CN113645461A - Novel tuner test circuit and test fixture - Google Patents
Novel tuner test circuit and test fixture Download PDFInfo
- Publication number
- CN113645461A CN113645461A CN202110774207.4A CN202110774207A CN113645461A CN 113645461 A CN113645461 A CN 113645461A CN 202110774207 A CN202110774207 A CN 202110774207A CN 113645461 A CN113645461 A CN 113645461A
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- Prior art keywords
- circuit
- test
- tuner
- ohm
- control circuit
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- 238000012360 testing method Methods 0.000 title claims abstract description 102
- 230000000087 stabilizing effect Effects 0.000 claims abstract description 28
- 230000009471 action Effects 0.000 claims description 7
- 230000008859 change Effects 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 230000010287 polarization Effects 0.000 description 3
- 230000001960 triggered effect Effects 0.000 description 2
- 230000004913 activation Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/004—Diagnosis, testing or measuring for television systems or their details for digital television systems
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers
- H04N17/045—Self-contained testing apparatus
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/44—Receiver circuitry for the reception of television signals according to analogue transmission standards
- H04N5/50—Tuning indicators; Automatic tuning control
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N7/00—Television systems
- H04N7/20—Adaptations for transmission via a GHz frequency band, e.g. via satellite
Abstract
The invention discloses a novel tuner test circuit and a test fixture, wherein the test fixture comprises a shell, and a control circuit board is arranged in the shell; the external navigation switch for switching modes, the joint for connecting the test tuner and the joint for connecting the test equipment are arranged outside the shell; the control circuit board is connected with a connector connected with the testing tuner, a connector connected with the testing equipment and an external navigation switch; the control circuit board is provided with a test circuit; the test circuit comprises a power supply circuit, a switch voltage stabilizing circuit, a main chip control circuit and a 75 ohm to 50 ohm circuit; the power circuit is externally connected with a power supply, and the power circuit is internally connected with a switch voltage stabilizing circuit and a main chip control circuit; the main chip control circuit is connected with the switch voltage stabilizing circuit and the 75 ohm-to-50 ohm circuit, and the switch voltage stabilizing circuit is externally connected with a tuner to be tested; the 75-ohm to 50-ohm circuit is externally connected with a tuner to be tested and external test equipment; the test circuit and the test fixture have the characteristic of realizing multiple test modes.
Description
Technical Field
The invention relates to a satellite television receiving technology, in particular to a novel tuner test circuit and a novel tuner test fixture.
Background
The tuner-related data is tested by means of a test fixture. The existing test fixture can not integrate multiple test functions, so that the existing test fixture is troublesome in the process of testing by means of multiple different test fixtures.
In view of the above problems, the present invention provides a novel tuner test circuit and a test fixture, and the present invention is thus developed.
Disclosure of Invention
The invention provides a novel tuner test circuit and a test fixture, which have the characteristic of realizing various test modes; specifically, the invention is realized by the following technical scheme:
a novel tuner test circuit is characterized in that: the test circuit comprises a power supply circuit, a switch voltage stabilizing circuit, a main chip control circuit and a 75 ohm to 50 ohm circuit; the power circuit is externally connected with a power supply, and the power circuit is internally connected with a switch voltage stabilizing circuit and a main chip control circuit; the main chip control circuit is connected with the switch voltage stabilizing circuit, the switch voltage stabilizing circuit is externally connected with the tuner to be tested, and the switch voltage stabilizing circuit outputs voltage to the tuner to be tested according to the instruction of the main chip control circuit and provides working voltage for the tuner to be tested; the main chip control circuit is connected with the 75 ohm-to-50 ohm circuit, and the 75 ohm-to-50 ohm circuit is externally connected with a tuner to be tested and external test equipment.
Switching of various test modes is realized by operating a main chip control circuit, and the main chip control circuit gives a 22K signal and a Diseqc command to a tuner to be tested through a 75-ohm to 50-ohm circuit; and simultaneously, the main chip control circuit outputs an instruction to control the communication state of the switch voltage stabilizing circuit and the tuner to be tested, and the two circuits output an instruction, so that the switching of different test modes of the test circuit is realized, wherein the test modes comprise the selection of the polarization and high and low frequencies of the tuner, and the activation of all independent users UB on the horizontal or vertical direction, the sending of a Diseqc reset instruction, the change of a DCSS Broadcom database, the change of a DCSS MXL database, and the switching of a satellite A, a satellite B and a satellite C.
A novel tuner test fixture comprises a shell, wherein a control circuit board is arranged in the shell; the external navigation switch for switching modes, the joint for connecting the test tuner and the joint for connecting the test equipment are arranged outside the shell; the control circuit board is connected with a connector connected with the testing tuner, a connector connected with the testing equipment and an external navigation switch; a novel tuner test circuit is arranged on the control circuit board.
The external navigation switch can switch various test modes of the test fixture.
Furthermore, a display lamp combination is further arranged on the shell, and the display lamp combination is connected with the main chip control circuit and displays the mode of the test fixture.
The display lamp combination can realize the test mode of the test fixture.
Furthermore, the external navigation switch is a deflector rod, and has three action modes, namely an upward toggle action mode, a downward toggle action mode and an inward press mode; dial-up and dial-down play a selective role, and press-in plays a definitive role.
Furthermore, external test equipment is connected with the test circuit through a joint connected with the test equipment; the external tuner to be tested is connected with the test circuit through the connector connected with the test tuner.
Further, the connector connected with the test tuner is selected to be a 75 ohm connector; the connector for connecting the test equipment is a 50 ohm connector.
Drawings
Fig. 1 is a schematic view of an embodiment of a tuner testing fixture provided in the present invention;
fig. 2 is a schematic diagram of a test circuit according to an embodiment of the present invention.
Wherein: 1. a housing; 2. an external navigation switch; 3. the connector is connected with the testing tuner; 4. a connector for connecting the test equipment; 5. a display lamp assembly; 6. a power supply circuit; 7. a switching voltage stabilizing circuit; 8. a main chip control circuit; a 9.75 ohm to 50 ohm circuit; 10. testing equipment; 11. a tuner to be tested; 12. the circuit is tested.
Detailed Description
The invention is further described with reference to the following figures and detailed description.
As shown in fig. 1, a novel tuner test fixture comprises a metal shell 1, wherein a control circuit board is installed in the metal shell 1; an external navigation switch 2 for switching a test mode, a connector 3 for connecting a test tuner and a connector 4 for connecting test equipment are arranged outside the metal shell 1; wherein the connector 3 connected with the test tuner is selected to be a 75 ohm connector; the connector 4 for connecting the test equipment is a 50 ohm connector.
The metal casing 1 is also provided with a display lamp combination 5, and the mode state of the test fixture can be judged through the display lamp combination 5.
The control circuit board is connected with a connector 3 connected with the testing tuner, a connector 4 connected with the testing equipment, an external navigation switch 2 and a display lamp combination 5.
As shown in fig. 2, a test circuit 12 is disposed on the control circuit board, and the test circuit 12 includes a power circuit 6, a switching regulator circuit 7, a main chip control circuit 8, and a 75 ohm to 50 ohm circuit 9; wherein the test fixture is externally connected with an external 10V power supply, and the external power supply is connected with the power circuit 6 in the test circuit 12; the power supply circuit 6 is connected with the switch voltage stabilizing circuit 7 and the main chip control circuit 8 and provides working voltage required by the switch voltage stabilizing circuit 7 and the main chip control circuit 8; the main chip control circuit 8 is connected with the switch voltage stabilizing circuit 7, the switch voltage stabilizing circuit 7 is connected with an external tuner 11 to be tested, and the switch voltage stabilizing circuit 7 outputs voltage to the tuner 11 to be tested according to the instruction of the main chip control circuit 8 and provides working voltage for the tuner 11 to be tested; the main chip control circuit 8 is connected with a 75 ohm to 50 ohm circuit 9, the 75 ohm to 50 ohm circuit 9 is connected with an external tuner 11 to be tested and an external test device 10, and the main chip control circuit 8 gives a 22K signal and a Diseqc command to the tuner 11 to be tested through the 75 ohm to 50 ohm circuit 9; the main chip control circuit 8 is connected with the external navigation switch 2 and the display lamp assembly 5, and controls the output state of the main chip control circuit 8 by performing mechanical operation on the external navigation switch 2 up, down, left and right, so that different modes are switched and relevant instructions are given to an external tuner 11 to be tested; the main chip control circuit 8 displays the test mode condition of the test fixture through the display lamp combination 5.
The external test equipment 10 is connected with the test circuit 12 through the connector 4 connected with the test equipment; the external tuner 11 to be tested is connected with the test circuit 12 through the connector 3 connected with the test tuner.
The external navigation switch 2 is a deflector rod, and has three action modes, namely upward-shifting, downward-shifting and inward-pressing; wherein dial-up and dial-down play a selective role and pressing inwards plays a determinate role.
The test circuit 12 can perform tuner polarization and high and low frequency selection, and on the basis of the tuner polarization and the high and low frequency selection, the following mode functions can be realized.
General mode: in this mode the switching frequency can be changed.
Switching mode: in this mode, the switch voltage regulator circuit 7 can be triggered to be communicated with the tuner 11 to be tested.
DCSS mode: in the mode, all independent users UB on the horizontal or vertical are activated, the main chip control circuit 8 sends a Diseqc reset command and simultaneously triggers whether the switch voltage stabilizing circuit 7 is communicated with the tuner 11 to be tested or not.
DCSS noise mode MXL mode: the main chip control circuit 8 sends a command of the noise indexes 1 to 8, and simultaneously triggers whether the switch voltage stabilizing circuit 7 is communicated with the tuner 11 to be tested or not.
DCSS noise mode BCM mode: the main chip control circuit 8 sends a command of the noise indexes 1 to 8, and simultaneously triggers whether the switch voltage stabilizing circuit 7 is communicated with the tuner 11 to be tested or not.
Satellite a, satellite B and satellite C Toneburst short pure tone mode: the main chip control circuit 8 controls the switching among the satellite A, the satellite B and the satellite C.
A fixed mode: the stroboscopic DC power supply is stroboscopic for 20 times at an interval of 50ms, and the switch voltage stabilizing circuit 7 is triggered to be communicated with the tuner 11 to be tested or not, namely, the switch voltage stabilizing circuit 7 is controlled by the main chip to complete the on-off control of the product.
DCSS Broadcom database change schema: the master chip control circuit 8 sends a Diseqc command list and simultaneously triggers whether the switch voltage stabilizing circuit 7 is communicated with the tuner 11 to be tested or not.
DCSS MXL database change schema: and the main chip control circuit 8 sends the selected Diseqc command and simultaneously triggers the switch voltage stabilizing circuit 7 to be communicated with the tuner 11 to be tested.
The above is the preferred embodiment of the present invention, and several other simple substitutions and modifications made on the premise of the inventive concept should be considered as falling into the protection scope of the present invention.
Claims (5)
1. A novel tuner test circuit is characterized in that: the test circuit comprises a power supply circuit, a switch voltage stabilizing circuit, a main chip control circuit and a 75 ohm to 50 ohm circuit; the power circuit is externally connected with a power supply, and the power circuit is internally connected with a switch voltage stabilizing circuit and a main chip control circuit; the main chip control circuit is connected with the switch voltage stabilizing circuit, the switch voltage stabilizing circuit is externally connected with the tuner to be tested, and the switch voltage stabilizing circuit outputs voltage to the tuner to be tested according to the instruction of the main chip control circuit and provides working voltage for the tuner to be tested; the main chip control circuit is connected with the 75 ohm-to-50 ohm circuit, and the 75 ohm-to-50 ohm circuit is externally connected with a tuner to be tested and external test equipment.
2. The utility model provides a novel tuner test fixture which characterized in that: comprises a shell, wherein a control circuit board is arranged in the shell; the external navigation switch for switching modes, the joint for connecting the test tuner and the joint for connecting the test equipment are arranged outside the shell; the control circuit board is connected with a joint connected with the testing tuner, a joint connected with the testing equipment and an external navigation switch; the control circuit board is provided with a novel tuner test circuit as claimed in claim 1; the external test equipment is connected with the test circuit through a joint connected with the test equipment; the external tuner to be tested is connected with the test circuit through the connector connected with the test tuner.
3. The novel tuner test fixture of claim 2, wherein: and the shell is also provided with a display lamp combination, and the display lamp combination is connected with the main chip control circuit and displays the mode of the test fixture.
4. The novel tuner test fixture of claim 2, wherein: the external navigation switch is a deflector rod, and has three action modes, namely an upward toggle action mode, a downward toggle action mode and an inward press mode; dial-up and dial-down play a selective role, and press-in plays a definitive role.
5. The novel tuner test fixture of claim 2, wherein: the connector connected with the test tuner is selected to be a 75 ohm connector; the connector for connecting the test equipment is a 50 ohm connector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110774207.4A CN113645461A (en) | 2021-07-08 | 2021-07-08 | Novel tuner test circuit and test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110774207.4A CN113645461A (en) | 2021-07-08 | 2021-07-08 | Novel tuner test circuit and test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN113645461A true CN113645461A (en) | 2021-11-12 |
Family
ID=78416929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110774207.4A Pending CN113645461A (en) | 2021-07-08 | 2021-07-08 | Novel tuner test circuit and test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113645461A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080094385A1 (en) * | 2006-10-19 | 2008-04-24 | Nec Electronics Corporation | Drive circuit of display device and method of testing the same |
| CN204305192U (en) * | 2014-11-26 | 2015-04-29 | 珠海迈科智能科技股份有限公司 | A kind of tuner and satellite signal receiving system |
| CN205408081U (en) * | 2016-02-18 | 2016-07-27 | 珠海迈科智能科技股份有限公司 | Tuner test system |
| CN210927851U (en) * | 2020-01-08 | 2020-07-03 | 深圳市千亿高科电子有限公司 | Tuner signal detection system |
| CN212381326U (en) * | 2020-07-29 | 2021-01-19 | 深圳市康冠智能科技有限公司 | Satellite digital television signal testing device and system |
| CN215932023U (en) * | 2021-07-08 | 2022-03-01 | 浙江盛洋科技股份有限公司 | Novel tuner test circuit and test fixture |
-
2021
- 2021-07-08 CN CN202110774207.4A patent/CN113645461A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080094385A1 (en) * | 2006-10-19 | 2008-04-24 | Nec Electronics Corporation | Drive circuit of display device and method of testing the same |
| CN204305192U (en) * | 2014-11-26 | 2015-04-29 | 珠海迈科智能科技股份有限公司 | A kind of tuner and satellite signal receiving system |
| CN205408081U (en) * | 2016-02-18 | 2016-07-27 | 珠海迈科智能科技股份有限公司 | Tuner test system |
| CN210927851U (en) * | 2020-01-08 | 2020-07-03 | 深圳市千亿高科电子有限公司 | Tuner signal detection system |
| CN212381326U (en) * | 2020-07-29 | 2021-01-19 | 深圳市康冠智能科技有限公司 | Satellite digital television signal testing device and system |
| CN215932023U (en) * | 2021-07-08 | 2022-03-01 | 浙江盛洋科技股份有限公司 | Novel tuner test circuit and test fixture |
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