CN113848217A - Crack detection device and method based on coplanar integrated mirror image dielectric waveguide - Google Patents
Crack detection device and method based on coplanar integrated mirror image dielectric waveguide Download PDFInfo
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- CN113848217A CN113848217A CN202111107839.1A CN202111107839A CN113848217A CN 113848217 A CN113848217 A CN 113848217A CN 202111107839 A CN202111107839 A CN 202111107839A CN 113848217 A CN113848217 A CN 113848217A
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- dielectric waveguide
- integrated mirror
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- crack
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
- G01N22/02—Investigating the presence of flaws
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P3/00—Waveguides; Transmission lines of the waveguide type
- H01P3/16—Dielectric waveguides, i.e. without a longitudinal conductor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P3/00—Waveguides; Transmission lines of the waveguide type
- H01P3/16—Dielectric waveguides, i.e. without a longitudinal conductor
- H01P3/165—Non-radiating dielectric waveguides
Abstract
The invention provides a crack detection device and method based on a coplanar integrated mirror dielectric waveguide, wherein the device comprises: the coplanar integration mirror image medium waveguide, the network analyzer and the upper computer; the coplanar integrated mirror image dielectric waveguide comprises a substrate integrated non-radiative dielectric waveguide and a substrate integrated mirror image dielectric waveguide; and a transition zone is arranged between the substrate integrated non-radiative dielectric waveguide and the substrate integrated mirror image dielectric waveguide. The coplanar integrated mirror image dielectric waveguide generates traveling waves; the substrate integrates a mirrored dielectric waveguide for crack sensing. The invention improves the detection sensitivity of the crack detection device and is insensitive to the crack position, and can be used for crack detection in a complex environment.
Description
Technical Field
The invention relates to the technical field of microwave and detection, in particular to a crack detection device and method based on a coplanar integrated mirror dielectric waveguide.
Background
The metal material is widely applied to equipment in various fields at present. The metal parts can receive the influence of environment such as high load, corruption, high temperature high pressure in long-time use, can cause the metal parts surface to produce the crackle scheduling problem, if can not in time carry out effectual detection and take effectual remedial measure to the metal crackle, can reduce the stability and the security of each equipment, lead to each equipment can not normally work, lead to the emergence of incident even. Therefore, it is important to effectively detect these working devices.
Publication No. CN112683930A (publication No. 2021-04-20) proposes an apparatus and method for detecting metal cracks, wherein the apparatus comprises: the system comprises a rectangular waveguide, a network analyzer and a computer terminal; two ends of the rectangular waveguide are respectively connected with the network analyzer through coaxial cables; the network analyzer is externally connected to the computer terminal; the bottom wall of the rectangular waveguide is in an open state, the rectangular waveguide is placed on the metal to be tested with cracks, and the traveling wave transmission direction of the rectangular waveguide is perpendicular to the cracks; the rectangular waveguide is used for: generating a traveling wave; the network analyzer is used for: collecting S21 parameters of the rectangular waveguide; the computer terminal is used for: and calculating the notch frequency of the rectangular waveguide according to the S21 parameters, and representing the crack characteristics of the metal to be measured according to the notch frequency.
However, the rectangular waveguide adopted by the device is a metal waveguide made of metal material (copper, aluminum, etc.) and filled with air or medium inside, and the device works in TE10In the working mode, the device has the problems of low sensitivity, large influence by the environment, incapability of being applied to complex environments such as high temperature and high humidity and the like.
Disclosure of Invention
The invention provides a crack detection device and method based on coplanar integrated mirror image dielectric waveguide, aiming at overcoming the defects of low sensitivity and limited application environment in the prior art.
In order to solve the technical problems, the technical scheme of the invention is as follows:
the invention provides a crack detection device based on a coplanar integrated mirror image dielectric waveguide, which comprises the coplanar integrated mirror image dielectric waveguide, a network analyzer and an upper computer; the coplanar setsTwo ends of the mirror image dielectric waveguide are connected with the network analyzer, and the network analyzer is externally connected with the upper computer; the coplanar integrated mirror image dielectric waveguide comprises a substrate integrated non-radiative dielectric waveguide and a substrate integrated mirror image dielectric waveguide; a transition zone is arranged between the substrate integrated non-radiative dielectric waveguide and the substrate integrated mirror image dielectric waveguide; the coplanar integrated mirror image dielectric waveguide generates traveling waves; the substrate integrated mirror dielectric waveguide is used for crack sensing and works in
Mode(s).
Placing the coplanar integrated mirror image dielectric waveguide on the metal to be tested with cracks, wherein the coplanar integrated mirror image dielectric waveguide generates traveling waves; the transmission direction of the traveling wave is vertical to the crack of the metal to be measured; the traveling wave is transmitted to the substrate integrated non-radiative dielectric waveguide through the substrate integrated mirror image dielectric waveguide and the transition zone and then input into the network analyzer to finish the acquisition of the traveling wave; the network analyzer collects traveling waves and calculates the forward transmission coefficient of the traveling waves; and the upper computer calculates the trap frequency of the coplanar integrated mirror medium waveguide according to the forward transmission coefficient of the traveling wave, and obtains the crack profile characteristics of the metal to be detected according to the trap frequency to obtain a crack detection result.
Preferably, the working mode of the substrate integrated non-radiative dielectric waveguide is TE10The part for monitoring the cracks is a substrate integrated mirror image dielectric waveguide, and the working mode is
Mode(s).
Preferably, the coplanar integrated mirror dielectric waveguide further comprises a dielectric substrate.
Preferably, the coplanar integrated mirror dielectric waveguide is periodically slotted on a dielectric substrate.
Preferably, the dielectric used for the coplanar integrated mirror dielectric waveguide comprises a ceramic dielectric.
Preferably, the dielectric constant of the ceramic medium is 10-30.
Preferably, the ceramic dielectric has a loss tangent of 0.001 to 0.003.
Preferably, the bottom wall of the coplanar integrated mirror dielectric waveguide is in an open state.
In a second aspect, the present invention further provides a crack detection method based on a coplanar integrated mirror dielectric waveguide, which is applied to the crack detection apparatus based on a coplanar integrated mirror dielectric waveguide according to any of the above schemes, and includes the following steps:
s1: placing the coplanar integrated mirror image dielectric waveguide on the metal to be tested with cracks, wherein the coplanar integrated mirror image dielectric waveguide generates traveling waves;
s2: the network analyzer collects traveling waves and calculates the forward transmission coefficient of the traveling waves;
s3: and the upper computer calculates the trap frequency of the coplanar integrated mirror medium waveguide according to the forward transmission coefficient of the traveling wave and obtains the crack profile characteristics of the metal to be detected according to the trap frequency.
Preferably, the transmission direction of the traveling wave is perpendicular to the crack of the metal to be measured.
Compared with the prior art, the technical scheme of the invention has the beneficial effects that: the TE of the substrate integrated non-radiative dielectric waveguide is formed by adopting a coplanar integrated mirror dielectric waveguide consisting of a substrate integrated non-radiative dielectric waveguide, a substrate integrated mirror dielectric waveguide and a transition band10With conversion of operating mode into substrate-integrated mirror dielectric waveguide
The working mode of the method enables the coplanar integrated mirror dielectric waveguide to generate traveling waves, calculates the trapped wave frequency of the coplanar integrated mirror dielectric waveguide with high crack detection sensitivity, and improves the detection sensitivity of the crack detection device. In addition, the coplanar integrated mirror dielectric waveguide is composed of a substrate integrated nonradiative dielectric waveguide and a substrate integrated mirror dielectric waveguide for crack sensing, and can be used for detecting different and complex environments and areas.
Drawings
Fig. 1 is a schematic structural diagram of a crack detection device based on a coplanar integrated mirror dielectric waveguide in embodiment 1.
Fig. 2 is a perspective view of a metal plate to be tested and a coplanar integrated mirror dielectric waveguide in embodiment 1.
Fig. 3 is a side view of a metal plate to be tested and a coplanar integrated mirror dielectric waveguide in example 1.
FIG. 4 is a schematic view of cracks in example 1.
Fig. 5 is a graph of the forward transmission coefficient of the first case in example 2.
Fig. 6 is a graph of the forward transmission coefficient of the second case in example 2.
FIG. 7 is a graph of notch frequency versus crack depth for a coplanar integrated mirrored dielectric waveguide as in example 2.
FIG. 8 is a flowchart of a crack detection method based on a coplanar integrated mirror dielectric waveguide in embodiment 3.
The method comprises the following steps of 1-coplanar integrated mirror image dielectric waveguide, 101-substrate integrated mirror image dielectric waveguide, 102-substrate integrated non-radiative dielectric waveguide, 103-transition zone, 2-network analyzer, 3-upper computer, 4-periodic slot position, 5-metal to be detected and 6-crack.
Detailed Description
The drawings are for illustrative purposes only and are not to be construed as limiting the patent;
for the purpose of better illustrating the embodiments, certain features of the drawings may be omitted, enlarged or reduced, and do not represent the size of an actual product;
it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
The technical solution of the present invention is further described below with reference to the accompanying drawings and examples.
Example 1
Referring to fig. 1 to fig. 3, the present embodiment provides a crack 6 detection apparatus based on a coplanar integrated mirror dielectric waveguide 1, which includes the coplanar integrated mirror dielectric waveguide 1, a network analyzer 2 and an upper computer 3; two ends of the coplanar integrated mirror image dielectric waveguide 1 are respectively connected with the network analyzer 2 through coaxial cables, and the network analyzer 2 is externally connected with the upper computer 3.
In this embodiment, the coplanar integrated mirror dielectric waveguide 1 has a dielectric strip in the middle, and is composed of a substrate integrated non-radiative dielectric waveguide 102 and a substrate integrated mirror dielectric waveguide 101, and both sides are perforated, and the waveguide is an open-structured waveguide.
In this embodiment, the operation mode of the substrate integrated non-radiative dielectric waveguide 102 is TE10Mode, the mode of operation of the substrate integrated mirror dielectric waveguide 101 is
Mode(s).
In this embodiment, the coplanar integrated mirror dielectric waveguide 1 is configured to perform periodic slotting on a dielectric substrate, where periodic slots 4 are provided, the periodic uniform slotting is equivalent to a dielectric with a low dielectric constant, and the length of the slot side limits transmission of electromagnetic waves on a central dielectric strip by using a dielectric constant difference between the central dielectric strip and slotted regions on two sides. As shown in FIG. 2, the sides of the square slots are 1.3mm with a period spacing of 1.5 mm. A transition zone 103 is arranged between the substrate integrated non-radiative dielectric waveguide 102 and the substrate integrated mirror image dielectric waveguide 101, the length sl of the transition zone 103 is 4.2mm, and the width sw is 2.5 mm. TE of substrate-integrated non-radiative dielectric waveguide 102 may be achieved by using transition zone 10310Conversion of operating mode into substrate-integrated mirrored dielectric waveguides
And (4) working modes.
In the embodiment, the coplanar integrated mirror dielectric waveguide generates traveling waves,
the mode is also called a main mode in the substrate integrated mirror image dielectric waveguide 101, and the mode can keep better transmission effect at high frequency in the transmission process of the dielectric band and can output the most important waveform of the coplanar integrated mirror image dielectric waveguide 1.
In this embodiment, the dielectric used for the coplanar integrated mirror dielectric waveguide 1 includes a ceramic dielectric. The dielectric constant of the ceramic dielectric is 10 to 30, and the tangent of the loss angle of the ceramic dielectric is 0.001 to 0.003.
In this embodiment, the bottom wall of the coplanar integrated mirror dielectric waveguide 1 is in an open state, that is, an opening is formed on one surface of the coplanar integrated mirror dielectric waveguide 1, which is in contact with the metal to be tested
In the specific implementation process, the coplanar integrated mirror image dielectric waveguide 1 with the bottom wall in an open state is placed on the metal to be tested with the crack 6, and the coplanar integrated mirror image dielectric waveguide 1 generates traveling waves; the transmission direction of the traveling wave is vertical to the crack 6 of the metal to be measured; the traveling wave is transmitted to the substrate integrated non-radiative dielectric waveguide 102 through the substrate integrated mirror image dielectric waveguide 101 and the transition zone 103 and then input into the network analyzer 2 to complete the acquisition of the traveling wave; the network analyzer 2 collects the traveling wave and calculates the forward transmission coefficient of the traveling wave; and the upper computer 3 calculates the trap frequency of the coplanar integrated mirror medium waveguide 1 according to the forward transmission coefficient of the traveling wave, and obtains the section characteristics of the crack 6 of the metal to be detected according to the trap frequency to obtain the crack 6 detection result.
Example 2
Referring to fig. 3-4, the present embodiment provides a specific application example and experimental analysis, which is applied to the apparatus for detecting a crack 6 based on the coplanar integrated mirror dielectric waveguide 1 in embodiment 1.
In this embodiment, the length (x-axis direction) of the coplanar integrated mirror dielectric waveguide 1 is 82mm, the width (y-axis direction) is 2mm, and the lengths of both ends connected to the network analyzer 2 are 1 mm. The dielectric material loaded on the coplanar integrated mirror image dielectric waveguide 1 is ceramic dielectric with the dielectric constant of 11.2, and the tangent value of the loss angle of the ceramic dielectric is 0.0023. The size of the metal to be measured is set to be 120mm multiplied by 30mm multiplied by 5mm (x-axis direction/y-axis direction/z-axis direction), the crack 6 is arranged on the surface of the metal to be measured, d represents the depth of the crack 6, w represents the width of the crack 6, and p represents the deviation amount of the center of the coplanar integrated mirror image dielectric waveguide 1 and the position of the crack 6.
The present embodiment sets the width w of the crack 6 to 1.0 mm.
The first case is set in the embodiment, namely, the position deviation between the center of the coplanar integrated mirror dielectric waveguide 1 and the crack 6 is small, and p is 0-3 mm. As shown in fig. 3, fig. 3 is a graph showing the change of the forward transmission coefficient according to the depth of the crack 6 and the deviation of the center of the coplanar integrated mirror dielectric waveguide 1 from the position of the crack 6 in the first case, wherein the depth d of the crack 6 is changed from 0.4mm to 1.2mm in steps of 0.4mm, and the deviation p of the center of the coplanar integrated mirror dielectric waveguide 1 from the position of the crack 6 is changed from 0mm to 3mm in steps of 1 mm.
The second case is set in the embodiment, namely, the position deviation between the center of the coplanar integrated mirror dielectric waveguide 1 and the crack 6 is large, and p is 0-30 mm. As shown in fig. 4, fig. 4 is a graph showing the change of the forward transmission coefficient according to the depth of the crack 6 and the deviation of the center of the coplanar integrated mirror dielectric waveguide 1 from the position of the crack 6 in the second case, wherein the depth d of the crack 6 is changed from 0.4mm to 1.2mm in steps of 0.4mm, and the deviation of the center of the coplanar integrated mirror dielectric waveguide 1 from the position of the crack 6 is changed from 0mm to 30mm in steps of 10 mm.
As shown in fig. 5, the notch frequency of the coplanar integrated mirror dielectric waveguide 1 is plotted against the depth of the crack 6. As can be seen from fig. 5, at a certain crack 6 depth, the trap frequency of the coplanar integrated mirror dielectric waveguide 1 is limited to a certain range.
The deviation p between the center of the coplanar integrated mirror dielectric waveguide 1 and the position of the crack 6 is 0-3 mm, and when the depth d of the crack 6 is 0.4mm, the notch frequency is about 34.898 GHz; when the depths d of the cracks 6 are respectively 0.8mm, the notch frequency range is about 31.430 GHz; when the depths d of the cracks 6 are respectively 1.2mm, the notch frequency ranges are about 28.323GHz, and it can be seen that the notch frequency ranges of the coplanar integrated mirror image dielectric waveguide 1 do not overlap under different depths of the cracks 6. During the change of the depth of the crack 6, the section of the crack 6 is from 0.40mm2Change to 1.20mm2The detection sensitivity reaches 8.294GHz/mm2。
The deviation p between the center of the coplanar integrated mirror dielectric waveguide 1 and the position of the crack 6 is 0-30 mm, and when the depth d of the crack 6 is 0.4mm, the notch frequency is about 34.885 GHz; when the depths d of the cracks 6 are respectively 0.8mm, the notch frequency range is 30.929 GHz; when the depths d of the cracks 6 are respectively 1.2mm, the notch frequency range is about 28.285GHz, and the coplanar integrated mirror image medium can be seen under different depths of the cracks 6The notch frequency ranges of the waveguides 1 do not overlap. During the change of the depth of the crack 6, the section of the crack 6 is from 0.40mm2Change to 1.20mm2The detection sensitivity reaches 8.205GHz/mm2。
From the two situations, the crack 6 detection device based on the coplanar integrated mirror dielectric waveguide 1 has high detection sensitivity on the crack 6, is not influenced by the position deviation change of the center of the coplanar integrated mirror dielectric waveguide 1 and the crack 6, and has average detection sensitivity of 8.235GHz/mm2
Example 3
Referring to fig. 6, the present embodiment provides a method for detecting a crack 6 based on a coplanar integrated mirror dielectric waveguide 1, which is applied to a device for detecting a crack 6 based on a coplanar integrated mirror dielectric waveguide 1 provided in embodiment 1, and specifically includes the following steps:
s1: placing the coplanar integrated mirror image dielectric waveguide 1 on a metal to be tested with a crack 6, wherein the coplanar integrated mirror image dielectric waveguide 1 generates a traveling wave; the transmission direction of the traveling wave is vertical to the crack 6 of the metal to be measured;
s2: the network analyzer 2 collects the traveling wave and calculates the forward transmission coefficient of the traveling wave;
s3: and the upper computer 3 calculates the trap frequency of the coplanar integrated mirror medium waveguide 1 according to the forward transmission coefficient of the traveling wave, and obtains the section characteristics of the crack 6 of the metal to be detected according to the trap frequency.
Example 4
The embodiment also provides a detection device, which is used together with the crack 6 detection device based on the coplanar integrated mirror dielectric waveguide 1, and comprises a processor and a memory.
The memory is used for storing codes, and the codes stored by the memory comprise program execution codes for using the crack 6 detection method based on the coplanar integrated mirror image dielectric waveguide 1, which is proposed by the embodiment 2; the memory also transmits the program execution code to the processor.
The processor executes the method for detecting the crack 6 based on the coplanar integrated mirror dielectric waveguide 1, which is provided in embodiment 2, according to the instructions in the program execution code, so that the apparatus for detecting the crack 6 based on the coplanar integrated mirror dielectric waveguide 1, which is provided in embodiment 1, starts to work.
The terms describing positional relationships in the drawings are for illustrative purposes only and are not to be construed as limiting the patent;
it should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Other variations and modifications will be apparent to persons skilled in the art in light of the above description. And are neither required nor exhaustive of all embodiments. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (10)
1. A crack detection device based on a coplanar integrated mirror dielectric waveguide is characterized by comprising the coplanar integrated mirror dielectric waveguide, a network analyzer and an upper computer;
two ends of the coplanar integrated mirror image dielectric waveguide are connected with the network analyzer, and the network analyzer is externally connected with the upper computer;
the coplanar integrated mirror image dielectric waveguide comprises a substrate integrated non-radiative dielectric waveguide and a substrate integrated mirror image dielectric waveguide, and a transition zone is arranged between the substrate integrated non-radiative dielectric waveguide and the substrate integrated mirror image dielectric waveguide; the coplanar integrated mirror image dielectric waveguide generates traveling waves; the substrate integrates a mirrored dielectric waveguide for crack sensing.
2. The apparatus according to claim 1, wherein the mode of operation of the substrate-integrated nonradiative dielectric waveguide is TE10The mode of operation of the substrate integrated mirror image dielectric waveguide is
Mode(s).
3. The coplanar integrated mirror dielectric waveguide-based crack detection device as claimed in claim 1, wherein the coplanar integrated mirror dielectric waveguide further comprises a dielectric substrate.
4. The device as claimed in claim 3, wherein the coplanar integrated mirror dielectric waveguide is periodically grooved on the dielectric substrate.
5. The coplanar integrated mirror dielectric waveguide-based crack detection device as claimed in claim 1, wherein the coplanar integrated mirror dielectric waveguide loaded dielectric comprises a ceramic dielectric.
6. The crack detection device based on the coplanar integrated mirror dielectric waveguide as claimed in claim 5, wherein the dielectric constant of the ceramic dielectric is 10-30.
7. The device of claim 5, wherein the tangent of the loss angle of the ceramic dielectric is 0.001-0.003.
8. The device as claimed in claim 1, wherein the bottom wall of the coplanar integrated mirror dielectric waveguide is open.
9. A crack detection method based on a coplanar integrated mirror dielectric waveguide is characterized by comprising the following steps:
s1: placing the coplanar integrated mirror image dielectric waveguide on the metal to be tested with cracks, wherein the coplanar integrated mirror image dielectric waveguide generates traveling waves;
s2: the network analyzer collects traveling waves and calculates the forward transmission coefficient of the traveling waves;
s3: and the upper computer calculates the trap frequency of the coplanar integrated mirror medium waveguide according to the forward transmission coefficient of the traveling wave and obtains the crack profile characteristics of the metal to be detected according to the trap frequency.
10. The method as claimed in claim 9, wherein the traveling wave is transmitted in a direction perpendicular to the crack of the metal to be tested.
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| CN112683930A (en) * | 2020-12-11 | 2021-04-20 | 广东工业大学 | Detection device and method for metal cracks |
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