000 to 00342017 is 61006E0069006D0061006C0073000000124F434600000080, a first set of feature data is obtained, the upper computer software is restarted twice repeatedly, and another two sets of feature data are obtained in the same manner as 612C6E0069005C0022006C21730000001F4F 6104600000080 and 06E2269006D 006C1E730000002D4F 434600000080.
According to the technical scheme, a specific method for obtaining the characteristic data corresponding to the parameters of the test equipment is provided on the basis of the technical scheme, and the method has the advantages that the characteristic data of data stored in the memory by multiple groups of parameters of the test equipment can be obtained in a method for obtaining the memory address of the parameters of the test equipment, so that the characteristic code corresponding to the parameters of the test equipment can be determined according to the characteristic data, and the characteristic code can be used for automatically searching the parameters of the test equipment from the memory.
On the basis of the embodiment shown in fig. 1, fig. 3 is a schematic flow chart of another testing apparatus parameter modification method provided in the embodiment of the present disclosure, which is further described in the step S2 in the foregoing embodiment, and the testing apparatus parameter modification method includes:
s201, sequentially comparing numerical values of the same position of a plurality of groups of characteristic data, and if the numerical values of the ith position of the plurality of groups of characteristic data are the same, setting the numerical values as the numerical values of the ith position in the parameter characteristic code;
s202, otherwise, setting the value of the ith position in the parameter feature code as a preset symbol;
s203, until the comparison of all the positions of the plurality of groups of characteristic data is completed, obtaining parameter characteristic codes.
For example, as shown in table 1, 3 sets of feature data include: comparing the values stored in each address of the 3 sets of feature data in sequence, i.e., the 1 st set of feature data 61006E0069006D0061006C0073000000124F434600000080, the 2 nd set of feature data 612C6E0069005C0022006C21730000001F4F434600000080, and the 3 rd set of feature data 61006E2269006D002E006C1E730000002D4F434600000080, the values of the addresses having the same value are kept unchanged, and the values of the addresses having different values are set to "? ", get the parameter signature code 616E 690000006C 730000004F 434600000080.
TABLE 1
| Address | Set 1 of feature data | Set 2 of feature data | Set 3 of characteristic data | Feature code |
| 00 | 61 | 61 | 61 | 61 |
| 01 | 00 | 2C | 00 | ？？ |
| 02 | 6E | 6E | 6E | 6E |
| 03 | 00 | 00 | 22 | ？？ |
| 04 | 69 | 69 | 69 | 69 |
| 05 | 00 | 00 | 00 | 00 |
| 06 | 6D | 5C | 6D | ？？ |
| 07 | 00 | 00 | 00 | 00 |
| 08 | 61 | 22 | 2E | ？？ |
| 09 | 00 | 00 | 00 | 00 |
| 0A | 6C | 6C | 6C | 6C |
| 0B | 00 | 21 | 1E | ？？ |
| 0C | 73 | 73 | 73 | 73 |
| 0D | 00 | 00 | 00 | 00 |
| 0E | 00 | 00 | 00 | 00 |
| 0F | 00 | 00 | 00 | 00 |
| 10 | 12 | 1F | 2D | ？？ |
| 11 | 4F | 4F | 4F | 4F |
| 12 | 43 | 43 | 43 | 43 |
| 13 | 46 | 46 | 46 | 46 |
| 14 | 00 | 00 | 00 | 00 |
| 15 | 00 | 00 | 00 | 00 |
| 16 | 00 | 00 | 00 | 00 |
| 17 | 80 | 80 | 80 | 80 |
The technical scheme provides a method for generating the parameter feature code on the basis of the technical schemes, and the method has the advantages that the parameter feature code can be generated by using feature data corresponding to the parameters of the test equipment, so that the parameters of the test equipment can be automatically searched according to the parameter feature code.
On the basis of obtaining the parameter feature code, target data matched with the parameter feature code can be searched in a large amount of data stored in the memory by using a character string matching algorithm, so that the initial address of the target data in the memory is determined, and the character string matching algorithm used here can be specifically a KMP algorithm.
Example two
Fig. 4 is a schematic structural diagram of a test apparatus parameter modification device provided in the second embodiment of the present disclosure. For ease of illustration, only portions that are relevant to embodiments of the present disclosure are shown. Referring to fig. 4, the test device parameter modifying apparatus includes:
the obtaining module 41 is configured to perform multiple pre-starting on upper computer software of the test equipment, and obtain feature data corresponding to a parameter of the test equipment after each pre-starting from a memory space;
a comparison module 42, configured to compare multiple sets of the feature data according to a preset comparison rule to obtain a parameter feature code;
the matching module 43 is configured to search target data matched with the parameter feature code in the memory by using a character string matching algorithm after formally starting the upper computer software of the test device, and determine an initial address of the target data in the memory;
a determining module 44, configured to determine, according to the start address and the data type of the test device parameter, a memory address where the test device parameter is located;
and a modifying module 45, configured to invoke a write-in function to modify the data stored in the memory address where the test device parameter is located into preset data.
According to the technical scheme provided by the embodiment of the disclosure, the upper computer software of the test equipment is pre-started for multiple times through the acquisition module, and the characteristic data corresponding to the test equipment parameters after each pre-start is acquired from the memory space; comparing the plurality of groups of feature data through a comparison module according to a preset comparison rule to obtain parameter feature codes; after upper computer software of the test equipment is formally started through a matching module, target data matched with the parameter feature codes are searched in a memory by utilizing a character string matching algorithm, and an initial address of the target data in the memory is determined; determining the memory address of the test equipment parameter according to the initial address and the data type of the test equipment parameter by a determining module; and calling a write-in function through a modification module to modify the data stored in the memory address where the test equipment parameter is located into preset data. By adopting the technical scheme provided by the disclosure, the characteristic data of a plurality of groups of test equipment parameters in the memory is obtained, the characteristic code corresponding to the test equipment parameters is determined according to the characteristic data, the memory address where the test equipment parameters are located is accurately positioned according to the characteristic code, and the test parameters of the equipment are directly modified in the memory according to the memory address where the test equipment parameters are located, so that the automatic modification of the test parameters of the equipment is realized, and the problems of high difficulty, low efficiency and poor stability in parameter modification caused by the limitations of equipment and equipment manufacturers in the prior art are solved.
Optionally, the obtaining module 41 is specifically configured to start upper computer software of the test equipment, and load the started upper computer software by using a debugging tool to obtain a memory base address of a parameter of the test equipment; determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length; acquiring characteristic data corresponding to the test equipment parameters stored in a memory space according to the memory address of the characteristic data corresponding to the test equipment parameters; and obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
Optionally, the comparing module 42 is specifically configured to sequentially compare multiple sets of numerical values at the same position of the feature data, and if the numerical values at the ith position of the multiple sets of feature data are the same, set the numerical value as the numerical value at the ith position in the parameter feature code; otherwise, setting the value of the ith position in the parameter feature code as a preset symbol; and obtaining parameter feature codes until the comparison of all the positions of the plurality of groups of feature data is completed.
Optionally, the debugging tool includes at least one of a decompilation tool such as a Cheat Engine, X32dbg, and OllyDBG.
Optionally, the string matching algorithm is a KMP algorithm.
The product can execute the method provided by any embodiment of the disclosure, and has corresponding functional modules and beneficial effects of the execution method.
EXAMPLE III
Fig. 5 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure, and as shown in fig. 5, the electronic device 50 according to this embodiment may include: memory 51, processor 52.
A memory 51 for storing a computer program (e.g., an application program, a functional module, etc. for implementing the parameter modification method of the test equipment described above), computer instructions, etc.;
the computer programs, computer instructions, etc. described above may be stored in one or more memories 51 in partitions. And the computer programs, computer instructions, data, etc. described above may be invoked by the processor 52.
A processor 52 for executing the computer program stored in the memory 51 to implement the steps of the method according to the above embodiments.
Reference may be made in particular to the description relating to the preceding method embodiment.
The memory 51 and the processor 52 may be separate structures or may be an integrated structure integrated together. When the memory 51 and the processor 52 are separate structures, the memory 51 and the processor 52 may be coupled by a bus 53.
The electronic device of this embodiment may execute the technical solutions in the methods shown in fig. 1 to fig. 3, and the specific implementation process and technical principle of the electronic device refer to the relevant descriptions in the methods shown in fig. 1 to fig. 3, which are not described herein again.
In addition, embodiments of the present application further provide a computer-readable storage medium, in which computer-executable instructions are stored, and when at least one processor of the user equipment executes the computer-executable instructions, the user equipment performs the above-mentioned various possible methods.
Computer-readable media includes both computer storage media and communication media including any medium that facilitates transfer of a computer program from one place to another. A storage media may be any available media that can be accessed by a general purpose or special purpose computer. An exemplary storage medium is coupled to the processor such the processor can read information from, and write information to, the storage medium. Of course, the storage medium may also be integral to the processor. The processor and the storage medium may reside in an ASIC. Additionally, the ASIC may reside in user equipment. Of course, the processor and the storage medium may reside as discrete components in a communication device.
Those of ordinary skill in the art will understand that: all or a portion of the steps of implementing the above-described method embodiments may be performed by hardware associated with program instructions. The program may be stored in a computer-readable storage medium. When executed, the program performs steps comprising the method embodiments described above; and the aforementioned storage medium includes: various media that can store program codes, such as ROM, RAM, magnetic or optical disks.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for modifying parameters of a test device, comprising:
pre-starting the upper computer software of the test equipment for multiple times, and acquiring characteristic data corresponding to the test equipment parameters after each pre-starting from a memory space;
comparing the plurality of groups of feature data according to a preset comparison rule to obtain parameter feature codes;
after upper computer software of the test equipment is formally started, searching target data matched with the parameter feature codes in a memory by using a character string matching algorithm, and determining an initial address of the target data in the memory;
determining a memory address where the test equipment parameter is located according to the starting address and the data type of the test equipment parameter;
and calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data.
2. The method for modifying the parameters of the test equipment according to claim 1, wherein the pre-starting the upper computer software of the test equipment for a plurality of times and acquiring the characteristic data corresponding to the parameters of the test equipment after each pre-starting from the memory space comprises:
starting upper computer software of the test equipment, and loading the started upper computer software by using a debugging tool to obtain a memory base address of the test equipment parameter;
determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length;
acquiring characteristic data corresponding to the test equipment parameters stored in a memory space according to the memory address of the characteristic data corresponding to the test equipment parameters;
and obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
3. The method for modifying parameters of testing equipment according to claim 1, wherein comparing the plurality of sets of feature data according to a preset comparison rule to obtain a parameter feature code comprises:
sequentially comparing the numerical values of the same position of the multiple groups of characteristic data, and if the numerical values of the ith position of the multiple groups of characteristic data are the same, setting the numerical values as the numerical values of the ith position in the parameter characteristic code;
otherwise, setting the value of the ith position in the parameter feature code as a preset symbol;
and obtaining parameter feature codes until the comparison of all the positions of the plurality of groups of feature data is completed.
4. The test rig parameter modification method of claim 2, wherein the debugging tool comprises at least one of a Cheat Engine, X32dbg, and OllyDBG decompilation tool.
5. The test rig parameter modification method of any one of claims 1-4, wherein the string matching algorithm is a KMP algorithm.
6. A test equipment parameter modification device, comprising:
the acquisition module is used for pre-starting the upper computer software of the test equipment for multiple times and acquiring characteristic data corresponding to the test equipment parameters after each pre-starting from the memory space;
the comparison module is used for comparing a plurality of groups of the characteristic data according to a preset comparison rule to obtain a parameter characteristic code;
the matching module is used for searching target data matched with the parameter feature codes in the memory by using a character string matching algorithm after upper computer software of the test equipment is formally started, and determining the initial address of the target data in the memory;
the determining module is used for determining the memory address of the test equipment parameter according to the starting address and the data type of the test equipment parameter;
and the modification module is used for calling a write-in function to modify the data stored in the memory address where the test equipment parameter is located into preset data.
7. The device for modifying the parameters of the test equipment according to claim 6, wherein the obtaining module is specifically configured to start the upper computer software of the test equipment, and load the started upper computer software by using a debugging tool to obtain the base memory address of the parameters of the test equipment; determining the memory address of the characteristic data corresponding to the test equipment parameter according to the memory base address and the preset data length; acquiring characteristic data corresponding to the test equipment parameters stored in a memory space according to the memory address of the characteristic data corresponding to the test equipment parameters; and obtaining characteristic data corresponding to a plurality of groups of test equipment parameters in a mode of repeatedly restarting the upper computer software.
8. The test equipment parameter modification device according to claim 6, wherein the comparison module is specifically configured to sequentially compare a plurality of sets of values at the same position of the feature data, and if the values at the ith position of the plurality of sets of feature data are the same, set the values as the values at the ith position in the parameter feature code; otherwise, setting the value of the ith position in the parameter feature code as a preset symbol; and obtaining parameter feature codes until the comparison of all the positions of the plurality of groups of feature data is completed.
9. An electronic device, comprising: at least one processor and memory;
the memory stores computer-executable instructions;
the at least one processor executing the computer-executable instructions stored by the memory causes the at least one processor to perform the test device parameter modification method of any of claims 1-5.
10. A computer-readable storage medium having computer-executable instructions stored thereon which, when executed by a processor, implement the assay device parameter modification method of any one of claims 1-5.
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