CN113760718A

CN113760718A - Automatic testing method and device

Info

Publication number: CN113760718A
Application number: CN202011325602.6A
Authority: CN
Inventors: 魏莉莉; 周文宏; 刘兴强; 吴�琳
Original assignee: Beijing Jingdong Century Trading Co Ltd; Beijing Jingdong Shangke Information Technology Co Ltd
Current assignee: Beijing Jingdong Century Trading Co Ltd; Beijing Jingdong Shangke Information Technology Co Ltd
Priority date: 2020-11-23
Filing date: 2020-11-23
Publication date: 2021-12-07

Abstract

The present disclosure provides an automated testing method, which includes: in response to a received test request, determining a to-be-tested object indicated by the test request; determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested; sending the test case to a test executive party so that the test executive party can test the object to be tested according to the test case; acquiring test parameters aiming at the object to be tested; and determining and outputting a test result aiming at the object to be tested according to the test parameters and a preset parameter threshold. The disclosure also provides an automatic testing device, an electronic device and a computer readable storage medium.

Description

Automatic testing method and device

Technical Field

The present disclosure relates to the field of test technologies, and more particularly, to an automated test method, an automated test apparatus, an electronic device, and a computer-readable storage medium.

Background

The equipment test is an important node starting from the construction and commissioning of an Internet Data Center (IDC for short), and the professional and perfect equipment test can greatly reduce the failure rate of the IDC in the operation process and lay a foundation for the stable operation of the IDC in the whole life cycle.

In the process of realizing the disclosed concept, the inventor finds that the IDC equipment testing method in the related art has the defects of low testing efficiency and high error rate of testing results.

Disclosure of Invention

In view of the above, the present disclosure provides a method and an apparatus for automated testing, which are streamlined, have a low test error rate, and effectively improve the test efficiency.

One aspect of the present disclosure provides an automated testing method, which includes determining a to-be-tested object indicated by a received test request in response to the test request; determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested; sending the test flow and the test instruction of the test case to a test executive party so that the test executive party can test the object to be tested according to the test case; acquiring test parameters aiming at the object to be tested; and comparing and judging the test parameters with preset parameter thresholds, determining a test result aiming at the object to be tested and outputting the test result.

Optionally, the obtaining of the test parameters for the object to be tested includes performing identification processing on test data measured by a test instrument used in a test process to obtain the test parameters for the object to be tested.

Optionally, the identifying the test data obtained by the test instrument used in the test process includes identifying a test panel image of the test instrument uploaded by the test execution party; or, the test panel of the test instrument is scanned.

Optionally, the obtaining of the test parameters for the object to be tested further includes obtaining the test parameters from the test instrument through a preset communication link.

Optionally, after the test parameters are obtained, executing a standard form including adding the test parameters to the standard form associated with the test case according to the measurement unit of the test parameters; and after the preset types of test parameters are added, generating a test report aiming at the object to be tested.

Optionally, when obtaining the test parameters for the object to be tested, the executing includes determining whether the test operation for the object to be tested conforms to the test case according to the type of the obtained test parameters; and taking the test parameters which do not conform to the test operation of the test case as invalid parameters, and giving an alarm to require manual confirmation or abandon.

Optionally, the method further includes performing similarity calculation on the obtained test parameters and fault parameters in a preset fault library; and when the similarity is higher than a preset threshold value, determining that the object to be tested is abnormal.

Optionally, the method is used for testing equipment of an internet data center.

Another aspect of the present disclosure provides an automated testing apparatus, including a to-be-tested object determining module, configured to determine, in response to a received test request, a to-be-tested object indicated by the test request; the test case determining module is used for determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested; the test case sending module is used for sending the test case to a test executive party so that the test executive party can test the object to be tested according to the test case; the test parameter acquisition module is used for acquiring test parameters aiming at the object to be tested; and the test result determining module is used for determining and outputting the test result aiming at the object to be tested according to the test parameters and the preset parameter threshold.

Optionally, the test parameter acquiring module includes an identification submodule, configured to identify test data measured by a test instrument used in a test process, so as to obtain a test parameter for the object to be tested.

Optionally, the identification sub-module includes a first identification unit, configured to perform identification processing on a test panel image of the test instrument uploaded by a test execution party; or the second identification unit is used for scanning the test panel of the test instrument.

Optionally, the test parameter obtaining module further includes an obtaining submodule, configured to obtain the test parameter from the test instrument through a preset communication link.

Optionally, the apparatus further includes a test parameter adding module, configured to add the test parameter to a standardized table associated with the test case according to a measurement unit of the test parameter after the test parameter acquiring module acquires the test parameter; and the test report generating module is used for generating a test report for the object to be tested after the test parameter adding module adds the test parameters of the preset types.

Optionally, the apparatus further includes a test operation determining module, configured to determine whether the test operation for the object to be tested conforms to the test case according to a type of the obtained test parameter when the test parameter obtaining module obtains the test parameter for the object to be tested; and taking the test parameters which do not accord with the test operation of the test case as invalid parameters, and giving an alarm.

Optionally, the apparatus further includes an anomaly determination module, configured to perform similarity calculation between the obtained test parameter and a fault parameter in a preset fault library; and when the similarity is higher than a preset threshold value, determining that the object to be tested is abnormal.

Optionally, the device is used for testing equipment of an internet data center.

Another aspect of the disclosure provides an electronic device comprising one or more processors; and a memory for storing one or more programs, wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the methods of embodiments of the present disclosure.

Another aspect of the disclosure provides a computer-readable storage medium having stored thereon executable instructions that, when executed by a processor, cause the processor to implement a method of an embodiment of the disclosure.

By the aid of the test execution method and the test execution system, the test case for the object to be tested is sent to the test execution party, so that the test execution party can test the object to be tested according to the test case, the problems that the test execution party tests according to professional knowledge or own experience are at least partially solved, the test flow is not uniform, the professional requirement is high, and the normalization and the specialty of the test process can be effectively improved; moreover, the test parameter acquisition process is automatic acquisition, and compared with manual reading and manual input of test data, the efficiency, timeliness and accuracy of acquiring the test parameters are obviously improved, so that the test efficiency can be effectively improved, and the test error is reduced.

Drawings

For a more complete understanding of the present disclosure and the advantages thereof, reference is now made to the following descriptions taken in conjunction with the accompanying drawings, in which:

FIG. 1 schematically illustrates an automated test system architecture according to an embodiment of the present disclosure;

FIG. 2 schematically illustrates a flow diagram of an automated testing method according to an embodiment of the present disclosure;

FIG. 3 schematically illustrates a flow diagram of an automated testing method according to another embodiment of the present disclosure;

FIG. 4 schematically illustrates a block flow diagram of an automated testing method according to an embodiment of the present disclosure;

FIG. 5 schematically illustrates a flow diagram of an automated testing method according to another embodiment of the present disclosure;

FIG. 6 schematically illustrates a block diagram of an automated testing apparatus according to an embodiment of the present disclosure;

FIG. 7 schematically illustrates a block diagram of an electronic device suitable for implementing automated testing methods and apparatus according to an embodiment of the present disclosure.

Detailed Description

Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. It is to be understood that such description is merely illustrative and not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, operations steps, operations, or components.

All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.

Where a convention analogous to "at least one of A, B and C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B and C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).

Various embodiments of the present disclosure provide an automated testing method and a testing apparatus to which the method can be applied. The method comprises the steps of responding to a received test request, determining an object to be tested indicated by the test request, determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested, sending the test case to a test executing party for the test executing party to test the object to be tested according to the test case, then obtaining test parameters for the object to be tested, and finally determining and outputting a test result for the object to be tested according to the test parameters and a preset parameter threshold.

As shown in fig. 1, the system architecture 100 includes at least one object under test (a plurality of objects under

test

101, 102, 103 are shown in the figure, which may be a set of objects under test, not shown in the figure) and a test platform 104. In the system architecture 100, the test platform 104, in response to the received test request, determines an object to be tested (e.g., the object to be tested 101, 102, 103) indicated by the test request, and determines a test case for the object to be tested, where the test case describes a structured flow for testing the object to be tested, and then sends the test case to the test executor, so that the test executor tests the object to be tested according to the test case, and then obtains test parameters for the object to be tested, and finally determines and outputs a test result for the object to be tested according to the test parameters and a preset parameter threshold.

An Internet Data Center (IDC for short) is a service platform that can provide a high-speed Internet access broadband, a high-performance local area network and a safe and reliable computer room environment. The equipment test based on the IDC can effectively reduce the failure rate of the IDC in the operation process, and can lay a foundation for the steady operation of the IDC in the whole life cycle. At present, equipment testing based on IDC is completed manually, because the equipment scale of IDC is large, the equipment testing workload is large, the problems of low testing efficiency and high error rate of testing results exist by means of manual testing, and the conditions of testing omission or testing method errors are easy to occur. Therefore, the related art has poor reliability in device testing the IDC.

The present disclosure will be described in detail below with reference to the drawings and specific embodiments.

FIG. 2 schematically shows a flow diagram of an automated testing method, which employs a test platform, according to an embodiment of the present disclosure.

As shown in FIG. 2, the method may include operations S210-S250, for example.

In operation S210, in response to the received test request, an object to be tested indicated by the test request is determined.

In the embodiment of the disclosure, the method is particularly suitable for an equipment testing stage after the construction of a facility project is completed, and is used for automatically testing the object to be tested involved in the facility project. The object to be tested can be the whole of the facility engineering or part of equipment in the facility engineering. For example, the object to be tested may be a "xxx data center", or may be a single device such as an electric device, a heating and ventilation device, and a cooling device in the "xxx data center". Specifically, a test request input by a test executor may be received through an external or internal input interface of the test platform, where the test request may include information such as a name, a brand, a model, and a quantity of an object to be tested.

Illustratively, a test request from a tester is received, the test request requesting that an object to be tested in the IDC be tested. The test platform responds to the received test request, and determines an object to be tested indicated by the test request, wherein the object to be tested may include hardware devices in a standard machine room environment such as heating and ventilation devices, lighting devices, humidity devices, anti-static devices, uninterruptible power supply devices and cabinet racks in the IDC, network devices such as servers, hosts and physical lines, and network objects such as an IDC machine room network, a device traffic path and broadband resources.

The test executor includes any object that can execute the method of the embodiment, for example, a tester, a test digital assistant, an intelligent robot, and the like, and the embodiment is not limited herein.

Next, in operation S220, a test case for the object to be tested is determined, where the test case describes a structured flow for testing the object to be tested.

In the embodiment of the present disclosure, the test case describes a structured flow for testing the object to be tested, and may include each test node to be executed when performing an automated test on the object to be tested, test information of each test node, and an execution sequence of each test node. The test information of each test node may include a device to be tested (for example, a heating and ventilation device in the IDC) to which each test node is directed, a preset type of test parameter (for example, parameters such as wind speed, voltage, and power of the heating and ventilation device) corresponding to each test node, and a test instrument (for example, a test instrument such as an anemometer, a voltmeter, and a power analyzer) that each test node needs to use.

The test case may be preset by the test executor and stored in a local storage of the test platform or a server associated with the test platform. In the process of executing the method of the embodiment, after the test platform determines the object to be tested, the test platform can call the test case for the object to be tested from the local storage or the associated server according to the identification information of the object to be tested.

In addition, for a newly established object to be tested or a newly introduced device to be tested in the object to be tested, a corresponding test case may not exist in the local storage or the association server, at this time, when the test case for the object to be tested is determined, the parameter template may be displayed to the test executive party, so that the test executive party selects corresponding test parameters of a preset type from the parameter template in sequence according to the newly established object to be tested or the newly introduced device to be tested, and then generates the test case according to the test parameters of the preset type selected by the test executive party and the sequence of selecting the test parameters of the preset type. Optionally, the generated test case may be stored in a local storage or an associated server for use in subsequent testing.

Next, in operation S230, the test case is sent to the test executor, so that the test executor tests the object to be tested according to the test case.

In the embodiment of the present disclosure, specifically, the test case may be displayed to the test executor through the display device, or the test case may be sent to the test terminal of the test executor in a wired or wireless manner, and specifically, the test flow and the test instruction of the test case may be sent to the test executor, so that the test executor may test the object to be tested according to the test case. The test flow indicates a standardized flow of the test process, and the test instruction includes test reference details of the test process, which may include, for example, a reference mounting position of the meter under test, a reference reading time of the test parameter, and the like.

Next, in operation S240, test parameters for the object to be tested are acquired.

In the embodiment of the present disclosure, specifically, in the process of testing the object to be tested according to the test case, the test executing party obtains the test parameters obtained by the test executing party at each test node in real time.

Optionally, obtaining the test parameters for the object to be tested may include performing identification processing on test data measured by a test instrument used in the test process to obtain the test parameters for the object to be tested. Specifically, the identification processing is performed on the test data measured by the test instrument used in the test process, including the identification processing of the test panel image of the test instrument uploaded by the test execution party, or the scanning processing of the test panel of the test instrument.

In the embodiment of the disclosure, the test parameters are obtained by directly identifying and processing the test data, so that the automatic acquisition of the test parameters is realized, the problems of low input efficiency, poor input timeliness and high error rate existing in the process of manually inputting the test parameters are avoided, the efficiency of acquiring the test parameters can be effectively improved, and the precision of the test parameters is improved. The design can be well suitable for automatic IDC test with large test scale and high test precision requirement.

Specifically, the existing image recognition technology may be used to perform recognition processing on the test panel image, or the equipment such as the scanner may be used to perform scanning processing on the test panel of the test instrument, so as to obtain the test parameters for the object to be tested, where the test panel image may be obtained by taking a picture of the test panel of the test instrument by the test executing party. Optionally, when the test parameters for the object to be tested still cannot be obtained after the test panel image is identified or the test panel is scanned, an alarm message may be sent to prompt the test executing party to manually input the test parameters displayed in the test panel.

Preferably, the test panel image of the test instrument uploaded by the test execution party, or the scan image obtained by scanning the test panel of the test instrument, may be stored in a local storage or an associated server, so as to be used as a basis for later-stage test parameter verification.

In addition, acquiring the test parameters for the object to be tested may further include acquiring the test parameters from the test instrument through a preset communication link. Through the preset communication link, the test parameters are directly obtained from the test instrument, so that the test parameters can be obtained at least partially in real time and accurately, the test time can be effectively saved, and the accuracy of the test result is improved.

Optionally, when obtaining the test parameters for the object to be tested, the method may further perform determining whether the test operation for the object to be tested conforms to the test case according to the type of the obtained test parameters, and then taking the test parameters obtained by the test operation that does not conform to the test case as invalid parameters, and performing an alarm to request the test execution party to manually confirm or discard the alarmed test parameters.

Specifically, the test operation may be compared with the test case according to the type of the obtained test parameter and the test case, and whether the test operation meets the test case or not may be determined according to the comparison result. More specifically, whether the device to be tested to which the test operation is directed at each test node is the same as a preset device to be tested in the test case is compared, whether the type of the test parameter obtained by the test operation at each test node is the same as the type of the test parameter of the preset type in the test case is compared, whether the sequence of executing each test node in the test operation is compared with the execution sequence of each test node preset in the test case is compared, and when at least one comparison result is different, it is determined that the test operation does not conform to the test case.

Optionally, after the test parameters obtained by the test operation that does not conform to the test case are used as invalid parameters and an alarm is given, the correct test case can be sent or prompted to the test execution party.

In the embodiment of the disclosure, by determining the test operation which does not conform to the test case and taking the test parameters obtained by the test operation which does not conform to the test case as the invalid parameters, modeling of the test result by irregular test operation can be avoided, and the accuracy of the test result can be at least partially improved.

Next, in operation S250, a test result for the object to be tested is determined and output according to the test parameter and the preset parameter threshold.

In the embodiment of the present disclosure, specifically, after the test parameter for the object to be tested is obtained, whether the test parameter meets a preset parameter threshold is determined in real time, and the test result for the object to be tested is determined and output according to the determination result. Optionally, when it is determined that the test result is abnormal, an alarm is given to prompt the test executor to perform verification, where the verification includes verifying the obtained test parameters and checking the object to be tested.

The verification of the test parameters may be to obtain the test parameters again, or to perform error correction processing on the obtained test parameters according to a stored test panel image of the test instrument uploaded by the test execution party, or a scanned image obtained by scanning the test panel of the test instrument.

And checking the object to be tested, maintaining the object to be tested when the checking result indicates that the object to be tested is abnormal, and retesting the object to be tested after maintenance treatment to obtain a normal testing result.

Whether the test result aiming at the object to be tested is accurate is judged in real time according to the test parameters, so that errors generated in the test process or problems of the object to be tested are found and eliminated in time, the problems of processing delay of abnormal test results and secondary test in the related technology can be solved at least partially, the test efficiency can be effectively improved, the test period can be shortened, and the test energy consumption can be reduced.

In the embodiment of the disclosure, the test case for the object to be tested is sent to the test executive party, so that the test executive party can test the object to be tested according to the test case, which at least partially overcomes the problems of non-uniform test flow and high professional requirement when the test executive party tests according to professional knowledge or own experience, and can effectively improve the normalization and the specialty of the test process; moreover, the test parameter acquisition process is completed in an automatic acquisition mode, and compared with manual reading and manual input of test data, the timeliness and accuracy of acquiring the test parameters are obviously improved, the test efficiency is effectively improved, and the test error is reduced. The embodiment of the disclosure can be well applied to IDC automatic test with large test scale and high test precision requirement, and is beneficial to realizing a highly reliable and safe machine room environment by improving the IDC automatic test efficiency and the IDC automatic test precision.

FIG. 3 schematically illustrates a flow diagram of an automated testing method according to another embodiment of the present disclosure.

As shown in fig. 3, the method may include operations S210 to S240, S310, and S320, for example. The contents and principles of operations S210 to S240 are the same as those of the foregoing embodiments, and are not described herein again.

In operation S310, the test parameters are added to the standardized table associated with the test case according to the measurement unit of the test parameters.

In the embodiment of the present disclosure, specifically, the standardized table associated with the test case may be preset and stored in the local storage or the associated server, and may be directly called in the test process. The standardized form at least includes the name of the object to be tested, the testing parameters of the preset types, the testing results, and the like.

When the test parameters are added to the standardized table associated with the test case according to the measurement units of the test parameters, the test parameters can be added to the test parameter items of the same preset types as the measurement units of the test parameters according to the measurement units of the test parameters and the measurement units of the preset types of test parameters in the standardized table.

Next, in operation S320, after the preset kind of test parameters are added, a test report for the object to be tested is generated.

In the embodiment of the present disclosure, specifically, after the preset types of test parameters are added to the standardized table, a test report for the object to be tested is generated according to the standardized table. Preferably, the test parameters added to the standardized table may be the test parameters verified or retrieved in operation S250. Optionally, the embodiment of the present disclosure may further store the obtained fault parameter in a local storage or an associated server for later query and invocation.

FIG. 4 schematically illustrates a flow diagram of an automated testing method according to an embodiment of the disclosure. As shown in fig. 4, after receiving the test request, the test platform responds to the test request, determines an object to be tested, and determines whether a corresponding test case exists in the local storage or the associated server according to the object to be tested, if so, the test case is directly called, and if not, the test case is generated according to the operation of a tester. And then, sending the test case to a tester so that the tester can test the object to be tested according to the test case. After the test is finished, the tester acquires the test parameters of the object to be tested, judges whether the test parameters are completely acquired, and prompts the tester to manually input the test parameters under the condition that the test parameters are not completely acquired. And then judging whether the test parameters conform to the test cases or not, and prompting a tester to test according to the test cases again under the condition that the test parameters do not conform to the test cases. And then, outputting a test result, and prompting a tester to check the test parameters to acquire normal test parameters when the test result is abnormal, or checking and maintaining the object to be tested, and acquiring the normal test parameters of the maintained object to be tested. And finally, adding the normal test parameters into a standardized table associated with the test case, generating a test report aiming at the object to be tested, and storing test data.

FIG. 5 schematically illustrates a flow diagram of an automated testing method according to another embodiment of the present disclosure.

As shown in fig. 5, the method may include operations S210 to S240, S510, and S520, for example. The contents and principles of operations S210 to S240 are the same as those of the foregoing embodiments, and are not described herein again.

In operation S510, similarity calculation is performed between the obtained test parameters and the fault parameters in the preset fault library.

In the embodiment of the present disclosure, specifically, the preset fault library includes at least one fault parameter, each fault parameter corresponds to one fault problem, and the fault parameters may be historical fault parameters or simulated fault parameters obtained by testing through simulation of the fault problem. When the similarity between the test parameter and the fault parameter in the preset fault library is calculated, the similarity between the test parameter and each fault parameter in the preset fault library can be calculated respectively, wherein a data similarity calculation algorithm can be adopted to calculate the similarity between the test parameter and the fault parameter, and the data similarity calculation algorithm can be, for example, a Simhash algorithm, a Minihash algorithm, a Baidu fingerprint similarity algorithm, or the like.

Next, in operation S520, when the similarity is higher than a preset threshold, it is determined that the object to be tested is abnormal.

In the embodiment of the present disclosure, specifically, after determining that the object to be tested is abnormal, a fault problem corresponding to the abnormal situation may also be determined and output, so that the test executing party performs maintenance processing on the object to be tested according to the fault problem, thereby eliminating the abnormal situation.

When determining the fault problem corresponding to the abnormal condition, the fault problem corresponding to the fault parameter of which the similarity of the test parameter exceeds the preset threshold may be determined as the fault problem corresponding to the abnormal condition, or the fault problem corresponding to the fault parameter of which the similarity of the test parameter is the maximum may be determined as the fault problem corresponding to the abnormal condition.

Optionally, the preset fault library may further include at least one maintenance scheme corresponding to each fault problem, and a maintenance effect corresponding to each maintenance scheme. In this embodiment, after the fault problem corresponding to the abnormal condition is output, each maintenance scheme and maintenance effect corresponding to the fault problem may be further output, so that the test executive party may select an appropriate maintenance scheme according to the requirement.

In the embodiment of the disclosure, after the test parameters are obtained, similarity calculation is performed on the obtained test parameters and the fault parameters in the preset fault library, and when the similarity is higher than a preset threshold, the abnormality of the object to be tested is determined, which can effectively improve the efficiency and accuracy of abnormality determination of the object to be tested compared with manual judgment.

FIG. 6 schematically illustrates a block diagram of an automated testing apparatus according to an embodiment of the present disclosure.

As shown in fig. 6, the apparatus 600 may include a to-be-tested object determining module 601, a test case determining module 602, a test case sending module 603, a test parameter obtaining module 604, and a test result determining module 605.

Specifically, the to-be-tested object determining module 601 is configured to determine, in response to the received test request, an to-be-tested object indicated by the test request; a test case determining module 602, configured to determine a test case for an object to be tested, where the test case describes a structured flow for testing the object to be tested; the test case sending module 603 is configured to send the test case to the test executor, so that the test executor tests the object to be tested according to the test case; a test parameter obtaining module 604, configured to obtain a test parameter for an object to be tested; and the test result determining module 605 is configured to determine and output a test result for the object to be tested according to the test parameter and the preset parameter threshold.

As an optional embodiment, the test parameter obtaining module includes an identification sub-module, configured to perform identification processing on test data measured by a test instrument used in a test process to obtain test parameters for an object to be tested.

As an alternative embodiment, the identification submodule includes a first identification unit, configured to perform identification processing on a test panel image of the test instrument uploaded by the test executor; or the second identification unit is used for scanning the test panel of the test instrument.

As an optional embodiment, the test parameter obtaining module further includes an obtaining sub-module, configured to obtain the test parameters from the test instrument through a preset communication link.

As an optional embodiment, the apparatus further includes a test parameter adding module, configured to add the test parameter to a standardized table associated with the test case according to a measurement unit of the test parameter after the test parameter acquiring module acquires the test parameter; and the test report generating module is used for generating a test report for the object to be tested after the test parameter adding module adds the test parameters of the preset types.

As an optional embodiment, the apparatus further includes a test operation determining module, configured to determine whether the test operation for the object to be tested conforms to the test case according to the type of the obtained test parameter when the test parameter obtaining module obtains the test parameter for the object to be tested; and taking the test parameters which are obtained by the test operation and do not accord with the test case as invalid parameters, and giving an alarm.

As an optional embodiment, the apparatus further includes an anomaly determination module, configured to perform similarity calculation between the obtained test parameters and fault parameters in a preset fault library; and when the similarity is higher than a preset threshold value, determining that the object to be tested is abnormal.

As an alternative embodiment, the device is used for testing equipment of the Internet data center.

Optionally, at least part of the functions of any of the modules, sub-modules, or any of the modules in the to-be-tested object determining module 601, the test case determining module 602, the test case sending module 603, the test parameter obtaining module 604 and the test result determining module 605 may be implemented in one module. Any one or more of the modules according to the embodiments of the present disclosure may be implemented by being split into a plurality of modules. Any one or more of the modules according to the embodiments of the present disclosure may be implemented at least in part as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented in any other reasonable manner of hardware or firmware by integrating or packaging the circuit, or in any one of three implementations, or in any suitable combination of any of the software, hardware, and firmware. Or one or more of the modules according to embodiments of the disclosure, may be implemented at least partly as computer program modules which, when executed, may perform corresponding functions.

For example, any plurality of the to-be-tested object determining module 601, the test case determining module 602, the test case sending module 603, the test parameter obtaining module 604, and the test result determining module 605 may be combined and implemented in one module, or any one of the modules may be split into a plurality of modules. Alternatively, at least part of the functionality of one or more of these modules may be combined with at least part of the functionality of the other modules and implemented in one module. Alternatively, at least one of the to-be-tested object determining module 601, the test case determining module 602, the test case sending module 603, the test parameter obtaining module 604 and the test result determining module 605 may be at least partially implemented as a hardware circuit, such as a Field Programmable Gate Array (FPGA), a Programmable Logic Array (PLA), a system on a chip, a system on a substrate, a system on a package, an Application Specific Integrated Circuit (ASIC), or may be implemented by hardware or firmware in any other reasonable manner of integrating or packaging a circuit, or implemented by any one of three implementation manners of software, hardware and firmware, or an appropriate combination of any of them. Alternatively, at least one of the test object determining module 601, the test case determining module 602, the test case sending module 603, the test parameter obtaining module 604 and the test result determining module 605 may be at least partially implemented as a computer program module, and when the computer program module is executed, the corresponding function may be executed.

FIG. 7 schematically illustrates a block diagram of an electronic device suitable for implementing automated testing methods and apparatus according to an embodiment of the present disclosure. The electronic device shown in fig. 7 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present disclosure.

As shown in fig. 7, an electronic device 700 according to an embodiment of the present disclosure includes a processor 701, which can perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM)702 or a program loaded from a storage section 708 into a Random Access Memory (RAM) 703. The processor 701 may include, for example, a general purpose microprocessor (e.g., a CPU), an instruction set processor and/or associated chipset, and/or a special purpose microprocessor (e.g., an Application Specific Integrated Circuit (ASIC)), among others. The processor 701 may also include on-board memory for caching purposes. The processor 701 may comprise a single processing unit or a plurality of processing units for performing the different actions of the method flows according to embodiments of the present disclosure.

In the RAM 703, various programs and data necessary for the operation of the system 700 are stored. The processor 701, the ROM 702, and the RAM 703 are connected to each other by a bus 704. The processor 701 performs various operations of the method flows according to the embodiments of the present disclosure by executing programs in the ROM 702 and/or the RAM 703. It is noted that the programs may also be stored in one or more memories other than the ROM 702 and RAM 703. The processor 701 may also perform various operations of method flows according to embodiments of the present disclosure by executing programs stored in the one or more memories.

Optionally, the system 700 may also include an input/output (I/O) interface 705, the input/output (I/O) interface 705 also being connected to the bus 704. The system 700 may also include one or more of the following components connected to the I/O interface 705: an input portion 706 including a keyboard, a mouse, and the like; an output section 707 including a display such as a Cathode Ray Tube (CRT), a Liquid Crystal Display (LCD), and the like, and a speaker; a storage section 708 including a hard disk and the like; and a communication section 709 including a network interface card such as a LAN card, a modem, or the like. The communication section 709 performs communication processing via a network such as the internet. A drive 710 is also connected to the I/O interface 706 as needed. A removable medium 711 such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, or the like is mounted on the drive 710 as necessary, so that a computer program read out therefrom is mounted into the storage section 708 as necessary.

Alternatively, the method flows according to embodiments of the present disclosure may be implemented as computer software programs. For example, embodiments of the present disclosure include a computer program product comprising a computer program embodied on a computer readable storage medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program can be downloaded and installed from a network through the communication section 709, and/or installed from the removable medium 711. The computer program, when executed by the processor 701, performs the above-described functions defined in the system of the embodiment of the present disclosure. Alternatively, the systems, devices, apparatuses, modules, units, etc. described above may be implemented by computer program modules.

The present disclosure also provides a computer-readable storage medium, which may be contained in the apparatus/device/system described in the above embodiments; or may exist separately and not be assembled into the device/apparatus/system. The computer-readable storage medium carries one or more programs which, when executed, implement the method according to an embodiment of the disclosure.

Alternatively, the computer-readable storage medium may be a non-volatile computer-readable storage medium, which may include, for example but is not limited to: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In the present disclosure, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. For example, a computer-readable storage medium may optionally include one or more memories other than the ROM 702 and/or RAM 703 and/or ROM 702 and RAM 703 described above.

The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of systems, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams or flowchart illustration, and combinations of blocks in the block diagrams or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.

Those skilled in the art will appreciate that various combinations and/or combinations of features recited in the various embodiments and/or claims of the present disclosure can be made, even if such combinations or combinations are not expressly recited in the present disclosure. In particular, various combinations and/or combinations of the features recited in the various embodiments and/or claims of the present disclosure may be made without departing from the spirit or teaching of the present disclosure. All such combinations and/or associations are within the scope of the present disclosure.

The embodiments of the present disclosure have been described above. However, these examples are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although the embodiments are described separately above, this does not mean that the measures in the embodiments cannot be used in advantageous combination. The scope of the disclosure is defined by the appended claims and equivalents thereof. Various alternatives and modifications can be devised by those skilled in the art without departing from the scope of the present disclosure, and such alternatives and modifications are intended to be within the scope of the present disclosure.

Claims

1. An automated testing method, comprising:

in response to a received test request, determining a to-be-tested object indicated by the test request;

determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested;

sending the test case to a test executive party so that the test executive party can test the object to be tested according to the test case;

acquiring test parameters aiming at the object to be tested;

and determining and outputting a test result aiming at the object to be tested according to the test parameters and a preset parameter threshold.

2. The method of claim 1, wherein said obtaining test parameters for said subject to be tested comprises:

and identifying the test data measured by the test instrument used in the test process to obtain the test parameters of the object to be tested.

3. The method of claim 2, wherein the identifying test data measured by a test instrument used in the test procedure comprises:

identifying and processing a test panel image of the test instrument uploaded by a test executive party; or the like, or, alternatively,

and scanning the test panel of the test instrument.

4. The method of claim 2, wherein said obtaining test parameters for said subject to be tested, further comprises:

and acquiring the test parameters from the test instrument through a preset communication link.

5. The method of claim 1, wherein after obtaining the test parameters, performing comprises:

adding the test parameters to a standardized table associated with the test case according to the measurement units of the test parameters;

and after the test parameters of the preset types are added, generating a test report aiming at the object to be tested.

6. The method of any of claims 1 to 5, when obtaining test parameters for the subject to be tested, performing comprises:

determining whether the test operation aiming at the object to be tested conforms to the test case or not according to the type of the obtained test parameters; and

and taking the test parameters which do not conform to the test operation of the test case as invalid parameters, and giving an alarm to require manual confirmation or abandon.

7. The method of claim 1, further comprising:

similarity calculation is carried out on the obtained test parameters and fault parameters in a preset fault library; and the number of the first and second groups,

and when the similarity is higher than a preset threshold value, determining that the object to be tested is abnormal.

8. The method of any one of claims 1 to 7, wherein the method is used for testing equipment of an internet data center.

9. An automated test apparatus, comprising:

the device comprises a to-be-tested object determining module, a to-be-tested object determining module and a test object determining module, wherein the to-be-tested object determining module is used for responding to a received test request and determining a to-be-tested object indicated by the test request;

the test case determining module is used for determining a test case for the object to be tested, wherein the test case describes a structured flow for testing the object to be tested;

the test case sending module is used for sending the test case to a test executive party so that the test executive party can test the object to be tested according to the test case;

the test parameter acquisition module is used for acquiring test parameters aiming at the object to be tested;

and the test result determining module is used for determining and outputting a test result aiming at the object to be tested according to the test parameters and preset parameter thresholds.

10. An electronic device, comprising:

one or more processors; and

a memory for storing one or more programs,

wherein the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the method of any of claims 1-8.

11. A computer readable storage medium having stored thereon executable instructions which, when executed by a processor, cause the processor to carry out the method of any one of claims 1 to 8.