CN113934194A - Testing device and testing method for DIO interface of industrial personal computer - Google Patents
Testing device and testing method for DIO interface of industrial personal computer Download PDFInfo
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- CN113934194A CN113934194A CN202111127945.6A CN202111127945A CN113934194A CN 113934194 A CN113934194 A CN 113934194A CN 202111127945 A CN202111127945 A CN 202111127945A CN 113934194 A CN113934194 A CN 113934194A
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- 238000010923 batch production Methods 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
- G05B19/0425—Safety, monitoring
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Abstract
The invention relates to a testing device and a testing method for a DIO interface of an industrial personal computer, wherein the testing device for the DIO interface of the industrial personal computer comprises the following components: the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port and an NPN status indicator lamp, and the NPN test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer; the PNP test circuit comprises a PNP test port and a PNP status indicator lamp, and the PNP test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer; the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation unit is electrically connected with the PNP test circuit. Through the setting, the problems that the existing DIO interface is not intuitive to test and inconvenient to use can be solved.
Description
Technical Field
The invention relates to the technical field of industrial personal computers, in particular to a testing device and a testing method for a DIO interface of an industrial personal computer.
Background
In the field of industrial personal computers, a DIO (digital input/output) port is widely used on the industrial personal computer; the user can develop the module corresponding to the software driver by himself according to the DIO port characteristics.
In the traditional test, input and output are short-circuited generally, and a command line is used for knocking codes to carry out transceiving test, and the test mode is not intuitive and is inconvenient to use.
Disclosure of Invention
In order to solve the technical problems, the invention aims to provide a testing device and a testing method for a DIO interface of an industrial personal computer.
In order to achieve one of the above objects, an embodiment of the present invention provides a testing apparatus for a DIO interface of an industrial personal computer, including:
the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port and an NPN status indicator lamp, the NPN test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the NPN status indicator lamp is turned on when the input of the NPN test port is low level; the PNP test circuit comprises a PNP test port and a PNP status indicator lamp, the PNP test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the PNP status indicator lamp is turned on when the input of the PNP test port is high level;
the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation and control unit is electrically connected with the PNP test circuit.
As a further improvement of an embodiment of the present invention, the main control unit further includes a software debugging window interface, where the software debugging window interface includes an NPN test button and a PNP test button; the NPN test button is in signal connection with the NPN regulation and control unit; the PNP test button is in signal connection with the PNP regulation and control unit.
As a further improvement of an embodiment of the present invention, the software debugging window interface further includes a first DIO voltage writing unit and a second DIO voltage writing unit;
the first DIO voltage writing unit is positioned at the NPN test button and used for writing voltage data into the NPN test port;
the second DIO voltage writing unit is located at the position of the PNP test button and used for writing voltage data into the PNP test port.
As a further improvement of an embodiment of the present invention, the first DIO voltage writing unit includes a first data writing frame, a first data writing button; the first data writing frame is used for setting a low level numerical value by a user, and the first data writing button is used for confirming by the user;
the second DIO voltage writing unit comprises a second data writing frame and a second data writing button; the second data writing box is used for setting a high level value by a user, and the second data writing button is used for confirming by the user.
As a further improvement of an embodiment of the present invention, the NPN test circuit includes 8 sets of the NPN test port and the NPN status indicator lamp;
the PNP test circuit comprises 8 groups of PNP test ports and PNP status indicator lamps.
As a further improvement of an embodiment of the present invention, the NPN test circuit further includes 8 first voltage dividing resistors, which are electrically connected to the 8 NPN status indicator lamps, respectively;
the PNP test circuit further comprises 8 second voltage-dividing resistors which are electrically connected with the 8 PNP state indicating lamps respectively.
As a further improvement of an embodiment of the present invention, the NPN status indicator lamp and the PNP status indicator lamp are both LED indicator lamps.
As a further improvement of an embodiment of the present invention, the test fixture further includes a 12V power interface, a power indicator, for connecting a power supply and displaying a power-on state.
As a further improvement of an embodiment of the present invention, the test fixture is a handheld test fixture.
An embodiment of the present invention further provides a method for testing a DIO interface of an industrial personal computer, based on the device for testing a DIO interface of an industrial personal computer, the method including:
step A: electrically connecting the test fixture with a DIO interface to be tested of the industrial personal computer, and connecting a power supply;
and B: opening the software debugging window interface, and selecting an NPN test mode or a PNP test mode;
when an NPN test mode is selected, writing a low level value in the first data writing frame, clicking a first data writing button for confirmation, and observing whether the NPN status indicator lamp is lightened;
when the PNP test mode is selected, writing a high level value in the second data writing frame, clicking a second data writing button for confirmation, and observing whether the PNP state indicator lamp is lightened.
Compared with the prior art, the invention has the beneficial effects that:
arranging a test fixture and a main control unit in a test device of a DIO interface of an industrial personal computer; in the test fixture, the NPN test mode and the PNP test mode are integrated on one test fixture according to the two working modes of the DIO interface, so that the operation is convenient; in the main control unit, an NPN regulation and control unit and a PNP regulation and control unit are used for selecting a test mode;
when the NPN test mode is selected, the NPN test port is electrically connected with a DIO interface to be tested, and the NPN status indicator lamp is used for indicating a detection result;
when the PNP test mode is selected, the PNP test port is used for being electrically connected with a DIO interface to be tested, and the PNP state indicator lamp is used for indicating a detection result;
therefore, the main control unit selects the test mode, and the test fixture carries out specific test and result display, so that the DIO interface of the industrial personal computer can be visually and quickly detected, and the detection working efficiency is improved; meanwhile, the detection mode is simple and effective, the test result is visual, and the method is suitable for batch production.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings used in the embodiments or the description of the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is a schematic structural distribution diagram of a test fixture according to an embodiment of the present invention;
FIG. 2 is a schematic plan view of a software debugging window interface in an embodiment of the invention;
FIG. 3 is a schematic circuit diagram of an NPN test circuit according to an embodiment of the present invention;
fig. 4 is a schematic circuit diagram of a PNP test circuit according to an embodiment of the present invention.
Wherein the reference numbers referred to in the figures are as follows:
the NPN test terminal 110, the NPN status indicator lamp 111, the PNP test terminal 120, the PNP status indicator lamp 121, the second voltage-dividing resistor 122, the 12V power interface 130, the power indicator lamp 131, the NPN test button 210, the first data write-in button 211, the PNP test button 220 and the LED lamp command line 25.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be described in detail and completely with reference to the following detailed description of the invention and the accompanying drawings. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.
As shown in fig. 1 to fig. 2, an embodiment of the present invention provides a testing apparatus for a DIO interface of an industrial personal computer, including:
the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port 110 and an NPN status indicator lamp 111, wherein the NPN test port 110 is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the NPN status indicator lamp 111 is turned on when the input of the NPN test port 110 is at a low level; the PNP test circuit comprises a PNP test port 120 and a PNP status indicator lamp 121, the PNP test port 120 is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and when the input of the PNP test port 120 is in a high level, the PNP status indicator lamp 121 is turned on;
the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation unit is electrically connected with the PNP test circuit.
Specifically, a test fixture and a main control unit are arranged in a test device of a DIO interface of an industrial personal computer; in the test fixture, the NPN test mode and the PNP test mode are integrated on one test fixture according to the two working modes of the DIO interface, so that the operation is convenient; in the main control unit, an NPN regulation and control unit and a PNP regulation and control unit are used for selecting a test mode;
when the NPN test mode is selected, the NPN test port 110 is used to electrically connect with a DIO interface to be tested, and the NPN status indicator lamp 111 is used to indicate a detection result;
when the PNP test mode is selected, the PNP test port 120 is used to electrically connect to a DIO interface to be tested, and the PNP status indicator lamp 121 is used to indicate a detection result;
therefore, the main control unit selects the test mode, and the test fixture carries out specific test and result display, so that the DIO interface of the industrial personal computer can be visually and quickly detected, and the detection working efficiency is improved; meanwhile, the detection mode is simple and effective, the test result is visual, and the method is suitable for batch production.
In practical use, the testing device designs NPN and PNP testing items according to two working modes of DIO, integrates the two modules into a testing jig, and is convenient to operate.
Further, the main control unit further comprises a software debugging window interface, wherein the software debugging window interface comprises an NPN test button 210 and a PNP test button 220; the NPN test button 210 is in signal connection with the NPN regulation and control unit; the PNP test button 220 is in signal connection with the PNP regulation unit.
In practical use, according to two working modes of DIO, the principle is as follows:
as shown in fig. 3, in the NPN mode, when the DO terminal gives a low level through software or the like, the LED lights up;
as shown in fig. 4, in the PNP mode, when the DO terminal gives a high level through software or the like, the LED lights up;
as shown in fig. 2, the testing can be performed through a DIO software debug window.
Furthermore, the software debugging window interface also comprises a first DIO voltage writing unit and a second DIO voltage writing unit;
the first DIO voltage writing unit is located at the position of the NPN test button 210, and is configured to write voltage data for the NPN test port 110;
the second DIO voltage writing unit is located at the location of the PNP test button 220 for writing voltage data for the PNP test port 120.
In actual use, firstly, a test software is started, and a corresponding test mode, NPN or PNP mode is selected; then, voltage data of the corresponding status indicator lamp is set.
Therefore, voltage data can be written and tested by self.
Further, the first DIO voltage writing unit includes a first data writing frame, a first data writing button 211; the first data write box is used for setting a low level value by a user, and the first data write button 211 is used for confirmation by the user;
the second DIO voltage writing unit comprises a second data writing frame and a second data writing button; the second data write box is used for setting a high level value by a user, and the second data write button is used for confirming by the user.
In actual operation, when voltage data of the status indicator lamp corresponding to each test mode is set, NPN writes "0" (i.e., after the first data write frame is filled with "0" and the first data write button 211 is clicked), the LED lights; the PNP writes a "1" (i.e., the second data write box fills in a "1", and after clicking the second data write button), the LED will light up.
Therefore, the condition of each DIO interface on the industrial personal computer is tested by observing whether the LED corresponding to the DIO interface is on or not.
Further, the NPN test circuit comprises 8 groups of NPN test ports and NPN status indicator lamps;
the PNP test circuit comprises 8 groups of PNP test ports and PNP status indicator lamps.
Further, the NPN status indicator 111 and the PNP status indicator 121 are both LED indicators.
In actual use, 8 sets of LED circuits are designed according to the characteristics of 8 sets of DIO ports, and the LEDs of the corresponding ports can be lightened through the level sent out by software.
In actual operation, multiple sets or single sets of interfaces may be tested simultaneously.
Further, the NPN test circuit also comprises 8 first voltage dividing resistors which are respectively electrically connected with the 8 NPN status indicator lamps;
the PNP test circuit also comprises 8 second voltage-dividing resistors which are respectively electrically connected with the 8 PNP status indicator lamps.
Therefore, each status indicator lamp is guaranteed to be normally powered and can normally work.
Further, the test fixture further comprises a 12V power interface 130 and a power indicator 131, which are used for connecting a power supply and displaying a power-on state.
Furthermore, the test fixture is a handheld test fixture.
In actual use, after the test fixture is inserted into a DIO port of the industrial personal computer, the power supply can be switched on to carry out normal detection.
The handheld test fixture is convenient to carry and use.
The invention also provides a testing method of the DIO interface of the industrial personal computer, which is based on the testing device of the DIO interface of the industrial personal computer, and the method comprises the following steps:
step A: electrically connecting the test fixture with a DIO interface to be tested by the industrial personal computer, and connecting a power supply;
and B: opening a software debugging window interface, and selecting an NPN test mode or a PNP test mode;
when the NPN test mode is selected, writing a low level value in the first data writing frame, clicking the first data writing button 211 for confirmation, and observing whether the NPN status indicator lamp 111 is lit;
when the PNP test mode is selected, a high level value is written in the second data writing frame, the second data writing button is clicked to confirm, and whether the PNP status indicator lamp 121 is lit or not is observed.
In actual operation, the test method is as follows:
1. inserting the jig on a DIO port of an industrial personal computer, and switching on a power supply;
2. opening the testing software, and selecting a corresponding testing mode, NPN or PNP;
3. setting corresponding LED lamp group data; NPN writes '0', LED lights; PNP writes into '1', LED lights; multiple groups or groups may be tested;
4. after setting, click the "write" button to see whether the LED corresponding to the DIO port is on.
It should be understood that although the present description refers to embodiments, not every embodiment contains only a single technical solution, and such description is for clarity only, and those skilled in the art should make the description as a whole, and the technical solutions in the embodiments can also be combined appropriately to form other embodiments understood by those skilled in the art.
The above-listed detailed description is only a specific description of a possible embodiment of the present invention and is not intended to limit the scope of the present invention, and equivalent embodiments or modifications made without departing from the technical spirit of the present invention are included in the scope of the present invention.
Claims (10)
1. The utility model provides a testing arrangement of industrial computer DIO interface which characterized in that includes:
the testing jig comprises an NPN testing circuit and a PNP testing circuit; the NPN test circuit comprises an NPN test port and an NPN status indicator lamp, the NPN test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the NPN status indicator lamp is turned on when the input of the NPN test port is low level; the PNP test circuit comprises a PNP test port and a PNP status indicator lamp, the PNP test port is used for being electrically connected with a DIO interface to be tested of the industrial personal computer, and the PNP status indicator lamp is turned on when the input of the PNP test port is high level;
the main control unit is electrically connected with the test fixture; the main control unit comprises an NPN regulation and control unit and a PNP regulation and control unit; the NPN regulation and control unit is electrically connected with the NPN test circuit; the PNP regulation and control unit is electrically connected with the PNP test circuit.
2. The device for testing the DIO interface of the industrial personal computer according to claim 1, wherein the main control unit further comprises a software debugging window interface, and the software debugging window interface comprises an NPN test button and a PNP test button; the NPN test button is in signal connection with the NPN regulation and control unit; the PNP test button is in signal connection with the PNP regulation and control unit.
3. The device for testing the DIO interface of the industrial personal computer according to claim 2, wherein the software debugging window interface further comprises a first DIO voltage writing unit and a second DIO voltage writing unit;
the first DIO voltage writing unit is positioned at the NPN test button and used for writing voltage data into the NPN test port;
the second DIO voltage writing unit is located at the position of the PNP test button and used for writing voltage data into the PNP test port.
4. The device for testing the DIO interface of the industrial personal computer according to claim 3, wherein the first DIO voltage writing unit comprises a first data writing frame and a first data writing button; the first data writing frame is used for setting a low level numerical value by a user, and the first data writing button is used for confirming by the user;
the second DIO voltage writing unit comprises a second data writing frame and a second data writing button; the second data writing box is used for setting a high level value by a user, and the second data writing button is used for confirming by the user.
5. The device for testing the DIO interface of the industrial personal computer according to claim 4, wherein the NPN test circuit comprises 8 sets of NPN test ports and NPN status indicator lamps;
the PNP test circuit comprises 8 groups of PNP test ports and PNP status indicator lamps.
6. The device for testing the DIO interface of the industrial personal computer according to claim 5, wherein the NPN test circuit further comprises 8 first voltage-dividing resistors which are electrically connected with the 8 NPN status indicator lamps respectively;
the PNP test circuit further comprises 8 second voltage-dividing resistors which are electrically connected with the 8 PNP state indicating lamps respectively.
7. The device for testing the DIO interface of the industrial personal computer of claim 4, wherein the NPN status indicator lamp and the PNP status indicator lamp are both LED indicator lamps.
8. The device for testing the DIO interface of the industrial personal computer according to claim 4, wherein the test fixture further comprises a 12V power interface and a power indicator lamp, and the power interface and the power indicator lamp are used for being connected with a power supply and displaying the power-on state.
9. The device for testing the DIO interface of the industrial personal computer of claim 4, wherein the testing jig is a handheld testing jig.
10. A method for testing a DIO interface of an industrial personal computer, which is based on the device for testing the DIO interface of the industrial personal computer according to any one of the claims 4 to 9, and comprises the following steps:
step A: electrically connecting the test fixture with a DIO interface to be tested of the industrial personal computer, and connecting a power supply;
and B: opening the software debugging window interface, and selecting an NPN test mode or a PNP test mode;
when an NPN test mode is selected, writing a low level value in the first data writing frame, clicking a first data writing button for confirmation, and observing whether the NPN status indicator lamp is lightened;
when the PNP test mode is selected, writing a high level value in the second data writing frame, clicking a second data writing button for confirmation, and observing whether the PNP state indicator lamp is lightened.
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