CN113918396B - System, method, device and medium for testing touch panel - Google Patents

System, method, device and medium for testing touch panel Download PDF

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Publication number
CN113918396B
CN113918396B CN202111165051.6A CN202111165051A CN113918396B CN 113918396 B CN113918396 B CN 113918396B CN 202111165051 A CN202111165051 A CN 202111165051A CN 113918396 B CN113918396 B CN 113918396B
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touch panel
connector
control unit
tested
micro control
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CN113918396A (en
Inventor
蔡烈波
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Inspur Shandong Computer Technology Co Ltd
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Inspur Shandong Computer Technology Co Ltd
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Priority to CN202111165051.6A priority Critical patent/CN113918396B/en
Publication of CN113918396A publication Critical patent/CN113918396A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test input/output devices or peripheral units
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0416Control or interface arrangements specially adapted for digitisers

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Human Computer Interaction (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The application discloses a system, a method, a device and a medium for testing a touch pad, comprising the following steps: the touch panel comprises a touch panel to-be-tested part, a micro control unit and an indicating circuit, wherein one end of the micro control unit is connected with the touch panel to-be-tested part, the other end of the micro control unit is connected with the indicating circuit, the micro control unit sends a detection signal to the touch panel to-be-tested part when acquiring a trigger signal, acquires a return signal of the touch panel to-be-tested part, judges whether the return signal of the touch panel to-be-tested part meets a preset condition, if yes, determines that the touch panel is abnormal in function, and controls the indicating circuit to be connected with a power supply. Therefore, according to the technical scheme provided by the invention, the micro control unit is utilized to send the detection signal to the part to be tested of the touch panel, and whether the return signal of the part to be tested of the touch panel meets the preset condition is judged to detect whether the function of the touch panel is abnormal or not, so that the time for starting up and waiting for entering a test interface when the touch panel is tested by the traditional tool is saved, and the test efficiency of the touch panel to be tested is improved.

Description

System, method, device and medium for testing touch panel
Technical Field
The present disclosure relates to the field of computer control technologies, and in particular, to a system, a method, an apparatus, and a medium for testing a touch pad.
Background
The touch pad is an input device for controlling a pointer of an electronic device by using finger movement of a user, and is widely applied to various fields such as vehicle-mounted touch screens, medical touch screens, educational touch screens, tablet computers and the like along with continuous development of the Internet. At present, for testing whether the function of a touch pad is normal, a PC tool is required to be built, wherein the PC tool comprises a PC main board and touch pad equipment, one end of the touch pad to be tested is connected with the PC main board, the other end of the touch pad is connected with the touch pad equipment, whether left and right keys of the touch pad to be tested are normal and effective, whether short circuit exists between pins of a connector and whether normal conduction between the connector and the connector can be achieved is required, and whether the function of the touch pad to be tested is normal is further determined.
Setting up a PC frock and testing the touch panel function, need to start up the PC mainboard and wait to get into the test interface, the test is over, still need to shut down the PC frock and avoid appearing electrified plug and lead to touch panel function abnormality, consequently, wait to change the process time consuming that the machine is longer, and then influence the test efficiency of whole touch panel that awaits measuring.
Therefore, how to cancel the waiting time of the on-off in the tooling test and improve the test efficiency of the touch pad to be tested is a problem to be solved by those skilled in the art.
Disclosure of Invention
The invention aims to provide a system, a method, a device and a medium for testing a touch panel, which utilize a micro control unit to test the performance of the touch panel with an indication circuit, save the time of waiting for starting up to enter a test interface when the traditional building work is tested, and improve the efficiency of testing the touch panel.
To solve the above technical problems, the present application provides a system for testing a touch pad, including: a touch panel to-be-tested part, a micro control unit and an indication circuit;
one end of the micro control unit is connected with the touch panel to-be-tested part, and is used for sending a detection signal to the touch panel to-be-tested part when a trigger signal is acquired, acquiring a return signal of the touch panel to-be-tested part and judging whether the return signal meets a preset condition or not;
the other end of the micro control unit is connected with the indicating circuit and used for controlling the indicating circuit to be connected with a power supply if the return signal meets the preset condition.
Preferably, the part to be tested of the touch panel comprises a first connector, a second connector and keys;
the first connector is connected with the second connector, and the free ends of the first connector and the second connector are respectively connected with the micro control unit;
one end of the key is connected with the micro control unit, the other end of the key is grounded, when the key is triggered, the micro control unit sends a detection signal to the key to detect whether the key is normal, and meanwhile, the micro control unit sends the detection signal to the first connector and the second connector to detect whether the first connector is conducted with the second connector or not.
Preferably, the indicating circuit comprises a switch, an indicating lamp, a buzzer, a first resistor, a second resistor, a third resistor, a power supply and an MOS tube;
one end of the switch is connected with the micro control unit, the other end of the switch is grounded, and when the switch is triggered, the micro control unit sends detection signals to the first connector and the second connector to detect whether short circuits exist between pins of the first connector and pins of the second connector;
one end of the indicator lamp is connected with one end of the first resistor, the other end of the indicator lamp is connected with the micro-control unit, the other end of the first resistor is connected with the power supply, and when a short circuit exists between pins of the first connector and/or the second connector, the micro-control unit controls the indicator lamp to be connected with the power supply;
one end of the second resistor is connected with the drain electrode of the MOS tube, the other end of the second resistor is connected with the power supply, one end of the third resistor is connected with the grid electrode of the MOS tube, and the other end of the third resistor is connected with the micro control unit;
one end of the buzzer is connected with the source electrode of the MOS tube, the other end of the buzzer is grounded, and when the first connector and the second connector are not conducted, the micro-control unit controls the buzzer to be connected with the power supply.
Preferably, the system for testing a touch panel further comprises a connection circuit;
the connecting circuit is connected between the micro control unit and the touch panel to-be-tested part and used for transmitting signals between the micro control unit and the touch panel to-be-tested part.
Preferably, the connection circuit includes a third connector and a fourth connector;
one end of the third connector is connected with the first connector, and the other end of the third connector is connected with the micro control unit;
one end of the fourth connector is connected with the second connector, and the other end of the fourth connector is connected with the micro control unit.
Preferably, the system for testing the touch pad further comprises a man-machine interaction module, and the man-machine interaction module is connected with the micro control unit.
In order to solve the above technical problem, the present application further provides a method for testing a touch pad, which is applied to the system, including:
acquiring a trigger signal;
sending a detection signal to a part to be tested of the touch panel;
acquiring a return signal of a part to be tested of the touch panel;
and judging whether the return signal meets a preset condition, and if so, switching on the control indicating circuit and the power supply.
In order to solve the above technical problem, the present application further provides a device for testing a touch pad, including:
the first acquisition module is used for acquiring the trigger signal;
the sending module is used for sending a detection signal to a part to be tested of the touch panel;
the second acquisition module is used for acquiring a return signal of the part to be tested of the touch panel;
and the judging module is used for judging whether the return signal meets the preset condition, and if so, the control indicating circuit is connected with the power supply.
In order to solve the technical problem, the application also provides a device for testing the touch panel, which comprises a memory for storing a computer program;
a processor for implementing the steps of the method of testing a touch pad as described when executing the computer program.
To solve the above technical problem, the present application further provides a computer readable storage medium, on which a computer program is stored, which when being executed by a processor, implements the steps of the method for testing a touch pad as described.
The system for testing a touch pad provided by the application comprises: the touch panel comprises a touch panel to-be-tested part, a micro control unit and an indicating circuit, wherein one end of the micro control unit is connected with the touch panel to-be-tested part, the other end of the micro control unit is connected with the indicating circuit, a detection signal is sent to the touch panel to-be-tested part when the micro control unit acquires a trigger signal, a return signal of the touch panel to-be-tested part is acquired, whether the return signal of the touch panel to-be-tested part meets a preset condition is judged, if the preset condition is met, the function of the touch panel is determined to be abnormal, and the indicating circuit is controlled to be connected with a power supply. Therefore, the technical scheme provided by the invention directly utilizes the micro control unit to match the indicating circuit, sends the detection signal to the part to be tested of the touch panel, judges whether the return signal of the part to be tested of the touch panel meets the preset condition to detect whether the function of the touch panel is abnormal, saves the time of starting up to wait for entering the test interface when the touch panel is tested by the traditional PC tool, and further improves the test efficiency of the touch panel to be tested.
In addition, the method, the device and the medium for testing the touch panel correspond to the system and have the same effects.
Drawings
For a clearer description of the embodiments of the present application, the drawings that are needed in the embodiments will be briefly described, it being apparent that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a diagram of a test touch pad system according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a micro control unit according to an embodiment of the present invention;
FIG. 3 (a) is a schematic diagram of an indication circuit according to an embodiment of the present invention;
FIG. 3 (b) is a schematic diagram of another indication circuit according to an embodiment of the present invention;
fig. 4 (a) is a schematic diagram of a first connector in a component to be tested of a touch pad according to an embodiment of the present invention;
fig. 4 (b) is a schematic diagram of a second connector in a component to be tested of the touch pad according to an embodiment of the present invention;
fig. 4 (c) is a schematic diagram of a key in a component to be tested of the touch pad according to an embodiment of the present invention;
fig. 5 (a) is a schematic diagram of a third connector in the connection circuit according to an embodiment of the present invention;
fig. 5 (b) is a schematic diagram of a fourth connector in the connection circuit according to an embodiment of the present invention;
FIG. 6 is a flowchart of a method for testing a touch pad according to an embodiment of the present invention;
FIG. 7 is a diagram illustrating a device for testing a touch pad according to an embodiment of the present invention;
fig. 8 is a block diagram of an apparatus for testing a touch pad according to another embodiment of the present application.
Detailed Description
The following description of the technical solutions in the embodiments of the present application will be made clearly and completely with reference to the drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, but not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments herein without making any inventive effort are intended to fall within the scope of the present application.
The core of the application is to provide a system, a method, a device and a medium for testing the touch panel, wherein a detection signal is sent to a part to be tested of the touch panel through a micro control unit, a return signal of the part to be tested of the touch panel is obtained, whether the part to be tested of the touch panel is abnormal or not is judged according to the return signal, and further whether the function of the touch panel is normal or not is judged.
In order to provide a better understanding of the present application, those skilled in the art will now make further details of the present application with reference to the drawings and detailed description.
Touch pads can be regarded as a mouse substitute, and are used for controlling pointers by sensing the movement of fingers of users, and along with the development of the age, touch pads are applied to aspects of life, such as medical treatment, education, various electronic products and the like. Whether the function of the touch pad directly influences the experience of a user or not normally, and therefore the function test of the touch pad is of great importance. At present, a PC tool to be seen is generally adopted to test a touch panel, wherein the PC tool comprises a PC main board and touch panel equipment, one end of the touch panel to be tested is connected with the PC main board, the other end of the touch panel to be tested is connected with the touch panel equipment, and then the touch panel to be tested is tested so as to ensure that keys of the touch panel to be tested are normal and effective, namely connector pins in the touch panel cannot be short-circuited, and the connector must be normally conducted. The tool is required to be tested, a test interface is required to be waited for, and after the test is finished, shutdown is required to be carried out in order to avoid abnormal functions of the touch panel caused by hot plug, so that the whole test time is longer, the test efficiency of the touch panel is affected, and meanwhile, the labor cost is increased.
In order to avoid waiting time for entering a tool test interface and improve the test efficiency of a touch pad, the invention provides a system for testing the touch pad, which comprises: the touch panel is used for detecting the part to be detected, the micro control unit and the indicating circuit. Fig. 1 is a diagram of a system structure of a test touch panel, as shown in fig. 1, one end of a micro control unit 2 is connected with an indication circuit 3, the other end is connected with a part 1 to be tested of the touch panel, when the micro control unit 2 acquires a trigger signal, a detection signal is transmitted to the part 1 to be tested of the touch panel, a return signal of the part 1 to be tested of the touch panel is acquired, whether a preset condition is met is judged according to the return signal, if the preset condition is met, the abnormality of the part 1 to be tested of the touch panel is determined, and the indication circuit 3 is controlled to be connected with a power supply. Therefore, the technical scheme provided by the invention utilizes the micro control unit 2 to test the touch panel together with the indicating circuit 3, avoids waiting time of the tool test for entering the test interface after starting up, saves labor cost and improves the test efficiency of the touch panel.
The touch pad to-be-tested part 1 includes a key, a first connector, and a second connector. The micro control unit 2 is combined with the indicating circuit 3 to detect whether the key function is normal, whether the pins of the first connector and the second connector are in short circuit, and whether the pins of the first connector and the second connector are in conduction, so that whether the function of the touch pad is normal is determined.
In addition, it should be noted that, the indication circuit 3 is provided with an indicator light, a buzzer, and other elements, and is used for switching on the indication circuit 3 and the power supply, that is, the buzzer or the indicator light is on when the micro-control unit 2 detects that the touch panel to be tested part 1 is abnormal, so as to alert the staff of the abnormal function of the touch panel. Of course, the indication circuit 3 may include other elements besides the indication lamp and the buzzer, and the present invention is not limited thereto.
In a specific embodiment, in order to facilitate connection between the component 1 to be tested of the touch panel and the micro control unit 2, and further improve the testing efficiency, the system for testing the touch panel provided by the invention may further be provided with a connection circuit, where the connection circuit is connected between the micro control unit 2 and the component 1 to be tested of the touch panel, and is used for transmitting signals between the micro control unit 2 and the component 1 to be tested of the touch panel.
In order to enable a detector to intuitively observe the detection result of the touch panel, the system for testing the touch panel provided by the invention can be further provided with a man-machine interaction module, wherein the man-machine interaction module can comprise a mouse, a keyboard, a display and the like, and the system is not limited to the above.
The system for testing a touch pad provided by the application comprises: the touch panel comprises a touch panel to-be-tested part, a micro control unit and an indicating circuit, wherein one end of the micro control unit is connected with the touch panel to-be-tested part, the other end of the micro control unit is connected with the indicating circuit, a detection signal is sent to the touch panel to-be-tested part when the micro control unit acquires a trigger signal, a return signal of the touch panel to-be-tested part is acquired, whether the return signal of the touch panel to-be-tested part meets a preset condition is judged, if the preset condition is met, the function of the touch panel is determined to be abnormal, and the indicating circuit is controlled to be connected with a power supply. Therefore, the technical scheme provided by the invention directly utilizes the micro control unit to match the indicating circuit, sends the detection signal to the part to be tested of the touch panel, judges whether the return signal of the part to be tested of the touch panel meets the preset condition to detect whether the function of the touch panel is abnormal, saves the time of starting up to wait for entering the test interface when the touch panel is tested by the traditional PC tool, and further improves the test efficiency of the touch panel to be tested.
Fig. 2 is a schematic diagram of a micro control unit provided by an embodiment of the present invention, fig. 3 (a) is a schematic diagram of an indication circuit provided by an embodiment of the present invention, fig. 3 (b) is another schematic diagram of an indication circuit provided by an embodiment of the present invention, fig. 4 (a) is a schematic diagram of a first connector in a component to be tested of a touch pad provided by an embodiment of the present invention, fig. 4 (b) is a schematic diagram of a second connector in a component to be tested of a touch pad provided by an embodiment of the present invention, and fig. 4 (c) is a schematic diagram of a key in a component to be tested of a touch pad provided by an embodiment of the present invention. Among them, fig. 3 (a) and 3 (b) constitute an instruction circuit.
As shown in fig. 2, the micro-control unit is provided with pins 1-40, pin 18 and pin 19 are connected with the crystal oscillator circuit, pin 20 is grounded, resistor R2 is connected with pin 31 and pin 40 respectively, switch SW, capacitor C3 and resistor R1 are connected in parallel, and the common terminal is connected with pin 9.
In a specific embodiment, the touch pad to-be-tested component includes a first connector, a second connector and keys, and for convenience of understanding, the following will describe in detail with reference to fig. 4 (a), fig. 4 (b) and fig. 4 (c). As shown in fig. 4 (a), 4 (b) and 4 (c), the touch panel to-be-tested part includes a first connector J1, a second connector J2, and left and right keys S2 and S3 of the touch panel. Pins T1.0-T1.2 of the first connector J1 are connected with pins P1.4-P1.6 of the micro control unit in a one-to-one correspondence, pins T1.3 are grounded, pins T2.0-T2.2 of the second connector J2 are connected with pins P3.0-P3.2 of the micro control unit in a one-to-one correspondence, pins T2.4 and pins T2.5 are respectively connected with pins P3.3 and P3.4 of the micro control unit, wherein pins T2.0-T2.2 are connected with a capacitor, the other end of the capacitor is grounded, and in addition, pins T2.3 are grounded. One end of the key S2 is connected with the pin P3.3 of the micro control unit, the other end of the key S3 is grounded, one end of the key S3 is connected with the pin P3.4 of the micro control unit, and the other end of the key S is grounded. When the key S2 and the key S3 are triggered, that is, when the key S2 and the key S3 are closed, the micro control unit sends detection signals to the key S2 and the key S3, and determines whether the returned detection signals meet a preset condition, if so, it is determined that the key S2 and the key S3 are normal and effective, and for convenience of understanding, the detection of the key S2 will be described in detail below as an example. For example, when S2 is closed, the micro control unit sends a high level to the key S2, and since the other ends of the keys S2 are all grounded, when the micro control unit detects that the high level sent to the key S2 3 changes, the micro control unit can determine that the key S2 is normal and valid, and if the sent high level does not change, the micro control unit determines that the key S2 is abnormal, and at this time, the micro control unit controls the indication circuit to be connected with the power supply to alert the detection personnel of the abnormal function of the key S2. It should be noted that the preset condition here is whether the high level is pulled low. In addition, it should be noted that, the present invention is not limited to the level value of the key S2 or the key S3 sent by the micro control unit.
In an embodiment, when the key S2 or the key S3 is activated, that is, when the key S2 or the key S3 is closed, the micro control unit further transmits a detection signal to the first connector J1 and the second connector J2 to detect whether or not the first connector J1 and the second connector J2 are conductive. As can be seen from fig. 4 (c), one end of the key S2 and one end of the key S3 are connected to the pin P3.3 and the pin P3.4 of the micro control unit, and as can be seen from fig. 4 (b), the pin T2.4 and the pin T2.5 of the connector J2 are also connected to the micro control unit through the pin P3.3 and the pin P3.4. When S2 or S3 is closed, the micro control unit sends a high level signal and a low level signal to any one pin of the first connector J1 and the second connector J2 respectively, judges whether the pin receiving the high level is pulled down by the pin receiving the low level, and determines that the detected pins are conducted when the pin receiving the high level is pulled down. Also, it should be noted that the level value transmitted by the micro control unit is not limited in the present invention, but there is a voltage difference between the levels respectively transmitted to any one of the pins of the first connector J1 and the second connector J2.
According to the system for testing the touch panel, the micro control unit is used for directly transmitting the detection signal to the touch panel to-be-detected part, acquiring the return signal of the touch panel to-be-detected part and judging whether the return signal meets the preset condition to determine whether the function of the touch panel is normal or not, the operation is simple, the time that the traditional construction tool needs to wait for entering the test interface for testing the touch panel to-be-detected part can be saved, and the test efficiency of the touch panel is improved.
On the basis of the above embodiment, when the abnormal function of the key S2 or the key S3 or the non-conduction between the first connector J1 and the second connector J2 is detected, the micro control unit controls the indication circuit to be connected with the power supply so as to inform the detection personnel of the detection result of the part to be detected of the touch panel. As shown in fig. 3 (a) and 3 (b), the indication circuit includes a switch S1, an indication lamp L1 and an indication lamp L2, a buzzer Bell, resistors R3-R6, a power supply and a MOS transistor M1. One end of the switch S1 is connected with a pin P1.0 of the micro control unit, the other end of the switch S1 is grounded, the indicator lamp L1 and the indicator lamp L2 are connected in parallel, one ends of the indicator lamp L1 and the indicator lamp L2 are respectively connected with a pin P1.1 and a pin P1.2 of the micro control unit, the other ends of the indicator lamp L1 and the indicator lamp L2 are respectively connected with a resistor R3 and a resistor R4, a common end of the resistor R3 and the resistor R4 is connected with one end of the resistor R5, the other end of the resistor R5 is connected with a drain electrode of the MOS tube M1, one end of the resistor R6 is connected with the pin P1.3 of the micro control unit, the other end of the resistor R6 is connected with a grid electrode of the MOS tube M1, one end of the buzzer Bell is connected with a source electrode of the MOS tube M1, and the other end of the resistor is grounded.
When the switch S1 is closed, that is, the micro control unit receives a signal that the switch S1 is triggered, the micro control unit transmits a detection signal to the first connector J1 or the second connector J2 to detect whether the pins of the first connector J1 or the second connector J2 are shorted. For ease of understanding, the following description will be given in detail with reference to the detection of the first connector J1 as an example. For example, when any one of the keys S2 and S3 is triggered, the micro control unit transmits a high level and a low level to any two pins T1.0-T1.2 of the first connector J1 through pins P1.4-P1.6, and determines whether the pin receiving the high level is pulled down by the pin receiving the low level, if the high level is pulled down, it is determined that a short circuit exists between the pins of the first connector J1, and at this time, the micro control unit controls the buzzer Bell to be connected with the power source to alert the staff that the short circuit exists. It should be noted that, since the pin T1.3 of the first connector J1 is grounded, when detecting whether the pin T1.3 is shorted with any one of the pins T1.0-T1.2, only a high level needs to be sent to any one of the pins T1.0-T1.2. It should be noted that, detection needs to be performed between every two pins of the first connector J1, and no short circuit exists between the two pins to determine that the first connector is normal. In addition, it should be noted that the level values of the connectors of the components to be detected of the touch panel are also transmitted by the micro control unit, and the invention is not limited.
In addition, when the key S2 or the key S3 is activated, that is, the key S2 or the key S3 is closed, the micro control unit transmits a detection signal to the first connector J1 and the second connector J2 to detect whether or not conduction is performed between the first connector J1 and the second connector J2. For example, the micro control unit sends a high level signal and a low level signal to any one of the first connector J1 and the second connector J2, respectively, and determines whether the pin receiving the high level is pulled down by the pin receiving the low level, if pulled down, it is determined that the detected pins are conductive, at this time, the micro control unit controls the indicator lamp L1 to be connected to the power supply, if the level is not pulled down, it is determined that the detected pins are non-conductive, and the micro control unit controls the indicator lamp L2 to be connected to the power supply, so that a detection person observes the detection result, and it is required to be noted that a voltage difference must exist between the levels sent by the micro control unit to any one of the first connector J1 and the second connector J2, respectively.
The utility model provides a system of test touch pad, the pilot lamp is provided with bee calling organ and two pilot lamps, bee calling organ is used for when there is the short circuit between the connector self pin of touch pad with power switch-on in order to inform the inspector, two pilot lamps are respectively represented as switch-on pilot lamp and non-switch-on pilot lamp, when the testing result is switch-on between the connector, switch-on pilot lamp and power switch-on, if the testing result is non-switch-on between the connector, then non-switch-on pilot lamp and power switch-on, it is thus visible that the pilot lamp is provided with bee calling organ and two pilot lamps, the inspector of being convenient for directly perceived observation testing result.
In a specific embodiment, the part to be tested of the touch panel is directly connected with the micro control unit to be welded, and the inaccurate test result may be caused by improper connection during welding, and meanwhile, the welding is also unfavorable for improving the test efficiency, so that the system for testing the touch panel provided by the invention can be further provided with a connecting circuit. Fig. 5 (a) is a schematic diagram of a third connector in the connection circuit provided by the embodiment of the invention, and fig. 5 (b) is a schematic diagram of a fourth connector in the connection circuit provided by the embodiment of the invention. Fig. 2, 3 (a), 3 (b), 4 (a), 4 (b), 4 (c), 5 (a) and 5 (b) collectively constitute a system for testing a touch panel.
As shown in fig. 5 (a) and 5 (b), the connection circuit is provided with a third connector J3 and a fourth connector J4, and pins T3.0-T3.2 of the third connector J3 are respectively connected with pins T1.0-T1.2 of the first connector J1, and are simultaneously connected with pins P1.4-P1.6 of the micro control unit. Pins T4.0-T4.2 of the fourth connector J3 are respectively connected with pins T2.0-T2.2 of the second connector J2, and are simultaneously connected with pins P3.0-P3.2 of the micro control unit, pins T4.3 are grounded, pins T4.4 and T4.5 are connected with pins T2.4 and T2.5 of the second connector J2, and are simultaneously connected with pins P3.3 and P3.4 of the micro control unit. The micro control unit sends a detection signal to the touch panel to-be-detected part through the connecting circuit so as to detect whether the touch panel to-be-detected part is abnormal or not.
According to the system for testing the touch panel, the connecting circuit is additionally arranged between the micro control unit and the touch panel to-be-detected part, so that the problems of inaccurate testing and inconvenience in welding the micro control unit and the touch panel to-be-detected part are avoided, and the testing efficiency of the test touch panel is improved.
On the basis of the above embodiment, in order to facilitate the inspector to more intuitively observe the inspection result, and control the inspection signal transmitted to the component to be inspected of the touch panel, the system for inspecting the touch panel may further be provided with a man-machine interaction module, where the man-machine interaction module may include a mouse, a keyboard, a display, and other elements, which is not limited in this invention. The detection personnel can input the components to be detected to be transmitted to the touch pad through the mouse and the keyboard, and meanwhile, the display can directly display the detection result.
According to the system for testing the touch pad, provided by the application, through the arrangement of the man-machine interaction module, detection staff can intuitively observe the detection result, and the detection efficiency is improved.
In the above embodiments, a system for testing a touch pad is described in detail, and the present invention further provides a corresponding embodiment of a method for testing a touch pad. Fig. 6 is a flowchart of a method for testing a touch pad according to an embodiment of the present invention, as shown in fig. 6, where the method includes:
s10: and acquiring a trigger signal.
S11: and sending a detection signal to the part to be tested of the touch pad.
S12: a return signal of a component to be tested of the touch panel is acquired.
S13: whether the return signal meets the preset condition is judged, and if yes, the step S14 is carried out.
S14: the control indication circuit is connected with a power supply.
Since the embodiments of the system portion and the embodiments of the method portion correspond to each other, the embodiments of the method portion are referred to the description of the embodiments of the system portion, and are not repeated herein.
The method for testing the touch panel comprises the following steps: the micro control unit acquires a trigger signal, sends a detection signal to a part to be tested of the touch panel after acquiring the trigger signal, acquires a return signal of the part to be tested of the touch panel, judges whether the return signal meets a preset condition, determines that the function of the touch panel is abnormal if the return signal meets the preset condition, and controls the indication circuit to be connected with a power supply. Therefore, the technical scheme provided by the invention directly utilizes the micro control unit to match the indicating circuit, sends the detection signal to the part to be tested of the touch panel, judges whether the return signal of the part to be tested of the touch panel meets the preset condition to detect whether the function of the touch panel is abnormal, saves the time of starting up to wait for entering the test interface when the touch panel is tested by the traditional PC tool, and further improves the test efficiency of the touch panel to be tested.
In the above embodiments, a method for testing a touch pad is described in detail, and the present application further provides a corresponding embodiment of an apparatus for testing a touch pad. It should be noted that the present application describes an embodiment of the device portion from two angles, one based on the angle of the functional module and the other based on the angle of the hardware structure.
Fig. 7 is a structural diagram of an apparatus for testing a touch pad according to an embodiment of the present invention, as shown in fig. 7, the apparatus includes:
a first acquisition module 10, configured to acquire a trigger signal;
a transmitting module 11 for transmitting a detection signal to a touch panel to-be-tested part;
a second acquisition module 12 for acquiring a return signal of a part to be tested of the touch panel;
and the judging module 13 is used for judging whether the return signal meets the preset condition, and if so, the control indicating circuit is connected with the power supply.
Since the embodiments of the apparatus portion and the embodiments of the method portion correspond to each other, the embodiments of the apparatus portion are referred to the description of the embodiments of the method portion, and are not repeated herein.
The device for testing the touch pad provided by the application comprises: the micro control unit acquires a trigger signal, sends a detection signal to a part to be tested of the touch panel after acquiring the trigger signal, acquires a return signal of the part to be tested of the touch panel, judges whether the return signal meets a preset condition, determines that the function of the touch panel is abnormal if the return signal meets the preset condition, and controls the indication circuit to be connected with a power supply. Therefore, the technical scheme provided by the invention directly utilizes the micro control unit to match the indicating circuit, sends the detection signal to the part to be tested of the touch panel, judges whether the return signal of the part to be tested of the touch panel meets the preset condition to detect whether the function of the touch panel is abnormal, saves the time of starting up to wait for entering the test interface when the touch panel is tested by the traditional PC tool, and further improves the test efficiency of the touch panel to be tested.
Fig. 8 is a block diagram of an apparatus for testing a touch pad according to another embodiment of the present application, and as shown in fig. 8, the apparatus for testing a touch pad includes: a memory 20 for storing a computer program;
a processor 21 for carrying out the steps of the method of testing a touch panel as mentioned in the above embodiments when executing a computer program.
The device for testing the touch pad provided in this embodiment may include, but is not limited to, a smart phone, a tablet computer, a notebook computer, a desktop computer, or the like.
Processor 21 may include one or more processing cores, such as a 4-core processor, an 8-core processor, etc. The processor 21 may be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, abbreviated as DSP), field-programmable gate array (Field-Programmable Gate Array, abbreviated as FPGA), programmable logic array (Programmable Logic Array, abbreviated as PLA). The processor 21 may also include a main processor and a coprocessor, the main processor being a processor for processing data in an awake state, also referred to as a central processor (Central Processing Unit, CPU for short); a coprocessor is a low-power processor for processing data in a standby state. In some embodiments, the processor 21 may integrate with an image processor (Graphics Processing Unit, GPU for short) for rendering and drawing of the content required to be displayed by the display screen. In some embodiments, the processor 21 may also include an artificial intelligence (Artificial Intelligence, AI) processor for processing computing operations related to machine learning.
Memory 20 may include one or more computer-readable storage media, which may be non-transitory. Memory 20 may also include high-speed random access memory, as well as non-volatile memory, such as one or more magnetic disk storage devices, flash memory storage devices. In this embodiment, the memory 20 is at least used to store a computer program 201 that, when loaded and executed by the processor 21, is capable of implementing the relevant steps of the method for testing a touch pad disclosed in any of the foregoing embodiments. In addition, the resources stored in the memory 20 may further include an operating system 202, data 203, and the like, where the storage manner may be transient storage or permanent storage. The operating system 202 may include Windows, unix, linux, among others. The data 203 may include, but is not limited to, related data related to a method of testing the touch pad, and the like.
In some embodiments, the device for testing the touch pad may further comprise a display 22, an input-output interface 23, a communication interface 24, a power supply 25, and a communication bus 26.
Those skilled in the art will appreciate that the configuration shown in FIG. 8 is not limiting of the means for testing a touchpad and may include more or fewer components than shown.
The device for testing the touch panel, provided by the embodiment of the application, comprises a memory and a processor, wherein the processor can realize the following method when executing a program stored in the memory: a method of testing a touch panel.
According to the device for testing the touch panel, the micro control unit is directly utilized to match the indicating circuit, the detection signal is sent to the part to be tested of the touch panel, whether the return signal of the part to be tested of the touch panel meets the preset condition or not is judged to detect whether the function of the touch panel is abnormal or not, the time for starting up to wait for entering a test interface when the touch panel is tested by the traditional PC tool is saved, and further the test efficiency of the touch panel to be tested is improved.
Finally, the present application also provides a corresponding embodiment of the computer readable storage medium. The computer-readable storage medium has stored thereon a computer program which, when executed by a processor, performs the steps as described in the method embodiments above.
It will be appreciated that the methods of the above embodiments, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored on a computer readable storage medium. With such understanding, the technical solution of the present application, or a part contributing to the prior art or all or part of the technical solution, may be embodied in the form of a software product stored in a storage medium, performing all or part of the steps of the method described in the various embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The system, the method, the device and the medium for testing the touch panel are described in detail. In the description, each embodiment is described in a progressive manner, and each embodiment is mainly described by the differences from other embodiments, so that the same similar parts among the embodiments are mutually referred. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant points refer to the description of the method section. It should be noted that it would be obvious to those skilled in the art that various improvements and modifications can be made to the present application without departing from the principles of the present application, and such improvements and modifications fall within the scope of the claims of the present application.
It should also be noted that in this specification, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.

Claims (6)

1. A system for testing a touch pad, comprising: a touch panel to-be-tested part, a micro control unit and an indication circuit;
one end of the micro control unit is connected with the touch panel to-be-tested part, and is used for sending a detection signal to the touch panel to-be-tested part when a trigger signal is acquired, acquiring a return signal of the touch panel to-be-tested part and judging whether the return signal meets a preset condition or not;
the other end of the micro control unit is connected with the indicating circuit and is used for controlling the indicating circuit to be connected with a power supply if the return signal meets the preset condition;
the touch panel to-be-tested part comprises a first connector, a second connector and a key;
the first connector is connected with the second connector, and the free ends of the first connector and the second connector are respectively connected with the micro control unit;
one end of the key is connected with the micro control unit, the other end of the key is grounded, when the key is triggered, the micro control unit sends a detection signal to the key to detect whether the key is normal, and meanwhile, the micro control unit sends the detection signal to the first connector and the second connector to detect whether the first connector and the second connector are conducted or not;
the indicating circuit comprises a switch, an indicating lamp, a buzzer, a first resistor, a second resistor, a third resistor, a power supply and an MOS tube;
one end of the switch is connected with the micro control unit, the other end of the switch is grounded, and when the switch is triggered, the micro control unit sends detection signals to the first connector and the second connector to detect whether short circuits exist between pins of the first connector and pins of the second connector;
one end of the indicator lamp is connected with one end of the first resistor, the other end of the indicator lamp is connected with the micro-control unit, the other end of the first resistor is connected with the power supply, and when a short circuit exists between pins of the first connector and/or the second connector, the micro-control unit controls the indicator lamp to be connected with the power supply;
one end of the second resistor is connected with the drain electrode of the MOS tube, the other end of the second resistor is connected with the power supply, one end of the third resistor is connected with the grid electrode of the MOS tube, and the other end of the third resistor is connected with the micro control unit;
one end of the buzzer is connected with the source electrode of the MOS tube, the other end of the buzzer is grounded, and when the first connector and the second connector are not conducted, the micro-control unit controls the buzzer to be connected with the power supply;
the device also comprises a connecting circuit;
the connecting circuit is connected between the micro control unit and the touch panel to-be-tested part and is used for transmitting signals between the micro control unit and the touch panel to-be-tested part;
the connection circuit comprises a third connector and a fourth connector;
one end of the third connector is connected with the first connector, and the other end of the third connector is connected with the micro control unit;
one end of the fourth connector is connected with the second connector, and the other end of the fourth connector is connected with the micro control unit.
2. The system for testing a touch pad of claim 1, further comprising a human-machine interaction module, the human-machine interaction module being coupled to the micro-control unit.
3. A method of testing a touch pad for use in the system of claim 1 or 2, comprising:
acquiring a trigger signal;
sending a detection signal to a part to be tested of the touch panel;
acquiring a return signal of a part to be tested of the touch panel;
and judging whether the return signal meets a preset condition, and if so, switching on the control indicating circuit and the power supply.
4. An apparatus for testing a touch panel, applied to the system of claim 1 or 2, comprising:
the first acquisition module is used for acquiring the trigger signal;
the sending module is used for sending a detection signal to a part to be tested of the touch panel;
the second acquisition module is used for acquiring a return signal of the part to be tested of the touch panel;
and the judging module is used for judging whether the return signal meets the preset condition, and if so, the control indicating circuit is connected with the power supply.
5. An apparatus for testing a touch panel, comprising a memory for storing a computer program;
a processor for implementing the steps of the method of testing a touch panel as claimed in claim 3 when executing said computer program.
6. A computer readable storage medium, characterized in that it has stored thereon a computer program which, when executed by a processor, implements the steps of the method of testing a touch panel according to claim 3.
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