CN113866969B - Light path system for light beam tracking equipment - Google Patents
Light path system for light beam tracking equipment Download PDFInfo
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Abstract
The invention discloses an optical path system for beam tracking equipment, which comprises an optical axis calibration system, an inner channel aberration correction system, an illumination laser emission system, a laser emission system and a fine tracking imaging system which are connected in sequence; the optical path system is used in a directional energy weapon, has the functions of inner channel aberration correction, optical axis calibration, target pointing and light beam emission, can analyze the aberration and distortion of light beams through a Hardman detector and a reference light, and is corrected in real time through a deformable mirror; the optical axis calibration of the internal optical path is realized through the quick reflection mirror and the reference light; the stable pointing to the target is realized through the quick reflection mirror; the laser is emitted through an off-axis emission system; the system can realize the illumination imaging of the target and the like, can realize all-weather work, and has the advantages of high optical transmission efficiency, high tracking precision and aiming precision, high beam quality, strong environmental adaptability, high space utilization rate and the like.
Description
Technical Field
The invention relates to the technical field of directional energy equipment, in particular to an optical path system for beam tracking equipment.
Background
The light beam control and tracking aiming equipment (ATP for short) is an important component of the laser directional energy equipment, and has the functions of stably tracking the target after capturing the target and transmitting laser to the target through the off-axis transmitting telescope to destroy the target.
The prior art has the following defects: the ATP equipment has a huge structure, has larger influence on environmental changes along with temperature and vibration, has high material price, and can not reach the level of angle seconds in aiming precision; when the high-energy laser is transmitted by the inner channel, air is heated to generate refractive index gradient transformation, so that aberration of the inner channel is increased, the beam quality of the light source is deteriorated, and the damage capability of the system is reduced; the existing light path can not fight all weather; the optical axis calibration system is not a common aperture, and the detector is more used; the structure is complex, and the space utilization rate is low.
Disclosure of Invention
The invention aims to overcome the defects of the prior art, and provides an optical path system for beam tracking equipment, which can correct the deviation of an imaging optical axis, a mechanical axis and an emission axis, can correct the aberration of an inner channel, can realize all-weather work, and has the advantages of high optical transmission efficiency, high tracking precision and aiming precision, high beam quality, strong environmental adaptability, high space utilization rate and the like.
The invention aims at realizing the following scheme:
an optical path system for light beam tracking equipment comprises an optical axis calibration system, an inner channel aberration correction system, an illumination laser emission system, a laser emission system and a fine tracking imaging system which are sequentially connected.
Further, in the optical axis calibration system, when calibrating the optical axis of the reference laser, the beacon laser emits light, the reference light after the light emission is reflected to the seventh spectroscope through the ninth fast reflecting mirror and the eighth reflecting mirror, and is reflected to the third spectroscope after being reflected by the seventh spectroscope, and most of the reference light is transmitted by the third spectroscope, and part of the light is reflected from the third spectroscope, reflected to the fourth reflecting mirror and the fifth reflecting mirror, and then enters the first optical axis detection system after being reflected, and the point light source of the reference light is imaged; by the ninth quick reflection mirror, the optical axis can be stabilized at the center of the detector.
Further, in the optical axis calibration system, when the optical axis of the main laser is calibrated, a control closed loop is formed by the second emission optical axis calibration fast reflecting mirror and the detection imaging system, so that the main laser can be positioned at the position center of the detector.
Further, in the optical axis calibration system, when the optical axis of the illumination laser is calibrated, the illumination laser is emitted, reflected by the mirrors of the thirteenth emission optical axis calibration quick reflection mirror, the twelfth reflection mirror and the eleventh reflection mirror, transmitted through the seventh spectroscope, reflected by a part of the light from the third spectroscope, reflected to the fourth reflection mirror and the fifth reflection mirror, and reflected to the optical axis detection system to image a point light source of the reference light; by correcting the quick reflection mirror by the thirteenth emission optical axis, the optical axis can be stabilized at the center of the detector.
Further, in the optical axis calibration system, when the mechanical axis calibration is performed, reference light is transmitted from the third spectroscope, reflected by the fifteenth kude fast reflector, the deformable mirror, the seventeenth kude fast reflector, the eighteenth kude fast reflector and the nineteenth spectroscope, reflected to the second twenty-second spectroscope, reflected by the twenty-seventh spectroscope, partially transmitted to the pyramid prism, returned by the original path of the pyramid prism, reflected by the twenty-seventh spectroscope to the thirty-second spectroscope, transmitted by the thirty-fourth spectroscope, reflected by the thirty-fourth reflector and then transmitted to the second optical axis detection system; after the reference light enters the second optical axis detection system, the point light source forms an image on the detector, the position of the point light source is checked, then the photoelectric tracking turntable is rotated by 360 degrees, the deviation of a mechanical axis and an emission axis caused by the rotation of the photoelectric turntable or the pixel deviation caused by the temperature change and the vibration environment of a light spot is recorded, the mean square error is obtained through image processing, the value of the mean square error is used as the zero point of initial calibration, and then the value is given to a fifteenth kude fast mirror, a seventeenth kude fast mirror and an eighteenth kude fast mirror, and the gesture of the fast mirror is adjusted, so that the reference light coincides with the mechanical axis of the photoelectric tracking turntable.
Further, in the inner channel aberration correction system, when the main laser light is emitted, the reference light is reflected by a ninth fast reflecting mirror, an eighth reflecting mirror and a seventh spectroscope, is transmitted by a third spectroscope, enters a fifteenth kurd fast reflecting mirror, a deformable mirror, a seventeenth kurd fast reflecting mirror, an eighteenth kurd fast reflecting mirror and a nineteenth spectroscope for reflection, is transmitted when entering a second twenty-second spectroscope, is reflected by the twenty-third reflecting mirror, then enters a real-focus beam-shrinking telescope, then enters a double telecentric lens and then enters a Hartmann detector; when the main laser is not emitted, decomposing the initial aberration of the reference light through a Hardman detector, and performing phase calibration; after calibration, the difference between the wave aberration of the inner channel on the Hardman detector and the calibrated value is produced, feedback information is given to the deformable mirror through control decoupling, and the inner optical path aberration of the system is corrected in real time through the deformable mirror.
Further, in the illumination laser emission system, the illuminated laser is reflected by the thirteenth emission optical axis correction fast reflecting mirror, the twelfth reflecting mirror and the eleventh reflecting mirror, transmitted by the seventh spectroscope and the third spectroscope, reflected by the fifteenth kude fast reflecting mirror, the deformable mirror, the seventeenth kude fast reflecting mirror and the eighteenth kude fast reflecting mirror, transmitted by the nineteenth spectroscope, reflected by the active illumination directional fast reflecting mirror, and enters the active illumination emission head.
Further, in the laser emission system, after the main laser comes out from the light source, the main laser sequentially passes through the second emission optical axis correction fast reflector, the third spectroscope, the fifteenth kude fast reflector, the deformable mirror, the seventeenth kude fast reflector, the eighteenth kude fast reflector, the ninth fast reflector, the twenty second spectroscope, the twenty seventh spectroscope, the fine tracking target pointing fast reflector, the off-axis emission secondary mirror and the off-axis emission main mirror reflector for reflection, and then is emitted to the target.
Further, in the fine tracking imaging system, an imaging light path is reflected by an off-axis emission main mirror, an off-axis emission secondary mirror and a fine tracking target pointing fast reflection mirror, then transmitted by a twenty-seventh spectroscope, reflected by a thirty-seventh spectroscope and enters a fine tracking imaging camera.
Further, the active illumination emission head can rotate omnidirectionally along with the photoelectric turntable.
Further, the active illumination pointing fast mirror can stably illuminate illumination on a target by forming closed loop control with a finely tracked camera.
Further, the active illumination emission head is a group of optical systems capable of zooming, and the spot size of illumination light on a target can be adjusted.
Further, the fine tracking target pointing fast reflecting mirror is used for eliminating tracking errors caused by jitter and temperature change in the tracking process.
Further, the off-axis emission secondary mirror is a focusing mirror, so that the emission focusing can be carried out on targets at different distances.
The beneficial effects of the invention include:
the optical path system provided by the embodiment of the invention has more functions, and can be used for calibrating the multi-optical axis difference of the system, correcting the inner channel aberration, working around the clock and the like.
The fine tracking imaging light path and the emission light path do not share the Coulomb light path, so that the illumination and transmission efficiency of the detection system can be improved, the imaging system has no image rotation, and the influence on stable tracking of target pointing caused by rotation of the Coulomb mirror is avoided.
The optical path system of the embodiment of the invention can greatly reduce the cost of system materials, and has very high tracking precision and aiming deviation.
The fine tracking imaging system and the coupling detection system of the embodiment of the invention all adopt common aperture imaging.
The system has compact structure and reasonably distributes the space of the system.
The embodiment of the invention has simple system and is easy to realize.
The embodiment of the invention is used in the light beam control and tracking aiming equipment and is a light path system of the equipment. The optical path system provided by the embodiment of the invention can correct the optical axis deviation and the aberration of the inner channel of the system in real time. The system comprises an active illumination optical system, a target detection imaging system and a target detection imaging system, wherein the target detection imaging system realizes all-weather operation; tracking and aiming of the target are realized through an off-axis emission light path system; in addition, the optical path system of the embodiment of the invention has the advantages of high optical transmission efficiency, high tracking precision and aiming precision, high beam quality, all-weather operation, strong environmental adaptability, high space utilization rate and the like.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions of the prior art, the drawings which are used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are only some embodiments of the invention, and that other drawings can be obtained according to these drawings without inventive faculty for a person skilled in the art.
FIG. 1 is a diagram of an optical path system according to an embodiment of the present invention;
in the figure, a 1-laser; 2-a second emission optical axis correction fast mirror; 3-a third spectroscope; 4-a fourth mirror; 5-a fifth mirror; 6-a first optical axis detection system; 7-a seventh spectroscope; 8-eighth mirror; 9-a ninth fast mirror; 10-a reference beacon laser; 11-eleventh mirror; 12-a twelfth mirror; 13-thirteenth emission optical axis correction fast mirror; 14-an illumination laser; 15-fifteenth kude fast mirror; 16-deformable mirror; 17-seventeenth kude fast mirror; 18-eighteenth kude fast mirror; 19-nineteenth spectroscope; 20-active illumination directed fast mirror; 21-actively illuminating the emission head; 22-a twenty-second beam splitter; 23-a twenty-third mirror; 24-real focus beam shrinking telescope; 25-double telecentric lens; a 26-hadamard detector; 27-a twenty-seventh spectroscope; 28-fine tracking target pointing fast mirror; 29-off-axis emission secondary mirror; 30-off-axis emission primary mirror; 31-pyramid prisms; 32-a thirty-second dichroic mirror; 33-fine tracking imaging camera; 34-a thirty-fourth mirror; 35-a second optical axis detection system.
Detailed Description
All of the features disclosed in all of the embodiments of this specification, or all of the steps in any method or process disclosed implicitly, except for the mutually exclusive features and/or steps, may be combined and/or expanded and substituted in any way.
Example 1
As shown in fig. 1, an optical path system for a beam tracking device includes an optical axis calibration system, an inner channel aberration correction system, an illumination laser emission system, a laser emission system, and a fine tracking imaging system, which are sequentially connected.
Example 2
In other embodiments of the present invention based on embodiment 1, in the optical axis calibration system, when calibrating the optical axis of the reference laser, the beacon laser 10 emits light, the reference light after the light emission is reflected to the seventh beam splitter 7 through the ninth fast reflector 9 and the eighth reflector 8, reflected to the third beam splitter 3 after being reflected by the seventh beam splitter 7, most of the reference light is transmitted by the third beam splitter 3, and part of the light is reflected from the third beam splitter 3, reflected to the fourth reflector 4 and the fifth reflector 5, reflected into the first optical axis detection system 6, and imaged by the point light source of the reference light; by the ninth quick return mirror 9, the optical axis can be stabilized in the center of the detector.
Example 3
In other embodiments of the present invention based on embodiment 1, in the optical axis calibration system, when calibrating the optical axis of the main laser, the main laser can be centered at the position of the detector by forming a control loop with the probe imaging system through the second emission optical axis calibration fast reflecting mirror 2.
Example 4
In other embodiments of the present invention based on embodiment 1, in the optical axis calibration system, when the optical axis of the illumination laser is calibrated, the illumination laser is emitted, reflected by the mirrors of the thirteenth emission optical axis calibration fast mirror 13, the twelfth mirror 12, and the eleventh mirror 11, transmitted through the seventh spectroscope 7, reflected by the third spectroscope 3, reflected by the fourth mirror 4 and the fifth mirror 5, and then reflected by the optical axis detection system 6, and the point light source of the reference light is imaged; by correcting the quick reflection mirror 13 by the thirteenth emission optical axis, the optical axis can be stabilized at the center of the detector.
Example 5
In other embodiments of the present invention based on embodiment 1, in the optical axis calibration system, when the mechanical axis is calibrated, the reference light is transmitted from the third spectroscope 3, reflected by the fifteenth kurdng fast reflector 15, the deformable mirror 16, the seventeenth kurdng fast reflector 17, the eighteenth kurdng fast reflector 18 and the nineteenth spectroscope 19, reflected to the second light splitter 22, reflected by the second light splitter 22, passed through the twenty-seventh spectroscope 27, partially transmitted to the pyramid prism 31, reflected by the twenty-seventh spectroscope 27, passed through the thirty-fourth reflector 34, reflected by the thirty-fourth reflector 34, and then passed into the second optical axis detection system 35; after the reference light enters the second optical axis detection system 35, the point light source forms an image on the detector, the position of the point light source is checked, then the photoelectric tracking turntable is rotated by 360 degrees, the deviation of a mechanical axis and an emission axis caused by the rotation of the photoelectric turntable or the pixel deviation caused by the temperature change and the vibration environment of a light spot is recorded, the mean square error is obtained through image processing, the value of the mean square error is used as the zero point of initial calibration, then the value is given to the fifteenth kude fast mirror 15, the seventeenth kude fast mirror 17 and the eighteenth kude fast mirror 18, and the posture of the fast mirror is adjusted, so that the mechanical axes of the reference light and the photoelectric tracking turntable coincide.
Example 6
In other embodiments of the present invention based on any of the embodiments above, in the internal channel aberration correction system, when the main laser light is emitted, the reference light is reflected by the ninth fast mirror 9, the eighth mirror 8, and the seventh beam splitter 7, is transmitted by the third beam splitter 3, is reflected by the fifteenth kude fast mirror 15, the deformable mirror 16, the seventeenth kude fast mirror 17, the eighteenth kude fast mirror 18, and the nineteenth beam splitter 19, is transmitted when entering the second twenty-split mirror 22, is reflected by the twenty-third mirror 23, is then enters the real-focus beam-shrinking telescope 24, is then enters the double telecentric lens 25, and is then enters the hadamard detector 26; when the main laser is not emitted, decomposing the initial aberration of the reference light through the Hardman detector 26, and performing phase calibration; the difference between the inner channel wave aberration on the Hardman detector 26 and the calibrated value is obtained after calibration, feedback information is given to the deformable mirror 16 through control decoupling, and the inner optical path aberration of the system is corrected in real time through the deformable mirror 16.
Example 7
In other embodiments of the present invention based on any of the above embodiments, in the illumination laser emission system, the illuminated laser light is reflected by the thirteenth emission optical axis correction fast mirror 13, the twelfth mirror 12, and the eleventh mirror 11, transmitted through the seventh beam splitter 7 and the third beam splitter 3, reflected by the fifteenth kude fast mirror 15, the deformable mirror 16, the seventeenth kude fast mirror 17, and the eighteenth kude fast mirror 18, transmitted through the nineteenth beam splitter 19, reflected by the active illumination directional fast mirror 20, and enters the active illumination emission head 21.
Example 8
In other embodiments of the present invention based on any of the above embodiments, in the laser emission system, after the main laser light comes out from the light source, the laser light is emitted onto the target after passing through the second emission optical axis correction fast mirror 2, the third beam splitter 3, the fifteenth kurd fast mirror 15, the anamorphic mirror 16, the seventeenth kurd fast mirror 17, the eighteenth kurd fast mirror 18, the ninth fast mirror 9, the twenty second beam splitter 22, the twenty seventh beam splitter 27, the fine tracking target pointing fast mirror 28, the off-axis emission secondary mirror 29, and the off-axis emission main mirror 30 in order.
Example 9
In other embodiments of the present invention, based on any of the embodiments described above, in a fine tracking imaging system, the imaging light path is reflected from the off-axis primary emission mirror 30, the off-axis secondary emission mirror 29, the fine tracking target pointing fast mirror 28, then transmitted from the twenty-seventh beam splitter 27, reflected from the thirty-second beam splitter 32, and then directed into the fine tracking imaging camera 33.
In other embodiments of the present invention based on embodiment 7, it should be noted that the active illumination emission head 21 can rotate omnidirectionally with the optoelectronic turntable.
In other embodiments of the present invention based on embodiment 7, it should be noted that the active illumination pointing fast mirror 20 can stably illuminate the illumination on the target by forming a closed loop control with the finely tracked camera.
In other embodiments of the present invention based on embodiment 7, it should be noted that the active illumination emission head 21 is a set of optical systems capable of zooming, and is capable of adjusting the spot size of illumination light on the target.
In other embodiments of the present invention based on embodiment 8, it should be noted that the fine tracking target pointing fast mirror 28 is used to eliminate tracking errors caused by jitter and temperature variation during tracking.
In other embodiments of the present invention based on embodiment 8, it should be noted that the off-axis emission secondary mirror 29 is a focusing mirror, and can perform emission focusing on targets at different distances.
The invention comprises an optical axis calibration system, an inner channel aberration correction system, an illumination emission system, an off-axis emission system and a fine tracking imaging system, wherein the specific working principle is as follows:
1) The optical axis calibration system, as shown in fig. 1, firstly calibrates the optical axis, the reference beacon laser 10 emits light, the reference light after the light emitting is reflected to the seventh spectroscope 7 through the ninth fast reflecting mirror 9 and the eighth reflecting mirror 8 for optical axis calibration of the reference light, the reference light is reflected to the third spectroscope 3 after being reflected by the seventh spectroscope 7, the third spectroscope 3 transmits most of the reference light, a part of the light is reflected from the third spectroscope 3, reflected to the fourth reflecting mirror 4 and the fifth reflecting mirror 5, and then enters the optical axis detection system 6 after being reflected, and the point light source of the reference light is imaged. Looking at the imaging position of the point light source of the reference light in the detector, the optical axis is stabilized in the center of the detector by a ninth quick mirror 9 for reference light optical axis correction.
The position of the main laser in the detector is checked by the laser with low power, a control closed loop is formed by the second emission optical axis correction quick reflection mirror 2 and the detection imaging system, so that the main laser is also in the position center of the detector, and the main laser and the reference light energy completely coincide.
The emitted illumination laser is reflected by the thirteenth emission optical axis correction fast reflecting mirror 13, the twelfth reflecting mirror 12 and the eleventh reflecting mirror 11, transmitted through the seventh spectroscope 7, reflected by the third spectroscope 3, reflected to the fourth reflecting mirror 4 and the fifth reflecting mirror 5, reflected to the first optical axis detection system 6, and imaged by the point light source of the reference light. Looking at the imaging position of the point light source of the reference light in the detector, the quick-reflecting mirror 13 is corrected by the thirteenth emission optical axis so that the optical axis is stabilized at the center of the detector.
After the optical axes of the illumination laser, the main laser and the reference laser are calibrated, the calibrated reference light is transmitted from the third spectroscope 3, reflected by the fifteenth kurdon quick reflector 15, the deformable mirror 16, the seventeenth kurdon quick reflector 17, the eighteenth kurdon quick reflector 18 and the nineteenth spectroscope 19, reflected by the twenty-second spectroscope 22, reflected by the twenty-seventh spectroscope 27, partially transmitted to the pyramid prism 31, returned by the original path of the pyramid prism 31, reflected by the twenty-seventh spectroscope 27 to the thirty-fourth spectroscope 32, transmitted by the thirty-fourth spectroscope 32, reflected by the thirty-fourth reflector 34 and then entering the second optical axis detection system 35. After the reference light enters an on-axis optical axis detection system, a point light source forms an image on a detector, the position of the point light source is checked, then a photoelectric tracking turntable is rotated by 360 degrees, the deviation of a mechanical axis and an emission axis caused by the rotation of the photoelectric turntable or the pixel deviation caused by the temperature change and the vibration environment of a light spot is recorded, the mean square error is obtained through image processing, the value of the mean square error is used as the zero point of initial calibration, then the value is given to a fifteenth kude fast mirror 15, a seventeenth kude fast mirror 17 and an eighteenth kude fast mirror 18, and the posture of the fast mirror is adjusted, so that the mechanical axes of the reference light and the photoelectric tracking turntable coincide.
2) Inner channel aberration correction system: as shown in fig. 1, in the system, when the aberration of the inner channel is corrected, the thermal effect of the laser causes the inner channel to generate a change of refractive index gradient during the process of outputting the main laser, so that the quality of the light beam of the light source is reduced. After the optical axis of the reference light is corrected, the reference light is reflected by the ninth fast reflecting mirror 9, the eighth reflecting mirror 8 and the seventh spectroscope 7, transmitted by the third spectroscope 3, reflected by the fifteenth kude fast reflecting mirror 15, the deformable mirror 16, the seventeenth kude fast reflecting mirror 17, the eighteenth kude fast reflecting mirror 18 and the nineteenth spectroscope 19 in fig. 1, transmitted by the second twenty-second spectroscope 22, reflected by the twenty-third reflecting mirror 23, then transmitted to the real-focus beam-shrinking telescope 24, then transmitted to the double telecentric lens 25 and then transmitted to the hadamard detector 26. When the main laser is not emitted, the initial aberration of the reference light is decomposed by the Hardman detector 26 for phase calibration. The difference between the wave aberration of the inner channel on the Hardman detector 26 and the calibrated value is produced when the main laser is calibrated, feedback information is given to the deformable mirror 16 through control decoupling, and the inner optical path aberration of the system is corrected in real time through the deformable mirror 16, so that the beam quality of the system is improved.
3) Illumination laser emission system: the illumination at night is very low, and the target can not be seen by the fine tracking camera, and the target is required to be illuminated by the short wave camera or the near infrared camera, so that the target is imaged on the detector by active illumination, and the transmitting head of the active illumination can rotate in all directions along with the photoelectric turntable. After the illumination laser calibration is completed, the illumination laser is reflected by the thirteenth emission optical axis correction fast reflecting mirror 13, the twelfth reflecting mirror 12 and the eleventh reflecting mirror 11 in fig. 1, transmitted by the seventh spectroscope 7 and the third spectroscope 3, reflected by the fifteenth kude fast reflecting mirror 15, the deformable mirror 16, the seventeenth kude fast reflecting mirror 17 and the eighteenth kude fast reflecting mirror 18, transmitted by the nineteenth spectroscope 19, reflected by the active illumination directional fast reflecting mirror 20 and enters the active illumination emission head. The active illumination-pointing fast-reflecting mirror 20 is a fast-reflecting mirror to which illumination is directed, and by forming a closed-loop control with a finely tracked camera, illumination can be stably directed on a target. The active illumination emission head 21 is a set of variable-focus optical systems that can adjust the spot size of illumination light on a target.
4) Laser emission system: the laser emission system is used for emitting the main laser to the target in a directional manner, and the emission system in the system is an off-axis emission system, as can be seen from fig. 1, after the main laser exits from the light source, the main laser is emitted to the target after passing through the second emission optical axis correction fast mirror 2, the third spectroscope 3, the fifteenth kude fast mirror 15, the deformable mirror 16, the seventeenth kude fast mirror 17, the eighteenth kude fast mirror 18, the nineteenth spectroscope 19, the second twenty spectroscope 22, the twenty seventh spectroscope 27, the fine tracking target pointing fast mirror 28, the off-axis emission secondary mirror 29 and the off-axis emission main mirror 30 in sequence. The off-axis emission secondary mirror 29 of the emission system is a focusing mirror for performing emission focusing on targets at different distances.
5) Fine tracking imaging system: the fine tracking imaging system and the emission system are the inverse process, and the imaging light path is reflected from the off-axis emission main mirror 30, the off-axis emission secondary mirror 29 and the fine tracking target pointing fast reflecting mirror 28, then transmitted from the twenty-seventh spectroscope 27, reflected from the thirty-seventh spectroscope 32 and enters the fine tracking camera. The fine tracking target points to the quick reflecting mirror 28, so as to eliminate tracking errors caused by jitter, temperature change and the like in the tracking process and improve the stable tracking precision of the target.
The optical path system of the embodiment is used in a directional energy weapon and has the functions of inner channel aberration correction, optical axis calibration, target pointing and light beam emission, and the optical path system can analyze the aberration and distortion of a light beam through a Hardman sensor and reference light and correct the aberration and distortion in real time through a deformable mirror; the optical axis calibration of the internal optical path is realized through the quick reflection mirror and the reference light; the stable pointing to the target is realized through the quick reflection mirror; the laser is emitted through an off-axis emission system; illumination imaging of the object is achieved by an illumination system.
The invention is not related in part to the same as or can be practiced with the prior art.
The foregoing technical solution is only one embodiment of the present invention, and various modifications and variations can be easily made by those skilled in the art based on the application methods and principles disclosed in the present invention, not limited to the methods described in the foregoing specific embodiments of the present invention, so that the foregoing description is only preferred and not in a limiting sense.
In addition to the foregoing examples, those skilled in the art will recognize from the foregoing disclosure that other embodiments can be made and in which various features of the embodiments can be interchanged or substituted, and that such modifications and changes can be made without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (1)
1. The optical path system for the light beam tracking equipment is characterized by comprising an optical axis calibration system, an inner channel aberration correction system, an illumination laser emission system, a laser emission system and a fine tracking imaging system which are connected in sequence;
in the optical axis calibration system, when the optical axis of reference laser is calibrated, a beacon laser (10) emits light, the emitted reference light is reflected to a seventh spectroscope (7) through a ninth fast reflecting mirror (9) and an eighth reflecting mirror (8), reflected to a third spectroscope (3) through the seventh spectroscope (7), most of the reference light is transmitted by the third spectroscope (3), and part of the light is reflected from the third spectroscope (3), reflected to a fourth reflecting mirror (4) and a fifth reflecting mirror (5), reflected to enter a first optical axis detection system (6) and imaged by a point light source of the reference light; the optical axis can be stabilized in the center of the detector by a ninth fast reflecting mirror (9);
in the optical axis calibration system, when the optical axis of the main laser is calibrated, a control closed loop is formed by the second emission optical axis calibration quick reflection mirror (2) and the detection imaging system, so that the main laser can be positioned at the position center of the detector;
in the optical axis calibration system, when the optical axis of the illumination laser is calibrated, the illumination laser is emitted, reflected by the mirrors of the thirteenth emission optical axis calibration quick reflecting mirror (13), the twelfth reflecting mirror (12) and the eleventh reflecting mirror (11), transmitted by the seventh spectroscope (7), reflected by the third spectroscope (3), reflected to the fourth reflecting mirror (4) and the fifth reflecting mirror (5), reflected to the first optical axis detection system (6), and imaged by a point light source of the illumination laser; the optical axis can be stabilized in the center of the detector by a thirteenth emission optical axis correction quick reflection mirror (13);
in the optical axis calibration system, when a mechanical axis is calibrated, reference light is transmitted from a third spectroscope (3), reflected by a fifteenth kude fast reflector (15), a deformable mirror (16), a seventeenth kude fast reflector (17), an eighteenth kude fast reflector (18) and a nineteenth spectroscope (19), reflected to a twenty-seventh spectroscope (22), reflected by the twenty-seventh spectroscope (22), transmitted to a pyramid prism (31) in part, reflected by the twenty-seventh spectroscope (27) after being returned in the original way of the pyramid prism (31), transmitted to a thirty-fourth reflector (34) after being transmitted by the thirty-fourth spectroscope (32), and transmitted to a second optical axis detection system (35) after being reflected by the thirty-fourth reflector (34); after the reference light enters a second optical axis detection system (35), a point light source forms an image on a detector, the position of the point light source is checked, then a photoelectric tracking turntable is rotated by 360 degrees, the deviation of a mechanical axis and an emission axis of a light spot caused by the rotation of the photoelectric tracking turntable or the pixel deviation caused by temperature change and vibration environment is recorded, the mean square error is obtained through image processing, the value of the mean square error is used as a zero point of an initial calibration, then the value is given to a fifteenth kude fast mirror (15), a seventeenth kude fast mirror (17) and an eighteenth kude fast mirror (18), and the gesture of the fast mirror is adjusted, so that the reference light coincides with the mechanical axis of the photoelectric tracking turntable;
in the inner channel aberration correction system, when main laser light is emitted, reference light is reflected by a ninth fast reflecting mirror (9), an eighth reflecting mirror (8) and a seventh spectroscope (7), is transmitted by a third spectroscope (3), enters a fifteenth kurd fast reflecting mirror (15), a deformable mirror (16), a seventeenth kurd fast reflecting mirror (17), an eighteenth kurd fast reflecting mirror (18) and a nineteenth spectroscope (19), is reflected by a second twenty-second spectroscope (22), is transmitted by a twenty-third reflecting mirror (23), enters a real-focus beam-shrinking telescope (24), enters a double telecentric lens (25) and then enters a Hardemander detector (26); when the main laser is not emitted, decomposing the initial aberration of the reference light through a Hardman detector (26) to perform phase calibration; after calibration, the difference between the wave aberration of the inner channel on the Hardman detector (26) and the calibrated value is produced, feedback information is given to the deformable mirror (16) through control decoupling, and the inner optical path aberration of the system is corrected in real time through the deformable mirror (16);
in the illumination laser emission system, illumination laser is reflected by a thirteenth emission optical axis correction fast reflecting mirror (13), a twelfth reflecting mirror (12) and an eleventh reflecting mirror (11), is transmitted by a seventh spectroscope (7) and a third spectroscope (3), is reflected by a fifteenth kude fast reflecting mirror (15), a deformable mirror (16), a seventeenth kude fast reflecting mirror (17) and an eighteenth kude fast reflecting mirror (18), is transmitted by a nineteenth spectroscope (19), is reflected by an active illumination directional fast reflecting mirror (20) and enters an active illumination emission head (21);
in the laser emission system, after main laser comes out from a light source, the main laser sequentially passes through a second emission optical axis correction fast reflecting mirror (2), a third spectroscope (3), a fifteenth kude fast reflecting mirror (15), a deformable mirror (16), a seventeenth kude fast reflecting mirror (17), an eighteenth kude fast reflecting mirror (18), a nineteenth spectroscope (19), a twenty second spectroscope (22), a twenty seventh spectroscope (27), a precise tracking target pointing fast reflecting mirror (28), an off-axis emission secondary mirror (29) and an off-axis emission main mirror (30) to reflect and then emit the laser to the target;
in the fine tracking imaging system, an imaging light path is reflected from an off-axis emission main mirror (30), an off-axis emission secondary mirror (29) and a fine tracking target pointing quick reflection mirror (28), then transmitted from a twenty-seventh spectroscope (27), reflected from a thirty-seventh spectroscope (32) and enters a fine tracking imaging camera (33);
the active illumination emission head (21) can rotate in all directions along with the photoelectric tracking turntable;
the active illumination pointing fast reflecting mirror (20) can stably irradiate illumination on a target through forming closed loop control with the fine tracking imaging camera;
the active illumination emission head (21) is a group of optical systems capable of zooming, and the spot size of illumination light on a target can be adjusted;
the fine tracking target pointing fast reflecting mirror (28) is used for eliminating tracking errors caused by jitter and temperature change in the tracking process;
the off-axis emission secondary mirror (29) is a focusing mirror, and can carry out emission focusing on targets at different distances.
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