CN113595654B - Simulator and simulation method for simulating resistance change of conductive slip ring - Google Patents

Simulator and simulation method for simulating resistance change of conductive slip ring Download PDF

Info

Publication number
CN113595654B
CN113595654B CN202110841213.7A CN202110841213A CN113595654B CN 113595654 B CN113595654 B CN 113595654B CN 202110841213 A CN202110841213 A CN 202110841213A CN 113595654 B CN113595654 B CN 113595654B
Authority
CN
China
Prior art keywords
slip ring
resistance
switch
conductive slip
simulator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202110841213.7A
Other languages
Chinese (zh)
Other versions
CN113595654A (en
Inventor
李立
朱野
刘会杰
梁旭文
程睿
刘磊
潘小彤
刘兴富
王硕
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Engineering Center for Microsatellites
Original Assignee
Shanghai Engineering Center for Microsatellites
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Engineering Center for Microsatellites filed Critical Shanghai Engineering Center for Microsatellites
Priority to CN202110841213.7A priority Critical patent/CN113595654B/en
Publication of CN113595654A publication Critical patent/CN113595654A/en
Application granted granted Critical
Publication of CN113595654B publication Critical patent/CN113595654B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/0082Monitoring; Testing using service channels; using auxiliary channels
    • H04B17/0087Monitoring; Testing using service channels; using auxiliary channels using auxiliary channels or channel simulators
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R39/00Rotary current collectors, distributors or interrupters
    • H01R39/02Details for dynamo electric machines
    • H01R39/08Slip-rings

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)

Abstract

The invention relates to a simulator for simulating the resistance change of a conductive slip ring, which comprises one or more transmission channels, wherein each transmission channel comprises: a switch array having n switching units connected in parallel with each other, where n is an integer, each switching unit having an on-resistance R, the switch array being configured to turn on and/or off a corresponding number of switching units according to a control signal received from a control bus so as to adjust a resistance into a transmission channel; a control bus for transmitting control signals to the switch array; and a noise simulator configured to simulate electromagnetic interference in the conductive slip ring. By the aid of the method, characteristics such as resistance change, electromagnetic noise and instantaneous interruption characteristics of the conductive slip ring during operation can be simulated more truly besides electric energy and electric signal transmission.

Description

Simulator and simulation method for simulating resistance change of conductive slip ring
Technical Field
The invention relates to the field of precision machine manufacturing in general, and particularly relates to a simulator for simulating resistance change of a conductive slip ring and a simulation method. The invention further relates to a method for simulating a change in the resistance of a conductive slip ring.
Background
The conductive slip ring is used for mechanically and electrically connecting two rotating bodies which rotate relatively, and transmitting electric energy and signals between the two rotating bodies. The precision conductive slip ring belongs to a high-tech product, is used for transmitting electric energy and electric signals for a relatively rotating mechanism, is always applied to the field of advanced military, and is a key device of various precision rotary tables, centrifuges and inertial navigation equipment. With the increase of manufacturing processes, the civil field also increasingly uses such products, for example in industrial automation system control. The method is widely applied to electromechanical equipment such as security, factory automation, electric power, finance, instruments, aerospace, military, transportation, buildings and the like.
The core structure of the conductive slip ring is a stator and a rotor, the two parts rotate relatively, and lead wires are respectively led out to be connected with the two rotating bodies so as to realize the transmission of electric energy or electric signals between the two rotating bodies. The conductive slip ring has a complex structure and high manufacturing process difficulty, and is easy to wear due to relative rotation, so that the conductive slip ring is a weak mechanical link of a machine and is a key factor for limiting the service life of a system. For example, satellites with high speed rotating parts, have a life that is limited primarily by the useful life of the slip rings. Therefore, the service life of the slip ring is prolonged, the service life of the whole system can be directly prolonged, the use and maintenance cost of the whole system is greatly reduced, and great economic benefits are achieved.
The service life of the slip ring can be effectively prolonged through open source methods such as the optimization design of the slip ring, the improvement of manufacturing materials and the improvement of manufacturing processes, and meanwhile, when a non-test slip ring test is carried out, the throttling methods such as the reduction of the use of the conductive slip ring in ground test and verification stages through a slip ring simulator also have the effect of prolonging the effective service life of the system. However, at present, electric energy or electric signal transmission on the conductive slip ring is usually simulated by using a lead or an added interference signal wire, but characteristics such as resistance fluctuation and instantaneous interruption on the conductive slip ring cannot be accurately reflected, and a real slip ring is difficult to simulate.
Resistance fluctuation caused by relative rotation of a rotor and a stator of the conductive slip ring directly influences the level size and the signal quality on a transmission line, and is a key index influencing the signal transmission quality; the instantaneous interruption characteristic causes instantaneous disconnection of the line, and the signal transmission level and energy supply are directly cut off, so that the accurate transmission of signals and the effective transmission of energy are influenced.
Therefore, a scheme is needed to simulate the characteristics of a real conductive slip ring in the testing process of signal transmission and the like of the conductive slip ring, so that the in-orbit running state of the whole system is simulated more truly, and the accuracy of a ground test is improved.
Disclosure of Invention
The invention aims to provide a simulator for simulating the resistance change of a conductive slip ring and a simulation method. In addition, other characteristics of the conductive slip ring, such as electromagnetic noise and snap characteristics, may also be simulated by the simulator and/or the method.
Specifically, the invention provides a simulator for simulating the resistance change of a conductive slip ring, which comprises one or more transmission channels, wherein each transmission channel comprises:
a switch array having n switching cells connected in parallel with each other, where n is an integer, each switching cell having an on-resistance R, the switch array being configured to switch on and/or off a corresponding number of switching cells in accordance with a control signal received from a control bus so as to adjust a resistance into a transmission channel, wherein the switching cells comprise metal oxide semiconductor field effect transistors MOSFETs that are bidirectionally conductive, and the switch array being further configured to perform the following actions:
switching on a number k of switching elements in the case of simulating a static resistance R1 on a conductive slip ring transmission line, where k satisfies the following equation:
Figure GDA0004053547630000021
and
correspondingly, a number h of switching elements are switched off or on in the case of a simulated change in the resistance of the conductive slip ring R3, wherein h satisfies the following equation:
Figure GDA0004053547630000022
and
and the control bus is used for transmitting the control signal to the switch array.
In one embodiment of the invention, it is provided that the simulator that can simulate the change in resistance of the conductive slip ring further comprises a noise simulator configured to simulate electromagnetic interference in the conductive slip ring.
In one embodiment of the invention, it is provided that the noise simulator is configured to output stored or received electromagnetic noise, wherein the electromagnetic noise is collected from the electrically conductive slip ring.
In one embodiment of the invention, it is provided that n satisfies the following inequality:
Figure GDA0004053547630000031
where R2 is the minimum ripple resistance in the conductive slip ring.
In one embodiment of the invention, it is provided that the switch array is further configured to perform the following actions:
and all the switch units are disconnected within the instantaneous disconnection time t under the condition of simulating the instantaneous disconnection time t of the conductive slip ring.
The invention also provides a method for simulating the resistance change of the conductive slip ring, which comprises the following steps:
determining a resistance to be simulated and electromagnetic interference to be simulated of the conductive slip ring;
generating a control signal according to the resistor to be simulated; and
-supplying said control signal to a switch array for switching on and/or off a corresponding number of switch units such that the resistance of a transmission channel connected into the simulator is said resistance to be simulated, said switch array having n switch units connected in parallel to each other, where n is an integer, each switch unit having an on-resistance R, wherein said switch units comprise a bi-directionally conducting metal oxide semiconductor field effect transistor MOSFET, comprising the actions of:
causing the switch array to turn on a number k of switch units if a static resistance R1 on the transmission line of the conductive slip ring is simulated, where k satisfies the following equation:
Figure GDA0004053547630000032
and
the resistance change R3 of the conductive slip ring is simulated to cause the switch array to correspondingly switch off or switch on a number h of switch units, wherein h satisfies the following and the like
Formula (II):
Figure GDA0004053547630000033
in one embodiment of the present invention, it is provided that the method for simulating the change of the resistance of the conductive slip ring further comprises the following steps: and transmitting the electromagnetic interference to be simulated to the transmission channel.
In one embodiment of the present invention, it is provided that the method for simulating the change of the resistance of the conductive slip ring further comprises the following steps:
and in the case of simulating the transient interruption time t of the conductive slip ring, the switch array is caused to open all the switch units within the transient interruption time t.
In one embodiment of the present invention, it is provided that the method for simulating a change in resistance of a conductive slip ring further comprises the following steps:
measuring and storing electromagnetic noise on a transmission line of the conductive slip ring as electromagnetic noise to be simulated under the condition that the conductive slip ring does not rotate; and
and inputting the electromagnetic noise to be simulated into a transmission channel of a simulator.
The invention has at least the following beneficial effects: the slip ring simulator provided by the invention can not only realize the transmission of electric energy and electric signals on a lead, but also simulate the electric characteristics on the slip ring, such as resistance fluctuation, electromagnetic interference, instantaneous interruption characteristic and the like; the resistance fluctuation is the resistance change which appears on a transmission line when the stator and the rotor are oppositely opposite, the electromagnetic interference is the noise interference on a slip ring loop caused by a space environment and an electronic circuit, and the instantaneous interruption is the instantaneous transient separation of the stator and the rotor and the transient transmission termination of an electric signal; the noise simulator can add electrical noise on the transmission lead to simulate the electrical noise on the transmission line of the conductive slip ring; the switch array realizes high-speed control on each path of switch through the control bus, controls the resistance on the transmission line through the switch on quantity to simulate the resistance fluctuation on the conductive slip ring transmission line, and momentarily switches off the transient interruption characteristic of the simulated slip ring through the switch.
Drawings
The invention is further elucidated with reference to the drawings in conjunction with the detailed description.
FIG. 1 shows a schematic diagram of a simulator for simulating a change in resistance of a conductive slip ring in accordance with the present invention; and
fig. 2 shows a schematic diagram of a switch array of a simulator according to the invention.
Detailed Description
It should be noted that the components in the figures may be exaggerated and not necessarily to scale for illustrative purposes. In the figures, identical or functionally identical components are provided with the same reference symbols.
In the present invention, "disposed on" \ 8230 "", "disposed over" \823030 "", and "disposed over" \8230 "", do not exclude the presence of an intermediate therebetween, unless otherwise specified. Furthermore, "arranged above or 8230that" on "merely indicates the relative positional relationship between the two components, but in certain cases, for example after reversing the product direction, can also be switched to" arranged below or below "8230, and vice versa.
In the present invention, the embodiments are only intended to illustrate the aspects of the present invention, and should not be construed as limiting.
In the present invention, the terms "a" and "an" do not exclude the presence of a plurality of elements, unless otherwise specified.
It is further noted herein that in embodiments of the present invention, only a portion of the components or assemblies may be shown for clarity and simplicity, but those of ordinary skill in the art will appreciate that, given the teachings of the present invention, required components or assemblies may be added as needed in a particular scenario.
It is also noted herein that, within the scope of the present invention, the terms "same", "equal", and the like do not mean that the two values are absolutely equal, but allow some reasonable error, that is, the terms also encompass "substantially the same", "substantially equal".
The numbering of the steps of the methods of the present invention does not limit the order of execution of the steps of the methods. Unless specifically stated, the method steps may be performed in a different order.
The invention provides a slip ring simulator based on a high-speed switch array, which not only can realize the transmission of electric energy and electric signals on a lead, but also can simulate the electric characteristics such as resistance fluctuation, electromagnetic interference and instantaneous interruption characteristics on a slip ring. The resistance fluctuation is the resistance change which appears on the transmission line when the stator and the rotor are oppositely opposite, the electromagnetic interference is the noise interference on a slip ring loop caused by a space environment and an electronic circuit, and the transient interruption is the transient disconnection which appears on the stator and the rotor and causes the transient transmission termination of an electric signal. The conductive slip ring simulator includes a noise simulator, a switch array, an optional control bus, wires, an optional housing. The noise simulator is used for adding electrical noise on the transmission lead and simulating electrical noise on the transmission line of the conductive slip ring; the switch array realizes high-speed control on each path of switch through the control bus, controls the resistance on the transmission line through the switch on quantity to simulate the resistance fluctuation on the conductive slip ring transmission line, and momentarily switches off the transient interruption characteristic of the simulated slip ring through the switch.
The invention is further elucidated with reference to the drawings in conjunction with the detailed description.
Fig. 1 shows a schematic diagram of a simulator 100 for simulating a conductive slip ring according to the invention.
As shown in fig. 1, a simulator 100 for simulating a conductive slip ring according to the present invention comprises a plurality of transmission channels 1-n. The conductive slip rings are typically multi-path, so multiple transmission channels can be used to simulate a multi-channel slip ring, but single channel slip rings are also contemplated. Each transmission channel 1-n comprises the following components, some of which are optional:
a switch array 102 having n switching units (not shown) connected in parallel to each other, where n is an integer, each switching unit having an on-resistance R, the switch array being configured to switch on and/or off a corresponding number of switching units in accordance with a control signal received from the control bus 103 in order to adjust the resistance into the transmission channel. The switching unit is for example a bidirectional conducting metal oxide semiconductor field effect transistor MOSFET. Here, bidirectional conduction means that current can flow in two directions, i.e., forward and reverse directions, so that both terminals of the simulator can serve as an input terminal and an output terminal, thereby achieving bidirectional current and power transmission. Other switches are also conceivable, for example triode switches.
A control bus 103 for transmitting control signals to the switch array 102. A control bus 103 connects the switch array 102 to a controller to enable control of the switch units.
A noise simulator 101 configured to simulate electromagnetic interference in a conductive slip ring. For example, the noise simulator 101 is configured to output stored or received electromagnetic noise that is collected from the conductive slip ring, thereby enabling a more realistic simulation of electromagnetic noise in the conductive slip ring.
Transmission lines 104 for electrically connecting the components in the transmission channel to each other. Here, the noise simulator 101 and the switch array 102 are connected in series with each other.
An optional housing 105 for housing the components of the simulator 100.
Fig. 2 shows a schematic diagram of the switch array 102 of the simulator 100 according to the invention.
As shown in fig. 2, the switch array 102 includes the following components, some of which are optional:
a plurality of switching units 201 (4 in the present embodiment, but other numbers are also conceivable), said switching units 201 being connected in parallel to each other and having their control terminals 203 connected to the output of the control unit 204, wherein the output signal at the output of the control unit 204 may control the switching of the respective switching unit 201. The switch unit 201 is, for example, a CMOS bidirectional switch and the control unit 201 is, for example, a gating device, a gating input terminal 205 of which is connected to the control bus, and since the CMOS bidirectional switch 201 can be turned on bidirectionally, the input/output terminal 202 has no difference between input and output, and applying a control signal to the control terminal 203 can control the on and off of the CMOS bidirectional switch. The single CMOS bidirectional switch 201 can realize, for example, on-resistance of tens of milli-ohms and switching speed of nanoseconds, and can be used to simulate resistance fluctuation of milli-ohms and instantaneous interruption of nanoseconds on a conductive slip ring.
The following sets forth the various modes of operation of the simulator 100.
Noise simulation: the noise simulator 101 may simulate electromagnetic interference on the conducting slip ring, such as electromagnetic interference caused by a spatial electromagnetic field on the brushes. The noise simulation process comprises the following steps:
1) Electromagnetic noise on the transmission line is measured and stored without rotation of the conductive slip ring.
2) The stored noise is placed in the noise simulator 101, the collected noise is added in a circulating mode, and the noise is executed in a circulating mode all the time in the conducting slip ring simulation process.
And (3) resistance fluctuation simulation: resistance fluctuations refer to the change in resistance across the transmission line during rotation of the conductive slip ring, usually by subtracting the minimum value of the resistance measurement from the maximum value of the measurement.
The specific implementation steps are as follows:
1) And (3) a static conductive slip ring is static, and static resistance R1 on a transmission line of the conductive slip ring is measured.
2) And (3) driving the slip ring to rotate for a circle according to a preset rotating speed by using the motor, measuring and storing a resistance value sequence on the transmission line of the electric slip ring, and calculating the minimum fluctuation resistance R2 of the resistance sequence.
3) Measuring the on-resistance of a single CMOS bidirectional conducting switch to be R, wherein the number n of the switch array units needs to satisfy the following formula:
Figure GDA0004053547630000081
the more the number of the switch array units n is, the higher the resistance adjustment resolution is, and finer resistance fluctuation can be simulated.
4) Calculating the number k of switches to be switched on when the conductive slip ring is simulated to be static by using the static resistance R1 measured in the step 1) and the on-resistance R of the CMOS bidirectional conductive switch measured in the step 3), wherein the number k meets the requirement
Figure GDA0004053547630000082
A switch number command is input to the controller through the control terminal 205 so that the bidirectional switch 201 is turned on by k.
5) Sequentially taking out the resistance value from the resistance measurement value obtained in the step 2) to compare with the previous resistance value, comparing the first value with the static resistance R in the step 1), calculating the number of the bidirectional switches 201 needing to be increased or decreased, setting the resistance to be increased R3, and then meeting the requirement that the number h of the bidirectional switches 201 needing to be disconnected meets the requirement that the resistance is increased
Figure GDA0004053547630000083
If the resistance is reduced by R3 due to resistance fluctuation, h bidirectional switches need to be additionally switched on, and the number m of the bidirectional switches 201 which need to be finally switched on is calculated by adding or subtracting h on the number of the previous switched-on switches.
6) And repeating the step 5) until the resistance value sequence in the step 2) is output, and obtaining a control switch number m sequence.
7) The number m sequence is input to the controller 204 through the control bus 205 in sequence, and the controller 204 controls the control end 203 of each switch according to the command, so that the number of switches on the whole array is controlled to be m until the sequence output is finished.
8) And repeating the step 7) so that the conducting slip ring simulation process is continuously circulated.
In the above design, a CMOS bi-directional switch with a suitable on-resistance R needs to be selected so that the increased or decreased number of switches h satisfies h ≧ 0 and
h≤n-k
instantaneous interruption characteristic simulation: the glitch characteristic is a short momentary disconnection on the transmission line, and can be realized by controlling the on number of the bidirectional switch 201 to 0. The implementation steps are as follows:
1) The slip ring is driven by the motor to rotate according to a preset rotating speed, and the slip ring tester is used for measuring the instantaneous interruption time t in the rotating process.
2) In the process of executing the resistance fluctuation simulation step 7), the current on-number is recorded as j, the command of the on-switch number 0 is input to the controller 204 through the control bus 205, and after t time, the command of the on-switch number j is input to the controller 204 through the control bus 205, so that instant interruption with the time length of t is realized.
3) And (5) repeatedly executing the step 2) according to the instantaneous interruption frequency of the conductive slip ring required to be simulated.
The invention has at least the following beneficial effects: the slip ring simulator provided by the invention can not only realize the transmission of electric energy and electric signals on a lead, but also simulate the electric characteristics on the slip ring, such as resistance fluctuation, electromagnetic interference, instantaneous interruption characteristic and the like; the resistance fluctuation is the resistance change which appears on a transmission line when the stator and the rotor are oppositely opposite, the electromagnetic interference is the noise interference on a slip ring loop caused by a space environment and an electronic circuit, and the instantaneous interruption is the instantaneous transient separation of the stator and the rotor and the transient transmission termination of an electric signal; the noise simulator can add electrical noise on a transmission lead to simulate electrical noise on a transmission line of the conductive slip ring; the switch array realizes high-speed control on each switch through the control bus, controls the resistance on the transmission line through the switch-on quantity to simulate the resistance fluctuation on the conductive slip ring transmission line, and momentarily switches off the transient interruption characteristic of the simulated slip ring through the switch.
Although some embodiments of the present invention have been described herein, those skilled in the art will appreciate that they have been presented by way of example only. Numerous variations, substitutions and modifications will occur to those skilled in the art in light of the teachings of the present invention without departing from the scope thereof. It is intended that the following claims define the scope of the invention and that methods and structures within the scope of these claims and their equivalents be covered thereby.

Claims (5)

1. A simulator for simulating changes in resistance of a conductive slip ring, comprising one or more transmission channels, wherein each transmission channel comprises:
a switch array having n switching cells connected in parallel with each other, where n is an integer, each switching cell having an on-resistance R, the switch array being configured to switch on and/or off a corresponding number of switching cells in accordance with a control signal received from a control bus so as to adjust a resistance into a transmission channel, wherein the switching cells comprise metal oxide semiconductor field effect transistors MOSFETs that are bidirectionally conductive, and the switch array being further configured to perform the following actions:
switching on a number k of switching elements in the case of simulating a static resistance R1 on a conductive slip ring transmission line, where k satisfies the following equation:
Figure QLYQS_1
and
correspondingly, a number h of switching elements are switched off or on in the case of a simulated change in the resistance of the conductive slip ring R3, wherein h satisfies the following equation:
Figure QLYQS_2
and
and the control bus is used for transmitting the control signal to the switch array.
2. The simulator of claim 1, wherein n satisfies the following inequality:
Figure QLYQS_3
where R2 is the minimum ripple resistance in the conductive slip ring.
3. The simulator of claim 1, wherein the switch array is further configured to perform the following actions:
and all the switch units are disconnected within the instantaneous disconnection time t under the condition of simulating the instantaneous disconnection time t of the conductive slip ring.
4. A method of simulating a change in resistance of a conductive slip ring, comprising the steps of:
determining a resistance to be simulated and electromagnetic interference to be simulated of the conductive slip ring;
generating a control signal according to the resistance to be simulated; and
-supplying said control signal to a switch array for switching on and/or off a corresponding number of switch units such that the resistance of a transmission channel switched into the simulator is said resistance to be simulated, said switch array having n switch units connected in parallel to each other, where n is an integer, each switch unit having an on-resistance R, wherein said switch units comprise a bi-directionally conducting metal oxide semiconductor field effect transistor, MOSFET, comprising the actions of:
causing the switch array to turn on a number k of switch units if a static resistance R1 on the transmission line of the conductive slip ring is simulated, where k satisfies the following equation:
Figure QLYQS_4
and
the method comprises the steps of causing a switch array to correspondingly switch off or switch on a number h of switch units under the condition of simulating the resistance change amount R3 of the conductive slip ring, wherein h satisfies the following equation:
Figure QLYQS_5
5. the method of claim 4, further comprising the steps of:
and in the case of simulating the transient interruption time t of the conductive slip ring, the switch array is caused to open all the switch units within the transient interruption time t.
CN202110841213.7A 2019-04-23 2019-04-23 Simulator and simulation method for simulating resistance change of conductive slip ring Active CN113595654B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202110841213.7A CN113595654B (en) 2019-04-23 2019-04-23 Simulator and simulation method for simulating resistance change of conductive slip ring

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202110841213.7A CN113595654B (en) 2019-04-23 2019-04-23 Simulator and simulation method for simulating resistance change of conductive slip ring
CN201910328252.XA CN110048784B (en) 2019-04-23 2019-04-23 Simulator for simulating conductive slip ring and corresponding simulation method

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201910328252.XA Division CN110048784B (en) 2019-04-23 2019-04-23 Simulator for simulating conductive slip ring and corresponding simulation method

Publications (2)

Publication Number Publication Date
CN113595654A CN113595654A (en) 2021-11-02
CN113595654B true CN113595654B (en) 2023-03-31

Family

ID=67278660

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201910328252.XA Active CN110048784B (en) 2019-04-23 2019-04-23 Simulator for simulating conductive slip ring and corresponding simulation method
CN202110841213.7A Active CN113595654B (en) 2019-04-23 2019-04-23 Simulator and simulation method for simulating resistance change of conductive slip ring

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201910328252.XA Active CN110048784B (en) 2019-04-23 2019-04-23 Simulator for simulating conductive slip ring and corresponding simulation method

Country Status (1)

Country Link
CN (2) CN110048784B (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004059876A1 (en) * 2002-12-24 2004-07-15 Matsushita Electric Industrial Co., Ltd. Transmission path simulation method and transmission path simulator
CN106534007A (en) * 2016-11-23 2017-03-22 合肥中感微电子有限公司 Analog equalizer, communication interface and chip
CN106680630A (en) * 2016-12-29 2017-05-17 北京金风科创风电设备有限公司 Fault testing device and method for conductive slip ring

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0376723U (en) * 1989-11-28 1991-07-31
US8175209B2 (en) * 2004-03-24 2012-05-08 Richard Carl Auchterlonie Method and apparatus for pulsed power generation
DE102010015908B4 (en) * 2010-03-10 2013-10-24 Lear Corporation Gmbh Device for controlling an electrical load
CN202255416U (en) * 2011-09-19 2012-05-30 中国航空工业第六一八研究所 Automatic conducting ring detection system
CN203054198U (en) * 2013-01-20 2013-07-10 华北电力大学(保定) Generator carbon brush collector ring system fault simulation device
CN103604993B (en) * 2013-09-12 2017-01-04 陕西航天导航设备有限公司 Electric installation dynamic contact resistance test equipment and method of testing
CN203630224U (en) * 2013-09-12 2014-06-04 陕西航天导航设备有限公司 Conductive device dynamic contact resistance test apparatus
CN104849559B (en) * 2015-06-01 2017-12-08 绵阳市维博电子有限责任公司 A kind of device and method of automatic testing conductive slip ring contact resistance
CN205120884U (en) * 2015-10-14 2016-03-30 中国航空工业集团公司北京航空精密机械研究所 Disconnected detecting system of sliding ring wink
CN106199292A (en) * 2016-08-29 2016-12-07 九江精达检测技术有限公司 A kind of Portable precise conducting slip ring detecting system and detection method thereof
CN109655668B (en) * 2018-12-24 2021-01-08 陕西航天时代导航设备有限公司 Method for testing dynamic contact resistance of conductive device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004059876A1 (en) * 2002-12-24 2004-07-15 Matsushita Electric Industrial Co., Ltd. Transmission path simulation method and transmission path simulator
CN106534007A (en) * 2016-11-23 2017-03-22 合肥中感微电子有限公司 Analog equalizer, communication interface and chip
CN106680630A (en) * 2016-12-29 2017-05-17 北京金风科创风电设备有限公司 Fault testing device and method for conductive slip ring

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
赵爱明 ; 刘卓夫 ; 郭环球 ; .多路复用器建立时间及其在伺服控制电路中应用.电测与仪表.2016,(15),全文. *
龚东军 ; 肖春华 ; 赵庆来 ; .多环路精密导电滑环自动化检测系统设计开发.科技创新与应用.2016,(10),全文. *

Also Published As

Publication number Publication date
CN110048784B (en) 2021-07-13
CN110048784A (en) 2019-07-23
CN113595654A (en) 2021-11-02

Similar Documents

Publication Publication Date Title
CN103002473B (en) A kind of wireless terminal method of testing, device and system
CN1834674A (en) Method and apparatus for a reliability testing
CN101789744B (en) Driver circuit
CN111487952B (en) Multichannel signal switching and coupling device and signal testing system
CN104009516B (en) Control method and the device of power supply assembly
CN103558495A (en) Multi-channel circuit on-off detection device
CN102520713B (en) Closed-loop test apparatus of control and drive circuits of stepping motor
JP5542608B2 (en) Electrical component testing equipment
CN102375428B (en) For the analog input module of programmable logic controller (PLC)
CN105911483A (en) Power chip testing device and method
CN110196381A (en) A kind of cable general purpose automatic test system based on cpci bus
CN113595654B (en) Simulator and simulation method for simulating resistance change of conductive slip ring
CN117148064A (en) Photovoltaic direct current fault arc testing system and method
CN105681127A (en) Complete multi-port vector network measurement device and method for multi-port radio frequency element
CN107860953B (en) Three-phase electric energy metering module and calibration method thereof
CN220730347U (en) Photovoltaic direct current fault arc test system
CN112748370A (en) Complex on-missile cable testing system and testing method
CN211627773U (en) Multichannel charging and discharging parameter calibration system
CN108896796A (en) Resistance simulation device and its implementation, insulation testing system and method
CN116027165A (en) Dynamic high-temperature reverse bias test circuit and method for broadband semiconductor
CN105676025A (en) Detection artificial load for movable electric vehicle charger
CN104820177A (en) Probe switching control system and method for flying probe test
CN108120874B (en) Method for rapidly and accurately acquiring multi-path alternating current switching value signals
CN207008000U (en) A kind of cut-in voltage test device of cmos circuit
CN111208423A (en) Automatic motor aging test method

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant