CN113695271A - Method for automatically setting defective product mark - Google Patents
Method for automatically setting defective product mark Download PDFInfo
- Publication number
- CN113695271A CN113695271A CN202010438584.6A CN202010438584A CN113695271A CN 113695271 A CN113695271 A CN 113695271A CN 202010438584 A CN202010438584 A CN 202010438584A CN 113695271 A CN113695271 A CN 113695271A
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- Prior art keywords
- mark
- defective
- defective product
- data
- complete
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- 230000002950 deficient Effects 0.000 title claims abstract description 57
- 238000000034 method Methods 0.000 title claims abstract description 25
- 238000001514 detection method Methods 0.000 claims abstract description 8
- 238000004519 manufacturing process Methods 0.000 claims abstract description 6
- 238000002955 isolation Methods 0.000 claims abstract description 4
- 238000012545 processing Methods 0.000 claims description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- General Factory Administration (AREA)
Abstract
The invention provides a method for automatically setting a defective product mark, which comprises the following steps: s1: and (4) concentrating defective products: manually collecting defective products on different production lines in the containing boxes; s2: calling defective product data: inquiring whether the defective product data are complete, if the data are complete, calling the data for carrying out the next step, and if not, carrying out mobile isolation; s3: and (3) defective product detection: extracting defective product patterns, comparing the defective product patterns with qualified products, and enabling the qualified products to reach the step S6, otherwise, entering the next step; s4: setting a mark: setting a rejection mark, detecting whether the rejection mark is complete or not, and resetting if the rejection mark is incomplete; s5: detection of the containing box: detecting whether the containing box has residues, if so, returning to the S2, otherwise, carrying out the next step; s6: resetting defective products: registering data of defective products, and returning all samples to the original positions; the invention avoids the condition that the mark cannot be identified or the position of the manual mark is wrong due to the non-standard mark, reduces the labor cost and improves the working efficiency.
Description
Technical Field
The invention mainly relates to the field of product marking, in particular to a method for automatically setting a defective product mark.
Background
In the production process of semiconductor products, operators need to manually mark three bad positions, and large-area scrapping usually occurs on 1-2 substrates in mass production. The operator needs to spend a lot of time and manpower to mark the rejected mark, and the manual mark is easy to have the problems of irregular mark, inconsistent mark depth, even position error of the mark and the like, which brings great trouble to the post-processing.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a method for automatically setting a defective product mark, which comprises the following steps:
s1: and (4) concentrating defective products: manually collecting defective products on different production lines in the containing boxes;
s2: calling defective product data: inquiring whether the defective product data are complete, if the data are complete, calling the data for carrying out the next step, and if not, carrying out mobile isolation;
s3: and (3) defective product detection: extracting a defective product pattern, comparing the defective product pattern with a qualified product pattern, and if the defective product pattern is a qualified product, directly performing the step S6, otherwise, entering the next step;
s4: setting a mark: setting a rejection mark, detecting whether the rejection mark is complete or not, and resetting if the rejection mark is incomplete;
s5: detection of the containing box: detecting whether the containing box has residues, if so, returning to the S2, otherwise, carrying out the next step;
s6: resetting defective products: and (4) performing data registration of defective products, and returning all samples to the original position.
Preferably, in step S1, the starting step is performed manually.
Preferably, the data in step S2 includes three defective patterns, product numbers, position information and processing records.
Preferably, in step S3, the non-defective pattern is a clear complete pattern input in advance.
Preferably, in step S4, the setting of the rejection flag is performed by a laser method.
Preferably, in step S5, the container data is recorded into the system in advance.
Preferably, in step S6, the defective product data is registered and then entered into the system.
The invention has the beneficial effects that: the situation that the subsequent process is wrong due to the fact that the mark is not standard and cannot be identified or the position of the manual mark is wrong is avoided; meanwhile, time and labor wasted in large-scale marking after batch scrapping are reduced, and the purposes of reducing labor cost and improving working efficiency are achieved.
Drawings
FIG. 1 is a flow chart illustrating a method for automatically setting a defective product flag;
Detailed Description
In order to make the technical solutions of the present invention better understood and make the above features, objects, and advantages of the present invention more comprehensible, the present invention is further described with reference to the following examples. The examples are intended to illustrate the invention only and are not intended to limit the scope of the invention.
As shown in fig. 1, the present invention includes: the method comprises the following steps:
s1: and (4) concentrating defective products: manually collecting defective products on different production lines in the containing boxes;
s2: calling defective product data: inquiring whether the defective product data are complete, if the data are complete, calling the data for carrying out the next step, and if not, carrying out mobile isolation;
s3: and (3) defective product detection: extracting a defective product pattern, comparing the defective product pattern with a qualified product pattern, and if the defective product pattern is a qualified product, directly performing the step S6, otherwise, entering the next step;
s4: setting a mark: setting a rejection mark, detecting whether the rejection mark is complete or not, and resetting if the rejection mark is incomplete;
s5: detection of the containing box: detecting whether the containing box has residues, if so, returning to the S2, otherwise, carrying out the next step;
s6: resetting defective products: and (4) performing data registration of defective products, and returning all samples to the original position.
In this embodiment, it is preferable that the starting step in step S1 is manually performed.
In this embodiment, the data in step S2 preferably includes three defective patterns, product numbers, position information and processing records.
In this embodiment, preferably, in the step S3, the non-defective pattern is a clear complete pattern input in advance.
In this embodiment, it is preferable that the setting of the rejection flag in step S4 is performed by a laser method.
In this embodiment, preferably, in the step S5, the container data is recorded into the system in advance.
In this embodiment, preferably, in step S6, the defective product data is registered and then entered into the system.
During use, the step S1 is eliminated, and all steps are automatically completed by the system itself. The moving of the isolated defective products also needs to be finished manually and then the program is restarted, or the moving of the isolated defective products is finished without the method.
The above-described embodiments are merely illustrative of the principles and utilities of the present patent application and are not intended to limit the present patent application. Modifications and variations can be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of this patent application. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical concepts disclosed in the present application shall be covered by the claims of this patent application.
Claims (7)
1. A method for automatically setting a defective product mark is characterized by comprising the following steps:
s1: and (4) concentrating defective products: manually collecting defective products on different production lines in the containing boxes;
s2: calling defective product data: inquiring whether the defective product data are complete, if the data are complete, calling the data for carrying out the next step, and if not, carrying out mobile isolation;
s3: and (3) defective product detection: extracting a defective product pattern, comparing the defective product pattern with a qualified product pattern, and if the defective product pattern is a qualified product, directly performing the step S6, otherwise, entering the next step;
s4: setting a mark: setting a rejection mark, detecting whether the rejection mark is complete or not, and resetting if the rejection mark is incomplete;
s5: detection of the containing box: detecting whether the containing box has residues, if so, returning to the S2, otherwise, carrying out the next step;
s6: resetting defective products: and (4) performing data registration of defective products, and returning all samples to the original position.
2. The method of claim 1, wherein the method comprises the steps of: in step S1, the start step is performed manually.
3. The method of claim 1, wherein the method comprises the steps of: the data in step S2 includes three defective patterns, product numbers, position information and processing records.
4. The method of claim 1, wherein the method comprises the steps of: in step S3, the non-defective pattern is a clear complete pattern input in advance.
5. The method of claim 1, wherein the method comprises the steps of: in step S4, the rejection flag is set by a laser method.
6. The method of claim 1, wherein the method comprises the steps of: in step S5, the container data is entered into the system in advance.
7. The method of claim 1, wherein the method comprises the steps of: in step S6, the defective product data is registered and then entered into the system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010438584.6A CN113695271A (en) | 2020-05-22 | 2020-05-22 | Method for automatically setting defective product mark |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010438584.6A CN113695271A (en) | 2020-05-22 | 2020-05-22 | Method for automatically setting defective product mark |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113695271A true CN113695271A (en) | 2021-11-26 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010438584.6A Pending CN113695271A (en) | 2020-05-22 | 2020-05-22 | Method for automatically setting defective product mark |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113695271A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116110822A (en) * | 2022-12-07 | 2023-05-12 | 晶科能源股份有限公司 | Solar cell tracing method and cell transmission equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003273171A (en) * | 2002-03-15 | 2003-09-26 | Seiko Epson Corp | Semiconductor manufacturing device, defect review device and manufacturing method for semiconductor device |
| US20100115887A1 (en) * | 2008-11-07 | 2010-05-13 | Delkor Systems, Inc. | Detection System |
| CN202807183U (en) * | 2012-07-24 | 2013-03-20 | 格兰达技术（深圳）有限公司 | Rejected product marking module device for full-automatic IC (integrated circuit) coil detecting machine |
| CN103253410A (en) * | 2013-05-10 | 2013-08-21 | 江苏新宁供应链管理有限公司 | Semi-automatic labeling production line |
| CN204872943U (en) * | 2015-07-23 | 2015-12-16 | 苏州博众精工科技有限公司 | Defective products letter sorting mechanism |
| CN105478363A (en) * | 2015-11-20 | 2016-04-13 | 苏州易瑞得电子科技有限公司 | Defective product detection and classification method and system based on three-dimensional figures |
| CN110712803A (en) * | 2019-09-11 | 2020-01-21 | 东阿阿胶股份有限公司 | Intelligent donkey-hide gelatin syrup box supply assembly line and box supply method |
| CN110773443A (en) * | 2019-10-31 | 2020-02-11 | 太仓北新建材有限公司 | Gypsum board defective product removing device and implementation method thereof |
| CN111071782A (en) * | 2019-12-18 | 2020-04-28 | 苏州精濑光电有限公司 | Rechecking device of display device |
-
2020
- 2020-05-22 CN CN202010438584.6A patent/CN113695271A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003273171A (en) * | 2002-03-15 | 2003-09-26 | Seiko Epson Corp | Semiconductor manufacturing device, defect review device and manufacturing method for semiconductor device |
| US20100115887A1 (en) * | 2008-11-07 | 2010-05-13 | Delkor Systems, Inc. | Detection System |
| CN202807183U (en) * | 2012-07-24 | 2013-03-20 | 格兰达技术（深圳）有限公司 | Rejected product marking module device for full-automatic IC (integrated circuit) coil detecting machine |
| CN103253410A (en) * | 2013-05-10 | 2013-08-21 | 江苏新宁供应链管理有限公司 | Semi-automatic labeling production line |
| CN204872943U (en) * | 2015-07-23 | 2015-12-16 | 苏州博众精工科技有限公司 | Defective products letter sorting mechanism |
| CN105478363A (en) * | 2015-11-20 | 2016-04-13 | 苏州易瑞得电子科技有限公司 | Defective product detection and classification method and system based on three-dimensional figures |
| CN110712803A (en) * | 2019-09-11 | 2020-01-21 | 东阿阿胶股份有限公司 | Intelligent donkey-hide gelatin syrup box supply assembly line and box supply method |
| CN110773443A (en) * | 2019-10-31 | 2020-02-11 | 太仓北新建材有限公司 | Gypsum board defective product removing device and implementation method thereof |
| CN111071782A (en) * | 2019-12-18 | 2020-04-28 | 苏州精濑光电有限公司 | Rechecking device of display device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116110822A (en) * | 2022-12-07 | 2023-05-12 | 晶科能源股份有限公司 | Solar cell tracing method and cell transmission equipment |
| CN116110822B (en) * | 2022-12-07 | 2024-05-10 | 晶科能源股份有限公司 | Solar cell tracing method and cell transmission equipment |
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Application publication date: 20211126 |