CN113687407A - Scintillation measuring instrument calibration device, scintillation measuring instrument calibration method and storage medium - Google Patents
Scintillation measuring instrument calibration device, scintillation measuring instrument calibration method and storage medium Download PDFInfo
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Abstract
The application discloses a flicker measuring instrument calibration device, a flicker measuring instrument calibration method and a storage medium, wherein the flicker measuring instrument calibration device comprises a control module, a light-emitting module and a brightness feedback module; the control module is connected with the light-emitting module and is used for sending a brightness waveform to the light-emitting module and controlling the light-emitting module to emit light based on the brightness waveform; the brightness feedback module is respectively connected with the control module and the light-emitting module and is used for acquiring a brightness signal of the light-emitting module and sending the brightness signal to the control module; the control module is used for calculating and calibrating the response time according to the brightness signal. In the application, the control module, the light-emitting module and the brightness feedback module are connected in a closed loop manner, so that the brightness of the light-emitting module can be controlled in a closed loop manner, and the light-emitting effect of the light-emitting module is more accurate; the control module can provide different brightness waveforms, and can simultaneously calibrate the response time and the flicker rate under different brightness conditions.
Description
Technical Field
The present disclosure relates to the field of scintillation measurement technologies, and in particular, to a scintillation measurement apparatus calibration device, a scintillation measurement apparatus calibration method, and a storage medium.
Background
The flicker rate parameter can affect the visual fatigue of human eyes, and is a key parameter for the flat panel display industry and the lamp measurement, so that the flicker measuring instrument is indispensable to be applied to the industry. However, the measurement instruments of various manufacturers are inconsistent at present, so that the flicker measurement instrument cannot be traced and calibrated domestically, and meanwhile, no relevant measurement technical specification exists domestically, and no formed calibration device or solution exists.
Disclosure of Invention
The embodiment of the application provides a flicker measuring instrument calibration device, a flicker measuring instrument calibration method and a storage medium, which can perform closed-loop control on the brightness of a light emitting module and calibrate the response time and the flicker rate at the same time under different brightness conditions.
In one aspect, an embodiment of the present application provides a calibration apparatus for a scintillation measuring apparatus, including a control module, a light emitting module, and a brightness feedback module;
the control module is connected with the light-emitting module and is used for sending a brightness waveform to the light-emitting module and controlling the light-emitting module to emit light based on the brightness waveform;
the brightness feedback module is respectively connected with the control module and the light-emitting module and is used for acquiring a brightness signal of the light-emitting module and sending the brightness signal to the control module;
the control module is used for calculating and calibrating the response time according to the brightness signal.
Further, the control module comprises a display calculation module and a waveform generation module;
the display calculation module is connected with the waveform generation module and is used for determining the parameters of the brightness waveform and converting the parameters of the brightness waveform into brightness control signals;
the waveform generation module is connected with the light-emitting module and used for receiving the brightness control signal generated by the display calculation module and generating a brightness waveform according to the brightness control signal so as to control the light-emitting module to emit light based on the brightness waveform.
Furthermore, the control module also comprises a waveform storage module; the waveform storage module is connected with the display calculation module and is used for storing the brightness control signal generated by the display calculation module and the parameter of the brightness waveform corresponding to the brightness control signal.
Further, the display calculation module is configured to, when it is determined that the parameter of the luminance waveform is the parameter of the luminance waveform already stored in the input waveform storage module, call a luminance control signal corresponding to the parameter of the luminance waveform stored in the waveform storage module, and send the luminance control signal to the waveform generation module.
Further, the waveform generation module comprises a waveform conversion module, an output matching module and a waveform amplification module, and the waveform conversion module, the output matching module and the power amplification module are sequentially connected;
the waveform conversion module is connected with the display calculation module and is used for receiving the brightness control signal sent by the display calculation module and converting the brightness control signal into a first brightness waveform;
the output matching module is connected with the waveform conversion module and is used for receiving the first brightness waveform sent by the waveform conversion module and adjusting the output impedance of the waveform conversion module so as to ensure that the first brightness waveform is not distorted;
the waveform amplification module is connected with the output matching module and used for receiving the first brightness waveform sent by the output matching module, amplifying the first brightness waveform to obtain a brightness waveform and sending the brightness waveform to the light-emitting module.
Further, the waveform amplifying module further includes a voltage-current converting module for converting the luminance waveform into a current luminance waveform when the light emitting module includes a current-type device.
Further, the display calculation module is connected with the brightness feedback module, and the display calculation module is used for receiving the brightness signal sent by the brightness feedback module and obtaining a brightness adjustment signal according to the comparison between the brightness signal and the brightness control signal.
Further, the waveform generating module is used for receiving the brightness adjusting signal generated by the display calculating module and generating a brightness adjusting waveform according to the brightness adjusting signal, so as to adjust the brightness of the light emitting module.
Further, the calibration device of the flicker measuring instrument further comprises a flicker feedback module; the flicker feedback module is respectively connected with the display calculation module and the light-emitting module, and is used for acquiring flicker signals of the light-emitting module and sending the flicker signals to the display calculation module.
Further, the display calculation module is used for receiving the brightness signal sent by the brightness feedback module, and calculating and calibrating the response time according to the brightness signal; and/or the display calculation module is used for receiving the flicker signal sent by the flicker feedback module, and calculating and calibrating the flicker rate according to the flicker signal.
Further, the display calculation module is also used for storing data, wherein the data comprises waveform parameters, response time and flicker rate.
On the other hand, the embodiment of the application provides a method for calibrating a flicker measuring instrument, which comprises the following steps:
the control module sends a brightness waveform to the light emitting module;
the control module receives the brightness signal sent by the brightness feedback module; the brightness signal is obtained by the brightness feedback module based on the light-emitting module according to the brightness waveform light-emitting acquisition;
the control module calculates and calibrates the response time based on the brightness signal;
the control module receives a flicker signal sent by the flicker feedback module; the flicker signal is obtained by a flicker feedback module based on the light-emitting module to emit light and collect light according to the brightness waveform;
the control module calculates and calibrates a flicker rate based on the flicker signal.
Furthermore, the control module comprises a display calculation module, a waveform generation module and a waveform storage module;
the control module determines whether the parameters of the brightness waveform are the parameters of the brightness waveform stored in the input waveform storage module through the display calculation module;
if so, the control module calls a brightness control signal corresponding to the parameters of the brightness waveform stored in the waveform storage module through the display calculation module, and sends the brightness control signal to the waveform generation module;
or;
if not, the control module converts the parameters of the brightness waveform into brightness control signals through the display calculation module, sends the brightness control signals to the waveform generation module, and sends the parameters of the brightness waveform and the brightness control signals to the waveform storage module.
Further, the waveform generation module comprises a waveform conversion module, an output matching module and a power amplification module;
the control module converts the brightness control signal into a first brightness waveform through the waveform conversion module;
the control module adjusts the output impedance of the waveform conversion module through the output matching module, so that the first brightness waveform is not distorted;
the control module amplifies the first brightness waveform through the waveform amplification module to obtain a brightness waveform.
Further, the waveform amplifying module comprises a voltage-current conversion module;
when the light emitting module comprises a current-type device, the control module converts the brightness waveform into a current brightness waveform through the voltage-current conversion module.
Further, the control module compares the brightness signal with the brightness control signal through the display calculation module to obtain a brightness adjustment signal;
the control module generates a brightness adjusting waveform according to the brightness adjusting signal through the waveform generating module;
the control module sends the brightness adjustment waveform to the light emitting module.
Another aspect provides an electronic device, which includes a processor and a memory, where at least one instruction or at least one program is stored in the memory, and the at least one instruction or the at least one program is loaded by the processor and executed to implement the scintillation gauge calibration method as described above.
Another aspect provides a computer-readable storage medium, in which at least one instruction or at least one program is stored, and the at least one instruction or the at least one program is loaded and executed by a processor to implement the scintillation gauge calibration method as described above.
The scintillation measuring instrument calibration device, the scintillation measuring instrument calibration method and the storage medium provided by the embodiment of the application have the following technical effects:
according to the calibration device for the flicker measuring instrument, the control module is used for determining the parameters of the brightness waveform and controlling the light-emitting module to emit light based on the brightness waveform, so that calibration can be performed under different brightness conditions;
according to the calibration device for the flicker measuring instrument, the control module, the light emitting module and the brightness feedback module are connected in a closed loop mode, the brightness of the light emitting module can be controlled in a closed loop mode, and the light emitting effect of the light emitting module is more accurate;
the flicker measuring instrument calibration device provided by the embodiment of the application can calibrate the response time and the flicker rate simultaneously by arranging the flicker feedback module and the brightness feedback module.
Drawings
In order to more clearly illustrate the technical solutions and advantages of the embodiments of the present application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic structural diagram of a calibration apparatus for a scintillation measuring apparatus according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a control module of a scintillation measuring apparatus calibration apparatus according to an embodiment of the present disclosure;
fig. 3 is a schematic structural diagram of a waveform generation module of a calibration apparatus for a scintillation measuring instrument according to an embodiment of the present disclosure;
fig. 4 is a schematic structural diagram of a calibration apparatus for a scintillation measuring apparatus according to an embodiment of the present disclosure;
fig. 5 is a schematic structural diagram of a calibration apparatus for a scintillation measuring apparatus according to an embodiment of the present disclosure;
FIG. 6 is a schematic flow chart illustrating a method for calibrating a scintillation gauge according to an embodiment of the present disclosure;
fig. 7 is a schematic flowchart illustrating luminance control signal conversion of a method for calibrating a scintillation gauge according to an embodiment of the present disclosure;
fig. 8 is a schematic flow chart illustrating a brightness waveform of a method for calibrating a scintillation gauge according to an embodiment of the present disclosure;
FIG. 9 is a flow chart of a brightness closed-loop control of a flicker measurement calibration method according to an embodiment of the present disclosure;
fig. 10 is a block diagram of a hardware structure of a server of a calibration method for a scintillation gauge according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Reference herein to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic may be included in at least one implementation of the present application. In the description of the present application, it is to be understood that the terms "upper", "lower", "left", "right", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are only for convenience in describing the present application and simplifying the description, and do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application. Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. Moreover, the terms "first," "second," and the like are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein.
Fig. 1 shows a schematic structural diagram of a calibration apparatus for a scintillation measuring instrument according to an embodiment of the present application, and as shown in fig. 1, the calibration apparatus includes a control module 1, a light emitting module 2, and a brightness feedback module 3. The control module 1 is connected with the light-emitting module 2, the control module 1 sends a brightness waveform to the light-emitting module 2, and controls the light-emitting module 2 to emit light based on the brightness waveform; the brightness feedback module 3 is respectively connected with the control module 1 and the light-emitting module 2, the brightness feedback module 3 collects the brightness signal of the light-emitting module 2 and sends the brightness signal to the control module 1, and the control module 1 calculates and calibrates the response time according to the received brightness signal. Thus, the control module 1, the light emitting module 2 and the brightness feedback module 3 are connected, closed-loop connection and feedback are realized, and the response time can be calibrated.
Fig. 2 is a schematic structural diagram of a control module of a calibration apparatus for a scintillation measuring instrument according to an embodiment of the present application, and as shown in fig. 2, the control module 1 includes a display calculation module 11 and a waveform generation module 12, and the display calculation module 11 is connected to the waveform generation module 12. The display calculation module 11 is configured to determine a parameter of a luminance waveform sent to the light emitting module 2, where the parameter of the luminance waveform is an analog signal, and the display calculation module 11 converts the parameter of the luminance waveform of the analog signal into a luminance control signal of a digital signal and sends the luminance control signal to the waveform generation module 12, so that the waveform generation module 12 generates the luminance waveform. Specifically, the brightness waveform may be a sine wave, a trapezoidal wave, a square wave, and the like, and the parameters of the brightness waveform may include the type of the brightness waveform, the brightness size, the frequency, and the like. Optionally, the luminance range of the luminance waveform may be adjustable within 1-2000 cd/m2, and the frequency may be adjustable within 1 Hz-10 kHz.
The waveform generating module 12 is respectively connected to the display calculating module 11 and the light emitting module 2, and the waveform generating module 12 is configured to receive the brightness control signal sent by the display calculating module 11, generate a brightness waveform according to the brightness control signal, and send the brightness waveform to the light emitting module 2, so as to control the light emitting module 2 to emit light based on the brightness waveform.
The display calculation module 11 and the waveform generation module 12 are arranged, so that the control module 1 can provide a plurality of brightness waveforms for the light emitting module 2, and the calibration device for the scintillation measuring instrument provided by the embodiment of the application has universality and can calibrate different scintillation measuring instruments by using different types of brightness waveforms.
Optionally, the control module 1 may further include a waveform storage module 13, where the waveform storage module 13 is connected to the display calculation module 11, and the waveform storage module 13 is configured to store the luminance control signal generated by the conversion of the display calculation module 11 and a parameter of the luminance waveform corresponding to the luminance control signal. Specifically, when the display calculation module 11 obtains the parameter of the brightness waveform, the display calculation module 11 first compares whether the parameter of the brightness waveform is the parameter of the brightness waveform already stored in the waveform storage module 13, and if so, the display calculation module 11 calls the brightness control signal corresponding to the parameter of the brightness waveform stored in the waveform storage module 13 and sends the brightness control signal to the waveform generation module 12; if not, the display calculating module 11 converts the parameter of the brightness waveform into a brightness control signal, and on one hand, sends the brightness control signal to the waveform generating module 12, and on the other hand, sends the parameter of the brightness waveform and the corresponding brightness control signal to the waveform storing module 13, so that the waveform storing module 13 stores the parameter of the brightness waveform and the corresponding brightness control signal.
By arranging the waveform storage module 13, the display calculation module 11 can directly call the brightness control signal stored in the waveform storage module 13, and the repeated work is not needed for the parameters of the same brightness waveform, so that the processing time of the display calculation module 11 is reduced, and the response time of the calibration device of the flicker measuring instrument provided by the embodiment of the application is reduced.
Fig. 3 shows a schematic structural diagram of a waveform generating module of a calibration apparatus of a scintillation meter according to an embodiment of the present application, and as shown in fig. 3, the waveform generating module 12 includes a waveform converting module 121, an output matching module 122, and a waveform amplifying module 123, and the waveform converting module 121, the output matching module 122, and the waveform amplifying module 123 are connected in sequence.
The waveform conversion module 121 is connected to the display calculation module 11, and the waveform conversion module 121 is configured to receive the brightness control signal sent by the display calculation module 11 and convert the brightness control signal into a first brightness waveform, where the first brightness waveform may be a voltage waveform, and the light emitting module 2 is controlled to emit light by the first brightness waveform.
Since the first brightness waveform is a voltage waveform, in order to prevent the distortion of the first brightness waveform caused by the mismatch of the output voltages of the subsequent modules and the waveform conversion module 121 and influence the quality of the first brightness waveform, so that the light emitting module 2 cannot emit light based on the brightness waveform, the output matching module 122 is connected behind the waveform conversion module 121. The output matching module 122 is configured to receive the first luminance waveform sent by the waveform module 121, and adjust the output impedance of the waveform conversion module 121, so that the output voltage of the waveform conversion module 121 is matched with a subsequent module, thereby preventing the first luminance waveform from being distorted.
The waveform amplifying module 123 is connected to the output matching module 122 and the light emitting module 2, and is configured to receive the first brightness waveform sent by the output matching module 122, and amplify the first brightness waveform to obtain a brightness waveform, so as to meet the driving requirement of the light emitting module 2, and enable the light emitting module 2 to emit light based on the brightness waveform.
Optionally, the light emitting module 2 may be a voltage type device, the light emitting module 2 is connected to the waveform amplifying module 123, and the light emitting module 2 is configured to receive the luminance waveform sent by the waveform amplifying module 123 and emit light based on the luminance waveform.
Optionally, the light emitting module 2 may be a current-mode device, and the waveform amplifying module 123 may include a voltage-current converting module, where the voltage-current converting module is configured to convert a brightness waveform of a voltage into a brightness waveform of a current so as to meet a driving requirement of the current-mode device, so that the light emitting module emits light based on the brightness waveform.
The waveform conversion module 121, the output matching module 122, and the waveform amplification module 123 are configured such that the parameters of the luminance waveform generated by the waveform generation module 12 are consistent with the parameters of the luminance waveform determined by the display calculation module 11, so that the light emitting module 2 can emit light based on the luminance waveform determined by the display calculation module 11.
Optionally, the waveform generating module 12 may be a programmable power supply, and the waveform converting module 121, the output matching module 122 and the waveform amplifying module 123 are integrated into one device, so as to reduce the size of the calibration apparatus for a scintillation meter provided in the embodiment of the present application.
Fig. 4 is a schematic structural diagram of a calibration apparatus for a scintillation measuring instrument according to an embodiment of the present application, and as shown in fig. 4, a display calculation module 11 is connected to the luminance feedback module 3, where the display calculation module 11 is configured to receive a luminance signal sent by the luminance feedback module 3, and on one hand, the display calculation module 11 calculates and calibrates a response time according to the luminance signal; on the other hand, the display calculation module 11 obtains a brightness adjustment signal according to the comparison result between the brightness signal and the brightness control signal, and sends the brightness adjustment signal to the waveform generation module 12.
The waveform generating module 12 receives the brightness adjusting signal sent by the display calculating module 11, adjusts the brightness adjusting signal according to the brightness adjusting signal to obtain a brightness adjusting waveform, and sends the brightness adjusting waveform to the light emitting module 2, so as to adjust the brightness of the light emitting module 2, and the light emitting module 2 emits light based on the brightness waveform.
Through the cooperation of the display module 11, the waveform generation module 12, the light-emitting module 2 and the brightness feedback module 3, the light-emitting effect of the light-emitting module 2 is controlled in a closed loop manner, so that the light-emitting effect of the light-emitting module 2 can be timely adjusted when deviation is generated between the light-emitting effect and the brightness waveform, the light-emitting effect of the light-emitting module 2 is more accurate, and the calibration result is more accurate.
Fig. 5 shows a schematic structural diagram of a calibration apparatus for a scintillation measurement instrument provided in an embodiment of the present application, and as shown in fig. 5, the calibration apparatus for a scintillation measurement instrument provided in an embodiment of the present application further includes a scintillation feedback module 4, and the scintillation feedback module 4 is connected to the display calculation module 11 and the light emitting module 2 respectively, and is configured to collect scintillation signals of the light emitting module 2 and send the scintillation signals to the display calculation module 11. The display calculation module 11 receives the flicker signal sent by the flicker feedback module 4, and calculates and calibrates the flicker rate according to the flicker signal. Through setting up scintillation feedback module 4 and luminance feedback module 3 for the scintillation measuring apparatu calibrating device that this application embodiment provided can calibrate the scintillation rate, also can calibrate response time.
Specifically, the display calculation module 11 may be connected to the flicker measuring instrument to be calibrated, receive the flicker rate and the response time measured by the flicker measuring instrument to be calibrated on the light emitting module 2, and calculate the flicker rate and the response time with the flicker measuring instrument calibration device provided in this embodiment of the present application, so as to obtain the calibration result of the flicker measuring instrument to be calibrated.
Alternatively, the brightness feedback module 3 may include a brightness meter, and the flicker feedback module 4 may include a photo sensor, which may be a photo sensor with a high frequency resolution.
Optionally, the display calculating module 11 may also be configured to store data, which includes waveform parameters, response time, flicker rate, and the like.
The parameters of the brightness waveform are determined through the control module 1, the brightness of the light-emitting module 2 is controlled in a closed-loop mode through the control module 1, the light-emitting module 2 and the brightness feedback module 3, the brightness signal and the flicker signal of the light-emitting module 2 are collected simultaneously through the flicker feedback module 3 and the brightness feedback module 4, the flicker measuring instrument calibration device can be used for calibrating under different brightness conditions, the calibration precision and the accuracy are high, and the response time and the flicker rate can be calibrated simultaneously.
The embodiment of the present application further provides a calibration method for a scintillation measuring instrument, fig. 6 shows a schematic flow chart of the calibration method for a scintillation measuring instrument provided in the embodiment of the present application, and as shown in fig. 6, the standard method for a scintillation measuring instrument includes the following steps:
s01: the control module 1 sends a brightness waveform to the light emitting module 2.
S02: the control module 1 receives the brightness signal sent by the brightness feedback module 3. The brightness signal is obtained by the brightness feedback module 3 based on the light emitting module 2 according to the brightness waveform light emitting collection.
S03: the control module 1 calculates and calibrates the response time based on the luminance signal.
Specifically, the control module 1 is connected to the flicker measuring instrument to be calibrated, receives the response time measured by the flicker measuring instrument to be calibrated to the light emitting module 2, and compares the response time with the response time calculated by the control module 1, thereby obtaining a calibration result of the response time.
S04: the control module 1 receives the flicker signal sent by the flicker feedback module 4. The flicker signal is obtained by the flicker feedback module 4 based on the light-emitting module 2 according to the luminance waveform light-emitting collection.
S05: the control module 1 calculates and calibrates the flicker rate based on the flicker signal.
Specifically, the control module 1 is connected to the flicker measuring instrument to be calibrated, receives the flicker rate measured by the flicker measuring instrument to be calibrated to the light emitting module 2, and compares the response time with the flicker rate calculated by the control module 1, thereby obtaining a calibration result of the response time.
Through the calibration steps, the calibration method for the flicker measuring instrument provided by the embodiment of the application can calculate and calibrate the response time and the flicker rate at the same time.
Specifically, the control module 1 includes a display calculation module 11, a waveform generation module 12, and a waveform storage module 13. Fig. 7 is a schematic flowchart illustrating a luminance control signal conversion process of a calibration method of a scintillation meter according to an embodiment of the present application, where, as shown in fig. 7, the luminance control signal conversion process includes the following steps:
s11: the control block 1 determines whether the parameter of the luminance waveform is the parameter of the luminance waveform already stored in the input waveform storage block 13 through the display calculation block 11. Alternatively, the brightness waveform may be a sine wave, a trapezoidal wave, a square wave, or the like, and the parameters of the brightness waveform may include the type of the brightness waveform, the brightness size, the frequency, and the like. Optionally, the luminance range of the luminance waveform may be adjustable within 1-2000 cd/m2, and the frequency may be adjustable within 1 Hz-10 kHz. If yes, go to S12; if not, go to S13.
S12: the control module 1 calls the brightness control signal corresponding to the parameter of the brightness waveform stored in the waveform storage module 13 through the display calculation module 11.
S13: the control module 1 converts the parameters of the brightness waveform into brightness control signals through the display calculation module 11.
S14, the control module 1 sends the brightness control signal to the waveform generation module 12 through the display calculation module 11.
S15: the control module 1 sends the parameters of the brightness waveform and the brightness control signal to the waveform storage module 13 through the display calculation module 11.
Through the steps, the control module 1 can directly call the brightness control signal stored in the waveform storage module 13 through the display calculation module 11, and the repeated work is not needed for the parameters of the same brightness waveform, so that the processing time of the display calculation module 11 is reduced.
Specifically, the waveform generating module 12 includes a waveform converting module 121, an output matching module 122, and a power amplifying module 123. Fig. 8 is a flow chart illustrating a brightness waveform of a calibration method of a scintillation meter according to an embodiment of the present application, and as shown in fig. 8, the generation of the brightness waveform includes the following steps:
s16: the control block 1 converts the luminance control signal into a first luminance waveform through the waveform conversion block 121.
S17: the control module 1 adjusts the output impedance of the waveform conversion module 121 through the output matching module 122, so that the first brightness waveform is not distorted.
S18: the control module 1 amplifies the first brightness waveform by the waveform amplifying module 123 to obtain a brightness waveform.
Optionally, the waveform amplifying module 123 further includes a voltage-current converting module.
S19, whether the light emitting module 2 is a current mode device is determined, if yes, the process goes to S20.
S20, the control module 1 converts the brightness waveform into a current brightness waveform through the voltage-current conversion module.
S21, the control module 1 transmits the brightness waveform to the light emitting module 2 through the waveform amplifying module 123.
By the above method, the parameters of the luminance waveform generated by the control module 1 through the waveform generation module 12 are consistent with the parameters of the luminance waveform determined by the display calculation module 11, so that the light emitting module 2 can emit light based on the luminance waveform determined by the display calculation module 11, and the light emitting module 2 can be compatible with a current type device and a voltage type device, and has universality.
Fig. 9 is a schematic flowchart illustrating a brightness closed-loop control of a flicker measurement calibration method according to an embodiment of the present application, and as shown in fig. 9, the brightness closed-loop control of the light emitting module 2 includes the following steps:
s06: the control module 1 compares the brightness signal with the brightness control signal through the display calculation module 11 to obtain a brightness adjustment signal.
S07: the control module 1 generates a brightness adjustment waveform according to the brightness adjustment signal through the waveform generation module 12.
S08: the control module 1 transmits the brightness adjustment waveform to the light emitting module 2.
By the method, the light-emitting effect of the light-emitting module 2 is controlled in a closed loop mode, so that the light-emitting effect of the light-emitting module 2 can be adjusted in time when deviation is generated between the light-emitting effect and the brightness waveform, the light-emitting effect of the light-emitting module 2 is more accurate, and the calibration result is more accurate.
The method provided by the embodiment of the application can be executed in a computer terminal, a server or a similar operation device. Taking the example of the method performed on a server, fig. 10 is a block diagram of a hardware structure of the server of the calibration method for a scintillation measuring instrument according to the embodiment of the present application. As shown in fig. 10, the server 1000 may have a relatively large difference due to different configurations or performances, and may include one or more Central Processing Units (CPUs) 1010 (the processor 1010 may include but is not limited to a Processing device such as a microprocessor MCU or a programmable logic device FPGA), a memory 1030 for storing data, and one or more storage media 1020 (e.g., one or more mass storage devices) for storing applications 1023 or data 1022. Memory 1030 and storage media 1020 may be, among other things, transient or persistent storage. The program stored in the storage medium 1020 may include one or more modules, each of which may include a series of instruction operations for a server. Still further, the central processor 1010 may be configured to communicate with the storage medium 1020 and execute a series of instruction operations in the storage medium 1020 on the server 1000. The server 1000 may also include one or more power supplies 1060, one or more wired or wireless network interfaces 1050, one or more input-output interfaces 1040, and/or one or more operating systems 1021, such as Windows Server, Mac OS XTM, UnixTM, LinuxTM, FreeBSDTM, and so forth.
Input-output interface 1040 may be used to receive or transmit data via a network. Specific examples of such networks may include wireless networks provided by the communications provider of server 1600. In one example, i/o Interface 1040 includes a Network adapter (NIC) that may be coupled to other Network devices via a base station to communicate with the internet. In one example, the input/output interface 1040 may be a Radio Frequency (RF) module, which is used for communicating with the internet in a wireless manner.
It will be understood by those skilled in the art that the structure shown in fig. 10 is merely illustrative and is not intended to limit the structure of the electronic device. For example, server 1000 may also include more or fewer components than shown in FIG. 10, or have a different configuration than shown in FIG. 10.
Embodiments of the present application further provide a storage medium that can be disposed in a server to store at least one instruction, at least one program, a set of codes, or a set of instructions related to implementing a method for calibrating a flash measurement instrument in the method embodiments, where the at least one instruction, the at least one program, the set of codes, or the set of instructions is loaded and executed by the processor to implement the above-mentioned method for calibrating a measurement instrument.
Alternatively, in this embodiment, the storage medium may be located in at least one network server of a plurality of network servers of a computer network. Optionally, in this embodiment, the storage medium may include, but is not limited to: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
As can be seen from the above embodiments of the calibration apparatus, the calibration method, the device or the storage medium for a scintillation measuring instrument provided in the present application, the calibration apparatus for a scintillation measuring instrument in the present application includes a control module 1, a light emitting module 2 and a brightness feedback module 3; the control module 1 is connected with the light-emitting module 2, the control module 1 sends a brightness waveform to the light-emitting module 2, and the light-emitting module 2 is controlled to emit light based on the brightness waveform; the brightness feedback module 3 is respectively connected with the control module 1 and the light-emitting module 2, and the brightness feedback module 3 collects the brightness signal of the light-emitting module 2 and sends the brightness signal to the control module 1; the control module 1 calculates and calibrates the response time according to the luminance signal. In the application, the control module, the light-emitting module and the brightness feedback module are connected in a closed loop manner, so that the brightness of the light-emitting module can be controlled in a closed loop manner, and the light-emitting effect of the light-emitting module is more accurate; the control module can provide different brightness waveforms, and can simultaneously calibrate the response time and the flicker rate under different brightness conditions.
It should be noted that: the sequence of the embodiments of the present application is only for description, and does not represent the advantages and disadvantages of the embodiments. And specific embodiments thereof have been described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the apparatus embodiment, since it is substantially similar to the method embodiment, the description is relatively simple, and for the relevant points, reference may be made to the partial description of the method embodiment.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program instructing relevant hardware, where the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
The above description is only exemplary of the present application and should not be taken as limiting the present application, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims (18)
1. A flicker measuring instrument calibration device is characterized by comprising a control module (1), a light-emitting module (2) and a brightness feedback module (3);
the control module (1) is connected with the light-emitting module (2), the control module (1) is used for sending a brightness waveform to the light-emitting module (2) and controlling the light-emitting module (2) to emit light based on the brightness waveform;
the brightness feedback module (3) is respectively connected with the control module (1) and the light-emitting module (2), and the brightness feedback module (3) is used for collecting a brightness signal of the light-emitting module (2) and sending the brightness signal to the control module (1);
the control module (1) is used for calculating and calibrating the response time according to the brightness signal.
2. The scintillation gauge calibration apparatus according to claim 1, characterized in that the control module (1) comprises a display calculation module (11) and a waveform generation module (12);
the display calculation module (11) is connected with the waveform generation module (12), and the display calculation module (11) is used for determining the parameters of the brightness waveform and converting the parameters of the brightness waveform into brightness control signals;
the waveform generating module (12) is connected with the light emitting module (2), and the waveform generating module (12) is used for receiving the brightness control signal generated by the display calculating module (11) and generating the brightness waveform according to the brightness control signal, so that the light emitting module (2) is controlled to emit light based on the brightness waveform.
3. The scintillation gauge calibration apparatus according to claim 2, characterized in that the control module (1) further comprises a waveform storage module (13);
the waveform storage module (13) is connected with the display calculation module (11), and the waveform storage module (13) is used for storing the brightness control signal generated by the display calculation module (11) and the brightness waveform parameters corresponding to the brightness control signal.
4. The scintillation meter calibration apparatus of claim 3,
the display calculation module (11) is configured to, when it is determined that the parameter of the luminance waveform is a parameter of a luminance waveform that has been stored in the input waveform storage module (13), call the luminance control signal corresponding to the parameter of the luminance waveform that is stored in the waveform storage module (13), and send the luminance control signal to the waveform generation module (12).
5. The scintillation meter calibration apparatus of claim 2, wherein the waveform generation module (12) comprises a waveform conversion module (121), an output matching module (122) and a waveform amplification module (123), the waveform conversion module (121), the output matching module (122) and the power amplification module (123) being connected in sequence;
the waveform conversion module (121) is connected to the display calculation module (11), and the waveform conversion module (121) is configured to receive the brightness control signal sent by the display calculation module (11) and convert the brightness control signal into a first brightness waveform;
the output matching module (122) is connected to the waveform conversion module (121), and the output matching module (122) is configured to receive the first luminance waveform sent by the waveform conversion module (121) and adjust the output impedance of the waveform conversion module (121) so that the first luminance waveform is not distorted;
the waveform amplification module (123) is connected with the output matching module (122), and the waveform amplification module (123) is used for receiving the first brightness waveform sent by the output matching module (122), amplifying the first brightness waveform to obtain the brightness waveform and sending the brightness waveform to the light emitting module (2).
6. The scintillation meter calibration apparatus of claim 5, wherein the waveform amplification module (123) further comprises a voltage to current conversion module for converting the brightness waveform to a current brightness waveform when the light emitting module (2) comprises a current-type device.
7. The scintillation meter calibration apparatus according to claim 2, wherein the display calculation module (11) is connected to the brightness feedback module (3), and the display calculation module (11) is configured to receive the brightness signal sent by the brightness feedback module (3) and obtain a brightness adjustment signal according to a comparison between the brightness signal and the brightness control signal.
8. The scintillation meter calibration apparatus of claim 7, wherein the waveform generation module (12) is configured to receive the brightness adjustment signal generated by the display calculation module (11) and generate the brightness adjustment waveform according to the brightness adjustment signal, so as to adjust the brightness of the light emitting module (2).
9. The scintillation meter calibration apparatus of claim 2, further comprising a scintillation feedback module (4);
the flicker feedback module (4) is respectively connected with the display calculation module (11) and the light-emitting module (2), and the flicker feedback module (4) is used for collecting flicker signals of the light-emitting module (2) and sending the flicker signals to the display calculation module (11).
10. The scintillation meter calibration apparatus of claim 2 or 9,
the display calculation module (11) is used for receiving the brightness signal sent by the brightness feedback module (3), and calculating and calibrating response time according to the brightness signal;
and/or the presence of a gas in the gas,
the display calculation module (11) is used for receiving the flicker signal sent by the flicker feedback module (4), and calculating and calibrating the flicker rate according to the flicker signal.
11. The scintillation meter calibration apparatus of claim 2 wherein the display calculation module (11) is further configured to store data including the waveform parameters, response time, and scintillation rate.
12. A scintillation measuring apparatus calibration method is characterized by comprising the following steps:
the control module (1) sends a brightness waveform to the light-emitting module (2);
the control module (1) receives a brightness signal sent by the brightness feedback module (3); the brightness signal is obtained by the brightness feedback module (3) based on the light-emitting module (2) according to the brightness waveform light-emitting acquisition;
-said control module (1) calculates and calibrates said response time based on said luminance signal;
the control module (1) receives a flicker signal sent by the flicker feedback module (4); the flicker signal is obtained by the flicker feedback module (4) based on the light-emitting module (2) according to the brightness waveform light-emitting acquisition;
the control module (1) calculates and calibrates the flicker rate based on the flicker signal.
13. The scintillation gauge calibration method according to claim 12, characterized in that said control module (1) comprises a display calculation module (11), a waveform generation module (12) and a waveform storage module (13);
the control module (1) determines whether the parameter of the brightness waveform is the parameter of the brightness waveform which is input into the waveform storage module (13) through the display calculation module (11);
if yes, the control module (1) calls the brightness control signal corresponding to the parameter of the brightness waveform stored in the waveform storage module (13) through the display calculation module (11), and sends the brightness control signal to the waveform generation module (12);
or;
if not, the control module (1) converts the parameters of the brightness waveform into brightness control signals through the display calculation module (11), sends the brightness control signals to the waveform generation module (12), and sends the parameters of the brightness waveform and the brightness control signals to the waveform storage module (13).
14. The scintillation meter calibration method of claim 13, wherein the waveform generation module (12) comprises a waveform conversion module (121), an output matching module (122), and a power amplification module (123);
the control module (1) converts the brightness control signal into a first brightness waveform through the waveform conversion module (121);
the control module (1) adjusts the output impedance of the waveform conversion module (121) through the output matching module (122) so that the first brightness waveform is not distorted;
the control module (1) amplifies the first brightness waveform through the waveform amplification module (123) to obtain the brightness waveform.
15. The scintillation meter calibration method of claim 14, wherein the waveform amplification module (123) comprises a voltage to current conversion module;
when the light emitting module (2) comprises a current mode device, the control module (1) converts the brightness waveform into a current brightness waveform through the voltage-current conversion module.
16. The scintillation gauge calibration method of any one of claims 12 to 15,
the control module (1) compares the brightness signal with the brightness control signal through the display calculation module (11) to obtain a brightness adjustment signal;
the control module (1) generates the brightness adjusting waveform according to the brightness adjusting signal through the waveform generating module (12);
the control module (1) sends the brightness adjustment waveform to the light emitting module (2).
17. An electronic device comprising a processor and a memory, wherein at least one instruction or at least one program is stored in the memory, and wherein the at least one instruction or the at least one program is loaded by the processor and executes the scintillation meter calibration method of any one of claims 12-16.
18. A computer storage medium having at least one instruction or at least one program stored therein, the at least one instruction or the at least one program being loaded and executed by a processor to implement the scintillation meter calibration method of any one of claims 12-16.
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