CN113611352B - Solid state disk testing method, device and system and readable storage medium - Google Patents
Solid state disk testing method, device and system and readable storage medium Download PDFInfo
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- G—PHYSICS
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- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/44—Arrangements for executing specific programs
- G06F9/4401—Bootstrapping
- G06F9/4411—Configuring for operating with peripheral devices; Loading of device drivers
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C29/56016—Apparatus features
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
- G11C2029/5602—Interface to device under test
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Abstract
The application discloses a solid state disk testing method, a device, a system and a readable storage medium. The application provides a solid state disk test system comprising a main controller (MCU 1), a BIOS modification module (BIOS TOOL), a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of a PC device, and the BIOS modification module comprises a slave controller (MCU 2) and a restarting unit. The main controller can acquire the preset state of the target parameter; and sending the preset state to the slave controller and controlling the slave controller so that the slave controller changes the current state into the preset state and controls the restarting unit to restart the PC device when the preset state is different from the current state of the target parameter. According to the method and the device, the target parameters do not need to be modified by professional testers, and the modification speed of the target parameters is improved.
Description
Technical Field
The present invention relates to the field of solid state disk testing technologies, and in particular, to a method, an apparatus, a system, and a readable storage medium for testing a solid state disk.
Background
The SATA (Serial Advanced Technology Attachment) interface is a standard Disk access interface in the industry, and recently, SATA interfaces are also applied to Solid State Disks (SSD) or Solid State Drive.
In practical application, some parameters of the SATA interface are configured by BIOS (Basic Input Output System) and stored in the BIOS, and the main parameters are SATA Hot Plug enable parameters (SATA Hot Plug), which determine whether the system enables a SATA Hot Plug function, and have different requirements for different operating systems on whether to enable the SATA Hot Plug function.
In the process of checking, producing and testing the solid state disk, the operation of modifying the SATA interface parameters in the BIOS is a time-consuming process, and especially in the process of mass production testing, the automation is not facilitated, resulting in low efficiency of modifying the SATA interface parameters.
Disclosure of Invention
In view of the above problems, the present application provides a method, an apparatus, a system, and a readable storage medium for testing a solid state disk.
The embodiment of the application provides a solid state disk testing method which is applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of a PC (personal computer) device, and the BIOS modification module comprises a slave controller and a restarting unit; the method comprises the following steps:
the main controller obtains a preset state of a target parameter;
and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
According to the solid state disk testing method, the PC equipment is connected with the main controller; the obtaining the preset state of the target parameter includes:
and acquiring the preset state of the target parameter sent by the PC equipment, wherein the preset state of the target parameter sent by the PC equipment is sent by a user through a test program.
According to the solid state disk testing method, the solid state disk testing system further comprises a key modification module, the key modification module comprises a parameter modification key, and the key modification module is connected with the main controller; the obtaining the preset state of the target parameter includes:
and when the state of the parameter modification key is changed, acquiring a preset state of a target parameter corresponding to the current key state of the parameter modification key.
According to the solid state disk testing method, the solid state disk testing system further comprises a power supply control module, wherein the power supply control module comprises a current inflow interface, a current outflow interface and a controlled interface, the current inflow interface is connected with a power supply, the current outflow interface is connected with a second interface of the first connecting module, and the controlled interface is connected with the main controller; the method further comprises the steps of:
when a test instruction is received, determining whether a first instruction for disconnecting the first connection module from the power supply is included in the test instruction;
if the first instruction is included, the power control module is controlled to disconnect the first connection module from the power supply;
if the first instruction is not included, determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction;
and if the second instruction is included, the first connection module is communicated with the power supply by controlling the power supply control module.
According to the solid state disk testing method, the solid state disk testing system further comprises a disk position detection module, and the disk position detection module is connected with the main controller; the method further comprises the steps of:
if the second instruction is not included, determining whether a third instruction for acquiring the disc information is included in the test instruction;
and if the third instruction is included, receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk according to the disk position information.
According to the solid state disk testing method, the solid state disk testing system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connecting module, a second interface of the on-off control module is connected with a second interface of the second connecting module, and the third interface of the on-off control module is connected with the main controller; the method further comprises the steps of:
if the third instruction is not included, determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction;
if the fourth instruction is included, the on-off control module is controlled to disconnect the first connection module and the second connection module;
and if the fourth instruction is not included, the on-off control module is controlled to enable the first connection module to be communicated with the second connection module.
According to the solid state disk testing method, the target parameter comprises one of a SATA interface hot plug enabling parameter, an mSATA interface hot plug enabling parameter and an NGFF interface hot plug enabling parameter.
The embodiment of the application also provides a solid state disk testing device which is applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein the first connection module is used for connecting a solid state disk, and the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restarting unit, and the device comprises:
the acquisition unit is used for acquiring a preset state of the target parameter;
and the modification unit is used for sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
The embodiment of the application also provides a solid state disk test system, which comprises a main controller, a BIOS modification module, a first connection module, a second connection module and a memory, wherein a first interface of the first connection module is used for connecting a solid state disk, and a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restarting unit, wherein the memory stores a computer program, and the computer program executes the solid state disk testing method in the embodiment of the application when running on the master controller.
The embodiment of the application also provides a readable storage medium which stores a computer program, and the computer program executes the solid state disk testing method in the embodiment of the application when running on a processor.
The application provides a solid state disk test system comprising a main controller (MCU 1), a BIOS modification module (BIOS TOOL), a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment, and the BIOS modification module comprises a slave controller (MCU 2) and a restarting unit. The main controller can acquire a preset state of the target parameter; and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter. According to the method, the solid state disk is tested by using the solid state disk testing system, a professional tester is not required to determine the BIOS interface where the target parameter is located from a plurality of BIOS interfaces of the BIOS system, and locate the target parameter on the BIOS interface to modify the target parameter, the complex modification process is simplified by using the solid state disk testing system, the modification speed of the target parameter is improved, and the solid state disk testing efficiency is further improved.
Drawings
In order to more clearly illustrate the technical solutions of the present invention, the drawings that are required for the embodiments will be briefly described, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope of the present invention. Like elements are numbered alike in the various figures.
Fig. 1 shows a schematic structural diagram of a solid state disk testing system according to an embodiment of the present application;
FIG. 2 is a schematic diagram illustrating a structure of a BIOS modification module according to an embodiment of the present application;
fig. 3 is a schematic flow chart of a method for testing a solid state disk according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of another solid state disk testing system according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram of a BIOS interface according to an embodiment of the present application;
fig. 6 shows a schematic flow chart of another solid state disk testing method according to an embodiment of the present application;
fig. 7 shows a schematic structural diagram of a solid state disk testing device according to an embodiment of the present application.
Description of main reference numerals:
10-a solid state disk testing device; 11-an acquisition unit; 12-modifying unit.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments.
The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present invention.
The terms "comprises," "comprising," "including," or any other variation thereof, are intended to cover a specific feature, number, step, operation, element, component, or combination of the foregoing, which may be used in various embodiments of the present invention, and are not intended to first exclude the presence of or increase the likelihood of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.
Furthermore, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which various embodiments of the invention belong. The terms (such as those defined in commonly used dictionaries) will be interpreted as having a meaning that is the same as the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in connection with the various embodiments of the invention.
Referring to fig. 1, an embodiment of the present application proposes a solid state disk test system including a master controller (MCU 1), a BIOS modification module (BIOS tol), a first connection module and a second connection module, where a first interface of the first connection module is used to connect to a solid state disk, a first interface of the second connection module is used to connect to a solid state disk interface of a PC device, and the BIOS modification module includes a slave controller (MCU 2) and a restart unit.
For example, referring to fig. 2, the BIOS modifying module (BIOS tol) includes a slave controller (MCU 2) and a restarting unit for controlling the restart of the PC device, where the restarting unit includes a power supply VCC, a diode VD, a relay K, a transistor T, a first resistor R1 and a second resistor R2, and the relay K is connected in parallel to a restart Button Reset Button of the PC device. The power supply end VCC is a BIOS TOOL power supply, wherein the relay K can be a passive relay, and the diode VD can play a role of follow current; the triode T is an NPN bipolar triode, and can be replaced by an NMosfet tube, the first resistor R1 plays a role in limiting current, and the second resistor R2 is used for preventing misoperation.
The slave controller (MCU 2) of the BIOS modifying module (BIOS TOOL) receives the Protocol through the serial port COM, and after receiving the Protocol from the controller (MCU 2), the BIOS modifying module analyzes the Protocol. VGA_In from the controller (MCU 2) is VGA signal or HDMI signal input interface, also can be converted into communicable signal input through the video device, such as I2C, SPI, UART, etc. The USB Device of the slave controller (MCU 2) is a USB port working in a USB Device mode, and mainly functions as a Mouse and keyboard simulation (Mouse & Keyboard Simulator).
It should be noted that, the flash memory of the BIOS modification module stores the identification information of each BIOS interface in advance, and each BIOS interface has unique identification information, for example, a picture, a video frame, a color, a text, and the like. When modifying certain parameter information of a certain interface, the BIOS interface comprising the parameter information can be positioned from each BIOS interface through a picture or video frame or color or text corresponding to the parameter information, so that the parameter information is modified through the BIOS interface comprising the parameter information.
Example 1
Referring to fig. 3, an embodiment of the present application provides a method for testing a solid state disk, including the following steps S100 and S200:
s100: and acquiring a preset state of the target parameter.
The target parameters include one of SATA interface hot plug enable parameters, msta interface hot plug enable parameters, and NGFF interface hot plug enable parameters.
For example, referring to fig. 4, the solid state disk testing system further includes a key modification module, where the key modification module includes a parameter modification key (K1), and the key modification module is connected to a ki_in pin of the main controller (MCU 1); the main controller (MCU 1) can acquire a preset state of a target parameter corresponding to the current key state of the parameter modification key (K1) when the state of the parameter modification key (K1) is changed.
The COM1 pin of the main controller (MCU 1) is connected with the PC device, and the main controller (MCU 1) can acquire the preset state of the target parameter sent by the user through the COM1, namely, the PC device sends the preset state of the target parameter to the main controller (MCU 1) through the COM 1.
S200: and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter.
It will be appreciated that the COM pin of the master controller (MCU 1) is connected to the COM pin of the slave controller (MCU 2), and the master controller (MCU 1) transmits the preset state to the slave controller through the COM pin. The slave controller (MCU 2) judges whether the preset state is the same as the current state, if the preset state is the same as the current state, the current state of the target parameter is maintained, if the preset state is different from the current state, a BIOS interface (shown in fig. 5) corresponding to the target parameter is determined, the current state is modified to the preset state at the BIOS interface corresponding to the target parameter, and the restarting unit is controlled to restart the PC device. After modifying the state of the target parameter, the PC device needs to be restarted to validate the modified preset state.
It should be noted that, the BIOS modifying module (BIOS TOOL) may select an interface where the target parameter is located from the plurality of BIOS interfaces according to the information obtained from the main controller (MCU 1), and determine the location where the target parameter is located at the interface where the target parameter is located.
It will be appreciated that steps S100 and S200 are performed by the main controller of the solid state disk testing system.
It should be noted that, when the user modifies the target parameter into the preset state through the test program, the test program receives the current state of the target parameter through the BIOS standard interface after receiving the instruction of the user to modify the target parameter into the preset state, further, judges whether the preset state is the same as the current state, and when the preset state is different from the current state, sends a protocol including the preset state to the main controller (MCU 1) through the COM1, and the main controller (MCU 1) executes step S200 after receiving the protocol.
It should be noted that, because the program update frequency in the master controller is high, the program in the master controller needs to be updated according to the test requirement, and the program in the slave controller generally does not need to be updated. If the solid state disk test system uses only one controller, and programs in the master controller and programs in the slave controller are burnt in one controller, the programs which are updated frequently can influence the stability of the programs which do not need to be updated. Therefore, by using the master controller and the slave controller, the program which is updated at high frequency is prevented from influencing the program which does not need to be updated, and the stability of the program which does not need to be updated is ensured.
The embodiment of the application provides a solid state disk test system comprising a main controller (MCU 1), a BIOS modification module (BIOS TOOL), a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of a PC device, and the BIOS modification module comprises a slave controller (MCU 2) and a restarting unit. The main controller can acquire a preset state of the target parameter; and sending the preset state to the slave controller and controlling the slave controller so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter. According to the embodiment, the solid state disk is tested by using the solid state disk testing system, a professional tester is not required to determine the BIOS interface where the target parameter is located from a plurality of BIOS interfaces of the BIOS system, and locate the target parameter on the BIOS interface to modify the target parameter, the complex modification process is simplified by using the solid state disk testing system, the modification speed of the target parameter is improved, and the solid state disk testing efficiency is further improved.
Further, referring to fig. 4, the solid state disk testing system further includes a power control module, where the power control module includes a current inflow interface, a current outflow interface, and a controlled interface, the current inflow interface is connected to the power supply, the current outflow interface is connected to the second interface of the first connection module, and the controlled interface is connected to the main controller (MCU 1). The current inflow interface comprises six power supply ends (3 VCC power supply ends, 3.3v power supply ends, 5v power supply ends and 12v power supply ends), the current outflow interface comprises 3 output ends (3.3 v output ends, 5v output ends and 12v output ends), and the controlled interface comprises 3 controlled ends which are respectively connected with a K3.3 pin, a K5 pin and a K12 pin of the main controller (MCU 1).
The solid state disk testing system further comprises a disk position detection module, and the disk position detection module is connected with the main controller (MCU 1). Wherein Touch Spot is mechanical switch contact, and linkage K0 switching action is when solid state disk inserts first interface of first connection module, and K0 is closed, otherwise K0 disconnection. The main controller (MCU 1) can receive the on and off information of K0 through the K0_in pin, and then can detect the disk bit according to the on and off information of K0.
The solid state disk testing system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connection module, a second interface of the on-off control module is connected with a second interface of the second connection module, and the third interface of the on-off control module is connected with the main controller (MCU 1). The first interface of the on-off control module comprises four ports which are respectively connected with the four ports of the third interface of the first connection module, the second interface of the on-off control module comprises four ports which are respectively connected with the four ports of the second interface of the second connection module, and the third interface of the on-off control module is connected with an EN_Out pin of the controller (MCU 1).
Referring to fig. 6, based on the solid state disk testing system disclosed in fig. 4, the solid state disk testing method provided in the embodiment of the present application further includes the following steps:
s10: and when a test instruction is received, determining whether a first instruction for disconnecting the first connection module from the power supply is included in the test instruction.
If the first instruction is included, step S20 is executed, and if the first instruction is not included, step S30 is executed.
S20: and the power supply control module is controlled to disconnect the first connection module from the power supply.
S30: and determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction.
If the second instruction is included, step S40 is executed, and if the second instruction is not included, step S50 is executed.
S40: and the first connecting module is communicated with the power supply by controlling the power supply control module.
S50: and determining whether a third instruction for acquiring the disc information is included in the test instruction.
If the third instruction is included, step S60 is executed, and if the third instruction is not included, step S70 is executed.
S60: and receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk or not according to the disk position information.
S70: determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction.
If the fourth instruction is included, step S80 is executed, and if the fourth instruction is not included, step S90 is executed.
S80: and the on-off control module is controlled to disconnect the first connection module and the second connection module.
S90: and the on-off control module is controlled to enable the first connecting module to be communicated with the second connecting module.
It can be understood that the power supply of the solid state disk can be independently controlled by the power supply control module so as to test the on and off functions of the power supply of the solid state disk. The on-off control module can control the connection and disconnection of the solid state disk and the PC equipment, so that the plug-in state of the solid state disk is conveniently simulated, the plug-in times of the solid state disk are reduced when the connection and disconnection functions of the solid state disk and the PC equipment are tested, and the damage of the solid state disk interface caused by excessive plug-in times is avoided. The disk position information can be detected by utilizing the disk position detection module, so that whether the solid state disk is inserted into the first interface of the first connection module or not can be rapidly determined through the detected disk position information.
Example 2
Referring to fig. 7, a solid state disk testing device 10 is provided for a solid state disk testing system including a main controller, a BIOS modification module, a first connection module and a second connection module, where the first connection module is used for connecting a solid state disk, and the second connection module is used for connecting a solid state disk interface of a PC device; the BIOS modification module comprises a slave controller and a restarting unit. The solid state disk test device 10 includes: an acquisition unit 11 and a modification unit 12.
An acquiring unit 11, configured to acquire a preset state of a target parameter; and a modifying unit 12, configured to send the preset state to the slave controller and control the slave controller, so that the slave controller modifies the current state to the preset state and controls the restarting unit to restart the PC device when the preset state is different from the current state of the target parameter.
The solid state disk testing device 10 disclosed in this embodiment is used to execute the solid state disk testing method described in the foregoing embodiment through the cooperation of the obtaining unit 11 and the modifying unit 12, and the implementation and the beneficial effects related to the foregoing embodiment are also applicable in this embodiment, and are not repeated herein.
It can be understood that the solid state disk testing system disclosed by the application further comprises a memory, wherein the memory stores a computer program, and the computer program executes the solid state disk testing method disclosed by the embodiment of the application when running on the main controller.
It can be appreciated that the present application also discloses a readable storage medium storing a computer program, which when run on a processor, performs the solid state disk testing method described in the embodiments of the present application.
In the several embodiments provided in this application, it should be understood that the disclosed apparatus and method may be implemented in other manners as well. The apparatus embodiments described above are merely illustrative, for example, of the flow diagrams and block diagrams in the figures, which illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, functional modules or units in various embodiments of the invention may be integrated together to form a single part, or the modules may exist alone, or two or more modules may be integrated to form a single part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a smart phone, a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned readable storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention.
Claims (9)
1. The solid state disk testing method is characterized by being applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein a first interface of the first connection module is used for connecting a solid state disk, a first interface of the second connection module is used for connecting a solid state disk interface of a PC device, and the BIOS modification module comprises a slave controller and a restarting unit; the method comprises the following steps:
the main controller obtains a preset state of a target parameter; the target parameters comprise one of SATA interface hot plug enabling parameters, mSATA interface hot plug enabling parameters and NGFF interface hot plug enabling parameters;
the preset state is sent to the slave controller and controls the slave controller, so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC equipment when the preset state is different from the current state of the target parameter;
the solid state disk test system also comprises a power supply control module, wherein the power supply control module comprises a current inflow interface, a current outflow interface and a controlled interface, the current inflow interface is connected with a power supply, the current outflow interface is connected with a second interface of the first connection module, and the controlled interface is connected with the main controller; the method further comprises the steps of:
when a test instruction is received, determining whether a first instruction for disconnecting the first connection module from the power supply is included in the test instruction;
and if the first instruction is included, the power control module is controlled to disconnect the first connection module from the power supply.
2. The method for testing a solid state disk of claim 1, wherein the PC device is connected to the main controller; the obtaining the preset state of the target parameter includes:
and acquiring the preset state of the target parameter sent by the PC equipment, wherein the preset state of the target parameter sent by the PC equipment is sent by a user through a test program.
3. The method for testing a solid state disk according to claim 1, wherein the solid state disk testing system further comprises a key modification module, the key modification module comprises a parameter modification key, and the key modification module is connected with the main controller; the obtaining the preset state of the target parameter includes:
and when the state of the parameter modification key is changed, acquiring a preset state of a target parameter corresponding to the current key state of the parameter modification key.
4. The method for testing a solid state disk of claim 1, wherein,
when a test instruction is received, if the test instruction does not include a first instruction for disconnecting the first connection module from the power supply; determining whether a second instruction for communicating the first connection module with the power supply is included in the test instruction;
and if the second instruction is included, the first connection module is communicated with the power supply by controlling the power supply control module.
5. The method for testing a solid state disk according to claim 4, wherein the solid state disk testing system further comprises a disk position detection module, and the disk position detection module is connected with the main controller; the method further comprises the steps of:
if the second instruction is not included, determining whether a third instruction for acquiring the disc information is included in the test instruction;
and if the third instruction is included, receiving the disk position information detected by the disk position detection module, and determining whether the first connection module is connected to the solid state disk according to the disk position information.
6. The method for testing a solid state disk according to claim 5, wherein the solid state disk testing system further comprises an on-off control module, a first interface of the on-off control module is connected with a third interface of the first connection module, a second interface of the on-off control module is connected with a second interface of the second connection module, and the third interface of the on-off control module is connected with the main controller; the method further comprises the steps of:
if the third instruction is not included, determining whether a fourth instruction for disconnecting the first connection module and the second connection module is included in the test instruction;
if the fourth instruction is included, the on-off control module is controlled to disconnect the first connection module and the second connection module;
and if the fourth instruction is not included, the on-off control module is controlled to enable the first connection module to be communicated with the second connection module.
7. The solid state disk testing device is characterized by being applied to a solid state disk testing system comprising a main controller, a BIOS modification module, a first connection module and a second connection module, wherein the first connection module is used for connecting a solid state disk, and the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restarting unit, and the device comprises:
the acquisition unit is used for acquiring a preset state of the target parameter; the target parameters comprise one of SATA interface hot plug enabling parameters, mSATA interface hot plug enabling parameters and NGFF interface hot plug enabling parameters;
a modifying unit, configured to send the preset state to the slave controller and control the slave controller, so that the slave controller modifies the current state into the preset state and controls the restarting unit to restart the PC device when the preset state is different from the current state of the target parameter;
the solid state disk test system also comprises a power supply control module, wherein the power supply control module comprises a current inflow interface, a current outflow interface and a controlled interface, the current inflow interface is connected with a power supply, the current outflow interface is connected with a second interface of the first connection module, and the controlled interface is connected with the main controller;
the solid state disk testing device further comprises:
the judging unit is used for determining whether the test instruction comprises a first instruction for disconnecting the first connecting module from the power supply or not when the test instruction is received;
and the control unit is used for disconnecting the first connection module from the power supply by controlling the power supply control module if the first instruction is included.
8. The solid state disk testing system is characterized by comprising a main controller, a BIOS modification module, a first connection module, a second connection module and a memory, wherein a first interface of the first connection module is used for connecting a solid state disk, and a first interface of the second connection module is used for connecting a solid state disk interface of PC equipment; the BIOS modification module comprises a slave controller and a restarting unit, wherein the memory stores a computer program which executes the solid state disk testing method of any one of claims 1 to 6 when running on the master controller.
9. A readable storage medium, characterized in that it stores a computer program which, when run on a processor, performs the solid state disk testing method of any one of claims 1 to 6.
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