CN113945134A - Zero drift measuring device and method for sliding micrometer - Google Patents

Zero drift measuring device and method for sliding micrometer Download PDF

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Publication number
CN113945134A
CN113945134A CN202111226436.9A CN202111226436A CN113945134A CN 113945134 A CN113945134 A CN 113945134A CN 202111226436 A CN202111226436 A CN 202111226436A CN 113945134 A CN113945134 A CN 113945134A
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measuring
micrometer
probe
zero
sliding
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CN113945134B (en
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吴浩
汪小刚
田冬成
李秀文
王玉芳
田超
熊乐
张书军
赵春林
王静
熊吉圆
涂寒
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China Institute of Water Resources and Hydropower Research
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China Institute of Water Resources and Hydropower Research
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/02Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/14Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/042Calibration or calibration artifacts

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  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

本发明公开了一种滑动测微计的零飘测定装置,属于岩石工程检测仪器技术领域,包括设有激光测距仪的底座,底座上设有端头正对激光测距仪发射端的测管,测管上设有两个间距可调的测环,测环的中间位置设有供反光装置安装的安装部,反光装置可将激光反射到激光测距仪接收端,底座上设有用于调节滑动测微计探头在测管内轴向位置的微调机构;还公开了一种滑动测微计的零飘测定方法,S1、安放测定装置并静置24小时;S2、通过激光测距仪将两个测环调节出标准间距1m;S3、通过微调机构将探头调至测管中合适位置;并得到测微计电脑显示为1时,两个测环的实际间距L2‑L1,最后得到零飘值L2‑L1‑1,以便校正实际工程所测的数据,并得到真实测距。

Figure 202111226436

The invention discloses a zero drift measurement device of a sliding micrometer, belonging to the technical field of rock engineering detection instruments. There are two measuring rings with adjustable spacing on the measuring tube. The middle position of the measuring ring is provided with a mounting part for the installation of the reflective device. The reflective device can reflect the laser to the receiving end of the laser rangefinder. The invention discloses a fine-tuning mechanism for the axial position of the sliding micrometer probe in the measuring tube; a zero-drift measurement method of the sliding micrometer is also disclosed. S1. Place the measuring device and let it stand for 24 hours; S2. Adjust the standard distance between the two measuring rings to 1m; S3, adjust the probe to the proper position in the measuring tube through the fine-tuning mechanism; and obtain the actual distance L 2 ‑L 1 between the two measuring rings when the micrometer computer displays 1, and finally obtain Zero drift value L 2 ‑L 1 ‑1 in order to correct the data measured in the actual project and obtain the real distance measurement.

Figure 202111226436

Description

Zero drift measuring device and method for sliding micrometer
Technical Field
The invention relates to the technical field of rock engineering detection instruments, in particular to a zero drift determination device of a sliding micrometer and a determination method thereof.
Background
The sliding micrometer is a common device for monitoring the deformation of the surrounding rock, the whole set of device consists of a probe, a cable, a guide rod and a matched reading computer (secondary instrument), the probe extends to the bottom of a surrounding rock measuring hole under the control of the measuring rod, the probe can measure the distance between two copper rings on the measuring hole, the standard distance of the copper rings is 1m, certain errors can exist, the deformation between the two copper rings can be measured section by gradually lifting the probe, and then the final deformation result can be obtained after the deformation of each section is accumulated. In engineering practice, during the long-term use of the monitoring equipment, the conditions of probe wear length change, electronic component performance change, instrument efficacy reduction and the like are inevitably generated, and the factors can cause the error of the whole sliding micrometer measuring system for the standard length (1m), namely the zero drift phenomenon. If there is zero drift, the measurement result will cause error amplification when added segment by segment, and the measurement result will be seriously distorted. Therefore, the relevant regulatory regulations require regular certification of such monitoring instruments, secondary meters. However, the precision of the whole set of equipment of the sliding side micro meter is high, the maintenance difficulty is high, once the sliding side micro meter is detected to have the zero drift problem, the final processing mode is usually only to replace the whole set of system, so that the cost is high, if the specific zero drift value can be measured, after each section of measurement result is obtained by using the sliding side micro meter, the measurement result is subtracted or added with the measured zero drift to obtain real measurement data, and then the sliding side micro meter can be continuously used, so that the cost is reduced.
However, at present, the detection of the slide micrometer in China still remains whether the slide micrometer can carry out measurement, and the measurement of the specific zero drift value of the slide micrometer still remains a blank. For example, the invention patent with the patent number of '201910971697. X' and the name of 'a calibrating device and a calibrating method of a sliding micrometer' discloses a device and a method for determining whether the current state of a probe of the sliding micrometer can be measured and whether the length of the probe changes, wherein the device and the method comprise a shell, a measuring tube, two measuring rings, a humidity-temperature meter, a guide structure, a clamp and a transmission assembly, the two measuring rings are arranged on the measuring tube, the distance value between the two measuring rings is equal to the standard length of the probe, when the probe of the slide micrometer is inserted into the measuring tube and is positioned at the central position between the two measuring tubes, the temperature and the humidity measured by the temperature and humidity thermometer on the display screen of the computer are read, and the actual measurement value on the display screen is the first distance value, so that whether the probe is suitable for the environment and can be measured and whether the length of the probe is changed can be judged. However, the above patent still can only judge whether the probe length has changed, and cannot determine what the specific zero value of the slide micrometer is, and the zero drift of the slide micrometer is generated, and not only because whether the probe has changed, often the conditions such as the performance change of electronic elements, the efficiency reduction of instruments and the like cause the zero drift problem of the slide micrometer, so only the change of the probe length is absorbed, in the actual use process, the probe determination can be carried out, but the finally measured data has a larger error problem.
Disclosure of Invention
The invention aims to solve the technical problems and provides a zero drift measuring device and a zero drift measuring method of a sliding micrometer.
In order to achieve the purpose, the invention provides the following scheme: the invention provides a zero drift measuring device of a sliding micrometer, which comprises a base provided with a laser range finder, wherein a measuring tube with the end head facing to the transmitting end of the laser range finder is arranged on the base, two measuring rings with adjustable intervals are arranged on the measuring tube, an installation part for installing a reflecting device is arranged in the middle of each measuring ring, the reflecting device can reflect laser to the receiving end of the laser range finder, and a fine adjustment mechanism for adjusting the axial position of a probe of the sliding micrometer in the measuring tube is arranged on the base.
Preferably, the laser range finder includes that the top is equipped with the shell of display screen, be equipped with signal processor in the shell, signal processor both ends are connected with laser emitter and light source receiver respectively, be equipped with on the shell respectively with laser emitter the corresponding transmission mouth of light source receiver, receiving port.
Preferably, condenser lenses are arranged between the laser transmitter and the transmitting opening, and between the light source receiver and the receiving opening.
Preferably, the measuring ring is screwed on the measuring tube.
Preferably, the measuring tube is provided with scale marks, and the end heads on the same side of the two measuring rings are provided with mark lines matched with the scale marks.
Preferably, the precision of the thread on the measuring tube and the measuring ring and the precision of the scale mark are both 1 mm.
Preferably, the mounting portion includes an annular groove located in the middle of the measuring ring, and the light reflecting device includes a metal buckle capable of being clamped on the annular groove and a light reflecting plate rotatably connected to the metal buckle.
Preferably, the fine adjustment mechanism comprises a guide assembly, a traction assembly and a transmission assembly, the guide assembly comprises a fixed seat and a guide rod, the guide rod is fixed on the base through the fixed seat, and the guide rod is parallel to the axial direction of the measuring tube; the traction assembly comprises a connecting rod detachably connected with the probe of the sliding micrometer, the connecting rod is coaxially connected with the probe of the sliding micrometer, and the connecting rod is connected to the guide rod in a sliding mode through an adjusting sliding block; the transmission assembly comprises a fine adjustment fixing part and a threaded connection, wherein the fine adjustment fixing part and the threaded connection are fixedly connected to the fixing seat, an adjusting threaded rod is arranged on the fine adjustment fixing part, one end of the adjusting threaded rod is in threaded connection with the adjusting slide block, and a hand wheel is installed at the other end of the adjusting threaded rod.
Preferably, the connecting rod is connected with the probe of the slide micrometer through a buckle.
The zero drift measuring device adopting the sliding micrometer comprises the following steps:
s1, placing the base of the measuring device on the table top of a laboratory, and standing for 24 hours in the environment of the laboratory;
s2, firstly, installing the reflecting device on the measuring ring close to one side of the laser range finder, then starting the laser range finder, reflecting the laser emitted by the emitting end to the receiving end through the reflecting device, and measuring the distance L from the reflecting device to the emitting end1Then the reflecting device is arranged on another measuring ring, and the distance L from the reflecting device to the transmitting end is measured2Then moving the measuring ring with the reflecting device until L is enabled2-L1=1m;
S3, extending the probe of the sliding micrometer into the measuring tube and connecting the probe with the fine adjustment mechanism; then opening and closingA micrometer computer connected with the probe; then, the axial position of the probe in the measuring tube is adjusted through the fine adjustment mechanism, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe is represented to be in a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; if the display number is not 1, synchronously moving the two measuring rings, changing the distance between the two measuring rings until the micrometer computer displays 1, stopping moving the measuring rings, and repeating the operation step of the step 2, wherein L is the moment 2-L1The value of-1 is the zero drift value.
Compared with the prior art, the invention has the following technical effects:
1. the measuring device comprises a laser range finder, a measuring tube with measuring rings and a fine adjustment mechanism, wherein the measuring rings with a standard distance (1m) can be adjusted by the laser range finder, then the fine adjustment mechanism can ensure that a probe is just positioned in the middle of the two measuring rings, and finally the actual distance between the two measuring rings can be obtained by adjusting the distance between the two measuring rings and matching the laser range finder when the sliding micrometer displays the standard distance of 1 m; then, a zero drift specific value can be obtained by comparing the standard distance 1m displayed by the sliding micrometer with the actual distance of the actual measuring ring, and the actual distance measurement can be obtained only by subtracting or adding the corresponding zero drift value from the distance measurement of each section of the subsequent actual sliding micrometer, so that the problem of large error after data accumulation is solved.
2. The laser distance meter is selected for measurement, and compared with any mechanical measurement mode, the measurement precision can be obviously improved.
3. According to the invention, the measuring tube is provided with the scale marks, the end heads on the same side of the two measuring rings are provided with the mark lines, and the positions of the measuring rings on the measuring tube can be effectively known through the matching of the mark lines and the scale marks, so that the distance between the measuring rings can be conveniently adjusted, and the moving distances of the measuring rings are the same when the measuring rings are synchronously moved.
4. The determination method of the present invention is carried out by using a sliding micrometer to display the true ring spacing (L) at a standard distance of 1m2-L1) In contrast to the standard distance of 1m,can obtain specific zero drift value, the method is simple, accurate, and can ignore specifically because the probe length of slip micrometer has appeared changing, still the sensing element has appeared the problem, because what this application measured is the zero drift value that the whole slip micrometer exists, what the calibration is whole slip micrometer has the error, consequently, it has not to know specifically that which part of slip micrometer has appeared the problem, as long as there is zero drift promptly, all can calibrate with the zero drift value that measures, it has appeared the problem to need not to know specifically that which part of slip micrometer has appeared, and also need not to change the whole set of slip micrometer because of having zero drift, show the cost is reduced.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without inventive exercise.
FIG. 1 is a schematic view of a zero drift measurement device of a slide micrometer;
FIG. 2 is a front view of a zero drift measurement device of the slide micrometer;
FIG. 3 is a top view of a zero drift measurement device of the slide micrometer;
FIG. 4 is a schematic view of a reflector;
FIG. 5 is a schematic diagram of the zero drift measurement process of the slide micrometer.
Description of reference numerals: 1. a base; 2. a laser range finder; 3. measuring a tube; 4. measuring a ring; 5. a fine adjustment mechanism; 6. a housing; 7. a signal processor; 8. a laser transmitter; 9. a light source receiver; 10. an electric wire; 11. an emission port; 12. a receiving port; 13. a condenser lens; 14. an annular groove; 15. a metal buckle; 16. a reflector; 17. a measuring tube fixing frame; 18. a guide bar; 19. a fixed seat; 20. finely adjusting the fixing piece; 21. a connecting rod; 22. adjusting the sliding block; 23. a threaded adjusting rod; 24. a hand wheel; 25. a probe.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment provides a zero drift survey device of slide micrometer, as shown in fig. 1 to 5, including base 1, laser range finder 2, survey pipe 3 and fine-tuning 5 arrange along a lateral opposite side of base 1 in proper order, and base 1's effect is the equal level setting of assurance laser range finder 2, survey pipe 3 and fine-tuning 5, therefore base 1's top surface need be the horizontal plane, and preferred base 1 is a rectangle steel sheet. The measuring tube 3 is fixed on the base 1 through a measuring tube fixing frame 17, two ends of the measuring tube 3 respectively face the laser range finder 2 and the fine adjustment mechanism 5, one end of the measuring tube 3 faces the transmitting end of the laser range finder 2, and the material of the measuring tube 3 cannot influence the detection of the probe 25 of the sliding micrometer, so that the preferable measuring tube 3 is a PVC tube, the length is preferably more than 1.2m, and the probe 25 is usually about 1.2 m. Two measuring rings 4 are arranged on the measuring tube 3, and the distance between the two measuring rings 4 is adjustable. The measuring ring 4 is preferably made of metal, preferably copper, so that the probe 25 of the slide micrometer can detect the measuring ring 4. The installation department that supplies the reflect light device to install is all equipped with to every centre of surveying ring 4, can install the reflect light device at the centre of surveying ring 4 through the installation department, the reflect light device can be with the laser reflection of the emission end transmission of laser range finder 2 to the receiving end of laser range finder 2 on, thereby record the distance of the emission end of laser range finder 2 to the reflect light device, the distance of the emission end of laser range finder 2 to surveying ring 4 centre promptly, through installing the reflect light device respectively on the survey ring 4 that is close to laser range finder 2 end and the survey ring 4 of keeping away from laser range finder 2 end, thereby obtain the interval between two survey rings 4, then adjust the interval of two survey rings 4, until adjusting to standard interval (1 m). The fine adjustment mechanism 5 is used for adjusting the axial position of the probe 25 of the sliding micrometer in the measuring tube 3, so that the probe 25 is just positioned between the two measuring rings 4, the distance from the end of the probe 25 to the outermost end of the two measuring rings 4 is equal, after the adjustment is finished, the zero drift measurement of the sliding micrometer can be formally carried out, when the computer display number of the micrometer of the sliding micrometer is 1 (namely, the distance is 1m), no problem exists, zero drift does not exist, and the zero drift measurement can be directly used for engineering measurement. If the number displayed by the micrometer computer is not 1, zero drift exists, the two measuring rings 4 need to be moved towards or away from each other at the same time by the same distance, the distance between the two measuring rings 4 is adjusted until the number displayed by the micrometer computer is 1, the zero drift of the sliding micrometer is measured, then the distance between the two measuring rings 4 is measured by the laser range finder 2, and the zero drift value can be obtained by subtracting 1 m. In the actual engineering, the slide micrometer adds the zero drift value to correct the result to obtain the real measurement result.
Further, in this embodiment, referring to fig. 1 to 5, the laser distance measuring instrument 2 includes a housing 6 having a display screen on the top, a signal processor 7 is installed in the housing 6, two ends of the signal processor 7 are respectively connected to a laser emitter 8 and a light source receiver 9 through wires 10, and the display screen is electrically connected to the signal processor 7 and can display the measured distance. The shell 6 is provided with two openings, one opening faces the laser emitter 8 and is a transmitting opening 11, the other opening faces the light source receiver 9 and is a receiving opening 12, the laser emitter 8 and the transmitting opening 11 form a transmitting end of the laser range finder 2, and the light source receiver 9 and the receiving opening 12 form a receiving end of the laser range finder 2. The laser emitted by the laser emitter 8 can be irradiated on the reflecting device through the emitting opening 11, then the laser can be emitted to the receiving opening 12 through the reflection of the reflecting device, and is irradiated on the light source receiver 9 after passing through the receiving opening 12, and after the processing of the signal processor 7, the distance from the reflecting device to the laser emitter 8 can be displayed on the display screen. A battery can be arranged in the shell 6 of the laser range finder 2, and a power line can be arranged behind the shell 6 and is connected with power supply equipment to supply power for the signal processor 7, the laser transmitter 8 and the light source receiver 9.
Further, in order to ensure the accuracy of the measurement of the laser range finder 2, in this embodiment, a condenser 13 is disposed between the laser emitter 8 and the emitting port 11, and between the light source receiver 9 and the receiving port 12. The laser convergence degree and intensity of emission and reception are improved, the phenomenon that multi-point laser is applied to the light source receiver 9 to cause data confusion and weakening of laser intensity is avoided, and the light source receiver 9 cannot effectively recognize the laser.
In this embodiment, as shown in fig. 1 to 5, the measuring ring 4 is screwed on the measuring pipe 3, and the axial position of the measuring ring 4 on the measuring pipe 3 can be adjusted by rotating the measuring ring 4, so that the distance between the two measuring rings 4 can be adjusted.
Further, in order to adjust the measuring ring 4 conveniently and improve the adjustment precision of the measuring ring 4, referring to fig. 1 to 5, in this embodiment, the adjustment distance of the measuring ring 4 is visualized, i.e. the measuring tube 3 is provided with scale marks along the axis direction thereof, and the end heads of the two measuring rings 4 are respectively provided with mark lines, the mark lines are located at the end heads at the same side of the two measuring rings 4, i.e. the mark lines can be the left end and the right end of the measuring ring 4, and the positions of the measuring rings 4 can be accurately adjusted by identifying the scale marks corresponding to the mark lines, so that the problems that the rotation distance of one measuring ring 4 is large and the rotation distance of one measuring ring 4 is small when the measuring ring 4 needs to be synchronously rotated when the zero drift of the sliding micrometer is measured are avoided.
Further, in this embodiment, the precision of the scale mark on the measuring tube 3 is 1mm, and the thread precision of the measuring ring 4 and the measuring tube 3 is also 1mm, that is, the distance between the two threads is 1 mm. To improve the accuracy of the adjustment of the measuring ring 4.
In this embodiment, referring to fig. 1 to 5, the mounting portion includes an annular groove 14 located in the middle of the measuring ring 4, the light reflecting device includes a metal clip 15 and a light reflecting plate 16, the light reflecting plate 16 is rotatably connected to the metal clip 15 through a rotating shaft so as to adjust the angle of the light reflecting plate 16, so as to reflect the laser emitted by the laser emitter 8 to the light source receiver 9, the metal clip 15 is an arc clip and can be just clipped on the annular groove 14, and after the metal clip 15 is clipped in the annular groove 14, the mounting of the light reflecting plate 16 in the middle of the measuring ring 4 is realized.
In this embodiment, as shown in fig. 1 to 5, the fine adjustment mechanism 5 includes a guide assembly, a traction assembly, and a transmission assembly; the guide assembly comprises two fixing seats 19 and two guide rods 18, the two fixing seats 19 are fixed on the base 1, the two guide rods 18 are fixed on the two fixing seats 19, and the two guide rods 18 are parallel to the axis direction of the measuring tube 3. The traction assembly comprises a connecting rod 21 and an adjusting slide block 22, the adjusting slide block 22 is connected to the two guide rods 18 in a sliding mode, the connecting rod 21 is fixed on the adjusting slide block 22, the end of the connecting rod 21 is coaxially fixed with a probe 25 of a sliding micrometer extending into the measuring tube 3, and the connecting rod 21 is driven to move along the axis direction of the measuring tube 3. The transmission assembly comprises a fine adjustment fixing piece 20 and a thread adjusting rod 23, and the fine adjustment fixing piece 20 is fixedly connected to a fixing seat 19 far away from the measuring tube 3; one end of the threaded adjusting rod 23 is connected to the adjusting slider 22 in a threaded manner, the other end of the threaded adjusting rod is connected to the fine adjustment fixing member 20 in a rotating manner and extends out of the fine adjustment fixing member 20, and a hand wheel 24 is fixed on the end of the fine adjustment fixing member 20. The probe 25 of the sliding micrometer extends into the measuring tube 3 from one end provided with the laser range finder 2, then the hand wheel 24 is rotated after the probe extends out from the other end, the adjusting slide block 22 moves towards the probe 25, the connecting rod 21 is fixed after approaching the probe 25, then the hand wheel 24 is continuously rotated, the probe 25 is driven to retract into the measuring tube 3 through the connecting rod 21, and adjustment is carried out as required.
Further, in this embodiment, the connecting rod 21 is connected with the probe 25 of the slide micrometer through the buckle, and the buckle mode is easy to detach and install, and can effectively improve the measuring efficiency.
The present embodiment provides a method for measuring zero drift of a sliding micrometer, as shown in fig. 1 to 5, in which the zero drift measuring apparatus using the sliding micrometer includes the following steps:
s1, placing the base 1 of the measuring device on a table top of a laboratory, and standing for 24 hours in the environment of the laboratory; so that the environment in the measuring tube 3 is the same as the environment in the laboratory, and the influence of environmental factors on the sensing element of the slide micrometer is avoided;
s2, firstly, installing a light reflecting device on the measuring ring 4 close to one side of the laser range finder 2, then starting the laser range finder 2, emitting laser from the emitting end of the laser range finder 2 to strike the light reflecting device, reflecting the laser to the receiving end of the laser range finder 2 by the light reflecting device, and enabling the laser to be reflected to the receiving end of the laser range finder 2The distance L from the reflecting device to the transmitting end is measured by the distance measuring instrument 21I.e. the distance L from the midpoint of the measuring ring 4 to the transmitting end of the laser distance measuring instrument 21Then the reflecting device is arranged on the other measuring ring 4, and the distance L from the reflecting device to the transmitting end is measured2I.e. the distance L from the midpoint of the other measuring ring 4 to the emitting end of the laser distance measuring device 2 2Then the measuring ring 4 close to the laser distance measuring device 2 is kept still, and only the measuring ring 4 with the reflecting device is moved until L is enabled2-L1Stop when 1 m;
s3, extending the probe 25 of the slide micrometer into the measuring tube 3 and connecting with the fine adjustment mechanism 5; then, a micrometer computer connected with the probe 25 is turned on, the axial position of the probe 25 in the measuring tube 3 is adjusted through the fine adjustment mechanism 5, and when a row of position indicating lamps on the micrometer computer are completely turned off, the probe 25 is represented to be in a proper position; at this time, if the number on the display of the micrometer computer is 1, the null shift is 0, and the measurement is finished; if the display number is not 1, synchronously moving the two measuring rings 4, needing to ensure that the moving distances of the two measuring rings 4 are the same, changing the distance between the two measuring rings 4 until the micrometer computer displays 1, stopping moving the measuring rings 4, and repeating the operation step of the step 2, wherein L is the time2-L1The value of-1 is the zero drift value.
After the zero drift finger is obtained, in the measurement in the subsequent actual engineering, the real distance measurement of each section can be obtained only by subtracting or adding the zero drift value to each section of measurement data of the sliding side micrometer, so that the error problem caused by the zero drift of the accumulated real distance measurement can be avoided.
The principle and the implementation mode of the invention are explained by applying a specific example, and the description of the embodiment is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, the specific embodiments and the application range may be changed. In view of the above, the present disclosure should not be construed as limiting the invention.

Claims (10)

1.一种滑动测微计的零飘测定装置,其特征在于,包括设有激光测距仪的底座,所述底座上设有端头正对所述激光测距仪的发射端的测管,所述测管上设有两个间距可调的测环,所述测环的中间位置设有供反光装置安装的安装部,所述反光装置可将激光反射到所述激光测距仪的接收端,所述底座上设有用于调节所述滑动测微计的探头在所述测管内部轴向位置的微调机构。1. the zero-drift measuring device of a sliding micrometer, is characterized in that, comprises the base that is provided with laser range finder, and described base is provided with the measuring tube that end is facing the transmitting end of described laser range finder, The measuring tube is provided with two measuring rings with adjustable spacing, and the middle position of the measuring ring is provided with a mounting part for the installation of a reflective device, and the reflective device can reflect the laser light to the receiver of the laser range finder. The base is provided with a fine adjustment mechanism for adjusting the axial position of the probe of the sliding micrometer inside the measuring tube. 2.根据权利要求1所述的一种滑动测微计的零飘测定装置,其特征在于,所述激光测距仪包括顶部设有显示屏的外壳,所述外壳内设有信号处理器,所述信号处理器两端分别连接有激光发射器和光源接收器,所述外壳上设有分别与所述激光发射器、所述光源接收器相对应的发射口、接收口。2. The zero-drift measuring device of a sliding micrometer according to claim 1, wherein the laser range finder comprises a casing with a display screen on the top, and a signal processor is arranged in the casing, Two ends of the signal processor are respectively connected with a laser transmitter and a light source receiver, and the shell is provided with a transmitter port and a receiver port corresponding to the laser transmitter and the light source receiver respectively. 3.根据权利要求2所述的一种滑动测微计的零飘测定装置,其特征在于,所述激光发射器与所述发射口、所述光源接收器与所述接收口之间均设有聚光镜。3. The zero-drift measuring device of a sliding micrometer according to claim 2, wherein the laser transmitter and the emission port, the light source receiver and the receiving port are all provided with There is a condenser lens. 4.根据权利要求1所述的一种滑动测微计的零飘测定装置,其特征在于,所述测环螺纹连接在所述测管上。4 . The zero drift measuring device of a sliding micrometer according to claim 1 , wherein the measuring ring is threadedly connected to the measuring tube. 5 . 5.根据权利要求4所述的一种滑动测微计的零飘测定装置,其特征在于,所述测管上设有刻度线,两个所述测环同侧的端头上均设有与所述刻度线配合的标记线。5. The zero-drift measuring device of a sliding micrometer according to claim 4, wherein the measuring tube is provided with a scale line, and the ends on the same side of the two measuring rings are provided with Marker lines that match the tick marks. 6.根据权利要求5所述的一种滑动测微计的零飘测定装置,其特征在于,所述测管和所述测环上的螺纹精度以及所述刻度线的精度均为1mm。6 . The zero drift measuring device of a sliding micrometer according to claim 5 , wherein the precision of the thread on the measuring tube and the measuring ring and the precision of the scale line are both 1 mm. 7 . 7.根据权利要求1所述的一种滑动测微计的零飘测定装置,其特征在于,所述安装部包括位于所述测环中间位置的环形凹槽,所述反光装置包括可卡在所述环形凹槽上的金属卡扣、转动连接在所述金属卡扣上的反光板。7 . The zero-drift measuring device of a sliding micrometer according to claim 1 , wherein the mounting part comprises an annular groove located in the middle of the measuring ring; The metal buckle on the annular groove and the reflective plate rotatably connected to the metal buckle. 8.根据权利要求1所述的一种滑动测微计的零飘测定装置,其特征在于,所述微调机构包括导向组件、牵引组件以及传动组件,所述导向组件包括固定座和导向杆,所述导向杆通过所述固定座固定在所述底座上,所述导向杆平行于所述测管的轴线方向;所述牵引组件包括与所述滑动测微计的探头可拆卸连接的连接杆,所述连接杆与所述滑动测微计的探头同轴连接,所述连接杆通调节滑块滑动连接在所述导向杆上;所述传动组件包括固定连接在所述固定座上的微调固定件、螺纹连接在所述微调固定件上的调节螺纹杆,所述调节螺纹杆一端螺纹连接在所述调节滑块上,所述调节螺纹杆的另一端安装有手轮。8 . The zero drift measuring device of a sliding micrometer according to claim 1 , wherein the fine adjustment mechanism comprises a guide assembly, a traction assembly and a transmission assembly, and the guide assembly includes a fixed seat and a guide rod, 9 . The guide rod is fixed on the base through the fixing seat, and the guide rod is parallel to the axis direction of the measuring tube; the traction assembly includes a connecting rod detachably connected with the probe of the sliding micrometer , the connecting rod is coaxially connected with the probe of the sliding micrometer, and the connecting rod is slidably connected to the guide rod through the adjusting slider; the transmission assembly includes a fine adjustment fixedly connected to the fixed seat A fixing piece, an adjusting threaded rod screwed on the fine adjustment fixing piece, one end of the adjusting threaded rod is screwed on the adjusting slider, and the other end of the adjusting threaded rod is installed with a hand wheel. 9.根据权利要求8所述的一种滑动测微计的零飘测定装置,其特征在于,所述连接杆通过卡扣与所述滑动测微计的探头连接。9 . The device for measuring zero drift of a sliding micrometer according to claim 8 , wherein the connecting rod is connected to the probe of the sliding micrometer through a buckle. 10 . 10.一种滑动测微计的零飘测定方法,采用了如权利要求1-9任意一项所述的一种滑动测微计的零飘测定装置,其特征在于,包括以下步骤:10. A zero-drift measuring method of a sliding micrometer, adopting the zero-drift measuring device of a sliding micrometer according to any one of claims 1-9, it is characterized in that, comprises the following steps: S1、将所述测定装置的底座放在试验室的桌面上,并在试验室环境中静置24小时;S1, place the base of the measuring device on the desktop of the laboratory, and leave it to stand for 24 hours in the laboratory environment; S2、先将所述反光装置安装在靠近所述激光测距仪一侧的测环上,然后开启所述激光测距仪,通过所述反光装置将所述发射端发出的激光反射到所述接收端,测出所述反光装置到所述发射端的距离L1,然后将所述反光装置安装在另一个测环上,测出所述反光装置到所述发射端的距离L2,然后移动此时安装有所述反光装置的测环,直至使L2-L1=1m;S2. First install the reflective device on the measuring ring near the side of the laser range finder, then turn on the laser range finder, and reflect the laser light emitted by the transmitting end to the laser range finder through the reflective device At the receiving end, measure the distance L 1 from the reflecting device to the transmitting end, then install the reflecting device on another measuring ring, measure the distance L 2 between the reflecting device and the transmitting end, and then move the When installing the measuring ring with the reflective device, until L 2 -L 1 =1m; S3、将所述滑动测微计的探头伸入所述测管中并与所述微调机构连接;然后打开与所述探头连接的测微计电脑;然后通过所述微调机构调节所述探头在所述测管内的轴向位置,当所述测微计电脑上的一排位置指示灯全灭时,代表所述探头到了合适位置;此时,若测微计电脑的显示器上的数字为1,则零飘为0,结束测定;若显示数字不为1,则同步移动两个所述测环,改变两个所述测环的间距,直至所述测微计电脑显示1时,停止移动所述测环,然后重复步骤2的操作步骤,此时L2-L1-1的数值即为零飘值。S3. Extend the probe of the sliding micrometer into the measuring tube and connect it with the fine-tuning mechanism; then open the micrometer computer connected to the probe; then adjust the probe in the fine-tuning mechanism through the fine-tuning mechanism. For the axial position in the measuring tube, when a row of position indicators on the micrometer computer are all off, it means that the probe has reached the appropriate position; at this time, if the number on the display of the micrometer computer is 1 , the zero drift is 0, and the measurement is ended; if the displayed number is not 1, move the two measuring rings synchronously, and change the distance between the two measuring rings, until the micrometer computer displays 1, stop moving Then repeat the operation steps of step 2, and the value of L 2 -L 1 -1 is zero drift value at this time.
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