CN113010190A - MAC address burning method, device, equipment and storage medium - Google Patents

MAC address burning method, device, equipment and storage medium Download PDF

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Publication number
CN113010190A
CN113010190A CN202110327420.0A CN202110327420A CN113010190A CN 113010190 A CN113010190 A CN 113010190A CN 202110327420 A CN202110327420 A CN 202110327420A CN 113010190 A CN113010190 A CN 113010190A
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address
tested
current
mac
memory
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王龙
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Yizhao Micro Electronics Hangzhou Co Ltd
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Yizhao Micro Electronics Hangzhou Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00Arrangements for software engineering
    • G06F8/60Software deployment
    • G06F8/61Installation
    • G06F8/63Image based installation; Cloning; Build to order

Abstract

The invention discloses a method, a device, equipment and a storage medium for burning an MAC address, wherein the method comprises the following steps: acquiring a Media Access Control (MAC) interval for burning a plurality of pieces to be tested through test equipment; calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a memory; reading a current address from a memory through a current processing piece to be detected, and burning the current address into a nonvolatile storage unit; and verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning to execute the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated until all pieces to be tested are processed. According to the technical scheme of the embodiment of the invention, the to-be-tested piece with burning failure can be screened out from the to-be-tested pieces with burning completion, and the burning efficiency of the to-be-tested piece to the MAC address is improved.

Description

MAC address burning method, device, equipment and storage medium
Technical Field
The embodiment of the invention relates to the technical field of computers, in particular to a method, a device, equipment and a storage medium for burning an MAC address.
Background
When a traditional computer hardware device product is manufactured in mass production, a burning process of a Media Access Control (MAC) address and a burning process of a hardware device program code are separately performed. Usually, after burning the program code, the burning of the MAC address is performed separately.
At present, methods for burning an MAC address of a device under test (e.g., a chip) are mainly classified into two methods, one is burning by transmitting the MAC address to the device under test through a test device, and the other is self-burning by reading the MAC address stored in a preset memory. In the first method, the test equipment needs to convert the current MAC address into a binary signal each time the test equipment performs programming, and the binary signal is stored in the internal memory unit of the device under test through the communication pin, and then the test equipment sends a programming instruction to the device under test, and the device under test performs programming under the programming instruction. In the second method, the test equipment usually stores the MAC address in a memory of a test Load Board (Load Board), and then sends a burning command to the device under test, and the device under test can use its own high frequency clock to achieve fast burning under the burning command.
However, in the first method, the process of converting the current MAC address into the binary signal by the test device is time-consuming, which results in low burning efficiency of the MAC address; in the second method, when the write function of the device under test is abnormal, the device under test is likely to disturb the MAC address in the memory of the test load board, resulting in an error in the subsequently burned MAC address.
Disclosure of Invention
The embodiment of the invention provides an MAC address burning method, device, equipment and storage medium, which can screen a burning-failed to-be-tested piece from a plurality of burning-completed to-be-tested pieces and improve the burning efficiency of the to-be-tested piece to an MAC address.
In a first aspect, an embodiment of the present invention provides a method for burning an MAC address, where the method includes:
acquiring a Media Access Control (MAC) interval for burning a plurality of pieces to be tested through test equipment, wherein the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a preset memory;
reading a current address from a memory through a current processing piece to be tested, and burning the current address into a nonvolatile storage unit of the current processing piece to be tested;
and verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning to execute the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated until all pieces to be tested are processed.
In a second aspect, an embodiment of the present invention further provides an apparatus for burning an MAC address, where the apparatus includes:
the MAC interval acquisition module is used for acquiring a media access control layer MAC interval for burning a plurality of pieces to be tested through the test equipment, and the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
the MAC interval transmission module is used for calculating a check value according to the current address in the MAC interval through the test equipment and transmitting the MAC interval and the check value to a preset memory;
the burning module is used for reading the current address from the memory through the current processing piece to be tested and burning the current address into the nonvolatile memory unit of the current processing piece to be tested;
and the result verification module is used for verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning and executing the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated and finished until all pieces to be tested are processed.
In a third aspect, an embodiment of the present invention further provides a computer device, where the computer device includes:
one or more processors;
storage means for storing one or more programs;
when the one or more programs are executed by the one or more processors, the one or more processors are enabled to execute the MAC address burning method provided by any embodiment of the invention.
In a fourth aspect, an embodiment of the present invention further provides a computer-readable storage medium, where a computer program is stored on the storage medium, and when the computer program is executed by a processor, the MAC address burning method provided in any embodiment of the present invention is implemented.
The technical scheme of the embodiment of the invention includes that an MAC interval for burning a plurality of pieces to be tested is obtained through test equipment, then a check value is calculated through the test equipment according to a current address in the MAC interval, the MAC interval and the check value are transmitted to a preset memory, the current address is read from the memory through the currently processed pieces to be tested and burned in a nonvolatile memory unit of the currently processed pieces to be tested, finally whether the currently processed pieces to be tested are successfully burned on the MAC address is verified according to burning results, after the current address and the check value in the test equipment and the memory are updated, the operation of reading the current address from the memory through the currently processed pieces to be tested is returned to be executed until the processing on all pieces to be tested is completed, the pieces to be tested which are burned and completed can be screened out from the pieces to be tested, and the burning time of the MAC addresses of the pieces to be tested can be saved, the burning efficiency of the piece to be tested is improved.
Drawings
Fig. 1 is a flowchart of a MAC address burning method according to a first embodiment of the present invention;
fig. 2 is a flowchart of a MAC address burning method according to a second embodiment of the present invention;
fig. 3 is a flowchart of a method for burning an MAC address according to a third embodiment of the present invention;
fig. 4 is a structural diagram of an MAC address burning apparatus according to a fourth embodiment of the present invention;
fig. 5 is a schematic structural diagram of a computer device in the fifth embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a flowchart of a MAC address burning method according to an embodiment of the present invention, where this embodiment is applicable to a case of burning an MAC address for a device to be tested, and the method may be executed by an MAC address burning apparatus, and the apparatus may be implemented by software and/or hardware, and may be generally integrated in a computer and all intelligent devices (e.g., a terminal device or a server) including a program running function, and specifically includes the following steps:
and 110, acquiring an MAC interval for burning to a plurality of pieces to be tested through the test equipment.
In this embodiment, the device under test is a hardware device (e.g., a chip) waiting for burning the MAC address. The Test Equipment is Equipment for providing an MAC address to a device to be tested, and specifically, the Test Equipment may be Automatic Test Equipment (ATE). The test equipment can download the MAC intervals for burning to the multiple pieces to be tested from the server. The MAC interval includes: a start address, a current address, and a stop address, the current address being initialized to the start address.
The current address is located in an interval formed by the starting address and the ending address, and the current address is increased along with the increase of the piece to be tested. The interval formed by the starting address and the ending address can correspond to a plurality of pieces to be tested, and each current address in the interval corresponds to one piece to be tested.
In a specific embodiment, it is assumed that an interval formed by the start address and the end address includes five MAC addresses, the five MAC addresses correspond to five pieces to be tested one by one, and the minimum MAC address in the interval is the start address, and the maximum MAC address is the end address.
And step 120, calculating a check value according to the current address in the MAC interval through the test equipment, and transmitting the MAC interval and the check value to a preset memory.
In a specific embodiment, a Cyclic Redundancy Check (CRC) value corresponding to a current address in the MAC section may be calculated by the test device, and then the MAC section and the CRC value may be transmitted to the preset memory by the test device. The test device may transmit data to the memory through a Serial Peripheral Interface (SPI) communication protocol or a Universal Asynchronous Receiver Transmitter (UART) protocol.
Step 130, reading the current address from the memory through the current processing piece to be tested, and burning the current address into the nonvolatile memory unit of the current processing piece to be tested.
And the current processing piece to be tested is hardware equipment for burning the MAC address at the current time. In a specific embodiment, the current processing dut can read the current address from the memory through the SPI communication protocol or the UART protocol, and burn the current address into the nonvolatile memory unit of the current processing dut. Specifically, the nonvolatile memory unit may be a One Time Programmable (OTP) memory.
And step 140, verifying whether the current processed piece to be tested is successfully burned on the MAC address according to the burning result.
In this embodiment, optionally, after the current processing test piece burns the current address into the nonvolatile memory unit, the current address burnt by the current processing test piece may be obtained, the current address burnt by the current processing test piece is compared with the current address in the MAC interval obtained by the test equipment, and whether the current processing test piece burns the MAC address successfully is verified according to the comparison result. If the current address of the current processing piece to be tested in burning is consistent with the current address in the MAC interval acquired by the test equipment, the current processing piece to be tested can be confirmed to successfully burn the MAC address; otherwise, the failure of burning the MAC address by the current processing piece to be tested can be confirmed.
In this embodiment, in order to improve the verification efficiency of the burning result of the currently processed to-be-tested piece, a CRC value corresponding to the currently processed to-be-tested piece burning current address may be calculated, the CRC value is compared with a CRC value corresponding to the current address acquired by the test equipment, and whether the currently processed to-be-tested piece successfully burns the MAC address is verified according to the comparison result of the CRC values.
And 150, judging whether all the pieces to be tested are processed or not, if so, ending the execution of the MAC address burning method, and if not, executing the step 160.
In this embodiment, after verifying whether the currently processed piece to be tested is successfully burned to the MAC address, it is further determined whether the burning process of all pieces to be tested corresponding to the MAC interval is completed. The number of the addresses in the MAC interval can be compared with the number of the burning-finished pieces to be tested, and if the number of the addresses in the MAC interval is larger than the number of the burning-finished pieces to be tested, the burning process of all the pieces to be tested can be confirmed to be not finished; if the number of the addresses included in the MAC interval is equal to the number of the burning-finished pieces to be tested, the burning process of all the pieces to be tested can be confirmed to be finished.
When the burning process of all the pieces to be tested is not finished, the current piece to be tested is taken away through the mechanical arm, and the next piece to be tested is taken as the current piece to be tested so as to finish the burning process of the next piece to be tested.
Step 160, updating the current address and check value in the test equipment and memory.
In this embodiment, after the next to-be-tested piece is taken as the current processing to-be-tested piece, 1 may be added to the current address in the test equipment and the memory, so that the next to-be-tested piece burns the current address added with 1 in the memory.
After this step is completed, the step 130 may be executed again, so that the next device to be tested can burn the current address in the memory, and whether the next device to be tested successfully burns the MAC address is verified until the processing of all devices to be tested is completed.
In this embodiment, after the processing of all the pieces to be tested is completed, the burning results of the MAC addresses of the pieces to be tested may be classified, for example, the pieces to be tested that are successfully burned may be classified into one type, and the pieces to be tested that are failed in burning may be classified into another type. The purpose of this is to: the subsequent use of the part to be tested with failed burning can be avoided, and the influence of the part to be tested with failed burning in the use process is reduced.
In this embodiment, the MAC interval and the check value are transmitted to the memory through the test device, and the current address is read from the memory through the to-be-tested object for burning, so that the problem that the burning process is time-consuming when the test device directly transmits the MAC address to the to-be-tested object in the prior art can be avoided, and the burning efficiency of the to-be-tested object on the MAC address can be improved.
The technical scheme of the embodiment of the invention includes that an MAC interval for burning a plurality of pieces to be tested is obtained through test equipment, then a check value is calculated through the test equipment according to a current address in the MAC interval, the MAC interval and the check value are transmitted to a preset memory, the current address is read from the memory through the currently processed pieces to be tested and burned in a nonvolatile memory unit of the currently processed pieces to be tested, finally whether the currently processed pieces to be tested are successfully burned on the MAC address is verified according to burning results, after the current address and the check value in the test equipment and the memory are updated, the operation of reading the current address from the memory through the currently processed pieces to be tested is returned to be executed until the processing on all pieces to be tested is completed, the pieces to be tested which are burned and completed can be screened out from the pieces to be tested, and the burning time of the MAC addresses of the pieces to be tested can be saved, the burning efficiency of the piece to be tested is improved.
On the basis of the foregoing embodiment, optionally, reading the current address from the memory by currently processing the to-be-tested device includes: acquiring a check value corresponding to a current address, which is stored in a preset storage area by the test equipment; and judging whether the check values stored in the memory and the storage area are consistent, and if so, reading the current address from the memory by currently processing the piece to be detected.
In this embodiment, after the test device obtains the MAC intervals for burning the pieces to be tested, the MAC intervals may be stored in a preset storage area (e.g., a hard disk or a network disk) of the test device, and then CRC values corresponding to the start address, the current address, and the end address in the MAC intervals are calculated, and the MAC intervals and the CRC values are transmitted to a preset memory. After the memory receives the MAC interval and each CRC value, whether the CRC values stored in the memory and the memory area are consistent or not can be judged, if yes, the current processing piece to be tested is controlled to read the current address from the memory.
The advantages of such an arrangement are: before the MAC address of the piece to be tested is burned, the accuracy of data transmission between the test equipment and the memory can be ensured, so that the risk of burning the wrong address of the subsequent piece to be tested can be reduced.
In an embodiment of the present invention, verifying whether the currently processed to-be-tested object successfully burns the MAC address according to the burning result includes: verifying whether the current address burned in the current to-be-tested piece is positioned in the MAC interval or not; if so, continuously verifying whether the current processing piece to be tested is successfully burned to the MAC address according to the burning result.
After verifying whether the current address burned in the currently processed piece to be tested is located in the MAC interval, the method further comprises the following steps: if not, determining that the current processing piece to be tested fails to burn the MAC address; adding 1 to the current address stored in the memory, and updating the current address and the check value in the memory according to the processing result; and adding 1 to the current address stored in the storage area, and updating the current address and the check value in the storage area according to the processing result.
And if the current address burnt in the current to-be-tested piece is not positioned in the MAC interval and the processing of all to-be-tested pieces is not finished, adding 1 to the current addresses in the test equipment and the memory so that the next to-be-tested piece burns the current address added with 1 in the memory.
Example two
This embodiment is a further refinement of the first embodiment, and the same or corresponding terms as those in the first embodiment are explained, and this embodiment is not repeated. Fig. 2 is a flowchart of a MAC address burning method according to a second embodiment of the present invention, in this embodiment, the technical solution of this embodiment may be combined with one or more methods in the solutions of the foregoing embodiments, and in this embodiment, as shown in fig. 2, the method according to the second embodiment of the present invention may further include:
step 210, obtaining, by the test equipment, an MAC interval for burning to the plurality of pieces to be tested.
Wherein, the MAC interval includes: a start address, a current address, and a stop address, the current address being initialized to the start address.
And step 220, calculating a check value according to the current address in the MAC interval through the test equipment, and transmitting the MAC interval and the check value to a preset memory.
Step 230, reading the current address from the memory through the currently processed device under test, and burning the current address into the nonvolatile memory cell of the currently processed device under test.
And 240, updating the current address in the memory by using the current address of the current processing to-be-tested element.
In this embodiment, since the storage space of the nonvolatile memory unit is smaller, in order to more conveniently compare the currently processed burning address of the to-be-tested device with the correct address in the test equipment, the current address in the memory may be updated by using the currently processed burning address of the to-be-tested device, and the updated current address in the memory may be compared with the correct address in the test equipment.
Specifically, the original current address in the memory may be deleted, and the current address to be burned by the currently processed device to be tested is written into the memory, so as to complete updating of the current address in the memory.
And step 250, verifying whether the current processing piece to be tested is successfully burned to the MAC address according to the current address in the memory and the current address stored in the memory area.
In this embodiment, a CRC value corresponding to the current address may be calculated according to the current address in the memory, and the CRC value corresponding to the current address in the memory is compared with a CRC value corresponding to the current address in the storage area, and if the CRC values are consistent, it is determined that the MAC address is successfully burned by the currently processed device under test; and if the MAC addresses are inconsistent, the current processing piece to be tested fails to burn the MAC addresses.
And step 260, judging whether all the pieces to be tested are processed, if so, ending the execution of the MAC address burning method, and if not, executing step 270.
Step 270, updating the current address and check value in the test equipment and memory.
After this step is completed, the step 230 is executed again until the processing of all the pieces to be tested is completed.
The technical scheme of the embodiment of the invention includes that an MAC interval for burning a plurality of pieces to be tested is obtained through test equipment, then a check value is calculated through the test equipment according to a current address in the MAC interval, the MAC interval and the check value are transmitted to a memory, the current address is read from the memory through the pieces to be tested in current processing, the pieces to be tested are burned in a nonvolatile memory unit, then the current address in the memory is updated by using the current address burned by the pieces to be tested in current processing, finally whether the pieces to be tested in current processing are successfully burned in the MAC address is verified according to the current address in the memory and the current address stored in a memory area, and after the current address and the check value in the test equipment and the memory are updated, the operation of reading the current address from the memory through the pieces to be tested in current processing is returned to be executed until the processing of all pieces to be tested is completed, the burning failure test pieces can be screened out from the plurality of burning completed test pieces, the burning time of the test pieces to the MAC address can be saved, and the burning efficiency of the test pieces is improved.
EXAMPLE III
This embodiment is a further refinement of the second embodiment, and the same or corresponding terms as those in the first embodiment are explained, and this embodiment is not repeated. Fig. 3 is a flowchart of a MAC address burning method according to a third embodiment of the present invention, where in this embodiment, the technical solution of this embodiment may be combined with one or more methods in the solutions of the foregoing embodiments, and in this embodiment, as shown in fig. 3, the method according to the third embodiment of the present invention may further include:
and 310, acquiring an MAC interval for burning to a plurality of pieces to be tested through the test equipment.
Wherein, the MAC interval includes: a start address, a current address, and a stop address, the current address being initialized to the start address.
And step 320, calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a preset memory.
Step 330, reading the current address from the memory by the current processing device under test, and burning the current address into the nonvolatile memory cell of the current processing device under test.
In an implementation manner of the embodiment of the present invention, reading a current address from a memory by currently processing a device under test includes: acquiring a check value corresponding to a current address, which is stored in a preset storage area by the test equipment; and judging whether the check values stored in the memory and the storage area are consistent, and if so, reading the current address from the memory by currently processing the piece to be detected.
And 340, acquiring a current address of the current processing to-be-tested piece, updating the current address by adding 1, and writing the updated current address into the memory through the current processing to-be-tested piece.
In this embodiment, in order to improve the efficiency of burning the MAC addresses by multiple devices to be tested, 1 may be added to the current address of the currently processed device to be tested for updating, and the updated current address of the burning device may be used to update the current address in the memory.
Specifically, the original current address in the memory may be deleted, and the updated burned current address may be written into the memory, so as to complete updating the current address in the memory.
The setting has the advantages that on one hand, whether the current processing piece to be tested is successfully burned on the MAC address can be verified through the updated current address in the memory; on the other hand, under the condition that the MAC address of the current to-be-tested piece is successfully burned, the current address updated in the memory is directly used as the MAC address to be burned of the next to-be-tested piece, and therefore burning efficiency of the MAC addresses of the multiple to-be-tested pieces can be improved.
Step 350, calculating a first check value corresponding to the updated current address in the memory.
In this step, a CRC value corresponding to the updated current address in the memory may be calculated, and this CRC value may be used as the first check value.
And step 360, adding 1 to the current address stored in the storage area, and updating the current address and the check value in the storage area according to the processing result.
In this step, the address of the current address stored in the storage area may be incremented by 1, then the current address incremented by 1 is used as the updated current address in the storage area, and the CRC value corresponding to the updated current address is calculated.
And 370, verifying whether the currently processed piece to be tested is successfully burned to the MAC address according to the consistency of the first check value and the check value in the storage area.
In this step, the CRC value calculated in step 350 may be compared with the CRC value calculated in step 360, and if the CRC values are consistent, it is determined that the MAC address of the currently processed device under test is successfully burned; and if the MAC addresses are inconsistent, confirming that the burning of the current to-be-tested piece to the MAC address fails.
And 380, judging whether all the pieces to be tested are processed or not, if so, ending the execution of the MAC address burning method, and if not, executing 390.
Step 390, update the current address and check value in the test equipment and memory.
In this embodiment, if the MAC address is successfully burned by the currently processed device under test, the current address and the check value in the test equipment and the memory are used as the updated current address and the updated check value; and if the current processing piece to be tested fails to burn the MAC address, transmitting the current address and the check value to the memory through the test equipment so as to finish updating the current address and the check value in the memory.
After this step is completed, the step 330 is executed again until the processing of all the pieces to be tested is completed.
The technical scheme of the embodiment of the invention includes that an MAC interval for burning a plurality of pieces to be tested is obtained through test equipment, a check value is calculated through the test equipment according to a current address in the MAC interval, the MAC interval and the check value are transmitted to a preset memory, the current address is read from the memory through the pieces to be tested through current processing and is burnt in a nonvolatile memory unit, then 1 is added to the current address burnt by the pieces to be tested for current processing for updating, the updated current address is written into the memory through the pieces to be tested for current processing, a first check value corresponding to the updated current address in the memory is calculated, the current address stored in a memory area is subjected to address 1 adding processing, the current address and the check value in the memory area are updated according to a processing result, and finally whether the pieces to be tested are burnt successfully on the MAC address or not is verified according to the consistency of the first check value and the check value in the memory area, and after the current address and the check value in the test equipment and the memory are updated, returning to execute the operation of reading the current address from the memory by currently processing the to-be-tested piece until the technical means of processing all to-be-tested pieces is completed, providing an investment suggestion for a transaction product selected by a user, reducing the cost of selecting the transaction product by a bank and the user, screening out the to-be-tested piece with failed burning from a plurality of burning to-be-tested pieces, saving the burning time of the to-be-tested piece to the MAC address and improving the burning efficiency of the to-be-tested piece.
In order to better introduce the technical solutions provided by the embodiments of the present invention, the embodiments of the present invention may refer to the following implementation manners:
and 11, acquiring an MAC interval for burning to a plurality of pieces to be tested through the test equipment.
In this step, the test device stores the MAC section in a preset storage area of the test device.
And step 12, calculating a check value according to the starting address, the current address and the ending address in the MAC interval by the test equipment, and transmitting the MAC interval and each check value to a preset memory.
In this step, the test equipment also stores check values corresponding to the start address, the current address and the end address in the storage area.
Step 13, judging whether the check values stored in the memory and the storage area are consistent, if so, executing step 14; if not, go to step 20.
And step 14, reading the current address from the memory through the current processing piece to be tested, and burning the current address into the nonvolatile memory unit of the current processing piece to be tested.
Step 15, verifying whether the current address burned in the current processing piece to be tested is located in the MAC interval, if so, executing step 16; if not, go to step 20.
And step 16, acquiring a current address burned by the current processing piece to be tested, updating the burned current address by adding 1, writing the updated current address into a memory through the current processing piece to be tested, and calculating a first check value corresponding to the updated current address in the memory.
And step 17, adding 1 to the current address stored in the storage area of the test equipment, and updating the current address and the check value in the storage area according to the processing result.
Step 18, judging whether the first check value is consistent with the check value in the storage area, if so, executing step 19; if not, go to step 20.
And step 19, confirming that the current processed piece to be tested successfully burns the MAC address.
And step 20, confirming that the burning of the current to-be-tested piece to the MAC address fails.
And step 21, judging whether the processing of all the pieces to be tested is finished, if so, finishing the execution of the MAC address burning method, and if not, executing step 22.
And step 22, updating the current address and the check value in the test equipment and the memory.
After this step is completed, the step 14 may be executed again, so that the next device to be tested burns the current address in the memory, and it is verified whether the next device to be tested burns the MAC address successfully or not, until the processing of all devices to be tested is completed.
The method provided by the embodiment of the invention can screen the burning failed to-be-tested piece from the plurality of burning completed to-be-tested pieces, can save the burning time of the to-be-tested piece to the MAC address, and can improve the burning efficiency of the to-be-tested piece.
Example four
Fig. 4 is a structural diagram of an MAC address burning apparatus according to a fourth embodiment of the present invention, where the apparatus includes: the MAC interval acquisition module 410, the MAC interval transmission module 420, the burning module 430, and the result verification module 440.
Wherein, the MAC interval obtaining module 410 is configured to obtain, through the testing device, a MAC interval of a media access control layer for burning a plurality of pieces to be tested, where the MAC interval includes: a start address, a current address and an end address, the current address being initialized to the start address;
the MAC interval transmission module 420 is configured to calculate, by the test device, a check value according to a current address in the MAC interval, and transmit the MAC interval and the check value to a preset memory;
the burning module 430 is used for reading the current address from the memory through the current processing piece to be tested and burning the current address into the nonvolatile memory unit of the current processing piece to be tested;
and the result verifying module 440 is configured to verify whether the currently processed piece to be tested is successfully burned for the MAC address according to the burning result, and return to execute the operation of reading the current address from the memory by the currently processed piece to be tested after the current address and the check value in the test device and the memory are updated and completed until all pieces to be tested are processed.
The technical scheme of the embodiment of the invention includes that an MAC interval for burning a plurality of pieces to be tested is obtained through test equipment, then a check value is calculated through the test equipment according to a current address in the MAC interval, the MAC interval and the check value are transmitted to a preset memory, the current address is read from the memory through the currently processed pieces to be tested and burned in a nonvolatile memory unit of the currently processed pieces to be tested, finally whether the currently processed pieces to be tested are successfully burned on the MAC address is verified according to burning results, after the current address and the check value in the test equipment and the memory are updated, the operation of reading the current address from the memory through the currently processed pieces to be tested is returned to be executed until the processing on all pieces to be tested is completed, the pieces to be tested which are burned and completed can be screened out from the pieces to be tested, and the burning time of the MAC addresses of the pieces to be tested can be saved, the burning efficiency of the piece to be tested is improved.
On the basis of the foregoing embodiments, the burning module 430 may include:
the verification value acquisition unit is used for acquiring a verification value which is stored in a preset storage area by the test equipment and corresponds to the current address;
and the check value judging unit is used for judging whether the memory is consistent with each check value stored in the storage area, and if so, reading the current address from the memory by currently processing the piece to be detected.
The result verification module 440 may include:
the first updating unit is used for updating the current address in the memory by using the current address of the current processing burning of the piece to be tested;
the first verification unit is used for verifying whether the current processing piece to be tested is successfully burned to the MAC address according to the current address in the memory and the current address stored in the storage area;
the second updating unit is used for acquiring the current address of the current processing to-be-tested piece in burning, updating the address of the burning current address by adding 1, and writing the updated current address into the memory through the current processing to-be-tested piece;
the first check value calculating unit is used for calculating a first check value corresponding to the updated current address in the memory;
a third updating unit, configured to add 1 to the current address stored in the storage area, and update the current address and the check value in the storage area according to the processing result;
the second verification unit is used for verifying whether the current to-be-processed piece to be tested is successfully burned to the MAC address according to the consistency of the first check value and the check value in the storage area;
the address verification unit is used for verifying whether the current address burnt in the current processing piece to be tested is positioned in the MAC interval or not;
the third verification unit is used for continuously verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result when the current address burnt in the current processing piece to be tested is positioned in the MAC interval;
the burning failure determining unit is used for determining that the burning of the current processing piece to be tested to the MAC address fails when the current address burnt in the current processing piece to be tested is not positioned in the MAC interval;
the fourth updating unit is used for adding 1 to the current address stored in the memory and updating the current address and the check value in the memory according to the processing result;
a fifth updating unit, configured to add 1 to the current address stored in the storage area, and update the current address and the check value in the storage area according to the processing result;
the burning process judging unit is used for judging whether the burning process of all the pieces to be tested corresponding to the MAC interval is finished or not;
and the to-be-detected piece determining unit is used for taking the currently processed to-be-detected piece away through the mechanical arm when determining that the burning process of all to-be-detected pieces corresponding to the MAC interval is not finished, and taking the next to-be-detected piece as the currently processed to-be-detected piece.
The MAC address burning device provided by the embodiment of the invention can execute the MAC address burning method provided by any embodiment of the invention, and has the corresponding functional module and beneficial effect of the execution method.
EXAMPLE five
Fig. 5 is a schematic structural diagram of a computer apparatus according to a fifth embodiment of the present invention, as shown in fig. 5, the computer apparatus includes a processor 510, a memory 520, an input device 530, and an output device 540; the number of the processors 510 in the computer device may be one or more, and one processor 510 is taken as an example in fig. 5; the processor 510, the memory 520, the input device 530 and the output device 540 in the computer apparatus may be connected by a bus or other means, and the connection by the bus is exemplified in fig. 5. The memory 520 is used as a computer-readable storage medium for storing software programs, computer-executable programs, and modules, such as program instructions/modules corresponding to a MAC address burning method in any embodiment of the present invention (for example, the MAC interval acquisition module 410, the MAC interval transmission module 420, the burning module 430, and the result verification module 440 in a MAC address burning device). The processor 510 executes various functional applications and data processing of the computer device by executing software programs, instructions and modules stored in the memory 520, so as to implement one of the MAC address burning methods described above. That is, the program when executed by the processor implements:
acquiring a Media Access Control (MAC) interval for burning a plurality of pieces to be tested through test equipment, wherein the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a preset memory;
reading a current address from a memory through a current processing piece to be tested, and burning the current address into a nonvolatile storage unit of the current processing piece to be tested;
and verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning to execute the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated until all pieces to be tested are processed.
The memory 520 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function; the storage data area may store data created according to the use of the terminal, and the like. Further, the memory 520 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some examples, memory 520 may further include memory located remotely from processor 510, which may be connected to a computer device through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof. The input device 530 may be used to receive input numeric or character information and generate key signal inputs related to user settings and function control of the computer apparatus, and may include a keyboard and a mouse, etc. The output device 540 may include a display device such as a display screen.
EXAMPLE six
The sixth embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program is executed by a processor to implement the method according to any embodiment of the present invention. Of course, the computer-readable storage medium provided in the embodiments of the present invention may perform related operations in a MAC address burning method provided in any embodiment of the present invention. That is, the program when executed by the processor implements:
acquiring a Media Access Control (MAC) interval for burning a plurality of pieces to be tested through test equipment, wherein the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a preset memory;
reading a current address from a memory through a current processing piece to be tested, and burning the current address into a nonvolatile storage unit of the current processing piece to be tested;
and verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning to execute the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated until all pieces to be tested are processed.
From the above description of the embodiments, it is obvious for those skilled in the art that the present invention can be implemented by software and necessary general hardware, and certainly, can also be implemented by hardware, but the former is a better embodiment in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which can be stored in a computer-readable storage medium, such as a floppy disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a FLASH Memory (FLASH), a hard disk or an optical disk of a computer, and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device) to execute the methods according to the embodiments of the present invention.
It should be noted that, in the embodiment of the MAC address burning apparatus, each unit and each module included in the apparatus are only divided according to functional logic, but are not limited to the above division, as long as the corresponding function can be implemented; in addition, specific names of the functional units are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present invention.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims (10)

1. A MAC address burning method is characterized by comprising the following steps:
acquiring a Media Access Control (MAC) interval for burning a plurality of pieces to be tested through test equipment, wherein the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
calculating a check value according to the current address in the MAC interval by the test equipment, and transmitting the MAC interval and the check value to a preset memory;
reading a current address from a memory through a current processing piece to be tested, and burning the current address into a nonvolatile storage unit of the current processing piece to be tested;
and verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning to execute the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated until all pieces to be tested are processed.
2. The method of claim 1, wherein reading the current address from the memory by currently processing the dut comprises:
acquiring a check value corresponding to a current address, which is stored in a preset storage area by the test equipment;
and judging whether the check values stored in the memory and the storage area are consistent, and if so, reading the current address from the memory by currently processing the piece to be detected.
3. The method of claim 2, wherein verifying whether the currently processed dut is successfully programmed with the MAC address according to the programming result comprises:
updating the current address in the memory by using the current address of the current processing to-be-tested piece in burning;
and verifying whether the current processing piece to be tested is successfully burned for the MAC address or not according to the current address in the memory and the current address stored in the storage area.
4. The method of claim 2, wherein verifying whether the currently processed dut is successfully programmed with the MAC address according to the programming result comprises:
acquiring a current address burnt by a current processing piece to be tested, updating the burnt current address by adding 1, and writing the updated current address into the memory through the current processing piece to be tested;
calculating a first check value corresponding to the updated current address in the memory;
adding 1 to the current address stored in the storage area, and updating the current address and the check value in the storage area according to the processing result;
and verifying whether the current to-be-processed piece to be tested is successfully burned for the MAC address according to the consistency of the first check value and the check value in the storage area.
5. The method of claim 2, wherein verifying whether the currently processed dut is successfully programmed with the MAC address according to the programming result comprises:
verifying whether the current address burned in the currently processed piece to be tested is located in the MAC interval or not;
if so, continuously verifying whether the current processing piece to be tested is successfully burned to the MAC address according to the burning result.
6. The method of claim 5, wherein after verifying whether the current address burned in the currently processed dut is within the MAC interval, further comprising:
if not, determining that the current processing piece to be tested fails to burn the MAC address;
adding 1 to the current address stored in the memory, and updating the current address and the check value in the memory according to the processing result;
and adding 1 to the current address stored in the storage area, and updating the current address and the check value in the storage area according to the processing result.
7. The method of claim 1, further comprising, prior to updating the current address and check value in the completion test device and memory:
judging whether the burning process of all the pieces to be tested corresponding to the MAC interval is finished or not;
and if not, taking the currently processed to-be-detected piece away through the mechanical arm, and taking the next to-be-detected piece as the currently processed to-be-detected piece.
8. An apparatus for burning MAC addresses, comprising:
the MAC interval acquisition module is used for acquiring a media access control layer MAC interval for burning a plurality of pieces to be tested through the test equipment, and the MAC interval comprises: a start address, a current address and an end address, the current address being initialized to the start address;
the MAC interval transmission module is used for calculating a check value according to the current address in the MAC interval through the test equipment and transmitting the MAC interval and the check value to a preset memory;
the burning module is used for reading the current address from the memory through the current processing piece to be tested and burning the current address into the nonvolatile memory unit of the current processing piece to be tested;
and the result verification module is used for verifying whether the current processing piece to be tested successfully burns the MAC address according to the burning result, and returning and executing the operation of reading the current address from the memory through the current processing piece to be tested after the current address and the check value in the test equipment and the memory are updated and finished until all pieces to be tested are processed.
9. A computer device, comprising:
one or more processors;
storage means for storing one or more programs;
the one or more programs when executed by the one or more processors cause the one or more processors to implement the MAC address burning method as recited in any one of claims 1-7.
10. A computer-readable storage medium, on which a computer program is stored, which, when executed by a processor, implements the MAC address burning method according to any one of claims 1 to 7.
CN202110327420.0A 2021-03-26 2021-03-26 MAC address burning method, device, equipment and storage medium Pending CN113010190A (en)

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CN113778467A (en) * 2021-08-30 2021-12-10 深圳市拔超科技有限公司 Burning device for MAC address and SN sequence of equipment

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