CN113916121A - Method and device for detecting diameter of metal micro-wire - Google Patents
Method and device for detecting diameter of metal micro-wire Download PDFInfo
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- CN113916121A CN113916121A CN202111090419.7A CN202111090419A CN113916121A CN 113916121 A CN113916121 A CN 113916121A CN 202111090419 A CN202111090419 A CN 202111090419A CN 113916121 A CN113916121 A CN 113916121A
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- 229910052751 metal Inorganic materials 0.000 title claims abstract description 59
- 239000002184 metal Substances 0.000 title claims abstract description 59
- 238000000034 method Methods 0.000 title claims abstract description 37
- 238000001514 detection method Methods 0.000 claims abstract description 47
- 230000035772 mutation Effects 0.000 claims abstract description 17
- 230000008569 process Effects 0.000 claims abstract description 11
- 238000012360 testing method Methods 0.000 claims abstract description 9
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 15
- 239000002041 carbon nanotube Substances 0.000 claims description 11
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 11
- 238000006073 displacement reaction Methods 0.000 claims description 9
- 238000007689 inspection Methods 0.000 claims description 9
- 238000009795 derivation Methods 0.000 claims description 3
- 238000004891 communication Methods 0.000 claims description 2
- 230000004044 response Effects 0.000 claims description 2
- 230000001131 transforming effect Effects 0.000 claims 1
- 239000000523 sample Substances 0.000 description 27
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 13
- 229910052709 silver Inorganic materials 0.000 description 13
- 239000004332 silver Substances 0.000 description 13
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000000835 fiber Substances 0.000 description 4
- 229910002804 graphite Inorganic materials 0.000 description 4
- 239000010439 graphite Substances 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910000881 Cu alloy Inorganic materials 0.000 description 1
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 229910000861 Mg alloy Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011777 magnesium Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- YTCQFLFGFXZUSN-BAQGIRSFSA-N microline Chemical compound OC12OC3(C)COC2(O)C(C(/Cl)=C/C)=CC(=O)C21C3C2 YTCQFLFGFXZUSN-BAQGIRSFSA-N 0.000 description 1
- 230000006740 morphological transformation Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000010408 sweeping Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/12—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring diameters
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The invention discloses a method and a device for detecting the diameter of a metal micro-wire, wherein the method comprises the following steps: A. constructing a test system, wherein the test system at least comprises a platform with a bearing surface for bearing a metal microwire sample, a movable sensitive element for acquiring detection information and a feedback system connected to the sensitive element for acquiring the detection information, and the bearing surface is conductive; B. moving the sensitive element, and acquiring the stroke information of the sensitive element related to a mutation point when the detection information is mutated on the basis of the detection information acquired when the sensitive element is displaced or changed in form relative to a loaded metal microwire sample on the platform; C. and solving to obtain the diameter D of the metal micro-wire. The invention has simple detection process, high efficiency and high detection precision.
Description
Technical Field
The present invention relates to a detection device, and more particularly, to a method and an apparatus for detecting the diameter of a metal micro-wire.
Background
The metal micro-wire mainly refers to copper and copper alloy with the wire diameter of less than 20 microns, magnesium and magnesium alloy, stainless steel, gold, silver, aluminum, platinum, palladium and other metal monofilaments, and is mainly applied to the key fields of chip micro-connection, precision circuit and photovoltaic solar screen printing, surface tension siphon materials, conventional solution filter materials, nuclear power filter materials, electromagnetic shielding nets, static electricity guiding nets and the like. With the miniaturization of electronic devices, the continuous expansion of wearable electronic consumer products, and the rapid development of the photovoltaic industry and the aerospace field, the demand for metal micro wires is increasingly urgent. The prepared metal micro-wire has low wire diameter detection accuracy, and the large data dispersion is always a pain point in the industry.
The conventional metal micro-wire diameter detection method mainly comprises a resistance method, a laser interference method and an optical microscope measurement method. The resistance method is to calculate the resistance by measuring the current and voltage values of the metal micro-wire with fixed length (1m), and calculate the wire diameter according to ohm's law and the calculation formula of the resistivity. The method is characterized in that the error is large, the data is greatly influenced by material, contact resistance, temperature and resistivity, and the accuracy of measuring the wire diameter below 15 micrometers is low.
The laser interference method is to make the metal micro-line to be measured pass through the laser beam with fixed wavelength, and measure the light intensity caused by the optical path difference of two coherent laser beams according to the interference principle of light. The method is fast and accurate for measuring the wire diameter with larger wire diameter, such as wire diameter of 20 microns and above. But limited by the laser wavelength, the method has low precision and large error for the metal micro-wire of about 10 microns, and is not suitable for measuring the ultra-fine metal micro-wire.
The optical microscope method is to directly place the metal micro-wire to be measured under a microscope, and to calculate the wire diameter by observing the shape of the wire diameter and by the method multiple and linear proportion. However, in the optical microscope, when a visible light is used as a light source, when a micro-wire of about 10 microns is observed, the depth is low, the dispersion is severe, the wire diameter profile is difficult to distinguish, and a large measurement error is brought.
The information disclosed in this background section is only for enhancement of understanding of the general background of the invention and should not be taken as an acknowledgement or any form of suggestion that this information forms the prior art already known to a person skilled in the art.
Disclosure of Invention
The invention aims to provide a method and a device for detecting the diameter of a metal micro-wire, which effectively reduce errors caused by environmental factors, human factors and the like, have higher precision and resolution performance and have high diameter measurement precision.
In order to achieve the above object, an embodiment of the present invention provides a method for detecting a diameter of a metal micro-wire, including the steps of: A. constructing a testing system, wherein the testing system at least comprises a platform which is used for bearing a metal micro-wire sample and is provided with a bearing surface (the bearing surface can be a large-area plane on the platform and can also be a surface structure on a part of the platform), a movable sensitive element used for acquiring detection information, and a feedback system which is connected to the sensitive element and is used for acquiring the detection information, and the bearing surface is conductive; B. moving the sensitive element, and acquiring the stroke information of the sensitive element related to a mutation point when the detection information is mutated on the basis of the detection information acquired when the sensitive element is displaced or changed in form relative to a loaded metal microwire sample on the platform; C. and (4) solving and obtaining the diameter D of the metal micro-wire according to the stroke information of the sensitive element related to the catastrophe point obtained by repeated tests.
In one or more embodiments of the invention, the mutation point is obtained by first-order derivation of the obtained detection information-time curve.
In one or more embodiments of the present invention, the detection information includes at least any one of: current information, resistance information, voltage information, displacement information.
In one or more embodiments of the present invention, the feedback system includes a power source, a nanoampere meter, the nanoampere meter is connected in series to the power source, and a positive electrode and a negative electrode of the power source are respectively electrically connected to the carrying surface and the sensitive element (i.e., the carrying surface and the sensitive element can be respectively and electrically connected to two electrodes of the power source without a specific correspondence to form a circuit structure meeting the detection requirement, the circuit structure is open in a normal state, and a path is formed when the circuit structure moves to an abrupt change point in the detection process), so as to at least realize an electrical connection with all or part of the structure of the carrying surface and an electrical connection with all or part of the structure of the sensitive element.
In one or more embodiments of the present invention, the sensor comprises carbon nanotubes, and the extending direction of the carbon nanotubes is parallel to the moving direction of the sensor and perpendicular to the bearing surface.
In one or more embodiments of the present invention, the morphological transformation of step B comprises deformation of the sensitive element upon contact or interference with the metal microwire sample.
In one or more embodiments of the present disclosure, the sensitive element deforms upon contacting or abutting an end surface of the metal microwire sample.
In one or more embodiments of the invention, the end face is parallel to the direction of movement of the sensitive element. In one or more embodiments of the present invention, during the detection, two mutation points x1(dI1/dt1, t), x2(dI2/dt, t2) are obtained along with the movement of the sensitive element on the end surface contacting or abutting against the metal microwire sample, where I1 is the detected current value at the time t1 (unit S, the same below), x1 is the displacement coordinate value at the time t1 (unit mm, the same below), I2 is the detected current value at the time t3, etc., and x2 is the displacement coordinate value at the time t2, and multiple sets (n sets) of mutation point data are obtained by multiple detections, so as to solve and obtain multiple sets (n sets) of mutation point dataIn one or more embodiments of the present invention, the metal microwire diameter detection apparatus includes a feedback system for responding to the obtained detection information (where the responding includes performing data or information display on the detection information, or performing calculation according to the detection information and displaying a calculation conclusion such as diameter, etc.), a platform, at least a partial area of which has a carrying surface for defining a metal microwire sample; a sensing element in communication with the feedback system and having a capability of being movable toward, against, or away from the metal microwire sample to obtain inspection information during the inspection process.
Compared with the prior art, according to the method and the device for detecting the diameter of the metal micro-wire, which are provided by the embodiment of the invention, the carbon nano tube is used as a sensitive element of the probe, the electric signals such as current, resistance, voltage and the like fed back by the carbon nano tube are obtained in the test process, the diameter of the metal micro-wire is further measured and calculated by determining the mutation point in the detection process, and the end face or the end face of the metal micro-wire is used as a direct object for reflecting the diameter of the metal micro-wire, so that higher precision and accuracy are obtained, and the interference of human factors, system factors and the like causing errors is not easy to be caused.
Drawings
FIG. 1 is a schematic view of a metal micro-wire diameter detection apparatus according to an embodiment of the present invention;
FIG. 2 is a schematic view illustrating a detection process of a metal micro-wire diameter detection apparatus according to an embodiment of the present invention;
FIG. 3 is an I-t diagram in the inspection of a metal micro-wire diameter inspection apparatus according to an embodiment of the present invention.
Wherein, 1, power supply; 2. a silver electrode; 3. a conductive silver adhesive head; 4. graphite fibers; 5. a carbon nanotube; 6. a metal micro-wire to be tested; 7. a platform; 8. a nanoampere meter; 9. a signal amplifier; 10. and a proportional operation processor.
Detailed Description
The following detailed description of the present invention is provided in conjunction with the accompanying drawings, but it should be understood that the scope of the present invention is not limited to the specific embodiments.
Throughout the specification and claims, unless explicitly stated otherwise, the word "comprise", or variations such as "comprises" or "comprising", will be understood to imply the inclusion of a stated element or component but not the exclusion of any other element or component.
In a metal micro-wire diameter detection method according to a preferred embodiment of the present invention:
a platform 7 for carrying a metal micro-wire sample is prepared, where in order to satisfy the departure and purpose of the present solution, at least an area of the platform 7 for directly fixing or placing the metal micro-wire sample, here defined as a carrying surface, is electrically conductive to enable electrical connection with the metal micro-wire sample during the inspection process. The bearing surface is preferably a bearing surface, and in the case of the preferred bearing surface, the interference on the moving of the sensitive element used as the probe in the detection process or the selection requirement on the falling point of the probe on the bearing surface can be reduced, for example, when the bearing surface is a curved structure, the data error between different falling points may be large due to the arc structure, and particularly, in the case of not strictly defining the moving route of the sensitive element, the bearing surface in a curved surface or arc shape may bring about a relatively obvious influence.
A sensing element is constructed which may have a probe structure providing a sensing function, a movement structure for effecting movement of the probe structure. The probe structure is used for implementing information feedback in the whole detection system according to the diameter of a metal micro-wire sample to be detected, and the feedback can be current data, resistance data, voltage data and the like. The moving structure here may be a digitally controlled linear motor connected to the probe for precisely controlling the displacement information of the probe.
The feedback system may be provided with a power supply 1 for electrically connecting at least to the carrying surface and to the sensitive element, in particular to enable an electrical connection to the probe structure. And a response device for responding and feeding back information such as current, resistance, voltage and the like in the circuit can be further arranged, such as a nanoampere meter 8 and the like.
Therefore, based on the above, in the detection process, the power supply 1, the nanoampere meter 8, the probe structure and the bearing surface provided with the metal micro-wire sample form an open circuit before the probe structure moves to the mutation point, and the conduction is realized when the probe structure moves to the first mutation point. At this time, since the probe structure is deformed when contacting or abutting against the end surface of the metal micro-wire sample, the current, voltage, resistance, and the like in the detection circuit may be changed, and the detection information may be fed back, thereby causing the information such as the current information, the resistance information, and the voltage information to be changed. Therefore, a detection information-time curve is obtained, and at the moment, the derivation is carried out on the curve, so that the information of the mutation point, such as the time of mutation, can be determined, and the corresponding displacement information can be further obtained.
More specifically, as shown in fig. 1, a metal micro-wire diameter detection device according to a preferred embodiment of the present invention may include a power supply 1, a nanoampere meter 8, a silver electrode 2, a conductive silver adhesive head 3, a graphite fiber 4, a carbon nanotube 5, a metal micro-wire 6 to be measured, a signal amplifier 9, a proportional operation processor 10, and the like. The graphite fiber 4 is connected with the silver electrode 2 through a conductive silver adhesive head 3 formed by bonding conductive silver adhesive, the lower end of the carbon fiber grows a carbon nano tube 5 through chemical vapor deposition, and the whole structure is used as a detection positive electrode and connected with a direct current power supply 1 and a nanoampere meter 8; placing a sample to be detected on a silver platform 7, wherein the silver platform 7 is precisely polished and is connected with the negative electrode of the direct current power supply 1; wherein the diameter of the end of the silver electrode 2 is 0.1-0.3 mm; the diameter of the graphite fiber 4 is 5-10 microns, and the length is 2-5 mm; the diameter of the carbon nano tube 5 is 50-150nm, and the length is 2-10 microns;
the detection process is as follows, as shown in fig. 2 and 3:
two ends of the metal micro-wire with the wire diameter to be measured are tensioned and laid on the silver platform 7;
switching on the direct current power supply 1, detecting the anode, adjusting the motion direction, enabling the metal micro-wire 6 to be detected to be vertical to the motion direction of the detecting anode, and recording the displacement value (micrometer);
the detection positive electrode is slowly contacted with the silver platform 7, the nanoampere meter 8 generates current after the positive electrode and the negative electrode are connected, and a basic current value is obtained after the current passes through the signal amplifier 9;
connecting the nanoampere meter 8 with an oscilloscope externally, detecting the start of the motion of the anode, and starting timing at the same time;
when the detection anode touches the metal micro-wire 6 to be detected, the carbon nano tube 5 is bent and deformed to cause the change (reduction) of the current value, and the deformation rule is symmetrically distributed along with the time of sweeping the cross section of the metal micro-wire 6 to be detected; obtaining a catastrophe point (time) by solving a first derivative of a current time curve;
the signal amplifier 9 amplifies the detected nanoampere current, and the two mutation points are obtained by deriving a function I (x, t) to 0, that is, d (I (x, t))/d (t)) to 0, according to the displacement relative positions x1(dI1/dt1, t), x2(dI2/dt, t2) corresponding to the displacement and the current mutation point time by using the proportional arithmetic processor 10;
the line diameter of the metal micro-wire is obtained by calculating the position of the current catastrophe point moment for multiple times and solving the average value
The foregoing descriptions of specific exemplary embodiments of the present invention have been presented for purposes of illustration and description. It is not intended to limit the invention to the precise form disclosed, and obviously many modifications and variations are possible in light of the above teaching. The exemplary embodiments were chosen and described in order to explain certain principles of the invention and its practical application to enable one skilled in the art to make and use various exemplary embodiments of the invention and various alternatives and modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the claims and their equivalents.
Claims (10)
1. A method for detecting the diameter of a metal micro-wire is characterized by comprising the following steps:
A. constructing a test system, wherein the test system at least comprises a platform with a bearing surface for bearing a metal microwire sample, a movable sensitive element for acquiring detection information and a feedback system connected to the sensitive element for acquiring the detection information, and the bearing surface is conductive;
B. moving the sensitive element, and acquiring the stroke information of the sensitive element related to a mutation point when the detection information is mutated on the basis of the detection information acquired when the sensitive element is displaced or changed in form relative to a loaded metal microwire sample on the platform;
C. and (4) solving and obtaining the diameter D of the metal micro-wire according to the stroke information of the sensitive element related to the catastrophe point obtained by repeated tests.
2. The method of claim 1, wherein the discontinuity is obtained by first-order derivation of a time-curve from the obtained detection information.
3. The method according to claim 1 or 2, wherein the detection information includes at least one of: current information, resistance information, voltage information, displacement information.
4. The method of claim 1, wherein the feedback system comprises a power source, a nanoamp meter coupled in series to the power source, the positive and negative poles of the power source being electrically coupled to the support surface and the sensing element, respectively, to at least make electrical connections to all or a portion of the structure of the support surface and to all or a portion of the structure of the sensing element.
5. The method of claim 1, wherein the sensor comprises carbon nanotubes, and the extending direction of the carbon nanotubes is parallel to the moving direction of the sensor and perpendicular to the supporting surface.
6. The method of claim 1, wherein the transforming in step B comprises deforming the sensitive element when the sensitive element contacts or abuts the metal microwire sample.
7. The method of claim 6, wherein the sensitive element deforms upon contacting or abutting an end surface of the metal microwire sample.
8. The method of claim 7, wherein the end surface is parallel to a direction of movement of the sensing element.
9. The method of claim 7, wherein two mutation points x1(dI1/dt1, t), x2(dI2/dt, t2) are obtained as the sensing element moves on an end surface contacting or abutting the metal microwire sample during the inspection, and a plurality of sets of mutation point data are obtained through a plurality of inspections to solve the obtained mutation point data
10. A metal micro-wire diameter detection device is characterized by comprising
A feedback system for, in response to the acquired detection information,
a platform, at least a partial region of which has a carrying surface for defining a metal microwire sample; and
a sensing element in communication with the feedback system and having a capability of being movable toward, against, or away from the metal microwire sample to obtain inspection information during the inspection process.
Priority Applications (2)
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CN202111090419.7A CN113916121B (en) | 2021-09-17 | 2021-09-17 | Method and device for detecting diameter of metal micro-thin wire |
ZA2022/07314A ZA202207314B (en) | 2021-09-17 | 2022-07-01 | Method and device for measuring diameter of metal microwire |
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CN202111090419.7A CN113916121B (en) | 2021-09-17 | 2021-09-17 | Method and device for detecting diameter of metal micro-thin wire |
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CN113916121B CN113916121B (en) | 2024-06-21 |
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ZA202207314B (en) | 2022-09-28 |
CN113916121B (en) | 2024-06-21 |
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