CN113659346B - Antenna housing electrical thickness test antenna and use method thereof - Google Patents
Antenna housing electrical thickness test antenna and use method thereof Download PDFInfo
- Publication number
- CN113659346B CN113659346B CN202110878061.8A CN202110878061A CN113659346B CN 113659346 B CN113659346 B CN 113659346B CN 202110878061 A CN202110878061 A CN 202110878061A CN 113659346 B CN113659346 B CN 113659346B
- Authority
- CN
- China
- Prior art keywords
- ellipsoid
- antenna
- reflecting surface
- horn antenna
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 70
- 238000000034 method Methods 0.000 title claims abstract description 28
- 230000005284 excitation Effects 0.000 claims description 46
- 230000003287 optical effect Effects 0.000 claims description 7
- 239000011248 coating agent Substances 0.000 claims description 6
- 238000000576 coating method Methods 0.000 claims description 6
- 238000001028 reflection method Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 7
- 230000000903 blocking effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000007431 microscopic evaluation Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q13/00—Waveguide horns or mouths; Slot antennas; Leaky-waveguide antennas; Equivalent structures causing radiation along the transmission path of a guided wave
- H01Q13/02—Waveguide horns
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q1/00—Details of, or arrangements associated with, antennas
- H01Q1/42—Housings not intimately mechanically associated with radiating elements, e.g. radome
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01Q—ANTENNAS, i.e. RADIO AERIALS
- H01Q15/00—Devices for reflection, refraction, diffraction or polarisation of waves radiated from an antenna, e.g. quasi-optical devices
- H01Q15/14—Reflecting surfaces; Equivalent structures
- H01Q15/16—Reflecting surfaces; Equivalent structures curved in two dimensions, e.g. paraboloidal
Abstract
The invention belongs to the technical field of aerospace antenna testing, and discloses an antenna housing electric thickness testing antenna and a using method thereof. The antenna and the using method of the invention use the local rotary ellipsoid as the antenna reflecting surface, put the exciting horn antenna to one focus to face the antenna reflecting surface to block the direct wave, and put the tested antenna cover as the reflecting surface in the reflection method test to the other focus, thus the problems of gain and measuring focusing area can be solved well at the same time.
Description
Technical Field
The invention belongs to the technical field of aerospace antenna testing, relates to a reflective test antenna for the electrical thickness of an antenna housing, and particularly relates to an antenna housing electrical thickness test antenna and a use method.
Background
The electrical thickness refers to the wavenumber of the dielectric layer in the direction normal to the radome surface for any angle of incidence tested. For a uniformly structured radome, the electrical thickness may be expressed by the following formula:
the electrical thickness distribution of the radome is the comprehensive reflection of the dielectric constant and the wall thickness of the material. The electric thickness distribution of the radome is adjusted, so that the aiming error of the radome can be reduced, and the direction diagram of the radome is improved. In the manufacturing process of the radome, the manufacturing quality is monitored through an electric thickness test, and then the electric thickness distribution is adjusted through an electric thickness correction process, so that the final purpose of improving the electric performance level of the radome is achieved.
The radar radome forming process is divided into two types, and for the radar radome with a uniform structure, the radar radome is formed at one time through a press injection process of matching male and female molds; for a radome of non-uniform structure, multiple molding by a male mold is required. After each molding, the electric thickness distribution of the radome needs to be monitored by an electric thickness test means, because designers of radomes with heterogeneous structures usually respectively give design requirements for the wall thickness and the tolerance of the skin and the honeycomb so as to achieve the matching of the electric structure.
The semi-finished radome in the forming process is provided with a metal mold, and the electrical thickness of the radome wall is detected by adopting a reflection method. The traditional electrical thickness reflection test method is as follows: the single horn normally enters, and the transmitting signal and the receiving signal share one test antenna. The ideal test principle is shown in figure 1.
The reflection method tests the antenna selected, typically a conical horn antenna or a point focus antenna. The former has higher gain, and the signal amplitude is stronger, thereby being convenient for information processing. The latter has a small test point area, facilitates microscopic analysis of local range electrical thickness characteristics, particularly curved surfaces with large curvatures, and is very effective.
The two antennas adopted in the prior art have advantages and disadvantages, the gain of the conical horn antenna is higher, but the area of the far field area is larger after the test signal is radiated. The electrical thickness represents the macroscopic effect of the phase change of the measured medium before and after electromagnetic transmission, so that the peripheral area of the measured point has a larger influence on the test result, and the structural characteristics of the measured point are not favorable for accurately distinguishing.
The principle of a point focus antenna is to focus all radiation energy at the same point. If the focal spot is small enough, the focal spot region may be visible in the same far field. Point-focusing antennas are in principle quite different from other forms of antennas and do not have a gain indicator.
Disclosure of Invention
In order to solve the problems, the invention provides an antenna housing electric thickness test antenna and a use method thereof, which take gain and test area into consideration.
The technical scheme of the invention is as follows:
an antenna housing electrical thickness test antenna comprises an ellipsoid and an excitation horn antenna, wherein the ellipsoid is a part of an elongated end of the ellipsoid, the inner side of the ellipsoid is provided with a reflecting surface, the excitation horn antenna is arranged at one focus of the ellipsoid adjacent to the ellipsoid, and an opening of the excitation horn antenna faces the ellipsoid.
Further, the outer surface of the excited horn antenna is coated with a wave-absorbing coating. So that the horn can only receive reflected waves from the ellipsoid.
The application method of the antenna housing electric thickness test antenna comprises the steps of setting a test point of the antenna housing on the other focus of an ellipsoid, and adjusting an angle between a connecting line of two focuses of the ellipsoid and a reflecting surface of the antenna housing to be 90 degrees.
Further, the excitation horn antenna at the focus of the ellipsoid emits rays to the ellipsoid, the rays are reflected by the reflecting surface at the inner side of the ellipsoid, and then necessarily reflected to the other focus of the ellipsoid, namely the test point of the radome according to the optical characteristics of the ellipsoid, and as the angle between the connecting line of the two focuses of the ellipsoid and the reflecting surface of the radome is 90 degrees, the reflecting rays are reflected again on the reflecting surface of the test point, then are reflected on the reflecting surface of the ellipsoid for three times, and finally are received by the excitation horn antenna. By adopting the method, direct waves between the excited horn antenna and the test point can be shielded, so that the test gain of the antenna is higher, and the area of the test point can be controlled.
An antenna housing electrical thickness test antenna comprises a first ellipsoid, a second ellipsoid, a first excitation horn antenna and a second excitation horn antenna, wherein the first ellipsoid is a part of an elongated end of the first ellipsoid, and the second ellipsoid is a part of an elongated end of the second ellipsoid; the inner sides of the first ellipsoid and the second ellipsoid are provided with reflecting surfaces; the first excitation horn antenna is arranged on a focus of a first ellipsoid adjacent to the first ellipsoid, the second excitation horn antenna is arranged on a focus of a second ellipsoid adjacent to the second ellipsoid, and the shapes and the sizes of the first ellipsoid and the second ellipsoid are the same; the first and second excitation horns open toward the first and second ellipsoids, respectively.
Further, the outer surfaces of the first excitation horn antenna and the second excitation horn antenna are coated with a wave-absorbing coating. So that both horns can only receive reflected waves from the ellipsoids.
The method for using the antenna housing electric thickness test antenna comprises the steps of overlapping focuses of a first ellipsoid and a second ellipsoid which are far away from the first ellipsoid and the second ellipsoid, setting a test point of the antenna housing on the overlapped focuses of the first ellipsoid and the second ellipsoid, and adjusting an angle between a connecting line of two focuses of the first ellipsoid and a reflecting surface of the antenna housing to be the same as an angle between a connecting line of two focuses of the second ellipsoid and the reflecting surface of the antenna housing.
Further, the first excitation horn antenna at the focus of the first ellipsoid emits rays to the first ellipsoid, the rays are reflected by the reflecting surface at the inner side of the first ellipsoid, and then are necessarily reflected to the other focus of the first ellipsoid, namely the test point of the radome according to the optical characteristics of the ellipsoid, and as the angle between the connecting line of the two focuses of the first ellipsoid and the reflecting surface of the radome is the same as the angle between the connecting line of the two focuses of the second ellipsoid and the reflecting surface of the radome, the reflecting lines are reflected again on the reflecting surface of the test point, are reflected on the reflecting surface of the second ellipsoid for three times, and are finally received by the second excitation horn antenna. By adopting the method, the direct waves among the first excitation horn antenna, the second excitation horn antenna and the test point can be shielded, so that the test gain of the antenna is higher, and the area of the test point can be controlled.
The invention has the advantages that:
according to the invention, an elliptical antenna is used for testing the electrical thickness of the radome, and according to the optical characteristics of the elliptical surface, light (or electromagnetic waves) emitted in any direction on any focal point of the rotating elliptical surface can be reflected and converged in the other focal point (except for direct waves) in an equiphase manner. In this way, the local rotating ellipsoid is used as an antenna reflecting surface, the exciting horn antenna is placed on one focus to face the antenna reflecting surface (blocking direct waves), and the tested antenna cover is placed on the other focus as a reflecting surface in the reflection method test, so that the problems of gain and measurement focusing area can be solved well at the same time; the first method of the invention adopts an elliptical spherical antenna, and the method is simple and easy to realize; the second method of the invention adopts two elliptical spherical antennas, has a wider testing range than the first method, and can be suitable for radomes with various uneven angles.
Drawings
FIG. 1 is a schematic diagram of the background art of the invention;
FIG. 2 is a schematic diagram of an elliptical spherical antenna according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a first elliptical spherical antenna according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a second elliptical spherical antenna according to an embodiment of the present invention; the method comprises the steps of carrying out a first treatment on the surface of the
Wherein, 1-ellipsoid, 2-excitation horn antenna, 3-ellipsoid, 4-test point, 5-direct wave, 6-incident line and reflection line, 7-tested antenna cover;
1-first ellipsoid, 1-2-second ellipsoid, 2-1-first excitation horn antenna, 2-second excitation horn antenna, 3-1-first ellipsoid, 3-2-second ellipsoid;
11-test antenna, 12-incident ray, 13-reflected ray, 14-radome, 15-reflecting surface.
Detailed Description
This section is an embodiment of the present invention for explaining and explaining the technical solution of the present invention.
The first antenna housing electrical thickness test antenna comprises an ellipsoid 1 and an excitation horn antenna 2, wherein the ellipsoid 1 is a part of an elongated end of an ellipsoid 3, the inner side of the ellipsoid 1 is provided with a reflecting surface, the excitation horn antenna 2 is arranged at one focal point of the ellipsoid 3 adjacent to the ellipsoid 1, and an opening of the excitation horn antenna 2 faces the ellipsoid 1.
The outer surface of the excitation horn antenna 2 is coated with a wave-absorbing coating. So that the horn can only receive reflected waves from the ellipsoid.
The first method for using the antenna housing electric thickness test antenna is to set the test point 4 of the antenna housing on the other focus of the ellipsoid 3, and to adjust the angle between the connecting line of the two focuses of the ellipsoid 3 and the reflecting surface of the antenna housing to 90 degrees.
The exciting horn antenna 2 positioned at the focus of the ellipsoid 3 emits rays to the ellipsoid 1, the rays are reflected by the reflecting surface at the inner side of the ellipsoid 1 and then inevitably reflected to the other focus of the ellipsoid 3 according to the optical characteristics of the ellipsoid, namely, the position of the test point 4 of the antenna housing, because the angle between the connecting line of the two focuses of the ellipsoid 3 and the reflecting surface of the antenna housing is 90 degrees, the reflecting lines are reflected again on the reflecting surface of the test point 4, then are reflected on the reflecting surface of the ellipsoid 1 for three times, and finally are received by the exciting horn antenna 2. By adopting the method, the direct wave 5 between the excited horn antenna 2 and the test point 4 can be shielded, so that the test gain of the antenna is higher, and the area of the test point can be controlled.
A second radome electrical thickness test antenna, which comprises a first ellipsoid 1-1, a second ellipsoid 1-2, a first excitation horn antenna 2-1 and a second excitation horn antenna 2-2, wherein the first ellipsoid 1-1 is a part of the slender end of a first ellipsoid 3-1, and the second ellipsoid 1-2 is a part of the slender end of a second ellipsoid 3-2; the inner sides of the first ellipsoid 1-1 and the second ellipsoid 1-2 are provided with reflecting surfaces; the first excitation horn antenna 2-1 is arranged on the focus of a first ellipsoid 3-1 adjacent to the first ellipsoid 1-1, the second excitation horn antenna 2-2 is arranged on the focus of a second ellipsoid 3-2 adjacent to the second ellipsoid 1-2, and the shapes and the sizes of the first ellipsoid 3-1 and the second ellipsoid 3-2 are the same; the first excitation horn antenna 2-1 and the second excitation horn antenna 2-2 are respectively opened towards the first ellipsoid 1-1 and the second ellipsoid 1-2.
The outer surfaces of the first excitation horn antenna 2-1 and the second excitation horn antenna 2-2 are coated with a wave-absorbing coating. So that both horns can only receive reflected waves from the ellipsoids.
The second method for using the antenna housing electric thickness test antenna uses the test antenna, the focuses of the first ellipsoid 3-1 and the second ellipsoid 3-2 far away from the first ellipsoid 1-1 and the second ellipsoid 1-2 are overlapped, then the test point 4 of the antenna housing is arranged on the overlapped focus of the first ellipsoid 3-1 and the second ellipsoid 3-2, and the angle between the connecting line of the two focuses of the first ellipsoid 3-1 and the reflecting surface of the antenna housing is the same as the angle between the connecting line of the two focuses of the second ellipsoid 3-2 and the reflecting surface of the antenna housing.
The first excitation horn antenna 2-1 positioned at the focus of the first ellipsoid 3-1 emits rays to the first ellipsoid 1-1, the rays are reflected by the reflecting surface at the inner side of the first ellipsoid 1-1, and then necessarily reflected to the other focus of the first ellipsoid 3-1, namely the test point 4 of the antenna housing, according to the optical characteristics of the ellipsoids, as the angle between the connecting line of the two focuses of the first ellipsoid 3-1 and the reflecting surface of the antenna housing is the same as the angle between the connecting line of the two focuses of the second ellipsoid 3-2 and the reflecting surface of the antenna housing, the reflecting lines are reflected again on the reflecting surface of the test point 4, then are reflected on the reflecting surface of the second ellipsoid 1-2 for three times, and finally are received by the second excitation horn antenna 2-2. By adopting the method, the direct wave 5 among the first excitation horn antenna 2-1, the second excitation horn antenna 2-2 and the test point 4 can be shielded, so that the test gain of the antenna is higher, and the area of the test point can be controlled.
According to the optical characteristics of the ellipsoid, light (or electromagnetic waves) emitted in any direction on any one focus of the rotating ellipsoid will be reflected and converged in the other focus (except for direct waves) in an equiphase manner. Therefore, the local rotating ellipsoid is used as an antenna reflecting surface, the exciting horn antenna is placed on one focus to face the antenna reflecting surface (blocking direct waves), and the tested antenna cover is placed on the other focus as a reflecting surface in the reflection method test, so that the problems of gain and measurement of focusing area can be solved well at the same time. The schematic diagram of the ellipsoidal antenna is shown in fig. 2.
The focal length of the ellipsoidal antenna can be designed according to the structural requirement of the test system.
Because the signals reflected from the reflecting surface of the test antenna are converged in equal phase, compared with the 'same far field' of the point focusing antenna, the method meets the requirement of the same phase of the signals required on the tested point in theory and engineering.
Compared with the point focusing antenna, the ellipsoidal antenna has a relatively simple structure and is convenient for reducing the standing wave ratio.
The excitation horn antenna is placed on a focus to block direct waves from the measured point. Because of the angular relationship, the amplitude of the direct wave is not great, and if the wave-absorbing coating is coated on the exciting horn antenna, the problem of the direct wave is basically solved. As shown in fig. 3.
The invention can also be used for the reflection method electric thickness test of the double-horn antenna, and the structure schematic diagram is shown in fig. 4.
Claims (3)
1. A method for using a radome electrical thickness test antenna, which is characterized in that the radome electrical thickness test antenna comprises a first ellipsoid (1-1), a second ellipsoid (1-2), a first excitation horn antenna (2-1) and a second excitation horn antenna (2-2), wherein the first ellipsoid (1-1) is a part of an elongated end of a first ellipsoid (3-1), and the second ellipsoid (1-2) is a part of an elongated end of a second ellipsoid (3-2); the inner sides of the first ellipsoid (1-1) and the second ellipsoid (1-2) are provided with reflecting surfaces; the first excitation horn antenna (2-1) is arranged on the focus of a first ellipsoid (3-1) adjacent to the first ellipsoid (1-1), the second excitation horn antenna (2-2) is arranged on the focus of a second ellipsoid (3-2) adjacent to the second ellipsoid (1-2), and the shapes of the first ellipsoid (3-1) and the second ellipsoid (3-2) are the same; the openings of the first excitation horn antenna (2-1) and the second excitation horn antenna (2-2) face the first ellipsoid (1-1) and the second ellipsoid (1-2) respectively;
the focal points of the first ellipsoid (3-1) and the second ellipsoid (3-2) far away from the first ellipsoid (1-1) and the second ellipsoid (1-2) are overlapped, then a test point (4) of the radome is arranged on the overlapped focal points of the first ellipsoid (3-1) and the second ellipsoid (3-2), and the angle between the connecting line of the two focal points of the first ellipsoid (3-1) and the reflecting surface of the radome is the same as the angle between the connecting line of the two focal points of the second ellipsoid (3-2) and the reflecting surface of the radome.
2. A method of using a radome electrical thickness test antenna according to claim 1, wherein the outer surfaces of both the first excitation horn antenna (2-1) and the second excitation horn antenna (2-2) are coated with a wave-absorbing coating; so that both horns can only receive reflected waves from ellipsoids.
3. The method for using the antenna housing electric thickness test antenna according to claim 1, wherein the first excitation horn antenna (2-1) positioned at the focus of the first ellipsoid (3-1) emits rays to the first ellipsoid (1-1), the rays are reflected by the reflecting surface at the inner side of the first ellipsoid (1-1), and then necessarily reflected to the other focus of the first ellipsoid (3-1) according to the optical characteristics of the ellipsoid, namely, the position of the test point (4) of the antenna housing, and as the angle between the connecting line of the two focuses of the first ellipsoid (3-1) and the reflecting surface of the antenna housing is the same as the angle between the connecting line of the two focuses of the second ellipsoid (3-2) and the reflecting surface of the antenna housing, the reflecting line is reflected again on the reflecting surface of the second ellipsoid (1-2), and finally reflected by the test point (2-2) for three times; by adopting the method, the direct wave (5) between the first excitation horn antenna (2-1), the second excitation horn antenna (2-2) and the test point (4) can be shielded, so that the test gain of the antenna is higher, and the area of the test point can be controlled.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110878061.8A CN113659346B (en) | 2021-07-30 | 2021-07-30 | Antenna housing electrical thickness test antenna and use method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202110878061.8A CN113659346B (en) | 2021-07-30 | 2021-07-30 | Antenna housing electrical thickness test antenna and use method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
CN113659346A CN113659346A (en) | 2021-11-16 |
CN113659346B true CN113659346B (en) | 2023-11-21 |
Family
ID=78490192
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202110878061.8A Active CN113659346B (en) | 2021-07-30 | 2021-07-30 | Antenna housing electrical thickness test antenna and use method thereof |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN113659346B (en) |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3195137A (en) * | 1960-12-27 | 1965-07-13 | Bell Telephone Labor Inc | Cassegrainian antenna with aperture blocking correction |
US5319379A (en) * | 1984-08-24 | 1994-06-07 | Hercules Defense Electronics Systems, Inc. | Parabolic dual reflector antenna with offset feed |
US5371505A (en) * | 1993-04-22 | 1994-12-06 | Microwave Power Devices, Inc. | Radome test systems and methods |
RU2066457C1 (en) * | 1981-10-30 | 1996-09-10 | Санкт-Петербургская государственная академия аэрокосмического приборостроения | Device for measuring characteristics of dielectric materials |
US5859615A (en) * | 1997-03-11 | 1999-01-12 | Trw Inc. | Omnidirectional isotropic antenna |
CN102016608A (en) * | 2008-05-09 | 2011-04-13 | 安立股份有限公司 | Radiated power measurement method, radiated power measurement coupler and radiated power measurement apparatus |
CN104535858A (en) * | 2014-12-18 | 2015-04-22 | 北京无线电计量测试研究所 | Compact field antenna measurement synchronization reflection point region determination method |
CN105870641A (en) * | 2016-05-11 | 2016-08-17 | 广东通宇通讯股份有限公司 | Dual-frequency-band dual-reflecting-surface antenna |
CN106936524A (en) * | 2015-12-31 | 2017-07-07 | 深圳市通用测试系统有限公司 | The test system of wireless terminal |
CN111913050A (en) * | 2020-08-18 | 2020-11-10 | 中国电子科技集团公司第四十一研究所 | Contact type electrical thickness reflection measurement probe and method suitable for non-planar antenna housing |
CN112034406A (en) * | 2020-08-26 | 2020-12-04 | 中国航空工业集团公司济南特种结构研究所 | Phase calibration method for portable electrical thickness tester |
CN112134001A (en) * | 2020-09-23 | 2020-12-25 | 航天科工微电子系统研究院有限公司 | W-band directional diagram reconfigurable shaped surface antenna and system |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016161654A1 (en) * | 2015-04-10 | 2016-10-13 | 深圳市通用测试系统有限公司 | Wireless terminal testing system and method for controlling same |
WO2017120513A1 (en) * | 2016-01-06 | 2017-07-13 | The SETI Institute | A cooled antenna feed for a telescope array |
-
2021
- 2021-07-30 CN CN202110878061.8A patent/CN113659346B/en active Active
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3195137A (en) * | 1960-12-27 | 1965-07-13 | Bell Telephone Labor Inc | Cassegrainian antenna with aperture blocking correction |
RU2066457C1 (en) * | 1981-10-30 | 1996-09-10 | Санкт-Петербургская государственная академия аэрокосмического приборостроения | Device for measuring characteristics of dielectric materials |
US5319379A (en) * | 1984-08-24 | 1994-06-07 | Hercules Defense Electronics Systems, Inc. | Parabolic dual reflector antenna with offset feed |
US5371505A (en) * | 1993-04-22 | 1994-12-06 | Microwave Power Devices, Inc. | Radome test systems and methods |
US5859615A (en) * | 1997-03-11 | 1999-01-12 | Trw Inc. | Omnidirectional isotropic antenna |
CN102016608A (en) * | 2008-05-09 | 2011-04-13 | 安立股份有限公司 | Radiated power measurement method, radiated power measurement coupler and radiated power measurement apparatus |
CN104535858A (en) * | 2014-12-18 | 2015-04-22 | 北京无线电计量测试研究所 | Compact field antenna measurement synchronization reflection point region determination method |
CN106936524A (en) * | 2015-12-31 | 2017-07-07 | 深圳市通用测试系统有限公司 | The test system of wireless terminal |
CN105870641A (en) * | 2016-05-11 | 2016-08-17 | 广东通宇通讯股份有限公司 | Dual-frequency-band dual-reflecting-surface antenna |
CN111913050A (en) * | 2020-08-18 | 2020-11-10 | 中国电子科技集团公司第四十一研究所 | Contact type electrical thickness reflection measurement probe and method suitable for non-planar antenna housing |
CN112034406A (en) * | 2020-08-26 | 2020-12-04 | 中国航空工业集团公司济南特种结构研究所 | Phase calibration method for portable electrical thickness tester |
CN112134001A (en) * | 2020-09-23 | 2020-12-25 | 航天科工微电子系统研究院有限公司 | W-band directional diagram reconfigurable shaped surface antenna and system |
Non-Patent Citations (3)
Title |
---|
An Adaptive Data Acquisition and Clustering Technique to Enhance the Speed of Spherical Near-Field Antenna Measurements;Rezvan Rafiee Alavi;IEEE Antenna and Wireless Propagation Lettersx;第18卷(第11期);全文 * |
一种相位测试用曲口面天线的设计与应用;王克先,郭利强;微波学报;全文 * |
导弹天线罩IPD单喇叭测量仪机械系统的研究与实现;彭思平;赵立;梅国平;刘莉;;航空精密制造技术(第06期);全文 * |
Also Published As
Publication number | Publication date |
---|---|
CN113659346A (en) | 2021-11-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5121129A (en) | EHF omnidirectional antenna | |
US4218683A (en) | Range focus lens | |
Gu et al. | A D-band 3D-printed antenna | |
JPH0586682B2 (en) | ||
CN109037871B (en) | Terahertz waveguide polarization attenuation device | |
CN107623184A (en) | It is a kind of to realize that the multilayer dielectricity antenna with end-fire function is penetrated on side | |
CN106936524B (en) | Test system of wireless terminal | |
CN112003025A (en) | Reflecting surface and compact range measuring system with same | |
CN113659346B (en) | Antenna housing electrical thickness test antenna and use method thereof | |
CN108808248B (en) | Convex conformal Cassegrain vortex field antenna based on super surface | |
CN211955669U (en) | Compact range testing system based on angle feed | |
CN206134947U (en) | Millimeter wave phased array antenna and antenna equipment | |
CN209764952U (en) | Annular distance-reducing antenna testing device | |
CN106410424A (en) | Millimeter wave phased array antenna and antenna device | |
US6456254B1 (en) | Laminated dielectric reflector for a parabolic antenna | |
US4307403A (en) | Aperture antenna having the improved cross-polarization performance | |
Hung et al. | Parametric analysis of negative and positive refractive index lens antenna by ANSYS HFSS | |
CN114465019A (en) | Cassegrain antenna with transmitting and receiving coaxial functions for terahertz real aperture imaging | |
CN112886252B (en) | Compact range shaped feed source and compact range system | |
RU138600U1 (en) | DEVICE FOR MEASURING ELECTROMAGNETIC RESPONSE FROM FLAT-PARALLEL PLATES IN THE MICROWAVE RANGE | |
CN108808250B (en) | Convex conformal Gregorian antenna based on super surface | |
Simakauskas | Phase center stabilization of a horn antenna and its application in a luneburg lens feed array | |
EP2738875B1 (en) | Cassegrain microwave antenna | |
TWM583134U (en) | Toroidal compact antenna test range | |
CN117630511B (en) | Equivalent far-field RCS measurement method and system based on Longber lens antenna |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |