CN113607728A - Optical system in-situ measuring mechanism integrating multi-degree-of-freedom linear motion - Google Patents

Optical system in-situ measuring mechanism integrating multi-degree-of-freedom linear motion Download PDF

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CN113607728A
CN113607728A CN202110765196.3A CN202110765196A CN113607728A CN 113607728 A CN113607728 A CN 113607728A CN 202110765196 A CN202110765196 A CN 202110765196A CN 113607728 A CN113607728 A CN 113607728A
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measuring mechanism
dust
optical system
rotary
linear
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CN113607728B (en
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李丽芳
闫继宏
刘军考
陈维山
胡松梅
魏翔
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Harbin Institute of Technology
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Harbin Institute of Technology
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

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Abstract

The invention provides an optical system in-situ measurement mechanism integrating multi-degree-of-freedom linear motion, and belongs to the technical field of space environment simulation. The problem of the big degree of difficulty of normal position measurement when having solved current space environment simulation. It includes dust electrification measuring mechanism, surface dust measuring mechanism, linear displacement slide, revolving arm, first gyration pole, second gyration pole and up-and-down motion system, the linear displacement slide links to each other with linear guide, linear displacement slide upper end links to each other with the revolving arm through first revolving axle, the one end and the up-and-down motion system of revolving arm link to each other, the other end of revolving arm links to each other with the second gyration pole through the second revolving axle, the up-and-down motion system links to each other with first gyration pole through the third revolving axle, the both ends of first gyration pole all are provided with surface dust measuring mechanism, the both ends of second gyration pole all are provided with dust electrification measuring mechanism. It is mainly used for in-situ measurement.

Description

Optical system in-situ measuring mechanism integrating multi-degree-of-freedom linear motion
Technical Field
The invention belongs to the technical field of space environment simulation, and particularly relates to an optical system in-situ measurement mechanism integrating multi-degree-of-freedom linear motion.
Background
The moon is the only natural satellite of the earth, but its orbital environment is very different from the earth's orbital environment. The lunar orbit has a large solar radiation constant, and since the lunar surface has almost no atmosphere, the diurnal temperature difference of the lunar surface is large, and the shadow zone where the sun cannot be irradiated and the lunar surface temperature during the night are very low. With the progress of the lunar ground environment simulation technology, the lunar environment simulation in China is in a high-level stage, and the lunar surface comprehensive simulation environment of vacuum, low temperature, electronic irradiation, X-ray irradiation, ultraviolet irradiation and micron/submicron-level charged dust can be simulated, so that the difficulty of in-situ measurement is increased when the environment simulation is carried out. Therefore, some technical difficulties in the aspects of extreme environmental adaptability exist in the demonstration, design and engineering implementation processes of the equipment.
Disclosure of Invention
The invention provides an in-situ measuring mechanism of an optical system integrating multi-degree-of-freedom linear motion, aiming at solving the problems in the prior art.
In order to achieve the purpose, the invention adopts the following technical scheme: the utility model provides an integrated multi freedom linear motion's optical system normal position measuring mechanism, it includes dust electrification measuring mechanism, surface dust measuring mechanism, linear displacement slide, revolving arm, first revolving rod, second revolving rod and up-and-down motion system, linear displacement slide links to each other with linear guide, linear displacement slide upper end links to each other with the revolving arm through first revolving axle, the one end and the up-and-down motion system of revolving arm link to each other, the other end of revolving arm passes through the second revolving axle and links to each other with the second revolving rod, the up-and-down motion system links to each other with first revolving rod through the third revolving axle, the both ends of first revolving rod all are provided with surface dust measuring mechanism, the both ends of second revolving rod all are provided with dust electrification measuring mechanism.
Furthermore, the dust electrification amount measuring mechanism comprises a photomultiplier and a Faraday cup, wherein the photomultiplier and the Faraday cup are respectively arranged at two ends of the second rotary rod.
Furthermore, the surface dust measuring mechanism comprises a surface potentiometer and an integrating sphere, wherein the surface potentiometer and the integrating sphere are respectively arranged at two ends of the first rotating rod.
Furthermore, a heating plate is arranged on the linear displacement sliding seat.
Compared with the prior art, the invention has the beneficial effects that: the invention solves the problem of high difficulty in-situ measurement in the conventional space environment simulation. The invention relates to an optical system in-situ measurement multi-degree-of-freedom linear motion integrated mechanism which can work in a lunar surface comprehensive simulation environment of vacuum, low temperature, electronic irradiation, X-ray irradiation, ultraviolet irradiation and micron/submicron electrified dust, wherein the in-situ measurement mechanism works in a lunar dust cabin with vacuum, low temperature, irradiation and electrified dust, the no-load vacuum limit pressure of the in-situ measurement mechanism is 10-5Pa magnitude, the environmental temperature is 100K, and the mechanism needs to have dustproof and thermal control capability and radiation protection capability; the portable measuring instruments are more in types and quantity: mainly comprises but not limited to an optical microscope probe, an integrating sphere reflectivity measuring instrument, an emissivity measuring instrument, a surface potentiometer and the like; the range of motion is great: the movement range of the carried measuring instrument in the horizontal movement plane is not less than 400mm multiplied by 400 mm; the method has certain positioning accuracy and speed requirements: the movement speed is more than or equal to 400mm/min, and the positioning precision error is less than or equal to +/-5 mm. The measurement of the charged lunar dust and the test object can be realized.
Drawings
FIG. 1 is a schematic structural diagram of an in-situ measurement mechanism of an optical system integrating multi-degree-of-freedom linear motion according to the present invention;
FIG. 2 is an enlarged view of an installation position of an in-situ measuring mechanism of an integrated multi-degree-of-freedom linear motion optical system according to the present invention;
FIG. 3 is a schematic view of an in-situ measurement mechanism of an optical system integrated with multi-degree-of-freedom linear motion according to the present invention;
FIG. 4 is a schematic diagram illustrating a zero state of an in-situ measurement mechanism of an optical system integrated with multi-degree-of-freedom linear motion according to the present invention;
FIG. 5 is a schematic diagram of the photomultiplier tube of the present invention positioned in the region directly above the center of the sample stage;
FIG. 6 is a schematic diagram of a photomultiplier tube according to the present invention positioned in a desired region directly above a sample stage;
FIG. 7 is a schematic diagram of the surface potentiometer moving above the sample stage according to the present invention;
FIG. 8 is a schematic diagram of the motion of the pointing measurement surface of the surface potentiometer according to the present invention;
FIG. 9 is a block diagram of a lunar dust cabin system according to the present invention.
1-a surface potentiometer, 2-an integrating sphere, 3-a photomultiplier, 4-a sample stage, 5-a heating sheet, 6-a linear displacement slide seat, 7-a Faraday cup, 8-a second rotating shaft, 9-a first rotating shaft, 10-a third rotating shaft, 11-a rotating arm, 12-a first rotating rod, 13-a second rotating rod, 14-an up-and-down motion system, a-a lunar dust cabin, b-an in-situ measurement mechanism and c-a platform.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely explained below with reference to the drawings in the embodiments of the present invention.
Referring to fig. 1-9 to illustrate the embodiment, an in-situ measurement mechanism of an optical system integrating multi-degree-of-freedom linear motion comprises a dust charge measurement mechanism, a surface dust measurement mechanism, a linear displacement slide 6, a rotary arm 11, a first rotary rod 12, a second rotary rod 13 and an up-and-down motion system 14, the linear displacement slide carriage 6 is connected with a linear guide rail, the upper end of the linear displacement slide carriage 6 is connected with a rotary arm 11 through a first rotary shaft 9, one end of the rotary arm 11 is connected with the up-and-down motion system 14, the other end of the rotary arm 11 is connected with the second rotary rod 13 through the second rotary shaft 8, the up-and-down movement system 14 is connected with the first rotary rod 12 through a third rotary shaft 10, surface dust measuring mechanisms are arranged at two ends of the first rotary rod 12, and dust charge measuring mechanisms are arranged at two ends of the second rotary rod 13.
The measuring instruments carried by the in-situ measuring mechanism of the embodiment have two types,
one type is a dust electrification amount measuring mechanism for measuring the dust electrification amount in the sprinkling process, the dust electrification amount measuring mechanism comprises a photomultiplier tube 3 and a Faraday cup 7, and the photomultiplier tube 3 and the Faraday cup 7 are respectively arranged at two ends of a second rotating rod 13. The other type is a surface dust measuring mechanism for measuring the surface dust of the sample table after the sprinkling is finished, the surface dust measuring mechanism comprises a surface potentiometer 1 and an integrating sphere 2, and the surface potentiometer 1 and the integrating sphere 2 are respectively arranged at two ends of a first rotating rod 12.
According to the working characteristics and the motion requirements of a measuring instrument, the two-dimensional translational motion of the photomultiplier tube 3 and the Faraday cup 7 is realized by a set of polar coordinate motion mechanism; the two-dimensional translation motion of the surface potentiometer 1 and the integrating sphere 2 is realized by a set of polar coordinate mechanism, and the distance between the surface potentiometer and the integrating sphere and the table top is realized by a set of up-and-down motion system 14; in order to simplify the structure and reduce the number of degrees of freedom, two sets of polar coordinate mechanisms share one rotation axis system and one linear motion system.
In the lunar dust sprinkling and charging processes, in order to avoid dust and reduce the influence of the in-situ measurement mechanism on dust falling, the zero position of the in-situ measurement mechanism is in the position shown in fig. 4. When the in-situ measuring mechanism is in a zero position, the minimum distance between the mechanism and the center of the lunar dust cabin is 620mm, the minimum distance between the mechanism and the dust falling area is 420mm, at the moment, the mechanism has no influence on the falling of the lunar dust, and in the sprinkling and charging processes, the surface potential instrument 1 and the integrating sphere 2, which are measuring instruments of the in-situ measuring mechanism, are positioned in the in-situ auxiliary cabin, so that the in-situ auxiliary cabin is utilized to realize dust prevention, and the influence of the lunar dust on the instruments or moving equipment of the mechanism can be effectively reduced.
In the design of the in-situ measuring mechanism, components which can adapt to the temperature of-196 ℃ to +40 ℃ are selected for components such as a motor, a guide rail, a lead screw and a bearing which are greatly influenced by the temperature, and the components can normally work without active thermal control measures, so that passive thermal protection of multiple layers of thermal insulation materials is performed on the components, and the heating plate 5 is arranged on the linear displacement sliding seat 6. The in-situ measuring mechanism is as free as possible of non-metallic polymeric materials in view of the effect of vacuum on the material, and if used, must take into account the evaporation, sublimation and decomposition characteristics of the material. The influence of low temperature on the mechanism is considered, and the low-temperature cold brittleness phenomenon is avoided by adopting metal with a face-centered cubic crystal structure and high-strength steel. Considering the radiation environment, the motor selected by the in-situ measuring mechanism motor is an anti-radiation motor, and the in-situ measuring mechanism can work normally without special protection. The cable of the in-situ measuring mechanism is mainly used for power supply and signal transmission, and particularly, the signal transmission cable also puts higher requirements on radiation resistance, and the cable can completely perform specific functions in a radiation environment. The radiation-resistant semi-flexible/semi-rigid coaxial cable can be selected, the radiation-resistant intensity of the cable is greater than 1 x 106Gy, and the cable can work in the temperature range of-100 ℃ to +150 ℃ for a long time. The cable comprises an inner conductor, an insulating layer, an outer conductor and a sheath layer, and can be used for signal transmission of an in-situ measuring mechanism.
The working flow of the mechanism when the photomultiplier tube 3 works is as follows:
step 1: the in-situ measurement mechanism is in the zero position shown in FIG. 4;
step 2: the photomultiplier 3 is moved above the sample stage 4 by the linear movement of the swing arm 11, the swing movement of the first swing shaft 9 and the second swing shaft 8, as shown in fig. 5;
and step 3: according to the test requirement, the photomultiplier 3 is moved to a designated position by the swing motion of the first swing shaft 9 and the linear motion of the swing arm 11 to perform the test, as shown in fig. 6.
The test procedure of the faraday cup 7 is similar to that of the photomultiplier tube 3, and the movement of the mechanism is the same.
The mechanism work flow when the surface potentiometer 1 is used for measurement is as follows:
step 1: firstly, the surface potentiometer 1 is moved above the sample table 4 by the rotation of the first rotating shaft 9 and the linear motion of the rotating arm 11, as shown in fig. 7;
step 2: the probe of the surface potentiometer 1 is pointed to the upper surface of the sample table 4 through a third rotating shaft 10, and the probe is moved to a required height above the surface of the sample table 4 through an up-down movement system 14;
and step 3: according to the measurement requirement, the probe of the surface potentiometer 1 can be moved to any position of a 400mm multiplied by 400mm area above the sample table 4 through the rotation of the first rotating shaft 9 and the linear motion system of the rotating arm 11, and the mechanism motion principle is shown in figure 8.
The working principle of the mechanism when the integrating sphere 2 is used for measurement is the same as that of the mechanism when the surface potentiometer 1 is used for measurement.
The optical system in-situ measurement mechanism integrated with multi-degree-of-freedom linear motion provided by the invention is described in detail, a specific example is applied in the detailed description to explain the principle and the implementation mode of the invention, and the description of the embodiment is only used for helping to understand the method and the core idea of the invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.

Claims (4)

1. An optical system in-situ measuring mechanism integrated with multi-degree-of-freedom linear motion is characterized in that: it comprises a dust electrification measuring mechanism, a surface dust measuring mechanism, a linear displacement slide carriage (6), a rotary arm (11), a first rotary rod (12), a second rotary rod (13) and an up-and-down motion system (14), the linear displacement sliding seat (6) is connected with the linear guide rail, the upper end of the linear displacement sliding seat (6) is connected with a rotary arm (11) through a first rotary shaft (9), one end of the rotary arm (11) is connected with the up-and-down motion system (14), the other end of the rotary arm (11) is connected with the second rotary rod (13) through the second rotary shaft (8), the up-and-down motion system (14) is connected with the first rotary rod (12) through a third rotary shaft (10), the two ends of the first rotary rod (12) are provided with surface dust measuring mechanisms, and the two ends of the second rotary rod (13) are provided with dust electrification amount measuring mechanisms.
2. The in-situ measurement mechanism of the optical system integrating the linear motion with multiple degrees of freedom of claim 1, wherein: the dust electrification amount measuring mechanism comprises a photomultiplier (3) and a Faraday cup (7), and the photomultiplier (3) and the Faraday cup (7) are respectively arranged at two ends of a second rotary rod (13).
3. The in-situ measurement mechanism of the optical system integrating the linear motion with multiple degrees of freedom of claim 1, wherein: the surface dust measuring mechanism comprises a surface potentiometer (1) and an integrating sphere (2), wherein the surface potentiometer (1) and the integrating sphere (2) are respectively arranged at two ends of a first rotating rod (12).
4. The in-situ measurement mechanism of the optical system integrating the linear motion with multiple degrees of freedom of claim 1, wherein: and a heating sheet (5) is arranged on the linear displacement sliding seat (6).
CN202110765196.3A 2021-07-06 2021-07-06 Optical system in-situ measurement mechanism integrating linear motion with multiple degrees of freedom Active CN113607728B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114858689A (en) * 2022-03-21 2022-08-05 哈尔滨工业大学 In-situ and semi-in-situ test shielding device for space comprehensive environment and test shielding method thereof

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Publication number Priority date Publication date Assignee Title
CN2233561Y (en) * 1995-02-14 1996-08-21 王宝元 Two-dimensional displacement dynamic measuring unit
CN201697975U (en) * 2010-06-13 2011-01-05 山东科技大学 Mining dust electric quantity measuring device
CN203275496U (en) * 2013-05-29 2013-11-06 中国科学院南京土壤研究所 An apparatus for measuring soil streaming potential
CN203323877U (en) * 2012-12-26 2013-12-04 中国计量科学研究院 Device used for measuring visual thresholds
CN105806810A (en) * 2016-06-01 2016-07-27 北京卫星环境工程研究所 Spectral reflectivity in-situ test system in vacuum environment
CN108279193A (en) * 2017-12-11 2018-07-13 中国计量大学 Dusty gas concentration detection apparatus based on integrating sphere
CN111157257A (en) * 2020-01-07 2020-05-15 吉林大学 Wheel flying dust measurement test bed for simulating lunar environment
CN212674090U (en) * 2020-06-19 2021-03-09 中国工程物理研究院机械制造工艺研究所 Dynamic measuring device with rotary shaft with six degrees of freedom

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2233561Y (en) * 1995-02-14 1996-08-21 王宝元 Two-dimensional displacement dynamic measuring unit
CN201697975U (en) * 2010-06-13 2011-01-05 山东科技大学 Mining dust electric quantity measuring device
CN203323877U (en) * 2012-12-26 2013-12-04 中国计量科学研究院 Device used for measuring visual thresholds
CN203275496U (en) * 2013-05-29 2013-11-06 中国科学院南京土壤研究所 An apparatus for measuring soil streaming potential
CN105806810A (en) * 2016-06-01 2016-07-27 北京卫星环境工程研究所 Spectral reflectivity in-situ test system in vacuum environment
CN108279193A (en) * 2017-12-11 2018-07-13 中国计量大学 Dusty gas concentration detection apparatus based on integrating sphere
CN111157257A (en) * 2020-01-07 2020-05-15 吉林大学 Wheel flying dust measurement test bed for simulating lunar environment
CN212674090U (en) * 2020-06-19 2021-03-09 中国工程物理研究院机械制造工艺研究所 Dynamic measuring device with rotary shaft with six degrees of freedom

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114858689A (en) * 2022-03-21 2022-08-05 哈尔滨工业大学 In-situ and semi-in-situ test shielding device for space comprehensive environment and test shielding method thereof
CN114858689B (en) * 2022-03-21 2023-12-01 哈尔滨工业大学 Space comprehensive environment in-situ and semi-in-situ test shielding device and test shielding method thereof

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