CN113767274A - Gas analyzer - Google Patents
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- CN113767274A CN113767274A CN201980096050.5A CN201980096050A CN113767274A CN 113767274 A CN113767274 A CN 113767274A CN 201980096050 A CN201980096050 A CN 201980096050A CN 113767274 A CN113767274 A CN 113767274A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
- G01N21/276—Calibration, base line adjustment, drift correction with alternation of sample and standard in optical path
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
- G01N2021/3509—Correlation method, e.g. one beam alternating in correlator/sample field
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Abstract
The invention provides a gas analyzer. The gas analyzer includes: a light source (110); a light splitter (150) that splits the light emitted by the light source into measurement light and reference light; a measurement arm (510) in which a gas to be measured is filled, and a reference arm (530) in which a reference gas is filled, the measurement light being propagated through the measurement arm, and the reference light being propagated through the reference arm; an optical detector (750) that receives light propagating through the measurement arm and light propagating through the reference arm and converts the received light into an electrical signal; and an encoder (300) disposed between the beam splitter and the measurement and reference arms, wherein the encoder is configured to encode one of the measurement light and the reference light and block the other of the measurement light and the reference light. Therefore, the structure of the gas analyzer can be simplified.
Description
Technical Field
The present invention relates to a gas analyzer.
Background
A gas analyzer, also referred to as a gas analyzer, may be configured to analyze gas components. For example, as a gas analyzer, an optical gas analyzer analyzes gas components by using the characteristic that a specific component in a gas has different absorptance on light of a specific wavelength. Specifically, the light may first illuminate the gas to be analyzed. The light transmitted through the gas to be analyzed in a transmissive manner can then be received by means of a photosensor to obtain the intensity of the light transmitted through the gas to be analyzed in a transmissive manner. The component in the gas to be analyzed absorbs light of a specific wavelength and the intensity of light transmitted through the gas to be analyzed becomes small in a transmissive manner, and thus, for example, by comparing the reduced intensity of light transmitted through the gas to be analyzed with the intensity of reference light, the component in the gas to be analyzed and the content thereof can be determined.
Disclosure of Invention
The present invention is to solve the foregoing and/or other technical problems and to provide a gas analyzer.
According to an exemplary embodiment, a gas analyzer includes: a light source; a light splitter that splits the light emitted by the light source into measurement light and reference light; a measurement arm in which a gas to be measured is filled, and a reference arm in which a reference gas is filled, the measurement light propagating through the measurement arm, and the reference light propagating through the reference arm; an optical detector (750) that receives light propagating through the measurement arm and light propagating through the reference arm and converts the received light into an electrical signal; and an encoder (300) disposed between the beam splitter and the measurement and reference arms, wherein the encoder is configured to encode one of the measurement light and the reference light and block the other of the measurement light and the reference light.
The gas analyzer includes a grating disposed between the light source and the optical splitter, wherein the grating is configured to separate the light emitted from the light source into a plurality of light beams having different wavelengths.
The gas analyzer includes a lens unit, an optical coupler, and a position adjuster, wherein the lens unit is configured to direct the light propagating through the measurement arm and the light propagating through the reference arm to enter the optical coupler, the optical coupler is configured to direct the light directed by the lens unit to illuminate the optical detector, and the position adjuster is configured to adjust a position of the optical detector such that the optical detector is located at a focal point of the optical coupler.
The encoder includes: an encoding pattern configured to allow at least a portion of one of the measurement light or the reference light to pass through the encoding pattern and propagate to the measurement arm or the reference arm in a transmissive manner to encode the light beam; and a light blocking pattern configured to block the other of the measurement light or the reference light from transmitting through the light blocking pattern.
The encoding pattern includes a plurality of encoding patterns different from each other, and the encoder is configured to encode one of the measurement light or the reference light at a preset time by means of one of the plurality of encoding patterns different from each other, and block the other of the measurement light and the reference light.
The encoding pattern includes a plurality of encoding patterns different from each other, and the encoder is configured to encode one of the measurement light or the reference light for a preset period of time by means of a plurality of encoding patterns of the plurality of encoding patterns different from each other, and block the other of the measurement light and the reference light.
The encoding pattern includes an encoding pattern that complies with a walsh-hadamard algorithm, and the encoder is configured to encode one of the measurement light or the reference light by means of the pattern that complies with the walsh-hadamard algorithm, and block the other of the measurement light and the reference light.
The encoder includes a circular encoding chip, wherein the encoding pattern is located on at least one sector of the circular encoding chip.
The circular encoding chip is configured to rotate between the beam splitter and the measurement and reference arms such that the sector in which the encoding pattern is located at a first position between the beam splitter and the measurement arm to encode the measurement light or a second position between the beam splitter and the reference arm to encode the reference light.
The shading pattern is located at a sector of the circular coding chip, the sector being symmetrical to the sector where the coding pattern is located with respect to a center of the circular coding chip, such that the sector where the coding pattern is located at the first position between the beam splitter and the measuring arm to block the reference light when the measurement light is coded, or the sector where the coding pattern is located at the second position between the beam splitter and the measuring arm to block the measurement light when the reference light is coded.
The encoder includes a display, wherein the display is configured to display the encoding pattern at the first position between the beam splitter and the measurement arm to encode the measurement light or the encoding pattern at the second position between the beam splitter and the reference arm to encode the reference light.
The display is configured to display the light blocking pattern at the second position to block the reference light when the coding pattern is displayed at the first position, or to display a blocking pattern at the first position to block the measurement light when the coding pattern is displayed at the second position.
The display includes at least one of a liquid crystal display and a digital micromirror device.
The gas analyzer includes: a processor configured to receive the electrical signal from the optical detector and to obtain information relating to the gas to be measured from the received electrical signal.
The encoder includes an encoding pattern configured to allow at least a portion of one of the measurement light or the reference light to pass through the encoding pattern and propagate in transmission to the measurement arm or the reference arm to encode the optical beam, wherein the processor is configured to be capable of performing a decoding process on a received electrical signal corresponding to the encoded light by using a time-wavelength mapping algorithm, a Fourier (Fourier) transform algorithm, and a walsh-hadamard transform algorithm.
According to an exemplary embodiment, an encoder including an encoding pattern and a light shielding pattern is disposed between a light source unit and a measurement unit; when encoding one of the measurement light and the reference light, the other of the measurement light and the reference light may be blocked such that at the same time, only the encoded measurement light or only the encoded reference light passes through the gas or reference gas to be measured and reaches the measurement unit. Accordingly, the gas analyzer according to the exemplary embodiment may have a simplified structure.
Drawings
The following drawings are designed to schematically illustrate and explain the present invention and are not intended to limit the scope of the invention, wherein:
FIG. 1 is a schematic block diagram showing a gas analyzer according to an exemplary embodiment;
FIG. 2 is a schematic diagram showing an encoder according to an exemplary embodiment; and
FIG. 3 is a schematic diagram showing rotation of an encoder according to an exemplary embodiment.
List of reference numerals:
100 light source units; 300 an encoder; 500 a measurement unit;
700 a detection unit; 900 processor
110 light sources; 13 grating; 150 light splitter
510 a measuring arm; 530 reference arm
710 a lens unit; 530 an optical coupler; 750 an optical detector; 770 position regulator
Detailed Description
In order that the technical features, objects, and effects of the present invention can be more clearly understood, specific embodiments of the present invention will be described with reference to the accompanying drawings.
Fig. 1 is a schematic block diagram showing a gas analyzer according to an exemplary embodiment. As shown in fig. 1, the gas analyzer may include a light source unit 100, an encoder 300, a measurement unit 500, and a detection unit 700.
The light source unit 100 may include a light source 110 and a beam splitter 150. The light source 110 may emit light of a particular wavelength (as shown by the solid arrowed lines in fig. 1) for performing gas analysis. The light source 110 may be a single light source emitting light of one wavelength, or a composite light source emitting light of multiple wavelengths. For example, when the light source 110 is implemented as a composite light source, the light source unit 100 may include a grating 130 disposed between the light source 110 and the light splitter 150 such that the grating may separate the composite light of the plurality of wavelengths emitted from the light source into a plurality of light beams of different wavelengths. In this way, separate lights of different wavelengths may illuminate different positions of the encoder 300 after passing through the beam splitter 150.
The beam splitter 150 may split the light emitted by the light source 110 into measurement light and reference light having different directions (as shown by the solid arrow lines in fig. 1). Herein, the measurement light and the reference light transmitted through the beam splitter 150 in a transmission manner may have the same optical intensity. For example, when the light source 110 is configured as a composite light source emitting composite light of a plurality of wavelengths, the beam splitter 150 may split a plurality of light beams, which pass through the grating 130 and are separated into a plurality of lights having different wavelengths from each other, into the measurement light and the reference light, respectively, so that the plurality of light beams included in the measurement light and the plurality of light beams included in the reference light may be identical to each other and may have the same optical intensity. In other words, the measurement light and the reference light may be identical to each other, except for the illumination of the measurement arm 510 and the reference arm 530. However, exemplary embodiments are not limited thereto, the measurement light and the reference light may include light of a specific wavelength and light of a specific intensity, respectively, and finally, it is acceptable to consider the initial wavelength and the initial intensity of the light when performing the gas analysis according to the intensity of the light passing through the measurement arm 510 and the reference arm 530.
The encoder 300 may be disposed between the beam splitter 150 and the measurement arm 510 and the reference arm 530. As shown in the following to be described, the encoder 300 may encode one of the measurement light and the reference light and block the other of the measurement light and the reference light. In other words, the measurement light may be encoded by the encoder 300 and then pass through the measurement arm 510 (as shown by the solid arrowed line in fig. 1), and the reference light may be blocked by the encoder 300 and not pass through the reference arm 530; or the reference light may be encoded by the encoder 300 and then pass through the reference arm 530 (as shown by the solid arrowed line in fig. 1), and the measurement light may be blocked by the encoder 300 and not pass through the measurement arm 510. Accordingly, gas analyzer 300 may be configured in a particular configuration according to an exemplary embodiment. A detailed description is provided below.
The measurement unit 500 may be disposed on an optical path on which light passing through the encoder 300 is projected. The measurement unit 500 may include a measurement arm 510 and a reference arm 530. The gas to be measured may be filled in the measuring arm 510. For example, the measurement arm 510 may include an air inlet and an air outlet. The gas to be measured may enter the interior space of the measurement arm 510 from the gas inlet, flow in the direction shown in fig. 1, and finally flow out of the gas outlet of the measurement arm 510 (as shown by the dashed arrow lines in fig. 1). Accordingly, the measurement arm 510 may be made of a transparent material to allow measurement light to pass through the gas to be measured flowing in the inner space of the measurement arm 510 in a transmission manner and then to be emitted to the detection unit 700. In addition, the gas to be measured may be filled in the reference arm 530. For example, the reference arm 530 may include an air inlet and an air outlet. The reference gas may enter the interior space of the measurement arm 530 from a gas inlet, flow in the direction shown in fig. 1, and finally flow out of a gas outlet of the reference arm 530 (as shown by the dashed arrow lines in fig. 1). Accordingly, the reference arm 530 may be made of a transparent material to allow the measurement light to pass through the gas to be measured flowing in the inner space of the reference arm 530 in a transmission manner and then to be emitted to the detection unit 700.
The detection unit 700 may include a lens unit 710, an optical coupler 730, an optical detector 750, and a position adjuster 770. The lens unit 710, the optical coupler 730, and the position adjuster 770 may be configured to enable light emitted from the measurement unit 500 to propagate to the optical detector 750. For example, the lens unit may direct light propagating through the measurement arm and light propagating through the reference arm to enter the optical coupler, and then the optical coupler may direct light directed by the lens unit to impinge on the optical detector. In addition, the position adjuster may adjust the position of the optical detector such that the optical detector is located at a focal point of the optical coupler.
The gas analyzer according to an exemplary embodiment may further include a processor or processing unit 900. The processor 900 may receive electrical signals from the optical detector and may obtain information about the gas to be measured from the received electrical signals in order to accomplish gas detection.
Operations corresponding to the encoder 300 and the processor 900 according to exemplary embodiments will be described in detail below by referring to fig. 2 and 3. FIG. 2 is a schematic diagram showing an encoder according to an exemplary embodiment; and fig. 3 is a schematic diagram showing the rotation of an encoder according to an exemplary embodiment.
As shown in fig. 2, the encoder 300 may include encoding patterns 1A, 2A, 3A, and 4A and light blocking patterns 1B, 2B, 3B, and 4B. The encoding patterns 1A, 2A, 3A, and 4A may be patterns that allow at least a portion of one of the measurement light or the reference light to pass through and propagate in transmission to the measurement arm 510 or the reference arm 530. "allowing at least a portion of the light to pass through in transmission" refers herein to "encoding" the light beam. In other words, the encoding patterns 1A, 2A, 3A, and 4A may further include a light shielding portion that blocks light from passing through in a transmissive manner, in addition to the light transmitting portion that allows light to pass through in a transmissive manner. For example, as shown in fig. 2, the encoding pattern 1A may only include light-transmissive portions, and not block light at all. The encoding patterns 2A, 3A, and 4A may include a light shielding portion, and may further include a light transmitting portion. On the other hand, the light shielding patterns 1B, 2B, 3B, and 4B may be patterns including only light shielding portions that block light from passing therethrough in a transmissive manner. Therefore, light cannot pass through the light shielding patterns 1B, 2B, 3B, and 4B in a transmissive manner. In other words, the light shielding patterns 1B, 2B, 3B, and 4B may be identical to each other.
Herein, the encoder 300 may allow the encoding pattern to encode one of the measurement light or the reference light, and simultaneously allow the light blocking pattern to block the other of the measurement light and the reference light. In this manner, at the same time, only one of the encoded measurement light or the encoded reference light may be transmitted through the gas to be measured or the reference gas and incident on the optical detector 750. In this way, the processor 900 may determine which of the measurement light and the reference light according to the current state of the encoder 300 the signal from the optical detector 750 corresponds to (that is, which of the measurement light and the reference light being encoded, and which of the measurement light and the reference light being blocked by the encoder 300).
As shown in fig. 2, in an exemplary embodiment, the encoder 300 may include or be implemented as a circular encoding chip. The coding patterns 1A, 2A, 3A and 4A are located on at least one sector of a circular coding chip. The circular encoding chip is rotatable between the beam splitter and the measurement and reference arms. In this way, the sector in which the coding pattern is located can be located at a position between the beam splitter and the measurement arm (first position) to code the measurement light or at a position between the beam splitter and the reference arm (second position) to code the reference light.
In addition, the light shielding patterns 1B, 2B, 3B, and 4B may be located at sectors of the circular code chip that are symmetrical to the sectors where the code patterns 1A, 2A, 3A, and 4A are located with respect to the center of the circular code chip. For example, the code pattern 1A may be symmetrical to the light shielding pattern 3B, the code pattern 2A may be symmetrical to the light shielding pattern 4B, the code pattern 3A may be symmetrical to the light shielding pattern 1B, and the code pattern 4A may be symmetrical to the light shielding pattern 2B. The circular encoding chip is rotated between the beam splitter and the measurement and reference arms such that the sector in which the encoding pattern is located at a first position between the beam splitter and the measurement arm to block the reference light when the measurement light is encoded or at a second position between the beam splitter and the reference arm to block the measurement light when the reference light is encoded.
As shown in fig. 3, the circular encoder chip may be rotated such that when time t is 0 (i.e., an initial point of time), the circular encoder chip may encode the reference light by means of the encoding pattern 4A and, at the same time, may block the measurement light by means of the light blocking pattern 2B; when the time t is 1, the circular encoding chip may encode the measurement light by means of the encoding pattern 2A and, at the same time, may block the reference light by means of the light blocking pattern 4B; when the time t is 2, the circular encoding chip may encode the reference light by means of the encoding pattern 3A and, at the same time, may block the measurement light by means of the light blocking pattern 1B; when the time t is 3, the circular encoding chip may encode the measurement light by means of the encoding pattern 1A and, at the same time, may block the reference light by means of the light blocking pattern 3B; when the time t is 4, the circular encoding chip may encode the measurement light by means of the encoding pattern 4A and, at the same time, may block the reference light by means of the light blocking pattern 2B; when the time t is 5, the circular encoding chip may encode the reference light by means of the encoding pattern 2A and, at the same time, may block the measurement light by means of the light blocking pattern 4B; when the time t is 6, the circular encoding chip may encode the measurement light by means of the encoding pattern 3A and, at the same time, may block the reference light by means of the light blocking pattern 1B; and when the time t is 7, the circular encoding chip may encode the reference light by means of the encoding pattern 1A and at the same time may block the measurement light by means of the light blocking pattern 3B.
In an exemplary embodiment, the circular code chip shown in FIG. 3 may have a diameter of approximately 5cm to approximately 6 cm. The circular encoder chip is rotatable so that the circular encoder chip can encode the measurement light or the reference light 5 to 6 times per second. In an exemplary embodiment, the measurement light or the reference light may have a wavelength of 480 nm.
In another exemplary embodiment, the encoder 300 may comprise or be implemented as a display. The display may be disposed between the beam splitter and the measurement unit 500, and may display an encoding pattern at a first position between the beam splitter and the measurement arm to encode the measurement light, or may display an encoding pattern at a second position between the beam splitter and the reference arm to encode the reference light. Similar to the foregoing description in the exemplary embodiment in which the encoder 300 is implemented as a circular encoding chip, the encoder 300 implemented as a display may display a light blocking pattern at the second position so as to block the reference light when the encoding pattern is displayed at the first position, or display a blocking pattern at the first position so as to block the measurement light when the encoding pattern is displayed at the second position. Accordingly, the display may include a Liquid Crystal Display (LCD), a Digital Micromirror Device (DMD), and other various types of display devices. In an example, the encoder 300 may include two displays disposed at a first location and a second location, respectively.
The encoding patterns 1A, 2A, 3A, and 4A may be different from each other, that is, the positions of the light transmitting portions and/or the light shielding portions in the encoding patterns 1A, 2A, 3A, and 4A may be different. Accordingly, the encoder 300 may encode one of the measurement light or the reference light at a preset time by means of one of encoding patterns different from each other and block the other of the measurement light and the reference light, i.e., time division multiplexing encoding. In other words, the encoder 300 may perform encoding by using an encoding pattern whose light-transmitting portions have different positions at different times, so that the processor 900 connected to the optical detector 750 may perform decoding by using a time-wavelength mapping algorithm, that is, light intensities at different points in time may be recorded to correspond to wavelengths of light received by the optical detector 750 at the points in time. Thus, different materials have different light absorptance for different wavelengths of light; the gas to be measured is analyzed by comparing the light intensity of the measurement light with the light intensity of the reference light encoded by the same encoding pattern.
In another exemplary embodiment, the encoder 300 may encode one of the measurement light or the reference light for a preset time period by means of a plurality of encoding patterns different from each other, and block the other of the measurement light and the reference light by means of a blocking pattern, i.e., frequency division multiplexing encoding. When the encoder 300 is implemented as the circular encoder chip shown in fig. 2, the preset time period may be the time taken after the circular encoder chip rotates one turn. In this way, in each rotation cycle of the circular code chip, the measurement light or the reference light is coded by means of a different coding pattern, that is to say the portions of light in the measurement light or the reference light in different positions are allowed to pass through the coding pattern in each code in a transmissive manner, so that the amount of time of the portions of light in the measurement light or the reference light in different positions is different in each rotation cycle. Accordingly, the processor 900 may perform decoding by using a fourier transform algorithm, that is, recording components of signals of different frequencies received by the optical detector 750 and corresponding to the wavelengths of the light subjected to the frequency division multiplexing encoding as light intensities of the corresponding wavelengths, in order to analyze the gas to be measured.
In still another exemplary embodiment, the encoding pattern of the encoder 300 may be a pattern complying with the walsh-hadamard algorithm, that is, including a pattern for arranging the light-transmitting portion and the light-shielding portion according to the walsh-hadamard algorithm. The encoding patterns 1A, 2A, 3A, and 4A shown in fig. 2 may be patterns that comply with the walsh-hadamard algorithm. The encoding patterns 1A, 2A, 3A, and 4A may correspond to the following expressions:
in other words, the encoding pattern of the encoder 300 may be generated according to a hadamard matrix of a certain order (e.g., the same as the wavelength resolution) so that the measurement light or the reference light may be encoded. In this way, the processor 900 performs decoding according to the walsh-hadamard transform algorithm, that is, signal intensities corresponding to different orthogonal bases among signals received by the optical detector 750 and corresponding to light encoded according to the walsh-hadamard transform algorithm, in order to analyze the gas to be measured.
Although described above with reference to an encoder 300 capable of being implemented as a rotatable circular encoding chip, the exemplary embodiments are not so limited. When the encoder 300 is implemented as an LCD, DMD, and other display devices, an encoding pattern encoded according to time division multiplexing encoding, frequency division multiplexing encoding, and/or walsh-hadamard algorithm may be displayed at one of a first position and a second position between the beam splitter and the measurement unit, and a light blocking pattern is displayed at the other position to encode the measurement light or the reference light.
According to an exemplary embodiment, an encoder including an encoding pattern and a light shielding pattern is disposed between a light source unit and a measurement unit; when encoding one of the measurement light and the reference light, the other of the measurement light and the reference light may be blocked such that at the same time, only the encoded measurement light or only the encoded reference light passes through the gas or reference gas to be measured and reaches the measurement unit. Accordingly, the gas analyzer according to the exemplary embodiment may have a simplified structure.
It should be understood that although this specification is described based on embodiments, it does not indicate that each embodiment includes only one independent claim, and the description is for clarity purposes only. Those skilled in the art will recognize that the specification as a whole, and the techniques in the embodiments can be appropriately combined to form other implementations as can be understood by those skilled in the art.
The foregoing description is only specific exemplary embodiments of the present invention and is not intended to limit the scope of the invention. Any equivalent alterations, modifications and combinations made by those skilled in the art without departing from the spirit and principles of the invention are intended to be within the scope of the invention.
Claims (15)
1. A gas analyzer, comprising:
a light source (110);
a light splitter (150) that splits the light emitted by the light source into measurement light and reference light;
a measurement arm (510) in which a gas to be measured is filled, and a reference arm (530) in which a reference gas is filled, the measurement light being propagated through the measurement arm, and the reference light being propagated through the reference arm;
an optical detector (750) that receives light propagating through the measurement arm and light propagating through the reference arm and converts the received light into an electrical signal; and
an encoder (300) disposed between the beam splitter and the measurement arm and the reference arm, wherein the encoder is configured to encode one of the measurement light and the reference light and block the other of the measurement light and the reference light.
2. The gas analyzer of claim 1, comprising:
a grating (130) disposed between the light source and the optical splitter, wherein the grating (130) is configured to separate the light emitted from the light source into a plurality of light beams having different wavelengths.
3. The gas analyzer of claim 1, comprising a lens unit (710), an optical coupler (730), and a position adjuster (770), wherein
The lens cell configured to direct the light propagating through the measurement arm and the light propagating through the reference arm to enter the optical coupler,
the optical coupler is configured to direct the light directed by the lens unit to illuminate the optical detector; and is
The position adjuster is configured to adjust a position of the optical detector such that the optical detector is located at a focal point of the optical coupler.
4. The gas analyzer of claim 1, wherein the encoder comprises:
an encoding pattern configured to allow at least a portion of one of the measurement light or the reference light to pass through the encoding pattern and propagate to the measurement arm or the reference arm in a transmissive manner to encode the light beam; and
a light blocking pattern configured to block the other of the measurement light or the reference light from transmitting through the light blocking pattern.
5. The gas analyzer of claim 4, wherein the encoding pattern comprises a plurality of encoding patterns that are different from one another, and the encoder is configured to encode one of the measurement light or the reference light at a preset time by means of one of the plurality of encoding patterns that are different from one another, and block the other of the measurement light and the reference light.
6. The gas analyzer of claim 4, wherein the encoding pattern includes a plurality of encoding patterns that are different from one another, and the encoder is configured to encode one of the measurement light or the reference light for a preset period of time by means of a plurality of encoding patterns of the plurality of encoding patterns that are different from one another, and block the other of the measurement light and the reference light.
7. The gas analyzer of claim 4, wherein the encoding pattern comprises an encoding pattern that complies with a Walsh-Hadamard (Welsh-Hadamard) algorithm, and the encoder is configured to encode one of the measurement light or the reference light by virtue of the encoding pattern that complies with the Walsh-Hadamard algorithm, and block the other of the measurement light and the reference light.
8. The gas analyzer of claim 4, wherein the encoder comprises a circular code chip and the code pattern is located on at least one sector of the circular code chip.
9. The gas analyzer of claim 8, wherein the circular encoding chip is configured to rotate between the optical splitter and the measurement and reference arms such that the sector in which the encoding pattern is located at a first position between the optical splitter and the measurement arm to encode the measurement light or a second position between the optical splitter and the reference arm to encode the reference light.
10. The gas analyzer of claim 9, wherein the light blocking pattern is located at a sector of the circular code chip that is symmetric with the sector where the code pattern is located with respect to a center of the circular code chip such that the sector where the code pattern is located at the first position between the beam splitter and the measurement arm to block the reference light when the measurement light is encoded or the sector where the code pattern is located at the second position between the beam splitter and the measurement arm to block the measurement light when the reference light is encoded.
11. The gas analyzer of claim 4, wherein the encoder includes a display, wherein the display is configured to display the coding pattern at the first position between the optical splitter and the measurement arm to encode the measurement light or the coding pattern at the second position between the optical splitter and the reference arm to encode the reference light.
12. The gas analyzer of claim 11, wherein the display is configured to display the light blocking pattern at the second location to block the reference light when the coding pattern is displayed at the first location, or to display a blocking pattern at the first location to block the measurement light when the coding pattern is displayed at the second location.
13. The gas analyzer of claim 11, wherein the display comprises at least one of a liquid crystal display and a digital micro-mirror device.
14. The gas analyzer of claim 1, comprising:
a processor (900) configured to receive the electrical signal from the optical detector and to obtain information relating to the gas to be measured from the received electrical signal.
15. The gas analyzer of claim 14, wherein the encoder includes an encoding pattern, and the encoding pattern is configured to allow at least a portion of one of the measurement light or the reference light to pass through the encoding pattern and propagate to the measurement arm or the reference arm in a transmissive manner to encode the optical beam, and the processor is configured to be able to perform decoding processing on a received electrical signal corresponding to the encoded light by using a time-wavelength mapping algorithm, a fourier transform algorithm, and a walsh-hadamard transform algorithm.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2019/102333 WO2021035432A1 (en) | 2019-08-23 | 2019-08-23 | Gas analyzer |
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| Publication Number | Publication Date |
|---|---|
| CN113767274A true CN113767274A (en) | 2021-12-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980096050.5A Pending CN113767274A (en) | 2019-08-23 | 2019-08-23 | Gas analyzer |
Country Status (3)
| Country | Link |
|---|---|
| EP (1) | EP3994447A4 (en) |
| CN (1) | CN113767274A (en) |
| WO (1) | WO2021035432A1 (en) |
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Also Published As
| Publication number | Publication date |
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| EP3994447A1 (en) | 2022-05-11 |
| EP3994447A4 (en) | 2023-04-19 |
| WO2021035432A1 (en) | 2021-03-04 |
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