CN113607081A - Contact type welding surface defect three-dimensional measurement system and method - Google Patents
Contact type welding surface defect three-dimensional measurement system and method Download PDFInfo
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- CN113607081A CN113607081A CN202110854501.6A CN202110854501A CN113607081A CN 113607081 A CN113607081 A CN 113607081A CN 202110854501 A CN202110854501 A CN 202110854501A CN 113607081 A CN113607081 A CN 113607081A
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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Abstract
The disclosure provides a contact welding surface defect three-dimensional measurement system and a contact welding surface defect three-dimensional measurement method, and belongs to the technical field of three-dimensional measurement. Wherein the system includes: a contact end and a measurement end; the contact end includes: the device comprises an opaque layer and a plurality of light sources with different colors, wherein the opaque layer is used for contacting the defect position of a welding surface and generating deformation; the measuring end includes: the camera is used for acquiring images of the opaque layer after deformation under the irradiation of the light sources with different colors, and the processing device is used for processing the images to obtain a three-dimensional measurement result of the welding surface defects. The method is based on the photometric stereo technology, can directly obtain the three-dimensional point cloud of the welding surface defect, has comprehensive measurement, meets the requirement of the three-dimensional measurement of the welding surface defect with precision, and is simple, convenient and low in cost.
Description
Technical Field
The invention belongs to the technical field of three-dimensional measurement, and particularly provides a welding surface defect three-dimensional measurement system and method.
Background
With the development of modern industrial manufacturing technology and measurement technology, technologies such as real-time monitoring, quality detection and defect identification of products in the production process of the products are widely applied. At present, welding surface defects in the evaluation of welding processes mostly depend on direct observation by naked eyes and direct measurement by traditional measuring tools. In a few automated defect measurement systems that have been used, two-dimensional measurement methods are also mainly used: the measuring system shoots the surface of the workpiece to obtain a digital image, and then the shape, the structural characteristics and the like of the defect are extracted by using an image processing technology. However, the technology generally has higher requirements on the measurement environment, can only measure specific types of defects according to the template, has lower general applicability, cannot obtain three-dimensional information of the defects, and has great limitation on the improvement of the subsequent process.
Three-dimensional measurement methods such as structured light measurement techniques, which actively project an image with a code onto the surface of a measured object by means of a light source generator and acquire three-dimensional data of the measured object, are less used in three-dimensional measurement of defects on welded surfaces. Patent CN112595264A provides a method and a system for measuring the three-dimensional topography of a high-reflection surface of a visual touch automobile, and the method uses a structured light measurement technology to be matched with a contact front end which is directly contacted with the surface of a measured object, so that a data hole caused by an overexposure problem can be effectively inhibited. However, the phase-shift structured light measurement technology needs a special image projection instrument, is high in cost and is not suitable for large-scale production environment.
Disclosure of Invention
The purpose of the present disclosure is to overcome the shortcomings of the prior art and to provide a contact welding surface defect three-dimensional measurement system and method. The method is based on the photometric stereo technology, can directly obtain the three-dimensional point cloud of the welding surface defect, has comprehensive measurement, meets the requirement of the three-dimensional measurement of the welding surface defect with precision, and is simple, convenient and low in cost.
The embodiment of the first aspect of the disclosure provides a contact welding surface defect three-dimensional measurement system, which comprises a contact end and a measurement end;
the contact end includes: the device comprises an opaque layer and a plurality of light sources with different colors, wherein the opaque layer is used for contacting the defect position of a welding surface and generating deformation;
the measuring end includes: the camera is used for acquiring images of the opaque layer after deformation under the irradiation of the light sources with different colors, and the processing device is used for processing the images to obtain a three-dimensional measurement result of the welding surface defects.
In one embodiment of the present disclosure, the opaque layer is made of a flexible material having a refractive index greater than 50% at visible frequencies, and the plurality of differently colored light sources includes at least three different colors.
In one embodiment of the present disclosure, the contact end further includes: the transparent elastic body, the transparent back plate and the fixed frame; one side of the transparent back plate is connected with the fixed frame, the other side of the transparent back plate is uniformly coated with transparent adhesive and then is connected with one side of the transparent elastomer, the other side of the transparent elastomer is uniformly coated with the opaque layer, and the plurality of light sources with different colors are uniformly distributed on the fixed frame by taking the central point of the transparent back plate as the center.
In one embodiment of the present disclosure, the transparent elastomer, the transparent backsheet, and the transparent adhesive all have a light transmittance of greater than 80% at visible frequencies.
In one embodiment of the present disclosure, the measuring end further includes: the fixed base is used for fixing the camera.
In an embodiment of the disclosure, the contact end is connected to the fixing base of the measuring end through the fixing frame, a lens of the camera faces the transparent back plate, and the opaque layer, the transparent elastic body, and the transparent back plate are all located within a lens shooting range of the camera.
The embodiment of the second aspect of the present disclosure provides a contact welding surface defect three-dimensional measurement method, based on the above contact welding surface defect three-dimensional measurement system, the method includes:
calibrating the measurement system to obtain a corresponding functional relation between the light intensity and the gradient of each point on the surface of the opaque layer;
contacting the opaque layer with a welding surface defect to be measured and generating deformation;
irradiating the deformation by using the light sources with different colors, then acquiring an image after the deformation of the opaque layer by using the camera, and obtaining the light intensity of each point on the surface of the opaque layer according to the pixel value of the image;
calculating the gradient of each point according to the light intensity by using the functional relation;
and calculating the depth value of each point according to the gradient of each point to obtain a three-dimensional measurement result of the welding surface defect.
In one embodiment of the present disclosure, the method of calibrating the measurement system employs a calibration look-up table.
In one embodiment of the disclosure, the deformation is generated by applying a pressure to the measurement system that is less than a pressure value at which damage occurs to the measurement system or the weld surface defect to be measured.
In an embodiment of the present disclosure, the method for calculating the depth value of each point according to the gradient adopts any one of a parallel beam projection reconstruction algorithm, an iterative reconstruction algorithm, and an iterative weighted least squares method.
The characteristics and the beneficial effects of the disclosure are as follows:
according to the contact type welding surface defect three-dimensional measurement system and method, the influence of welding surface overexposure on surface defect three-dimensional measurement is avoided; the system disclosed by the invention is simple in structure and installation, low in cost, lossless in measurement method, high in speed and high in precision.
The contact end of the system disclosed by the invention adopts the opaque layer and the transparent elastic body to remap the three-dimensional changes of the high-light-reflection surface and the defect position on the opaque layer, so that the measurability is improved, the influence of overexposure on a measurement result in direct optical measurement is avoided, and the contact end is only composed of three materials which can be conveniently obtained; the camera measuring end of the system disclosed by the invention adopts a photometric stereo technology, only light sources and industrial cameras with different colors are needed, and the system has the advantages of high speed and strong stability; the whole system is simple to install and low in cost.
The method can be used for three-dimensional measurement of the welding surface defects, can be used as a basis for improving the process technology and evaluating the product quality in the welding process, and has an important effect on improving the product quality.
Drawings
Fig. 1 is a schematic view of a contact end structure in a contact welding surface defect three-dimensional measurement system according to an embodiment of the disclosure.
Fig. 2 is a schematic structural diagram of a measuring end in a contact welding surface defect three-dimensional measuring system according to an embodiment of the disclosure.
Fig. 3 is an overall structural diagram of a contact welding surface defect three-dimensional measurement system in an embodiment of the disclosure.
Fig. 4 is an overall flowchart of a three-dimensional measurement method of welding surface defects in the embodiment of the present disclosure.
FIG. 5 is a schematic view of a usage scenario of a contact welding surface defect three-dimensional measurement system in an embodiment of the present disclosure.
In the figure, 1 an opaque layer, 2 a transparent elastomer, 3 a transparent back plate, 4 light sources with different colors, 5 a fixed frame, 6 a camera, 7 a fixed base and 8 a contact welding surface defect three-dimensional measuring system; 9 defective soldering surface.
Detailed Description
The present disclosure provides a contact welding surface defect three-dimensional measurement system and method, which are further described in detail below with reference to the accompanying drawings and specific embodiments. The following examples are intended to illustrate the present disclosure, but are not to be construed as limiting the scope thereof.
In the present disclosure, the welding surface defect refers to a welding surface with defects generated by various reasons when metal is melted and solidified during welding, and the defects include, but are not limited to, pock marks, blowholes, blisters, and the like. Such surfaces have high reflectivity at non-defects, so that light intensity saturation occurs when the camera directly captures the image of the surface (i.e. pixels of a part of the captured image where the light intensity is extremely high are limited to the maximum quantization value of the camera), which affects the measurement at the defect.
The disclosure provides a contact welding surface defect three-dimensional measurement system which comprises a contact end and a measurement end. The contact end is used for generating deformation at the position of the contact welding surface defect and irradiating the deformation through light sources with different colors; and the measuring end is used for acquiring and processing the images after the deformation is irradiated by the light sources with different colors to obtain a three-dimensional measuring result of the welding surface defect.
In the embodiment of the present disclosure, the contact end structure is shown in fig. 1, and includes: an opaque layer 1, a transparent elastomer 2, a transparent back plate 3, a plurality of light sources 4 of different colors and a fixing frame 5; one side of the transparent back plate 3 is connected to the fixed frame 5 through threads, the other side of the transparent back plate 3 is uniformly coated with transparent adhesive and then is connected with one side of the transparent elastomer 2, and the other side of the transparent elastomer 2 is uniformly coated with the opaque layer 1; a plurality of light sources 4 with different colors are uniformly distributed on the fixed frame by taking the transparent backboard 3 as the center, and the light emitted by the light source with each color irradiates the opaque backboard.
The measuring end structure is shown in fig. 2 and comprises: a camera 6, a fixed base 7 and a computer; the camera 6 is fixed on the fixed base 7 through threaded connection; the camera 6 is connected to a computer.
The contact end and the measuring end are connected by a fixing frame 5 and a fixing base 7 by using bolts, and the connected measuring system is shown in fig. 3. After the connection, the lens of the camera 6 faces the surface of the contact end, which is not connected with the transparent elastic body 2, of the transparent back plate 3, and the distance between the fixing frame 5 and the fixing base 7 enables the opaque layer 1, the transparent elastic body 2 and the transparent back plate 3 to be all in the shooting range of the lens of the camera 6.
In the embodiment of the disclosure, the opaque layer is made of a flexible material with a refractive index of more than 50% at visible frequency, and can be sprayed, such as commercial pigment, or directly covered, such as transfer printing pattern; the transparent elastic body 2 is made of a flat-plate elastic material with light transmittance of more than 80% under visible light or infrared light frequency, and comprises but is not limited to silicon rubber, polyurethane, thermoplastic elastomer, plastisol, natural rubber, polyisoprene, polyvinyl chloride, gelatin, hydrogel or a mixture thereof, wherein the hardness is 5 Shore 00 to 80 Shore A, the thickness is basically larger than the vertical height between the deepest point and the highest point of a detected surface defect, the thickness is generally selected to be 5mm to 15mm, and the rest thicknesses can also be adopted; the transparent adhesive is any tackifier or adhesive with light transmittance of more than 80% under visible light frequency, including but not limited to fir glue, epoxy resin, organic silicon and the like; the transparent back plate 3 is made of a rigid optically transparent material with a light transmittance of more than 80% at visible light frequency, including but not limited to glass, polycarbonate, acrylic, polystyrene, polyurethane, optically transparent epoxy resin, and the like, or a silicone resin, such as addition-cured silicone resin, is generally selected from 1mm to 5mm, and the remaining thickness can be adopted on the premise of ensuring the structural strength; the light sources with different colors can select a single LED with higher brightness, and can also select a plurality of LEDs with the same color to be spliced together to form an array, the arrangement position of the array requires that the center point of the transparent backboard is taken as the center, the distribution direction is uniform, and at least three different colors are provided, including but not limited to red, green, blue and the like; the fixed frame is made of any rigid material which can play a supporting role and cannot influence the transparency of the transparent elastic body and the elastic backboard.
In one example of the present disclosure, the opaque layer selects Print-
Gray Silicone Ink Gray silica gel coloring pigment and Smooth-OnNOVOCS organosilicon solvent are mixed to prepare, and a spray gun is used for uniformly spraying 3 layers to form an opaque layer; XP565 addition curing silica gel of the Silicones Inc. is selected as the transparent elastomer to be made into a cuboid with a bottom surface being a square with the width of 15cm and the thickness of 12 mm; the transparent adhesive is Gorilla organic silicon adhesive; the transparent back plate 3 is made of acrylic materials, and the bottom surface of the transparent back plate is a cuboid which is 20cm wide, square and 3mm thick; the light sources 4 with different colors are SMD Standard LEDs of the mouse company, the colors are red, green and blue, the LEDs with each color are arranged in two rows, eight LEDs in each row, the light sources with the colors are mutually spaced by 120 degrees by taking the central point of the transparent back plate as the center, and each light source with the colors is connected with the fixed frame by a rigid support; the fixed frame is made of common aluminum alloy materials, and a cover-free and bottom-free cube is formed by four square metal plates.
All parts of the measuring end in the embodiment of the disclosure can be of conventional types, and the fixing base is made of rigid materials. In one specific example of the present disclosure, the camera selects GO-5000M-USB from the JAI of Denmark; the computer is Y720; the fixed base is made of common aluminum alloy; the distance between the transparent back plate and the fixed base is 15 cm.
The disclosure also provides a contact welding surface defect three-dimensional measurement method based on the system, the overall process is shown in fig. 4, and the method comprises the following steps:
1) calibrating the measurement system to obtain the corresponding functional relation between the light intensity and the gradient of each point on the surface of the opaque layer, wherein the expression is as follows:
Ι(x,y)＝R(p,q)
wherein, i (x, y) is a light intensity vector of a point with coordinates (x, y) on the opaque layer after being irradiated by light sources with different colors, reflected to the camera and collected; (p, q) is the gradient of the point (X, Y) in the X and Y directions, respectively (where the X and Y directions are parallel to the adjacent sides of the opaque layer, respectively), and R represents the functional relationship of the light intensity vector to the gradient.
In the embodiment of the disclosure, the calibration step may first calibrate the light source direction, and then establish an overdetermined linear equation set corresponding to the light intensity and gradient of the surface of the opaque layer according to the light source direction, or may adopt other calibration methods that can achieve the target.
In one embodiment of the present disclosure, a method for calibrating a lookup table is used to establish a corresponding relationship between light intensity and gradient, and the specific steps are as follows:
1.1) constructing a lookup table matrix R and a lookup table auxiliary matrix RcWherein the lookup table matrix R is a four-dimensional matrix with dimensions of t × t × t × 2, and the lookup table auxiliary matrix RcFor a three-dimensional matrix, the dimensions are t × t × t, and all 0's are assigned to the two matrices. In the embodiment, t is 100;
1.2) use diameter d0The non-transparent layer of the rigid ball at the contact end randomly selects n different position points, and for each point, the rigid ball is pressed into a depth dpAnd shooting the deformation pictures of the opaque layer under the condition that the light sources with different colors are all opened at the same time through a camera to obtain n pictures. Diameter d in this disclosure0Generally, the selection range is 5-10 mm, n is generally 150-300, dpThe size range is generally 1/3d0～2/3d0In this embodiment, d is selected0＝7mm、 n＝150、dp＝3.5mm；
1.3) processing each deformation picture obtained in the step 1.2) by the following steps:
1.3.1) extracting a deformed area in the picture by using a contour extraction algorithm, wherein the area is a circular area, and obtaining a central point coordinate (x) in the area0,y0) And any one in this areaPoint coordinates (x, y) in units of 1; directly acquiring the pixel value of a point (x, y) as (r, g, b) according to the acquired picture (representing the light intensity values of red, green and blue respectively, and having a unit of 1 (if the light sources of different colors select other colors, the pixel value of the corresponding color is acquired);
1.3.2) calculating the surface gradient (p, q) of the deformation zone point (x, y), the expression being:
wherein alpha ispixIn mm for the width of each pixel, and in mm for the height of the point (x, y) for h (x, y), in this embodiment αpix＝0.0235mm/pixel；
1.3.3) calculating light intensity interception values, wherein the interception method of three pixel values of each point comprises the following steps:
wherein, clip is an interception function, and the target value is limited in a certain range; r is*,g*,b*Pixel values intercepted for r, g, b respectively
1.3.4) is a queryLook-up matrix R and look-up table auxiliary matrix RcAssigning the value by the process of
Rc(r*,g*,b*)＝Rc(r*,g*,b*)+1
Wherein R (R)*,g*,b*1) is a four-dimensional matrix R at (R)*,g*,b*1) value of point, R (R)*,g*,b*2) is a four-dimensional matrix R at (R)*,g*,b*2) value of point, Rc(r*,g*,b*) Is a three-dimensional matrix RcIn (r)*,g*,b*) The value of the point.
1.4) after all pictures have been processed, check RcIf for any point the pixel value
Exist of
Then select the distance matrix
This nearest non-0 element is assigned
Namely:
And completing calibration after the steps are completed.
2) The opaque layer of the contact end in the measuring system is used for contacting the welding surface defect to be measured and generating deformation;
in the embodiment of the present disclosure, as shown in fig. 5, the opaque layer of the contact end in the measurement system 8 is used to contact the defective welding surface 9 to be measured and apply pressure to the measurement system 8, wherein the portion applying pressure may be any large rigid component in the measurement system, such as the transparent back plate 3, the fixing frame 5, the fixing base 7 or any combination of the three, so that the opaque layer 1 in the measurement system is deformed after contacting the defective welding surface 9 to be measured (the non-planar portion in the defective welding surface 9 in fig. 5 represents the defect existing in the welding surface), and the minimum value of this pressure should cause the surface normal of the opaque layer 1 of the contact end to find local variation; the maximum value should be less than the value of the pressure that causes any damage to the measurement system or the surface being measured; in one embodiment of the present disclosure, the specific pressing component is the fixed back plate 7, and the pressure value is 3N.
3) Turning on all the light sources with different colors, collecting the deformed image of the opaque layer by using a camera, obtaining a light intensity vector I (x, y) of each point of the opaque layer from an image pixel value, and obtaining an inverse function R of R by marking in 1)-1Obtaining the gradient of the corresponding point, wherein the expression is as follows;
(p,q)＝R-1(Ι(x,y))
in this embodiment, the coordinates of each point on the image collected by the camera are expressed as (x)τ,yτ) Corresponding to a pixel value (r)τ,gτ,bτ) Respectively calculating the corresponding light intensity interception value of each point according to the formula in 1.3.3)
The surface gradient corresponding to this point is then:
4) and (3) utilizing a geometric processing algorithm to obtain the depth value of each point through gradient accumulation, thereby obtaining a three-dimensional measurement result of the welding surface defect to be measured, wherein the expression is as follows:
z＝f(p,q)
wherein z is the depth value corresponding to each point
The geometric processing algorithm described in the embodiments of the present disclosure is any algorithm that can obtain the surface height from the surface gradient accumulation, including but not limited to a parallel beam projection reconstruction algorithm, an iterative weighted least squares method, and the like, and in one embodiment of the present disclosure, a poisson equation reconstruction method is used, that is, the following equations are solved:
which can be solved using a discrete sine transform. And after the z corresponding to each point is obtained, point cloud of the defect to be measured can be obtained, and finally, a three-dimensional measurement result of the welding surface defect to be measured is obtained.
Claims (10)
1. A contact welding surface defect three-dimensional measurement system is characterized by comprising a contact end and a measurement end;
the contact end includes: the device comprises an opaque layer and a plurality of light sources with different colors, wherein the opaque layer is used for contacting the defect position of a welding surface and generating deformation;
the measuring end includes: the camera is used for acquiring images of the opaque layer after deformation under the irradiation of the light sources with different colors, and the processing device is used for processing the images to obtain a three-dimensional measurement result of the welding surface defects.
2. The system of claim 1, wherein the opaque layer is made of a flexible material having a refractive index greater than 50% at visible frequencies, and the plurality of differently colored light sources comprises at least three different colors.
3. The system of claim 1, wherein the contact end further comprises: the transparent elastic body, the transparent back plate and the fixed frame; one side of the transparent back plate is connected with the fixed frame, the other side of the transparent back plate is uniformly coated with transparent adhesive and then is connected with one side of the transparent elastomer, the other side of the transparent elastomer is uniformly coated with the opaque layer, and the plurality of light sources with different colors are uniformly distributed on the fixed frame by taking the central point of the transparent back plate as the center.
4. The system of claim 3, wherein the transparent elastomer, the transparent backing plate, and the transparent adhesive each have a light transmittance of greater than 80% at visible frequencies.
5. The system of claim 3, wherein the measurement end further comprises: the fixed base is used for fixing the camera.
6. The system of claim 4, wherein the contact end is connected to the fixing base of the measuring end through the fixing frame, the lens of the camera faces the transparent back plate, and the opaque layer, the transparent elastic body and the transparent back plate are all located within a shooting range of the lens of the camera.
7. A contact welding surface defect three-dimensional measurement method based on the system of any one of claims 1-6, characterized by comprising:
calibrating the measurement system to obtain a corresponding functional relation between the light intensity and the gradient of each point on the surface of the opaque layer;
contacting the opaque layer with a welding surface defect to be measured and generating deformation;
irradiating the deformation by using the light sources with different colors, then acquiring an image after the deformation of the opaque layer by using the camera, and obtaining the light intensity of each point on the surface of the opaque layer according to the pixel value of the image;
calculating the gradient of each point according to the light intensity by using the functional relation;
and calculating the depth value of each point according to the gradient of each point to obtain a three-dimensional measurement result of the welding surface defect.
8. The method of claim 7, wherein calibrating the measurement system uses a calibration look-up table.
9. The method according to claim 7, characterized in that the deformation is produced by applying a pressure to the measuring system, which pressure is less than a pressure value at which damage occurs to the measuring system or to the weld surface defect to be measured.
10. The method of claim 7, wherein the method of calculating the depth value of each point according to the gradient adopts any one of a parallel beam projection reconstruction algorithm, an iterative reconstruction algorithm, and an iterative weighted least squares method.
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| CN114659553A (en) * | 2022-02-28 | 2022-06-24 | 联想(北京)有限公司 | Detection method, device, equipment and storage medium |
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Application publication date: 20211105 |