CN109655668B - Method for testing dynamic contact resistance of conductive device - Google Patents
Method for testing dynamic contact resistance of conductive device Download PDFInfo
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- CN109655668B CN109655668B CN201811580558.6A CN201811580558A CN109655668B CN 109655668 B CN109655668 B CN 109655668B CN 201811580558 A CN201811580558 A CN 201811580558A CN 109655668 B CN109655668 B CN 109655668B
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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Abstract
A dynamic contact resistance test method for electric conducting device includes setting conducting rings on said conducting device, dividing the conducting rings into test group and loop group, switching on relay on any conducting ring to carry out actual dynamic contact resistance test of said ring, closing all conducting rings in another group to form loop of said ring test, sampling for multiple times by dynamic contact resistance tester, combining formula
And
the dynamic contact resistance of the conducting ring can be measured, and the problem that the dynamic contact resistance of the conducting device cannot realize single-ring testing and wiring harness winding in the testing process is solved.
Description
Technical Field
The invention relates to the field of electric performance parameter testing of a conductive device, in particular to a dynamic contact resistance testing method of the conductive device.
Background
The current test method for dynamic contact resistance is as follows: firstly, conducting rod outgoing lines of a conducting device are in short circuit pairwise, an electric brush frame of the conducting device is fixed, then the conducting rod of the conducting device is rotated at a rated rotating speed, the contact resistance of the corresponding electric brush outgoing line is tested, and the maximum fluctuation value of the contact resistance, namely the dynamic contact resistance, is calculated.
The method is used for testing the dynamic contact resistance, the sum of the contact resistances of two rings is actually measured every time, the contact resistance of each ring cannot be accurately measured, if the dynamic contact resistance of each ring needs to be tested, one end of a counter is directly connected with a lead-out wire of a brush, the other end of the counter is connected with the lead-out wire of a conducting rod, in the dynamic resistance testing process, the conducting rod of a rotating part can be wound in a rotating mode due to the fact that the conducting rod rotates continuously, and the lead is damaged and broken when the conducting rod is serious.
Disclosure of Invention
To overcome the above-mentioned drawbacks of the prior art, the present invention provides a method for testing the dynamic contact resistance of a conductive device
The technical scheme of the invention is as follows: the dynamic contact resistance testing method of the conductive device utilizes the conductive device and the dynamic contact resistance tester to carry out dynamic contact resistance testing, the conducting device comprises a conducting rod and a brush holder assembly, the conducting rod comprises a slip ring, the slip ring is connected with slip ring leads, the slip ring leads are all connected to the same point, the brush holder component comprises brush wires, the brush wires are connected with brush lead wires and connected with a slip ring, each brush lead is connected with a relay, the brush leads are divided into two groups, one group of brush leads along the direction of the relay are connected in parallel to form a first test endpoint, the other group of brush leads along the direction of the relay are connected in parallel to form a second test endpoint, the first test endpoint and the second test endpoint are respectively connected with the dynamic contact resistance tester, and an electric brush lead, a brush wire, a relay, a slip ring and a slip ring lead form a ring;
when the dynamic contact resistance of any ring on the conducting device is tested, the relay on the ring is firstly switched on, then the relay on the conducting ring of the other group is closed, a testing loop is formed by the sliding ring lead group closed by the relay on the ring, the conducting rod is rotated at the rated rotating speed, and the conducting rod drives the sliding ring lead group to rotate;
setting a conductive device with 2n rings, sampling the contact resistance of the ring for multiple times by a dynamic contact resistance tester, and calculating the dynamic contact resistance by using the following formula;
the static contact resistance of the ring is:
the dynamic contact resistance of the ring is:
wherein r isXR is the static resistance of the ring, r is the resistance of each ring on the other setThe static resistance of (a) is,
△rXfor the dynamic resistance fluctuation value of the loop, Δ r is the dynamic resistance of each loop on the other set, and n is the number of loops of the other set.
The invention has the beneficial effects that: the conducting rings of the conducting device are divided into a testing group and a loop group, a relay on any conducting ring is switched on to carry out actual dynamic contact resistance testing of the ring during work, all conducting rings of the other group are closed to form a loop of the ring testing, multiple sampling is carried out through a dynamic contact resistance tester, and then a formula is combined
And
the dynamic contact resistance of the conducting ring can be measured, and the problem that the dynamic contact resistance of the conducting device cannot realize single-ring testing and wiring harness winding in the testing process is solved.
Drawings
FIG. 1 is a graph of dynamic resistance testing of a 10-ring conductive device of the present invention;
FIG. 2 is a dynamic resistance test chart of the present invention at test S1 loop.
Detailed Description
In order to make the technical problems, technical solutions and advantages of the present invention more apparent, the following detailed description is given with reference to the accompanying drawings and specific embodiments.
The technical scheme of the invention is as follows: a dynamic contact resistance test method for a conductive device utilizes the conductive device and a dynamic contact resistance tester to carry out dynamic contact resistance test, as shown in figure 1, the conductive device comprises a conductive rod and a brush holder component, the conductive rod is a rotating part of the conductive device, the brush holder component is a fixed part of the conductive device, the conductive rod comprises a slip ring, slip ring leads are arranged in the slip ring connection, the slip ring leads are all connected at the same point, the brush holder component comprises brush wires, the brush wires are connected with brush leads, the brush wires are connected with the slip ring, a relay is connected on each brush lead, the brush leads are divided into two groups, one group of brush leads in the relay direction are connected in parallel to form a first test endpoint, the other group of brush leads in the relay direction are connected in parallel to form a second test endpoint, the first test endpoint and the second test endpoint are respectively connected with the dynamic contact resistance tester, the brush leads, The relay, the slip ring and the slip ring lead form a ring, and one ring consists of an electric brush lead, a brush wire, a relay, a slip ring and a slip ring lead;
when the dynamic contact resistance of any ring on the conducting device is tested, the relay on the ring is firstly switched on, then the relay on the conducting ring of the other group is closed, a testing loop is formed by the sliding ring lead group closed by the relay on the ring, the conducting rod is rotated at the rated rotating speed, and the conducting rod drives the sliding ring lead group to rotate;
setting a conductive device with 2n rings, sampling the contact resistance of the ring for multiple times by a dynamic contact resistance tester, and calculating the dynamic contact resistance by using the following formula;
the static contact resistance of the ring is:
the dynamic contact resistance of the ring is:
wherein r isXR is the static resistance of each ring on the other set,
△rXfor the dynamic resistance fluctuation value of the loop, Δ r is the dynamic resistance of each loop on the other set, and n is the number of loops of the other set.
Example (b): as shown in fig. 2, the rings on the 10-ring conductive device are divided into a test group and a loop group, the test group and the loop group are respectively 5 rings, relays with ring numbers S1, S2, S3, S4 and S5 are connected to each brush lead of the test group, relays with ring numbers S6, S7, S8, S9 and S10 are connected to each brush lead of the loop group in parallel, the brush leads of the test group are connected in parallel to form a first test endpoint, the brush leads of the loop group are connected in parallel to form a second test endpoint, the first test endpoint and the second test endpoint are respectively connected with a dynamic contact resistance tester, and each slip ring lead of the test group and each slip ring lead of the loop group are connected in parallel to the same point.
Firstly, a dynamic resistance switching circuit of a conductive device controls a relay S1 on a test set to be closed, then all relays of a loop set are closed, a conductive rod is rotated at a rated rotating speed, the conductive rod drives a slip ring lead of the test set and a slip ring lead of the loop set to rotate, a dynamic resistance tester samples contact resistance of a conductive ring for multiple times, the minimum value subtracted from the maximum value of the measured contact resistance is the dynamic resistance fluctuation value of the 1 st ring, and the dynamic resistance fluctuation value is obtained according to a formula
The dynamic contact resistance of ring 1 was calculated.
The measured data of the dynamic contact resistance part of the 90-ring conductive device tested by the invention are as follows:
the dynamic contact resistance of the conductive device is smaller, and the number of the rings of the conductive device is larger, so that the conductive device has the advantages of low resistance, high resistance, and high reliability
So that the dynamic contact resistance of the loop
The test method can realize the dynamic contact resistance test of the plurality of conducting rings, and divide all the conducting rings into two groups, wherein each group can be a test group or a loop group.
The above description is only for the preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention shall fall within the protection scope of the present invention.
Claims (1)
1. The dynamic contact resistance testing method of the conductive device utilizes the conductive device and a dynamic contact resistance tester to carry out dynamic contact resistance testing, and is characterized in that: the conducting device comprises a conducting rod and a brush holder assembly, the conducting rod comprises a slip ring, slip ring leads are arranged on the slip ring in a connected mode, the slip ring leads are all connected to the same point, the brush holder assembly comprises brush wires, the brush wires are provided with brush leads in a connected mode, the brush wires are connected with the slip ring, a relay is connected to each brush lead, the brush leads are divided into two groups, one group of brush leads in the relay direction are connected in parallel to form a first testing end point, the other group of brush leads in the relay direction are connected in parallel to form a second testing end point, the first testing end point and the second testing end point are respectively connected with the dynamic contact resistance tester, and the brush leads, the brush wires, the relay, the slip ring and the slip ring leads form a ring;
when the dynamic contact resistance of any ring on the conducting device is tested, the relay on the ring is firstly switched on, then the relay on the conducting ring of the other group is closed, a testing loop is formed by the sliding ring lead group closed by the relay on the ring, the conducting rod is rotated at the rated rotating speed, and the conducting rod drives the sliding ring lead group to rotate;
setting a conductive device with 2n rings, sampling the contact resistance of the ring for multiple times by a dynamic contact resistance tester, and calculating the dynamic contact resistance by using the following formula;
the static contact resistance of the ring is:
the dynamic contact resistance of the ring is:
wherein r isxIs the static resistance of the ring, r is the static resistance of each ring on the other set, Δ rxFor the ideal dynamic contact resistance of the ring, Δ r is the dynamic contact resistance of each ring on the other set, and n is the number of rings of the other set.
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| CN110048784B (en) * | 2019-04-23 | 2021-07-13 | 上海微小卫星工程中心 | Simulator for simulating conductive slip ring and corresponding simulation method |
| CN110308331A (en) * | 2019-05-22 | 2019-10-08 | 深圳安科高技术股份有限公司 | A kind of CT slip ring state online test method and system |
| CN110411628B (en) * | 2019-07-01 | 2021-06-25 | 东南大学 | Slip ring type wheel force sensor dynamic transmission error correction system and correction method thereof |
| CN111537813A (en) * | 2020-03-27 | 2020-08-14 | 中广核(乌兰察布)风力发电有限公司 | Multi-channel slip ring test method and test platform |
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