CN114002245B - Time-resolved single crystal X-ray Laue diffraction target device - Google Patents
Time-resolved single crystal X-ray Laue diffraction target device Download PDFInfo
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- CN114002245B CN114002245B CN202210000530.0A CN202210000530A CN114002245B CN 114002245 B CN114002245 B CN 114002245B CN 202210000530 A CN202210000530 A CN 202210000530A CN 114002245 B CN114002245 B CN 114002245B
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- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
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Abstract
The invention discloses a time-resolved single crystal X-ray laue diffraction target device, which comprises an imaging box with a hollow interior, wherein a focusing and aiming component and an X-ray laue diffraction target component are respectively arranged at the two opposite ends of the imaging box; the imaging box is provided with an optical through hole, and the focusing and aiming assembly is connected outside the optical through hole in a sealing way; the X-ray Laue diffraction target assembly is at least provided with a diffraction hole and a backlight X-ray target, the backlight X-ray target is positioned in an incident light path range outside the diffraction hole and is made of a plurality of layers of metal films, and the K-series or L-series radiation photon energies corresponding to metal elements of the plurality of layers of metal films are similar; wherein, the diffraction hole, the optical through hole and the focusing and aiming component form a complete optical imaging passage. The invention has the characteristics of high time sequence synchronization precision and good time resolution and is sensitive to microstructure change of atomic scale.
Description
Technical Field
The invention relates to the technical field of single crystal X-ray diffraction diagnosis, in particular to a time-resolved single crystal X-ray Laue diffraction target device.
Background
In the process of high-speed impact or detonation, certain plastic deformation can occur in the internal microscopic atomic structures of some single crystal materials, which is represented as the generation of dislocation or twin crystal, and the macroscopic mechanical properties of the single crystal materials can be changed along with the proliferation and evolution of the internal dislocation or twin crystal and other microscopic defects of the single crystal materials, so that the subsequent service performance of the single crystal materials is influenced.
The single crystal material is used as a simpler model system, and the micro mechanism of the plastic deformation inside the single crystal material lays an important foundation for further researching the micro mechanism of the plastic deformation of the powder crystal material. In the related research fields of explosion mechanics, engineering materials and the like, no diagnosis technology for effectively realizing in-situ observation of the microscopic mechanism of the single crystal material in the plastic deformation or phase change process under the extreme conditions of impact and the like exists at present, so that the design of a diagnosis device or method for in-situ observation of the microscopic mechanism of the single crystal material in the plastic deformation or phase change process under the extreme conditions of impact and the like is particularly necessary.
Disclosure of Invention
The invention aims to provide a time-resolved single crystal X-ray Laue diffraction target device, which generates a pulse X-ray light source with quasi-continuous energy spectrum through structural design, realizes time-resolved X-ray Laue diffraction diagnosis of a single crystal material in a laser-driven impact compression or subsequent unloading process, determines the type of microscopic defects in a single crystal at the diagnosis time through transient single crystal X-ray diffraction characteristics, and can obtain single crystal or powder crystal microscopic phase structures with different time delays.
The purpose of the invention is mainly realized by the following technical scheme: the time-resolved single crystal X-ray Laue diffraction target device comprises an imaging box with a hollow interior, wherein a focusing aiming component and an X-ray Laue diffraction target component are respectively arranged at two opposite ends of the imaging box; the imaging box is provided with an optical through hole, and the focusing and aiming assembly is connected outside the optical through hole in a sealing way; the X-ray Laue diffraction target assembly is at least provided with a diffraction hole and a backlight X-ray target, the backlight X-ray target is positioned in an incident light path range outside the diffraction hole and is made of a plurality of layers of metal films, and the energy difference of K-series or L-series radiation photons corresponding to metal elements of the plurality of layers of metal films is less than or equal to 3 keV; wherein, the diffraction hole, the optical through hole and the focusing and aiming component form a complete optical imaging passage.
Based on the technical scheme, the backlight X-ray target comprises an aluminum base layer and a plurality of metal film layers sequentially plated on the aluminum base layer.
Based on the technical scheme, the metal elements on the multi-layer metal film are V, Cr, Fe, Co, Ni, Cu, Zn, Ge and Mo in sequence, and the thickness of each layer of metal film is 0.2-0.4 micrometer.
Based on above technical scheme, X ray laue diffraction target subassembly includes the preceding shield plate with the seamless laminating of formation of image box, and preceding shield plate passes through the X ray target support connection in a poor light X ray target, preceding shield plate swing joint has the locating piece, forms on the locating piece the diffraction hole, still be provided with the laser incidence hole with the diffraction hole intercommunication on the preceding shield plate, laser incidence hole bottom of a hole with form the space of placing of single crystal target between the locating piece.
Based on above technical scheme, diffraction hole and laser incident hole are the toper square hole, and the two is located the one end in placing the space and is square microcephaly end.
Based on the technical scheme, the imaging box is not provided with a focusing aiming component and the inner side of the residual end surface of the X-ray Laue diffraction target component is sequentially provided with an X-ray imaging plate and an X-ray imaging filter disc.
Based on the technical scheme, the X-ray imaging filter disc comprises a hydrocarbon polymer layer and a metal foil layer which are arranged in a stacked mode, and the hydrocarbon polymer layer and the metal foil layer are polished on two sides.
Based on above technical scheme, the focusing subassembly of aiming includes the optical lens support of being connected with the formation of image box, is connected with the optical lens with optics through-hole confined on the optical lens support, and optical lens seals to be connected with the fiber interface, and the center pin of fiber interface and optics through-hole all is located optical lens's optical axis.
Based on above technical scheme, still include the gas circuit system with the inside intercommunication of formation of image box, the gas circuit system is used for the inside air extraction or the gas injection of formation of image box.
Compared with the prior art, the invention has the following beneficial effects: the method has the characteristics of high time sequence synchronization precision and good time resolution, is sensitive to microstructure change of atomic scale, can directly obtain an X-ray diffraction spectrum through single measurement, does not need to improve the signal-to-noise ratio through repeated measurement for many times, greatly saves single crystal samples and experimental times, and can give consideration to both laser interference speed measurement diagnosis and interface radiation temperature diagnosis of a rear interface of a single crystal while not hindering the implementation of time-resolved X-ray diffraction diagnosis on the single crystal.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic cross-sectional view of FIG. 1;
FIG. 3 is a schematic structural diagram of a backlight X-ray target holder and a backlight X-ray target according to the present invention;
FIG. 4 is a schematic structural view of a front shield plate according to the present invention;
FIG. 5 is a schematic cross-sectional view taken along line A-A of FIG. 4;
FIG. 6 is a schematic view of an exploded structure of the imaging cartridge of the present invention;
FIG. 7 is a screw profile of the lens adjustment mechanism;
the names corresponding to the reference numbers in the drawings are as follows: 1. a backlit X-ray target; 2. an X-ray target holder; 3. a front shield plate; 4. a single crystal target; 5. an X-ray imaging plate holder box; 6. an X-ray imaging plate support cover; 7. a device fixing screw hole; 8. a focus-aiming assembly; 9. a diffraction aperture; 10. an optical lens holder; 11. a lens adjusting mechanism; 12. an optical lens; 13. an optical fiber interface; 14. a vent hole; 15. a lower card slot of the X-ray imaging plate; 16. an X-ray imaging plate side clamping groove; 17. a clamping groove on the X-ray imaging plate; 18. an X-axis fine adjustment screw; 19. a Y-axis fine adjustment screw; 20-1, 20-2, 20-3 and Z-axis fine adjustment screws.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.
As shown in fig. 1 and 2, the present embodiment provides a time-resolved single crystal X-ray laue diffraction target device, which comprises an imaging box with a hollow interior, wherein a focusing and aiming assembly 8 and an X-ray laue diffraction target assembly are respectively arranged at two opposite ends of the imaging box; the imaging box is provided with an optical through hole, and the focusing and aiming component 8 is connected outside the optical through hole in a sealing way; the X-ray Laue diffraction target assembly is at least provided with a diffraction hole 9 and a backlight X-ray target 1, the backlight X-ray target 1 is positioned in an incident light path range outside the diffraction hole 9 and is made of a plurality of layers of metal films, and the K-series or L-series radiation photon energies corresponding to metal elements of the plurality of layers of metal films are similar; wherein, the diffraction hole 9, the optical through hole and the focusing and aiming component 8 form a complete optical imaging passage.
An external optical path system provides two groups of high-power pulse lasers with synchronous time sequences, one group of pulse lasers serve as diagnosis light, the other group of pulse lasers serve as loading light, when the single crystal laser device is used, the single crystal target 4 is positioned on the X-ray Laue diffraction target assembly, and the loading light acts on a single crystal sample through the beam uniform-slip lens and the X-ray Laue diffraction target assembly to generate an impact compression process; the diagnostic light acts with the backlight X-ray target 1 through synchronous focusing to generate pulse X-rays, part of the pulse X-rays enter the imaging box to be imaged and are used for performing transient X-ray Laue diffraction diagnosis on a single crystal sample at a specific time delay moment, and the focusing and aiming assembly 8 performs optical imaging on the rear surface or interface of the single crystal target 4 through an optical through hole and is used for laser interference speed measurement diagnosis and interface radiation temperature diagnosis of the rear interface of the single crystal.
As a specific mode of the external optical path system, the external optical path system may select a magic light II upgrading device, and uses the ninth light from the ninth device as the diagnostic light, and uses the fifth light from the remaining eight paths of pulse lasers as the loading light. When the laser is used, the wavelength of loaded light is 351 nm, the pulse waveform is within 2.5 ns of pulse width and is adjustable, and the laser energy is output by more than 260J; the diagnostic light generates pulse X-rays through the action of synchronous focusing and a backlight X-ray target 1, and is used for performing transient X-ray Laue diffraction diagnosis on a single crystal sample at a specific time delay moment, the diagnostic light wavelength is 351 nm, the pulse width is 1-2 ns, and the energy of each path of diagnostic light is about 1000J.
It should be noted that the time-resolved single crystal X-ray laue diffraction target apparatus can be placed in a vacuum environment such as a vacuum target chamber when in use, thereby reducing the influence of air and external light. The single crystal target 4 is mainly composed of an ablation layer and a single crystal sample, wherein the ablation layer is mainly composed of a hydrocarbon polymer material or a hydrocarbon polymer material mixed with medium and high Z elements, such as Polyimide (PI) or polyethylene terephthalate (PET), and has a thickness of about 20 μm; the thickness of the single crystal sample is about 50 microns, and when the single crystal sample is used, the loaded light generates a compression wave through interaction with the ablation layer, and the compression wave compresses the single crystal sample to realize an impact dynamic process.
In specific application, the backlight X-ray target 1 comprises an aluminum base layer and a plurality of metal film layers sequentially plated on the aluminum base layer. The thickness of the aluminum base layer is about 10 microns, the multiple metal films on the aluminum base layer can be sequentially stacked on the aluminum base layer by adopting the processes of electroplating and the like to form an integral film layer structure, the K series or L series radiation photon energies corresponding to the metal elements of the multiple metal films are close to each other, and the difference of the K series or L series radiation photon energies is preferably not more than 3 keV. Specifically, the metal elements on the multi-layer metal film are sequentially V (vanadium), Cr (chromium), Fe (iron), Co (cobalt), Ni (nickel), Cu (copper), Zn (zinc), Ge (germanium), and Mo (molybdenum), the thickness of each metal film is 0.2 to 0.4 μm, when the diagnostic light interacts with the backlight X-ray target 1, characteristic radiation spectra of ten elements including K-system and L-system transition radiation of atoms and helium-like and hydrogen-like radiation spectra of excited-state ions are generated, and these radiations jointly form a pulse X-ray light source with quasi-continuous energy spectrum, and the design structure of the multi-layer film backlight target is used to generate pulse X-ray radiation with quasi-continuous energy spectrum, which is also the key of the time-resolved single crystal dynamic X-ray diffraction technology of the embodiment. Further, each metal film has a thickness of 0.3 μm to make the energy spectrum of the generated pulsed X-ray radiation more continuous.
As shown in fig. 3, 4 and 5, the X-ray laue diffraction target assembly includes a front shielding plate 3 seamlessly attached to the imaging box, the front shielding plate 3 is connected to the backlight X-ray target 1 through a backlight X-ray target support 2, the front shielding plate 3 is movably connected to a positioning block, the diffraction holes 9 are formed in the positioning block, the front shielding plate 3 is further provided with laser incident holes communicated with the diffraction holes 9, and a placing space for the single crystal target 4 is formed between the bottom of the laser incident hole and the positioning block.
The backlight X-ray target support 2 can be made of aluminum or aluminum alloy materials and is used for connecting the backlight X-ray target 1 and the front shielding plate 3, the incident direction of energy spectrum quasi-continuous pulse X-rays is fixed after connection, diagnostic light passes through the energy spectrum quasi-continuous pulse X-rays generated by interaction with the backlight X-ray target 1 and is collimated through the diffraction hole 9, the diffraction hole 9 provides collimation positioning for the energy spectrum quasi-continuous pulse X-rays, the incident light path of X-ray Laue diffraction is determined, the pulse X-rays incident into the diffraction hole 9 serve as collimated light beams for X-ray Laue diffraction diagnosis, and generated diffraction signals are collected and imaged by the imaging box. Furthermore, the diffraction hole 9 and the laser incidence hole are both conical square holes, and the ends of the diffraction hole and the laser incidence hole, which are located in the placing space, are both square small opening ends, so that the measurement range of the X-ray diffraction angle can be limited by setting the taper or the opening size of the diffraction hole and the laser incidence hole. Further, the diffraction holes 9 have a minimum diameter of about 300 microns and an opening angle of about 140 °. Further, the diffraction holes 9 are made of high-density material such as tantalum and tantalum alloy to ensure the collimation effect of the diffraction holes 9, wherein the high-density material may be Ta10W alloy. In particular, during application, the center of the diagnostic light aiming target can be marked on the backlight X-ray target support 2 to position the accuracy of the target shooting position of the diagnostic light, in addition, the backlight X-ray target support 2 should ensure that the X-ray from the backlight X-ray target 1 cannot be blocked or partially blocked by the backlight X-ray target support 2, and if necessary, a hollow structure can be arranged on the backlight X-ray target support 2 to avoid blocking the X-ray.
The front shielding plate 3 is mainly used for shielding the pulse X-rays which are not incident into the diffraction hole 9, and the collection of X-ray diffraction signals by the imaging box is prevented from being directly influenced. Specifically, the front shielding plate 3 may be made of a high-density metal material such as stainless steel, copper alloy, tantalum alloy, or the like, so as to ensure the shielding effect.
With continued reference to FIG. 2, the remaining end faces of the imaging cassette not having the focusing and targeting assembly and the X-ray Laue diffraction target assembly are each provided with an X-ray imaging plate and an X-ray imaging filter in sequence. The pulse X-ray entering the imaging box can be imaged through the X-ray imaging plate after being filtered by the X-ray imaging filter disc.
During the specific application, the whole trapezoidal structure that is of formation of image box, its one end formation opening is used for also being preceding shield plate 3 seamless laminating with X ray laue diffraction target subassembly, and formation of image box residual structure mainly comprises X ray imaging plate support box 5 and X ray imaging plate support lid 6.
Specifically, X ray imaging board support box 5 wholly forms "︺" shape, and its both sides are sealed through the seamless laminating of X ray imaging board support lid 6, and X ray imaging board support box 5 does not set up the both sides inner wall of optics through-hole and the X ray imaging board support lid 6 inner wall of upper and lower both sides still is provided with the X ray imaging board draw-in groove, as shown in figure 6, draw-in groove 15 under the X ray imaging board, draw-in groove 16 on X ray imaging board side and the X ray imaging board go up draw-in groove 17, X ray imaging board and X ray imaging filter can the joint respectively in the draw-in groove of corresponding side, and then realize with convenient quick and stable the being connected of imaging box. Further, any position on the X-ray imaging plate bracket box 5 or the X-ray imaging plate bracket cover 6 can be provided with a device fixing screw hole 7, and the device fixing screw hole 7 can be connected with other connecting pieces through threads, so that the imaging box is fixedly connected and used conveniently.
Specifically, the X-ray imaging filter comprises a hydrocarbon polymer layer and a metal foil layer which are arranged in a stacked mode, and the hydrocarbon polymer layer and the metal foil layer are polished on two sides. The hydrocarbon polymer material is mainly used for filtering beta rays in X rays and the like, the thickness of the hydrocarbon polymer material can be about 100-300 micrometers, and the thickness of the metal foil can be about 10-30 micrometers. Specifically, the material of the metal foil depends on the cut-off energy of the energy spectrum quasi-continuous X-ray pulse at the low energy end, and the metal foil may be aluminum generally, and the thickness is about 10 micrometers.
It should be noted that, in order not to affect the optical imaging, the X-ray imaging plate and the X-ray imaging filter are also provided with through holes at opposite positions on the side where the optical through holes are located, so as to ensure that the optical through holes can normally form the optical path.
With continued reference to fig. 1 and 2, the focus-aiming assembly 8 is primarily used to optically image a polycrystalline target through the optical through-hole and the diffraction hole 9.
During specific application, the focusing and aiming assembly 8 comprises an optical lens support 10 connected with the imaging box, an optical lens 12 for sealing the optical through hole is connected onto the optical lens support 10, an optical fiber interface 13 is connected onto the optical lens 12 in a sealing manner, and the central axes of the optical fiber interface 13 and the optical through hole are both located on the optical axis of the optical lens 12. The optical fiber interface 13, the optical lens 12 and the optical through hole form a complete optical path to perform optical imaging on the rear surface or the interface of the single crystal target 4, so as to perform laser interference speed measurement diagnosis and interface radiation temperature diagnosis on the interface behind the powder crystal through an imaging result. Specifically, the distance between the end face of the optical fiber interface 13 and the optical lens 12 is slightly larger than the focal length of the optical lens 12, so as to ensure that the rear surface or the interface of the powder crystal target seen from the end face of the optical fiber meets the optical imaging relationship through the optical lens 12. Further, the fiber connector 19 may employ a standard FC/APC fiber interface or an SMA interface.
As shown in fig. 7, the focusing and aiming assembly 8 further includes a lens adjusting mechanism 11 disposed on the optical lens holder 10, and both the optical lens 12 and the optical fiber interface 13 are movably connected to the lens adjusting mechanism 11; the lens adjusting mechanism 11 is provided with an X-axis fine adjustment screw 18 and a Y-axis fine adjustment screw 19 which are perpendicular to the optical axis of the optical lens 12, and the X-axis fine adjustment screw 18 and the Y-axis fine adjustment screw 19 are used for adjusting the transverse position and the longitudinal position of the optical lens 12; the lens adjusting mechanism 11 is further provided with at least three Z-axis fine adjustment screws 20-1, 2, and 3, and the at least three Z-axis fine adjustment screws 20-1, 2, and 3 are used for adjusting the pointing direction of the optical lens 12 or the distance between the optical lens 12 and the end face of the optical fiber interface 13.
The lens adjusting mechanism 11 is mainly used for correspondingly adjusting the optical lens 12 and the optical fiber interface 13, and specifically, on the basis of meeting the imaging relationship, the optical lens 12 is subjected to two-dimensional fine adjustment in the transverse direction and the longitudinal direction through the X-axis fine adjustment screw 18 and the Y-axis fine adjustment screw 19, the transverse direction and the longitudinal direction are respectively perpendicular to the optical axis of the optical lens 12, so that the position of the optical lens 12 can be adjusted in a vertical plane to meet different imaging position requirements, any two of the three Z-axis fine adjustment screws 20-1, 20-2 and 20-3 are fixed as needed, the third Z-axis fine adjustment screw is adjusted along the optical axis direction of the optical lens 12 to change the inclination angle of the optical lens 12, the optical axis direction of the optical lens 12 can be finely adjusted, and when the three Z-axis fine adjustment screws 20-1, 20-2 and 20-2 are synchronously adjusted, 20-3, the distance between the optical lens 12 and the end face of the optical fiber interface 13 can be adjusted, so as to change the imaging effect, and the optical lens can be adjusted and used according to specific conditions.
It should be noted that the lens adjusting mechanism 11 is used as an adjusting mechanism for adjusting the position or relative position of the optical lens 12 and the optical fiber interface 13, and the implementation manners in the prior art are various, such as that in patent No. CN200962162Y and the publication named as a five-dimensional adjusting mechanism, and the specific operation principle and the specific structure thereof will not be further described in this embodiment.
With continuing reference to fig. 2, the time-resolved single crystal X-ray laue diffraction target apparatus of the present invention further comprises a gas path system communicated with the inside of the imaging box, wherein the gas path system is used for gas extraction or gas injection inside the imaging box to ensure balance of internal and external gas pressures during gas extraction or gas injection of the cavity inside the imaging box.
Specifically, the air passage system is a vent hole 14 formed in the imaging box in a penetrating manner. Furthermore, the vent hole 14 is communicated with a vent bent pipe, and when the imaging box is used specifically, the vent bent pipe cannot be replaced by a straight pipe, so that the imaging effect of the imaging box is prevented from being influenced by external stray light directly irradiating an X-ray imaging plate in the imaging box.
In summary, the time-resolved polycrystalline X-ray diffraction target device of the present invention has the following beneficial effects: 1) the timing synchronization precision is high, and the timing control precision between the driving laser and the diagnosis X-ray pulse is within hundred picoseconds. 2) The time resolution is good, and the pulse width of the diagnostic X-ray can reach nanosecond or even subnanosecond scale usually. 3) Sensitive to microstructural changes on an atomic scale. 4) The X-ray diffraction spectrum can be directly obtained through single measurement, and the signal-to-noise ratio is not required to be improved through repeated measurement for many times. 5) The laser interference speed measurement diagnosis and the interface radiation temperature diagnosis of the single crystal rear interface can be both considered.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.
Claims (7)
1. The time-resolved single crystal X-ray Laue diffraction target device is characterized by comprising an imaging box with a hollow interior, wherein a focusing and aiming component and an X-ray Laue diffraction target component are respectively arranged at two opposite ends of the imaging box; the imaging box is provided with an optical through hole, and the focusing and aiming assembly is connected outside the optical through hole in a sealing way; the X-ray Laue diffraction target assembly is at least provided with a diffraction hole and a backlight X-ray target, the backlight X-ray target is made of a plurality of layers of metal films, and the energy difference of K-series or L-series radiation photons corresponding to metal elements of the plurality of layers of metal films is less than or equal to 3 keV; wherein, the diffraction hole, the optical through hole and the focusing and aiming component form a complete optical imaging passage;
the backlight X-ray target comprises an aluminum base layer and a plurality of metal film layers sequentially plated on the aluminum base layer;
the metal elements on the multilayer metal film are V, Cr, Fe, Co, Ni, Cu, Zn, Ge and Mo in sequence;
the X-ray Laue diffraction target assembly comprises a front shielding plate in seamless fit with an imaging box, the front shielding plate is connected with the backlight X-ray target through a backlight X-ray target support, a positioning block is movably connected to the front shielding plate, the diffraction holes are formed in the positioning block, laser incident holes communicated with the diffraction holes are further formed in the front shielding plate, a placing space of a single crystal target is formed between the bottom of the laser incident holes and the positioning block, and the single crystal target is composed of an ablation layer and a single crystal sample.
2. The time-resolved single-crystal X-ray laue diffraction target device of claim 1, wherein the thickness of each metal film is 0.2 to 0.4 μm.
3. The time-resolved single-crystal X-ray laue diffraction target device of claim 1, wherein the diffraction aperture and the laser incidence aperture are both tapered square apertures, and both are square aperture ends at an end of the placement space.
4. The time-resolved single-crystal X-ray laue diffraction target apparatus of claim 1, wherein the imaging cartridge is provided with an X-ray imaging plate and an X-ray imaging filter in order inside the remaining end surfaces of the X-ray laue diffraction target assembly and the imaging cartridge without the focusing and aiming assembly.
5. The time-resolved single-crystal X-ray laue diffraction target device of claim 4, wherein the X-ray imaging filter comprises a hydrocarbon polymer layer and a metal foil layer arranged in a stack, both of the hydrocarbon polymer layer and the metal foil layer being double-side polished.
6. The time-resolved single-crystal X-ray laue diffraction target device of claim 1, wherein the focusing and aiming assembly comprises an optical lens holder connected to the imaging box, an optical lens closing the optical through hole is connected to the optical lens holder, an optical fiber interface is connected to the optical lens closing, and the central axes of the optical fiber interface and the optical through hole are located on the optical axis of the optical lens.
7. The time-resolved single crystal X-ray laue diffraction target apparatus of claim 1, further comprising an air path system in communication with the inside of the imaging box, the air path system being used for air extraction or injection inside the imaging box.
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| CN102507620A (en) * | 2011-10-18 | 2012-06-20 | 丹东奥龙射线仪器有限公司 | Device for acquiring crystal diffraction spot |
| CN111307843A (en) * | 2020-03-09 | 2020-06-19 | 中国工程物理研究院激光聚变研究中心 | Metal material dynamic response diagnosis device and method |
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