CN113836073A - Weapon system test data processing method, device and equipment - Google Patents

Weapon system test data processing method, device and equipment Download PDF

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Publication number
CN113836073A
CN113836073A CN202110872327.8A CN202110872327A CN113836073A CN 113836073 A CN113836073 A CN 113836073A CN 202110872327 A CN202110872327 A CN 202110872327A CN 113836073 A CN113836073 A CN 113836073A
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Prior art keywords
test data
storage unit
data
weapon system
central processing
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Inventor
张锐
鲜于琳
查坤
汤恒
仁钦
郑广春
唐浩
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Hubei Sanjiang Aerospace Wanfeng Technology Development Co Ltd
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Hubei Sanjiang Aerospace Wanfeng Technology Development Co Ltd
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Priority to CN202110872327.8A priority Critical patent/CN113836073A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus
    • G06F13/42Bus transfer protocol, e.g. handshake; Synchronisation
    • G06F13/4282Bus transfer protocol, e.g. handshake; Synchronisation on a serial bus, e.g. I2C bus, SPI bus
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus
    • G06F13/382Information transfer, e.g. on bus using universal interface adapter
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F2213/00Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F2213/0026PCI express

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  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The invention discloses a weapon system data processing method, which comprises the following steps: loading a bootstrap program, and acquiring and executing a system instruction in a system storage unit; receiving test data of the whole operation process of the weapon system according to the system instruction, and storing the test data in a data storage unit different from the system storage unit; and carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data, and sending an obtained detection result to an upper computer. The method can solve the problems that in the prior art, data of the whole operation process of a weapon system cannot be stored, so that the weapon system cannot be quickly positioned after a fault occurs in the operation process, and historical data cannot be analyzed and predicted.

Description

Weapon system test data processing method, device and equipment
Technical Field
The present invention relates to the technical field of military data processing, and in particular, to a method for processing weapon system test data, a device for processing weapon system test data, and a computer-readable storage medium.
Background
In the early weapon system test, only the test result is stored and analyzed, the data of the whole weapon system operation process cannot be stored, the failure in the operation process cannot be quickly positioned, the historical data cannot be analyzed and predicted, the key technology of the weapon system cannot be promoted, the core device depends on an imported commercial device, the commercial device is often updated quickly, the information safety cannot be guaranteed, and the application of the information storage device is limited.
Along with the development of weapon systems, the data quantity and data value of each system test are higher and higher, the data storage analysis of the whole operation process of the weapon system is more and more important, and the efficient and safe information storage and transmission become the essential characteristics for the development of weapon equipment information storage technology in the face of more and more complex electromagnetic environments. Meanwhile, the interface mode of the test object leads to the customization of the interface of the storage device due to the characteristics of diversity, application technical complexity and the like, and the requirements of low cost and generalization of the device are difficult to meet. Therefore, how to perform generalized safe storage and utilization on the information data of the whole operation process of the weapon system is a problem to be solved at present.
Disclosure of Invention
In view of the above defects or improvement needs of the prior art, the present invention provides a weapon system data processing method, a weapon system data processing device, a weapon system data processing apparatus, and a computer readable storage medium, which can solve the problems that data of the whole operation process of a weapon system cannot be stored, so that the data cannot be quickly located after a fault occurs in the operation process, and further, historical data cannot be analyzed and predicted.
In one aspect, an embodiment of the present invention provides a method for processing weapon system test data, including: loading a bootstrap program, and acquiring and executing a system instruction in a system storage unit; receiving test data of the whole operation process of the weapon system according to the system instruction, and storing the test data in a data storage unit different from the system storage unit; and carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data, and sending an obtained detection result to an upper computer.
In an embodiment of the present invention, the receiving test data of the whole operation process of the weapon system includes: the programmable logic device is connected through a PCIE (peripheral component interconnect express) data bus, and the test data is received through a CAN (Controller Area Network) bus interface, an RS-422 bus interface, and a 1553B bus interface extended by the programmable logic device.
In an embodiment of the present invention, the data storage unit is an SSD solid state disk, the test data is stored through a Serial ATA (SATA) interface, and the data storage unit stores a self-destruction program for implementing data self-destruction or physical self-destruction when receiving a self-destruction instruction.
In an embodiment of the present invention, the data storage unit is directly connected to a central processing unit through the SATA interface, or is connected to the central processing unit after being transferred to the PCIE bus interface through the SATA interface, and is configured to receive the test data.
On the other hand, an embodiment of the present invention provides a weapon system test data processing apparatus, including: the bootstrap program loading module is used for loading the bootstrap program and acquiring and executing the system instruction in the system storage unit; the test data storage module is used for receiving test data of the whole operation process of the weapon system according to the system instruction and storing the test data in a data storage unit different from the system storage unit; and the fault detection and analysis module is used for carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data and sending an obtained detection result to an upper computer.
In another aspect, an embodiment of the present invention provides a weapon system test data processing apparatus, including: the weapon system test data processing system comprises a central processing unit and a storage unit connected with the central processing unit, wherein the central processing unit is used for executing the weapon system test data processing method in any one of the embodiments.
In one embodiment of the invention, the weapon system test data processing apparatus further comprises: the programmable logic device is connected with the central processing unit, the central processing unit is of a domestic Loongson LS2K1000 type, the programmable logic device is of a domestic Compound Dan micro JFM7K325T type, is connected with the central processing unit through a PCIE bus interface, and is expanded with a CAN bus interface, an RS-422 bus interface and a 1553B bus interface.
In one embodiment of the present invention, the storage unit includes: the system comprises a system storage unit NAND FLASH (computer flash memory device), a data storage unit SSD (solid state disk), the data storage unit SSD is connected with the central processing unit through an SATA interface, and the data storage unit stores a self-destruction program for realizing data self-destruction or physical self-destruction when receiving a self-destruction instruction.
In one embodiment of the invention, the weapon system test data processing apparatus further comprises: the system comprises an Ethernet interface, an Ethernet transceiver and an upper computer, wherein the Ethernet interface is connected between the central processing unit and the Ethernet interface, and the Ethernet interface is connected with the upper computer.
In yet another aspect, an embodiment of the present invention provides a computer-readable storage medium storing computer-executable instructions for performing a weapon system test data processing method according to any one of the above embodiments.
As can be seen from the above, the above solution contemplated by the present invention may have one or more of the following advantages compared to the prior art:
(1) the testing data of the whole operation process of the weapon system is received by the central processing unit, the testing data of the whole operation process of the weapon system is stored to a data storage unit different from a system storage unit by the SATA interface, fault detection and analysis are carried out according to a fault processing program pre-stored in the data storage unit and the testing data, faults occurring in the operation process of the weapon system can be quickly positioned, analysis and prediction are carried out according to historical data, and a corresponding solution is provided; (ii) a
(2) The central processing unit is connected with the CAN bus interface, the RS-422 bus interface, the 1553B bus interface and other generalized interfaces extended by the programmable logic device, so that the diversity of interface modes of a test object CAN be met under the condition of customizing the interface of the storage device, and the cost of the device is reduced;
(3) the data storage unit is used for storing a self-destruction program, realizing data self-destruction or physical self-destruction when receiving a self-destruction instruction sent by the central processing unit, completely preventing data leakage of a weapon system, improving the autonomous guarantee capability, and realizing safe information storage and transmission by adopting a domestic core device;
(4) the data storage units are directly connected with the central processing unit through SATA interfaces or connected with the central processing unit through SATA interfaces after being connected with the SSSE9170 transceiver and then being connected with the central processing unit after being switched to the PCIE bus interface, so that backup of test data of the plurality of data storage units can be realized, and internal resources of the central processing unit are saved.
Other aspects and features of the present invention will become apparent from the following detailed description, which proceeds with reference to the accompanying drawings. It is to be understood, however, that the drawings are designed solely for purposes of illustration and not as a definition of the limits of the invention. It should be further understood that the drawings are not necessarily drawn to scale and that, unless otherwise indicated, they are merely intended to conceptually illustrate the structures and procedures described herein.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a flow chart of a weapon system test data processing method provided by an embodiment of the invention;
FIG. 2 is a schematic diagram of a connection structure between a memory unit and a CPU according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a weapon system test data processing device according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a weapon system test data processing device according to an embodiment of the present invention;
FIG. 5 is a schematic structural diagram of a weapon system test data processing device according to an embodiment of the present invention;
FIG. 6 is a schematic structural diagram of another specific configuration of a weapon system test data processing device according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of a computer-readable storage medium according to an embodiment of the present invention.
Description of the reference numerals
S11-S13: a step of weapon system test data processing method;
20: weapon system test data processing unit; 201: a bootstrap loading module; 202: a test data storage module; 203: a fault detection and analysis module;
30: weapon system test data processing equipment; 31: a central processing unit; 32: a storage unit; 321: a system storage unit; 322: a data storage unit; 33: a programmable logic device; 34: an Ethernet interface; 35: an Ethernet transceiver; 36: an upper computer;
40: a computer readable storage medium.
Detailed Description
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The invention will be described in connection with embodiments with reference to the drawings.
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments should fall into the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein are, for example, capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the method is simple. The terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It should be noted that the division of the embodiments of the present invention is only for convenience of description and should not be construed as a limitation, and features of various embodiments may be combined and referred to each other without contradiction.
[ first embodiment ] A method for manufacturing a semiconductor device
As shown in fig. 1, a first embodiment of the present invention provides a method for processing weapon system test data, which includes the following steps: step S11 is to load the boot program, and to obtain and execute the system instruction in the system storage unit; step S12, receiving test data of the whole operation process of the weapon system according to the system instruction, and storing the test data in a data storage unit different from the system storage unit; step S13 performs fault detection and analysis according to the fault handling program pre-stored in the data storage unit and the received test data, and sends the obtained detection result to the upper computer.
In step S11, the CPU (central processing unit ) controls the loading of the boot program, for example, the model of the central processing unit is, for example, a home-made loongson LS2K1000, and the loongson PMON is connected through an SPI (Serial Peripheral Interface), so that the boot program is loaded and the system is controlled to start. The central processing unit is connected with a system storage unit, a program and an instruction of a control system are stored in the system storage unit, and the central processing unit starts to execute test data processing after receiving the system instruction.
In step S12, the cpu is further connected to a data storage unit different from the system storage unit, and receives test data of the whole operation process of the weapon, for example, test data of conventional measurement parameters such as temperature, noise, pressure, displacement, speed, acceleration, etc., and stores the received test data in the data storage unit when the weapon is used for testing. Specifically, the system storage unit is, for example, NAND FLASH (computer flash memory device), the central processing unit is connected to the system storage unit through its own NAND controller, the data storage unit is, for example, (Solid State Disk), and the central processing unit is connected to the data storage unit through a Serial ATA (Serial ATA) interface for storing the test data.
In step S13, the data storage unit stores a failure handling program in advance, performs failure detection and analysis after receiving the test data, searches the failure mode database according to the detection result, and provides corresponding handling measures and suggestions, and the central processing unit sends the detection result to the connected upper computer to notify the user. Reference to a host computer is made, for example, to a personal computer, hand-held device, portable device, tablet device, multiprocessor system, microprocessor-based system, editable consumer electronics, network PC, minicomputer, mainframe computer, distributed computing environment that includes any of the above systems or devices, and the like.
At present, when an existing weapon system is tested, test data is stored in a storage unit where a control system is located, and due to the fact that the storage space of the system storage unit is limited and crosstalk with the test data is likely to occur, only part of key data is stored, for example, test results obtained by calculating and processing various parameters by a central processing unit cannot be stored in the whole operation process of the weapon system, so that the test data cannot be quickly positioned after a fault occurs in the operation process, and historical data cannot be analyzed and predicted. According to the technical scheme, the test data of the weapon system in the whole operation process are stored to the data storage unit different from the system storage unit through the SATA interface, fault detection and analysis are carried out according to the fault processing program pre-stored in the data storage unit and the test data, faults occurring in the weapon system in the operation process can be quickly positioned, analysis and prediction are carried out according to historical data, and a corresponding solution is provided.
Further, the receiving test data of the whole operation process of the weapon system specifically includes: the central processing unit is connected with the programmable logic device through a Peripheral Component Interface (PCIE) data bus, and receives the test data through a Controller Area Network (CAN) bus interface, an RS-422 bus interface and a 1553B bus interface extended by the programmable logic device. The type of the programmable logic device is, for example, national micro purple light HXI15H4G160AF-13K, the programmable logic device is connected with an RS422 interface through an isolation RS422 transceiver with the type of ADM2682E, is connected with a CAN interface through a CAN controller, and is connected with a 1553B interface through a 1553B controller with the type of LHB 155034. Therefore, the general interface expanded by the programmable logic device is connected with the central processing unit, so that the diversity of the interface modes of the test object can be met under the condition of customizing the interface of the storage device, and the cost of the equipment is reduced; .
Further, as shown in fig. 2, the data storage unit stores, for example, a self-destruction program, which is used to implement data self-destruction or physical self-destruction when receiving a self-destruction instruction sent by the central processing unit. Therefore, data leakage of the weapon system can be completely prevented, the autonomous guarantee capability is improved, and the safety of data storage is further guaranteed by adopting a domestic core device.
Furthermore, the data storage units are directly connected with the central processing unit through SATA interfaces or connected with the SSSE9170 transceiver through SATA interfaces and then are connected with the central processing unit after being switched to the PCIE bus interface for receiving test data, so that the test data can be backed up by the data storage units, and internal resources of the central processing unit are saved.
In summary, in the method for processing weapon system test data provided in the embodiments of the present invention, the central processing unit receives test data of the whole operation process of the weapon system, the SATA interface stores the test data of the whole operation process of the weapon system to the data storage unit different from the system storage unit, and the fault detection and analysis are performed according to the fault processing program and the test data pre-stored in the data storage unit, so that the fault occurring in the operation process of the weapon system can be quickly located, and the analysis and prediction are performed according to the historical data, thereby providing a corresponding solution; the central processing unit is connected with the CAN bus interface, the RS-422 bus interface, the 1553B bus interface and other generalized interfaces extended by the programmable logic device, so that the diversity of interface modes of a test object CAN be met under the condition of customizing the interface of the storage device, and the cost of the device is reduced; the data storage unit is used for storing a self-destruction program, realizing data self-destruction or physical self-destruction when receiving a self-destruction instruction sent by the central processing unit, completely preventing data leakage of a weapon system, improving the autonomous guarantee capability, and realizing safe information storage and transmission by adopting a domestic core device; the data storage units are directly connected with the central processing unit through SATA interfaces or connected with the central processing unit through SATA interfaces after being connected with the SSSE9170 transceiver and then being connected with the central processing unit after being switched to the PCIE bus interface, so that backup of test data of the plurality of data storage units can be realized, and internal resources of the central processing unit are saved.
[ second embodiment ]
As shown in fig. 3, a second embodiment of the present invention provides a weapon system test data processing device 20, for example, including: a bootstrap loading module 201, a test data storage module 202 and a failure detection analysis module.
The boot program loading module 201 is configured to load a boot program, and obtain and execute a system instruction in a system storage unit. The test data storage module 202 is used for receiving test data of the whole operation process of the weapon system according to the system instruction and storing the test data in a data storage unit different from the system storage unit. The fault detection and analysis module 203 is used for carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data and sending an obtained detection result to an upper computer.
The weapon system test data processing method implemented by the weapon system test data processing device 20 disclosed in the second embodiment of the present invention is as described in the first embodiment, and therefore, will not be described in detail herein. Optionally, each module and the other operations or functions in the second embodiment are respectively for implementing the method described in the first embodiment, and the beneficial effects of this embodiment are the same as those of the first embodiment, and for brevity, are not described herein again.
[ third embodiment ]
As shown in fig. 4, a third embodiment of the present invention proposes a weapon system test data processing apparatus 30, for example, including: a central processing unit 31 and a storage unit 32 connected to the central processing unit 31.
Further, as shown in fig. 5, the weapon system test data processing device 30 further includes, for example: the programmable logic device 33 is connected with the central processing unit 31, the model of the central processing unit 31 is, for example, domestic Loongson LS2K1000, the model of the programmable logic device 33 is, for example, domestic Compound Dan Mi JFM7K325T, the programmable logic device 33 is connected with the central processing unit 31 through a PCIE bus interface, and a CAN bus interface, an RS-422 bus interface and a 1553B bus interface are expanded.
Further, the storage unit includes, for example: a system storage unit 321 and a data storage unit 322, where the system storage unit 321 is, for example, NAND FLASH (computer flash memory device), the data storage unit 322 is, for example, an SSD solid state disk, and is connected to the central processing unit 31 through a SATA interface, and the data storage unit 322 stores a self-destruction program for implementing data self-destruction or physical self-destruction when receiving a self-destruction instruction.
Further, the weapon system test data processing device 30 includes, for example: ethernet interface 34, ethernet transceiver 35 and host computer 36, ethernet transceiver 35 connects between central processing unit 31 and ethernet interface 34, and ethernet interface 34 connects host computer 36. Reference to a host computer is made, for example, to a personal computer, hand-held device, portable device, tablet device, multiprocessor system, microprocessor-based system, editable consumer electronics, network PC, minicomputer, mainframe computer, distributed computing environment that includes any of the above systems or devices, and the like.
Further, as shown in fig. 6, the weapon system test data processing device 30 further includes, for example: a loongson PMON, a DDR3 (third generation double data rate dynamic random access memory), an MCU (micro controller Unit), a USB interface and a power supply which are connected with the central processing Unit 31.
The central processing unit 31 is used for implementing the weapon system test data processing method as described in the first embodiment. For the sake of brevity, details of the method for processing the weapon system test data may refer to the method described in the first embodiment, and the beneficial effect of the weapon system test data processing apparatus 30 provided in this embodiment is the same as the beneficial effect of the method for processing the weapon system test data provided in the first embodiment.
[ fourth example ] A
As shown in fig. 7, a fourth embodiment of the present invention provides a computer-readable storage medium 40, where the computer-readable storage medium 40 is a non-volatile memory and stores computer-readable instructions, and when the computer-readable instructions are executed by one or more processors, the one or more processors are caused to execute the weapon system test data processing method according to the first embodiment. For the sake of brevity, details are not repeated herein, and the beneficial effect of the computer-readable storage medium 40 provided by this embodiment is the same as that of the weapon system test data processing method provided by the first embodiment.
In addition, it should be understood that the foregoing embodiments are merely exemplary illustrations of the present invention, and the technical solutions of the embodiments can be arbitrarily combined and collocated without conflict between technical features and structural contradictions, which do not violate the purpose of the present invention.
In the embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and/or method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units/modules is only one logical division, and there may be other divisions in actual implementation, for example, multiple units or modules may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units/modules described as separate parts may or may not be physically separate, and parts displayed as units/modules may or may not be physical units, may be located in one place, or may be distributed on multiple network units. Some or all of the units/modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
In addition, each functional unit/module in the embodiments of the present invention may be integrated into one processing unit/module, or each unit/module may exist alone physically, or two or more units/modules may be integrated into one unit/module. The integrated units/modules may be implemented in the form of hardware, or may be implemented in the form of hardware plus software functional units/modules.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (10)

1. A weapon system test data processing method, comprising:
loading a bootstrap program, and acquiring and executing a system instruction in a system storage unit;
receiving test data of the whole operation process of the weapon system according to the system instruction, and storing the test data in a data storage unit different from the system storage unit;
and carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data, and sending an obtained detection result to an upper computer.
2. The method of claim 1, wherein receiving test data for the entire course of operation of the weapon system comprises: and the PCIE data bus is connected with a programmable logic device, and the test data is received through a CAN bus interface, an RS-422 bus interface and a 1553B bus interface which are extended by the programmable logic device.
3. The weapon system test data processing method according to claim 1, wherein the data storage unit is SSD, stores the test data through SATA interface, and stores self-destruction program for implementing data self-destruction or physical self-destruction upon receiving self-destruction instruction.
4. The method as claimed in claim 3, wherein the data storage unit is connected to the cpu directly via the SATA interface or connected to the cpu after being switched to the PCIE bus interface via the SATA interface, and configured to receive the test data.
5. A weapons systems test data processing apparatus, comprising:
the bootstrap program loading module is used for loading the bootstrap program and acquiring and executing the system instruction in the system storage unit;
the test data storage module is used for receiving test data of the whole operation process of the weapon system according to the system instruction and storing the test data in a data storage unit different from the system storage unit;
and the fault detection and analysis module is used for carrying out fault detection and analysis according to a fault processing program pre-stored in the data storage unit and the received test data and sending an obtained detection result to an upper computer.
6. A weapons systems test data processing apparatus, comprising: a central processing unit and a memory unit connected with the central processing unit, wherein the central processing unit is used for executing the weapon system test data processing method of any one of claims 1-4.
7. The weapons systems test data processing apparatus of claim 6, further including: the programmable logic device is connected with the central processing unit, the central processing unit is of a domestic Loongson LS2K1000 type, the programmable logic device is of a domestic Compound Dan micro JFM7K325T type, is connected with the central processing unit through a PCIE bus interface, and is expanded with a CAN bus interface, an RS-422 bus interface and a 1553B bus interface.
8. The weapons system test data processing apparatus of claim 6, wherein the memory unit includes: the system comprises a system storage unit NAND FLASH (computer flash memory device), a data storage unit SSD (solid state disk), the data storage unit SSD is connected with the central processing unit through an SATA interface, and the data storage unit stores a self-destruction program for realizing data self-destruction or physical self-destruction when receiving a self-destruction instruction.
9. The weapons systems test data processing apparatus of claim 6, further including: the system comprises an Ethernet interface, an Ethernet transceiver and an upper computer, wherein the Ethernet interface is connected between the central processing unit and the Ethernet interface, and the Ethernet interface is connected with the upper computer.
10. A computer-readable storage medium storing computer-executable instructions for performing the weapon system test data processing method according to any one of claims 1 to 4.
CN202110872327.8A 2021-07-30 2021-07-30 Weapon system test data processing method, device and equipment Pending CN113836073A (en)

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