CN113686465A - Transformer thermometer defect eliminating tester and testing method - Google Patents

Abstract

The invention provides a transformer thermometer defect elimination tester and a testing method, wherein the transformer thermometer defect elimination tester comprises a wiring module, a hardware module, a change-over switch module and an analysis module; the wiring module is respectively provided with a first input terminal, a second output terminal and a connecting terminal to be tested; the hardware module comprises a standard resistance module and an analog transmitting module, and the analog transmitting module is connected with the second output terminal and the connecting terminal to be detected; the switch module is respectively provided with a first grounding end, a second grounding end, a first shifting piece and a second shifting piece, and the first shifting piece is in switching connection with the first input terminal, the first grounding end and the standard resistor module; the second shifting piece is in switching connection with the second input terminal, the second grounding terminal and the analog transmitting module; the analysis module is electrically connected with the standard resistance module and the analog transmission module. The transformer thermometer defect elimination tester and the testing method provided by the invention simulate and replace a thermometer, and accurately measure errors caused by each device and eliminate defects.

Description

Transformer thermometer defect eliminating tester and testing method

Technical Field

The invention belongs to the technical field of transformer detection, and particularly relates to a defect eliminating tester and a defect eliminating testing method for a transformer thermometer.

Background

In an integrated automatic transformer substation, the monitored temperatures of different devices need to be collected and monitored, such as the oil temperature of a main transformer, the indoor and outdoor temperatures and the like, the temperature of the main transformer is one of important parameters of the transformer, and the indoor and outdoor temperatures are also important parameters of environments of primary and secondary devices and safety tools. The existing transformer defect eliminating work is to judge the fault condition through reasoning after measuring data through a thermometer. The existing thermometer detection method can only perform one-way measurement and judgment from a data end to a thermometer end, and cannot directly measure the condition of a temperature transmitter (hereinafter referred to as a transmitter) end; and the error caused by each device, cable and joint cannot be judged.

Disclosure of Invention

The invention aims to provide a defect elimination tester and a defect elimination method for a transformer thermometer, and aims to accurately measure errors caused by each device of a temperature measurement loop and reasonably eliminate defects.

In order to achieve the purpose, the invention adopts the technical scheme that: the utility model provides a transformer thermometer disappearance tester, includes:

the wiring module is respectively provided with a first input terminal connected with the thermometer, a second input terminal and a second output terminal connected with the transmitter, and a connection terminal to be tested connected with the device to be tested;

the hardware module comprises a standard resistor module for simulating a thermistor of the thermometer and a simulation transmission module for simulating a transmitter, and the simulation transmission module is connected with the second output terminal and the connecting terminal to be tested;

the switch module is respectively provided with a first grounding end, a second grounding end, a first shifting piece and a second shifting piece, the first shifting piece and the second shifting piece are both rotatably connected with a switch central shaft, and the first shifting piece is in switching connection with the first input terminal, the first grounding end and the standard resistor module; the second shifting piece is in switching connection with the second input terminal, the second grounding terminal and the analog transmission module;

and the analysis module is electrically connected with the standard resistance module and the analog transmission module.

As another embodiment of the present application, the standard resistance module includes:

the system comprises a plurality of thermistors, a power supply and a power supply, wherein the thermistors are connected in parallel and correspond to standard temperatures to be displayed by a device to be tested one by one; the thermistor leads are connected with the output end of the resistor module;

an insulation resistor connected in parallel to the plurality of thermistors;

the resistor fixing connecting rod is connected with an input end of the resistor module through a lead, the input end of the resistor module and the output end of the resistor module are integrated on a resistor module wiring terminal, and the resistor module wiring terminal is used for connecting the first shifting piece;

and the resistance switching gear lever is rotationally connected to the resistance fixing connecting rod and is connected with the plurality of thermistors and the insulation resistors in a switching manner.

As another embodiment of the present application, the analog transmitting module includes:

the input end of the analog transmitter is provided with a grounding wire; the output end of the analog transmitter is connected with the second output terminal and the connecting terminal to be detected;

and the analog transmitter wiring terminal is connected with the input end of the analog transmitter and is used for connecting the second shifting piece.

As another embodiment of this application, the transformer thermometer disappearance tester still is equipped with the display screen, the display screen with analysis module is connected.

The defect eliminating tester for the transformer thermometer provided by the invention has the beneficial effects that: compared with the prior art, the defect elimination tester for the transformer thermometer can completely simulate the condition of a whole thermometer loop, accurately measure the error caused by each device of the temperature measurement loop and reasonably eliminate defects; the analysis module can record the loop change, search the temperature jump problem, quickly judge the fault position and complete the defect elimination work.

In order to achieve the above object, the present invention further provides a method for testing transformer thermometer omission, which uses the transformer thermometer omission-testing instrument as claimed in claim 4, and specifically comprises the following steps:

step 1, connecting a transformer thermometer defect elimination tester into a detection system;

the switch is in 0 gear, the thermometer is connected to the first input terminal, the input end of the transducer is connected to the second input terminal, and the output end of the transducer is connected to the second output terminal; the connecting terminal to be tested is connected between the device to be tested and the transmitter; the first shifting piece is connected with a first grounding end, and the second shifting piece is connected with a second grounding end; the switching gear lever is connected with an insulation resistor;

step 2, adjusting the switch to 1 gear, detecting the temperature value of the original circuit of the device to be detected, and judging whether the original circuit has defects;

the switch is adjusted to 1 gear, namely a first shifting sheet is connected with a first input terminal, a second shifting sheet is connected with a second input terminal, the analog transmission module and the standard resistor module are both disconnected, the thermometer is connected with the transmitter and the device to be tested by virtue of the change-over switch module, preliminary temperature defect judgment is carried out on the device to be tested, temperature T1 of the thermometer and a corresponding temperature Q1 of the transmitter end are recorded and stored by virtue of the analysis module, and displayed by virtue of the display screen and recorded as a test value, and when T1 is equal to Q1, the original circuit is preliminarily judged to be defect-free; when T1 is larger than or smaller than Q1, preliminarily judging that the original circuit has defects;

step 3, adjusting the switch to 2, detecting the temperature value of the standard loop of the device to be detected, and judging the defect range of the thermometer;

the switch is adjusted to 2 gears, namely the first shifting piece is connected with a resistance module wiring terminal, and the second shifting piece is connected with a simulation transmitter wiring terminal; at the moment, the thermometer is disconnected, the transmitter is disconnected, the thermometer is replaced by the standard resistor module and the transmitter is replaced by the analog transmission module; standard temperature detection is carried out on the device to be detected, a temperature value T2 corresponding to the standard resistance module and a temperature value Q2 corresponding to the analog transmission module are recorded and stored by means of the analysis module and displayed by means of the display screen and are recorded as standard values, and when T2 is equal to Q2, a standard temperature value D1 is determined; when T2 is greater than or less than Q2, whether wiring is correct is detected;

step 4, comparing the test value with the standard value to determine whether the original circuit has defects;

comparing T1, Q1, T2 and Q2, when the four values are equal, the original circuit has no defect; when an error exists, judging an error value, and when the error value is smaller than an error setting range, judging that the original circuit has no defect; when the error value is larger than the error setting range, the original circuit is judged to have defects.

As another embodiment of the present application, in step 2 and step 3, the display screen displays the test value and the standard value.

As another embodiment of the present application, in step 4, when the four values of T1, Q1, T2, and Q2 are equal or the error value is smaller than the error setting range, the test is ended and the switch is switched to gear 0.

As another embodiment of the present application, the step 2 and the step 3 may be interchanged.

As another embodiment of the present application, in step 4, when the error value is greater than the error setting range, the following steps are performed:

step 5, judging whether the thermometer has defects or not;

the switch is adjusted to 3 grades, namely the first shifting piece is connected with the resistance module wiring terminal, and the second shifting piece is connected with the second input terminal; at the moment, the thermometer is in an open circuit, the analog transmission module is in an open circuit, the thermometer is replaced by the standard resistance module, the temperature of the device to be tested is detected, the temperature value T3 corresponding to the standard resistance module and the temperature value Q3 corresponding to the transmitter are recorded and stored by the aid of the analysis module, displayed by the aid of the display screen and recorded as a first calibration value; when T3, Q3, T2 and Q2 are equal, namely the circuit has no defect, the temperature table is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects;

step 6, judging whether the transmitter has defects;

the switch is adjusted to 4 gears, namely the first shifting piece is connected with the first input terminal, and the second shifting piece is connected with the wiring terminal of the analog transmitter; at the moment, the standard resistance module is disconnected, the transmitter is disconnected, the analog transmitting module replaces the transmitter to detect the temperature of the device to be detected, the analysis module records, stores and displays a temperature value T4 corresponding to the standard resistance module and a temperature value Q4 corresponding to the transmitter by the aid of a display screen, and the temperature values are recorded as a second calibration value; when T4, Q4, T2 and Q2 are equal, namely the loop has no defect, the transmitter is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects.

As another embodiment of the present application, the step 5 and the step 6 may be interchanged.

The defect elimination test method of the transformer thermometer provided by the invention has the beneficial effects that: the defect eliminating tester for the transformer thermometer has all the beneficial effects; the transformer thermometer defect elimination test method provided by the invention can completely simulate the situation of the whole thermometer loop, accurately measure the error caused by each device of the temperature measurement loop and reasonably eliminate defects; the analysis module can record the loop change, search the temperature jump problem, quickly judge the fault position and complete the defect elimination work.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed for the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.

Fig. 1 is an electrical schematic diagram of a transformer thermometer defect elimination tester provided in an embodiment of the present invention;

fig. 2 is an electrical schematic wiring diagram of a transformer thermometer defect elimination tester provided by the embodiment of the invention;

fig. 3 is a schematic structural diagram of a diverter switch module according to an embodiment of the present invention.

In the figure: 10. an analysis module; 11. a first input terminal; 12. a second input terminal; 13. a diverter switch module; 131. a first switch identification terminal; 132. a second switch identification terminal; 133. a resistance module wiring terminal; 134. a wiring terminal of the analog transmitter; 135. a first plectrum; 136. a second plectrum; 137. a switch central shaft; 14. a standard resistance module; 141. an insulation resistance; 142. a thermistor; 15. an analog transmitting module; 16. a connecting terminal to be tested; 17. a second output terminal; 20. a device under test; 21. a transmitter; 22. and (4) a thermometer.

Detailed Description

In order to make the technical problems, technical solutions and advantageous effects to be solved by the present invention more clearly apparent, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

Referring to fig. 1 to 3, a transformer thermometer defect elimination tester provided by the present invention will now be described. The transformer thermometer defect elimination tester comprises a wiring module, a hardware module, a change-over switch module 13 and an analysis module 10; the wiring module is respectively provided with a first input terminal 11 connected with a thermometer 22, a second input terminal 12 and a second output terminal 17 connected with a transmitter 21, and a connection terminal 16 to be tested connected with a device to be tested 20; the hardware module comprises a standard resistor module 14 simulating a thermistor 142 of the thermometer 22 and an analog transmission module 15 simulating a transmitter 21, and the analog transmission module 15 is connected with the second output terminal 17 and the connecting terminal 16 to be tested; the switch module 13 is respectively provided with a first grounding end, a second grounding end, a first shifting piece 135 and a second shifting piece 136, the first shifting piece 135 and the second shifting piece 136 are both rotationally connected with a first switch central shaft 137, and the first shifting piece 135 is in switching connection with a first input terminal 11, a first grounding end and a standard resistor module 14; the second paddle 136 is connected to the second input terminal 12, the second ground terminal, and the analog transmission module 15 in a switching manner; the analysis module 10 is connected to a standard resistance module 14 and an analog transmission module 15.

Compared with the prior art, the defect elimination tester for the transformer thermometer provided by the invention is additionally provided with the change-over switch module 13, the first shifting piece 135 and the second shifting piece 136 in the change-over switch module 13 rotate around the first switch central shaft 137, and the first shifting piece 135 is in switching connection with the thermometer 22 and the standard resistor module 14; the second driving plate 136 is switched to connect the transmitter 21 and the analog transmission module 15 to form different circuit paths, and replaces the thermometer 22 with the standard resistance module 14 and replaces the transmitter 21 with the analog transmission module 15 to judge whether the existing thermometer 22 detects a fault and judge the specific position of the fault.

The thermometer 22 is connected to the first input terminal 11, the input terminal of the transmitter 21 is connected to the second input terminal 12, the output terminal of the transmitter 21 is connected to the second output terminal 17, and the connection terminal 16 to be measured is connected between the device 20 to be measured and the variable device. The switch module 13 is switched to connect different modules by means of the first and second dials 135 and 136 to form different circuits. The first loop is used as an original loop and comprises a device to be tested 20, a transmitter 21 and a thermometer 22, at the moment, the first poking piece 135 is connected with the first input terminal 11, the second poking piece 136 is connected with the second input terminal 12, and whether the original loop has defects or not can be preliminarily judged by the analysis module 10; the second loop comprises a device to be tested 20, an analog transmission module 15 and a standard resistor, at the moment, the first shifting piece 135 is connected with the standard resistor module 14, the second shifting piece 136 is connected with the analog transmission module 15, standard value measurement is carried out by the analysis module 10 and is compared with a test value of the original loop, and whether the original loop has defects or not is judged; the third loop comprises the device to be tested 20, the transmitter 21 and the standard resistor, at this time, the first poking sheet 135 is connected with the resistor module wiring terminal 133, the second poking sheet 136 is connected with the second input terminal 12, and the analysis module 10 compares the first calibration value, the standard value and the test value measured by the first poking sheet to observe whether the defect is eliminated; the fourth loop includes the device under test 20, the analog transmitter module 15 and the thermometer 22, at this time, the first toggle piece 135 is connected to the first input terminal 11, the second toggle piece 136 is connected to the analog transmitter connection terminal 134, and the analysis module 10 compares the second calibration value and the standard value and the test value measured by the first toggle piece with the standard value and the test value to see whether the defect is eliminated. And (4) finding whether the original loop has defects or not through switching of the four loops, and finding the positions of the defects in the original loop.

The transformer thermometer defect elimination tester provided by the invention can completely simulate the condition of a loop replacing the whole thermometer 22, accurately measure the error caused by each device of a temperature measurement loop and reasonably eliminate defects; the analysis module 10 can record the loop change, search for the temperature jump problem, quickly judge the fault position and complete the defect elimination work.

Optionally, a power supply battery is arranged in the device, and the power supply battery is convenient to use.

Optionally, the first input terminal 11 is connected to a first switch identification terminal 131, the second input terminal 12 is connected to a second switch identification terminal 132, and both the first switch identification terminal 131 and the second switch identification terminal 132 extend into the switch module 13 and are respectively used for connecting the first paddle 135 and the second paddle 136.

In some possible embodiments, referring to fig. 1 and fig. 2, the standard resistor module 14 includes a plurality of thermistors 142, an insulation resistor 141, a resistor fixing link, and a resistor switching lever; the plurality of thermistors 142 are connected in parallel, and the plurality of thermistors 142 correspond to the standard temperature to be displayed of the device under test 20 one by one; the thermistors 142 are connected with the output end of the resistance module through leads; the insulation resistor 141 is connected in parallel with the plurality of thermistors 142; the resistor fixing connecting rod is connected with the input end of the resistor module through a lead, the input end of the resistor module and the output end of the resistor module are integrated on a resistor module connecting terminal 133, and the resistor module connecting terminal 133 is used for connecting a first shifting piece 135; the resistance switching lever is rotatably connected to the resistance fixing link, and the resistance switching lever is connected to the plurality of thermistors 142 and the insulation resistor 141 in a switching manner.

Specifically, the standard resistance module 14 includes five thermistors 142, and the thermistors 142 employ Pt 100. The resistance values of the five thermistors 142 correspond to the standard temperature to be displayed by the device 20, and the corresponding relationship is as follows: 100 omega-0 deg.C, 107.79 omega-20 deg.C, 115.54 omega-40 deg.C, 123.24 omega-60 deg.C, 130.90 omega-80 deg.C.

Alternatively, the thermistor 142 is formulated as Rt ═ R0(1+ a × t + B × t); rt ═ R0[1+ a × t + B × t + C (t-100) × t ], where t is the temperature in celsius, R0 is the resistance value at zero degrees celsius, and A, B, C is a predetermined coefficient.

Alternatively, the insulation resistor 141 is made of ceramic.

The plurality of thermistors 142 are switched and connected by a resistance switching lever, and the thermistors 142 with different resistance values are used for replacing the resistance value of the thermometer 22.

The plurality of thermistors 142 are connected in parallel and are arranged on a circumferential connecting disc by virtue of a connector, a resistor fixing connecting rod is connected with the input end of the resistor module, a resistor switching gear lever is rotatably connected with the resistor fixing connecting rod, and the resistor switching gear lever rotates around a connecting point to switch and connect different thermistors 142.

In some possible embodiments, referring to fig. 1 and 2, the analog transmitter module 15 includes an analog transmitter 21 and an analog transmitter terminal 134; the input end of the analog transmitter 21 is provided with a grounding wire; the output end of the analog transmitter 21 is connected with the second output terminal 17 and the connecting terminal 16 to be tested; analog transmitter terminals 134 connect to the input of analog transmitter 21 and transmitter 21 terminals are used to connect to second paddle 136.

Specifically, the input end of the analog transmitter 21 is provided with an analog transmitter connection terminal 134, and the analog transmitter connection terminal 134 extends into the change-over switch module 13 and is used for connecting the second paddle 136.

Analog transmitter 21 replaces transmitter 21. And replaced by means of the second paddle 136.

In some possible embodiments, referring to fig. 1 and 2, the transformer thermometer defect elimination tester further includes a display screen, and the display screen is connected to the analysis module 10.

Specifically, the display screen is arranged on a panel of the transformer thermometer elimination tester, and the display screen is in communication connection with the analysis module 10 and is used for displaying the temperature data received by the analysis module 10 and displaying the analysis result of the analysis module 10.

Referring to fig. 1 to 3, a method for testing the temperature of the transformer according to the present invention will be described. The transformer thermometer defect elimination test method uses the transformer thermometer defect elimination tester and specifically comprises the following steps:

step 1, connecting a transformer thermometer defect elimination tester into a detection system;

the switch is in 0-gear, the thermometer 22 is connected to the first input terminal 11, the input end of the transmitter 21 is connected to the second input terminal 12, and the output end of the transmitter 21 is connected to the second output terminal 17; the connection terminal 16 to be tested is connected between the device 20 to be tested and the transmitter 21; the first shifting piece 135 of the switch module 13 is connected to the first ground terminal, and the second shifting piece 136 is connected to the second ground terminal; the switching gear lever in the standard resistor module 14 is connected with an insulating resistor 141;

step 2, adjusting the switch to 1 gear, detecting the temperature value of the original circuit of the device to be detected 20, and judging whether the original circuit has defects;

the switch is adjusted to 1 gear, namely a first shifting sheet 135 in a change-over switch module 13 is connected with a first input terminal 11, a second shifting sheet 136 in the change-over switch module 13 is connected with a second input terminal 12, an analog transmission module 15 and a standard resistance module 14 in a transformer temperature defect elimination instrument are both disconnected, a thermometer 22 is connected with a transmitter 21 and a device to be tested 20 by virtue of the change-over switch module 13, preliminary temperature defect judgment is carried out on the device to be tested 20, a temperature value T1 of the thermometer 22 and a corresponding temperature value Q1 at the end of the transmitter 21 are recorded and stored and displayed by virtue of a display screen by virtue of an analysis module 10 and recorded as a test value, and when T1 is equal to Q1, the original circuit is preliminarily judged to be defect-free; when T1 is larger than or smaller than Q1, preliminarily judging that the original circuit has defects;

step 3, adjusting the switch to 2, detecting the temperature value of the standard loop of the device to be detected 20, and judging the defect range of the thermometer 22;

the switch is adjusted to 2 steps, namely a first shifting piece 135 in the change-over switch module 13 is connected with a resistance module connecting terminal 133, and a second shifting piece 136 in the change-over switch module 13 is connected with an analog transmitter connecting terminal 134; at this point, the thermometer 22 is disconnected, the transmitter 21 is disconnected, the thermometer 22 is replaced by the standard resistance module 14 and the transmitter 21 is replaced by the analog transmission module 15; standard temperature detection is carried out on the device to be detected 20, a temperature value T2 corresponding to the standard resistance module 14 and a temperature value Q2 corresponding to the analog transmission module 15 are recorded and stored by means of the analysis module 10 and displayed by means of the display screen, and are recorded as standard values, and when T2 is equal to Q2, a standard temperature value D1 is determined; when T2 is greater than or less than Q2, whether wiring is correct is detected;

step 4, comparing the test value with the standard value to determine whether the original circuit has defects;

comparing T1, Q1, T2 and Q2, when the four values are equal, the original circuit has no defect; when an error exists, judging an error value, and when the error value is smaller than an error setting range, judging that the original circuit has no defect; when the error value is larger than the error setting range, the original circuit is judged to have defects.

Compared with the prior art, the transformer thermometer defect elimination test method provided by the invention has all the beneficial effects by adopting the transformer thermometer defect elimination tester.

Specifically, in step 2, analysis module 10 makes a determination of T1 and Q1. When T1 is equal to Q1, the original circuit is judged to be defect-free preliminarily; when T1 is not equal to Q1, the original circuit is preliminarily judged to have defects.

When T1 equals Q1, step 3 is selected.

When T1 is not equal to Q1, the step 3 is selected, and the change-over switch module 13 is adjusted to the 2-gear.

Specifically, in step 4, the test values and standard values are compared, including comparing T1 and T2, Q1 and Q2; when T1 is Q1 in step 2 and T2 is Q2 in step 3, T1 and T2 are compared, and Q1 and Q2 are compared, and if T1 is T2 and Q1 is Q2, it is confirmed that no defect exists in the original circuit. When T1 in step 2 is not equal to Q1 and T2 in step 3 is equal to Q2, T1 and T2, Q1 and Q2 are compared to determine whether the error value thereof meets the error setting range. And when the error exceeds the set error range, judging that the original circuit has defects.

Optionally, the error setting range is between 1.5% and 2.5%.

Optionally, the display screen displays the test value, the standard value, the error setting range and whether the error setting range is exceeded.

Optionally, when the errors of T1 and T2, Q1 and Q2 are smaller than the error set range, the test is ended, and the switch module 13 is shifted to 0, that is, the first paddle 135 is connected to the first ground terminal, and the second paddle 136 is connected to the second ground terminal.

Alternatively, steps 2 and 3 may be reversed in order. After both step 2 and step 3 are finished, the analysis module 10 directly proceeds to step 4.

In some possible embodiments, when the error value is greater than the error setting range, the following steps are performed:

step 5, judging whether the thermometer 22 has defects or not;

the switch is shifted to 3 steps, namely, a first shifting piece 135 in the change-over switch module 13 is connected with the resistance module wiring terminal 133, and a second shifting piece 136 in the change-over switch module 13 is connected with the second input terminal 12; at this time, the thermometer 22 is open, the analog transmission module 15 is open, the thermometer 22 is replaced by the standard resistance module 14, the temperature of the device to be tested 20 is detected, the temperature value T3 corresponding to the standard resistance module 14 and the temperature value Q3 corresponding to the transmitter 21 are recorded, stored and displayed by the aid of the analysis module 10 and the display screen, and recorded as a first calibration value; when T3, Q3, T2 and Q2 are equal, namely the circuit has no defect, the temperature meter 22 is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects.

Step 6, judging whether the transmitter 21 has defects;

the switch is adjusted to 4 steps, namely a first shifting piece 135 in the change-over switch module 13 is connected with the first input terminal 11, and a second shifting piece 136 in the change-over switch module 13 is connected with the analog transmitter wiring terminal 134; at this time, the standard resistance module 14 is disconnected, the transmitter 21 is disconnected, the analog transmission module 15 replaces the transmitter 21, the temperature of the device to be tested 20 is detected, the analysis module 10 records, stores and displays the temperature value T4 corresponding to the standard resistance module 14 and the temperature value Q4 corresponding to the transmitter 21 through the display screen, and records the temperature values as a second calibration value; when T4, Q4, T2 and Q2 are equal, namely the loop has no defect, the transmitter 21 is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects.

Specifically, in step 5, T3 and T2, Q3 and Q2 are compared, and when T3 is T2 and Q3 is Q2, the adjusted loop has no defect, the defect is eliminated, and it is determined that there is an abnormality in the replaced temperature table 22; when T3 is not equal to T2 or Q3 is not equal to Q2, the adjusted loop still has defects which are not eliminated, and step 6 is needed.

In step 6, T4 is compared with T2, Q4 is compared with Q2, and when T4 is T2 and Q4 is Q2, the adjusted loop has no defect, the defect is eliminated, and it is determined that the replaced transmitter 21 has abnormality; when T4 is not equal to T2 or Q4 is not equal to Q2, the adjusted loop still has defects which are not eliminated, and the transmitter 21 and the temperature gauge 22 in the original loop can be determined to have abnormality.

Alternatively, steps 5 and 6 may be reversed in order.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims (10)

1. Transformer thermometer disappearance tester, its characterized in that includes:

the wiring module is respectively provided with a first input terminal connected with the thermometer, a second input terminal and a second output terminal connected with the transmitter, and a connection terminal to be tested connected with the device to be tested;

the hardware module comprises a standard resistor module for simulating a thermistor of the thermometer and a simulation transmission module for simulating a transmitter, and the simulation transmission module is connected with the second output terminal and the connecting terminal to be tested;

the switch module is respectively provided with a first grounding end, a second grounding end, a first shifting piece and a second shifting piece, the first shifting piece and the second shifting piece are both rotatably connected with a switch central shaft, and the first shifting piece is in switching connection with the first input terminal, the first grounding end and the standard resistor module; the second shifting piece is in switching connection with the second input terminal, the second grounding terminal and the analog transmission module;

and the analysis module is electrically connected with the standard resistance module and the analog transmission module.

2. The transformer thermometer erasure tester of claim 1, wherein said standard resistance module comprises:

the system comprises a plurality of thermistors, a power supply and a power supply, wherein the thermistors are connected in parallel and correspond to standard temperatures to be displayed by a device to be tested one by one; the thermistor leads are connected with the output end of the resistor module;

an insulation resistor connected in parallel to the plurality of thermistors;

the resistor fixing connecting rod is connected with an input end of the resistor module through a lead, the input end of the resistor module and the output end of the resistor module are integrated on a resistor module wiring terminal, and the resistor module wiring terminal is used for connecting the first shifting piece;

and the resistance switching gear lever is rotationally connected to the resistance fixing connecting rod and is connected with the plurality of thermistors and the insulation resistors in a switching manner.

3. The transformer thermometer erasure tester of claim 2, wherein said analog transformer module comprises:

the input end of the analog transmitter is provided with a grounding wire; the output end of the analog transmitter is connected with the second output terminal and the connecting terminal to be detected;

and the analog transmitter wiring terminal is connected with the input end of the analog transmitter and is used for connecting the second shifting piece.

4. The transformer thermometer defect elimination tester of claim 3 further comprising a display screen, wherein the display screen is connected to the analysis module.

5. The transformer thermometer defect elimination test method is characterized by using the transformer thermometer defect elimination tester as claimed in claim 4, and specifically comprises the following steps:

step 1, connecting a transformer thermometer defect elimination tester into a detection system;

the switch is in 0 gear, the thermometer is connected to the first input terminal, the input end of the transducer is connected to the second input terminal, and the output end of the transducer is connected to the second output terminal; the connecting terminal to be tested is connected between the device to be tested and the transmitter; the first shifting piece is connected with a first grounding end, and the second shifting piece is connected with a second grounding end; the switching gear lever is connected with an insulation resistor;

step 2, adjusting the switch to 1 gear, detecting the temperature value of the original circuit of the device to be detected, and judging whether the original circuit has defects;

the switch is adjusted to 1 gear, namely a first shifting sheet is connected with a first input terminal, a second shifting sheet is connected with a second input terminal, the analog transmission module and the standard resistor module are both disconnected, the thermometer is connected with the transmitter and the device to be tested by virtue of the change-over switch module, preliminary temperature defect judgment is carried out on the device to be tested, temperature T1 of the thermometer and a corresponding temperature Q1 of the transmitter end are recorded and stored by virtue of the analysis module, and displayed by virtue of the display screen and recorded as a test value, and when T1 is equal to Q1, the original circuit is preliminarily judged to be defect-free; when T1 is larger than or smaller than Q1, preliminarily judging that the original circuit has defects;

step 3, adjusting the switch to 2, detecting the temperature value of the standard loop of the device to be detected, and judging the defect range of the thermometer;

the switch is adjusted to 2 gears, namely the first shifting piece is connected with a resistance module wiring terminal, and the second shifting piece is connected with a simulation transmitter wiring terminal; at the moment, the thermometer is disconnected, the transmitter is disconnected, the thermometer is replaced by the standard resistor module and the transmitter is replaced by the analog transmission module; standard temperature detection is carried out on the device to be detected, a temperature value T2 corresponding to the standard resistance module and a temperature value Q2 corresponding to the analog transmission module are recorded and stored by means of the analysis module and displayed by means of the display screen and are recorded as standard values, and when T2 is equal to Q2, a standard temperature value D1 is determined; when T2 is greater than or less than Q2, whether wiring is correct is detected;

step 4, comparing the test value with the standard value to determine whether the original circuit has defects;

comparing T1, Q1, T2 and Q2, when the four values are equal, the original circuit has no defect; when an error exists, judging an error value, and when the error value is smaller than an error setting range, judging that the original circuit has no defect; when the error value is larger than the error setting range, the original circuit is judged to have defects.

6. The transformer thermometer defect elimination test method of claim 5, wherein in step 2 and step 3, the display screen displays the test value and the standard value.

7. The method as claimed in claim 5, wherein in step 4, when the four values of T1, Q1, T2 and Q2 are equal or the error value is smaller than the error setting range, the test is finished and the switch is switched to 0-gear.

8. The transformer thermometer erasure testing method of claim 5, wherein said step 2 and said step 3 are interchangeable.

9. The transformer thermometer defect elimination test method of claim 5, wherein in step 4, when the error value is larger than the error setting range, the following steps are performed:

step 5, judging whether the thermometer has defects or not;

the switch is adjusted to 3 grades, namely the first shifting piece is connected with the resistance module wiring terminal, and the second shifting piece is connected with the second input terminal; at the moment, the thermometer is in an open circuit, the analog transmission module is in an open circuit, the thermometer is replaced by the standard resistance module, the temperature of the device to be tested is detected, the temperature value T3 corresponding to the standard resistance module and the temperature value Q3 corresponding to the transmitter are recorded and stored by the aid of the analysis module, displayed by the aid of the display screen and recorded as a first calibration value; when T3, Q3, T2 and Q2 are equal, namely the circuit has no defect, the temperature table is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects;

step 6, judging whether the transmitter has defects;

the switch is adjusted to 4 gears, namely the first shifting piece is connected with the first input terminal, and the second shifting piece is connected with the wiring terminal of the analog transmitter; at the moment, the standard resistance module is disconnected, the transmitter is disconnected, the analog transmitting module replaces the transmitter to detect the temperature of the device to be detected, the analysis module records, stores and displays a temperature value T4 corresponding to the standard resistance module and a temperature value Q4 corresponding to the transmitter by the aid of a display screen, and the temperature values are recorded as a second calibration value; when T4, Q4, T2 and Q2 are equal, namely the loop has no defect, the transmitter is abnormal; when T3 and Q3 are larger or smaller than T2 and Q2, the circuit still has defects.

10. The transformer thermometer erasure testing method of claim 9, wherein said step 5 and said step 6 are interchangeable.

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